88031

REVISIONS
LTR
DESCRIPTION
DATE
APPROVED
A
Added new paragraph for resistance.
28 JUL 1989
D. Moore
B
Breakout RTC into specific resistance
ranges; power conditioning to allow test
parts mounted in a test fixture; change
manufacturers part number; editorial
changes throughout.
Added new resistance tolerances, values,
and characteristics. Revise to present DoD
policy requirements. Editorial changes
throughout.
Extend resistance range of source of supply.
Update to present DOD policy requirements.
Add pure tin paragraph. Add new source of
supply. Editorial changes throughout.
Add manufacturer eligibility, electrostatic
charge, and pulse application paragraphs.
Editorial changes throughout.
12 OCT 1990
D. Moore
12 JUL 2000
K. Cottongim
12 APR 2005
K. Cottongim
22 JAN 2007
M. Radecki
24 JUN 2014
M. Radecki
C
D
E
F
CURRENT DESIGN ACTIVITY CAGE CODE 037Z3
HAS CHANGED NAMES TO:
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
Prepared in accordance with ASME Y14.100
REV STATUS
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PMIC N/A
Original date of
drawing
4 May 1988
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DESIGN ACTIVITY:
DEFENSE ELECTRONIC SUPPLY CENTER
DAYTON, OHIO 45444-5000
PREPARED BY
Allan R. Knox
CHECKED BY
David W. Withrow
F
F
TITLE
RESISTOR, CHIP, FIXED, FILM,
.330 WATT, STYLE 1505
APPROVED BY
David E. Moore
SIZE
A
REV
AMSC N/A
CODE IDENT. NO.
14933
DWG NO.
F
PAGE
88031
1
OF
9
5905-2014-E29
1. SCOPE
1.1 Scope. This drawing describes the requirements for a fixed, film, .330 watt, .150 X .050 chip resistor.
1.2 Part or Identifying Number (PIN) The complete PIN is as follows:
88031
│
│
Drawing
number
-
*
│
│
Characteristic
(see 3.3.6)
****
│
│
Resistance and resistance
tolerance (see 3.3.1)
2. APPLICABLE DOCUMENTS
2.1 Government documents.
2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of
this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in
the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-55342 -
Resistors, Fixed, Film, Chip, Nonestablished Reliability, Established Reliability, Space Level,
General Specification For.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-202
MIL-STD-790
-
MIL-STD-1285 *
*
Test Methods for Electronic and Electrical Component Parts.
Established Reliability and High Reliability Qualified Product List (QPL) Systems for
Electrical, Electronic, and Fiber Optic Parts specifications.
Marking of Electrical and Electronic Parts.
(Copies of these documents are available online at http://quicksearch.dla.mil.)
2.2 Order of precedence. Unless otherwise noted herein or in the contract, or in the event of a conflict between the text
of this document and the references cited herein (except for related specification sheets), the text of this document takes
precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption
has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-55342, and as specified
herein.
3.2 Interface and physical dimensions. The interface and physical dimensions shall be as specified in MIL-PRF-55342
and herein (see figure 1).
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A
0.155
±0.007
B
C
.050
±.005
.015/.033
Inches
.005
.007
.015
.033
.050
.155
D
.015
±.005
E
.015
±.005
mm
0.13
0.18
0.38
0.84
1.27
3.94
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for general information only.
3. The pictorial view is representative of the envelope of the item. Slight deviations from the outline shown,
which are contained within the envelope, and do not alter the functional aspect of the device are
acceptable.
FIGURE 1. Chip resistor.
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3.3 Electrical characteristics.
3.3.1 Resistance and resistance tolerance. The nominal resistance expressed in ohms is identified by four characters
consisting of three digits and a letter. The letter is used simultaneously as a decimal point, multiplier, and resistance tolerance
designator in accordance with MIL-PRF-55342 and herein (see table I). Minimum and maximum resistance values available
shall be as specified in 3.3.2, 3.3.6, and 6.8. Resistance values not listed in the "10 to 100" decade table of MIL-PRF-55342
for the appropriate resistance tolerance shall be considered as not conforming to this drawing. The standard values for every
decade shall follow the sequence demonstrated for the "10 to 100" decade table specified in MIL-PRF-55342.
TABLE I. Designator of resistance values for resistance tolerances.
