IDT ICS854S202I-01

PRELIMINARY
ICS854S202I-01
12:2, DIFFERENTIAL-TO-LVDS MULTIPLEXER
GENERAL DESCRIPTION
FEATURES
The ICS854S202I-01 is a 12:2 Differential-toICS
LVDS Clock Multiplexer which can operate up to
HiPerClockS™ 700MHz and is a member of the HiPerClockS™
family of High Performance Clock Solutions from
IDT. The ICS854S202I-01 has 12 selectable differential clock inputs, any of which can be independently routed
to either of the two LVDS outputs. The CLKx, nCLKx input
pairs can accept LVPECL, LVDS, CML or SSTL levels. The
fully differential architecture and low propagation delay make
it ideal for use in clock distribution circuits.
• Two differential 2.5V LVDS clock outputs
• Twelve selectable differential clock inputs
• CLKx, nCLKx pairs can accept the following differential input
levels: LVPECL, LVDS, HSTL, SSTL, HCSL
•
Maximum output frequency: >3GHz
• Propagation delay: 650ps (typical)
• Input skew: TBD
• Output skew: 25ps (typical)
• Part-to-part skew: TBD
• Additive phase jitter, RMS (12kHz – 20MHz): 0.16ps (typical)
• Full 2.5V operating supply mode
BLOCK DIAGRAM
SELA_[3:0]
•
• Available in both standard (RoHS 5) and lead-free (RoHS 6)
packages
4
Pulldown
-40°C to 85°C ambient operating temperature
CLK0
nCLK0
CLK1
nCLK1
CLK2
nCLK2
QA
nQA
OEA
PIN ASSIGNMENT
CLK2
nCLK2
SELA_0
SELA_1
VDD
QA
nQA
GND
SELA_2
SELA_3
CLK3
nCLK3
CLK6
nCLK6
CLK7
nCLK7
CLK8
nCLK8
QB
nQB
OEB
CLK9
nCLK9
CLK11
nCLK11
SELB_[3:0]
48 47 46 45 44 43 42 41 40 39 38 37
1
36
2
35
3
34
4
33
5
32
48-Pin LQFP
6
31
7mm x 7mm x 1.4mm
7
30
package body
8
29
Y Package
9
28
Top View
10
27
11
26
12
25
13 14 15 16 17 18 19 20 21 22 23 24
ICS854S202I-01
nCLK4
CLK4
GND
nCLK5
CLK5
VDD
OEA
CLK6
nCLK6
GND
CLK7
CLK10
nCLK10
Pulldown
nCLK10
CLK5
nCLK5
CLK10
GND
nCLK11
CLK11
OEB
VDD
CLK0
nCLK0
GND
CLK1
nCLK1
CLK4
nCLK4
CLK9
nCLK9
SELB_0
SELB_1
VDD
QB
nQB
GND
SELB_2
SELB_3
CLK8
nCLK8
nCLK7
CLK3
nCLK3
4
The Preliminary Information presented herein represents a product in pre-production. The noted characteristics are based on initial product characterization
and/or qualification. Integrated Device Technology, Incorporated (IDT) reserves the right to change any circuitry or specifications without notice.
IDT ™ / ICS™ LVDS MULTIPLEXER
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12:2, DIFFERENTIAL-LVDS MULTIPLEXER
PRELIMINARY
TABLE 1. PIN DESCRIPTIONS (CONTINUED ON NEXT PAGE)
Number
Name
1
CLK2
Input
Type
2
nCLK2
Input
3,
4,
9,
10
5, 32, 43
SELA_0,
SELA_1,
SELA_2,
SELA_3
VDD
Power
Positive supply pins.
6, 7
QA, nQA
Output
Clock outputs. LVDS interface levels.
