0.8MB

The following document contains information on Cypress products.
AN706-00037-2v0-E
32-BIT MICROCONTROLLER
FM3 family Application Note
IEC60730 CLASS B
SELF-TEST LIBRARY
APPLICATION NOTE
ARM and Cortex-M3 are the trademarks of ARM Limited in the EU and other countries.
AN706-00037-2v0-E
All Rights Reserved.
The contents of this document are subject to change without notice. Customers are advised to consult with
FUJITSU sales representatives before ordering.
The information, such as descriptions of function and application circuit examples, in this document are
presented solely for the purpose of reference to show examples of operations and uses of Fujitsu
semiconductor device; Fujitsu does not warrant proper operation of the device with respect to use based on
such information. When you develop equipment incorporating the device based on such information, you
must assume any responsibility arising out of such use of the information. Fujitsu assumes no liability for
any damages whatsoever arising out of the use of the information.
Any information in this document, including descriptions of function and schematic diagrams, shall not be
construed as license of the use or exercise of any intellectual property right, such as patent right or
copyright, or any other right of Fujitsu or any third party or does Fujitsu warrant non-infringement of any
third-party’s intellectual property right or other right by using such information. Fujitsu assumes no liability
for any infringement of the intellectual property rights or other rights of third parties which would result from
the use of information contained herein.
The products described in this document are designed, developed and manufactured as contemplated for
general use, including without limitation, ordinary industrial use, general office use, personal use, and
household use, but are not designed, developed and manufactured as contemplated (1) for use
accompanying fatal risks or dangers that, unless extremely high safety is secured, could have a serious
effect to the public, and could lead directly to death, personal injury, severe physical damage or other loss
(i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport
control, medical life support system, missile launch control in weapon system), or (2) for use requiring
extremely high reliability (i.e., submersible repeater and artificial satellite).
Please note that Fujitsu will not be liable against you and/or any third party for any claims or damages
arising in connection with above-mentioned uses of the products.
Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or
loss from such failures by incorporating safety design measures into your facility and equipment such as
redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions.
If any products described in this document represent goods or technologies subject to certain restrictions on
export under the Foreign Exchange and Foreign Trade Law of Japan, the prior authorization by Japanese
government will be required for export of those products from Japan.
The company names and brand names herein are the trademarks or registered trademarks of their
respective owners.
Copyright© 2012 FUJITSU SEMICONDUCTOR LIMITED all rights reserved
1
AN706-00037-2v0-E
Revision History
Rev
Date
Remark
1.0
Jan. 18, 2012
First Edition
2.0
Sep. 18, 2012
4.5 Invariable Memory Test
Corrected sentence in Sowtware CRC16/32 Arithmetic
4.8 AD Test
Corrected sentence in 4.8.1
2
AN706-00037-2v0-E
Table of Contents
Revision History...................................................................................................................... 2
Target products ....................................................................................................................... 5
1 Introduction ........................................................................................................................ 6
1.1 About Document ........................................................................................................... 6
1.2 About IEC60730 ........................................................................................................... 6
1.3 About MB9B100A/MB9B300B/MB9B400A/MB9B500B Series MCU .......................... 6
1.4 About FM3 IEC60730 STL Demo Project .................................................................... 7
2 IEC60730 Class B Requirement ....................................................................................... 9
3 IEC60730 Class B STL Overview .................................................................................... 11
4 IEC60730 Class B STL API ............................................................................................. 13
4.1 CPU Register Test ...................................................................................................... 13
4.1.1 Test Description ................................................................................................... 14
4.1.2 API Definition....................................................................................................... 15
4.2 CPU PC Test ............................................................................................................... 16
4.2.1 Test Description ................................................................................................... 16
4.2.2 API Definition....................................................................................................... 17
4.3 Interrupt Test ............................................................................................................... 18
4.3.1 Test Description ................................................................................................... 18
4.3.2 API Definition....................................................................................................... 19
4.4 Clock Test ................................................................................................................... 21
4.4.1 Test Description ................................................................................................... 21
4.4.2 API Definition....................................................................................................... 28
4.5 Invariable Memory Test............................................................................................... 32
4.5.1 Test Description ................................................................................................... 33
4.5.2 API Definition....................................................................................................... 39
4.6 Variable Memory Test ................................................................................................. 43
4.6.1 Test Description ................................................................................................... 43
4.6.2 API Definition....................................................................................................... 44
4.7 IO Test ......................................................................................................................... 45
4.7.1 Test Description ................................................................................................... 45
4.7.2 API Definition....................................................................................................... 46
4.8 AD Test ....................................................................................................................... 48
4.8.1 Test Description ................................................................................................... 48
4.8.2 API Definition....................................................................................................... 49
5 Example project ............................................................................................................... 50
3
AN706-00037-2v0-E
5.1 User Configuration ...................................................................................................... 50
5.1.1 The definition “MCU_TYPE_MB9BF500” ........................................................... 50
5.1.2 The definition “IEC60730_FLASHTEST_USE_CRC16”..................................... 50
5.1.3 The definition “IEC60730_CLKTEST_USE_CSV” .............................................. 50
5.2 Project Structure ......................................................................................................... 50
5.2.1 Startup Self-Test .................................................................................................. 50
5.2.2 Periodic Test Initialization .................................................................................... 51
5.2.3 Periodic Test ........................................................................................................ 51
5.3 Sample Code .............................................................................................................. 52
5.3.1 Startup File .......................................................................................................... 52
5.3.2 Main File .............................................................................................................. 53
6 STL API Performance ...................................................................................................... 56
7 Reference Documents ..................................................................................................... 58
8 Appendix .......................................................................................................................... 59
8.1 CRC code making method ......................................................................................... 59
8.1.1 Start of the Command-Line ................................................................................. 59
8.1.2 Input the command.............................................................................................. 59
8.1.3 Setting of build messages to display in the message window ............................ 61
8.1.4 S
54B etting of the Linker configuration file ................................................................. 62
8.1.5 Making CRC code ............................................................................................... 63
9 Content of Table and Figure ............................................................................................ 64
4
AN706-00037-2v0-E
Target products
This application note is described about below products;
(TYPE0)
Series
Product Number (not included Package suffix)
MB9B500B
MB9BF504NB,MB9BF505NB,MB9BF506NB
MB9BF504RB,MB9BF505RB,MB9BF506RB
MB9B400A
MB9BF404NA,MB9BF405NA,MB9BF406NA
MB9BF404RA,MB9BF405RA,MB9BF406RA
MB9B300B
MB9BF304NB,MB9BF305NB,MB9BF306NB
MB9BF304RB,MB9BF305RB,MB9BF306RB
MB9B100A
MB9BF102NA,MB9BF104NA,MB9BF105NA,MB9BF106NA
MB9BF102RA,MB9BF104RA,MB9BF105RA,MB9BF106RA
5
AN706-00037-2v0-E
1
Introduction
1.1
About Document
This application notes describes how to use and implement the library functions
provided. It will first show the requirement of IEC60730 Class B, and then explain how it
can be implemented. At last an example is given to show to how to integrate test
functions into a real system.
1.2
About IEC60730
The International Electrotechnical Commission (IEC) is a worldwide organization for
standardization comprising all national electrotechnical committees (IEC National
Committees). International Standard IEC60730-1 has been prepared by IEC technical
committee for automatic controls in household use. From 2007 onwards, home
appliances have to comply with Standard IEC60730 to make system more safety.
The Annex H of IEC60730 applies to electronic controls and embedded systems
implemented by both hardware and software, therefore the system using a
microcontroller is typically the case in modern appliances. Especially, Annex H of
IEC60730 explains detailed test and diagnostic methods for microcontrollers.
In Annex H, the software-related Standard items are classified by Class A, B or C.
Class A:
control functions which are not intended to be relied upon for the safety of
the equipment, such as humidity controls, lighting controls and timers.
Class B:
software that includes code intended to prevent hazards if a fault, other than
a software fault, occurs in the appliance, such as thermal cut-outs and door
locks for laundry equipment.
Class C:
software that includes code intended to prevent hazards without the use of
other protective devices, such as thermal cut-outs for closed water heater
systems.
1.3
About MB9B100A/MB9B300B/MB9B400A/MB9B500B Series MCU
MB9B100A/MB9B300B/MB9B400A/MB9B500B series MCU is 32-bit general purpose
MCU of FM3 family that features the industry's leading-edge ARM CortexTM-M3 CPU
and integrates Fujitsu's highly reliable and high-speed secure embedded flash
6
AN706-00037-2v0-E
technology. This MCU can operate at up to 80MHz CPU frequency and work at a wide
voltage range (2.7-5.5V), which can be both compatible with 3.3V and 5V system.
It includes a host of robust peripheral features, including motor control timers (MFT),
base timer (can be configured to PWM, PPG, Reload, PWC timer), ADCs, on-chip
memory (up to 512K Flash, up to 64K SRAM) and a wide range of communication
interfaces (USB, I2C, SIO, LIN, CAN).
The size of on-chip memory can be configured according to different part number and
the package is available in LQFP and BGA, shown in table 1-1.
Product
Flash
SRAM
MB9BF104NA/RA
256kB
32kB
MB9BF105NA/RA
384kB
48kB
MB9BF106NA/RA
512kB
64kB
MB9BF304NB/RB
256kB
32kB
