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High-reliability discrete products
and engineering services since 1977
HR FLOW
PROGRAMMABLE UNIJUNCTION TRANSISTORS
All parts are screened per MIL-PRF-19500, JANTX Level and the device detail specification. All
testing is performed at room temperature, unless indicated otherwise. For testing at high and low
temperatures, Group A testing is required.
Test
Method
Conditions / Notes
1
Temperature Cycling
MIL-STD-750 Method 1051
2
Interim Electrical
Testing
Test condition C or maximum
storage temperature, whichever
less. 20 cycles, 10 minutes per
extreme.
DC parameters per device detail
specification.
3
Power Burn-in
MIL-STD-750 Method 1039
4
Final Electrical Testing
Conditions vary with detailed
specifications. 96 hour gate
reverse bias at 25°C is default.
DC parameters per device detail
specification.
5
Delta Calculation
Delta parameters and limits er
device detail specification.
6
PDA Calculation
10 percent defective allowed.
7
Seal Test Fine Leak
MIL-STD-750 Method 1071
Condition G or H
8
Seal Test Gross Leak
MIL-STD-750 Method 1071
Condition C
Notes:
1. Testing varies in accordance with the device detail specification.
2. Specific customer testing needs may be accommodated into any testing flow (selection
tests, temperature requirements, special tests).
144 Market Street
Kenilworth NJ 07033 USA
phone +1.908.245-7200
fax +1.908.245-0555
[email protected]
www.digitroncorp.com