8672QxxB

GS8672Q18/36BE-400/333/300/250/200
72Mb SigmaQuad-II™
Burst of 2 ECCRAM™
165-Bump BGA
Commercial Temp
Industrial Temp
Features
• On-Chip ECC with virtually zero SER
• Simultaneous Read and Write SigmaQuad™ Interface
• JEDEC-standard pinout and package
• Dual Double Data Rate interface
• Byte Write Capability
• Burst of 2 Read and Write
• 1.8 V +100/–100 mV core power supply
• 1.5 V or 1.8 V HSTL Interface
• Pipelined read operation
• Fully coherent read and write pipelines
• ZQ pin for programmable output drive strength
• IEEE 1149.1 JTAG-compliant Boundary Scan
• Pin-compatible with 18Mb, 36Mb, and 144Mb devices
• 165-bump, 15 mm x 17 mm, 1 mm bump pitch BGA package
• RoHS-compliant 165-bump BGA package available
400 MHz–200 MHz
1.8 V VDD
1.8 V and 1.5 V I/O
buffer. The device also allows the user to manipulate the
output register clock inputs quasi independently with the C and
C clock inputs. C and C are also independent single-ended
clock inputs, not differential inputs. If the C clocks are tied
High, the K clocks are routed internally to fire the output
registers instead.
Each internal read and write operation in a SigmaQuad-II B2
ECCRAM is two times wider than the device I/O bus. An input
data bus de-multiplexer is used to accumulate incoming data
before it is simultaneously written to the memory array. An
output data multiplexer is used to capture the data produced
from a single memory array read and then route it to the
appropriate output drivers as needed. Therefore the address
field of a SigmaQuad-II B2 ECCRAM is always one address
pin less than the advertised index depth (e.g., the 4M x 18 has
an 2M addressable index).
SigmaQuad™ ECCRAM Overview
The GS8672Q18/36BE SigmaQuad-II ECCRAMs are built in
compliance with the SigmaQuad-II SRAM pinout standard for
Separate I/O synchronous SRAMs. They are 75,497,472-bit
(72Mb) ECCRAMs. The GS8672Q18/36BE SigmaQuad-II
ECCRAMs are just one element in a family of Low power,
Low voltage HSTL I/O ECCRAMs designed to operate at the
speeds needed to implement economical High performance
networking systems.
Clocking and Addressing Schemes
The GS8672Q18/36BE SigmaQuad-II ECCRAMs are
synchronous devices. They employ two input register clock
inputs, K and K. K and K are independent single-ended clock
inputs, not differential inputs to a single differential clock input
On-Chip Error Correction Code
GSI's ECCRAMs implement an ECC algorithm that detects
and corrects all single-bit memory errors, including those
induced by Soft Error Rate (SER) events such as cosmic rays,
alpha particles. The resulting SER of these devices is
anticipated to be <0.002 FITs/Mb — a 5-order-of-magnitude
improvement over comparable SRAMs with no On-Chip ECC,
which typically have an SER of 200 FITs/Mb or more. SER
quoted above is based on reading taken at sea level.
However, the On-Chip Error Correction (ECC) will be
disabled if a “Half Write” operation is initiated. See the Byte
Write Contol section for further information.
Parameter Synopsis
Rev: 1.02 1/2013
-400
-333
-300
-250
-200
tKHKH
2.5 ns
3.0 ns
3.3 ns
4.0 ns
5.0 ns
tKHQV
0.45 ns
0.45 ns
0.45 ns
0.45 ns
0.45 ns
1/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
2M x 36 SigmaQuad-II ECCRAM—Top View
1
2
3
4
5
6
7
8
9
10
11
A
CQ
NC
(288Mb)
SA
W
BW2
K
BW1
R
SA
NF
(144Mb)
CQ
B
Q27
Q18
D18
SA
BW3
K
BW0
SA
D17
Q17
Q8
C
D27
Q28
D19
VSS
SA
SA
SA
VSS
D16
Q7
D8
D
D28
D20
Q19
VSS
VSS
VSS
VSS
VSS
Q16
D15
D7
E
Q29
D29
Q20
VDDQ
VSS
VSS
VSS
VDDQ
Q15
D6
Q6
F
Q30
Q21
D21
VDDQ
VDD
VSS
VDD
VDDQ
D14
Q14
Q5
G
D30
D22
Q22
VDDQ
VDD
VSS
VDD
VDDQ
Q13
D13
D5
H
Doff
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
D31
Q31
D23
VDDQ
VDD
VSS
VDD
VDDQ
D12
Q4
D4
K
Q32
D32
Q23
VDDQ
VDD
VSS
VDD
VDDQ
Q12
D3
Q3
L
Q33
Q24
D24
VDDQ
VSS
VSS
VSS
VDDQ
D11
Q11
Q2
M
D33
Q34
D25
VSS
VSS
VSS
VSS
VSS
D10
Q1
D2
N
D34
D26
Q25
VSS
SA
SA
SA
VSS
Q10
D9
D1
P
Q35
D35
Q26
SA
SA
C
SA
SA
Q9
D0
Q0
R
TDO
TCK
SA
SA
SA
C
SA
SA
SA
TMS
TDI
11 x 15 Bump BGA—15 x 17 mm2 Body—1 mm Bump Pitch
Notes:
1. BW0 controls writes to D0:D8; BW1 controls writes to D9:D17; BW2 controls writes to D18:D26; BW3 controls writes to D27:D35.
Rev: 1.02 1/2013
2/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
4M x 18 SigmaQuad-II ECCRAM—Top View
1
2
3
4
5
6
7
8
9
10
11
A
CQ
NC
(144Mb)
SA
W
BW1
K
NF
R
SA
SA
CQ
B
NC
Q9
D9
SA
NF
K
BW0
SA
NC
NC
Q8
C
NC
NC
D10
VSS
SA
SA
SA
VSS
NC
Q7
D8
D
NC
D11
Q10
VSS
VSS
VSS
VSS
VSS
NC
NC
D7
E
NC
NC
Q11
VDDQ
VSS
VSS
VSS
VDDQ
NC
D6
Q6
F
NC
Q12
D12
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
Q5
G
NC
D13
Q13
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
D5
H
Doff
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
NC
NC
D14
VDDQ
VDD
VSS
VDD
VDDQ
NC
Q4
D4
K
NC
NC
Q14
VDDQ
VDD
VSS
VDD
VDDQ
NC
D3
Q3
L
NC
Q15
D15
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
Q2
M
NC
NC
D16
VSS
VSS
VSS
VSS
VSS
NC
Q1
D2
N
NC
D17
Q16
VSS
SA
SA
SA
VSS
NC
NC
D1
P
NC
NC
Q17
SA
SA
C
SA
SA
NC
D0
Q0
R
TDO
TCK
SA
SA
SA
C
SA
SA
SA
TMS
TDI
11 x 15 Bump BGA—15 x 17 mm2 Body—1 mm Bump Pitch
Notes:
