HA-5330 ® Data Sheet June 2004 650ns Precision Sample and Hold Amplifier Features • Very Fast Acquisition . . . . . . 500ns (0.1%) 650ns (0.01%) The HA-5330 is a very fast sample and hold amplifier designed primarily for use with high speed A/D converters. It utilizes the Intersil Dielectric Isolation process to achieve a 650ns acquisition time to 12-bit accuracy and a droop rate of 0.01µV/µs. The circuit consists of an input transconductance amplifier capable of producing large amounts of charging current, a low leakage analog switch, and an integrating output stage which includes a 90pF hold capacitor. The analog switch operates into a virtual ground, so charge injection on the hold capacitor is constant and independent of VIN. Charge injection is held to a low value by compensation circuits and, if necessary, the resulting 0.5mV hold step error can be adjusted to zero via the Offset Adjust terminals. Compensation is also used to minimize leakage currents which cause voltage droop in the Hold mode. The HA-5330 will operate at reduced supply voltages (to ±10V) with a reduced signal range. The MIL-STD-883 data sheet for this device is available on request. • Low Droop Rate . . . . . . . . . . . . . . . . . . . . . . . . 0.01µV/µs • Very Low Offset . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.2mV • High Slew Rate. . . . . . . . . . . . . . . . . . . . . . . . . . . . 90V/µs • Wide Supply Range . . . . . . . . . . . . . . . . . . . . . ±10V to ±20V • Internal Hold Capacitor • Fully Differential Input • TTL/CMOS Compatible Applications • Precision Data Acquisition Systems • D/A Converter Deglitching • Auto-Zero Circuits • Peak Detectors Functional Diagram Ordering Information TEMP. RANGE (oC) PART NUMBER HA1-5330-5 0 to 75 OFFSET ADJUST PKG. DWG. # PACKAGE 14 Ld CERDIP 3 +IN S/H CONTROL +IN 1 14 -IN NC 2 13 NC OFFSET ADJ. 3 12 SIGNAL GND OFFSET ADJ. 4 11 SUPPLY GND 5 10 V+ NC 6 9 NC 10 90pF HA-5330 - IN HA-5330 (CERDIP) TOP VIEW V+ 4 F14.3 Pinout V- FN2858.5 14 7 1 OUT 8 11 SUPPLY GND 5 V- 12 SIGNAL GND 8 S/H CONTROL OUTPUT 7 1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a registered trademark of Intersil Americas Inc. Copyright © Intersil Americas Inc. 2003, 2004. All Rights Reserved. All other trademarks mentioned are the property of their respective owners. HA-5330 Absolute Maximum Ratings Thermal Information Voltage between V+ and SUPPLY/SIG GND . . . . . . . . . . . . . . .+20V Voltage between V- and SUPPLY/SIG GND . . . . . . . . . . . . . . . -20V Voltage between SUPPLY GND and SIG GND . . . . . . . . . . . . ±2.0V Voltage between S/H Control and SUPPLY/SIG GND . . . . +8V, -6V Differential Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24V Output Current, Continuous (Note 1) . . . . . . . . . . . . . . . . . . . ±17mA Supply Voltage Range (Typical) . . . . . . . . . . . . . . . . . ±10V to ±20V Thermal Resistance (Typical, Note 3) θJA (oC/W) θJC (oC/W) CERDIP Package. . . . . . . . . . . . . . . . . 66 16 Maximum Junction Temperature (Ceramic Package, Note 2) . . .175oC Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . 300oC Operating Conditions Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . 0oC to 75oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTES: 1. Internal Power Dissipation may limit Output Current below ±17mA. 2. Maximum power dissipation, including output load, must be designed to maintain the junction temperature below 175oC for the ceramic package. 