CAT6095 D

CAT6095
Digital Output Temperature
Sensor
Description
The CAT6095 is a JEDEC JC42.4 compliant Temperature Sensor
designed for general purpose temperature measurements requiring a
digital output.
The CAT6095 measures temperature at least 10 times every second.
Temperature readings can be retrieved by the host via the serial
interface, and are compared to high, low and critical trigger limits
stored into internal registers. Over or under limit conditions can be
signaled on the open−drain EVENT pin.
The CAT6095 is packaged in space saving TDFN package with
exposed backside die attach pads (DAP). The exposed DAP reduces
overall thermal resistance, thus providing faster response to thermal
changes when compared to SOIC, TSSOP or SOT packages.
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TDFN−8
VP2 SUFFIX
CASE 511AK
PIN CONFIGURATION
A0
Features
•
•
•
•
•
•
•
•
JEDEC JC42.4 Compliant Temperature Sensor
Temperature Range: −40°C to +125°C
Supply Range: 3.3 V ± 10%
I2C / SMBus Interface
Schmitt Triggers and Noise Suppression Filters on SCL and SDA
Inputs
Low Power CMOS Technology
2 x 3 x 0.75 mm TDFN Package
These Devices are Pb−Free and are RoHS Compliant
CAT6095
A2, A1, A0
EVENT
A2
SCL
VSS
SDA
(Top View)
For the location of Pin 1, please consult the
corresponding package drawing.
MARKING DIAGRAM
HMC
ALL
YM
G
HMC
A
LL
Y
M
G
EVENT
VCC
A1
VCC
SCL
1
= Specific Device Code
= Assembly Location Code
= Assembly Lot Number (Last Two Digits)
= Production Year (Last Digit)
= Production Month (1 − 9, O, N, D)
= Pb−Free Package
PIN FUNCTIONS
SDA
Pin Name
A0, A1, A2
VSS
Figure 1. Functional Symbol
Function
Device Address Input
SDA
Serial Data Input/Output
SCL
Serial Clock Input
EVENT
Open−drain Event Output
VCC
Power Supply
VSS
Ground
DAP
Backside Exposed DAP at VSS
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 15 of this data sheet.
© Semiconductor Components Industries, LLC, 2011
May, 2011 − Rev. 5
1
Publication Order Number:
CAT6095/D
CAT6095
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameter
Rating
Units
Operating Temperature
−45 to +130
°C
Storage Temperature
−65 to +150
°C
Voltage on any pin with respect to Ground (Note 1)
−0.5 to +6.5
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. The A0 pin can be raised to a HV level compatible
with the use of a DDR3 SPD device sharing the bus with the TS. SCL and SDA inputs can be raised to the maximum limit, irrespective of VCC.
Table 2. TEMPERATURE CHARACTERISTICS (VCC = 3.3 V ± 10%, TA = −40°C to +125°C, unless otherwise specified)
Parameter
Temperature Reading Error
Class B, JC42.4 compliant
Test Conditions/Comments
Max
Unit
+75°C ≤ TA ≤ +95°C, active range
±1.0
°C
+40°C ≤ TA ≤ +125°C, monitor range
±2.0
°C
−20°C ≤ TA ≤ +125°C, sensing range
±3.0
°C
12
Bits
0.0625
°C
100
ms
92
°C/W
ADC Resolution
Temperature Resolution
Temperature Conversion Time
Thermal Resistance (Note 2) qJA
Junction−to−Ambient (Still Air)
2. Power Dissipation is defined as PJ = (TJ − TA)/qJA, where TJ is the junction temperature and TA is the ambient temperature. The thermal
resistance value refers to the case of a package being used on a standard 2−layer PCB.