1. BW0 controls writes to D0:D8. BW1 controls writes to D9:D17.
Rev: 1.02 1/2013
3/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Pin Description Table
Symbol
Description
Type
Comments
SA
Synchronous Address Inputs
Input
—
R
Synchronous Read
Input
Active Low
W
Synchronous Write
Input
Active Low
BW0–BW3
Synchronous Byte Writes
Input
Active Low
K
Input Clock
Input
Active High
K
Input Clock
Input
Active Low
C
Output Clock
Input
Active High
C
Output Clock
Input
Active Low
TMS
Test Mode Select
Input
—
TDI
Test Data Input
Input
—
TCK
Test Clock Input
Input
—
TDO
Test Data Output
Output
—
VREF
HSTL Input Reference Voltage
Input
—
ZQ
Output Impedance Matching Input
Input
—
Qn
Synchronous Data Outputs
Output
—
Dn
Synchronous Data Inputs
Input
—
Doff
Disable DLL when Low
Input
Active Low
CQ
Output Echo Clock
Output
—
CQ
Output Echo Clock
Output
—
VDD
Power Supply
Supply
1.8 V Nominal
VDDQ
Isolated Output Buffer Supply
Supply
1.5 or 1.8 V Nominal
VSS
Power Supply: Ground
Supply
—
NC
No Connect
—
—
NF
No Function
—
—
Notes:
1. NC = Not Connected to die or any other pin.
2. NF= No Function. There is an electrical connection to this input pin, but the signal has no function in the device. It can be left unconnected,
or tied to VSS or VDDQ.
3. C, C, K, or K cannot be set to VREF voltage.
Rev: 1.02 1/2013
4/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Background
Separate I/O SRAMs, from a system architecture point of view, are attractive in applications where alternating reads and writes are
needed. Therefore, the SigmaQuad-II ECCRAM interface and truth table are optimized for alternating reads and writes. Separate
I/O SRAMs are unpopular in applications where multiple reads or multiple writes are needed because burst read or write transfers
from Separate I/O SRAMs can cut the RAM’s bandwidth in half.
SigmaQuad-II B2 ECCRAM DDR Read
The read port samples the status of the Address Input and R pins at each rising edge of K. A Low on the Read Enable pin, R, begins
a read cycle. Data can be clocked out after the next rising edge of K with a rising edge of C (or by K if C and C are tied High), and
after the following rising edge of K with a rising edge of C (or by K if C and C are tied High). Clocking in a High on the Read
Enable pin, R, begins a read port deselect cycle.
SigmaQuad-II B2 ECCRAM DDR Write
The write port samples the status of the W pin at each rising edge of K and the Address Input pins on the following rising edge of
K. A Low on the Write Enable pin, W, begins a write cycle. The first of the data-in pairs associated with the write command is
clocked in with the same rising edge of K used to capture the write command. The second of the two data in transfers is captured on
the rising edge of K along with the write address. Clocking in a High on W causes a write port deselect cycle.
Rev: 1.02 1/2013
5/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Power-Up Sequence for SigmaQuad-II ECCRAMs
SigmaQuad-II ECCRAMs must be powered-up in a specific sequence in order to avoid undefined operations.
1. After power supplies power-up and clocks (K, K) are stablized, 163,840 cycles are required to set Output Driver
Impedance.
2. Thereafter, an additional 65,536 clock cycles are required to lock the DLL after it has been enabled.
3. Begin Read and Write operations.
For more information, read AN1021 SigmaQuad and SigmaDDR Power-Up.
On-Chip Error Correction
SigmaQuad-II ECCRAMs implement a single-bit error detection and correction algorithm (specifically, a Hamming Code) on each
DDR data word (comprising two 9-bit data bytes) transmitted on each 9-bit data bus (i.e., transmitted on D/Q[8:0], D/Q[17:9], D/
Q[26:18], or D/Q[35:27]). To accomplish this, 5 ECC parity bits (invisible to the user) are utilized per every 18 data bits (visible to
the user).
The ECC algorithm neither corrects nor detects multi-bit errors. However, GSI ECCRAMs are architected in such a way that a
single SER event very rarely causes a multi-bit error across any given "transmitted data unit", where a "transmitted data unit"
represents the data transmitted as the result of a single read or write operation to a particular address. The extreme rarity of multibit errors results in the SER mentioned previously (i.e., <0.002 FITs/Mb measured at sea level).
Not only does the on-chip ECC significantly improve SER performance, but it also frees up the entire memory array for data
storage. Very often SRAM applications allocate 1/9th of the memory array (i.e., one "error bit" per eight "data bits", in any 9-bit
"data byte") for error detection (either simple parity error detection, or system-level ECC error detection and correction). Such
error-bit allocation is unnecessary with ECCRAMs —the entire memory array can be utilized for data storage, effectively
providing 12.5% greater storage capacity compared to SRAMs of the same density not equipped with on-chip ECC.
Output Register Control
SigmaQuad-II ECCRAMs offer two mechanisms for controlling the output data registers. Typically, control is handled by the
Output Register Clock inputs, C and C. The Output Register Clock inputs can be used to make small phase adjustments in the firing
of the output registers by allowing the user to delay driving data out as much as a few nanoseconds beyond the next rising edges of
the K and K clocks. If the C and C clock inputs are tied High, the RAM reverts to K and K control of the outputs, allowing the
RAM to function as a conventional pipelined read ECCRAM.
Rev: 1.02 1/2013
6/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Special Functions
Byte Write Control
Byte Write Enable pins are sampled at the same time that Data In is sampled. A High on the Byte Write Enable pin associated with
a particular byte (e.g., BW0 controls D0–D8 inputs) will inhibit the storage of that particular byte, leaving whatever data may be
stored at the current address at that byte location undisturbed. Any or all of the Byte Write Enable pins may be driven High or Low
during the data in sample times in a write sequence.