3. θJA is measured with the component mounted on an evaluation PC board in free air. Electrical Specifications VSUPPLY = ±15V; S/H Control VIL = +0.8V (Sample): VIH = +2.0V (Hold); SIG GND = SUPPLY GND, Unity Gain Configuration (Output tied to -Input), Unless Otherwise Specified TEMP (oC) MIN Input Voltage Range Full Input Resistance (Note 4) 25 Input Capacitance Offset Voltage PARAMETER TEST CONDITIONS TYP MAX UNITS ±10 - - V 5 15 - MΩ 25 - 3 - pF 25 - 0.2 - mV Full - - 1.5 mV Offset Voltage Temperature Coefficient Full - 1 10 µV/oC Bias Current 25 - ±20 - nA Full - - ±300 nA INPUT CHARACTERISTICS Offset Current 25 - 20 - nA Full - - 300 nA Full ±10 - - V VCM = ±10V Full 86 100 - dB Gain DC Full 2 x 106 2 x 107 - V/V Gain Bandwidth Product Note 12 25 - 4.5 - MHz Output Voltage Full ±10 - - V Output Current Full ±10 - - mA Full Power Bandwidth (Note 6) 25 - 1.4 - MHz 25 - 0.2 - Ω - 10-5 0.001 Ω - 230 - µVRMS Common Mode Range CMRR TRANSFER CHARACTERISTICS OUTPUT CHARACTERISTICS Output Resistance Hold Mode Sample Mode Total Output Noise, DC to 4MHz 25 Sample Mode Hold Mode 25 - 190 - µVRMS Rise Time Note 5 25 - 70 - ns Overshoot Note 5 25 - 10 - % TRANSIENT RESPONSE 2 HA-5330 Electrical Specifications VSUPPLY = ±15V; S/H Control VIL = +0.8V (Sample): VIH = +2.0V (Hold); SIG GND = SUPPLY GND, Unity Gain Configuration (Output tied to -Input), Unless Otherwise Specified (Continued) TEMP (oC) MIN TYP MAX UNITS Note 7 25 - 90 - V/µs VIH Full 2.0 - - V VIL Full - - 0.8 V VIL = 0V Full - 10 40 µA VIH = 5V Full - 10 40 µA To 0.1%, Note 8 25 - 500 - ns Full - - 700 ns PARAMETER TEST CONDITIONS Slew Rate DIGITAL INPUT CHARACTERISTICS Input Voltage Input Current SAMPLE/HOLD CHARACTERISTICS Acquisition Time To 0.01%, Note 8 25 - 650 - ns Full - - 900 ns Aperture Time (Note 4) 25 - 20 - ns Effective Aperture Delay Time 25 -50 -25 0 ns Aperture Uncertainty 25 - 0.1 - ns Droop Rate (Note 9) 25 - 0.01 - µV/µs Full - - 10 µV/µs 25 - 0.5 - mV Hold Step Error Note 10 Hold Mode Settling Time To 0.01% 25 - 100 200 ns Hold Mode Feedthrough 20VP-P, 100kHz Full - -88 - dB Positive Supply Current Full - 18 24 mA Negative Supply Current Full - 19 25 mA Full 86 100 - dB POWER SUPPLY CHARACTERISTICS Power Supply Rejection Note 11 NOTES: 4. Derived from computer simulation only; not tested. 5. VI = 200mV Step; RL = 2kΩ; CL = 50pF. Slew Rate . Distortion of wave shape occurs beyond 100kHz due 6. Full power bandwidth based on slew rate measurement using: FPBW = --------------------------2πV PEAK to slew rate enhancement circuitry. 7. VO = 20V Step; RL = 2kΩ; CL = 50pF. 8. VO = 10V Step; RL = 2kΩ; CL = 50pF. 9. This parameter is measured at ambient temperature extremes in a high speed test environment. Consequently, steady state heating effects from internal power dissipation are not included. 10. VIN = 0V; VIH = +3.5V; tR = 22ns (VIL to VIH). See graph. 11. Based on a 3V delta in each supply, i.e. 15V ±1.5VDC. 12. VOUT = 200mVP-P, RL = 2kΩ, CL = 50pF. 3 HA-5330 Application Information Output Stage The HA-5330 has the uncommitted differential inputs of an op amp, allowing the Sample/Hold function to be combined with many conventional op amp circuit ideas. See the Intersil Application Note AN517 for a collection of circuit ideas. The HA-5330 output circuit does not include short circuit protection, and consequently its output impedance remains low at high frequencies. Thus, the step changes in load current which occur during an A/D conversion are absorbed at the S/H output with minimum voltage error. A momentary short circuit to ground is