MQ Series – Medical Grade MLCC General Specifications GENERAL DESCRIPTION AVX offers a wide variety of medically qualified passive components. Medical devices require the utmost reliability with respect to the components incorporated into the designs. Advanced design qualification requirements, in-process controls and requirements and lot acceptance testing are implemented to ensure these components will meet the superior reliability levels of a life supporting application. AVX medical MLCC reliability documents provide an advanced level of designing, manufacturing, testing and qualification that places AVX as the top supplier and industry leader of medically qualified MLCCs. AVX MQ series of medically qualified ceramic capacitors are available in EIA case sizes ranging from 0402 to 2225, at typical voltage ratings between 4 – 200 Vdc with various termination options including Sn, SnPb solder, and Au. APPLICATIONS FEATURES • Implantable cardioverter-defibrillator (ICD) • Pacemakers • Neuromodulation • 0402 to 2225 case sizes • Voltage range from 4v to 100v • Capacitance up to 100μF • Class I & II dielectric materials • Tight tolerances on Class I dielectric materials • Various terminations • Customer specific requirements, screening, & testing HOW TO ORDER MQ02 Z A 100 J G T 3 A Size MQ02 = 0402 MQ03 = 0603 MQ05 = 0805 MQ06 = 1206 MQ10 = 1210 MQ12 = 1812 MQ13 = 1825 MQ14 = 2225 Rated Voltage 4 = 4V 6 = 6.3V Z = 10V Y = 16v 3 = 25V 5 = 50V 1 = 100V Dielectric Code A = NP0 (C0G) C = X7R Z = X7S D = X5R Capacitance Code (In pF) (2 significant digits + number of zeros) for values <10pF: letter R denotes decimal point. Example: 68pF = 680 8.2pF = 8R2 Capacitance Tolerance B = ±0.1pF C = ±0.25pF D = ±0.5pF F = ±1% (≥10pF) G = ±2% (≥10pF) J = ±5% K = ±10% M = ±20% N = ±30% Medical Grade Termination Finish T = Plated Ni & Sn J = 60/40 Sn/Pb B = 5% min Pb Plated Solder 7 = Gold Plated Packaging 1 = 7" Reel 2 = 7" Reel (0402 only) 3 = 13" Reel 4 = 13" Reel (0402 only) 6 = Waffle Special Code A = Standard 050516 Contact AVX for others 113 MQ Series – Medical Grade MLCC NP0 (C0G) – Capacitance & Voltage Range PREFERRED SIZES ARE SHADED 0603 0805 1206 1210 1812 1825 2225 Reflow/Wave All Embossed Reflow/Wave All Embossed Reflow/Wave All Embossed Reflow Only All Embossed Reflow Only All Embossed Reflow Only All Embossed Reflow Only All Embossed mm (in.) (W) Width mm (in.) (t) Terminal mm (in.) Maximum mm Thickness (in.) WVDC Cap 0.5 (pF) 1.0 1.2 1.5 1.8 2.2 2.7 3.3 3.9 4.7 5.6 6.8 8.2 10 12 15 18 22 27 33 39 47 56 68 82 100 120 150 180 220 270 330 390 470 560 680 820 1000 1200 1500 1800 2200 2700 3300 3900 4700 5600 6800 8200 10000 WVDC 1.00 ± 0.10 ((0.040 ± 0.004) 0.50 ± 0.10 (0.020 ± 0.004) 0.25 ± 0.15 (0.010 ± 0.006) 0.56 (0.022) 16 25 50 1.60 ± 0.15 (0.063 ± 0.006) 0.81 ± 0.15 (0.032 ± 0.006) 0.35 ± 0.15 (0.037) 0.94 (0.014 ± 0.006) 16 25 50 2.01 ± 0.20 (0.079 ± 0.008) 1.25 ± 0.20 (0.049 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.52 (0.060) 25 50 100 3.20 ± 0.20 (0.126 ± 0.008) 1.60 ± 0.20 (0.063 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.78 (0.070) 25 50 100 3.20 ± 0.20 (0.126 ± 0.008) 2.50 ± 0.20 (0.098 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.78 (0.070) 25 50 100 4.50 ± 0.30 (0.177 ± 0.012) 3.20 ± 0.20 (0.126 ± 0.008) 0.61 ± 0.36 (0.024 ± 0.014) 2.79 (0.110) 25 50 100 4.50 ± 0.30 (0.177 ± 0.012) 6.40 ± 0.40 (0.252 ± 0.016) 0.61 ± 0.36 (0.024 ± 0.014) 2.79 (0.110) 50 100 5.72 ± 0.25 (0.225 ± 0.010) 6.35 ± 0.25 (0.250 ± 0.010) 0.64 ± 0.39 (0.025 ± 0.015) 2.79 (0.110) 25 50 100 SIZE 0402 16 16 䉲 100 L 䉲 W T 䉲 䉲 䉲 114 6.3 䉲 (L) Length 䉲 0402 Reflow Only All Paper 䉲 SIZE Soldering Packaging 16 25 50 6.3 16 25 0603 50 100 16 25 50 0805 100 16 25 50 1206 100 25 50 1210 100 25 50 1812 100 50 t 100 1825 25 50 100 2225 050516 MQ Series – Medical Grade MLCC NP0 (C0G) – General Specifications TYPICAL ELECTRICAL CHARACTERISTICS ⌬ Capacitance vs. Frequency +2 Typical Capacitance Change Envelope: 0 ± 30 ppm/°C % ⌬ Capacitance % ⌬ Capacitance Temperature Coefficient +0.5 0 -0.5 -55 -35 -15 +5 +25 +45 +65 +85 +105 +125 +1 0 -1 -2 1KHz 10 KHz 1 MHz 10 MHz Variation of Impedance with Cap Value Impedance vs. Frequency 0805 - C0G (NP0) 10 pF p vs. 100 pF vs. p 1000 pF p Insulation Resistance vs. Temperature Insulation Resistance vs Temperature 10,000 100,000 10,000 Impedance, ⍀ Insulation Resistance (Ohm-Farads) 100 KHz Frequency Temperature °C 1,000 100 1,000 100 10 pF 10.0 1.0 100 pF 1000 pF 0.1 0 0 1 20 40 60 80 100 100 10 1000 Frequency, MHz Temperature °C Variation of Impedance with Chip Size Impedance vs. Frequency 1000 pF - C0G (NP0) 10.00 1.0 100 Frequency, MHz 050516 X7R NPO 1206 0805 1812 1210 Impedance, ⍀ Impedance, ⍀ 10 0.1 10 Variation of Impedance with Ceramic Formulation Impedance vs. Frequency 1000 pF - C0G (NP0) vs. X7R 0805 1000 1.00 0.10 0.01 10 100 1000 Frequency, MHz 115 MQ Series – Medical Grade MLCC NP0 (C0G) – Specifications & Test Methods Parameter/Test Operating Temperature Range Capacitance Insulation Resistance NP0 Specification Limits -55ºC to +125ºC Within specified tolerance <30 pF: Q≥ 400+20 x Cap Value ≥30 pF: Q≥ 1000 100,000MΩ or 1000MΩ - μF, whichever is less Dielectric Strength No breakdown or visual defects Q Resistance to Flexure Stresses Appearance Capacitance Variation ±5% or ±.5 pF, whichever is greater Q Meets Initial Values (As Above) Insulation Resistance ≥ Initial Value x 0.3 Solderability Resistance to Solder Heat Appearance Capacitance Variation Q Insulation Resistance Appearance Capacitance Variation Thermal Shock Load Life Q Insulation Resistance Dielectric Strength Appearance Capacitance Variation Q Insulation Resistance Dielectric Strength Appearance Load Humidity 116 Insulation Resistance No defects Measuring Conditions Temperature Cycle Chamber Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF 1.0 kHz ± 10% for cap > 1000 pF Voltage: 1.0Vrms ± .2V Charge device with rated voltage for 120 ± 5 secs @ room temp/humidity Charge device with 250% of rated voltage for 1-5 seconds, with charge and discharge current limited to 50 mA (max) Deflection: 2mm Test Time: 30 seconds 1mm/sec ≥ 85% of each terminal should be covered with fresh solder No defects, <25% leaching of either end terminal 90 mm Dip device in eutectic solder at 245 ± 5ºC for 5.0 ± 0.5 seconds ≤ ±2.5% or ±.25 pF, whichever is greater Meets Initial Values (As Above) MIL-STD-202 / Method 210 / Condition J (Reflow Mounting plus 1 Reflow Cycle @ 235°C ± 5°C) Meets Initial Values (As Above) No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes ≤ ±3.0% or ±.0.3 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 hours at room temperature No visual defects ≤ ±3.0% or ± 0.3 pF, whichever is greater ≥ 30 pF: ≥10 pF, <30 pF: <10 pF: Q≥ 350 Q≥ 275 +5C/2 Q≥ 200 +10C ≥ Initial Value x 0.3 (See Above) Load in test chamber set at 125°C ± 2°C for 1000 hours (+48, -0) with twice rated voltage applied. Remove from test chamber and stabilize at room temperature before measuring. Meets Initial Values (As Above) No visual defects ≥ Initial Value x 0.3 (See Above) Load in a test chamber set at 85°C ± 2°C/85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature before measuring. 050516 MQ Series – Medical Grade MLCC X7R/X7S – General Specifications PREFERRED SIZES ARE SHADED SIZE 0402 0603 0805 1206 1210 Soldering Packaging Reflow Only All Paper Reflow/Wave All Embossed Reflow/Wave All Embossed Reflow/Wave All Embossed Reflow Only All Embossed (L) Length mm (in.) (W) Width mm (in.) (t) Terminal mm (in.) Maximum mm Thickness (in.) WVDC Cap 100 (pF) 150 220 330 470 680 1000 1500 2200 3300 4700 6800 Cap 0.010 (μF) 0.015 0.022 0.033 0.047 0.068 0.10 0.15 0.22 0.33 0.47 0.68 1.0 1.5 2.2 3.3 4.7 10 WVDC 1.00 ± 0.10 ((0.040 ± 0.004) 0.50 ± 0.10 (0.020 ± 0.004) 0.25 ± 0.15 (0.010 ± 0.006) 0.56 (0.022) 10 16 25 50 6.3 1.60 ± 0.15 (0.063 ± 0.006) 0.81 ± 0.15 (0.032 ± 0.006) 0.35 ± 0.15 (0.037) 0.94 (0.014 ± 0.006) 10 16 25 50 100 6.3 10 100 10 3.20 ± 0.20 (0.126 ± 0.008) 2.50 ± 0.20 (0.098 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.78 (0.070) 16 25 50 4.50 ± 0.30 (0.177 ± 0.012) 3.20 ± 0.20 (0.126 ± 0.008) 0.61 ± 0.36 (0.024 ± 0.014) 2.79 (0.110) 100 50 100 10 6.3 10 100 6.3 10 100 10 16 100 SIZE 0402 16 25 50 16 25 0603 50 2.01 ± 0.20 (0.079 ± 0.008) 1.25 ± 0.20 (0.049 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.52 (0.060) 16 25 50 16 25 0805 50 100 6.3 3.20 ± 0.20 (0.126 ± 0.008) 1.60 ± 0.20 (0.063 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.78 (0.070) 10 16 25 50 100 6.3 10 16 25 1206 50 25 1210 1812 50 1825 2225 Reflow Only Reflow Only All Embossed All Embossed 50 100 1812 Reflow Only All Embossed 4.50 ± 0.30 5.72 ± 0.25 (0.177 ± 0.012) (0.225 ± 0.010) 6.40 ± 0.40 6.35 ± 0.25 (0.252 ± 0.016) (0.250 ± 0.010) 0.61 ± 0.36 0.64 ± 0.39 (0.024 ± 0.014) (0.025 ± 0.015) 2.79 2.79 (0.110) (0.110) 50 100 16 25 50 100 50 100 1825 16 25 50 100 2225 䉲 䉲 W 䉲 䉲 L 䉲 These values are produced with X7S temperature coefficient code T 䉲 䉲 䉲 050516 t 117 MQ Series – Medical Grade MLCC X7R/X7S – General Specifications TYPICAL ELECTRICAL CHARACTERISTICS X7R Dielectric Typical Temperature Coefficient ⌬ Capacitance vs. Frequency 10 +30 +20 % ⌬ Capacitance % Cap Change 5 0 -5 -10 -15 -20 -25 -60 -40 -20 0 20 40 60 +10 0 -10 -20 -30 1KHz 80 100 120 140 Temperature °C 100 KHz 1 MHz 10 MHz Frequency Variation of Impedance with Cap Value Impedance vs. Frequency 1,000 pF vs. 10,000 pF - X7R 0805 Insulation Resistance vs. Temperature Insulation Resistance vs Tempera 10,000 10.00 1,000 pF 10,000 pF Impedance, ⍀ Insulation Resistance (Ohm-Farads) 10 KHz 1,000 100 0 0 20 40 60 80 100 1.00 0.10 0.01 10 120 Temperature °C 10 10 1206 0805 1210 Impedance, ⍀ Impedance, ⍀ 1000 Variation of Impedance with Chip Size Impedance vs. Frequency 100,000 pF , p - X7R Variation of Impedance with Chip Size Impedance