Each write enable command and write address loaded into the RAM provides the base address for a 2-beat data transfer. The x18
version of the RAM, for example, may write 36 bits in association with each address loaded. Any 9-bit byte may be masked in any
write sequence.
Note: If “Half Write” operations (i.e., write operations in which a BWn pin is asserted for only half of a DDR write data transfer
on the associated 9-bit data bus, causing only 9 bits of the 18-bit DDR data word to be written) are initiated, the on-chip ECC will
be disabled for as long as the SRAM remains powered up thereafter. This must be done because ECC is implemented across entire
18-bit data words, rather than across individual 9-bit data bytes.
Byte Write Truth Table
The truth table below applies to write operations to Address "m", where Address "m" is the 18-bit memory location comprising the
2 beats of DDR write data associated with each BWn pin in a given clock cycle.
BWn
Input Data Byte n
↑K
(Beat 1)
↑K
(Beat 2)
↑K
(Beat 1)
↑K
(Beat 2)
Operation
Result
0
0
D0
D1
Full Write
D0 and D1 written to Address m
0
1
D0
X
Half Write
Only D0 written to Address m
1
0
X
D1
Half Write
Only D1 written to Address m
1
1
X
X
Abort
Address m unchanged
Notes:
1. BW0 is associated with Input Data Byte D[8:0].
2. BW1 is associated with Input Data Byte D[17:9].
3. BW2 is associated with Input Data Byte D[26:18] (in x36 only).
4. BW3 is associated with Input Data Byte D[35:27] (in x36 only).
5. ECC is disabled if a “Half Write” operation is initiated.
Rev: 1.02 1/2013
7/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
FLXDrive-II Output Driver Impedance Control
HSTL I/O SigmaQuad-II ECCRAMs are supplied with programmable impedance output drivers. The ZQ pin must be connected to
VSS via an external resistor, RQ, to allow the ECCRAM to monitor and adjust its output driver impedance. The value of RQ must
be 5X the value of the desired RAM output impedance. The allowable range of RQ to guarantee impedance matching continuously
is between 175Ω and 275Ω. Periodic readjustment of the output driver impedance is necessary as the impedance is affected by
drifts in supply voltage and temperature. The ECCRAM’s output impedance circuitry compensates for drifts in supply voltage and
temperature. A clock cycle counter periodically triggers an impedance evaluation, resets and counts again. Each impedance
evaluation may move the output driver impedance level one step at a time towards the optimum level. The output driver is
implemented with discrete binary weighted impedance steps.
Separate I/O SigmaQuad-II ECCRAM Read Truth Table
A
R
Output Next State
Q
Q
K↑
(tn)
K↑
(tn)
K↑
(tn)
K↑
(tn+1½)
K↑
(tn+2)
X
1
Deselect
Hi-Z
Hi-Z
V
0
Read
Q0
Q1
Notes:
1. X = Don’t Care, 1 = High, 0 = Low, V = Valid.
2. R is evaluated on the rising edge of K.
3. Q0 and Q1 are the first and second data output transfers in a read.
Separate I/O SigmaQuad-II ECCRAM Write Truth Table
A
W
BWn
BWn
Input Next State
D
D
K↑
(tn + ½)
K↑
(tn)
K↑
(tn)
K↑
(tn + ½)
(tn), (tn + ½)
K ↑, K ↑
K↑
(tn)
K↑
(tn + ½)
V
0
0
0
Write Byte Dx0, Write Byte Dx1
D0
D1
V
0
0
1
Write Byte Dx0, Write Abort Byte Dx1
D0
X
V
0
1
0
Write Abort Byte Dx0, Write Byte Dx1
X
D1
X
0
1
1
Write Abort Byte Dx0, Write Abort Byte Dx1
X
X
X
1
X
X
Deselect
X
X
Notes:
1. X = Don’t Care, H = High, L = Low, V = Valid.
2. W is evaluated on the rising edge of K.
3. D0 and D1 are the first and second data input transfers in a write.
4. BWn represents any of the Byte Write Enable inputs (BW0, BW1, etc.).
Rev: 1.02 1/2013
8/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
x36 Byte Write Enable (BWn) Truth Table
BW0
BW1
BW2
BW3
D0–D8
D9–D17
D18–D26
D27–D35
1
1
1
1
Don’t Care
Don’t Care
Don’t Care
Don’t Care
0
1
1
1
Data In
Don’t Care
Don’t Care
Don’t Care
1
0
1
1
Don’t Care
Data In
Don’t Care
Don’t Care
0
0
1
1
Data In
Data In
Don’t Care
Don’t Care
1
1
0
1
Don’t Care
Don’t Care
Data In
Don’t Care
0
1
0
1
Data In
Don’t Care
Data In
Don’t Care
1
0
0
1
Don’t Care
Data In
Data In
Don’t Care
0
0
0
1
Data In
Data In
Data In
Don’t Care
1
1
1
0
Don’t Care
Don’t Care
Don’t Care
Data In
0
1
1
0
Data In
Don’t Care
Don’t Care
Data In
1
0
1
0
Don’t Care
Data In
Don’t Care
Data In
0
0
1
0
Data In
Data In
Don’t Care
Data In
1
1
0
0
Don’t Care
Don’t Care
Data In
Data In
0
1
0
0
Data In
Don’t Care
Data In
Data In
1
0
0
0
Don’t Care
Data In
Data In
Data In
0
0
0
0
Data In
Data In
Data In
Data In
x18 Byte Write Enable (BWn) Truth Table
BW0
BW1
D0–D8
D9–D17
1
1
Don’t Care
Don’t Care
0
1
Data In
Don’t Care
1
0
Don’t Care
Data In
0
0
Data In
Data In
Rev: 1.02 1/2013
9/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Absolute Maximum Ratings
(All voltages reference to VSS)
Symbol
Description
Value
Unit
VDD
Voltage on VDD Pins
–0.5 to 2.4
V
VDDQ
Voltage in VDDQ Pins
–0.5 to VDD
V
VREF
Voltage in VREF Pins
–0.5 to VDDQ
V
VI/O
Voltage on I/O Pins
–0.5 to VDDQ +0.5 (≤ 2.4 V max.)
V
VIN
Voltage on Other Input Pins
–0.5 to VDDQ +0.5 (≤ 2.4 V max.)