MB9BF305NB/RB
384kB
48kB
MB9BF306NB/RB
512kB
64kB
MB9BF404NA/RA
256kB
32kB
MB9BF405NA/RA
384kB
48kB
MB9BF406NA/RA
512kB
64kB
MB9BF504NB/RB
256kB
32kB
MB9BF505NB/RB
384kB
48kB
MB9BF506NB/RB
512kB
64kB
Package
NA: LQFP-100/BGA-112
RA: LQFP-120
NA: LQFP-100/BGA-112
RA: LQFP-120
NA: LQFP-100/BGA-112
RA: LQFP-120
NB: LQFP-100/BGA-112
RB: LQFP-120
NB: LQFP-100/BGA-112
RB: LQFP-120
NB: LQFP-100/BGA-112
RB: LQFP-120
NA: LQFP-100/BGA-112
RA: LQFP-120
NA: LQFP-100/BGA-112
RA: LQFP-120
NA: LQFP-100/BGA-112
RA: LQFP-120
NB: LQFP-100/BGA-112
RB: LQFP-120
NB: LQFP-100/BGA-112
RB: LQFP-120
NB: LQFP-100/BGA-112
RB: LQFP-120
Table 1-1: FM3 Product List
1.4
About FM3 IEC60730 STL Demo Project
This is a sample project to demonstrate how to use FM3 IEC60730 Self-Test Library. It
is developed in IAR EWARM Workbench V6.21 and Keil μVision V4.20 IDE, and
evaluated on IAR MB9BF506-SK EV-Board and Keil MCB9BF500 EV-Board (Vers.2)
respectively.
Notes:
1. If the later version of IAR EWARM Workbench V6.21 and Keil μVision V4.20 are used
to open this example project, MCU type information in project setting may lose, please
check it.
7
AN706-00037-2v0-E
2. If user select the “Use CMSIS” option (in Library Configuration table of General
Options) with IAR EWARM Workbench V6.20 later, please erase the head files with
prefix “core_” in common folder (path: ..\..\common).
3. If the former version of IAR EWARM Workbench V6.21 is used to open this example
project, MCU type, pre-included files (in preprocess table of C/C++ compiler), icf file
(in link table of debug option), flash loader file (down table of debugger option) may
lose, please check these settings.
4. if the former version of Keil μVision V4.20 is used to open this example project, MCU
type, pre-included files (in C/C++ table of project option), debug setting (in debug
table of project setting) may lose, please check these information.
5. If user uses former version of IAR EWARM Workbench V6.20, it is a MUST to copy two
files (core_cmFunc.h and core_cmInstr.h in cmsis_low_ver folder in current project
directory) to common folder (path: ..\..\common).
8
AN706-00037-2v0-E
2
IEC60730 Class B Requirement
The specification defined in IEC60730 requires controls with functions classified as
software class B or C shall use measures to avoid and control software-related
faults/errors in safety-related data and safety-related segments of the software. This
means the software must use test method to detect faults internal and external of the
microcontroller.
FM3 IEC60730 Self-Test library (STL) focuses on software Class B requirement for
MB9B100A/MB9B300B/MB9B400A/MB9B500B series MCU, which covers most
IEC60730 requirements listed in the standard. For Class B controllers, below table lists
elements that must be tested, method to be adapted and definitions to be implemented
as summary of Annex H table H.11.12.7.
Component
Fault/Error
Method used in STL
Definitions
In STL
1.1 Register
Stuck at
static memory test
H. 2.19.6
YES
1.2 Program counter
Stuck at
logical monitoring of
H.2.18.10.2
TES
Time-slot monitoring
H.2.18.10.4
YES
Wrong frequency
Frequency monitor
H.2.18.10.1
YES
4.1. Invariable memory
All single bit faults
Redundancy check
H.2.19.3.2
YES
4.2. Variable memory
DC fault
static memory test
H.2.19.6
YES
4.3. Address[1]
Stuck at
Redundancy check
1. CPU
the program sequence
2. Interrupt
No interrupt or too
frequency interrupt
3. Clock
4. Memory
5. Internal data path
[2]
-
YES
Stuck at
-
-
NO
6.1 Data[3]
Hamming distance 3
-
-
NO
6.3 Timing
Wrong point in time
-
-
NO
6.External
communication
9
AN706-00037-2v0-E
7. Input/output periphery
7.1 Digital I/O
Function error
Output verification
H.2.18.12
YES
7.2 A/D
Function error
Input comparison
H.2.18.8
YES
Table 2-1: FM3 IEC60730 STL Test Items
Notes:
1. The address test can be partly covered by test method of invariable and variable
memory test. E.g. the error that two cells are mapped to a same address can be
identified when doing invariable memory test with CRC test.
2. Internal data path is only tested when using external memory.
3. The external communication test is not involved in this STL. But external
communication data can be tested with similar method of invariable memory test.
10
AN706-00037-2v0-E
3
IEC60730 Class B STL Overview
As shown in following figure, the STL block diagram includes CPU, Interrupt, Clock,
Memory, and Input/output periphery module. It shows file structure and software APIs in
the STL. The STL is coded by mixed C and assembly language.
FM3 IEC60730 STL should be compatible with ARM, IAR compiler. So STL supplies
two kinds of CPU test.s and ram test.s files according to different compilers.
IEC60730_B_STL
CPU
Test.s
reg_test()
pc_test()
Clock
Test.c
ClkInit()
ClkTestReset()
ClkCnt()
ClkTest()
ClkMonInMainloop()
InitCSV()
CheckCSVStat
Interrupt
Test.c
IntCntPro()
IntTestInit()
IntTest()
ROM
Test.c
HardwareCRC16Gen()
HardwareCRC16Test()
SoftwareCRC16Gen()
SoftwareCRC16Test()
HardwareCRC32Gen()
HardwareCRC32Test()
SoftwareCRC32Gen()
SoftwareCRC32Test()
RAM
Test.s
ram_test()
IO
Test.c
GPIOOutput
Test()
GPIOInput
Test()
ADTest()
AD
Test.c
ADTest()
Figure 3-1: FM3 IEC60730 Class B STL Block Diagram
The STL consists of several independent function modules, which have to be executed
once or cyclically as required by the application.
The test function implemented once is called Power-On Self-Test (POST), which should
be implemented in system initialization, this test is always complete but
destructive(need Initialize), which means it covers full test area but the data is not
restored after executing test. PC, register, ROM/RAM, IO, AD test are all POST.
The test function implemented cyclically is called Build-In Self-Test (BIST), which should
be implemented in main loop or timer interrupt service routine in a certain interval, this
test will not change test data and act as a monitor when program is running. Interrupt
and clock are BIST.
11
AN706-00037-2v0-E
Notes:
1. The library should be used as explained, if any part is changed, a new validation is
needed for these parts.
2. This library is usable, as-is, for all Fujitsu Cotex-M3 MCU, including those not
especially mentioned in this application notes.
3. The prefix of file and function name is omitted for easy description.
4. The STL provides two types of assembly files for CPU and RAM test for IAR and Keil
IDE.
5. User has alternative test method in clock and Flash test.
12
AN706-00037-2v0-E
4
IEC60730 Class B STL API
4.1
CPU Register Test
ARM Cotex-M3 has 19 core registers, which can be read and written. These registers
need to be tested.
Register Name
Bits tested
R0-R12
[31:0]
R13 (SP_main, SP_process)
[1]
[31:4]
R14 (LR)
APSR
[31:0]
[2]
[31:27]
[3]
PRIMASK
FAULTMASK
BASEPRI
0
[4]
0
[5]
[7:4]
Table 4-1: Cotex-M3 Register List
Notes:
1. ARM Cotex-M3 kernel has two stack pointers: main stack pointer (MSP) and process
stack pointer (PSP). Handler mode uses MSP and process mode uses MSP or PSP.
R13 indicates current SP.
2. Only high 5 bits of APSR is valid.
3. Only bit 0 of PRIMASK is valid.
4. Only bit 0 of FAULTMASK is valid.
5. 16 interrupt priority levels can be configured by bit[7:4] of Interrupt Priority Registers
in FM3 MCU, so only bit[7:4] of BASEPRI can be used to mask user interrupt.
13
AN706-00037-2v0-E
4.1.1
Test Description
As shown at table H.11.12.7, registers must be checked for “stuck-at error”, a simple
checkerboard method is used to implement register test, which is an effective method to
detect stuck-at error.
This test should be called at startup file when system resets in Privileged mode, as
kernel registers needs to be accessed. This test does not disable interrupts during the
register test. It is the responsibility of the application to disable interrupts when this
function is called to ensure that the register test is not interrupted.
Assembly is used to implement register test due to access to registers directly. And as it
is highly critical, it is designed that once register test error is detected, program will run
into an infinite loop.
The flow chart to test 1 register is shown as following figure.
Start
Select one pattern
Reverse the
pattern
Write pattern data into
register
Write reverse pattern
data into register
Read register
Read register
Verify if read data is
same with write data
Y
N
Verify if read data is
same with write data
N
Y
Jump to infinite loop
Return
Figure 4-1: Test 1 Register
14
AN706-00037-2v0-E
4.1.2
API Definition
Name
iec60730_reg_test
Parameter
None
Return
None
Description:
This function tests all registers including R0-R12 (low:R0-R7,high:R8-R12) special
registers (SP, LR, APSR, PRIMASK, FAULTMASK, BASEPRI) with checkerboard
method. This function should be called at reset handler.
15
AN706-00037-2v0-E
4.2
CPU PC Test
4.2.1
Test Description
As shown at table H.11.12.7, PC must be checked for “stuck-at error”. PC test makes
use of 8 subroutines and validates if PC value gotten from each subroutines is same
with pre-define value.
This test should be called at startup file when system resets in Privileged mode. This
test does not disable interrupts during the register test. It is the responsibility of the
application to disable interrupts when this function is called to ensure that the register
test is not interrupted.
Assembly is used to implement PC test due to access to PC register directly. As it is
highly critical, it is designed that once PC test error is detected, program will run into an
infinite loop.
The PC test flow is shown as following figure.
Jump to
subroutine1
Store
subroutine 1
address
Verify
subroutine 1
address
...
Jump to
subroutine8
Store
subroutine 8
address
Verify
subroutine 8
address
Figure 4-2: PC Test Flow Chart
16
AN706-00037-2v0-E
4.2.2
API Definition
Name
iec60730_pc_test
Parameter
None
Return
None
Description:
This function jumps to subroutines at different areas and gets the subroutine address,
then verifies if address gotten is correct. It should be called at reset handler.
17
AN706-00037-2v0-E
4.3
Interrupt Test
4.3.1
Test Description
To meet Class B requirement, interrupt must be checked for “incorrect frequency”. This
test is a task which is highly system dependent and therefore the STL can only
contribute the wrap up handle, which checks that a number of specific interrupts
occurred at least and at most a predefined number of times. It is assumed that
IEC60730_IntTest (interrupt test function) is called in specified intervals, e.g. triggered
by a timer or line frequency interrupt. Each specific interrupt handler which is to be
supervised, must decrement a dedicated global variable (Freq) by calling
IEC60730_IntCnt, IEC60730_IntTest compares that variable to predefined upper and
lower bounds, sets it to its preset value and returns an error, if the limits are exceeded.
For example, measure if timer0-3 interrupts happen 5 times in 10 second, assume 10
second timing can be gotten by a reload timer and set the range of interrupt frequency
of timer 0-3 at [3, 7].
Reload timer interrupt
User code
3<freq_init[0]-freq[0]<7?
IEC60730_IntTest()
N
Y
3<freq_init[1]-freq[1]<7?
N
Y
3<freq_init[2]-freq[2]<7?
N
Y
3<freq_init[3]-freq[3]<7?
Y
IEC60730_
IntITestnit() Initialize freq
Return Normal
Timer 0
interrupt
N
IEC60730_
IntTestInit()
Initialize freq
User code
IEC60730_
IntCntPro(0)
Timer 1
interrupt
Timer 2
interrupt
User code
User code
IEC60730_
IntCntPro(1)
IEC60730_
IntCntPro(2)
Timer 3
interrupt
User code
IEC60730
IntCntPro(3)
freq[0]--
freq[1]--
freq[2]--
freq[3]--
User code
User code
User code
User code
Return
Return
Return
Return
Return
INT_ERROR
User code
Main loop
Return
Interrupt
Figure 4-3: Interrupt Test Block Diagram
The interrupt test is independent from user application. User just need to add the
interrupt test API into his interrupt which he wants to test.
18
AN706-00037-2v0-E
4.3.2
API Definition
Name
IEC60730_IntTestInit
pFreq: pointer to frequency counters
pFreqLower: pointer to lower frequencies
Parameter
pFreqUpper: pointer to upper frequencies
pFreqInitial: pointer to frequency initial value
ArraySize: pointer to interrupt num
Return
None
Description:
This function Initializes str_int_test_par_t structure for interrupt test, which includes
pre-defined frequency ranges and frequency initial values. It should be called at system
initialization, before interrupt test starts.
Name
IEC60730_IntCntPro
Parameter
IntNum: interrupt number
Return
None
Description:
This function decreases frequency counter of the interrupt specified by the interrupt
number, and should be called in the interrupt which to be supervised.
19
AN706-00037-2v0-E
Name
IEC60730_IntTest
Parameter
None
Return
0: IEC60730_TEST_NORMAL
1: IEC60730_TEST_FUNC_ERROR
Description:
This is interrupt test main function, which verifies if interrupts are handled in time. It
should be called at a timer interrupt or main loop in a certain interval.
20
AN706-00037-2v0-E
4.4
Clock Test
4.4.1
Test Description
To meet Class B requirement, CPU clock must be checked for “wrong frequency”. This
requires a second independent clock as a standard clock for clock test. This library
provides two ways to implement clock test. First, FM3 MCU has integrated a watch
counter which can be sourced by an external sub clock (32.768kHz oscillator). The sub
clock can be treated as the standard clock. For the second, FM3 MCU has integrated a
Clock Supervisor (in following called CSV), which includes the functions: Clock failure
detection and Anomalous frequency detection. The CSV can also be used for clock
test.
User
should
enable
the
definition
“IEC60730_CLKTEST_USE_CSV”
in
IEC60730_user.h file if he wants to use CSV to perform clock test.