8, 15, 22, 29, 39, 46
GND
Power
11
CLK3
Input
12
nCLK3
Input
13
nCLK4
Input
14
CLK4
Input
16
nCLK5
Input
17
CLK5
Input
18, 43
VDD
Power
19
OEA
Input
Pullup
20
CLK6
Input
21
nCLK6
Input
23
CLK7
Input
24
nCLK7
Input
25
nCLK8
Input
26
27,
28,
33,
34
30, 31
CLK8
SELB_3,
SELB_2,
SELB_1,
SELB_0
nQB, QB
Input
Pullup
Pullup/
Pulldown
Pullup
Pullup/
Pulldown
Pullup/
Pulldown
Pullup
Output
35
nCLK9
Input
36
CLK9
Input
37
nCLK10
Input
38
CLK10
Input
40
nCLK11
Input
41
CLK11
Input
Input
Input
Description
Pullup
Non-inver ting differential clock input.
Pullup/
Inver ting differential clock input. VDD/2 default when left floating.
Pulldown
Clock select pins for Bank A outputs. See Control Input
Pulldown Function Table. LVCMOS/LVTTL interface levels.
See Table 3B.
Power supply ground.
Pullup
Pullup/
Pulldown
Pullup/
Pulldown
Pullup
Pullup/
Pulldown
Pullup
Non-inver ting differential clock input.
Inver ting differential clock input. VDD/2 default when left floating.
Inver ting differential clock input. VDD/2 default when left floating.
Non-inver ting differential clock input.
Inver ting differential clock input. VDD/2 default when left floating.
Non-inver ting differential clock input.
Positive supply pins.
Output enable pin. Controls enabling and disabling of QA/nQA
outputs. LVCMOS/LVTTL internface levels.
Non-inver ting differential clock input.
Inver ting differential clock input. VDD/2 default when left floating.
Non-inver ting differential clock input.
Inver ting differential clock input. VDD/2 default when left floating.
Inver ting differential clock input. VDD/2 default when left floating.
Non-inver ting differential clock input.
Clock select pins for Bank B outputs. See Control Input
Pulldown Function Table. LVCMOS/LVTTL interface levels.
See Table 3C.
Clock outputs. LVDS interface levels.
Pullup/
Pulldown
Pullup
Pullup/
Pulldown
Pullup
Pullup/
Pulldown
Pullup
Inver ting differential clock input. VDD/2 default when left floating.
Non-inver ting differential clock input.
Inver ting differential clock input. VDD/2 default when left floating.
Non-inver ting differential clock input.
Inver ting differential clock input. VDD/2 default when left floating.
Non-inver ting differential clock input.
NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
IDT ™ / ICS™ LVDS MULTIPLEXER
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PRELIMINARY
TABLE 1. PIN DESCRIPTIONS (CONTINUED)
Number
Name
Type
42
OEB
Input
44
CLK0
Input
Pullup
Description
Output enable pin. Controls enabling and disabling of QB/nQB
outputs. LVCMOS/LVTTL internface levels. See Table 3A.
Non-inver ting differential clock input.
Pullup
Pullup/
45
nCLK0
Input
Inver ting differential clock input. VDD/2 default when left floating.
Pulldown
47
CLK1
Input
Pullup
Non-inver ting differential clock input.
Pullup/
48
nCLK1
Input
Inver ting differential clock input. VDD/2 default when left floating.
