Datasheet

UNISONIC TECHNOLOGIES CO., LTD
U74LVC1G00
CMOS IC
SINGLE 2-INPUT NAND GATE

DESCRIPTION
The U74LVC1G00 is a 2-input NAND gate device which provides
the Function Y=A  B or Y=A  B in positive logic.
This device has power-down protective circuit preventing device
from destruction when it is powered down.

FEATURES
* Op erate From 1.65V to 5.5V
* Inputs Accept Voltages To 5.5V
* High Noise Immunity
* Low Power Dissipation
* Max tPD of 3.8 ns at 3.3V

ORDERING INFORMATION
Ordering Number
Lead Free
Halogen Free
U74LVC1G00L-AE5-R
U74LVC1G00G-AE5-R
U74LVC1G00L-AF5-R
U74LVC1G00G-AF5-R
U74LVC1G00L-AL5-R
U74LVC1G00G-AL5-R

Package
Packing
SOT-23-5
SOT-25
SOT-353
Tape Reel
Tape Reel
Tape Reel
MARKING
www.unisonic.com.tw
Copyright © 2014 Unisonic Technologies Co., Ltd
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QW-R502-401.C
U74LVC1G00

PIN CONFIGURATION

FUNCTION TABLE
INPUT(A)
CMOS IC
INPUT(B)
H
H
H
L
L
H
L
L
Note: H: HIGH voltage level; L: LOW voltage level.

OUTPUT(Y)
L
H
H
H
LOGIC DIAGRAM (positive logic)
Logic symbol
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IEC logic symbol
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
CMOS IC
ABSOLUTE MAXIMUM RATING (unless otherwise specified)
PARAMETER
SYMBOL
VCC
VIN
Supply Voltage
Input Voltage
RATINGS
-0.5 ~ +6.5
-0.5 ~ +6.5
-0.5 ~ +0.5
Output in the high or low state
VOUT
Output in the high-impedance or
-0.5 ~ +6.5
power-off state
VCC or GND Current (Output in the power-off state)
ICC
±100
Continuous Output Current (VOUT=0 to VCC)
IOUT
±50
Input Clamp Current (VIN<0)
IIK
-50
Output Clamp Current (VOUT<0)
IOK
-50
Storage Temperature Range
TSTG
-65 ~ +150
Note: Absolute maximum ratings are those values beyond which the device could be permanently damaged.
Absolute maximum ratings are stress ratings only and functional device operation is not implied.
Output Voltage

V
mA
mA
mA
mA
°C
THERMAL DATA
PARAMETER
SOT-23-5
Junction to Ambient
SOT-25
SOT-353

UNIT
V
V
V
SYMBOL
θJA
RATINGS
280
230
350
UNIT
°C/W
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
Supply Voltage
VCC
Input Voltage
Output Voltage
VIN
VOUT
High-level Output Current
IOH
Low-level Output Current
IOL
Operating Temperature
TA
Input Transition Rise or Fall
Rate
tR / tF
TEST CONDITIONS
Operating
Data retention only
High or low state
VCC=1.65V
VCC=2.3V
VCC=3V
VCC=3V
VCC=4.5V
VCC=1.65V
VCC=2.3V
VCC=3V
VCC=3V
VCC=4.5V
-40
VCC=1.8V±0.15V,2.5V±0.2V
VCC=3.3V±0.3V
VCC=5V±0.5V
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MIN
1.65
1.5
0
0
TYP
MAX
5.5
5.5
VCC
-4
-8
-16
-24
-32
4
8
16
24
32
85
20
10
5
UNIT
V
V
V
V
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
°C
ns/V
ns/V
ns/V
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CMOS IC
ELECTRICAL CHARACTERISTICS (TA =25°C , unless otherwise specified)
PARAMETER
SYMBOL
High-Level Input Voltage
VIH
Low-Level Input Voltage
VIL
High-Level Output Voltage
VOH
Low-Level Output Voltage
VOL
Input Leakage Current
Power OFF Leakage Current
Quiescent Supply Current
Additional Quiescent Supply
Current Per Input Pin
Input Capacitance

∆IQ
CI
SWITCHING CHARACTERISTICS (TA=25°С)
PARAMETER
Propagation delay from input
(A or B) to output(Y)