Use watch counter to do clock test
This test takes watch counter as standard clock, and tests if the frequency of CPU clock
is within acceptable bound by verifying a time tick which is counted in a timer interrupt.
The source clock of timer interrupt should be same with CPU clock. The case that CPU
clock is sourced by sub clock can not be tested, as 32.768kHz oscillator is assumed
accurate.
These test functions are implemented: IEC60730_ClkCnt, IEC60730_ClkTest, and
IEC60730_ClkMonMainloop, shown as following figure. The timer interrupt occurrence
frequency is monitored by watch counter and the watch counter interrupt occurrence is
checked in main loop.
Timer Interrupt handler
Watch counter interrupt
handler
Main loop
…
…
…
IEC60730_ClkCnt
…
freq
IEC60730_ClkTest
Int occurrence
flag
IEC60730_ClkMonInMainloop
…
…
Monitored clock
Dependent clock
Figure 4-4: Clock Test Block Diagram
21
AN706-00037-2v0-E
The API IEC60730_ClkCnt is used to count a global variable “freq”, which is called in a
timer interrupt handler, the source clock of timer should be same with CPU clock. The
flowchart of IEC60730_ClkCnt is shown as following figure.
Start
N
First watch counter
interrupt happened?
Y
freq++
freq overflow?
Y
Set overflow
flag
N
Return
Figure 4-5: Clock Counter Flowchart
Notes:
1. The global variable “freq” starts to count until first watch counter interrupt occurred,
because it is a limitation of watch counter in FM3 MCU that the first count cycle is 2
times of normal cycle. So the first watch counter interrupt should be ignored.
22
AN706-00037-2v0-E
API IEC60730_ClkTest is to check if “freq” is in pre-defined range, which is called in watch
counter interrupt handler.
Start
N
First watch counter
interrupt happened?
Y
Set first interrupt flag
Reset clock
test
Set watch counter
interrupt flag
Check overflow
flag
Y
Return
TEST_FUNC_ERROR
N
freq>lower freq &&
freq<higher freq
N
Y
Ruturn
TEST_NORMAL
Clear freq
Figure 4-6: Clock Test Flowchart
API IEC60730_ClkMonInMainloop guarantees the occurrence of watch counter interrupt
in a certain period, this period depends on the threshold value set by user according to a
real application. The flowchart of IEC60730_ClkMonMainInloop is shown as following
figure.
23
AN706-00037-2v0-E
Start
N
First watch counter
interrupt happened?
Y
N
loop count++
Check
watch counter
interrupt flag
Loop count>
threshold value
Clear watch counter
interrupt flag
Reset clock test
Return
TEST_NORMAL
Return
TEST_FUNC_ERROR
N
Y
Y
Clear loop
count
Figure 4-7: Clock Main Loop Monitor Flowchart

Use CSV to do clock test
The CSV has two types of functions: Clock failure detection (CSV: Clock failure
detection by clock Super Visor) and Anomalous frequency detection (FCS:
anomalous Frequency detection by Clock Super visor).
The clock failure detection monitors the main and sub clocks. If a rising edge of the
monitored clock is not detected within the specified period, this function determines that
the oscillator has failed, and outputs a system reset request. The main clock is
monitored with the high-speed CR clock, and the sub clock is monitored with the
low-speed CR clock. When a rising edge is not detected within 32 clocks of high-speed
CR for the main clock, or within 32 clocks of low-speed CR for the sub clock, this
function determines that the oscillator has failed. Figure 4-8 shows the block diagram of
the clock failure detection.
24
AN706-00037-2v0-E
Main_OSC
Main clock
counter
High-speed CR
Control circuit/
registers
Sub_OSC
CSV_RESET
Sub clock
counter
Low-speed CR
Figure 4-8: Clock Failure Detection Block Diagram
The Anomalous frequency detection monitors the main clock. Within the specified
period between an edge and the next edge of the divided clock of high-speed CR, this
function counts up the internal counter using the main clock. If the count value reaches
out of the set
window range, the function determines that the main clock frequency is anomalous, and
outputs an interrupt request or a system reset request to the CPU.
Figure 4-9 shows
the block diagram of the anomalous frequency detection.
Main_OSC
driver
Frequency
counter
Edge
detection
High-speed CR
Control circuit/
registers and
window registers
FCS_RESET
FCS_INT
Figure 4-9: Anomalous Frequency Detection Block Diagram
25
AN706-00037-2v0-E
Two
test
functions
are
IEC60730_InitCSV
implemented:
and
IEC60730_CheckCSVStat.
The API IEC60730_InitCSV provides a selection for user to disable/enable Clock failure
detection and Anomalous frequency detection functions. It should be called before
system clock initialization. Figure 4-10 shows the flow chart of it.
Start
Get the trimming value
from 0x00101004*1
Enable CSV main clock
monitor function*4
Set the trimming frequency
register MCR_FTRM*2
CSV sub clock
monitor enable?
Set FCS count cycle to
1/512
Enable CSV sub clock
monitor function*4
Set the upper and lower
frequency*3
N
Enable FCS function
Y
CSV main clock
monitor enable?
N
Y
FCS main clock frequency
monitor enable?
Enable FCS interrupt*5
Y
N
Open FCS interrupt
Return normal status
Figure 4-10: IEC60730_InitCSV Flow Chart
Notes:
1)
The default high-speed CR trimming value is stored in the address 0x00101004 when
leaving factory.
2)
If the CR trimming value in the address 0x00101004 is destroyed, a typical value will
be written into the trimming register MCR_FTRM.
3)
When setting the expected accuracy of main clock, high-speed CR frequency should
also be considered. Consider the high-speed CR oscillator precision is 4M±3% (As
found in data sheet, for MB9B100A / MB9B300A / MB9B400A / MB9B500A, the
26
AN706-00037-2v0-E
high-speed CR oscillator precision is 4M±2% in 25°C, so 4M±3% is used for a little
margin).
The base upper and lower count can be calculated by following formula.
base lower count (operating in +3.0%) = 1/[(freq/512*) × (1 + 0.03)] × freq = 512/1.03 =
497
base upper count (operating in -3.0%) = 1/[(freq/512*) × (1 - 0.03)] × freq = 512/0.97 =
528
If 5% accuracy is set,
lower count = 497 × 0.95 = 472
upper count = 528 × 1.05 = 554
4)
After enable CSV function, a reset will occurred when a rising edge is not detected
within 32 clocks of high-speed CR for the main clock, or within 32 clocks of
low-speed CR for the sub clock.
5)
After enable FCS function and FCS interrupt, a FCS interrupt will occur if main clock
frequency is detected not in the setting range, but FCS reset is set not to output.
The API IEC60730_CheckCSVStat is used to check if Clock failure detection or
Anomalous frequency detection happens. This API should be called before
IEC60730_InitCSV.
Figure 4-11 shows the flow chart of it.
Start
N
Read reset cause register
Read CSV status register
Reset caused by
CSV?
Reset caused by main
clock frequency failure
Y
N
Y
Y
Reset caused by sub
clock frequency failure
Disable hardware watchdog
N
Return normal status
Return error status
Figure 4-11: IEC60730_CheckCSVStat Flow Chart
27
AN706-00037-2v0-E
4.4.2

