HI-5042 thru HI-5051 TM Data Sheet April 2000 File Number 3127.4 CMOS Analog Switches Features This family of CMOS analog switches offers low resistance switching performance for analog voltages up to the supply rails and for signal currents up to 80mA. “ON” resistance is low and stays reasonably constant over the full range of operating signal voltage and current. rON remains exceptionally constant for input voltages between +5V and -5V and currents up to 50mA. Switch impedance also changes very little over temperature, particularly between 0oC and 75oC. rON is nominally 25Ω for HI-5049 and HI-5051 and 50Ω for HI-5042 through HI-5047. • Wide Analog Signal Range . . . . . . . . . . . . . . . . . . . ±15V All devices provide break-before-make switching and are TTL and CMOS compatible for maximum application versatility. Performance is further enhanced by Dielectric Isolation processing which insures latch-free operation with very low input and output leakage currents (0.8nA at 25oC). This family of switches also features very low power operation (1.5mW at 25oC). There are 7 devices in this switch series which are differentiated by type of switch action and value of rON (see Functional Description Table). The HI-504X and HI-505X series switches can directly replace IH-5040 series devices, and are functionally compatible with the DG180 and DG190 family. • Low “ON” Resistance . . . . . . . . . . . . . . . . . . . . . . . . . 25Ω • High Current Capability . . . . . . . . . . . . . . . . . . . . . . 80mA • Break-Before-Make Switching - Turn-On Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . 370ns - Turn-Off Time . . . . . . . . . . . . . . . . . . . . . . . . . . . 280ns • No Latch-Up • Input MOS Gates are Protected from Electrostatic Discharge • DTL, TTL, CMOS, PMOS Compatible Applications • High Frequency Switching • Sample and Hold • Digital Filters • Operational Amplifier Gain Switching Functional Diagram S Ordering Information A PART NUMBER TEMP. RANGE (oC) PACKAGE PKG. NO. HI1-5042-2 -55 to 125 16 Ld CERDIP F16.3 HI1-5043-2 -55 to 125 16 Ld CERDIP F16.3 HI1-5043-5 0 to 75 16 Ld CERDIP F16.3 HI3-5043-5 0 to 75 16 Ld PDIP E16.3 HI9P5043-5 0 to 75 16 Ld SOIC M16.15 HI1-5047-5 0 to 75 16 Ld CERDIP F16.3 HI1-5049-5 0 to 75 16 Ld CERDIP F16.3 HI1-5051-2 -55 to 125 16 Ld CERDIP F16.3 HI1-5051-5 0 to 75 16 Ld CERDIP F16.3 HI3-5051-5 0 to 75 16 Ld PDIP E16.3 HI9P5051-9 -40 to 85 16 Ld SOIC M16.15 1 P N D Functional Description PART NUMBER TYPE rON HI-5042 SPDT 50Ω HI-5043 Dual SPDT 50Ω HI-5047 4PST 50Ω HI-5049 Dual DPST 25Ω HI-5051 Dual SPDT 25Ω CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Intersil and Design is a trademark of Intersil Corporation. | Copyright © Intersil Corporation 2000 HI-5042 thru HI-5051 Pinouts Pinouts (SWITCHES SHOWN FOR LOGIC “0” INPUT) Single Control (SWITCHES SHOWN FOR LOGIC “0” INPUT) Dual Control SPDT HI-5042 (50Ω) 4PST HI-5047 (50Ω) 16 S1 D1 1 DUAL SPDT HI-5043 (50Ω), HI-5051 (25Ω) 16 S2 DUAL DPST HI-5049 (25Ω) D1 1 16 S1 D1 1 16 S1 2 15 A 2 15 A 2 15 A1 2 15 A1 D2 3 14 V- D1 3 14 V- D3 3 14 V- D3 3 14 V- S2 4 5 13 VR 12 VL S1 4 S4 5 13 VR 12 VL S3 4 S4 5 13 VR S3 4 13 VR 12 VL S4 5 12 VL 6 11 V+ D4 6 11 V+ D4 6 11 V+ D4 6 11 V+ 7 10 7 7 10 A2 7 10 A2 8 9 D3 8 D2 8 9 S2 