SO D1 23F BAS116H Low leakage switching diode Rev. 3 — 31 May 2011 Product data sheet 1. Product profile 1.1 General description Low leakage switching diode, encapsulated in a SOD123F small and flat lead Surface-Mounted Device (SMD) plastic package. 1.2 Features and benefits Small and flat lead SMD plastic package Low leakage current Excellent coplanarity and improved thermal behavior AEC-Q101 qualified 1.3 Applications General-purpose switching 1.4 Quick reference data Table 1. Quick reference data Symbol Parameter IF forward current IR reverse current VR reverse voltage trr reverse recovery time Conditions [1][2] VR = 75 V [3] Min Typ Max Unit - - 215 mA - 0.003 5.0 nA - - 75 V - 0.8 3.0 s [1] Pulse test: tp 300 s; 0.02. [2] Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated and standard footprint. [3] When switched from IF = 10 mA to IR = 10 mA; RL = 100 ; measured at IR = 1 mA. 2. Pinning information Table 2. Pinning Pin Description 1 cathode 2 anode Simplified outline Graphic symbol [1] 1 1 2 2 sym001 [1] The marking bar indicates the cathode. BAS116H NXP Semiconductors Low leakage switching diode 3. Ordering information Table 3. Ordering information Type number BAS116H Package Name Description Version - plastic surface-mounted package; 2 leads SOD123F 4. Marking Table 4. Marking codes Type number Marking code BAS116H B1 5. Limiting values Table 5. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions VRRM repetitive peak reverse voltage VR reverse voltage IF forward current IFRM repetitive peak forward current IFSM non-repetitive peak forward current total power dissipation Ptot Min Max Unit - 85 V - 75 V - 215 mA - 500 mA tp = 1 s - 4 A tp = 1 ms - 1 A tp = 1 s - 0.5 A - 375 mW [1][2] square wave Tamb 25 C [3] [1][4] [5] BAS116H Product data sheet Tj junction temperature - 150 C Tamb ambient temperature 65 +150 C Tstg storage temperature 65 +150 C [1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint. [2] Pulse test: tp 300 s; 0.02. [3] Tj = 25 C prior to surge. [4] Reflow soldering is the only recommended soldering method. [5] Soldering point of cathode tab. All information provided in this document is subject to legal disclaimers. Rev. 3 — 31 May 2011 © NXP B.V. 2011. All rights reserved. 2 of 10 BAS116H NXP Semiconductors Low leakage switching diode 6. Thermal characteristics Table 6. Thermal characteristics Symbol Parameter Conditions Rth(j-a) thermal resistance from junction to ambient Rth(j-sp) thermal resistance from junction to solder point in free air Min Typ Max Unit [1][2] - - 330 K/W [3] - - 70 K/W [1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint. [2] Reflow soldering is the only recommended soldering method. [3] Soldering point of cathode tab. 7. Characteristics Table 7. Characteristics Tamb = 25 C unless otherwise specified. Symbol Parameter VF forward voltage IR BAS116H Product data sheet Conditions reverse current Cd diode capacitance trr reverse recovery time Min Typ Max Unit IF = 1 mA - - 0.90 V IF = 10 mA - - 1.00 V IF = 50 mA - - 1.10 V IF = 150 mA - - 1.25 V VR = 75 V - 0.003 5.0 nA VR = 75 V; Tj = 150 C - 3 80.0 nA - 2 - pF - 0.8 3.0 s [1] VR = 0 V; f = 1 MHz [2] [1] Pulse test: tp 300 s; 0.02. [2] When switched from IF = 10 mA to IR = 10 mA; RL = 100 ; measured at IR = 1 mA. All information provided in this document is subject to legal disclaimers. Rev. 3 — 31 May 2011 © NXP B.V. 2011. All rights reserved. 3 of 10 BAS116H NXP Semiconductors Low leakage switching diode mlb752 300 mbg704 102 IF (mA) IFSM (A) 10 200 (1) (2) (3) 1 100 10−1 0 0 0.4 0.8 1.2 VF (V) 1.6 1 10 102 103 104 tp (μs) (1) Tamb = 150 C; typical values Based on square wave currents (2) Tamb = 25 C; typical values Tj = 25 C; prior to surge (3) Tamb = 25 C; maximum values Fig 1. Forward current as a function of forward voltage Fig 2. mlb754 102 Non-repetitive peak forward current as a function of pulse duration; maximum values mbg526 2 IR (nA) (1) 10 Cd (pF) 1 1 10−1 (2) 10−2 10−3 0 0 50 100 150 Tj (°C) 200 0 5 10 15 VR (V) 20 Tamb = 25 C; f = 1 MHz VR = 75 V (1) Maximum values (2) Typical values Fig 3. Reverse current as a function of junction temperature BAS116H Product data sheet Fig 4. Diode capacitance as a function of reverse voltage; typical values All information provided in this document is subject to legal disclaimers. Rev. 3 — 31 May 2011 © NXP B.V. 2011. All rights reserved. 4 of 10 BAS116H NXP Semiconductors Low leakage switching diode 8. Test information tr tp t D.U.T. 10 % + IF IF RS = 50 Ω SAMPLING OSCILLOSCOPE trr t Ri = 50 Ω V = VR + IF × RS VR (1) 90 % mga881 input signal output signal (1) IR = 1 mA Fig 5. Reverse recovery time test circuit and waveforms 8.1 Quality information This product has been qualified in accordance with the Automotive Electronics Council (AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in automotive applications. 