Table 3. D.C. OPERATING CHARACTERISTICS (VCC = 3.3 V ± 10%, TA = −40°C to +125°C, unless otherwise specified)
Symbol
ICC
Parameter
Supply Current
ISHDN
IL
I/O Pin Leakage Current
Test Conditions/Comments
Min
Max
Unit
TS active
200
mA
TS shut−down; no bus activity
10
mA
2
mA
VIL
Input Low Voltage
Pin at GND or VCC
−0.5
0.3 x VCC
V
VIH
Input High Voltage
0.7 x VCC
VCC + 0.5
V
VOL
Output Low Voltage
0.4
V
IOL = 3 mA, VCC > 2.5 V
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CAT6095
Table 4. A.C. CHARACTERISTICS (VCC = 3.3 V ± 10%, TA = −40°C to +125°C) (Note 3)
Symbol
Min
Max
Units
Clock Frequency
10
400
kHz
tHIGH
High Period of SCL Clock
600
ns
tLOW
Low Period of SCL Clock
1300
ns
FSCL (Note 4)
tTIMEOUT (Note 4)
Parameter
35
ms
tR (Note 5)
SMBus SCL Clock Low Timeout
SDA and SCL Rise Time
300
ns
tF (Note 5)
SDA and SCL Fall Time
300
ns
tSU:DAT (Note 6)
Data Setup Time
tHD:DAT (Note 5)
Data Hold Time (for Input Data)
25
100
ns
0
ns
Data Hold Time (for Output Data)
300
900
ns
tSU:STA
START Condition Setup Time
600
ns
tHD:STA
START Condition Hold Time
600
ns
tSU:STO
STOP Condition Setup Time
600
ns
tBUF
Bus Free Time Between STOP and START
1300
ns
Ti
Noise Pulse Filtered at SCL and SDA Inputs
100
ns
Power−up Delay to Valid Temperature Recording
100
ms
tPU (Note 7)
3. Timing reference points are set at 30%, respectively 70% of VCC, as illustrated in Figure 11. Bus loading must be such as to allow meeting
the VIL, VOL as well as the various timing limits.
4. The TS interface will reset itself and will release the SDA line if the SCL line stays low beyond the tTIMEOUT limit. The time−out count is started
(and then re−started) on every negative transition of SCL in the time interval between START and STOP.
5. In a “Wired−OR” system (such as I2C or SMBus), SDA rise time is determined by bus loading. Since each bus pull−down device must be
able to sink the (external) bus pull−up current (in order to meet the VIL and/or VOL limits), it follows that SDA fall time is inherently faster than
SDA rise time. SDA rise time can exceed the standard recommended tR limit, as long as it does not exceed tLOW − tHD:DAT − tSU:DAT, where
tLOW and tHD:DAT are actual values (rather than spec limits). A shorter tHD:DAT leaves more room for a longer SDA tR, allowing for a more
capacitive bus or a larger bus pull−up resistor. At the minimum tLOW spec limit of 1300 ns, the maximum tHD:DAT of 900 ns demands a
maximum SDA tR of 300 ns. The CAT6095’s maximum tHD:DAT is <700 ns, thus allowing for an SDA tR of up to 500 ns at minimum tLOW.
6. The minimum tSU:DAT of 100 ns is a limit recommended by standards. The TS will accept a tSU:DAT of 0 ns.
7. The first valid temperature recording can be expected after tPU at nominal supply voltage.
Table 5. PIN CAPACITANCE (TA = 25°C, VCC = 3.3 V, f = 1 MHz)
Symbol
CIN
Max
Unit
SDA, EVENT Pin Capacitance
Parameter
Test Conditions/Comments
VIN = 0
8
pF
Input Capacitance (other pins)
VIN = 0
6
pF
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Min
CAT6095
TYPICAL PERFORMANCE CHARACTERISTICS
300
5
250
4
200
3
ISHDN (mA)
ICC (mA)
(VCC = 3.3 V, TA = −25°C to +125°C, unless otherwise specified.)