vs. Frequency 10,000 pF -X7R 1.0 0.1 .01 1 10 100 Frequency, MHz 118 100 Frequency, MHz 1,000 1206 0805 1210 1.0 0.1 .01 1 10 100 1,000 Frequency, MHz 050516 MQ Series – Medical Grade MLCC X7R/X7S – Specifications & Test Methods Parameter/Test Operating Temperature Range Capacitance Insulation Resistance NP0 Specification Limits -55ºC to +125ºC Within specified tolerance ≤ 2.5% for ≥ 50V DC rating ≤ 3.0% for 25V & 35V DC rating ≤ 12.5% for 16V DC rating and lower Contact factory for DF by PN 100,000MΩ or 1000MΩ - μF, whichever is less Dielectric Strength No breakdown or visual defects Dissipation Factor Resistance to Flexure Stresses Appearance Capacitance Variation Dissipation Factor Insulation Resistance Solderability Resistance to Solder Heat Thermal Shock Load Life Load Humidity 050516 Appearance Capacitance Variation Dissipation Factor Insulation Resistance Appearance Capacitance Variation Dissipation Factor Insulation Resistance Dielectric Strength Appearance Capacitance Variation Dissipation Factor Insulation Resistance Dielectric Strength No defects ≤ ±12% Measuring Conditions Temperature Cycle Chamber Frequency: 1.0kHz ± 10% Voltage: 1.0Vrms ± 0.2V Charge device with rated voltage for 120 ± 5 secs @ room temp/humidity Charge device with 250% of rated voltage for 1-5 seconds, with charge and discharge current limited to 50 mA (max) Deflection: 2mm Test Time: 30 seconds 1mm/sec Meets Initial Values (As Above) ≥ Initial Value x 0.3 90 mm ≥ 85% of each terminal should be covered with fresh solder No defects, <25% leaching of either end terminal Dip device in eutectic solder at 245 ± 5ºC for 5.0 ± 0.5 seconds ≤ ±7.5% Meets Initial Values (As Above) MIL-STD-202 / Method 210 / Condition J (Reflow Mounting plus 1 Reflow Cycle @ 235°C ± 5°C) Meets Initial Values (As Above) No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes ≤ ±7.5% Step 2: Room Temp ≤ 3 minutes Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 hours at room temperature No visual defects ≤ ±12.5% ≤ initial value x 2.0 (see above) ≥ Initial Value x 0.3 (See Above) Load in test chamber set at 125°C ± 2°C for 1000 hours (+48, -0) with twice rated voltage applied. Remove from test chamber and stabilize at room temperature before measuring. Meets Initial Values (As Above) Appearance No visual defects Insulation Resistance ≥ Initial Value x 0.3 (See Above) Load in a test chamber set at 85°C ± 2°C/85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature before measuring. 119 MQ Series – Medical Grade MLCC X5R – Capacitance & Voltage Range PREFERRED SIZES ARE SHADED SIZE 0402 0603 0805 1206 1210 1812 Soldering Packaging Reflow Only All Paper Reflow/Wave All Embossed Reflow/Wave All Embossed Reflow/Wave All Embossed Reflow Only All Embossed Reflow Only All Embossed (L) Length mm (in.) (W) Width mm (in.) (t) Terminal mm (in.) Maximum mm Thickness (in.) WVDC Cap 0.01 (μF) 0.015 0.022 0.033 0.047 0.068 0.1 0.15 0.22 0.33 0.47 0.68 1.0 1.5 2.2 3.3 4.7 10 22 47 100 WVDC 4 1.00 ± 0.10 (0.040 ± 0.004) 0.50 ± 0.10 (0.020 ± 0.004) 0.25 ± 0.15 (0.010 ± 0.006) 0.56 (0.022) 6.3 10 16 25 50 4 1.60 ± 0.15 (0.063 ± 0.006) 0.81 ± 0.15 (0.032 ± 0.006) 0.35 ± 0.15 (0.037) 0.94 (0.014 ± 0.006) 6.3 10 16 25 50 6.3 2.01 ± 0.20 (0.079 ± 0.008) 1.25 ± 0.20 (0.049 