9. Package outline 1.7 1.5 1.2 1.0 1 0.55 0.35 3.6 3.4 2.7 2.5 2 0.70 0.55 0.25 0.10 Dimensions in mm Fig 6. 04-11-29 Package outline SOD123F 10. Packing information Table 8. Packing methods The -xxx numbers are the last three digits of the 12NC ordering code.[1] Type number BAS116H [1] BAS116H Product data sheet Package SOD123F Description 4 mm pitch, 8 mm tape and reel Packing quantity 3000 10000 -115 -135 For further information and the availability of packing methods, see Section 14. All information provided in this document is subject to legal disclaimers. Rev. 3 — 31 May 2011 © NXP B.V. 2011. All rights reserved. 5 of 10 BAS116H NXP Semiconductors Low leakage switching diode 11. Soldering Footprint information for reflow soldering of plastic surface-mounted, 2 leads package SOD123F 4.4 2.9 2.8 1.1 1.2 (2×) (2×) 2.1 1.6 1.1 (2×) 1.2 (2×) solder land solder land plus solder paste solder paste deposit solder resist occupied area Dimensions in mm sod123f_fr Reflow soldering is the only recommended soldering method. Fig 7. Reflow soldering footprint SOD123F BAS116H Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 31 May 2011 © NXP B.V. 2011. All rights reserved. 6 of 10 BAS116H NXP Semiconductors Low leakage switching diode 12. Revision history Table 9. Revision history Document ID Release date Data sheet status Change notice Supersedes BAS116H v.3 20110531 Product data sheet - BAS116H v.2 Modifications: • • • • • • • Section 1 “Product profile”: updated. Table 5 and 6: updated. Table 7: VF values changed from mV to V. Figure 2: updated. Section 8.1 “Quality information”: added. Figure 7: updated. Section 13 “Legal information”: updated. BAS116H v.2 20091214 Product data sheet - BAS116H v.1 BAS116H v.1 20050411 Product data sheet - - BAS116H Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 31 May 2011 © NXP B.V. 2011. All rights reserved. 7 of 10 BAS116H NXP Semiconductors Low leakage switching diode 13. Legal information 13.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 13.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification — The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. 13.3 Disclaimers Limited warranty and liability — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation - lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory. Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors. malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product design. It is customer’s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer’s applications and products planned, as well as for the planned application and use of customer’s third party customer(s). Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in life support, life-critical or safety-critical systems or equipment, nor in applications where failure or Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. BAS116H Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 31 May 2011 © NXP B.V. 2011. All rights reserved. 8 of 10 BAS116H NXP Semiconductors Low leakage switching diode Quick reference data — The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding. 13.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 14. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] BAS116H Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 3 — 31 May 2011 © NXP B.V. 2011. All rights reserved. 9 of 10 BAS116H NXP Semiconductors Low leakage switching diode 15. Contents 1 1.1 1.2 1.3 1.4 2 3 4 5 6 7 8 8.1 9 10 11 12 13 13.1 13.2 13.3 13.4 14 15 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1 General description . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Quick reference data . . . . . . . . . . . . . . . . . . . . 1 Pinning information . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2 Thermal characteristics . . . . . . . . . . . . . . . . . . 3 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Test information . . . . . . . . . . . . . . . . . . . . . . . . . 5 Quality information . . . . . . . . . . . . . . . . . . . . . . 5 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 5 Packing information . . . . . . . . . . . . . . . . . . . . . 5 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . 7 Legal information. . . . . . . . . . . . . . . . . . . . . . . . 8 Data sheet status . . . . . . . . . . . . . . . . . . . . . . . 8 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Contact information. . . . . . . . . . . . . . . . . . . . . . 9 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2011. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 31 May 2011 Document identifier: BAS116H