API Definition
Use watch counter to do clock test
Name
IEC60730_ClkCnt
Parameter
None
Return
None
Description:
This API is used to count clock frequency, which should be called in the timer interrupt.
Name
IEC60730_ClkTest
Parameter
None
Return
0: IEC60730_TEST_NORMAL
1: IEC60730_TEST_FUNC_ERROR
Description:
This API tests if the frequency of CPU clock is within acceptable bound by verifying a
time tick which is counted in a timer interrupt. It should be called in the watch counter
interrupt, which is sourced by an independent 32.768kHz clock (sub-clock of FM3
MCU).
Name
IEC60730_ClkMonInMainloop
Parameter
None
Return
0: IEC60730_TEST_NORMAL
1: IEC60730_TEST_FUNC_ERROR
28
AN706-00037-2v0-E
Description:
This API is used to monitor watch counter interrupt occurrence, it should be called in
main loop.
Name
IEC60730_ClkTestReset
Parameter
None
Return
None
Description:
This API resets interrupt test variables.
29
AN706-00037-2v0-E
Name
IEC60730_ClkInit
FreqLower: indicate timer interrupt minimum occur frequency
Parameter
FreqUpper: indicate timer interrupt maximum occur frequency
ClkTestThreshold: indicate threshold value
Return
None
Description:
This API should be called at system initialization before clock test starts.
The parameter FreqLower and FreqUpper should be set according to actual example. For
example, if user uses 1s interval for watch counter to monitor a 50ms timer interrupt.
The value FreqLower =18, FreqUpper =22 can be set as bound of timer clock frequency,
the standard of which is 20.
It is important to estimate threshold value, which should be at least 1s/mainloop
execution time.

Use CSV to do clock test
Name
IEC60730_CheckCSVStat
Parameter
pRegRSTStat: get the data from reset cause register
Return
None
Description:
This API is used to check if Clock failure detection or anomalous frequency detection
happens. The parameter “pRegRSTStat” store the address of data read from reset
cause register. This API only handles the reset caused by CSV, otherwise it will return
normal status. It should be called before IEC60730_InitCSV.
30
AN706-00037-2v0-E
Name
IEC60730_InitCSV
CSV_MCLKMonEn: 0: disable CSV main clock monitor 1:enable CSV main clock monitor
CSV_SCLKMonEn: 0: disable CSV sub clock monitor 1:enable CSV sub clock monitor
FCS_MONInfo: a fcs_mon_info_t structure
typedef struct fcs_mon_info
Parameter
{
stl_uint8_t FCSMonEn;
/* 0: disable FCS function, 1: enable FCS
function */
stl_uint8_t MCLKFreqAccuracy; /* input the excepted accuracy of main clock,
5->5%*/
} fcs_mon_info_t;
Return
0: IEC60730_TEST_NORMAL
2: IEC60730_TEST_PARA_ERROR
Description:
This API can enable/disable CSV main/sub clock function, and input the expected
accuracy of main clock frequency. It should be called before system clock initialization.
31
AN706-00037-2v0-E
4.5
Invariable Memory Test
Invariable memory in FM3 MCU means On-Chip Flash. The Flash size can be
configured according to different product shown as table 1-1.
FM3 MCU integrates an On-Chip CRC module. The CRC (Cyclic Redundancy Check)
module is an error detection system. The CRC code is a remainder after an input data
string is divided by the pre-defined generator polynomial, assuming the input data string
is a high order polynomial. Ordinarily, a data string is suffixed by a CRC code when
being sent, and the received data is divided by a generator polynomial as described
above. If the received data is dividable, it is judged to be correct. On-Chip Flash Test
confirms with CRC that data and program is correct.
This module can either use CCITT CRC16 or IEEE-802.3 CRC32, which can be
configured by CRCCR:CRC32 bit. In this module, the generator polynomials are fixed to
the numeric values for those two modes.

CCITT CRC16 generator polynomial: 0x1021(Omitted most significant bit of
0x11021)

IEEE-802.3 CRC32 generator polynomial: 0x04C11DB7
Following figure shows an application of CRC test when FM3 MCU communicates with other
devices.
32
AN706-00037-2v0-E
HardwareCRCTest
(FM3 MCU)
SoftwareCRCTest
(other MCU or PC)
Build-in
Hardware CRC
generator
Software CRC
arithmetic
D0,D1,D2…DN
D0,D1,D2…DN
Generate
CRC code
CRC
code
RX
D0,D1,D2…DN
D0,D1,D2…DN
Software CRC
arithmetic
Verify generate CRC
code
TX
Build-in
Hardware CRC
generator
D0,D1,D2…DN
CRC
code
D0,D1,D2…DN
D0,D1,D2…DN
Generate
CRC code
CRC code
D0,D1,D2…DN
Verify generate CRC
code
CRC
code
Figure 4-12: CRC test by communication
4.5.1
Test Description
To meet Class B requirement, Flash test must be checked for “single bit fault”. This test
can be implemented as CRC16/32 test. On-Chip CRC module is used to implement
hardware CRC16/32 test, and software CRC16/32 are also provided with same
implementation arithmetic as hardware CRC.
Enable the definition “FLASH_TEST_USE_CRC16” in IEC60730_user.h file if user
wants to use CRC16 arithmetic for Flash test, otherwise CRC32 arithmetic will be
implemented.
This test can be implemented at startup procedure to test whole code area, or it can
also be called periodically to test sub blocks. Flash Test compares the generated CRC
code at the time of test with the stored CRC code when build by a workbench tool.
See, 8.1 CRC code making method for generating CRC code with a workbench
X
X
X
X
tool.
Notes:
The CRC can also be used to test external communication data, which fulfills H.2.19.4.1 to
detect hamming distance 3 errors.
33
AN706-00037-2v0-E

Hardware CRC
The procedure to generator CRC code with hardware CRC module can be described as
following steps.
(1) Initial CRC control register CRCCR and initial value register CRCINIT
(2) Write “1” to the initial value bit (CRCCR:INIT). The value of CRCINIT is loaded into
CRC register CRCR.
(3) Write data into input data register CRCIN continuously. Then CRC calculation
starts. To obtain a CRC code, read the CRC register (CRCR).
Figure 4-13: Sequence of generating CRC code