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.52 (0.060) 10 16 25 50 6.3 3.20 ± 0.20 (0.126 ± 0.008) 1.60 ± 0.20 (0.063 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.78 (0.070) 10 16 25 50 4 3.20 ± 0.20 (0.126 ± 0.008) 2.50 ± 0.20 (0.098 ± 0.008) 0.50 ± 0.25 (0.020 ± 0.010) 1.78 (0.070) 6.3 10 16 25 50 4.50 ± 0.30 (0.177 ± 0.012) 3.20 ± 0.20 (0.126 ± 0.008) 0.61 ± 0.36 (0.024 ± 0.014) 2.79 (0.110) 6.3 10 25 50 4 6.3 50 4 6.3 50 6.3 10 50 6.3 10 50 4 6.3 50 6.3 10 16 25 0402 䉲 䉲 W 䉲 䉲 L 10 16 25 0603 16 25 0805 16 25 1206 10 16 25 10 1210 25 50 1812 䉲 SIZE T 䉲 䉲 䉲 t TYPICAL ELECTRICAL CHARACTERISTICS 20 % ⌬ Capacitance 15 10 5 0 -5 -10 -15 -20 -60 -40 -20 0 +20 +40 Temperature °C 120 +60 +80 Insulation Resistance (Ohm-Farads) Temperature Coefficient Insulation Resistance vs. Temperature Insulation Resistance vs Temperature 10,000 1,000 100 0 0 20 40 60 80 100 120 Temperature °C 050516 MQ Series – Medical Grade MLCC X5R – Specifications & Test Methods Parameter/Test Operating Temperature Range Capacitance Insulation Resistance X5R Specification Limits -55ºC to +85ºC Within specified tolerance ≤ 2.5% for ≥ 50V DC rating ≤ 3.0% for 25V, 35V DC rating ≤ 12.5% Max. for 16V DC rating and lower Contact Factory for DF by PN 10,000MΩ or 500MΩ - μF, whichever is less Dielectric Strength No breakdown or visual defects Dissipation Factor Resistance to Flexure Stresses Appearance Capacitance Variation Dissipation Factor Insulation Resistance Solderability Resistance to Solder Heat Thermal Shock Load Life Load Humidity 050516 Appearance Capacitance Variation Dissipation Factor Insulation Resistance Appearance Capacitance Variation Dissipation Factor Insulation Resistance Dielectric Strength Appearance Capacitance Variation Dissipation Factor Insulation Resistance Dielectric Strength Appearance Insulation Resistance No defects ≤ ±12% Measuring Conditions Temperature Cycle Chamber Freq.: 1.0 kHz ± 10% Voltage: 1.0Vrms ± .2V For Cap > 10 μF, 0.5Vrms @ 120Hz Charge device with rated voltage for 120 ± 5 secs @ room temp/humidity Charge device with 150% of rated voltage for 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Deflection: 2mm Test Time: 30 seconds 1mm/sec Meets Initial Values (As Above) ≥ Initial Value x 0.3 90 mm ≥ 85% of each terminal should be covered with fresh solder No defects, <25% leaching of either end terminal Dip device in eutectic solder at 245 ± 5ºC for 5.0 ± 0.5 seconds ≤ ±7.5% Meets Initial Values (As Above) MIL-STD-202 / Method 210 / Condition J (Reflow Mounting plus 1 Reflow Cycle @ 235°C ± 5°C) Meets Initial Values (As Above) No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes ≤ ±7.5% Step 2: Room Temp ≤ 3 minutes Meets Initial Values (As Above) Step 3: +85ºC ± 2º 30 ± 3 minutes Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 ± 2 hours at room temperature No visual defects ≤ ±12.5% ≤ Initial Value x 2.0 (See Above) ≥ Initial Value x 0.3 (See Above) Load in test chamber set at 85°C ± 2°C for 1000 hours (+48, -0) with twice rated voltage applied. Remove from test chamber and stabilize at room temperature before measuring. Meets Initial Values (As Above) No visual defects ≥ Initial Value x 0.3 (See Above) Load in a test chamber set at 85°C ± 2°C/85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature before measuring. 121