V
IIN
Input Current on Any Pin
+/–100
mA dc
IOUT
Output Current on Any I/O Pin
+/–100
mA dc
TJ
Maximum Junction Temperature
125
oC
TSTG
Storage Temperature
–55 to 125
oC
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended
Operating Conditions. Exposure to conditions exceeding the Recommended Operating Conditions, for an extended period of time, may affect
reliability of this component.
Recommended Operating Conditions
Power Supplies
Parameter
Symbol
Min.
Typ.
Max.
Unit
Supply Voltage
VDD
1.7
1.8
1.9
V
I/O Supply Voltage
VDDQ
1.4
—
VDD
V
Reference Voltage
VREF
VDDQ/2 – 0.05
—
VDDQ/2 + 0.05
V
Notes:
The power supplies need to be powered up simultaneously or in the following sequence: VDD, VDDQ, VREF, followed by signal inputs. The power
down sequence must be the reverse. VDDQ must not exceed VDD. For more information, read AN1021 SigmaQuad and SigmaDDR Power-Up.
Operating Temperature
Parameter
Symbol
Min.
Typ.
Max.
Unit
Junction Temperature
(Commercial Range Versions)
TJ
0
25
85
°C
Junction Temperature
(Industrial Range Versions)*
TJ
–40
25
100
°C
Note:
* The part numbers of Industrial Temperature Range versions end with the character “I”. Unless otherwise noted, all performance specifications
quoted are evaluated for worst case in the temperature range marked on the device.
Rev: 1.02 1/2013
10/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Thermal Impedance
Package
Test PCB
Substrate
θ JA (C°/W)
Airflow = 0 m/s
θ JA (C°/W)
Airflow = 1 m/s
θ JA (C°/W)
Airflow = 2 m/s
θ JB (C°/W)
θ JC (C°/W)
165 BGA
4-layer
15.25
12.38
11.41
4.79
1.31
Notes:
1. Thermal Impedance data is based on a number of of samples from mulitple lots and should be viewed as a typical number.
2. Please refer to JEDEC standard JESD51-6.
3. The characteristics of the test fixture PCB influence reported thermal characteristics of the device. Be advised that a good thermal path to
the PCB can result in cooling or heating of the RAM depending on PCB temperature.
HSTL I/O DC Input Characteristics
Parameter
Symbol
Min
Max
Units
Notes
DC Input Logic High
VIH (dc)
VREF + 0.1
VDDQ + 0.3
V
1
DC Input Logic Low
VIL (dc)
–0.3
VREF – 0.1
V
1
Notes:
1. Compatible with both 1.8 V and 1.5 V I/O drivers.
2. These are DC test criteria. DC design criteria is VREF ± 50 mV. The AC VIH/VIL levels are defined separately for measuring timing
parameters.
3. VIL (Min)DC = –0.3 V, VIL(Min)AC = –1.5 V (pulse width ≤ 3 ns).
4. VIH (Max)DC = VDDQ + 0.3 V, VIH(Max)AC = VDDQ + 0.85 V (pulse width ≤ 3 ns).
HSTL I/O AC Input Characteristics
Parameter
Symbol
Min
Max
Units
Notes
AC Input Logic High
VIH (ac)
VREF + 0.2
—
V
2,3
AC Input Logic Low
VIL (ac)
—
VREF – 0.2
V
2,3
VREF (ac)
—
5% VREF (DC)
V
1
VREF Peak-to-Peak AC Voltage
Notes:
1. The peak-to-peak AC component superimposed on VREF may not exceed 5% of the DC component of VREF.
2. To guarantee AC characteristics, VIH,VIL, Trise, and Tfall of inputs and clocks must be within 10% of each other.
3. For devices supplied with HSTL I/O input buffers. Compatible with both 1.8 V and 1.5 V I/O drivers.
Capacitance
(TA = 25oC, f = 1 MHZ, VDD = 1.8 V)
Parameter
Symbol
Test conditions
Typ.
Max.
Unit
Input Capacitance
CIN
VIN = 0 V
4
5
pF
Output Capacitance
COUT
VOUT = 0 V
4.5
5.5
pF
Note:
This parameter is sample tested.
Rev: 1.02 1/2013
11/28
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© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
AC Test Conditions
Parameter
Conditions
Input High level
1.25 V
Input Low level
0.25 V
Max. input slew rate
2 V/ns
Input reference level
0.75 V
Output reference level
VDDQ/2
Note:
Test conditions as specified with output loading as shown unless otherwise noted.
AC Test Load Diagram
DQ
50Ω
RQ = 250 Ω (HSTL I/O)
VREF = 0.75 V
VT = VDDQ/2
Input and Output Leakage Characteristics
Parameter
Symbol
Test Conditions
Min.
Max
Input Leakage Current
(except mode pins)
IIL
VIN = 0 to VDDQ
–2 uA
2 uA
Doff
IIL DOFF
VIN = 0 to VDDQ
–100 uA
2 uA
Output Leakage Current
IOL
Output Disable,
VOUT = 0 to VDDQ
–2 uA
2 uA
Rev: 1.02 1/2013
12/28
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© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Programmable Impedance HSTL Output Driver DC Electrical Characteristics
Parameter
Symbol
Min.
Max.
Units
Notes
Output High Voltage
VOH1
VDDQ/2 – 0.12
VDDQ/2 + 0.12
V
1
Output Low Voltage
VOL1
VDDQ/2 – 0.12
VDDQ/2 + 0.12
V
2
Output High Voltage
VOH2
VDDQ – 0.2
VDDQ
V
3, 4
Output Low Voltage
VOL2
Vss
0.2
V
3, 5
Output Driver Impedance
ROUT
(RQ/5) * 0.88
(RQ/5) * 1.12
Ω
6, 7
Notes:
1. IOH = (VDDQ/2) / (RQ/5) +/– 15% @ VOH = VDDQ/2 (for: 175Ω ≤ RQ ≤ 275Ω)
2. IOL = (VDDQ/2) / (RQ/5) +/– 15% @ VOL = VDDQ/2 (for: 175Ω ≤ RQ ≤ 275Ω)
3. 0Ω ≤ RQ ≤ ∞Ω
4. IOH = –1.0 mA
5. IOL = 1.0 mA
6. Parameter applies when 175Ω ≤ RQ ≤ 275Ω
7. Tested at VOUT = VDDQ * 0.2 and VDDQ * 0.8
Rev: 1.02 1/2013
13/28
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© 2011, GSI Technology
Rev: 1.02 1/2013
IDD
IDD
Operating Current
(x36): DDR
Operating Current
(x18): DDR
1860 mA
1360 mA
VDD = Max, IOUT = 0 mA
Cycle Time ≥ tKHKH Min
0
to
70°C
VDD = Max, IOUT = 0 mA
Cycle Time ≥ tKHKH Min
Test Conditions
–40
to
85°C
1380 mA
1880 mA
-400
1190 mA
–40
to
85°C
1210 mA
1620 mA
-333
1600 mA
0
to
70°C
Notes:
1. Minimum cycle, IOUT = 0 mA
2. Operating current is calculated with 50% read cycles and 50% write cycles.
Symbol
Parameter
Operating Currents
1100 mA
1480 mA
0
to
70°C
-300
1120 mA
1500 mA
–40
to
85°C
980 mA
1290 mA
0
to
70°C
–40
to
85°C
1000 mA
1310 mA
-250
850 mA
1100 mA
0
to
70°C
–40
to
85°C
870 mA
1120 mA
-200
1, 2
1, 2
Notes
GS8672Q18/36BE-400/333/300/250/200
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
14/28
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GS8672Q18/36BE-400/333/300/250/200
Symbol
-400
-333
-300
-250
-200
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Units
Parameter
Notes
AC Electrical Characteristics
K, K Clock Cycle Time
C, C Clock Cycle Time
tKHKH
tCHCH
2.5
8.4
3.0
8.4
3.3
8.4
4.0
8.4
5.0
8.4
ns
tKC Variable
tKCVar
—
0.2
—
0.2
—
0.2
—
0.2
—
0.2
ns
K, K Clock High Pulse Width
C, C Clock High Pulse Width
tKHKL
tCHCL
1.0
—
1.2
—
1.32
—
1.6
—
2.0
—
ns
K, K Clock Low Pulse Width
C, C Clock Low Pulse Width
tKLKH
tCLCH
1.0
—
1.2
—
1.32
—
1.6
—
2.0
—
ns
K to K High
C to C High
tKHKH
tCHCH
1.0
—
1.35
—
1.49
—
1.8
—
2.2
—
ns
K to K High
C to C High
tKHKH
tCHCH
1.0
—
1.35
—
1.49
—
1.8
—
2.2
—
ns
K, K Clock High to C, C Clock High
tKHCH
0
1.1
0
1.1
0
1.1
0
1.1
0
1.1
ns
DLL Lock Time
tKCLock
65,536
—
65,536
—
65,536
—
65,536
—
65,536
—
cycle
Clock
K Static to DLL reset
tKCReset
30
—
30
—
30
—
30
—
30
—
ns
K, K Clock High to Data Output Valid
C, C Clock High to Data Output Valid
tKHQV
tCHQV
—
0.45
—
0.45
—
0.45
—
0.45
—
0.45
ns
4
K, K Clock High to Data Output Hold
C, C Clock High to Data Output Hold
tKHQX
tCHQX
–0.45
—
–0.45
—
–0.45
—
–0.45
—
–0.45
—
ns
4
K, K Clock High to Echo Clock Valid
C, C Clock High to Echo Clock Valid
tKHCQV
tCHCQV
—
0.45
—
0.45
—
0.45
—
0.45
—
0.45
ns
K, K Clock High to Echo Clock Hold
C, C Clock High to Echo Clock Hold
tKHCQX
tCHCQX
–0.45
—
–0.45
—
–0.45
—
–0.45
—
–0.45
—
ns
CQ, CQ High Output Valid
tCQHQV
—
0.25
—
0.25
—
0.27
—
0.30
—
0.35
ns
8
CQ, CQ High Output Hold
tCQHQX
–0.25
—
–0.25
—
–0.27
—
–0.30
—
–0.35
—
ns
8
CQ Phase Distortion
tCQHCQH
tCQHCQH
0.9
—
1.10
—
1.24
—
1.55
—
1.95
—
ns
K Clock High to Data Output High-Z
C Clock High to Data Output High-Z
tKHQZ
tCHQZ
—
0.45
—
0.45
—
0.45
—
0.45
—
0.45
ns
4
K Clock High to Data Output Low-Z
C Clock High to Data Output Low-Z
tKHQX1
tCHQX1
–0.45
—
–0.45
—
–0.45
—
–0.45
—
–0.45
—
ns
4
Address Input Setup Time
tAVKH
0.28
—
0.28
—
0.3
—
0.35
—
0.4
—
ns
1
Control Input Setup Time (R, W)
tIVKH
0.28
—
0.28
—
0.3
—
0.35
—
0.4
—
ns
2
Control Input Setup Time
(BWX)
tIVKH
0.28
—
0.28
—
0.3
—
0.35
—
0.4
—
ns
3
Data Input Setup Time
tDVKH
0.28
—
0.28
—
0.3
—
0.35
—
0.4
—
ns
6
7
Output Times
Setup Times
Rev: 1.02 1/2013
15/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
AC Electrical Characteristics
-300
-250
-200
Notes
-333
Units
-400
Address Input Hold Time
tKHAX
0.28
—
0.28
—
0.3
—
0.35
—
0.4
—
ns
1
Control Input Hold Time (R, W)
tKHIX
0.28
—
0.28
—
0.3
—
0.35
—
0.4
—
ns
2
Control Input Setup Time
(BWX)
tIVKH
0.28
—
0.28
—
0.3
—
0.35
—
0.4
—
ns
3
Data Input Hold Time
tKHDX
0.28
—
0.28
—
0.3
—
0.35
—
0.4
—
ns
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Hold Times
Notes:
1.
2.
3.
4.
5.
6.
All Address inputs must meet the specified setup and hold times for all latching clock edges.
Control signals are R, W.
Control signals are BW0, BW1, and (BW2, BW3 for x36).
If C, C are tied high, K, K become the references for C, C timing parameters
Clock phase jitter is the variance from clock rising edge to the next expected clock rising edge.
VDD slew rate must be less than 0.1 V DC per 50 ns for DLL lock retention. DLL lock time begins once VDD and input clock are stable.