Pulldown
NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
TABLE 2. PIN CHARACTERISTICS
Symbol
Parameter
CIN
Input Capacitance
Test Conditions
Minimum
Typical
4
Maximum
Units
pF
RPULLUP
Input Pullup Resistor
51
kΩ
RPULLDOWN
Input Pulldown Resistor
51
kΩ
TABLE 3B. OEA, OEB CONTROL INPUT FUNCTION TABLE
Input
OEA, OEB
0
Output
QA/nQA, QB/nQB
Disabled (Logic LOW)
1
Active
IDT ™ / ICS™ LVDS MULTIPLEXER
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PRELIMINARY
TABLE 3B. SEL_A CONTROL INPUT FUNCTION TABLE
SELA_3
0
Control Input
SELA_2
SELA_1
0
0
SELA_0
0
Input Selected to QA/nQA
CLK0, nCLK0
0
0
0
1
CLK1, nCLK1
0
0
1
0
CLK2, nCLK2
0
0
1
1
CLK3, nCLK3
0
1
0
0
CLK4, nCLK4
0
1
0
1
CLK5, nCLK5
0
1
1
0
CLK6, nCLK6
0
1
1
1
CLK7, nCLK7
1
0
0
0
CLK8, nCLK8
1
0
0
1
CLK9, nCLK9
1
0
1
0
CLK10, nCLK10
1
0
1
1
CLK11, nCLK11
1
1
0
0
L/H
1
1
0
1
L/H
1
1
1
0
L/H
1
1
1
1
L/H
TABLE 3C. SEL_B CONTROL INPUT FUNCTION TABLE
SELB_3
0
Control Input
SELB_2
SELB_1
0
0
SELB_0
0
Input Selected to QB/nQB
CLK0, nCLK0
0
0
0
1
CLK1, nCLK1
0
0
1
0
CLK2, nCLK2
0
0
1
1
CLK3, nCLK3
0
1
0
0
CLK4, nCLK4
0
1
0
1
CLK5, nCLK5
0
1
1
0
CLK6, nCLK6
0
1
1
1
CLK7, nCLK7
CLK8, nCLK8
1
0
0
0
1
0
0
1
CLK9, nCLK9
1
0
1
0
CLK10, nCLK10
1
0
1
1
CLK11, nCLK11
1
1
0
0
L/H
1
1
0
1
L/H
1
1
1
0
L/H
1
1
1
1
L/H
IDT ™ / ICS™ LVDS MULTIPLEXER
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12:2, DIFFERENTIAL-LVDS MULTIPLEXER
PRELIMINARY
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDD
4.6V
NOTE: Stresses beyond those listed under Absolute
Inputs, VI
-0.5V to VDD + 0.5 V
Outputs, IO (LVDS)
Continuous Current
Surge Current
10mA
15mA
Maximum Ratings may cause per manent damage to the
device. These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability.
Package Thermal Impedance, θJA 67.2°C/W (0 lfpm)
Storage Temperature, TSTG
-65°C to 150°C
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = 2.5V±5%, TA = -40°C TO 85°C
Symbol
Parameter
VDD
Power Supply Voltage
Test Conditions
IDD
Power Supply Current
Minimum
Typical
Maximum
Units
2.375
2.5
2.625
V
110
mA
TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = 2.5V±5%, TA = -40°C TO 85°C
Symbol
Parameter
VIH
Input High Voltage
VIL
Input Low Voltage
IIH
IIL
Input High Current
Input Low Current
Test Conditions
SELA_0:3,
SELB_0:3
OEA, OEB
SELA_0:3,
SELB_0:3
OEA, OEB
Minimum
Maximum
Units
1.7
Typical
VDD + 0.3
V
-0.3
0.7
V
VDD = 2.625V
15 0
µA
VDD = 2.625V
5
µA
VDD = 2.625V, VIN = 0V
-5
µA
VDD = 2.625V, VIN = 0V
-150
µA
TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, VDD = 2.5V±5%, TA = -40°C TO 85°C
Symbol Parameter
IIH
Input High Current
IIL
Input Low Current
Test Conditions
CLK0:CLK11
nCLK0:nCLK11
Minimum
Typical
VDD = VIN = 2.625V
Units
150
µA
CLK0:CLK11
VDD = 2.625V, VIN = 0V
-5
µA
nCLK0:nCLK11
VDD = 2.625V, VIN = 0V
-150
µA
Peak-to-Peak Input Voltage
0.15
Common Mode Input Voltage;
VCMR
GND + 0.5
NOTE 1, 2
NOTE 1: Common mode voltage is defined as VIH.
NOTE 2: For single ended applications, the maximum input voltage for CLKx, nCLKx is VDD + 0.3V.
