IDT ICS889872AKT

PRELIMINARY
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER
W/INTERNAL TERMINATION
General Description
Features
The ICS889872 is a high speed Differential-toLVDS Buffer/Divider w/Internal Termination and is a
HiPerClockS™
member of the HiPerClockS™family of high
performance clock solutions from IDT. The
ICS889872 has a selectable ÷2, ÷4, ÷8, ÷16 output
dividers. The clock input has internal termination resistors,
allowing it to interface with several differential signal types while
minimizing the number of required external components. The
device is packaged in a small, 3mm x 3mm VFQFN package,
making it ideal for use on space-constrained boards.
•
•
Three LVDS outputs
•
IN, nIN input can accept the following differential input levels:
LVPECL, LVDS, CML
•
•
•
•
•
•
•
•
•
Output frequency: >2GHz
ICS
Frequency divide select options: ÷4, ÷6: >2GHz,
÷8, ÷16: >1.6GHz
Cycle-to-cycle jitter: 1ps (typical)
Total jitter: 10ps (typical)
Output skew: 7ps (typical), QA/nQA outputs
Part-to-part skew: 250ps (typical)
Propagation Delay: 750ps (typical), QA/nQA outputs
Full 2.5V supply mode
-40°C to 85°C ambient operating temperature
Available in both standard (RoHS 5) and lead-free (RoHS 6)
packages
16 15 14 13
12 IN
2
11 VT
QB1 3
QA
÷2, ÷4,
÷8, ÷16
VT
50Ω
nIN
QA
nQA
7
8
VDD
6
nQB0
ICS889872
QB1
VREF_AC
9 nIN
5
nRESET/
nDISABLE
QB0
50Ω
10 VREF_AC
nQB1 4
nQA
IN
VDD
QB0 1
nQB0
Enable
MUX
GND
S0
Enable
FF
nRESET/
nDISABLE
S1
Pin Assignment
Block Diagram
16-Lead VFQFN
3mm x 3mm x 0.95mm package body
K Package
Top View
nQB1
S1
Decoder
S0
The Preliminary Information presented herein represents a product in pre-production. The noted characteristics are based on initial product characterization and/or qualification.
Integrated Device Technology, Incorporated (IDT) reserves the right to change any circuitry or specifications without notice.
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
1
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Table 1. Pin Descriptions
Number
Name
Type
1, 2
QB0, nQB0
Output
Differential output pair. Divide by 2, 4, 8, 16. Unused outputs must be
terminated with 100W across the pin (QB0/nQB0).
LVDS interface levels.
3, 4
QB1, nQB1
Output
Differential output pair. Divide by 2, 4, 8, 16. Unused outputs must be
terminated with 100W across the pin (QB1nQB1).
LVDS interface levels.
5, 6
QA, nQA
Output
Differential undivided output pair. LVDS interface levels.
7, 14
VDD
Power
Power supply pins.
8
nRESET/
nDISABLE
Input
Output reset and enable/disable pin. When LOW, resets the divider select,
and align Bank A and Bank B edges. In addition, when LOW, Bank A and
Bank B will be disabled. Input threshold is VDD/2V.
Includes a 37kΩ pullup resistor. LVTTL / LVCMOS interface levels.
9
nIN
Input
Pullup
Description
Inverting differential LVPECL clock input. RT = 50Ω termination to VT.
Reference voltage for AC-coupled applications. Equal to VDD – 1.4V
(approx.). Maximum sink/source current is 0.5mA.
10
VREF_AC
Output
11
VT
Input
Termination input. Leave pin floating.
12
IN
Input
Non-inverting LVPECL differential clock input.
RT = 50Ω termination to VT.
13
GND
Power
Power supply ground.
15, 16
S1, S0
Input
Pullup
Select pins. Logic HIGH if left unconnected (÷16 mode). S0 = LSB.
Input threshold is VDD/2. 37kW pullup resistor.
LVCMOS/LVTTL interface levels.
NOTE: Pullup refers to internal input resistors. See Table 2, Pin Characteristics, for typical values.
Table 2. Pin Characteristics
Symbol
Parameter
RPULLUP
Input Pullup Resistor
Test Conditions
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
Minimum
Typical
37
2
Maximum
Units
kΩ
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Function Tables
Table 3A. Control Input Function Table
Input
Outputs
nRESET
QA, QBx
nQA, nQBx
0
Disabled; LOW
Disabled; HIGH
1
Enabled
Enabled
NOTE: After nRESET switches, the clock outputs are disabled or
enabled following a falling input clock edge as shown in Figure 1.