Software CRC
Software CRC16 Arithmetic
The CRC table enquiry method is used. The software CRC16 arithmetic should
implement 6 steps to generate a new CRC code.
(1) Initialize CRC code in 0xFFFF.(2) Store CRC code in “temp” after having divided it
by 256.
(3) Left shift 8 bits of the CRC code.
(4) Store the CRC code by XOR CRC code with the data gotten from CRC table(use the
data which calculated by XOR “temp” with the target data for a table index).
34
AN706-00037-2v0-E
(5) Increment the target data for 1 byte.
(6) Repeat processes of (2) to (5) until byte size of target data.
The software CRC16 generation code and CRC16 table is shown as following figure.
stl_uint16_t IEC60730_SoftwareCRC16Gen(stl_uint8_t *pData, stl_uint32_t Size)
{
stl_uint8_t temp;
stl_uint8_t *p_temp_data = pData;
stl_uint16_t crc = 0xFFFF;
while(Size-- != 0)
{
temp = crc/256;
crc <<=8;
crc ^= CRCTable[temp^*p_temp_data];
p_temp_data++;
}
return crc;
}
Figure 4-14: Software CRC16 Generation Source Code
35
AN706-00037-2v0-E
const stl_uint16_t
0x0000, 0x1021,
0x8108, 0x9129,
0x1231, 0x0210,
0x9339, 0x8318,
0x2462, 0x3443,
0xA56A, 0xB54B,
0x3653, 0x2672,
0xB75B, 0xA77A,
0x48C4, 0x58E5,
0xC9CC, 0xD9ED,
0x5AF5, 0x4AD4,
0xDBFD, 0xCBDC,
0x6CA6, 0x7C87,
0xEDAE, 0xFD8F,
0x7E97, 0x6EB6,
0xFF9F, 0xEFBE,
0x9188, 0x81A9,
0x1080, 0x00A1,
0x83B9, 0x9398,
0x02B1, 0x1290,
0xB5EA, 0xA5CB,
0x34E2, 0x24C3,
0xA7DB, 0xB7FA,
0x26D3, 0x36F2,
0xD94C, 0xC96D,
0x5844, 0x4865,
0xCB7D, 0xDB5C,
0x4A75, 0x5A54,
0xFD2E, 0xED0F,
0x7C26, 0x6C07,
0xEF1F, 0xFF3E,
0x6E17, 0x7E36,
};
crc_table[256]={
0x2042, 0x3063, 0x4084,
0xA14A, 0xB16B, 0xC18C,
0x3273, 0x2252, 0x52B5,
0xB37B, 0xA35A, 0xD3BD,
0x0420, 0x1401, 0x64E6,
0x8528, 0x9509, 0xE5EE,
0x1611, 0x0630, 0x76D7,
0x9719, 0x8738, 0xF7DF,
0x6886, 0x78A7, 0x0840,
0xE98E, 0xF9AF, 0x8948,
0x7AB7, 0x6A96, 0x1A71,
0xFBBF, 0xEB9E, 0x9B79,
0x4CE4, 0x5CC5, 0x2C22,
0xCDEC, 0xDDCD, 0xAD2A,
0x5ED5, 0x4EF4, 0x3E13,
0xDFDD, 0xCFFC, 0xBF1B,
0xB1CA, 0xA1EB, 0xD10C,
0x30C2, 0x20E3, 0x5004,
0xA3FB, 0xB3DA, 0xC33D,
0x22F3, 0x32D2, 0x4235,
0x95A8, 0x8589, 0xF56E,
0x14A0, 0x0481, 0x7466,
0x8799, 0x97B8, 0xE75F,
0x0691, 0x16B0, 0x6657,
0xF90E, 0xE92F, 0x99C8,
0x7806, 0x6827, 0x18C0,
0xEB3F, 0xFB1E, 0x8BF9,
0x6A37, 0x7A16, 0x0AF1,
0xDD6C, 0xCD4D, 0xBDAA,
0x5C64, 0x4C45, 0x3CA2,
0xCF5D, 0xDF7C, 0xAF9B,
0x4E55, 0x5E74, 0x2E93,
0x50A5,
0xD1AD,
0x4294,
0xC39C,
0x74C7,
0xF5CF,
0x66F6,
0xE7FE,
0x1861,
0x9969,
0x0A50,
0x8B58,
0x3C03,
0xBD0B,
0x2E32,
0xAF3A,
0xC12D,
0x4025,
0xD31C,
0x5214,
0xE54F,
0x6447,
0xF77E,
0x7676,
0x89E9,
0x08E1,
0x9BD8,
0x1AD0,
0xAD8B,
0x2C83,
0xBFBA,
0x3EB2,
0x60C6,
0xE1CE,
0x72F7,
0xF3FF,
0x44A4,
0xC5AC,
0x5695,
0xD79D,
0x2802,
0xA90A,
0x3A33,
0xBB3B,
0x0C60,
0x8D68,
0x1E51,
0x9F59,
0xF14E,
0x7046,
0xE37F,
0x6277,
0xD52C,
0x5424,
0xC71D,
0x4615,
0xB98A,
0x3882,
0xABBB,
0x2AB3,
0x9DE8,
0x1CE0,
0x8FD9,
0x0ED1,
Figure 4-15: CRC16 table
36
0x70E7,
0xF1EF,
0x62D6,
0xE3DE,
0x5485,
0xD58D,
0x46B4,
0xC7BC,
0x3823,
0xB92B,
0x2A12,
0xAB1A,
0x1C41,
0x9D49,
0x0E70,
0x8F78,
0xE16F,
0x6067,
0xF35E,
0x7256,
0xC50D,
0x4405,
0xD73C,
0x5634,
0xA9AB,
0x28A3,
0xBB9A,
0x3A92,
0x8DC9,
0x0CC1,
0x9FF8,
0x1EF0
AN706-00037-2v0-E

Software CRC32 Arithmetic
The CRC table enquiry method is used. The software CRC32 arithmetic should
implement 6 steps to generate a new CRC code.
(1) Initialize CRC code in 0xFFFFFFFF.
(2) Store CRC code in “temp” after having 24 bits shifted it.(3) Store the CRC code by
XOR left 8 bits shifted CRC code with the data gotten from CRC table(use the data
which calculated by XOR “temp” with the target data for a table index).(4) Increment the
target data for 1 byte.
(5) Repeat processes of (2) to (4) until byte size of target data.
(6) Finally, return reversed bit of CRC code.
The software CRC32 generation code and CRC32 table is shown as following figure.
stl_uint32_t IEC60730_SoftwareCRC32Gen(stl_uint8_t *pData, stl_uint32_t Size)
{
stl_uint8_t temp;
stl_uint8_t *p_temp_data = pData;
stl_uint32_t crc = 0xFFFFFFFF;
while(Size--)
{
temp=( crc >> 24 );
crc = ( crc << 8 ) ^ CRCTable[temp^*p_temp_data];
p_temp_data++;
}
return ~crc;
}
Figure 4-16: Software CRC32 Generation Source Code
37
AN706-00037-2v0-E
const stl_uint32_t CRCTable[256]={
0x00000000L, 0x04c11db7L, 0x09823b6eL,
0x130476dcL, 0x17c56b6bL, 0x1a864db2L,
0x2608edb8L, 0x22c9f00fL, 0x2f8ad6d6L,
0x350c9b64L, 0x31cd86d3L, 0x3c8ea00aL,
0x4c11db70L, 0x48d0c6c7L, 0x4593e01eL,
0x5f15adacL, 0x5bd4b01bL, 0x569796c2L,
0x6a1936c8L, 0x6ed82b7fL, 0x639b0da6L,
0x791d4014L, 0x7ddc5da3L, 0x709f7b7aL,
0x9823b6e0L, 0x9ce2ab57L, 0x91a18d8eL,
0x8b27c03cL, 0x8fe6dd8bL, 0x82a5fb52L,
0xbe2b5b58L, 0xbaea46efL, 0xb7a96036L,
0xad2f2d84L, 0xa9ee3033L, 0xa4ad16eaL,
0xd4326d90L, 0xd0f37027L, 0xddb056feL,
0xc7361b4cL, 0xc3f706fbL, 0xceb42022L,
0xf23a8028L, 0xf6fb9d9fL, 0xfbb8bb46L,
0xe13ef6f4L, 0xe5ffeb43L, 0xe8bccd9aL,
0x34867077L, 0x30476dc0L, 0x3d044b19L,
0x278206abL, 0x23431b1cL, 0x2e003dc5L,
0x128e9dcfL, 0x164f8078L, 0x1b0ca6a1L,
0x018aeb13L, 0x054bf6a4L, 0x0808d07dL,
0x7897ab07L, 0x7c56b6b0L, 0x71159069L,
0x6b93dddbL, 0x6f52c06cL, 0x6211e6b5L,
0x5e9f46bfL, 0x5a5e5b08L, 0x571d7dd1L,
0x4d9b3063L, 0x495a2dd4L, 0x44190b0dL,
0xaca5c697L, 0xa864db20L, 0xa527fdf9L,
0xbfa1b04bL, 0xbb60adfcL, 0xb6238b25L,
0x8aad2b2fL, 0x8e6c3698L, 0x832f1041L,
0x99a95df3L, 0x9d684044L, 0x902b669dL,
0xe0b41de7L, 0xe4750050L, 0xe9362689L,
0xf3b06b3bL, 0xf771768cL, 0xfa325055L,
0xc6bcf05fL, 0xc27dede8L, 0xcf3ecb31L,
0xd5b88683L, 0xd1799b34L, 0xdc3abdedL,
0x690ce0eeL, 0x6dcdfd59L, 0x608edb80L,
0x7a089632L, 0x7ec98b85L, 0x738aad5cL,
0x4f040d56L, 0x4bc510e1L, 0x46863638L,
0x5c007b8aL, 0x58c1663dL, 0x558240e4L,
0x251d3b9eL, 0x21dc2629L, 0x2c9f00f0L,
0x36194d42L, 0x32d850f5L, 0x3f9b762cL,
0x0315d626L, 0x07d4cb91L, 0x0a97ed48L,
0x1011a0faL, 0x14d0bd4dL, 0x19939b94L,
0xf12f560eL, 0xf5ee4bb9L, 0xf8ad6d60L,
0xe22b20d2L, 0xe6ea3d65L, 0xeba91bbcL,
0xd727bbb6L, 0xd3e6a601L, 0xdea580d8L,
0xc423cd6aL, 0xc0e2d0ddL, 0xcda1f604L,
0xbd3e8d7eL, 0xb9ff90c9L, 0xb4bcb610L,
0xae3afba2L, 0xaafbe615L, 0xa7b8c0ccL,
0x9b3660c6L, 0x9ff77d71L, 0x92b45ba8L,
0x8832161aL, 0x8cf30badL, 0x81b02d74L,
0x5d8a9099L, 0x594b8d2eL, 0x5408abf7L,
0x4e8ee645L, 0x4a4ffbf2L, 0x470cdd2bL,
0x7b827d21L, 0x7f436096L, 0x7200464fL,
0x68860bfdL, 0x6c47164aL, 0x61043093L,
0x119b4be9L, 0x155a565eL, 0x18197087L,
0x029f3d35L, 0x065e2082L, 0x0b1d065bL,
0x3793a651L, 0x3352bbe6L, 0x3e119d3fL,
0x2497d08dL, 0x2056cd3aL, 0x2d15ebe3L,
0xc5a92679L, 0xc1683bceL, 0xcc2b1d17L,
0xd6ad50a5L, 0xd26c4d12L, 0xdf2f6bcbL,
0xe3a1cbc1L, 0xe760d676L, 0xea23f0afL,
0xf0a5bd1dL, 0xf464a0aaL, 0xf9278673L,
0x89b8fd09L, 0x8d79e0beL, 0x803ac667L,
0x9abc8bd5L, 0x9e7d9662L, 0x933eb0bbL,
0xafb010b1L, 0xab710d06L, 0xa6322bdfL,
0xbcb4666dL, 0xb8757bdaL, 0xb5365d03L,
};
0x0d4326d9L,
0x1e475005L,
0x2b4bcb61L,
0x384fbdbdL,
0x4152fda9L,
0x52568b75L,
0x675a1011L,
0x745e66cdL,
0x95609039L,
0x8664e6e5L,
0xb3687d81L,
0xa06c0b5dL,
0xd9714b49L,
0xca753d95L,
0xff79a6f1L,
0xec7dd02dL,
0x39c556aeL,
0x2ac12072L,
0x1fcdbb16L,
0x0cc9cdcaL,
0x75d48ddeL,
0x66d0fb02L,
0x53dc6066L,
0x40d816baL,
0xa1e6e04eL,
0xb2e29692L,
0x87ee0df6L,
0x94ea7b2aL,
0xedf73b3eL,
0xfef34de2L,
0xcbffd686L,
0xd8fba05aL,
0x644fc637L,
0x774bb0ebL,
0x42472b8fL,
0x51435d53L,
0x285e1d47L,
0x3b5a6b9bL,
0x0e56f0ffL,
0x1d528623L,
0xfc6c70d7L,
0xef68060bL,
0xda649d6fL,
0xc960ebb3L,
0xb07daba7L,
0xa379dd7bL,
0x9675461fL,
0x857130c3L,
0x50c9b640L,
0x43cdc09cL,
0x76c15bf8L,
0x65c52d24L,
0x1cd86d30L,
0x0fdc1becL,
0x3ad08088L,
0x29d4f654L,
0xc8ea00a0L,
0xdbee767cL,
0xeee2ed18L,
0xfde69bc4L,
0x84fbdbd0L,
0x97ffad0cL,
0xa2f33668L,
0xb1f740b4L
Figure 4-17: CRC32 table
38
AN706-00037-2v0-E
4.5.2