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© 2011, GSI Technology
Rev: 1.02 1/2013
Q
CQ
CQ
D
BWx
W
R
Address
K
K
KHCQX
KHCQV
DVKH
B
IVKH
IVKH
IVKH
AVKH
KHKH
Read A Write B
KHCQX
KHCQV
KHDX
KHIX
KHIX
KHKL
A
KHQX1
KLKH
C
A+1
CQHQX
KHIX
KHAX
KH K H
Read C
KHQX
E
Read D Write E
C
CQHQV
C+1
KHQV
F
Write F
F
D
D+1
H
Read G Write H
K and K Controlled Read-Write-Read Timing Diagram
NOP
KHQZ
NOP
G
G+1
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17/28
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Rev: 1.02 1/2013
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18/28
CQ
CQ
Q
C
C
D
BWx
W
R
Address
K
K
CHCQX
CHCQV
KHKH
CHCQX
CHCQV
KHKL
DVKH
B
IVKH
KHIX
IVKH
KHAX
AVKH
KHKH
Read A Write B
KLKH
KHKL
NOP
KH K H
KLKH
A
CHQX1
C
CQHQX
A+1
KHDX
C
KHIX
IVKH
KH K H
Write C
KHIX
CHQZ
E
Read D Write E
G
Read F Write G
D
CHQV
H
Read H
CQHQV
D+1
C and C Controlled Read-Write-Read Timing Diagram
F
CHQX
NOP
F+1
H
GS8672Q18/36BE-400/333/300/250/200
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GS8672Q18/36BE-400/333/300/250/200
JTAG Port Operation
Overview
The JTAG Port on this RAM operates in a manner that is compliant with IEEE Standard 1149.1-1990, a serial boundary scan
interface standard (commonly referred to as JTAG). The JTAG Port input interface levels scale with VDD. The JTAG output
drivers are powered by VDD.
Disabling the JTAG Port
It is possible to use this device without utilizing the JTAG port. The port is reset at power-up and will remain inactive unless
clocked. TCK, TDI, and TMS are designed with internal pull-up circuits.To assure normal operation of the RAM with the JTAG
Port unused, TCK, TDI, and TMS may be left floating or tied to either VDD or VSS. TDO should be left unconnected.
JTAG Pin Descriptions
Pin
Pin Name
I/O
Description
TCK
Test Clock
In
Clocks all TAP events. All inputs are captured on the rising edge of TCK and all outputs propagate from the
falling edge of TCK.
TMS
Test Mode Select
In
The TMS input is sampled on the rising edge of TCK. This is the command input for the TAP controller state
machine. An undriven TMS input will produce the same result as a logic one input level.
TDI
Test Data In
In
The TDI input is sampled on the rising edge of TCK. This is the input side of the serial registers placed
between TDI and TDO. The register placed between TDI and TDO is determined by the state of the TAP
Controller state machine and the instruction that is currently loaded in the TAP Instruction Register (refer to
the TAP Controller State Diagram). An undriven TDI pin will produce the same result as a logic one input
level.
TDO
Test Data Out
Out
Output that is active depending on the state of the TAP state machine. Output changes in response to the
falling edge of TCK. This is the output side of the serial registers placed between TDI and TDO.
Note:
This device does not have a TRST (TAP Reset) pin. TRST is optional in IEEE 1149.1. The Test-Logic-Reset state is entered while TMS is
held High for five rising edges of TCK. The TAP Controller is also reset automaticly at power-up.
JTAG Port Registers
Overview
The various JTAG registers, refered to as Test Access Port or TAP Registers, are selected (one at a time) via the sequences of 1s
and 0s applied to TMS as TCK is strobed. Each of the TAP Registers is a serial shift register that captures serial input data on the
rising edge of TCK and pushes serial data out on the next falling edge of TCK. When a register is selected, it is placed between the
TDI and TDO pins.
Instruction Register
The Instruction Register holds the instructions that are executed by the TAP controller when it is moved into the Run, Test/Idle, or
the various data register states. Instructions are 3 bits long. The Instruction Register can be loaded when it is placed between the
TDI and TDO pins. The Instruction Register is automatically preloaded with the IDCODE instruction at power-up or whenever the
controller is placed in Test-Logic-Reset state.
Bypass Register
The Bypass Register is a single bit register that can be placed between TDI and TDO. It allows serial test data to be passed through
the RAM’s JTAG Port to another device in the scan chain with as little delay as possible.
Boundary Scan Register
The Boundary Scan Register is a collection of flip flops that can be preset by the logic level found on the RAM’s input or I/O pins.
The flip flops are then daisy chained together so the levels found can be shifted serially out of the JTAG Port’s TDO pin. The
Boundary Scan Register also includes a number of place holder flip flops (always set to a logic 1). The relationship between the
device pins and the bits in the Boundary Scan Register is described in the Scan Order Table folLowing. The Boundary Scan
Rev: 1.02 1/2013
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GS8672Q18/36BE-400/333/300/250/200
Register, under the control of the TAP Controller, is loaded with the contents of the RAMs I/O ring when the controller is in
Capture-DR state and then is placed between the TDI and TDO pins when the controller is moved to Shift-DR state. SAMPLE-Z,
SAMPLE/PRELOAD and EXTEST instructions can be used to activate the Boundary Scan Register.
JTAG TAP Block Diagram
·
·
·
·
·
·
·
·
Boundary Scan Register
·
·
1
·
108
0
0
Bypass Register
2 1 0
Instruction Register
TDI
TDO
ID Code Register
31 30 29
·
· ··
2 1 0
Control Signals
TMS
Test Access Port (TAP) Controller
TCK
Identification (ID) Register
The ID Register is a 32-bit register that is loaded with a device and vendor specific 32-bit code when the controller is put in
Capture-DR state with the IDCODE command loaded in the Instruction Register. The code is loaded from a 32-bit on-chip ROM.
It describes various attributes of the RAM as indicated beLow. The register is then placed between the TDI and TDO pins when the
controller is moved into Shift-DR state. Bit 0 in the register is the LSB and the first to reach TDO when shifting begins.
GSI Technology
JEDEC Vendor
ID Code
Not Used
Bit #
Presence Register
ID Register Contents
31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
0
X
1
X
Rev: 1.02 1/2013
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
0
20/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
0
0 1 1 0 1 1 0 0 1
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Tap Controller Instruction Set
Overview
There are two classes of instructions defined in the Standard 1149.1-1990; the standard (Public) instructions, and device specific
(Private) instructions. Some Public instructions are mandatory for 1149.1 compliance. Optional Public instructions must be
implemented in prescribed ways. The TAP on this device may be used to monitor all input and I/O pads, and can be used to load
address, data or control signals into the RAM or to preload the I/O buffers.