Designator for 0.1
percent tolerance
Resistance (ohms)
1A00 to 9A88 inclusive
10A0 to 98A8 inclusive
100A to 988A inclusive
1B00 to 9B88 inclusive
10B0 to 98B8 inclusive
100B to 988B inclusive
1C00 to 9C88 inclusive
10C0
Designator for 1.0
percent tolerance
1.00 to
9.88
10.0 to
98.8
100
to
988
1,000
to
9880
10,000
to
98800
100,000
to
988,000
1,000,000
to 9,880,000
10,000,000
Resistance (ohms)
inclusive
inclusive
inclusive
inclusive
inclusive
inclusive
inclusive
1D00 to 9D88 inclusive
10D0 to 98D8 inclusive
100D to 988D inclusive
1E00 to 9E88 inclusive
10E0 to 98E8 inclusive
100E to 988E inclusive
1F00 to 9F88 inclusive
10F0
Designator for 5.0
percent tolerance
1.00 to
9.76
10.0 to
97.6
100
to
976
1,000
to
9760
10,000
to
97600
100,000
to
976,000
1,000,000
to 9,760,000
10,000,000
Resistance (ohms)
inclusive
inclusive
inclusive
inclusive
inclusive
inclusive
inclusive
1J00
10J0
100J
1K00
10K0
100K
1L00
10L0
1.00
10.0
100
1,000
10,000
100,000
1,000,000
10,000,000
inclusive
inclusive
inclusive
inclusive
inclusive
inclusive
inclusive
to
to
to
to
to
to
to
9J88 inclusive
98J8 inclusive
988J inclusive
9K88 inclusive
98K8 inclusive
988K inclusive
9L88 inclusive
to
to
to
to
to
to
to
9.10
91.0
910
9100
91000
910,000
9,100,000
3.3.2 Resistance range. The resistance range shall be from 1 ohm to 10 megohms.
3.3.3 Resistance tolerances. The resistance tolerances for chip resistors shall be ±0.1 percent, ±1 percent, and ±5 percent
in accordance with MIL-PRF-55342 and table I herein.
3.3.4 Power rating. The power rating for chip resistors shall be 0.330 watt at +70°C derated to zero power at +150°C (see
figure 2).
3.3.5 Voltage rating. The maximum continuous working voltage shall not exceed 100 volts.
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3.3.6 Resistance temperature coefficient. The resistance temperature coefficient shall be in accordance with
MIL-PRF-55342 and not exceed the values specified below:
Characteristic
E and H
E and H
K and M
K and M
Resistance range
100 ohms
10 ohms
1 ohm
1 ohm
thru
thru
thru
thru
Resistance tolerance
1.5 megohm
1.5 megohm
10 megohms
10 megohms
0.1 percent
1.0 percent
1.0 percent
5.0 percent
3.3.7 Termination. Termination material shall be in accordance with MIL-PRF-55342, code letter B.
3.3.7.1 Pure tin. The use of pure tin, as an underplate or final finish is prohibited both internally and externally. Tin
content of resistor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3
percent lead, by mass (see 6.4).
3.3.8 DC resistance. When resistors are tested as specified in 4.6, the dc resistance shall be within the specified tolerance
of the nominal resistance.
3.3.9 Thermal shock. When resistors are tested as specified in 4.7, there shall be no evidence of mechanical damage.
3.3.10 Power conditioning. When resistors are tested as specified in 4.8, there shall be no evidence of mechanical
damage. The change in resistance between initial and final measurements shall not exceed ±(0.5 percent ±0.01 ohm).
3.3.11 Solderability. When resistors are tested as specified in 4.9, they shall meet the criteria for surface mount leadless
components in the test method.
FIGURE 2. Derating curve.
3.4 Marking. Marking of the individual chip resistors is not required; however, each unit package shall be marked in
accordance with MIL-STD-1285 and include the PIN as specified herein (see 1.2), the manufacturer's name or Commercial
and Government Entity (CAGE) code, and date lot codes.
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*
3.5 Recycled, recovered, environmentally preferable, or biobased materials. Recycled, recovered, environmentally
preferable, or biobased materials should be used to the maximum extent possible provided that the material meets or
exceeds the operational and maintenance requirements, and promotes economically advantageous life cycle costs.