150
2
100
1
50
0
0
−25
0
25
50
75
100
−1
−25
125
0
25
TAMB (°C)
Figure 2. Active Current
Idle)
70
Part # 2
1
TCONV (ms)
DT (°C)
125
80
2
0
−1
Part # 1
−2
60
50
40
30
−3
0
25
50
75
100
20
−25
125
0
25
50
75
100
TAMB (°C)
TAMB (°C)
Figure 4. Temperature Read−Out Error
Figure 5. A/D Conversion Time
3.0
125
40
2.6
35
tTIMEOUT (ms)
VTH (V)
100
Figure 3. Standby Current
(I2C−bus Idle, TS Shut−down)
3
2.2
1.8
30
25
1.4
1.0
−25
75
TAMB (°C)
(I2C−bus
4
−4
−25
50
0
25
50
75
100
20
−25
125
0
25
50
75
100
TAMB (°C)
TAMB (°C)
Figure 6. POR Threshold Voltage
Figure 7. SMBus SCL Clock Low Timeout
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125
CAT6095
Pin Description
SCL: The Serial Clock input pin accepts the Serial Clock
generated by the Master (Host).
SDA: The Serial Data I/O pin receives input data and
transmits data stored in the internal registers. In transmit
mode, this pin is open drain. Data is acquired on the positive
edge, and is delivered on the negative edge of SCL.
A0, A1 and A2: The Address pins set the device address.
These pins have on−chip pull−down resistors.
EVENT: The open−drain EVENT pin can be programmed
to signal over/under temperature limit conditions.
connect to the bus via their respective SCL and SDA pins.
The transmitting device pulls down the SDA line to
‘transmit’ a ‘0’ and releases it to ‘transmit’ a ‘1’.
Data transfer may be initiated only when the bus is not
busy (see A.C. Characteristics).
During data transfer, the SDA line must remain stable
while the SCL line is HIGH. An SDA transition while SCL
is HIGH will be interpreted as a START or STOP condition
(Figure 8).
START
The START condition precedes all commands. It consists
of a HIGH to LOW transition on SDA while SCL is HIGH.
The START acts as a ‘wake−up’ call to all Slaves. Absent a
START, a Slave will not respond to commands.
Power−On Reset
The CAT6095 incorporates Power−On Reset (POR)
circuitry which monitors the supply voltage, and then resets
(initializes) the internal state machine below a POR trigger
level of approximately 2.0 V, i.e. well below the minimum
recommended VCC value.
The temperature sensor (TS) powers-up into conversion
mode. The internal state machine will operate properly
above the POR trigger level, but valid temperature readings
can be expected only after the first conversion cycle started
and completed at nominal supply voltage.
STOP
The STOP condition completes all commands. It consists
of a LOW to HIGH transition on SDA while SCL is HIGH.
The STOP tells the Slave that no more data will be written
to or read from the Slave.
Device Addressing
The Master initiates data transfer by creating a START
condition on the bus. The Master then broadcasts an 8−bit
serial Slave address. The first 4 bits of the Slave address (the
preamble) select the Temperature Sensor (TS preamble =
0011) as shown in Figure 9. The next 3 bits, A2, A1 and A0,
select one of 8 possible TS Slave devices. The last bit, R/W,
specifies whether a Read (1) or Write (0) operation is being
performed.
Device Interface
The CAT6095 supports I2C and SMBus data transmission
protocols. These protocols describe serial communication
between transmitters and receivers sharing a 2−wire data
bus. Data flow is controlled by a Master device, which
generates the serial clock and the START and STOP
conditions. The CAT6095 acts as a Slave device. Master and
Slave alternate as transmitter and receiver. Up to 8 CAT6095
devices may be present on the bus simultaneously, and can
be individually addressed by matching the logic state of the
address inputs A0, A1, and A2.
Acknowledge
A matching Slave address is acknowledged (ACK) by the
Slave by pulling down the SDA line during the 9th clock
cycle (Figure 10). After that, the Slave will acknowledge all
data bytes sent to the bus by the Master. When the Slave is
the transmitter, the Master will in turn acknowledge data
bytes in the 9th clock cycle. The Slave will stop transmitting
after the Master does not respond with acknowledge
(NoACK) and then issues a STOP. Bus timing is illustrated
in Figure 11.