VPP
IDT ™ / ICS™ LVDS MULTIPLEXER
Maximum
5
1.3
V
VDD – 0.85
V
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PRELIMINARY
TABLE 4D. LVDS DC CHARACTERISTICS, VDD = 2.5V±5%, TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
VOD
Differential Output Voltage
400
mV
∆ VOD
VOD Magnitude Change
50
mV
VOS
Offset Voltage
1.3
V
∆ VOS
VOS Magnitude Change
50
mV
TABLE 5. AC CHARACTERISTICS, VDD = 2.5V ± 5%, TA = -40°C TO 85°C
Symbol
Parameter
fMAX
t sk(o)
Output Frequency
Propagation Delay, Low to High;
NOTE 1
Propagation Delay, High to Low;
NOTE 1
Output Skew; NOTE 2, 3
t sk(i)
Input Skew; NOTE 3
TBD
ps
t sk(pp)
TBD
ps
0.16
ps
tR / tF
Par t-to-Par t Skew; NOTE 3, 4
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter section,
NOTE 5
Output Rise/Fall Time
110
ps
od c
Output Duty Cycle
50
%
tpLH
tpHL
tjit
Test Conditions
155.52MHz,
Integration Range:
12kHz - 20MHz
20% to 80%
Minimum
Typical
Maximum
Units
>3
GHz
650
ps
650
ps
25
ps
fOUT < 1.2GHz
45
dB
MUXISOLATION MUX Isolation
All parameters measured at 500MHz, unless noted otherwise.
NOTE 1: Measured from VDD/2 of the input to VDD/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDD/2.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: Defined as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at VDD/2.
NOTE 5: Driving only one input clock.
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PRELIMINARY
ADDITIVE PHASE JITTER
band to the power in the fundamental. When the required offset
is specified, the phase noise is called a dBc value, which simply
means dBm at a specified offset from the fundamental. By
investigating jitter in the frequency domain, we get a better
understanding of its effects on the desired application over the
entire time record of the signal. It is mathematically possible to
calculate an expected bit error rate given a phase noise plot.
The spectral purity in a band at a specific offset from the
fundamental compared to the power of the fundamental is called
the dBc Phase Noise. This value is normally expressed using a
Phase noise plot and is most often the specified plot in many
applications. Phase noise is defined as the ratio of the noise power
present in a 1Hz band at a specified offset from the fundamental
frequency to the power value of the fundamental. This ratio is
expressed in decibels (dBm) or a ratio of the power in the 1Hz
Additive Phase Jitter at 155.52MHz
SSB PHASE NOISE dBc/HZ
(12kHz - 20MHz) = 0.16ps (typical)
OFFSET FROM CARRIER FREQUENCY (HZ)
meets the noise floor of what is shown, but can actually be lower.
The phase noise is dependant on the input source and
measurement equipment.
As with most timing specifications, phase noise measurements
have issues. The primary issue relates to the limitations of the
equipment. Often the noise floor of the equipment is higher than
the noise floor of the device. This is illustrated above. The device
IDT ™ / ICS™ LVDS MULTIPLEXER
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PRELIMINARY
PARAMETER MEASUREMENT INFORMATION
VDD
SCOPE
Qx
VDD
2.5V±5%
POWER SUPPLY
+ Float GND –
nCLK0:nCLK11
LVDS
V
V
Cross Points
PP
CMR
CLK0:CLK11
nQx
GND
2.5V OUTPUT LOAD AC TEST CIRCUIT
DIFFERENTIAL INPUT LEVEL
Part 1
nQx
nQx
Qx
Qx
Part 2
nQy
nQy
Qy
Qy
tsk(pp)
tsk(o)
PART-TO-PART SKEW
OUTPUT SKEW
nCLK0:nCLK11
CLK0:CLK11
80%
80%
VOD
nQA, nQB
Clock
Outputs
QA, QB
tPD
PROPAGATION DELAY
IDT ™ / ICS™ LVDS MULTIPLEXER
20%
20%
tR
tF
OUTPUT RISE/FALL TIME
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PRELIMINARY
nCLK0:
nCLK11
CLK0:
CLK11
nQA, nQB
QA, QB
nQA, nQB
QA, QB
tPD1
t PW
t
nCLKy
odc =
PERIOD
t PW
x 100%
t PERIOD
CLKy
nQA, nQB
QA, QB
tPD2
tsk(i) = |tPD1 - tPD2|
OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD
INPUT SKEW
VDD
VDD
out
➤
➤
LVDS
100
DC Input
VOD/∆ VOD
out
LVDS
➤
➤
DC Input
➤
out
out
VOS/∆ VOS
➤
DIFFERENTIAL OUTPUT VOLTAGE SETUP
IDT ™ / ICS™ LVDS MULTIPLEXER
OFFSET VOLTAGE SETUP
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PRELIMINARY
APPLICATION INFORMATION
RECOMMENDATIONS FOR UNUSED INPUT AND OUTPUT PINS
INPUTS:
OUTPUTS:
CLK/nCLK INPUT:
For applications not requiring the use of the differential input,
both CLK and nCLK can be left floating. Though not required, but
for additional protection, a 1kΩ resistor can be tied from CLK to
ground.
