INTERSIL 5962D9568802VGA

HS-2620RH, HS-2622RH
Data Sheet
Radiation Hardened, Very Wideband, High
Input Impedance Uncompensated
Operational Amplifiers
HS-2620RH and HS-2622RH are radiation hardened bipolar
operational amplifiers that feature very high input impedance
coupled with wideband AC performance. The high resistance
of the input stage is complemented by low offset voltage (4mV
Max at 25oC for HS-2620RH) and low bias and offset current
(15nA Max at 25oC for HS-2620RH) to facilitate accurate
signal processing. Offset voltage can be reduced further by
means of an external nulling potentiometer. Closed loop gains
greater than 5, the 25V/µs minimum slew rate at 25oC and the
100kV/V minimum open loop gain at 25oC, enables the
HS-2620RH to perform high gain amplification of very fast,
wideband signals. These dynamic characteristics, coupled
with fast settling times, make these amplifiers ideally suited to
pulse amplification designs as well as high frequency or video
applications. The frequency response of the amplifier can be
tailored to exact design requirements by means of an external
bandwidth control capacitor. Other high performance designs
such as high gain, low distortion audio amplifiers, high-Q and
wideband active filters and high speed comparators are
excellent uses of this part.
Specifications for Rad Hard QML devices are controlled
by the Defense Supply Center in Columbus (DSCC). The
SMD numbers listed here must be used when ordering.
Detailed Electrical Specifications for these devices are
contained in SMD 5962-95688. A “hot-link” is provided
on our homepage for downloading.
www.intersil.com/spacedefense/space.asp
August 1999
File Number
4014.1
Features
• Electrically Screened to SMD # 5962-95688
• QML Qualified per MIL-PRF-38535 Requirements
• High Input Impedance (HS-2620RH) . . . . . . . 65MΩ (Min)
• High Gain (HS-2620RH) . . . . . . . . . . . . . . . . 100kV/V (Min)
150kV/V (Typ)
• High Slew Rate (HS-2620RH) . . . . . . . . . . . . . . 25V/µs (Min)
35V/µs (Typ)
• Low Input Bias Current (HS-2620RH) . . . . . . . 15nA (Max)
5nA (Typ)
• Low Input Offset Voltage (HS-2620RH) . . . . . . 4mV (Max)
• Wide Gain Bandwidth Product (AV ≥ 5) . . . . . .100MHz (Typ)
• Output Short Circuit Protection
• Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 x 104 RAD(Si)
Applications
• Video and RF Amplifiers
• Pulse Amplifiers
• Audio Amplifiers and Filters
• High-Q Active Filters
• High Speed Comparators
Ordering Information
INTERNAL
MKT. NUMBER
ORDERING NUMBER
TEMP. RANGE
(oC)
5962D9568801VGA
HS2-2620RH-Q
-55 to 125
5962D9568801VPA
HS7-2620RH-Q
-55 to 125
5962D9568801VPC
HS7B-2620RH-Q
-55 to 125
5962D9568802VGA
HS2-2622RH-Q
-55 to 125
5962D9568802VPA
HS7-2622RH-Q
-55 to 125
5962D9568802VPC
HS7B-2622RH-Q
-55 to 125
Pinouts
HS7-2620RH, HS7-2622RH (CERDIP) GDIP1-T8
OR
HS7B-2620RH, HS7B-2622RH (SBDIP) CDIP2-T8
TOP VIEW
HS2-2620RH, HS2-2622RH (CAN) MACY1-X8
TOP VIEW
COMP
BAL
1
8
COMP
-IN
2
7
V+
+IN
3
6
OUT
V-
4
5
BAL
+
8
BAL
IN-
1
+
2
IN+
7
V+
6
5
3
OUT
BAL
4
V-
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
HS-2620RH, HS-2622RH
Test Circuit
400
1.6K
ACOUT
-1/10
+VCC
V1
0.1
100K
1
50pF (NOTE)
1 OPEN
S7
OPEN
1
3
RAL 2
ADJ
2
2 S3A
S1
2
1
S5A
1
OPEN 2
1
S2
S5B 1
+
S8
100
100
S3B
1
OPEN
OPEN 1
2
0.1
50
1
-
+
2
1
2
2K
VAC
+1
S9
OPEN
3
OPEN 2
100K 2
50K
500K
DUT
1 S6
FOR LOOP STABILITY,
USE MIN VALUE CAPACITOR
TO PREVENT OSCILLATION
BUFFER
V2
10K
-VEE
EOUT
x2
5K
2
S4
1
ALL RESISTORS = ±1% (Ω)
ALL CAPACITORS = ±10% (µF)
50K
NOTE: Includes stray capacitances.