I2C/SMBus Protocol
The I2C/SMBus uses two ‘wires’, one for clock (SCL) and
one for data (SDA). The two wires are connected to the VCC
supply via pull−up resistors. Master and Slave devices
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CAT6095
SDA
SCL
START BIT
STOP BIT
Figure 8. Start/Stop Timing
TEMPERATURE SENSOR
0
0
1
1
PREAMBLE
A2
A1
A0
R/W
DEVICE ADDRESS
Figure 9. Slave Address Bits
SCL FROM
MASTER
1
8
9
DATA OUTPUT
FROM TRANSMITTER
DATA OUTPUT
FROM RECEIVER
START
ACKNOWLEDGE
Figure 10. Acknowledge Timing
tF
SCL
tHIGH
tR
70%
30%
70%
tSU:STA
SDA
tLOW
tHD:STA
70%
30%
70%
30%
70%
tHD:DAT
tSU:STO
tSU:DAT
70%
30%
30%
70%
tBUF
Figure 11. Bus Timing
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70%
CAT6095
Write Operations
Read Operations
Temperature Sensor Register Write
Immediate Read
To write data to a TS register the Master creates a START
condition on the bus, and then sends out the appropriate
Slave address (with the R/W bit set to ‘0’), followed by an
address byte and two data bytes. The matching Slave will
acknowledge the Slave address, TS register address and the
TS register data (Figure 12). The Master then ends the
session by creating a STOP condition on the bus. The STOP
completes the TS register update. Note that all registers in
the TS are ‘volatile’ meaning any data contained in them is
lost when power is removed from the chip.
Upon power-up, the Temperature Sensor (TS) address
counter is initialized to 00h. The TS address counter will
thus point to the Capability Register. This address counter
may be updated by subsequent operations.
A CAT6095 presented with a Slave address containing a
‘1’ in the R/W position will acknowledge the Slave address
and will then start transmitting data being pointed at by the
current TS register address counter. The Master stops this
transmission by responding with NoACK, followed by a
STOP (Figure 13).
Selective Read
The Read operation can be started at an address different
from the one stored in the address counter, by preceding the
Immediate Read sequence with a ‘data less’ Write operation.
The Master sends out a START, Slave address and address
byte, but rather than following up with data (as in a Write
operation), the Master then issues another START and
continuous with an Immediate Read sequence (Figure 14).
BUS ACTIVITY:
MASTER
SDA LINE
S
T
A
R
T
SLAVE
ADDRESS
REGISTER
ADDRESS
DATA (MSB)
S
T
O
P
DATA (LSB)
S
P
A
C
K
SLAVE
A
C
K
A
C
K
A
C
K
Figure 12. Temperature Sensor Register Write
BUS ACTIVITY:
MASTER
SDA LINE
S
T
A
R
T
N
OS
AT
CO
KP
A
C
K
SLAVE
ADDRESS
S
P
A
C
K
SLAVE
DATA (MSB)
DATA (LSB)
Figure 13. Immediate Read
BUS ACTIVITY:
MASTER
SDA LINE
SLAVE
S
T
A
R
T
S
T
A
R
T
REGISTER
ADDRESS
SLAVE
ADDRESS
S
SLAVE
ADDRESS
N
OS
AT
CO
KP
A
C
K
S
A
C
K
P
A
C
K
A
C
K
Figure 14. Selective Read
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DATA (MSB)
DATA (LSB)
CAT6095
Temperature Sensor Operation
The CAT6095 temperature sensor (TS) combines a
Proportional to Absolute Temperature (PTAT) sensor with
a S−D modulator, yielding a 12 bit plus sign digital
temperature representation.
The TS runs on an internal clock, and starts a new
conversion cycle at least every 100 ms. The result of the
most recent conversion is stored in the Temperature Data
Register (TDR), and remains there following a TS
Shut−Down. Reading from the TDR does not interfere with
the conversion cycle.