LVDS OUTPUT
All unused LVDS output pairs can be either left floating or
ter minated with 100Ω across. If they are left floating, we
recommend that there is no trace attached.
LVCMOS CONTROL PINS:
All control pins have internal pull-ups or pull-downs; additional
resistance is not required but can be added for additional
protection. A 1kΩ resistor can be used.
WIRING THE DIFFERENTIAL INPUT TO ACCEPT SINGLE ENDED LEVELS
Figure 1 shows how the differential input can be wired to accept
single ended levels. The reference voltage V_REF = VDD/2 is
generated by the bias resistors R1, R2 and C1. This bias circuit
should be located as close as possible to the input pin. The ratio
of R1 and R2 might need to be adjusted to position the V_REF in
the center of the input voltage swing. For example, if the input
clock swing is only 2.5V and VDD = 3.3V, V_REF should be 1.25V
VDD
R1
1K
Single Ended Clock Input
CLKx
V_REF
nCLKx
C1
0.1u
R2
1K
FIGURE 1. SINGLE ENDED SIGNAL DRIVING DIFFERENTIAL INPUT
IDT ™ / ICS™ LVDS MULTIPLEXER
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DIFFERENTIAL CLOCK INPUT INTERFACE
The CLK /nCLK accepts LVDS, LVPECL, LVHSTL, SSTL, HCSL
and other differential signals. Both V SWING and VOH must meet
the V PP and V CMR input requirements. Figures 2A to 2E show
interface examples for the HiPerClockS CLK/nCLK input
driven by the most common driver types. The input interfaces
suggested here are examples only. Please consult with the
vendor of the driver component to confirm the driver termination requirements. For example in Figure 2A, the input
termination applies for IDT HiPerClockS LVHSTL drivers. If you
are using an LVHSTL driver from another vendor, use their
termination recommendation.
3.3V
3.3V
3.3V
1.8V
Zo = 50 Ohm
CLK
Zo = 50 Ohm
CLK
Zo = 50 Ohm
nCLK
Zo = 50 Ohm
LVPECL
nCLK
HiPerClockS
Input
LVHSTL
ICS
HiPerClockS
LVHSTL Driver
R1
50
R1
50
HiPerClockS
Input
R2
50
R2
50
R3
50
FIGURE 2A. HIPERCLOCKS CLK/nCLK INPUT DRIVEN BY
IDT HIPERCLOCKS LVHSTL DRIVER
FIGURE 2B. HIPERCLOCKS CLK/nCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER
3.3V
3.3V
3.3V
3.3V
3.3V
R3
125
R4
125
Zo = 50 Ohm
LVDS_Driv er
Zo = 50 Ohm
CLK
CLK
R1
100
Zo = 50 Ohm
nCLK
LVPECL
R1
84
HiPerClockS
Input
nCLK
Receiv er
Zo = 50 Ohm
R2
84
FIGURE 2C. HIPERCLOCKS CLK/nCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER
FIGURE 2D. HIPERCLOCKS CLK/nCLK INPUT DRIVEN BY
3.3V LVDS DRIVER
3.3V
3.3V
3.3V
LVPECL
Zo = 50 Ohm
C1
Zo = 50 Ohm
C2
R3
125
R4
125
CLK
nCLK
R5
100 - 200
R6
100 - 200
R1
84
HiPerClockS
Input
R2
84
R5,R6 locate near the driver pin.