API Definition
Use CRC16 arithmetic to implement Flash test
Name
Parameter
Return
IEC60730_HardwareCRC16Gen
pData: test data address
Size: data size
CRC value
Description:
This API implements CRC16 generation by internal hardware CRC generator.
The CCITT CRC16 generator polynomial: 0x1021. (Omitted most significant bit of
0x11021)
Name
IEC60730_HardwareCRC16Test
pData: test data address
Parameter
Size: data size
Crc: expected CRC code
Return
0: IEC60730_TEST_NORMAL
1: IEC60730_TEST_FUNC_ERROR
Description:
This API implements hardware CRC16 test, it can be called at startup procedure to test
all code area or test sub blocks periodically when code is running.
39
AN706-00037-2v0-E
Name
Parameter
Return
IEC60730_SoftwareCRC16Gen
pData: test data address
Size: data size
CRC value
Description:
This API implements CRC16 generation by software CRC arithmetic. The CRC table
enquiry method is used. It provides a reference CRC method that On-chip CRC is
implemented in a software way. It may be used in other system with which FM3 MCU
communicate.
Name
IEC60730_SoftwareCRC16Test
pData: test data address
Parameter
Size: data size
Crc: expected CRC code
Return
0: IEC60730_TEST_NORMAL
1: IEC60730_TEST_FUNC_ERROR
Description:
This API implements software CRC16 test, this test may be implemented in other
system with which FM3 MCU communicate.
40
AN706-00037-2v0-E

Use CRC32 arithmetic to implement Flash test
Name
Parameter
Return
IEC60730_HardwareCRC32Gen
pData: test data address
Size: data size
CRC value
Description:
This API implements CRC32 generation by internal hardware CRC generator.
The CRC32 generator polynomial: 0x04C11DB7
.
Name
IEC60730_HardwareCRC32Test
pData: test data address
Parameter
Size: data size
Crc: expected CRC code
Return
0: IEC60730_TEST_NORMAL
1: IEC60730_TEST_FUNC_ERROR
Description:
This API implements hardware CRC32 test, it can be called at startup procedure to test
all code area or test sub blocks periodically when code is running.
41
AN706-00037-2v0-E
Name
Parameter
Return
IEC60730_SoftwareCRC32Gen
pData: test data address
Size: data size
CRC value
Description:
This API implements CRC32 generation by software CRC arithmetic. The CRC table
enquiry method is used. It provides a reference CRC method that On-chip CRC is
implemented in a software way. It may be used in other system with which FM3 MCU
communicate.
Name
IEC60730_SoftwareCRC32Test
pData: test data address
Parameter
Size: data size
Crc: expected CRC code
Return
0: IEC60730_TEST_NORMAL
1: IEC60730_TEST_FUNC_ERROR
Description:
This API implements software CRC32 test, this test may be implemented in other
system with which FM3 MCU communicate.
42
AN706-00037-2v0-E
4.6
Variable Memory Test
Variable memory test in FM3 MCU means SRAM test, the SRAM size can be
configured according to different product, shown as table 1-1.
4.6.1
Test Description
To meet Class B requirement, SRAM test must be checked for “DC fault”. A simple
checkerboard method is used to implement this SRAM.
This test can be implemented at startup procedure to test entire SRAM area. And it can
also test sub blocks periodically when code is running, however user should pay
attention that the data will be destroyed after test.
As all RAM area is involved in this test, it is better not to use variable in this test, so
assembly is used to implement register test. And as it is highly critical, it is designed that
once RAM test error is detected, program will run into an infinite loop.
The procedure to test 1 word data is shown as following figure.
Start
Write 0x55555555
to the address in
RAM area
Write 0xAAAAAAAA
to the address in
RAM area
Verify the write
data
Verify the write data
Figure 4-18: Test 1 Word with Checkerboard Method
43
end
AN706-00037-2v0-E
4.6.2
API Definition
Name
Parameter
Return
iec60730_ram_test
StartAddr(R0): start RAM address
EndAddr(R1): end RAM address
None
Description:
This API tests SRAM area with Checkerboard arithmetic which writes alternate “0” and
“1” to memory, and verifies if the write data is right by reading back the data written. It
can detect stuck-at faults and direct coupling faults.
This test should be called in startup procedure, and it can also be called in cycle, but the
data is not saved after test.
44
AN706-00037-2v0-E
4.7
IO Test
FM3 MCU has up to 8 IO ports: Port0-Port8, each port has up to 16 channels. These
ports can be configured according to different package.
4.7.1
Test Description
To meet Class B requirement, GPIO must be check for “Function error”. So function test
is implemented for both input and output function. The IO direction can be configured by
IO register shown in figure 4-14. Please refer to the peripheral manual for detail of
GPIO.

Input IO configuration: ADE=0,PFR=0,DDR=0

Output IO configuration: ADE=0,PFR=0,DDR=1
I/O Port Function
Available main function
ADE/
Available sub function
SPSR
N/A
1
PFR
DDR
PCR
-
-
Disconnect
0
Valid
1
Disconnect
Special pin
Analog Input
USB
Oscillation
GPIO function input pin
GPIO function output pin
Peripheral
function output pin
Peripheral
function bidirectional pin
Peripheral
function input pin
Peripheral
function input pin
GPIO
function input pin (FB)
0
Peripheral
function input pin (FB)
GPIO
function input pin (FB)
Peripheral
function input pin (FB)
0
GPIO
function input pin (FB)
Peripheral
function input pin (FB)
GPIO
function input pin
Figure 4-19: IO Function Configuration
45
Disconnect
1
Valid
Valid
AN706-00037-2v0-E
The IO input test checks if selected IO input value which stores in PDIR is same with
expected value, . And IO output can check if output value by which stores in PDOR is
correct. These tests should be tested in startup procedure as function test.
IEC60730_GPIOInputputTest
IEC60730_GPIOOutputTest
Start
Start
Write test data
into data register
Read input data
Read data from
data register
Check if the read
data is same with
write data
Verify if read data is same
with expected data
N
Return
TEST_ERROR
N
Return
TEST_ERROR
Y
Y
Return
TEST_NORMAL
Return
TEST_NORMAL
Figure 4-20: IO Input/Output Test Flowchart
4.7.2
API Definition
Name
IEC60730_GPIOOutputTest
Port: port number
Parameter
Bit:
bit number
Value: output level
0: IEC60730_TEST_NORMAL
Return
1: IEC60730_TEST_FUNC_ERROR
2: IEC60730_TEST_PARA_ERROR
Description:
This API implements GPIO output test by setting a level for output pin and check if read
back value is the expected value.
46
AN706-00037-2v0-E
Name
IEC60730_GPIOInputTest
Port: port number
Parameter
Bit:
bit number
Value: expected pin level
0: IEC60730_TEST_NORMAL
Return
1: IEC60730_TEST_FUNC_ERROR
2: IEC60730_TEST_PARA_ERROR
Description:
This API implements GPIO input test by reading the value from input pin and check if
read value is the expected value.
47
AN706-00037-2v0-E
4.8
AD Test
FM3 MCU integrates a 10bit or 12bit AD module. It has 3 units with totally 16 channels.
4.8.1
Test Description
To meet Class B requirement, AD must be check for “Function error”.
This test
samples AD signal from selected AD channels and check if the AD convert values are in
the expected ranges.
Scan mode is used, multi-channel can be tested at the same time. The AD test
flowchart of checking single-channel is shown as following figure.
Start
IEC60730_ADTest
N
Selected A/D unit
Check if
convert finish
Y
Selected A/D
channel
Get current A/D
channel
Start A/D convert
Get A/D convert
value
N
A/D value<max &&
A/D value>min
Y
Return
TEST_NORMAL
Figure 4-21: AD Test Flowchart
48
Return
TEST_ERROR
AN706-00037-2v0-E
4.8.2
API Definition
Name
IEC60730_ADTest
ADTest_Info: a ad_test_info_t structure
typedef struct ad_test_info {
uint8_t ADUnit;
Parameter
/* unit num, 8/10 bit A/D -> 0/1/2 */
uint8_t *Ch;
/* pointer to AD channel num
uint8_t ChSize;
/* channel size */
uint16_t *ExpLowerValue;
/* pointer to expected lower value */
uint16_t *ExpUpperValue;
/* pointer to expected upper value */
*/
} ad_test_info_t;
0: IEC60730_TEST_NORMAL
Return
1: IEC60730_TEST_FUNC_ERROR
2: IEC60730_TEST_PARA_ERROR
Description:
This API implements AD test by checking if AD convert result is in expected range. It
should be implemented in startup procedure.
49
AN706-00037-2v0-E
5
Example project
Two demo projects are provided according to IAR and keil IDE. This chapter introduces
IAR demo project based on IAR MB9BF506R-SK EV-Board (MCU: MB9BF506R) and
shows how to integrate the IEC60730 STL into a real system.
5.1
User Configuration
User should first configure some definitions in IEC60730_user.h file.
5.1.1
The definition “MCU_TYPE_MB9BF500”
If MB9BF500 is used, enable the definition “MCU_TYPE_MB9BF500”, else disable this
definition.
MB9BF506R is used in the IAR MB9BF506R-SK EV-Board, so disable the definition
“MCU_TYPE_MB9BF500”.
5.1.2
The definition “IEC60730_FLASHTEST_USE_CRC16”
If User wants to use CRC16 arithmetic for Flash test, enable this definition, if user wants
to use CRC32 arithmetic for Flash test, disable this definition.
In this demo program, CRC16 arithmetic is used.
5.1.3
The definition “IEC60730_CLKTEST_USE_CSV”
If User wants to use CSV to implement clock test, enable this definition, or clock test will
be done with watch counter as standard timer, which is sourced by sub clock.
In the demo program, the latter method is demonstrated.
5.2
Project Structure
Class B STL routines are divided into two main processes: startup and periodic
self-tests. The periodic test must be initialized by a set-up block before it is applied.
5.2.1
Startup Self-Test
PC, register, SRAM test are all startup self-tests, and they should be called in reset
handler.
And Flash, AD, IO can be tested after system clock initialization after program jumps
into main function.
For AD test, channel 13 (Potentiometer input), channel 7,8,9 (inertial Sensor input) are
used for test.
For IO input test, joystick input pin P30 (LEFT), P31 (RIGHT), P40 (UP), P41 (Down)
are used for test.
50
AN706-00037-2v0-E
5.2.2
Periodic Test Initialization
Interrupt and clock test should be initialized before tests start.