When the TAP controller is placed in Capture-IR state the two least significant bits of the instruction register are loaded with 01.
When the controller is moved to the Shift-IR state the Instruction Register is placed between TDI and TDO. In this state the desired
instruction is serially loaded through the TDI input (while the previous contents are shifted out at TDO). For all instructions, the
TAP executes newly loaded instructions only when the controller is moved to Update-IR state. The TAP instruction set for this
device is listed in the folLowing table.
JTAG Tap Controller State Diagram
1
0
Test Logic Reset
0
Run Test Idle
1
Select DR
1
Select IR
0
0
1
1
Capture DR
Capture IR
0
0
Shift DR
1
1
Shift IR
0
1
1
Exit1 DR
0
Exit1 IR
0
0
Pause DR
1
Exit2 DR
1
Update DR
1
1
0
0
Pause IR
1
Exit2 IR
0
1
0
0
Update IR
1
0
Instruction Descriptions
BYPASS
When the BYPASS instruction is loaded in the Instruction Register the Bypass Register is placed between TDI and TDO. This
occurs when the TAP controller is moved to the Shift-DR state. This alLows the board level scan path to be shortened to facilitate testing of other devices in the scan path.
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SAMPLE/PRELOAD
SAMPLE/PRELOAD is a Standard 1149.1 mandatory public instruction. When the SAMPLE / PRELOAD instruction is
loaded in the Instruction Register, moving the TAP controller into the Capture-DR state loads the data in the RAMs input and
I/O buffers into the Boundary Scan Register. Boundary Scan Register locations are not associated with an input or I/O pin, and
are loaded with the default state identified in the Boundary Scan Chain table at the end of this section of the datasheet. Because
the RAM clock is independent from the TAP Clock (TCK) it is possible for the TAP to attempt to capture the I/O ring contents
while the input buffers are in transition (i.e. in a metastable state). Although allowing the TAP to sample metastable inputs will
not harm the device, repeatable results cannot be expected. RAM input signals must be stabilized for long enough to meet the
TAPs input data capture set-up plus hold time (tTS plus tTH). The RAMs clock inputs need not be paused for any other TAP
operation except capturing the I/O ring contents into the Boundary Scan Register. Moving the controller to Shift-DR state then
places the boundary scan register between the TDI and TDO pins.
EXTEST
EXTEST is an IEEE 1149.1 mandatory public instruction. It is to be executed whenever the instruction register is loaded with
all logic 0s. The EXTEST command does not block or override the RAM’s input pins; therefore, the RAM’s internal state is
still determined by its input pins.
Typically, the Boundary Scan Register is loaded with the desired pattern of data with the SAMPLE/PRELOAD command.
Then the EXTEST command is used to output the Boundary Scan Register’s contents, in parallel, on the RAM’s data output
drivers on the falling edge of TCK when the controller is in the Update-IR state.
Alternately, the Boundary Scan Register may be loaded in parallel using the EXTEST command. When the EXTEST instruction is selected, the sate of all the RAM’s input and I/O pins, as well as the default values at Scan Register locations not associated with a pin, are transferred in parallel into the Boundary Scan Register on the rising edge of TCK in the Capture-DR
state, the RAM’s output pins drive out the value of the Boundary Scan Register location with which each output pin is associated.
IDCODE
The IDCODE instruction causes the ID ROM to be loaded into the ID register when the controller is in Capture-DR mode and
places the ID register between the TDI and TDO pins in Shift-DR mode. The IDCODE instruction is the default instruction
loaded in at power up and any time the controller is placed in the Test-Logic-Reset state.
SAMPLE-Z
If the SAMPLE-Z instruction is loaded in the instruction register, all RAM outputs are forced to an inactive drive state (HighZ) and the Boundary Scan Register is connected between TDI and TDO when the TAP controller is moved to the Shift-DR
state.
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GS8672Q18/36BE-400/333/300/250/200
JTAG TAP Instruction Set Summary
Instruction
Code
Description
Notes
EXTEST
000
Places the Boundary Scan Register between TDI and TDO.
1
IDCODE
001
Preloads ID Register and places it between TDI and TDO.
1, 2
SAMPLE-Z
010
Captures I/O ring contents. Places the Boundary Scan Register between TDI and TDO.
Forces all RAM output drivers to High-Z except CQ.
1
GSI
011
GSI private instruction.
1
SAMPLE/PRELOAD
100
Captures I/O ring contents. Places the Boundary Scan Register between TDI and TDO.
1
GSI
101
GSI private instruction.
1
GSI
110
GSI private instruction.
1
BYPASS
111
Places Bypass Register between TDI and TDO.
1
Notes:
1. Instruction codes expressed in binary, MSB on left, LSB on right.
2. Default instruction automatically loaded at power-up and in test-logic-reset state.
JTAG Port Recommended Operating Conditions and DC Characteristics
Parameter
Symbol
Min.
Max.
Unit
Notes
Test Port Input Low Voltage
VILJ
–0.3
0.3 * VDD
V
1
Test Port Input High Voltage
VIHJ
0.7 * VDD
VDD + 0.3
V
1
TMS, TCK and TDI Input Leakage Current
IINHJ
–300
1
uA
2
TMS, TCK and TDI Input Leakage Current
IINLJ
–1
100
uA
3
TDO Output Leakage Current
IOLJ
–1
1
uA
4
Test Port Output High Voltage
VOHJ
VDD – 0.2
—
V
5, 6
Test Port Output Low Voltage
VOLJ
—
0.2
V
5, 7
Test Port Output CMOS High
VOHJC
VDD – 0.1
—
V
5, 8
Test Port Output CMOS Low
VOLJC
—
0.1
V
5, 9
Notes:
1. Input Under/overshoot voltage must be –1 V < Vi < VDDn +1 V not to exceed 2.4 V maximum, with a pulse width not to exceed 20% tTKC.
