8886

Document 243
Ultra-Small CO Driver Transformers
This product is not RoHS-compliant. Contact Coilcraft
for current status or possible alternatives.
To meet the demand for even higher density DSLAM
configurations, Coilcraft has introduced these ultra-small
Central Office magnetics.
These line driver transformers come in an EP7 package.
Compared to conventional EP13 designs, they feature:
• 58% less volume (under 0.078 in³)
• 42% smaller footprint (just 0.22 in²)
• 30% lower height (less than 0.36 in)
Part
number
Style
AS8886-B
SMD
AS9006-A
SMD
AS9015-A
SMD
Line side
inductance
(µH)
1000 ±6%
  400 ±5%
   74 ±10%
Part
Turns ratio
number
line:chip
AS8886-B
1.81 : 1
AS9006-A
1.80 : 1
AS9015-A
1.41 : 1
Capacitance
max (pF)
N/A
40
35
Leakage
Dielectric
DCR max (Ohms)strength
inductance
max (µH)
Chip side Line side
(V)
6.0
0.44 (8-6), 0.44 (7-5) 0.87 (1-3, 2-4)
1875
5.0
0.23 (8-6), 0.27 (7-5) 0.80 (1-3, 2-4)
1875
6.0
0.58 (8-6), 0.75 (7-5) 0.94 (1-3, 2-4)
1875
Longitudinal
balance
(dB) min
45 at 30 kHz – 1.1 MHz
60 at 100 kHz
45 at 20 kHz – 1.1 MHz
THD
typ (dB)
–85 at 20 kHz
–85 at 100 kHz
–92 at 20 kHz
Designed
to meet
UL 1950
UL 1950
UL 1950
1.All electrical specifications referenced to line side.
2.Operating temperature range -40° C to +85° C.
3.Electrical specifications at 25° C.
0.420
max
10,7
Recommended
Land Pattern
8
5
0.520 max
13,2
Dot over
pin 1
0.530
13,46
0.370
9,4
1
4
Dimensions are in
0.355 max
9,0
inches
mm
0.080
2,03
Line side
0.050
1,27
Chip side
1
8
3
2
6
7
4
5
0.098
2,5
Packaging 350/13″ reel; Plastic tape: 24 mm wide, 0.42 mm thick,
16 mm pocket spacing, 9.16 mm pocket depth
US +1-847-639-6400 [email protected]
UK +44-1236-730595 [email protected]
Taiwan +886-2-2264 3646 [email protected]
China +86-21-6218 8074 [email protected]
Singapore + 65-6484 8412 [email protected]
Document 243 Revised 06/10/09
© Coilcraft Inc. 2013
This product may not be used in medical or high
risk applications without prior Coilcraft approval.
Specification subject to change without notice.
Please check web site for latest information.
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