FIGURE 1. TEST LOOP FOR THE HS-2620RH AND THE HS-2622RH
Test Circuits and Waveforms
VAC IN
VAC OUT
+
-
50Ω
1.6K
50pF
400Ω
FIGURE 2. SIMPLIFIED TEST CIRCUIT
+5.0V
+1.0V
+1.0V
INPUT
+5.0V
∆V
-5.0V
-5.0V
-1.0V
-1.0V
+SL
∆V
OUTPUT
-SL
∆T
SR =
∆V
∆T
∆T
FIGURE 3. SLEW RATE WAVEFORM
VFINAL = +200mV
+40mV
0V
INPUT
VPEAK
90%
0V
10%
OUTPUT
10%
0V
0V
90%
-40mV
tr, +OS
tf, -OS
tr
tf
NOTE: Measured on both positive and negative transitions. Capacitance at Compensation pin should be minimized.
FIGURE 4. OVERSHOOT, RISE AND FALL TIME WAVEFORMS
2
-200mV
VPEAK
HS-2620RH, HS-2622RH
Burn-In Circuits
HS7-2620RH CERDIP
HS7-2622RH CERDIP
1
2
R1
3
VD2
HS2-2620RH (TO-99) METAL CAN
HS2-2622RH (TO-99) METAL CAN
8
V+
7
+
6
4
C3
C
8
D1
1
5
+
2
C2
7
6
5
3
4
R1
C2
V-
NOTES:
1. R1 = 1MΩ, ±5%, 1/4W (Min)
2. C1 = C2 = 0.01µF/Socket (Min) of 0.1µF/Row (Min)
3. C3 = 0.01µF/Socket (10%)
4. D1 = D2 = IN4002 or Equivalent/Board
5. I(V+) - (V -)I = 31V ±1V
Irradiation Circuit
C
1
8
2
7
3
6
4
5
C
R
V2
C
GND
NOTES:
6. V1 = +15V ±10%
7. V2 = -15V ±10%
8. R = 1MΩ ±5%
9. C = 0.1µF ±10%
3
V1
D2
HS-2620RH, HS-2622RH
Schematic Diagram
COMPENSATION
V+
R1
1K
BAL
R2
4.18K
R3
1.56K
R4
1.56K
R5
600
C2
9pF
BAL
R6
30
Q60
Q1
Q40
Q2
Q3
Q61
Q39
Q41
Q38
Q4
Q42
Q37
Q6
Q5
Q7
+INPUT
Q11
Q8
Q30
Q31
Q36
Q29
Q28
Q32
Q59
Q58
Q35
Q43
Q33
Q57
Q9
Q44
Q10
Q26
Q25
Q55
Q54
Q56
R18
30
Q53
R17
30
OUT
Q13
Q12
Q17
Q18
Q16
Q45
Q24
Q27
Q15
Q47
Q46
R7
1.35
R19
2.5K
Q52
R11
4.0K
Q19
Q22
Q21
Q48
Q23
RP1
R8
1K
Q49
Q50
R9
4.5K
Q20
R10
2.0K
Q51
C1
16pF
R12
1.6K
R13
1.6K
R14
2.8K
R15
800
R16
30
V-
-INPUT
4
HS-2620RH, HS-2622RH
Die Characteristics
DIE DIMENSIONS:
ASSEMBLY RELATED INFORMATION:
69 mils x 66 mils x 19 mils ±1 mil
1750µm x 1420µm x 483µm ±25.4µm
Substrate Potential (Powered Up):
Unbiased
INTERFACE MATERIALS:
ADDITIONAL INFORMATION:
Glassivation:
Worst Case Current Density:
Type: Nitride (S13N4) over Silox (SiO2, 5% Phos.)
Silox Thickness: 12kÅ ±2kÅ
Nitride Thickness: 3.5kÅ ±1.5kÅ
<2 x 105 A/cm2
Transistor Count:
Top Metallization:
HS-2620RH: 140
HS-2622RH: 140
Type: Al, 1% Cu
Thickness: 18kÅ ±2kÅ
Substrate:
Linear Bipolar, DI
Backside Finish:
Silicon
Metallization Mask Layout
HS-2620RH, HS-2622RH
COMP
V+
BAL
OUT
-IN
+IN
BAL
V-
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Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
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