FIGURE 2E. HIPERCLOCKS CLK/NCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER WITH AC COUPLE
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2.5V LVDS DRIVER TERMINATION
Figure 3 shows a typical termination for LVDS driver in characteristic impedance of 100Ω differential (50Ω single) transmission
line environment. For buffer with multiple LDVS driver, it is recommended to terminate the unused outputs.
2.5V
2.5V
LVDS_Driv er
+
R1
100
-
100 Ohm
Transmission
Line
ΩDifferential
100Ω
Differential Transmission
Line
FIGURE 3. TYPICAL LVDS DRIVER TERMINATION
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PRELIMINARY
POWER CONSIDERATIONS
This section provides information on power dissipation and junction temperature for the ICS854S202I-01.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for the ICS854S202I-01 is the sum of the core power plus the power dissipated in the load(s).
The following is the power dissipation for VDD = 2.5V + 5% = 2.625V, which gives worst case results.
•
Power (core)MAX = VDD_MAX * IDD_MAX = 2.625V * 110mA = 288.75mW
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability of the
device. The maximum recommended junction temperature for HiPerClockSTM devices is 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θJA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming a
moderate air flow of 200 linear feet per minute and a multi-layer board, the appropriate value is 57.4°C/W per Table 6 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.289W * 57.4°C/W = 101.6°C. This is well below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow, and
the type of board (single layer or multi-layer).
TABLE 6. THERMAL RESISTANCE θJA FOR 48-LEAD LQFP, FORCED CONVECTION
θJA vs. Air Flow (Linear Feet per Minute)
Multi-Layer PCB, JEDEC Standard Test Boards
IDT ™ / ICS™ LVDS MULTIPLEXER
0
200
500
67.2°C/W
57.4°C/W
53.8°C/W
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RELIABILITY INFORMATION
TABLE 7. θJAVS. AIR FLOW TABLE
FOR
48 LEAD LQFP
θJA vs. Air Flow (Linear Feet per Minute)
Multi-Layer PCB, JEDEC Standard Test Boards
0
200
500
67.2°C/W
57.4°C/W
53.8°C/W
TRANSISTOR COUNT
The transistor count for ICS854S202I-01 is: 8,485
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PACKAGE OUTLINE - Y SUFFIX FOR 48 LEAD LQFP
TABLE 8. PACKAGE DIMENSIONS
JEDEC VARIATION
ALL DIMENSIONS IN MILLIMETERS
SYMBOL
BBC
MINIMUM
NOMINAL
MAXIMUM
48
N
A
--
--
1.60
A1
0.05
--
0.15
A2
1.35
1.40
1.45
b
0.17
0.22
0.27
c
0.09
--
0.20
D
9.00 BASIC
D1
7.00 BASIC
D2
5.50 Ref.
E
9.00 BASIC
E1
7.00 BASIC
E2
5.50 Ref.
e
0.50 BASIC
L
0.45
0.60
θ
0°
--
0.75
7°
ccc
--
--
0.08
Reference Document: JEDEC Publication 95, MS-026
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TABLE 9. ORDERING INFORMATION
Part/Order Number
Marking
Package
Shipping Packaging
Temperature
ICS854S202AYI-01
ICS4S202AI01
48 Lead LQFP
tray
-40°C to 85°C
ICS854S202AYI-01T
ICS4S202AI01
48 Lead LQFP
1000 tape & reel
-40°C to 85°C
ICS854S202AYI-01LF
TBD
48 Lead "Lead-Free" LQFP
tray
-40°C to 85°C
ICS854S202AYI-01LFT
TBD
48 Lead "Lead-Free" LQFP
1000 tape & reel
-40°C to 85°C
NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Incorporated (IDT) assumes no responsibility for either its use or for
infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and
industrial applications. Any other applications such as those requiring high reliability or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT
reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments.
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© 2006 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, the IDT logo, ICS and HiPerClockS are trademarks
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