Figure 1. nRESET Timing Diagram
VDD/2
nRESET
tRR
IN
nIN
VIN Swing
tPD
nQBx
VOUT Swing
QBx
QA
nQA
Table 3B. Truth Table
Inputs
Outputs
nRESET/nDISABLE
S1
S0
Bank A
Bank B
1
0
0
Input Clock
Input Clock ÷2
1
0
1
Input Clock
Input Clock ÷4
1
1
0
Input Clock
Input Clock ÷8
1
1
1
Input Clock
Input Clock ÷16
0
X
X
QA = LOW, nQA = HIGH; NOTE 1
QBx = LOW, nQBx = HIGH; NOTE 2
NOTE 1: On the next negative transition of the input signal.
NOTE 2: Asynchronous reset/disable function.Absolute Maximum Ratings
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
3
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect product reliability.
Item
Rating
Supply Voltage, VDD
4.6V
Inputs, VI
-0.5V to VDD + 0.5V
Outputs, IO
Continuos Current
Surge Current
10mA
15mA
Input Current, IN, nIN
±50mA
VT Current, IVT
±100mA
Input Sink/Source, IREF_AC
± 0.5mA
Operating Temperature Range, TA
-40°C to +85°C
Package Thermal Impedance, θJA, (Junction-to-Ambient)
51.5°C/W (0 lfpm)
Storage Temperature, TSTG
-65°C to 150°C
DC Electrical Characteristics
Table 4A. Power Supply DC Characteristics, VDD = 2.5V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
VDD
Positive Supply Voltage
IDD
Power Supply Current
Test Conditions
Minimum
Typical
Maximum
Units
2.375
2.5
2.625
V
80
mA
Table 4B. LVCMOS/LVTTL DC Characteristics, VDD = 2.5V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
Test Conditions
VIH
Input High Voltage
VIL
Input Low Voltage
IIH
Input High Current
VDD = VIN = 2.625V
IIL
Input Low Current
VDD = 2.625V, VIN = 0V
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
Minimum
Maximum
Units
2
VDD + 0.3
V
0
0.8
V
5
µA
-150
4
Typical
µA
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Table 4C. Differential DC Characteristics, VDD = 2.5V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
RIN
Differential Input Resistance
(IN, nIN)
VIH
Input High Voltage
(IN, nIN)
1.2
VDD
V
VIL
Input Low Voltage
(IN, nIN)
0
VDD – 0.15
V
VIN
Input Voltage Swing
0.15
2.8
V
VDIFF_IN
Differential Input Voltage Swing
0.3
IIN
Input Current
VREF_AC
Bias Voltage
Ω
100
V
(IN, nIN)
45
VDD – 1.35
mA
V
Table 4D. LVDS DC Characteristics, VDD = 2.5V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
Test Conditions
VOUT
Output Voltage Swing
VOH
Output High Voltage
VOL
Output Low Voltage
VCCM
Output Common Mode Voltage
∆VOCM
Change in Common Mode Voltage
Minimum
Typical
Maximum
Units
350
mV
1.475
V
0.925
V
1.35
V
50
mV
AC Electrical Characteristics
Table 5. AC Characteristics, VDD = 2.5V ± 5%, TA = -40°C to 85°C
Parameter
fMAX
tPD
Symbol
Test Conditions
Minimum
Typical
Maximum
Units
Output Frequency
÷2, ÷4
>2
GHz
Input Frequency
÷8, ÷16
>1.6
GHz
Input Swing: <400mV
750
ps
Input Swing: ≥400mV
Propagation Delay;
NOTE 1, 2
IN-to-Q
750
ps
QB0-to-QB1
7
ps
QA-to-QB
60
ps
250
ps
tsk(o)
Output Skew;
NOTE 2, 3, 4
tsk(pp)
Part-to-Part Skew; NOTE 2, 4, 5
tjit(cc)
Cycle-to-Cycle Jitter; NOTE 2, 6
1
ps
tjit(j)
Total Jitter; NOTE 2
10
ps
tRR
Reset Recovery Time; NOTE 2
tR / tF
Output Rise/Fall Time; NOTE 2
600
ps
150
ps
All parameters characterized at ≤ 1GHz unless otherwise noted.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Specs are design targets.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at the output differential cross points.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 5: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load conditions.
Using the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 6: The cycle-to-cycle jitter on the input will equal the jitter on the output. The part does not add jitter.