II(LEAK)
IOFF
IQ
TEST CONDITIONS
MIN
TYP
MAX UNIT
V
VCC=1.65V ~ 1.95V
0.65*VCC
VCC=2.3V ~ 2.7V
1.7
V
VCC=3V ~ 3.6V
2
V
V
VCC=4.5V ~ 5.5V
0.7*VCC
V
VCC=1.65V ~ 1.95V
0.35*VCC
VCC=2.3V ~ 2.7V
0.7
V
VCC=3V ~ 3.6V
0.8
V
VCC=4.5V ~ 5.5V
V
0.3*VCC
VCC=1.65 ~ 5.5V
VCC-0.1
V
IOH=-100μA
IOH=-4mA
VCC=1.65V
1.2
V
IOH=-8mA
VCC=2.3V
1.9
V
IOH=-16mA
VCC=3.0V
2.4
V
IOH=-24mA
VCC=3.0V
2.3
V
IOH=-32mA
VCC=4.5V
3.8
V
VCC=1.65 ~ 5.5V
0.1
V
IOL=100μA
IOL=4mA
VCC=1.65V
0.45
V
IOL=8mA
VCC=2.3V
0.3
V
IOL=16mA
VCC=3.0V
0.4
V
IOL=24mA
VCC=3.0V
0.55
V
IOL=32mA
VCC=4.5V
0.55
V
VIN=5.5V or GND, VCC=0 ~ 5.5V
±5
μA
VIN or VOUT=5.5V, VCC=0V
±10
μA
VIN=VCC or GND,IOUT=0, VCC=1.65~5.5V
10
μA
VCC=3 ~ 5.5V, One input at VCC-0.6V,
500
μA
Other inputs at VCC or GND
VCC=3.3V, VIN=VCC or GND
4
pF
SYMBOL
tPLH / tPHL
TEST CONDITIONS
VCC=1.8±0.15V
VCC=2.5±0.2V
CL=15pF
RL=1MΩ
VCC=3.3±0.3V
VCC=5±0.5V
VCC=1.8±0.15V, RL=1KΩ
VCC=2.5±0.2V, RL=500Ω
CL=30pF
VCC=3.3±0.3V, RL=500Ω
VCC=5±0.5V, RL=500Ω
MIN
2.2
0.9
0.8
0.8
3.1
1.3
1
1
TYP
MAX
7.2
4.4
3.8
3.4
9
5.5
4.7
4
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
MIN
TYP
22
22
23
25
MAX
UNIT
OPERATING CHARACTERISTICS (TA=25°С)
PARAMETER
Power Dissipation Capacitance
SYMBOL
CPD
TEST CONDITIONS
VCC=1.8V
VCC=2.5V
f=10MHZ
VCC=3.3V
VCC=5.0V
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pF
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CMOS IC
TEST CIRCUIT AND WAVEFORMS
From Output
CL
RL
Inputs
VCC
1.8V±0.15V
2.5V±0.2V
3.3V±0.3V
5V±0.5V
VIN
VCC
VCC
3V
VCC
tR, tF
≤2ns
≤2ns
≤2.5ns
≤2.5ns
VM
CL
RL
VCC/2
VCC/2
1.5V
VCC/2
15pF
15pF
15pF
15pF
1MΩ
1MΩ
1MΩ
1MΩ
Note: CL includes probe and jig capacitance.
All input pulses are supplied by generators having the following characteristics: PRR ≤10MHz, ZO = 50Ω.
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CMOS IC
TEST CIRCUIT AND WAVEFORMS(Cont.)
From Output
CL
RL
Inputs
VCC
1.8V±0.15V
2.5V±0.2V
3.3V±0.3V
5V±0.5V
VIN
VCC
VCC
3V
VCC
tR, tF
≤2ns
≤2ns
≤2.5ns
≤2.5ns
VM
CL
RL
VCC/2
VCC/2
1.5V
VCC/2
30pF
30pF
50pF
50pF
1KΩ
500Ω
500Ω
500Ω
Note: CL includes probe and jig capacitance.
All input pulses are supplied by generators having the following characteristics: PRR ≤10MHz, ZO = 50Ω.
UTC assumes no responsibility for equipment failures that result from using products at values that
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specifications of any and all UTC products described or contained
herein. UTC products are not designed for use in life support appliances, devices or systems where
malfunction of these products can be reasonably expected to result in personal injury. Reproduction in
whole or in part is prohibited without the prior written consent of the copyright owner. The information
presented in this document does not form part of any quotation or contract, is believed to be accurate
and reliable and may be changed without notice.
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