Interrupt Test Initialization
It is designed that a dual time interrupt is used to monitor reload timer 0-3. The
initialization setting parameter is shown as following table.
Interrupt Name
Interrupt Interval
interrupt of dual timer
Standard Frequency
Pre-defined Range
Reload timer 0
2.5ms
25ms
10
[8,12]
Reload timer 1
1ms
25ms
25
[22, 28]
Reload timer 2
500us
25ms
50
[45,55]
Reload timer 3
250us
25ms
100
[95,105]
Table 5-1: IO Input/Output Test Flowchart

Clock Test Initialization
The CPU clock is HCLK, and the source clock of dual timer in this system is set to
PCLK0 (HCLK/2). So the source clock of dual timer can be tested indirectly in stead of
CPU clock by watch counter.
It is designed that the interrupt Interval of watch counter is 1s and interrupt Interval of
dual timer is 25ms, so the Standard Frequency of dual timer is 40 and the accepted
range is set between 45 and 55. Assume it takes 10 cycles to implement main loop. So
the minimum execution time of main loop is 1/8000000 s, so set the threshold value to
10000000.
5.2.3
Periodic Test
The interrupt and clock test should be tested in period when code is running.
Integrate IEC60730_IntTest into dual timer interrupt and IEC60730_IntCnt into each
reload timer interrupts.
Integrate IEC60730_ClkTest into watch counter interrupt, IEC60730_ClkCnt into dual
timer interrupt, and IEC60730_ClkMonInMainloop into main loop.
The Figure 5-1 shows the basic principle of how to integrate the Class B software
package into this application software.
51
AN706-00037-2v0-E
Reset
Start up self-tests (1)
(PC, register, SRAM test)
X
Application startup
Reload timer 0 Reload timer 1 Reload timer 2 Reload timer 3
ISR
ISR
ISR
ISR
System clock
initialization
Start up self-tests (2)
(CRC, AD, IO test)
X
User periphery and
function initilazation
Clock and Interrupt
initialization
X
User code
User code
User code
User code
IEC60730_
IntCnt(0)
IEC60730_
IntCnt(1)
IEC60730_
IntCnt(2)
IEC60730_
IntCnt(3)
User code
User code
User code
User code
Return
Return
Return
Return
Main loop
Watch counter
ISR
Dual timer
ISR
User code
User code
IEC60730_
ClkTest()
IEC60730_
IntTest()
User code
User code
Return
Return
User module 1
IEC60730_
ClkMonInMainloop()
X
User module 2
…
Figure 5-1: Project Structure
5.3
Sample Code
5.3.1

Startup File
Reset handler
Reset_Handler
bl iec60730_reg_test ; after reset, test register first
bl iec60730_pc_test
; test pc
ldr r0, =0x20000000
; set RAM start address
ldr r1, =0x20007fff
; set RAM end address
bl iec60730_ram_test ; test all Data RAM area
Figure 5-2: Reset Handler Sample Code
52
AN706-00037-2v0-E
5.3.2

Main File
Main function
int32_t main(void)
{
int32_t cntr = 0;
uint32_t hw_crc,sw_crc;
uint8_t bit;
uint8_t a[10] = {0x00,0x11,0x22,0x33,0x44,0x55,0x66,0x77,0x88,0x99};
uint8_t ch[4] = {7,8,9,13}; /* ch7: X-axes input */
/* ch8: Y-axes input */
/* ch9: Z-axes input */
/* ch13: VR2 input */
/* place board in horizon */
/*
* x=0x800
* y=0x800
* z=0xb41
*/
/* move the VR2 at middle */
/* VR2 value = 0xfff/2 = 0x7ff */
uint16_t low[16] = {0x700,0x700,0xb00,0x500};
uint16_t up[16] = {0x900,0x900,0xc00,0xB00};
ad_test_info_t ADTest_Info = {AD_UINT0, ch, sizeof(ch)/sizeof(uint8_t), low, up};
SystemInit();
/* use hardware CRC16 to calculate expected crc first,
then verify if the CRC code calculated by software is same with expected crc */
hw_crc = IEC60730_HardwareCRC16Gen(a, sizeof(a));
if(IEC60730_TEST_NORMAL != IEC60730_SoftwareCRC16Test(a, sizeof(a), hw_crc))
{while(1);};
/* use software CRC16 to calculate expected crc first,
then verify if the CRC code calculated by hardware is same with expected crc */
sw_crc = IEC60730_SoftwareCRC16Gen(a, sizeof(a));
if(IEC60730_TEST_NORMAL != IEC60730_HardwareCRC16Test(a, sizeof(a), sw_crc))
{while(1);};
/* GPIO output test
* test P32-P39 (control LED1-LED8)
*/
#ifdef MB9BF506R_SK
for(bit=BIT_NUM_2;bit<BIT_NUM_9;bit++)
{
if(IEC60730_TEST_NORMAL != IEC60730_GPIOOutputTest(PORT_NUM_3, bit, TEST_PIN_LOW)
|| IEC60730_TEST_NORMAL != IEC60730_GPIOOutputTest(PORT_NUM_3, bit,
TEST_PIN_HIGH))
{
while(1);
}
}
#endif
/* GPIO input test
* test P30(LEFT)
* test P31(RIGHT)
* test P40(UP)
* test P41(DOWN)
*/
#ifdef MB9BF506R_SK
if(IEC60730_TEST_NORMAL != IEC60730_GPIOInputTest(PORT_NUM_3, BIT_NUM_0,
1)){while(1);};
if(IEC60730_TEST_NORMAL != IEC60730_GPIOInputTest(PORT_NUM_3, BIT_NUM_1,
1)){while(1);};
if(IEC60730_TEST_NORMAL != IEC60730_GPIOInputTest(PORT_NUM_4, BIT_NUM_0,
1)){while(1);};
if(IEC60730_TEST_NORMAL != IEC60730_GPIOInputTest(PORT_NUM_4, BIT_NUM_1,
1)){while(1);};
#endif
/* AD test
* check if ch7,ch8,ch9,ch13 input is in expected range.
*/
53
AN706-00037-2v0-E
#ifdef MB9BF506R_SK
if(IEC60730_TEST_NORMAL != IEC60730_ADTest(ADTest_Info)){while(1);};
#endif
/*Init LEDs*/
LED_Init();
/*Init Buttons*/
Button_Init();
/*Init LCD Pins*/
HD44780_IO_Init();
/* Interrupt test initialization */
IEC60730_IntTestInit(IntTest_Freq,IntTest_FreqLower,IntTest_FreqUpper,IntTest_FreqInit,s
izeof(IntTest_Freq)/sizeof(uint32_t));
/* clock test initialization
* test CPU clock by checking if the 25ms interval time is set for dual timer,
* the occurrence frequency of dual times is about 40 in a 1s interval(produced by watch
counter)
* 1 cycle time = (1/80MHz). Assume it takes 10 cycles to implement main loop.
* So minimum
*/
IEC60730_ClkInit(35,45,10000000);
/* init watch counter */
WTC_Init();
/* init dual timer */
DT_Init();
/* init 4 base timers */
BT_Init();
/*Power up LCD*/
if(HD44780_OK != HD44780_PowerUpInit())
{
return 1;
}
#ifdef MB9BF506R_SK
/* LCD display */
HD44780_StrShow(1,1,(const HD44780_STRING_DEF *)"IEC60730 Class B");
HD44780_StrShow(3,2,(const HD44780_STRING_DEF *)"Self-Test Lib");
#endif
/*Main Loop*/
while(1)
{ /*Wait for timer tick*/
if(Tmr1Tick)
{ /*Clear timer tick flag*/
Tmr1Tick = 0;
/*update counter*/
cntr--;
/*leds update*/
LED_PDOR &= ~LED_MASK;
LED_PDOR |= ((cntr) & LED_MASK);
}
if(IEC60730_TEST_NORMAL != IEC60730_ClkMonInMainloop()) /* monitor watch counter
{
while(1);
}
}
}
Figure 5-3: Main Function Sample Code
54
AN706-00037-2v0-E