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
5
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Parameter Measurement Information
VDD
,
SCOPE
2.5V±5%
POWER SUPPLY
+ Float GND –
nIN
Qx
VDD
V
LVDS
Cross Points
IN
V
IH
IN
nQx
V
IL
GND
Differential Input Level
LVDS Output Load AC Test Circuit
nQx
Par t 1
nQx
Qx
Qx
nQy
Qy Par t 1
Qy
Qy
tsk(o)
tsk(pp)
Output Skew
Part-to-Part Skew
nQA,
nQB[0:1]
nIN
IN
QA,
QB[0:1]
➤
tcycle n
➤
tcycle n+1
nQA,
nQB[0:1]
➤
➤
tjit(cc) = tcycle n – tcycle n+1
1000 Cycles
QA,
QB[0:1]
Cycle-to-Cycle Jitter
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
tPD
Propagation Delay
6
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Parameter Measurement Information, continued
80%
80%
VDIFF_IN, VDIFF_OUT
VIN, VOUT
VOD
1600mV
(typical)
Clock
Outputs
800mV
(typical)
Single-Ended & Differential Input Voltage Swing
20%
20%
tF
tR
Output Rise/Fall Time
Application Information
Wiring the Differential Input to Accept Single Ended Levels
Figure 2 shows how the differential input can be wired to accept
single ended levels. The reference voltage V_REF = VDD/2 is
generated by the bias resistors R1, R2 and C1. This bias circuit
should be located as close as possible to the input pin. The ratio of
R1 and R2 might need to be adjusted to position the V_REF in the
center of the input voltage swing. For example, if the input clock
swing is only 2.5V and VDD = 3.3V, V_REF should be 1.25V and
R2/R1 = 0.609.
VDD
R1
1K
Single Ended Clock Input
IN
V_REF
nIN
C1
0.1u
R2
1K
Figure 2. Single-Ended Signal Driving Differential Input
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
7
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Differential Input with Built-in 50Ω Termination Interface
The IN /nIN with built-in 50Ω terminations accepts LVDS, LVPECL,
LVHSTL, CML, SSTL and other differential signals. Both signals
must meet the VPP and VCMR input requirements. Figures 3A to 3E
show interface examples for the HiPerClockS IN/nIN input with
built-in 50Ω terminations driven by the most common driver types.
The input interfaces suggested here are examples only. If the driver
is from another vendor, use their termination recommendation.
Please consult with the vendor of the driver component to confirm
the driver termination requirements.
2.5V
2.5V
2.5V
3.3V or 2.5V
Zo = 50Ω
Zo = 50Ω
IN
IN
VT
Zo = 50Ω
VT
Zo = 50Ω
nIN
nIN
Receiver
LVDS
Receiver
LVPECL
With
With
R1
18
Built-In
Built-In
50Ω
50Ω
Figure 3A. HiPerClockS IN/nIN Input with Built-In 50Ω
Driven by an LVDS Driver
2.5V
Figure 3B. HiPerClockS IN/nIN Input with Built-In 50Ω
Driven by an LVPECL Driver
2.5V
2.5V
3.3V
3.3V LVPECL
Zo = 50Ω
Zo = 50Ω
C1
IN
IN
50Ω
VT
VT
Zo = 50Ω
Zo = 50Ω
C2
50Ω
nIN
nIN
Receiver
REF_AC
With
CML - Built-in 50Ω Pull-up
R5
100 - 200Ω
Built-In
R5
100 - 200Ω
Receiver with
Built-In 50Ω
50Ω
Figure 3C. HiPerClockS IN/nIN Input with Built-In 50Ω
Driven by a CML Driver with Built-In 50Ω
Pullup
Figure 3D. HiPerClockS IN/nIN Input with Built-In 50Ω
Driven by an SSTL Driver
2.5V
3.3V
3.3V CML with
Built-In Pullup
Zo = 50Ω
C1
IN
50Ω
VT
Zo = 50Ω
C2
50Ω
nIN
REF_AC
Receiver with
Built-In 50Ω
Figure 3E. HiPerClockS IN/nIN Input with Built-In 50Ω
Driven by a 3.3V CML Driver with
Built-In Pullup
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
8
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Recommendations for Unused Input Pins
Inputs:
OUTputs:
LVCMOS Select Pins
LVDS Outputs
All control pins have internal pull-ups or pull-downs; additional
resistance is not required but can be added for additional
protection. A 1kΩ resistor can be used.
All unused LVDS output pairs can be either left floating or
terminated with 100Ω across. If they are left floating, we
recommend that there is no trace attached.
EPAD Thermal Release Path
The EPAD provides heat transfer from the device to the P.C. board.
The exposed metal pad on the PCB is connected to the ground
plane through thermal vias. To guarantee the device’s electrical
and thermal performance, EPAD must be soldered to the exposed
PIN
PIN PAD
SOLDER
metal pad on the PCB, as shown in Figure 4. For further
information, please refer to the Application Note on Surface Mount
Assembly of Amkor’s Thermally /Electrically Enhance Leadframe
Base Package, Amkor Technology.
SOLDER
EPAD
GROUND PLANE
PIN
EXPOSED METAL PAD
THERMAL VIA
PIN PAD
(GROUND PAD)
Figure 4. P.C. Board for Exposed Pad Thermal Release Path Example
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
9
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
2.5V LVDS Driver Termination
Figure 5 shows a typical termination for LVDS driver in
characteristic impedance of 100Ω differential (50Ω single)
transmission line environment. For buffer with multiple LDVS driver,
it is recommended to terminate the unused outputs.
