Degradation of Infrared Emitting Diodes

Vishay Semiconductors
Degradation of IREDs
The diagrams in figure 103 and figure 104 are based on electrical life tests, calculated with Ea = 0.8 eV at
Tj = 25°C.
20
10
IF=50mA
IF=50mA
Degradation ( % )
Degradation ( % )
8
6
4
94 8169
104
0
103
105
Time (h)
Figure 103. Average degradation of TSUS 5.
Document Number 80084
02-02
10
5
2
0
103
15
94 8170
104
105
Time (h)
Figure 104. Average degradation of TSHA 5.
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