Datasheet

SSF18N50F Main Product Characteristics:
VDSS
500V
RDS(on)
0.22ohm(typ.)
ID
18A
TO220F Features and Benefits:
Marking and pin
Advanced Process Technology
Special designed for PWM, load switching and
general purpose applications
Ultra low on-resistance with low gate charge
Fast switching and reverse body recovery
150℃ operating temperature
„
„
„
„
„
Schematic diagram Assignment Description:
These N-Channel enhancement mode power field effect transistors are produced using silikron
proprietary MOSFET technology. This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching performance, and withstand high energy
pulse in the avalanche and commutation mode. These devices are well suited for high efficiency
switch mode power supplies
Absolute max Rating:
Symbol
Parameter
Max.
Units
ID @ TC = 25°C
Continuous Drain Current, VGS @ 10V①
18
ID @ TC = 100°C
Continuous Drain Current, VGS @ 10V①
10.8
IDM
Pulsed Drain Current②
72
Power Dissipation③
38
W
Linear Derating Factor
0.3
W/°C
VDS
Drain-Source Voltage
500
V
VGS
Gate-to-Source Voltage
± 30
V
EAS
Single Pulse Avalanche Energy @ L=5.2mH
315
mJ
IAS
Avalanche Current @ L=5.2mH
11
A
TJ TSTG
Operating Junction and Storage Temperature Range
-55 to + 150
°C
PD @TC = 25°C
©Silikron Semiconductor CO.,LTD.
2011.09.25
www.silikron.com Version : 1.0
A
page 1 of 8
SSF18N50F
Thermal Resistance
Symbol
Characterizes
RθJC
RθJA
Typ.
Max.
Units
Junction-to-case③
—
3.3
℃/W
Junction-to-ambient (t ≤ 10s) ④
—
62
℃/W
Junction-to-Ambient (PCB mounted, steady-state) ④
—
40
℃/W
Electrical Characterizes @TA=25℃
Symbol
Parameter
V(BR)DSS
Drain-to-Source breakdown voltage
RDS(on)
Static Drain-to-Source on-resistance
VGS(th)
Gate threshold voltage
IDSS
Drain-to-Source leakage current
IGSS
Gate-to-Source forward leakage
Qg
unless otherwise specified
Min.
Typ.
Max.
Units
V
Conditions
500
—
—
—
0.22
0.35
—
0.49
—
2
—
4
—
3.1
—
—
—
1
—
—
50
— — 100
-100 — —
Total gate charge
— 39.4
—
Qgs
Gate-to-Source charge
— 18.3
—
Qgd
Gate-to-Drain("Miller") charge
— 8.9
—
td(on)
Turn-on delay time
— 54.3
—
VGS=10V, VDS =270V,
tr
Rise time
— 80.3
—
RL=15Ω,
td(off)
Turn-Off delay time
— 77.3
—
tf
Fall time
— 45.0
—
Ciss
Input capacitance
— 2360
—
Coss
Output capacitance
— 290
—
Crss
Reverse transfer capacitance
— 6
—
Ω
V
μA
nA
VGS = 0V, ID = 250μA
VGS=10V,ID = 9A
TJ = 125℃
VDS = VGS, ID = 250μA
TJ = 125℃
VDS = 500V,VGS = 0V
TJ = 125℃
VGS =30V
VGS = -30V
ID = 18A,
nC
VDS=400V,
VGS = 10V
nS
RGEN=25Ω
ID =18A
VGS = 0V
pF
VDS = 25V
ƒ = 400KHz
Source-Drain Ratings and Characteristics
Symbol
IS
ISM
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode)
Min.
Typ.
Max.
Units
—
—
18
A
—
—
72
A
Conditions
MOSFET symbol
showing the
integral reverse
p-n junction diode.
VSD
Diode Forward Voltage
—
0.92
1.3
V
IS=18A, VGS=0V
trr
Reverse Recovery Time
—
450
—
nS
TJ = 25°C, IF =18A, di/dt =
Qrr
Reverse Recovery Charge
—
6250
—
nC
100A/μs
©Silikron Semiconductor CO.,LTD.
2011.09.25
www.silikron.com Version : 1.0
page 2 of 8
SSF18N50F
Test circuits and Waveforms
Switch Waveforms:
Notes: ①The maximum current rating is limited by bond-wires.
②Repetitive rating; pulse width limited by max. junction temperature.
③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal
resistance.
④The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a
still air environment with TA =25°C
⑤These curves are based on the junction-to-case thermal impedence which is measured with the
device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=150°C.
⑥ The maximum current rating is limited by bond-wires.
©Silikron Semiconductor CO.,LTD.
2011.09.25
www.silikron.com Version : 1.0
page 3 of 8
SSF18N50F
Typical electrical and thermal characteristics
Figure 1: Typical Output Characteristics Figure 3. Drain-to-Source Breakdown Voltage vs.
Temperature
©Silikron Semiconductor CO.,LTD.
Figure 2. Gate to source cut-off voltage
2011.09.25
www.silikron.com Figure 4: Normalized On-Resistance Vs. Case
Temperature
Version : 1.0
page 4 of 8
SSF18N50F
Typical electrical and thermal characteristics Figure 5. Maximum Drain Current Vs. Case
Temperature
Figure 6.Typical Capacitance Vs. Drain-to-Source
Voltage
Figure7. Maximum Effective Transient Thermal Impedance, Junction-to-Case
©Silikron Semiconductor CO.,LTD.
