Reliability Data Report Product Family R565 LTC6945 / LTC6946 / LTC6947 / LTC6948 / LTC6950 / LTC6954 / LTC6957 Reliability Data Report Report Number: R565 Report generated on: Wed Feb 10 17:21:00 PST 2016 OPERATING LIFE TEST PACKAGE TYPE SOIC/MSOP QFN/DFN Totals SAMPLE SIZE 77 233 310 OLDEST DATE NEWEST DATE K DEVICE HRS 1 No. of FAILURES 2,3 CODE CODE (+125°C) 1133 1002 - 1133 1352 - 77 598 675 0 0 0 K DEVICE HRS No. of FAILURES PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN 306 Totals 306 OLDEST DATE NEWEST DATE CODE CODE 1238 1302 77 0 - - 77 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CODE CODE CYCLES 1249 - 1302 - 153 153 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES TEMP CYCLE FROM -65 TO 150 DEG C PACKAGE TYPE QFN/DFN Totals SAMPLE SIZE 230 230 THERMAL SHOCK FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE CYCLES QFN/DFN 230 1249 1302 115 0 Totals 230 - - 115 0 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE 1238 - 1249 - 88 88 0 0 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE 1250 - 1302 - 77 77 0 0 HIGH TEMPERATURE BAKE AT 150 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN Totals 127 127 HIGH TEMPERATURE BAKE AT 175 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN Totals 154 154 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =17.55 FITS (3) Mean Time Between Failure in Years = 6503.03 Note: 1 FIT = 1 Failure in One Billion Hours. Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL1 Preconditioning