permissible, but the output is not designed to tolerate a short of indefinite duration. Layout A printed circuit board with ground plane is recommended for best performance. Bypass capacitors (0.01µF to 0.1µF, ceramic) should be provided from each power supply terminal to the Supply GND Terminal on pin 11. Typical Applications The HA-5330 is configured as a unity gain noninverting amplifier by simply connecting the output (pin 7) to the inverting input (pin 14). As an input device for a fast successive - approximation A/D converter, it offers an extremely high throughput rate. Also, the HA-5330’s pedestal error is adjustable to zero by using an Offset Adjust potentiometer (10K to 50K) center tapped to V-. V- Acquisition Time The time required following a “sample” command, for the output to reach its final value within ±0.1% or ±0.01%. This is the minimum sample time required to obtain a given accuracy, and includes switch delay time, slewing time and settling time. Aperture Time The time required for the sample-and-hold switch to open, independent of delays through the switch driver and input amplifier circuitry. The switch opening time is that interval between the conditions of 10% open and 90% open. Hold Step Error 10kΩ - 50kΩ 4 FIGURE 1. HA-5330 OFFSET ADJUST The ideal ground connections are pin 11 (Supply Ground) directly to the system Supply Common, and pin 12 (Signal Ground) directly to the system Signal Ground (Analog Ground). Hold Capacitor The HA-5330 includes a 90pF MOS hold capacitor, sufficient for most high speed applications (the Electrical Specifications section is based on the internal capacitor). MAGNITUDE HOLD STEP ERROR (mV) Hold step error is the output shift due to charge transfer from the sample to the hold mode. It is also referred to as “offset step” or “pedestal error”. 3 3.0 2.0 1.0 0.0 -1.0 -2.0 20 40 60 80 100 RISE TIME (ns) 0V TO 3.5V FIGURE 3. HOLD STEP ERROR vs S/H CONTROL RISE TIME Effective Aperture Delay Time (EADT) 20 PHASE 0 0 ±15V SUPPLIES -20 90 -40 ±12V SUPPLIES 180 PHASE (DEGREES) 40 MAGNITUDE (dB) Glossary of Terms The difference between the digital delay time from the Hold command to the opening of the S/H switch, and the propagation time from the analog input to the switch. EADT may be positive, negative or zero. If zero, the S/H amplifier will output a voltage equal to VIN at the instant the Hold command was received. For negative EADT, the output in Hold (exclusive of pedestal and droop errors) will correspond to a value of VIN that occurred before the Hold command. Aperture Uncertainty 1K 10K 100K 1M FREQUENCY (Hz) FIGURE 2. MAGNITUDE AND PHASE RESPONSE (CLOSED LOOP GAIN = 100) 4 10M The range of variation in Effective Aperture Delay Time. Aperture Uncertainty (also called Aperture Delay Uncertainty, Aperture Time Jitter, etc.) sets a limit on the accuracy with which a waveform can be reconstructed from sample data. HA-5330 Die Characteristics PASSIVATION: Type: Nitride (Si3N4) over Silox (SiO2, 5% Phos.) Silox Thickness: 12kÅ ±2kÅ Nitride Thickness: 3.5kÅ ±1.5kÅ DIE DIMENSIONS: 99 mils x 166 mils x 19 mils 2510µm x 4210µm x 483µm SUBSTRATE POTENTIAL (POWERED UP): METALLIZATION: Signal GND Type: Al, 1% Cu Thickness: 16kÅ ±2kÅ TRANSISTOR COUNT: 205 PROCESS: Bipolar Dielectric Isolation Metallization Mask Layout HA-5330 +IN -IN SIGNAL GND SUPPLY GND V+ OFFSET ADJ OFFSET ADJ V- OUTPUT S/H CONTROL All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems. Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com 5