D2 8 9 S2 D2 1 10 9 S3 NOTE: Unused pins may be internally connected. Ground all unused pins. Switch Functions NOTE: Unused pins may be internally connected. Ground all unused pins. (SWITCHES SHOWN FOR LOGIC “1” INPUT) SPDT HI-5042 (50Ω) VL 12 S1 S2 A DUAL SPDT HI-5043 (50Ω) V+ VL 12 11 16 1 4 D1 S1 S3 3 D2 A1 A2 S2 15 S4 13 VR 12 S1 S2 S3 S4 A 10 9 5 13 V- VR 3 D1 D3 8 6 D2 D4 14 V- DUAL DPST HI-5049 (25Ω) V+ VL 12 11 3 16 1 9 8 5 6 D1 S1 D2 S3 D3 D4 15 A1 A2 S2 S4 13 1 15 14 4 VR 11 16 4 4PST HI-5047 (50Ω) VL V+ 14 VL 11 12 1 4 15 3 D1 D3 S1 S3 A1 10 9 5 8 6 VR 2 V+ 16 13 V- DUAL SPDT HI-5051 (25Ω) 14 V- D2 D4 A2 S2 S4 V+ 11 16 1 4 15 3 D1 D3 8 6 D2 10 9 5 13 VR 14 V- D4 HI-5042 thru HI-5051 Schematic Diagrams V+ P15 VL P16 QP6 25µA QP5 QP1 N13 25µA QP4 100µA QP3 QN1 R3 R6 25µA 35µA P14 R4 R2 QP7 QN2 VR TO VR’ 25µA 25µA V+ R5 16µA P13 QP8 R7 QP2 N14 V- N15 N16 to VL’ NOTE: Connect V+ to VL for minimizing power consumption when driving from CMOS circuits. TTL/CMOS REFERENCE CIRCUIT (NOTE) A1 (A2) N1 V+ N3 IN OUT P2 N2 VP1 A1 (A2) SWITCH CELL V+ P3 P5 P1 V+ P4 N1 P6 D1 R4 P8 P7 P9 P10 P11 P12 A1 A1 VR' A 200Ω D2 A2 A2 VL' N6 V- N7 N8 N9 P2 N4 N2 N5 N3 V- NOTE: All N-Channel bodies to V-, all P-Channel bodies to V+ except as shown. DIGITAL INPUT BUFFER AND LEVEL SHIFTER 3 N10 N11 N12 HI-5042 thru HI-5051 Absolute Maximum Ratings Thermal Information Supply Voltage (V+ to V-). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36V VR to Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V+, VDigital and Analog Input Voltage . . . . . . . . . . . . (V+) +4V to (V-) -4V Analog Current (S to D) Continuous . . . . . . . . . . . . . . . . . . . . 30mA Analog Current (S to D) Peak . . . . . . . . . . . . . . . . . . . . . . . . . 80mA Thermal Resistance (Typical, Note 1) θJA (oC/W) θJC (oC/W) CERDIP Package. . . . . . . . . . . . . . . . . 75 22 SOIC Package . . . . . . . . . . . . . . . . . . . 110 N/A PDIP Package . . . . . . . . . . . . . . . . . . . 90 N/A Maximum Junction Temperature Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150oC Ceramic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .175oC Maximum Storage Temperature. . . . . . . . . . . . . . . . -65oC to 150oC Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . 300oC (SOIC - Lead Tips Only) Operating Conditions Temperature Range HI-50XX-2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC HI-50XX-5. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0oC to 75oC HI-50XX-9. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. θJA is measured with the component mounted on an evaluation PC board in free air. Electrical Specifications Supplies = +15V, -15V; VR = 0V; VAH (Logic Level High) = 2.4V, VAL (Logic Level Low) = 0.8V, VL = 5V, Unless Otherwise Specified. For Test Conditions, Consult Performance Characteristics, Unused Pins are Grounded TEST CONDITIONS PARAMETER -2 -5, -9 TEMP (oC) MIN TYP MAX MIN TYP MAX UNITS 25 - 370 500 - 370 500 ns DYNAMIC CHARACTERISTICS Switch ON Time, tON (Note 5) Switch OFF Time, tOFF (Note 5) 25 - 280 500 - 280 500 ns Charge Injection, Q (Note 3) 25 - 5 20 - 5 - mV OFF Isolation (Note 4) 25 75 80 - - 80 - dB Crosstalk (Note 4) 25 80 88 - - 88 - dB Input Switch Capacitance, CS(OFF) 25 - 11 - - 11 - pF