Dual Timer ISR
void DT_QDU_IRQHandler(void)
{
Tmr1Tick = 1;
FM3_DTIM->TIMER1INTCLR= 1;
/* count the clock tick */
IEC60730_ClkCnt();
/* implement interrupt test */
if(IEC60730_TEST_NORMAL != IEC60730_IntTest())
{
while(1);
}
}
Figure 5-4: Dual Timer ISR

Watch Counter ISR
void CLK_IRQHandler(void)
{
if(bFM3_INTREQ_IRQ24MON_WCINT)
{
FM3_WC->WCCR &= 0xFE;
/* Clear interrupt flag */
/* implement clock test */
if(IEC60730_TEST_NORMAL != IEC60730_ClkTest())
{
while(1);
}
}
}
Figure 5-5: Watch Counter ISR

Reload Timer ISR
void BTIM_IRQHandler(void)
{
if(FM3_BT0_RT->STC&0x01)
{
FM3_BT0_RT->STC = FM3_BT0_RT->STC &
IEC60730_IntCntPro(0);
/*
}
else if(FM3_BT1_RT->STC&0x01)
{
FM3_BT1_RT->STC = FM3_BT1_RT->STC &
IEC60730_IntCntPro(1);
/*
}
else if(FM3_BT2_RT->STC&0x01)
{
FM3_BT2_RT->STC = FM3_BT2_RT->STC &
IEC60730_IntCntPro(2);
/*
}
else if(FM3_BT3_RT->STC&0x01)
{
FM3_BT3_RT->STC = FM3_BT3_RT->STC &
IEC60730_IntCntPro(3);
/*
}
}
0xFE;
count frequency value for interrupt 0 */
0xFE;
count frequency value for interrupt 1 */
0xFE;
count frequency value for interrupt 2 */
0xFE;
count frequency value for interrupt 3 */
Figure 5-6: Reload Timer ISR
55
AN706-00037-2v0-E
6
STL API Performance
API Name
Execution time
(Cycles)
Stack
ROM
RAM
usage
Usage
(Bytes)
(Bytes)
(Bytes)
(Global variable)
iec60730_pc_test
158
0
136
0
iec60730_reg_test
498
0
642
0
8
58
0
0
36
0
0
74
20
IEC60730_IntTestInit
IEC60730_IntCntPro
IEC60730_IntTest
191
(4 interrupts)
47
339
(4 interrupt)
IEC60730_ClkCnt
54
0
32
0
IEC60730_ClkTest
92
0
80
29
IEC60730_ClkMonInMainloop
79
8
68
0
IEC60730_ClkTestReset
60
0
30
0
IEC60730_InitCSV
280
8
224
0
IEC60730_CheckCSVStat
30
0
56
0
4
98
0
8
20
0
IEC60730_HardwareCRC16Gen
IEC60730_HardwareCRC16Test
IEC60730_SoftwareCRC16Gen
IEC60730_SoftwareCRC16Test
320
(10 bytes data)
348
(10 bytes data)
52+
326
(10 bytes data)
354
(10 bytes data)
56
4
512
0
(CRC table)
8
22
0
usage
AN706-00037-2v0-E
IEC60730_HardwareCRC32Gen
IEC60730_HardwareCRC32Test
IEC60730_SoftwareCRC32Gen
IEC60730_SoftwareCRC32Test
iec60730_ram_test
320
(10 bytes data)
348
(10 bytes data)
4
92
0
8
20
0
42+
244
(10 bytes data)
266
(10 bytes data)
262
(16 bytes data)
4
1024
0
(CRC table)
8
22
0
0
84
0
IEC60730_GPIOOutputTest
264
24
254
0
IEC60730_GPIOInputTest
265
28
266
0
80
1064
0
IEC60730_ADTest
1996
(4 channels)
Table 6-1: STL API Performance
Notes:
1. The code execution cycle is tested in normal run status.
2. The ROM size of this STL is 3528 bytes. (Use CRC16 for Flash test, and watch counter
for clock test)
57
AN706-00037-2v0-E
7
Reference Documents
[1]. IEC 60730-1 Reference Manual Edition3.2, 2007
[2]. Cortex-M3 r2p0 Technical Reference Manual, 2008
[3]. ARMv7-M Architecture Application Level Reference Manual, 2008
[4]. MB9BF500A-DS706-00021-1v0-E (MB9B500 Data Sheet)
[5]. MB9Bxxx-MN706-00002-1v0-E (MB9Axxx/MB9Bxxx Series Periphery Manual)
58
AN706-00037-2v0-E
8
Appendix
8.1
CRC code making method
The method to make CRC code to use in 4.1 CPU Register Test, follows is examples of
X4. 1
X
IAR Embedded Workbench. Please refer to IAR’s manual for details.
8.1.1
Start of the Command-Line
Click “Project”→”Options”→”Linker”→”Extra options” tabs, then check the “Use
command line options”.
8.1.2
1.
Input the command
“--place_holder” command
"--place_holder" is used that make CRC code and a section in ROM. If input the
following command, to set the size of section in 4byte and the alignment in 1.
--place_holder __checksum,4,.checksum,1
59
AN706-00037-2v0-E
2.
“--fill” command
The unused area of the target area needs to fill with optional value making the CRC
code. Therefore, use “--fill” command. If input the following command,
0x00000000-0x00003FFF is filled with 0xFF.
--fill 0xFF;0x0000-0x3FFF
If input the following command, 0x00000000-0x00003FFF, 0x5000-0x5FFF and
0x6500-0x6FFF are filled with 0xFF.
--fill 0xFF;0x0-0x3FFF;0x5000-0x5FFF;0x6500-0x6FFF
3.
“--checksum” command
Set algorithm of CRC. If input the following command, you can set items as follow. The
CRC code is stored in the symbol name “__checksum”, the CRC code size is 4byte, the
algorithm is CRC32, calculation is LSB first, CRC code is initialized by 0xFFFFFFFF,
0x00000000-0x00003FFF, 0x5000-0x5FFF and 0x6500-x6FFF are filled with 0xFF.
--checksum
__checksum:4,crc32:mi,0xffffffff;0x0-0x3FFF;0x5000-0x5FFF;0x6500-0x6FFF
If input the command mentioned above (1, 2, and 3), close the window by clicking the
“OK”.
60
AN706-00037-2v0-E
8.1.3 Setting of build messages to display in the message window
If set the following contents, you can display build messages at the time of make to the
message window.
Click “Tools”→”Options”→”Messages” tabs, then select the “All” from the combo box of
“Show build messages”. Finally, close the window by clicking the “OK”.
61
AN706-00037-2v0-E
8.1.4
Setting of the Linker configuration file
54B
Add setting to the Linker configuration file to store CRC code in Flash. In the case of
debug mode, you must use “mb9bf506_ram.icf” file. In the case of release mode, you
must use “mb9bf506.icf” file. If input the following command, CRC code is stored in
0x8000.
define symbol __ICFEDIT_checksum_start__ = 0x00008000;
define block CHECKSUM {ro section .checksum};
define symbol __ICFEDIT_checksum_start__ = 0x00008000;
62
AN706-00037-2v0-E
8.1.5 Making CRC code
Confirm that the CRC code was made after make.
63
AN706-00037-2v0-E
9
Content of Table and Figure
Figure 3-1: FM3 IEC60730 Class B STL Block Diagram............................................... 11
Figure 4-1: Test 1 Register ........................................................................................... 14
Figure 4-2: PC Test Flow Chart .................................................................................... 16
Figure 4-3: Interrupt Test Block Diagram ...................................................................... 18
Figure 4-4: Clock Test Block Diagram .......................................................................... 21
Figure 4-5: Clock Counter Flowchart ............................................................................ 22
Figure 4-6: Clock Test Flowchart .................................................................................. 23
Figure 4-7: Clock Main Loop Monitor Flowchart ........................................................... 24
Figure 4-8: Clock Failure Detection Block Diagram ...................................................... 25
Figure 4-9: Anomalous Frequency Detection Block Diagram ...................................... 25
Figure 4-10: IEC60730_InitCSV Flow Chart ................................................................. 26
Figure 4-11: IEC60730_CheckCSVStat Flow Chart ..................................................... 27
Figure 4-12: CRC test by communication ..................................................................... 33
Figure 4-13: Sequence of generating CRC code ......................................................... 34
Figure 4-14: Software CRC16 Generation Source Code ............................................. 35
Figure 4-15: CRC16 table ............................................................................................. 36
Figure 4-16: Software CRC32 Generation Source Code ............................................. 37
Figure 4-17: CRC32 table ............................................................................................. 38
Figure 4-18: Test 1 Word with Checkerboard Method.................................................. 43
Figure 4-19: IO Function Configuration ........................................................................ 45
Figure 4-20: IO Input/Output Test Flowchart ................................................................ 46
Figure 4-21: AD Test Flowchart .................................................................................... 48
Figure 5-1: Project Structure ......................................................................................... 52
Figure 5-2: Reset Handler Sample Code...................................................................... 52
Figure 5-3: Main Function Sample Code ...................................................................... 54
Figure 5-4: Dual Timer ISR ........................................................................................... 55
Figure 5-5: Watch Counter ISR..................................................................................... 55
Figure 5-6: Reload Timer ISR ....................................................................................... 55
64
AN706-00037-2v0-E
Table 1-1: FM3 Product List ............................................................................................ 7
Table 2-1: FM3 IEC60730 STL Test Items ................................................................... 10
Table 4-1: Cotex-M3 Register List ................................................................................ 13
Table 5-1: IO Input/Output Test Flowchart ................................................................... 51
Table 6-1: STL API Performance .................................................................................. 57
65
Similar pages