*
3.6 Manufacturer eligibility. To be eligible for listing as an approved source of supply, a manufacturer shall be listed on
the MIL-PRF-55342 Qualified Products List for at least one part, or perform the group A and group B inspections specified
herein on a sample agreed upon by the manufacturer and DLA Land and Maritime-VAT.
*
3.6.1 Certificate of compliance. A certificate of compliance shall be required from manufacturers requesting to be listed
as an approved source of supply.
3.7 Workmanship. Resistors shall be uniform in quality and free from any defects that will affect life, serviceability, or
appearance.
4. VERIFICATION
4.1 Product assurance program. The product assurance program specified in MIL-PRF-55342 and maintained in
accordance with MIL-STD-790 is not applicable to this document.
4.2 Qualification inspection. Qualification inspection is not applicable to this document.
4.3 Product level qualification. The product level qualification specified in MIL-PRF-55342 is not applicable to this
document.
4.4 Conformance inspection.
4.4.1 Inspection of product for delivery. Inspection of product for delivery shall consist of the groups A and B inspections.
4.4.1.1 Group A inspection. Group A inspection shall consist of the inspections specified in table II, and shall be made on
the same set of sample units, in the order shown.
4.4.1.1.1 Subgroup 1. Subgroup I tests shall be performed on a production lot basis on 100 percent of the product supplied
under this document. Resistors that are out of resistance tolerance, or which experience a change in resistance greater than
that permitted for the tests of this subgroup shall be removed from the lot. Lots having more than 5 percent total rejects, due
to exceeding the specified resistance tolerance change limit shall not be furnished on contracts.
4.4.1.1.2 Subgroup 2. Subgroup II tests shall be performed on an inspection lot basis. A sample of 13 parts shall be
randomly selected; if one or more defects are found, the lot shall be rescreened and defects removed. A new sample of 13
parts shall then be randomly selected. If one or more defects are found in this second sample, the lot shall be rejected and
shall not be supplied against the document.
4.4.1.1.3 Subgroup 3. Subgroup 3 tests shall be performed as specified in MIL-PRF-55342.
4.4.2 Group B inspection. Group B inspection shall be in accordance with MIL-PRF-55342.
*
4.4.2.1 Certification. The manufacturer shall submit a certificate of compliance in lieu of group B inspection, when group B
is not in the ordering data (see 6.2d).
4.5 Visual and mechanical examination. Resistors shall be examined to verify that the materials, design, construction,
physical dimensions, marking, and workmanship are in accordance with the applicable requirements of MIL-PRF-55342.
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TABLE II. Group A inspection.
Inspection
Subgroup 1
DC resistance
Thermal shock
Power conditioning
DC resistance
Subgroup 2
Visual inspection
Subgroup 3
Solderability
Requirement
Method
Sampling procedure
3.3.8
3.3.9
3.3.10
3.3.8
4.6
4.7
4.8
4.6
3.2, 3.4, 3.7
4.5
13 samples, 0 failures
3.3.11
4.9
See 4.4.1.1.3
100 percent
4.6 DC resistance. DC resistance shall be tested in accordance with MIL-PRF-55342.
4.7 Thermal shock. Thermal shock shall be tested in accordance with MIL-PRF-55342.
4.8 Power conditioning. Resistors shall be tested in accordance with method 108 of MIL-STD-202. The following details
and exceptions shall apply:
a. Method of mounting: Chip resistor sample units shall be mounted on a test fixture.
b. Test temperature: +70°C ±5°C.
c. Operating conditions: Rated dc continuous working voltage or filtered full wave rectified ac voltage shall be applied
intermittently, 1.5 hours “on”, and 0.5 hour “off”, for the applicable number of hours and applicable test temperature.
"On time" shall be three quarters of the total elapsed time. During the "on" cycle, the voltage shall be regulated and
controlled to maintain ±5 percent of the rated continuous working voltage.
d. Duration: 100 hours ±4 hours.
e. Stabilization and final dc resistance measurement: Resistors shall be removed from chambers for a minimum of 45
minutes and stabilized prior to final resistance measurement.
f. Examination after test: Resistors shall be examined for evidence of mechanical damage.
