Reliability Report-IX9908 Qualification No: 2013-009 Reliability Report Reliability Data for IX9908 Report Title: Reliability Data for IX9908 Report Number: 2013-009 Date: 6/26/13 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 1 of 5 Reliability Report-IX9908 Qualification No: 2013-009 Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division IX9908. The Reliability data presented here were collected during IXYS product qualification. The purpose of this qualification was to verify the IXYS Quality and Reliability requirements as outlined in IXYS internal specifications. The IX9908 silicon is manufactured at Vanguard and assembled at UTAC in the Philippines. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the IXYS internal specification and with the approval of the product development team and quality assurance. Table 1: Product IX9908 Reliability Tests Stress Test Applicable Specs Stress Conditions Mil-Std-883 125°C, 80% 1000hrs JESD22, 130°C, 85%, A110-C 18.8 psi, 96 hrs 96 hrs Thermal Mil-Std-883, 0 to 100°C, 10/10 Shock (T/S) M1011 dwells, 15 cycles Temp Cycle Mil-Std-883, -55 to 125°C, 10/10 (T/C) N1010, “B” dwells, 300 cycles High Temp JESD22125°C, 1000hrs Storage A103C MSL J-STDIR Reflow, 020D.1 Level 1 Latch-Up JESD78 100mA, <5 sec trigger, +/-100mA For each IO, Vcc Overvoltage 19V – 27V ESD JESD22, 1.5kΩ, 100pF HBM A114-E HTRB HAST Product/ Package IX9908 8L SOIC IX9908 8L SOIC Number Sample Total of Lots Size (SS) SS 4 110 440 3 78 234 IX9908 8L SOIC IX9908 8L SOIC 1 55 55 1 55 55 IX9908 8L SOIC IX9908 8L SOIC IX9908 8L SOIC 1 50 50 1 22 22 1 8 8 IX9908 8L SOIC 1 15 15 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 2 of 5 Reliability Report-IX9908 Qualification No: 2013-009 Reliability Test Results: The stress tests and associated results for the product IX9908 qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: Product IX9908 Reliability Test Results Stress Test HTRB HTRB HTRB HTRB HAST Product/Kit Number IX9908 AE0018 IX9908 AE0019 IX9908 AE0020 IX9908 AE0021 IX9908 AE0018 HAST IX9908 AE0020 HAST IX9908 AE0021 Thermal Shock IX9908 AE0018 Temp Cycle IX9908 AE0018 High Temp Storage IX9908 AE0018 MSL IX9908 AE0018 Latch-Up IX9908 AE0018 Readpoint / (Reject/ SS) 1000 hrs. Qual Lot#1 Data 0/110 1000 hrs. Qual Lot#2 Data 0/110 1000 hrs. Qual Lot#3 Data 0/110 1000 hrs. 0/110 1000 hrs. Comments Qual Lot#4 Data Qual Lot#1 Data 0/78 1000 hrs. Qual Lot#2 Data 0/78 1000 hrs. Qual Lot#3 Data 0/78 15 Cycles Qual Lot#1Data 0/55 300 Cycles Qual Lot#1 Data 0/55 1000 hrs. Qual Lot#1 Data 0/50 IR Reflow Level 1 0/22 100mA 0/8 Qual Lot#1 Data Qual Lot#1 Data IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 3 of 5 Reliability Report-IX9908 Qualification No: 2013-009 ESD Testing Results: As part of this qualification, the product IX9908 was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/-3000V testing. Table3: Product IX9908 ESD Characterization Results ESD Product/Kit Package ESD Test RC Highest Model Number Spec Network Passed HBM IX9908 8L SOIC JESD22, 3000V 1.5kΩ, AE0018 A114-E 100pF Class 2 FIT (Failure in Time) Rate on the Product IX9908: Table 4 summarizes the number of devices used for the product IX9908 reliability stress with associated failures. Using the HTRB data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 125°C test temperature and 40°C use temperatures. Using the HAST data, FITs were calculated based on the Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for 130°C test temperature and 40°C use temperatures.. The calculated FITs from the reliability stress came out to be 8.19 and 34.60 for HTRB and HAST, respectively. Table 4: Product IX9908 FIT Rate Summary Qual# Stress Product/Kit # of # of Hours Act. Acc. Number Devices Fails Tested Energy Factor 1 1 HTRB IX9908 AE0018 AE0020 AE0021 HAST IX9908 AE0018 AE0020 AE0021 440 0 1000 0.7 Equivalent Dev. Hours FIT Rate @ 60% CL 112,378,625 8.19 255.41 234 0 96 0.7 1.1363E+ 26,588,482 02 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 4 of 5 34.60 Reliability Report-IX9908 Qualification No: 2013-009 Conclusion: The qualification of the product IX9908 has been successfully completed for the production release. APPROVAL: Prepared by: Martha W. Brandt*_________________________________ 6/26/13___ Martha W. Brandt Date Quality Engineer Approved by: Jose Pinales*_______________________________________6/26/13____ Jose Pinales Date Product Engineer Approved by: _James Archibald*___________________________________6/27/13____ James Archibald Date Director of Engineering Approved by: _Ronald P. Clark*____________________________________6/27/13____ Ronald P. Clark Date Director of Quality *Signature on File IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM Page 5 of 5