VISHAY DALE THIN FILM www.vishay.com Film Resistors Technical Note Vishay Thin Film Engineering Test Report PLT CHIP RESISTOR - SURGE IMMUNITY TESTING 1. Background Surge immunity or electromagnetic compatibility can be defined as a system or device’s ability to withstand continuous or pulsed/transient energy from external sources without having adverse affect on its’ performance. In this testing we conducted pulse or transient surge immunity testing in order to understand how Vishay Thin Film’s PLT product line would perform over a range of transient voltage levels. 2. Experimental Methods Surge immunity testing, for this study, was conducted according to IEC standard 60115-1, paragraph 4.27 using the 1.2/50 μs waveform. Samples for the testing were selected from 3 different case sizes and multiple values as detailed in table 1 below. TABLE 1 - SAMPLE DETAILS CASE SIZE RESISTANCE VALUE 0603 301 1206 250 2512 100 1 k 10 k 25 k 12.3 k 50 k 100 k 50 k To facilitate the application of voltage pulses to the device under test (DUT), samples were mounted to FR-4 test cards and inserted into a testing fixture as shown in figure 1 below. Voltage pulses, following the 1.2/50 μs, waveform were generated using a Schaffner NSG650 High Energy Pulse Generator. Prior to conducting the testing, the voltage waveform was verified using a Tektronix TDS3034B oscilloscope. This measured waveform is shown in figure 2. Based on scaling, each 200 mV division shown below is equivalent to 200 V. Revision: 27-Sep-12 Document Number: 60123 1 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 TECHNICAL NOTE Fig. 1 - Test Fixture Technical Note www.vishay.com Vishay Dale Thin Film Vishay Thin Film Engineering Test Report Fig. 2 - 1.2/50 μs Waveform Verification U 1.0 B 0.9 0.5 T2 0.3 A 0.1 0.0 O1 T T1 TECHNICAL NOTE Front time: Time to half-value: 30 % max. t T1 = 1.67× T = 1.2 μs ± 30 % T2 = 50 μs ± 20 % Fig. 3 - Waveform of Open-circuit Voltage (1.2/50 μs) at the Output of the Generator with no CDN connected (waveform definition according to IEC 60060-1) Testing was conducted by subjecting sample groups of 10 resistors, individually, to incrementally higher voltage pulses, starting with 200 V, until a resistance delta greater than 0.5 % was observed. New samples were used for each voltage pulse level. Due to the pulse generator lower voltage limit of 200 V, the low value chips, 1 k, were tested in series instead of individually as was the case on the higher resistance values. Once again, new groups of samples were used for each voltage pulse level. Revision: 27-Sep-12 Document Number: 60123 2 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 Technical Note www.vishay.com Vishay Dale Thin Film Vishay Thin Film Engineering Test Report 3. Results and Discussion Table 2 below, is a summary of applied pulse voltage levels and the corresponding minimum and maximum deltas. As the data shows, VTF’s thin film PLT product line is minimally affected by periodic pulses, on higher resistance values up to 2 kV, in the 0805 and 1206 case sizes. The smaller case sizes are minimally affected up to 1.2 kV and 1.4 kV on critical and high values. As previously stated, the low value resistors were tested in series. The resultant voltage drop across the resistors is reflected in the reported pulse test voltage levels in table 2. As the data shows, VTF’s low value PLT resistors are minimally affected up to 125 V on the 0805 and 1206 case sizes and 50 V for the 0603 case size. TABLE 2 - SURGE IMMUNITY TEST RESULTS SUMMARY TECHNICAL NOTE SAMPLE DELTA DESCRIPT. RES. PLT0603 - 301 PLT0603 - 301 PLT0603 - 1 k PLT0603 - 1 k PLT0603 - 10 k PLT0603 - 10 k PLT0603 - 25 k PLT0603 - 25 k PLT0805 - 250 PLT0805 - 250 PLT0805 - 50 k PLT0805 - 50 k PLT1206 - 100 PLT1206 - 100 PLT1206 - 12.3 k PLT1206 - 12.3 k PLT1206 - 50 k PLT1206 - 50 k PLT1206 - 100 k PLT1206 - 100 k PULSE TEST VOLTAGE LEVEL 20 25 30 40 50 75 100 125 150 175 200 Min. 0.000 - 0.005 - 0.001 - 0.001 - 0.007 18.386 Max. 0.000 0.000 0.000 0.009 0.080 59.911 Min. 0.000 - 0.001 - 0.001 0.000 - 0.001 0.000 - 0.001 - 0.001 0.001 - 0.013 0.000 Max. 0.002 0.001 0.000 0.001 0.001 0.002 0.001 0.003 0.022 0.007 63.768 400 600 800 1000 1200 1400 1600 1800 2000 Min. 0.000 - 0.001 0.006 0.103 Max. 0.000 0.010 0.040 50.940 Min. 0.000 0.000 0.000 0.000 0.000 - 0.007 - 0.003 Max. 0.001 0.002 0.001 0.002 0.001 0.002 0.881 Min. 0.000 0.000 0.000 0.000 0.000 0.000 0.000 5.825 Max. 0.000 0.000 0.000 0.000 0.000 0.000 0.000 310.487 Min. - 0.001 - 0.001 - 0.001 0.000 - 0.001 0.000 - 0.002 - 0.001 - 0.001 - 0.001 Max. 0.000 0.000 - 0.001 0.000 0.000 0.003 0.000 0.000 0.000 0.005 Min. 0.000 - 0.001 0.000 - 0.001 0.000 0.000 - 0.001 - 0.001 0.361 Max. 0.002 0.002 0.002 0.001 0.003 0.002 0.003 0.002 1.729 Min. 0.000 0.000 0.000 - 0.002 - 0.003 - 0.002 11.599 Max. 0.001 0.001 0.001 0.004 0.007 0.120 40.944 Min. 0.001 0.001 0.001 0.000 0.000 0.002 - 0.001 - 0.089 0.007 0.010 Max. 0.002 0.002 0.002 0.002 0.004 0.011 0.024 0.027 0.068 0.067 Min. - 0.003 - 0.002 - 0.001 - 0.002 - 0.001 - 0.002 - 0.001 - 0.001 - 0.001 - 0.002 Max. 0.002 0.003 0.003 0.002 0.001 0.003 0.452 0.003 0.047 0.003 This pulse test data is also presented in graphical format in figures 4 through 7 of appendix A. Revision: 27-Sep-12 Document Number: 60123 3 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 Technical Note www.vishay.com Vishay Dale Thin Film Vishay Thin Film Engineering Test Report 4. Conclusion Based on the results of this work, it can be concluded that VTF’s PLT product line is able to withstand high pulse loads, with minimal affect on performance, when tested in accordance to IEC 60115-1 requirements. Appendix A TECHNICAL NOTE Fig. 4 - Low Value Surge Immunity Test Results Fig. 5 - 0603 Case Size Surge Immunity Test Results Revision: 27-Sep-12 Document Number: 60123 4 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 Technical Note www.vishay.com Vishay Dale Thin Film Vishay Thin Film Engineering Test Report TECHNICAL NOTE Fig. 6 - 0805 Case Size Surge Immunity Test Results Fig. 7 - 1206 Case Size Surge Immunity Test Results Revision: 27-Sep-12 Document Number: 60123 5 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000