2011.09.25
www.silikron.com Version : 1.0
page 5 of 8
SSF18N50F
Mechanical Data:
TO220F PACKAGE OUTLINE DIMENSION
Symbol
A
A1
A2
A3
B1
B2
B3
C
C1
C2
D
D1
D2
D3
E
E1
E2
E3
E4
Dimension In Millimeters
Min
Nom
Max
9.960
10.160
10.360
7.000
3.080
3.180
3.280
9.260
9.460
9.660
15.670
15.870
16.070
4.500
4.700
4.900
6.480
6.680
6.880
3.200
3.300
3.400
15.600
15.800
16.000
9.550
9.750
9.950
2.54 (TYP)
1.470
0.700
0.800
0.900
0.250
0.350
0.450
2.340
0.450
2.560
□
©Silikron Semiconductor CO.,LTD.
2.540
0.700
1.0*450
0.500
2.760
2.740
0.600
2.960
300
Dimension In Inches
Nom
0.400
0.000
0.125
0.372
0.625
0.185
0.263
0.130
0.622
0.384
1.00 (TYP)
0.028
0.031
0.010
0.014
Min
0.392
0.276
0.121
0.365
0.617
0.177
0.255
0.126
0.614
0.376
0.092
0.018
0.101
0.100
0.028
1.0*450
0.020
0.109
Max
0.408
0.000
0.129
0.380
0.633
0.193
0.271
0.134
0.630
0.392
0.058
0.035
0.018
0.108
0.024
0.117
300
2011.09.25
www.silikron.com Version : 1.0
page 6 of 8
SSF18N50F
Ordering and Marking Information
Device Marking: SSF18N50F
Package (Available)
TO220F
Operating Temperature Range
C : -55 to 150 ºC
Devices per Unit
Packag
e Type
Units/Tu Tubes/Inner
be
Box
TO220F
50
20
Reliability Test Program
Test Item
Conditions
High
Temperature
Reverse
Bias(HTRB)
High
Temperature
Gate
Bias(HTGB)
Units/Inner Inner
Box
Boxes/Carton
Box
1000
6
Duration
Sample Size
Tj=125℃ to 150℃ @
80% of Max
VDSS/VCES/VR
168 hours
500 hours
1000 hours
3 lots x 77 devices
Tj=150℃ @ 100% of
Max VGSS
168 hours
500 hours
1000 hours
3 lots x 77 devices
©Silikron Semiconductor CO.,LTD.
2011.09.25
www.silikron.com Version : 1.0
Units/Carton
Box
6000
page 7 of 8
SSF18N50F
ATTENTION:
■
■
■
■
■
■
■
■
■
Any and all Silikron products described or contained herein do not have specifications that can handle applications
that require extremely high levels of reliability, such as life-support systems, aircraft's control systems, or other
applications whose failure can be reasonably expected to result in serious physical and/or material damage.
Consult with your Silikron representative nearest you before using any Silikron products described or contained
herein in such applications.
Silikron assumes no responsibility for equipment failures that result from using products at values that exceed,
even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed
in products specifications of any and all Silikron products described or contained herein.
Specifications of any and all Silikron products described or contained herein stipulate the performance,
characteristics, and functions of the described products in the independent state, and are not guarantees of the
performance, characteristics, and functions of the described products as mounted in the customer’s products or
equipment. To verify symptoms and states that cannot be evaluated in an independent device, the customer
should always evaluate and test devices mounted in the customer’s products or equipment.
Silikron Semiconductor CO.,LTD. strives to supply high-quality high-reliability products. However, any and all
semiconductor products fail with some probability. It is possible that these probabilistic failures could give rise to
accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause
damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents or
events cannot occur. Such measures include but are not limited to protective circuits and error prevention circuits for
safe design, redundant design, and structural design.
In the event that any or all Silikron products(including technical data, services) described or contained herein are
controlled under any of applicable local export control laws and regulations, such products must not be exported
without obtaining the export license from the authorities concerned in accordance with the above law.
No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical,
including photocopying and recording, or any information storage or retrieval system, or otherwise, without the prior
written permission of Silikron Semiconductor CO.,LTD.
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not guaranteed for
volume production. Silikron believes information herein is accurate and reliable, but no guarantees are made or
implied regarding its use or any infringements of intellectual property rights or other rights of third parties.
Any and all information described or contained herein are subject to change without notice due to
product/technology improvement, etc. When designing equipment, refer to the "Delivery Specification" for the
Silikron product that you intend to use.
This catalog provides information as of Dec, 2008. Specifications and information herein are subject to change
without notice.
Customer Service
Worldwide Sales and Service:
[email protected]
Technical Support:
[email protected]
Suzhou Silikron Semiconductor Corp.
11A, 428 Xinglong Street, Suzhou Industrial Park, P.R.China
TEL: (86-512) 62560688
FAX: (86-512) 65160705
E-mail: [email protected]
©Silikron Semiconductor CO.,LTD.
2011.09.25
www.silikron.com Version : 1.0
page 8 of 8