The value stored in the TDR is compared against limits
stored in the High Limit Register (HLR), the Low Limit
Register (LLR) and/or Critical Temperature Register
(CTR). If the measured value is outside the alarm limits or
above the critical limit, then the EVENT pin may be
asserted. The EVENT output function is programmable, via
the Configuration Register for interrupt mode, comparator
mode and polarity.
The temperature limit registers can be Read or Written by
the host, via the serial interface. At power−on, all the
(writable) internal registers default to 0x0000, and should
therefore be initialized by the host to the desired values. The
EVENT output starts out disabled (corresponding to
polarity active low); thus preventing irrelevant event bus
activity before the limit registers are initialized. While the
TS is enabled (not shut−down), event conditions are
normally generated by a change in measured temperature as
recorded in the TDR, but limit changes can also trigger
events as soon as the new limit creates an event condition,
i.e. asynchronously with the temperature sampling activity.
In order to minimize the thermal resistance between
sensor and PCB, it is recommended that the exposed
backside die attach pad (DAP) be soldered to the PCB
ground plane.
Registers
The CAT6095 contains eight 16−bit wide registers
allocated to TS functions, as shown in Table 6. Upon
power−up, the internal address counter points to the
capability register.
Capability Register (User Read Only)
This register lists the capabilities of the TS, as detailed in
the corresponding bit map.
Configuration Register (Read/Write)
This register controls the various operating modes of the
TS, as detailed in the corresponding bit map.
Temperature Trip Point Registers (Read/Write)
The CAT6095 features 3 temperature limit registers, the
HLR, LLR and CLR mentioned earlier. The temperature
value recorded in the TDR is compared to the various limit
values, and the result is used to activate the EVENT pin. To
avoid undesirable EVENT pin activity, this pin is
automatically disabled at power−up to allow the host to
initialize the limit registers and the converter to complete the
first conversion cycle under nominal supply conditions.
Data format is two’s complement with the LSB representing
0.25°C, as detailed in the corresponding bit maps.
Temperature Data Register (User Read Only)
This register stores the measured temperature, as well as
trip status information. B15, B14 and B13 are the trip status
bits, representing the relationship between measured
temperature and the 3 limit values; these bits are not affected
by EVENT status or by Configuration register settings.
Measured temperature is represented by bits B12 to B0. Data
format is two’s complement, where B12 represents the sign,
B11 represents 128°C, etc. and B0 represents 0.0625°C.
Manufacturer ID Register (Read Only)
The manufacturer ID assigned by the PCI−SIG trade
organization to the CAT6095 device is 0x1B09.
Device ID and Revision Register (Read Only)
This register contains manufacturer specific device ID
and device revision information.
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CAT6095
Table 6. TEMPERATURE SENSOR REGISTERS
Register Address
Register Name
Power−On Default
Read/Write
0x00
Capability Register
0x007F
Read
0x01
Configuration Register
0x0000
Read/Write
0x02
High Limit Register
0x0000
Read/Write
0x03
Low Limit Register
0x0000
Read/Write
0x04
Critical Limit Register
0x0000
Read/Write
0x05
Temperature Data Register
Undefined
Read
0x06
Manufacturer ID Register
0x1B09
Read
0x07
Device ID/Revision Register
0x0813
Read
−
−
0x08 −
Reserved
Table 7. CAPABILITY REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
RFU
RFU
RFU
RFU
RFU
RFU
RFU
RFU
B7
B6
B5
B4
B3
B2
B1
B0
EVSD
TMOUT
RFU
RANGE
ACC
EVENT
TRES [1:0]
Bit
B15:B8
B7 (Note 8)
Description
Reserved for future use; can not be written; should be ignored; will typically read as 0