2. VILJ ≤ VIN ≤ VDDn
3. 0 V ≤ VIN ≤ VILJn
4. Output Disable, VOUT = 0 to VDDn
5. The TDO output driver is served by the VDD supply.
6. IOHJ = –2 mA
7. IOLJ = + 2 mA
8. IOHJC = –100 uA
9. IOLJC = +100 uA
Rev: 1.02 1/2013
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Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
JTAG Port AC Test Conditions
Parameter
Conditions
Input High level
VDD – 0.2 V
Input Low level
0.2 V
Input slew rate
1 V/ns
Input reference level
VDD/2
Output reference level
VDD/2
JTAG Port AC Test Load
TDO
50Ω
30pF*
VDD/2
* Distributed Test Jig Capacitance
Notes:
1. Include scope and jig capacitance.
2. Test conditions as shown unless otherwise noted.
JTAG Port Timing Diagram
tTKC
tTKH
tTKL
TCK
tTH
tTS
TDI
tTH
tTS
TMS
tTKQ
TDO
tTH
tTS
Parallel SRAM input
JTAG Port AC Electrical Characteristics
Parameter
Symbol
Min
Max
Unit
TCK Cycle Time
tTKC
50
—
ns
TCK Low to TDO Valid
tTKQ
—
20
ns
TCK High Pulse Width
tTKH
20
—
ns
TCK Low Pulse Width
tTKL
20
—
ns
TDI & TMS Set Up Time
tTS
10
—
ns
TDI & TMS Hold Time
tTH
10
—
ns
Rev: 1.02 1/2013
24/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Package Dimensions—165-Bump FPBGA (Package E)
A1 CORNER
TOP VIEW
BOTTOM VIEW
Ø0.10 M C
Ø0.25 M C A B
Ø0.40~0.60 (165x)
1 2 3 4 5 6 7 8 9 10 11
A1 CORNER
11 10 9 8 7 6 5 4 3 2 1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
1.0
14.0
17±0.05
1.0
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
A
1.0
1.0
10.0
0.15 C
B
Rev: 1.02 1/2013
0.20(4x)
0.36~0.46
1.50 MAX.
SEATING PLANE
C
15±0.05
25/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Ordering Information—GSI SigmaQuad-II ECCRAM
Org
Part Number1
Type
Package
Speed
(MHz)
TJ2
4M x 18
GS8672Q18BE-400
SigmaQuad-II ECCRAM
165-bump BGA
400
C
4M x 18
GS8672Q18BE-333
SigmaQuad-II ECCRAM
165-bump BGA
333
C
4M x 18
GS8672Q18BE-300
SigmaQuad-II ECCRAM
165-bump BGA
300
C
4M x 18
GS8672Q18BE-250
SigmaQuad-II ECCRAM
165-bump BGA
250
C
4M x 18
GS8672Q18BE-200
SigmaQuad-II ECCRAM
165-bump BGA
200
C
4M x 18
GS8672Q18BE-400I
SigmaQuad-II ECCRAM
165-bump BGA
400
I
4M x 18
GS8672Q18BE-333I
SigmaQuad-II ECCRAM
165-bump BGA
333
I
4M x 18
GS8672Q18BE-300I
SigmaQuad-II ECCRAM
165-bump BGA
300
I
4M x 18
GS8672Q18BE-250I
SigmaQuad-II ECCRAM
165-bump BGA
250
I
4M x 18
GS8672Q18BE-200I
SigmaQuad-II ECCRAM
165-bump BGA
200
I
2M x 36
GS8672Q36BE-400
SigmaQuad-II ECCRAM
165-bump BGA
400
C
2M x 36
GS8672Q36BE-333
SigmaQuad-II ECCRAM
165-bump BGA
333
C
2M x 36
GS8672Q36BE-300
SigmaQuad-II ECCRAM
165-bump BGA
300
C
2M x 36
GS8672Q36BE-250
SigmaQuad-II ECCRAM
165-bump BGA
250
C
2M x 36
GS8672Q36BE-200
SigmaQuad-II ECCRAM
165-bump BGA
200
C
2M x 36
GS8672Q36BE-400I
SigmaQuad-II ECCRAM
165-bump BGA
400
I
2M x 36
GS8672Q36BE-333I
SigmaQuad-II ECCRAM
165-bump BGA
333
I
2M x 36
GS8672Q36BE-300I
SigmaQuad-II ECCRAM
165-bump BGA
300
I
2M x 36
GS8672Q36BE-250I
SigmaQuad-II ECCRAM
165-bump BGA
250
I
2M x 36
GS8672Q36BE-200I
SigmaQuad-II ECCRAM
165-bump BGA
200
I
4M x 18
GS8672Q18BGE-400
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
400
C
4M x 18
GS8672Q18BGE-333
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
333
C
4M x 18
GS8672Q18BGE-300
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
300
C
4M x 18
GS8672Q18BGE-250
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
250
C
4M x 18
GS8672Q18BGE-200
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
200
C
4M x 18
GS8672Q18BGE-400I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
400
I
4M x 18
GS8672Q18BGE-333I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
333
I
4M x 18
GS8672Q18BGE-300I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
300
I
4M x 18
GS8672Q18BGE-250I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
250
I
4M x 18
GS8672Q18BGE-200I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
200
I
2M x 36
GS8672Q36BGE-400
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
400
C
2M x 36
GS8672Q36BGE-333
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
333
C
Notes:
1.
2.
Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS8672Q36BE-300T.
C = Commercial Temperature Range. I = Industrial Temperature Range.
Rev: 1.02 1/2013
26/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
Ordering Information—GSI SigmaQuad-II ECCRAM
Org
Part Number1
Type
Package
Speed
(MHz)
TJ2
2M x 36
GS8672Q36BGE-300
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
300
C
2M x 36
GS8672Q36BGE-250
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
250
C
2M x 36
GS8672Q36BGE-200
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
200
C
2M x 36
GS8672Q36BGE-400I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
400
I
2M x 36
GS8672Q36BGE-333I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
333
I
2M x 36
GS8672Q36BGE-300I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
300
I
2M x 36
GS8672Q36BGE-250I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
250
I
2M x 36
GS8672Q36BGE-200I
SigmaQuad-II ECCRAM
RoHS-compliant 165-bump BGA
200
I
Notes:
1.
2.
Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS8672Q36BE-300T.
C = Commercial Temperature Range. I = Industrial Temperature Range.
Rev: 1.02 1/2013
27/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
GS8672Q18/36BE-400/333/300/250/200
SigmaQuad-II ECCRAM Revision History
File Name
Format/Content
Description of changes
• Creation of new datasheet
8672QxxB_r1
8672QxxB_r1_01
Content
• Added Operating Currents data
• (Rev1.01a: Editorial updates)
• (Rev1.01b: Corrected 165 thermal numbers)
8672QxxB_r1_02
Content
• Added 400 MHz speed bin
• Updated to reflect MP status
Rev: 1.02 1/2013
28/28
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology
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