Output Switch Capacitance, CD(OFF) 25 - 11 - - 11 - pF Output Switch Capacitance, CD(ON) 25 - 22 - - 22 - pF Digital Input Capacitance, CA 25 - 5 - - 5 - pF Drain To Source Capacitance, CDS(OFF) 25 - 0.5 - - 0.5 - pF Input Low Threshold, VAL Full - - 0.8 - - 0.8 V Input High Threshold, VAH Full 2.4 - - 2.4 - - V Input Leakage Current (High or Low), IA Full - 0.01 1.0 - 0.01 1.0 µA Full -15 - +15 -15 - +15 V 25 - 50 75 - 50 75 Ω Full - - 150 - - 150 Ω DIGITAL INPUT CHARACTERISTICS ANALOG SWITCH CHARACTERISTICS Analog Signal Range ON Resistance, rON HI-5042 to HI-5047 (Note 2) 25 - 25 45 - 25 45 Ω Full - - 50 - - 50 Ω HI-5042 to HI-5047 25 - 2 10 - 2 10 Ω HI-5049, HI-5051 25 - 1 5 - 1 5 Ω 25 - 0.8 2 - 0.8 2 nA Full - 100 200 - 100 200 nA HI-5049, HI-5051 (Note 2) Channel-to-Channel Match, ∆rON OFF Input or Output Leakage Current, IS(OFF) = ID(OFF) 4 HI-5042 thru HI-5051 Electrical Specifications Supplies = +15V, -15V; VR = 0V; VAH (Logic Level High) = 2.4V, VAL (Logic Level Low) = 0.8V, VL = 5V, Unless Otherwise Specified. For Test Conditions, Consult Performance Characteristics, Unused Pins are Grounded (Continued) TEST CONDITIONS PARAMETER -2 TEMP (oC) MIN TYP ON Leakage Current, ID(ON) -5, -9 MAX MIN TYP MAX UNITS 25 - 0.01 2 - 0.01 2 nA Full - 2 200 - 2 200 nA 25 - 1.5 - - 1.5 - mW POWER REQUIREMENTS Quiescent Power Dissipation, PD I+, I-, IL , IR 25 - - 0.2 - - 0.3 mA I+, +15V Quiescent Current (Note 5) Full - - 0.3 - - 0.5 mA I-, -15V Quiescent Current (Note 5) Full - - 0.3 - - 0.5 mA IL , +5V Quiescent Current (Note 5) Full - - 0.3 - - 0.5 mA IR , Ground Quiescent Current (Note 5) Full - - 0.3 - - 0.5 mA NOTES: 2. VOUT = ±10V, IOUT = 1mA. 3. VIN = 0V, CL = 10nF. 4. RL = 100Ω, f = 100kHz, VIN = 2.0VP-P , CL = 5pF. 5. VAL = 0V, VAH = 5V. Test Circuits and Waveforms TA = 25oC, V+ = +15V, V- = -15V, VL = +5V, VR = 0V, VAH = 3V and VAL = 0.8V Unless Otherwise Specified 1mA rON = V2 V2 1mA IN OUT ±VIN FIGURE 1A. TEST CIRCUIT NORMALIZED ON RESISTANCE (REFERRED TO 25oC) ON RESISTANCE (Ω) 80 60 V+ = +12V V- = -12V V+ = +10V V- = -10V 40 20 0 -15 V+ = +15V V- = -15V 1.2 1.1 VIN = 0V 1.0 0.9 0.8 0.7 0.6 -10 0 5 -5 ANALOG SIGNAL LEVEL (V) 10 -50 15 0 25 50 75 100 125 TEMPERATURE (oC) FIGURE 1B. ON RESISTANCE vs ANALOG SIGNAL LEVEL FIGURE 1C. NORMALIZED ON RESISTANCE vs TEMPERATURE FIGURE 1. ON RESISTANCE 5 -25 HI-5042 thru HI-5051 Test Circuits and Waveforms TA = 25oC, V+ = +15V, V- = -15V, VL = +5V, VR = 0V, VAH = 3V and VAL = 0.8V Unless Otherwise Specified (Continued) OFF LEAKAGE CURRENT 100nA A IS(OFF) = ID(OFF) 10nA ID(OFF) IN OUT A ±10V ± LEAKAGE CURRENT IS(OFF) 10V ON LEAKAGE CURRENT 1nA IN OUT ID(ON) 100pA A ID(ON) ±10V 10pA 25 50 75 100 125 TEMPERATURE (oC) FIGURE 2A. LEAKAGE CURRENTS vs TEMPERATURE FIGURE 2B. TEST CIRCUITS FIGURE 2. LEAKAGE CURRENTS NORMALIZED ON RESISTANCE (REFERRED TO 1mA) 1.4 1.3 1.2 IN OUT I ±VIN 1.1 V IN r ON = --------I 1.0 0 20 40 60 80 ANALOG CURRENT (mA) FIGURE 3A. NORMALIZED ON RESISTANCE vs ANALOG CURRENT FIGURE 3B. TEST CIRCUIT FIGURE 3. NORMALIZED ON RESISTANCE OFF ISOLATION (dB) -200 IN -160 VIN 2VP-P RL = 100Ω -120 -80 -40 10 100 1K 10K VOUT 50Ω V OUT OFF ISOLATION = 20 Log ---------------- V IN RL = 10kΩ 1 OUT 100K 1M FREQUENCY (Hz) FIGURE 4A. OFF ISOLATION vs FREQUENCY