4.9 Solderability. Solderability shall be tested in accordance with MIL-PRF-55342.
5. PACKAGING
5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see
6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to
contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained
by the Inventory Control Point's packaging activities within the Military Service or Defense Agency, or within the military
service's system commands. Packaging data retrieval is available from the managing Military Department's or Defense
Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
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6. NOTES
(This section contains information of a general or explanatory nature which may be helpful, but is not mandatory.)
6.1 Intended use. Chip resistors are intended for use in thick or thin film circuits where microcircuitry is intended. Resistors
are also for use in surface mount applications.
6.2 Ordering data. The contract or purchase order should specify the following:
a. Complete PIN (see 1.2).
b. Requirements for delivery: One copy of the conformance inspection data or certificate of compliance that parts
have passed conformance inspection with each shipment of parts by the manufacturer.
c. Requirements for packaging and packing.
d. Whether the manufacturer performs the group B tests or provides certification of compliance with group B
requirements.
6.3 PIN supersession. PIN's of revision B of this document have been superseded by a new PIN in revision C that
includes a combination resistance value and resistance tolerance in accordance with MIL-PRF-55342 and herein.
6.4 Tin whisker growth. The use of alloys with tin content greater than 97 percent, by mass, may exhibit tin whisker
growth problems after manufacture. Tin whiskers may occur anytime from a day to years after manufacture and can
develop under typical operating conditions, on products that use such materials. Conformal coatings applied over top of a
whisker-prone surface will not prevent the formation of tin whiskers. Alloys of 3 percent lead, by mass, have shown to
inhibit the growth of tin whiskers. For additional information on this matter, refer to ASTM-B545 (Standard Specification
for Electrodeposited Coatings of Tin).
*
6.5 Electrostatic charge. Under several combinations of conditions, these resistors can be electrically damaged, by
electrostatic charges, and drift from specified value. Users should consider this phenomena when ordering or shipping
resistors. Direct shipment to the Government is controlled by MIL-DTL-39032, which specifies a preventive packaging
procedure.
*
6.6 Pulse applications. Designers are CAUTIONED on using the above resistors in high power pulse applications.
Since they have not been qualified nor tested for such applications, damage and premature failure are possible. These
resistors only see a onetime pulse (Short-time overload) as part of the group B inspection of MIL-PRF-55342.
*
6.7 User of record. Coordination of this document for future revisions is coordinated only with the approved source of
supply and the users of record of this document. Requests to be added as a recorded user of this drawing may be
achieved online at [email protected] or in writing to: DLA Land and Maritime, Attn: VAT, Post Office Box 3990, Columbus,
OH 43218-3990 or by telephone (614) 692-0552 or DSN 850-0552.
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*
6.8 Approved source of supply. Approved source of supply is listed herein. Additional sources will be added as they
become available. Assistance in the use of this drawing may be obtained online at [email protected] or contact DLA Land
and Maritime, Attn: VAT, Post Office Box 3990, Columbus, OH 43218-3990 or by telephone (614) 692-0552 or DSN 8500552.
DLA Land and Maritime
drawing PIN
88031-*****
Char. K & M, res. values 1
ohm thru 10 megohms, res.
tol., 1.0 & 5.0 pct.
Char. E & H, 100 ohms thru
1.5 megohms, res. tol. 0.1
pct., char. E & H, 10 ohms
thru 1.5 megohms, res. tol.,
1.0 pct., char. K & M, 1 ohm
thru 10 megohms, res. tol.,
1.0 & 5.0 pct.
Vendor similar
designation or type
number 1/
Vendor
CAGE
WA80SM-*****-NS62C
50316
H1505CPX******* (DEC031)
H1505CA******B (DEC031)
Char. K & M, res. values 1
ohm thru 10 megohms, res.
tol. 1.0 & 5.0 pct.
1/
MINI-SYSTEMS, INC.
20 David Road
N. Attleboro, MA 02761-0069
State of the Art, Inc.
2470 Foxhill Road
State College, PA 16803-1797
56235
RCWP-5150-ARO
Vendor name
and address
SH903
Vishay Israel, LTD.
Emek-Sara “B” Industrial Park
Beer Sheva, Israel 84874
Parts must be purchased to the DLA Land and Maritime PIN to assure that all performance requirements and
tests are met.
DEFENSE ELECTRONIC SUPPLY CENTER
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88031
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