2.5V
50Ω
2.5V
LVDS Driver
+
R1
100Ω
–
50Ω
100Ω Differential Transmission Line
Figure 5. Typical LVDS Driver Termination
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
10
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Power Considerations
This section provides information on power dissipation and junction temperature for the ICS889872.
Equations and example calculations are also provided.
1.
Power Dissipation.
The total power dissipation for the ICS889872 is the sum of the core power plus the power dissipated in the load(s).
The following is the power dissipation for VDD = 2.5V + 5% = 2.625V, which gives worst case results.
•
Power_MAX = VDD_MAX * IDD_MAX = 2.625V * 80mA = 210mW
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability of the device.
The maximum recommended junction temperature for HiPerClockS devices is 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θJA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming no air flow
and a multi-layer board, the appropriate value is 51.5°C/W per Table 6 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.210W * 51.5°C/W = 95.8°C. This is well below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow and the type
of board (single layer or multi-layer).
Table 6. Thermal Resistance θJA for 16 Lead VFQFN, Forced Convection
θJA by Velocity
Linear Feet per Minute
Multi-Layer PCB, JEDEC Standard Test Boards
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
0
51.5°C/W
11
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Reliability Information
Table 7. θJA vs. Air Flow Table for a 16 Lead VFQFN
θJA by Velocity
Linear Feet per Minute
0
Multi-Layer PCB, JEDEC Standard Test Boards
51.5°C/W
Transistor Count
The transistor count for ICS889872 is: 323
Pin compatible with SY89872U
Package Outline and Package Dimensions
Package Outline - K Suffix for 16 Lead VFQFN
(Ref.)
S eating Plan e
N &N
Even
(N -1)x e
(R ef.)
A1
Ind ex Area
A3
N
L
N
e (Ty p.)
2 If N & N
1
Anvil
Singula tion
are Even
2
OR
E2
(N -1)x e
(Re f.)
E2
2
To p View
b
A
(Ref.)
D
Chamfer 4x
0.6 x 0.6 max
OPTIONAL
e
N &N
Odd
0. 08
C
D2
2
Th er mal
Ba se
D2
C
Table 8. Package Dimensions
JEDEC Variation: VEED-2/-4
All Dimensions in Millimeters
Symbol
Minimum
Maximum
N
16
A
0.80
1.00
A1
0
0.05
A3
0.25 Ref.
b
0.18
0.30
4
ND & NE
D&E
3.00 Basic
D2 & E2
1.00
1.80
e
0.50 Basic
L
0.30
0.50
Reference Document: JEDEC Publication 95, MO-220
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
12
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Ordering Information
Table 9. Ordering Information
Part/Order Number
ICS889872AK
ICS889872AKT
ICS889872AKLF
ICS889872AKLFT
Marking
872A
872A
TBD
TBD
Package
16 Lead VFQFN
16 Lead VFQFN
“Lead-Free” 16 Lead VFQFN
“Lead-Free” 16 Lead VFQFN
Shipping Packaging
Tube
2500 Tape & Reel
Tube
2500 Tape & Reel
Temperature
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
NOTE: Parts that are ordered with an "LF" suffix to the part number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology (IDT) assumes no responsibility for either its use or for
the infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use
in normal commercial and industrial applications. Any other applications, such as those requiring high reliability or other extraordinary environmental requirements are not
recommended without additional processing by IDT. IDT reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT
product for use in life support devices or critical medical instruments.
IDT™ / ICS™ LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
13
ICS889872AK REV. A AUGUST 22, 2007
ICS889872
DIFFERENTIAL-TO-LVDS BUFFER/DIVIDER W/INTERNAL TERMINATION
PRELIMINARY
Innovate with IDT and accelerate your future networks. Contact:
www.IDT.com
www.IDT.com
For Sales
For Tech Support
800-345-7015
408-284-8200
Fax: 408-284-2775
[email protected]
480-763-2056
Corporate Headquarters
Asia Pacific and Japan
Europe
Integrated Device Technology, Inc.
6024 Silver Creek Valley Road
San Jose, CA 95138
United States
800 345 7015
+408 284 8200 (outside U.S.)
Integrated Device Technology
Singapore (1997) Pte. Ltd.
Reg. No. 199707558G
435 Orchard Road
#20-03 Wisma Atria
Singapore 238877
+65 6 887 5505
IDT Europe, Limited
321 Kingston Road
Leatherhead, Surrey
KT22 7TU
England
+44 (0) 1372 363 339
Fax: +44 (0) 1372 378851
© 2007 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT and the IDT logo are trademarks of Integrated Device
Technology, Inc. Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and marks are or may be trademarks or registered
trademarks used to identify products or services of their respective owners.
Printed in USA