FIGURE 4C. OFF ISOLATION 6 FIGURE 4B. TEST CIRCUIT RL HI-5042 thru HI-5051 Test Circuits and Waveforms TA = 25oC, V+ = +15V, V- = -15V, VL = +5V, VR = 0V, VAH = 3V and VAL = 0.8V Unless Otherwise Specified (Continued) CROSSTALK (dB) 200 SWITCHED CHANNEL 160 VIN 2VP-P 120 50Ω VOUT RL RL 80 40 V IN CROSSTALK = 20 Log ---------------- V OUT 0 1 10 100 1K 10K 100K 1M FREQUENCY (Hz) FIGURE 5A. CROSSTALK vs FREQUENCY FIGURE 5B. TEST CIRCUIT FIGURE 5. CROSSTALK POWER CONSUMPTION (mW) 200 160 +10V -10V 120 TOGGLE AT 50% DUTY A VL VR V+ V- 80 IL I+ I- 40 +5V +15V -15V 0 1K 10K 100K 1M TOGGLE FREQUENCY (50% DUTY CYCLE) (Hz) FIGURE 6A. POWER CONSUMPTION vs FREQUENCY FIGURE 6B. TEST CIRCUIT FIGURE 6. POWER CONSUMPTION VAH VA IN1 OUT 1 90% 90% +10V OUT 1 OUT 2 IN2 1K tON tOFF 90% 1K 90% VA tOFF FIGURE 7A. TEST CIRCUIT 7 tON FIGURE 7B. MEASUREMENT POINTS OUT 2 HI-5042 thru HI-5051 Test Circuits and Waveforms TA = 25oC, V+ = +15V, V- = -15V, VL = +5V, VR = 0V, VAH = 3V and VAL = 0.8V Unless Otherwise Specified (Continued) VA VA OUTPUT OUTPUT 720 720 660 660 600 600 540 INPUT) VA = 0V to 10V Vertical: 5V/Div. Horizontal: 200ns/Div. FIGURE 7D. WAVEFORMS WITH CMOS COMPATIBLE LOGIC INPUT 540 (NEED (NEED INPUT) VA = 0V to 5V Vertical: 2V/Div. Horizontal: 200ns/Div. FIGURE 7C. WAVEFORMS WITH TTL COMPATIBLE LOGIC INPUT 360 480 420 tON 360 300 tOFF 240 480 420 240 180 180 120 120 60 2.4 tON 300 tOFF 60 3.0 3.6 4.2 4.8 0 DIGITAL “HIGH” (V) 1.0 1.5 DIGITAL “LOW” (V) FIGURE 7E. SWITCHING TIMES vs POSITIVE DIGITAL VOLTAGE FIGURE 7F. SWITCHING TIMES vs NEGATIVE DIGITAL VOLTAGE FIGURE 7. SWITCH tON AND tOFF 8 0.5 HI-5042 thru HI-5051 Dual-In-Line Plastic Packages (PDIP) E16.3 (JEDEC MS-001-BB ISSUE D) N 16 LEAD DUAL-IN-LINE PLASTIC PACKAGE E1 INDEX AREA 1 2 3 INCHES N/2 -B- -AD E BASE PLANE -C- A2 SEATING PLANE A L D1 e B1 D1 A1 eC B 0.010 (0.25) M C A B S SYMBOL MIN MAX MIN MAX NOTES A - 0.210 - 5.33 4 A1 0.015 - 0.39 - 4 A2 0.115 0.195 2.93 4.95 - B 0.014 0.022 0.356 0.558 - C L B1 0.045 0.070 1.15 1.77 8, 10 eA C 0.008 0.014 C D 0.735 0.775 D1 0.005 - E 0.300 0.325 E1 0.240 0.280 6.10 eB NOTES: 1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control. 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication No. 95. 4. Dimensions A, A1 and L are measured with the package seated in JEDEC seating plane gauge GS-3. 5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm). 6. E and eA are measured with the leads constrained to be perpendicular to datum -C- . 7. eB and eC are measured at the lead tips with the leads unconstrained. eC must be zero or greater. 8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm). 9. N is the maximum number of terminal positions. 10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm). 9 MILLIMETERS e 0.100 BSC eA 0.300 BSC eB - L 0.115 N 16 0.204 0.355 18.66 - 19.68 5 0.13 - 5 7.62 8.25 6 7.11 5 2.54 BSC - 7.62 BSC 6 0.430 - 0.150 2.93 16 10.92 7 3.81 4 9 Rev. 0 12/93 HI-5042 thru HI-5051 Small Outline Plastic Packages (SOIC) M16.15 (JEDEC MS-012-AC ISSUE C) N INDEX AREA H 0.25(0.010) M 16 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE B M E INCHES -B- 1 2 SYMBOL 3 L SEATING PLANE -A- h x 45o A D -C- α e A1 B 0.25(0.010) M 0.10(0.004) C A M B S NOTES: 1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95. 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. 4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side. 5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area. 6. “L” is the length of terminal for soldering to a substrate. 7. “N” is the number of terminal positions. 8. Terminal numbers are shown for reference only. 9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch). 10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact. 10 MAX MILLIMETERS MIN MAX NOTES A 0.0532 0.0688 1.35 1.75 - A1 0.0040 0.0098 0.10 0.25 - B 0.013 0.020 0.33 0.51 9 C 0.0075 0.0098 0.19 0.25 - D 0.3859 0.3937 9.80 10.00 3 E 0.1497 0.1574 3.80 4.00 4 e C MIN 0.050 BSC 1.27 BSC - H 0.2284 0.2440 5.80 6.20 - h 0.0099 0.0196 0.25 0.50 5 L 0.016 0.050 0.40 1.27 6 N α 16 0o 16 8o 0o 7 8o Rev. 0 12/93 HI-5042 thru HI-5051 Ceramic Dual-In-Line Frit Seal Packages (CERDIP) F16.3 MIL-STD-1835 GDIP1-T16 (D-2, CONFIGURATION A) LEAD FINISH c1 16 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGE -D- -A- BASE METAL E M -Bbbb S C A-B S -C- S1 0.200 - 5.08 - 0.026 0.36 0.66 2 b1 0.014 0.023 0.36 0.58 3 b2 0.045 0.065 1.14 1.65 - eA e ccc M C A - B S eA/2 c aaa M C A - B S D S D S NOTES - b2 b MAX 0.014 α A A MIN b A L MILLIMETERS MAX A Q SEATING PLANE MIN M (b) D BASE PLANE SYMBOL b1 SECTION A-A D S INCHES (c) NOTES: 1. Index area: A notch or a pin one identification mark shall be located adjacent to pin one and shall be located within the shaded area shown. The manufacturer’s identification shall not be used as a pin one identification mark. 2. The maximum limits of lead dimensions b and c or M shall be measured at the centroid of the finished lead surfaces, when solder dip or tin plate lead finish is applied. 3. Dimensions b1 and c1 apply to lead base metal only. Dimension M applies to lead plating and finish thickness. 4. Corner leads (1, N, N/2, and N/2+1) may be configured with a partial lead paddle. For this configuration dimension b3 replaces dimension b2. 5. This dimension allows for off-center lid, meniscus, and glass overrun. 6. Dimension Q shall be measured from the seating plane to the base plane. 7. Measure dimension S1 at all four corners. 8. N is the maximum number of terminal positions. 9. Dimensioning and tolerancing per ANSI Y14.5M - 1982. 10. Controlling dimension: INCH. b3 0.023 0.045 0.58 1.14 4 c 0.008 0.018 0.20 0.46 2 c1 0.008 0.015 0.20 0.38 3 D - 0.840 - 21.34 5 E 0.220 0.310 5.59 7.87 5 e 0.100 BSC 2.54 BSC - eA 0.300 BSC 7.62 BSC - eA/2 0.150 BSC 3.81 BSC - L 0.125 0.200 3.18 5.08 - Q 0.015 0.060 0.38 1.52 6 S1 0.005 - 0.13 - 7 α 90o 105o 90o 105o - aaa - 0.015 - 0.38 - bbb - 0.030 - 0.76 - ccc - 0.010 - 0.25 - M - 0.0015 - 0.038 2, 3 N 16 16 8 Rev. 0 4/94 All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification. Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web site www.intersil.com Sales Office Headquarters NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (321) 724-7000 FAX: (321) 724-7240 11 EUROPE Intersil SA Mercure Center 100, Rue de la Fusee 1130 Brussels, Belgium TEL: (32) 2.724.2111 FAX: (32) 2.724.22.05 ASIA Intersil Ltd. 8F-2, 96, Sec. 1, Chien-kuo North, Taipei, Taiwan 104 Republic of China TEL: 886-2-2515-8508 FAX: 886-2-2515-8369