0:
1:
Configuration register bit 4 is frozen upon setting Configuration register bit 8
(i.e. a TS shut−down freezes the EVENT output)
Configuration register bit 4 is cleared upon setting Configuration register bit 8
(i.e. a TS shut−down de−asserts the EVENT output)
B6
0:
1:
The TS implements SMBus time−out within the range 10 to 60 ms
The TS implements SMBus time−out within the range 25 to 35 ms
B5
0:
1:
Pin A0 VHV compliance required for RSWP/SPD compatibility not explicitly stated
Pin A0 VHV compliance required for RSWP/SPD compatibility explicitly stated
B4:B3
00:
01:
10:
11:
LSB = 0.50°C (9 bit resolution)
LSB = 0.25°C (10 bit)
LSB = 0.125°C (11 bit)
LSB = 0.0625°C (12 bit)
B2
0:
1:
Positive Temperature Only
Positive and Negative Temperature
B1
0:
1:
±2°C over the active range and ±3°C over the operating range (Class C)
±1°C over the active range and ±2°C over the monitor range (Class B)
B0
0:
1:
Critical Temperature only
Alarm and Critical Temperature
8. Configuration Register bit 4 can be cleared (but not set) after Configuration Register bit 8 is set, by writing a “1” to Configuration Register
bit 5 (i.e. the EVENT output can be de-asserted during TS shut-down periods)
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CAT6095
Table 8. CONFIGURATION REGISTER
B15
B14
B13
B12
B11
RFU
RFU
RFU
RFU
RFU
B7
B6
B5
B4
B3
B2
B1
B0
TCRIT_LOCK
EVENT_LOCK
CLEAR
EVENT_STS
EVENT_CTRL
TCRIT_ONLY
EVENT_POL
EVENT_MODE
Bit
B15:B11
B10
B9
HYST [1:0]
B8
SHDN
Description
Reserved for future use; can not be written; should be ignored; will typically read as 0
B10:B9 (Note 9)
00:
01:
10:
11:
Disable hysteresis
Set hysteresis at 1.5°C
Set hysteresis at 3°C
Set hysteresis at 6°C
B8 (Note 13)
0:
1:
Thermal Sensor is enabled; temperature readings are updated at sampling rate
Thermal Sensor is shut down; temperature reading is frozen to value recorded before SHDN
B7 (Note 12)
0:
1:
Critical trip register can be updated
Critical trip register cannot be modified; this bit can be cleared only at POR
B6 (Note 12)
0:
1:
Alarm trip registers can be updated
Alarm trip registers cannot be modified; this bit can be cleared only at POR
B5 (Note 11)
0:
1:
Always reads as 0 (self−clearing)
Writing a 1 to this position clears an event recording in interrupt mode only
B4 (Note 10)
0:
1:
EVENT output pin is not being asserted
EVENT output pin is being asserted
B3 (Note 9)
0:
1:
EVENT output disabled; polarity dependent: open−drain for bit B1 = 0 and grounded for B1 = 1
EVENT output enabled
B2 (Note 15)
0:
1:
event condition triggered by alarm or critical temperature limit crossing
event condition triggered by critical temperature limit crossing only
B1 (Notes 9, 14)
0:
1:
EVENT output active low
EVENT output active high
B0 (Note 9)
0:
1:
Comparator mode
Interrupt mode
9. Can not be altered (set or cleared) as long as either one of the two lock bits, B6 or B7 is set.
10. This bit is a polarity independent ‘software’ copy of the EVENT pin, i.e. it is under the control of B3.
11. Writing a ‘1’ to this bit clears an event condition in Interrupt mode, but has no effect in comparator mode. When read, this bit always returns
0. Once the measured temperature exceeds the critical limit, setting this bit has no effect (see Figure 12).
12. Cleared at power-on reset (POR). Once set, this bit can only be cleared by a POR condition.
13. The TS powers up into active mode, i.e. this bit is cleared at power-on reset (POR). When the TS is shut down the ADC is disabled and the
temperature reading is frozen to the most recently recorded value. The TS can not be shut down (B8 can not be set) as long as either one
of the two lock bits, B6 or B7 is set. However, the bit can be cleared at any time.
14. The EVENT output is “open-drain” and requires an external pull-up resistor for either polarity. The “natural” polarity is “active low”, as it allows
“wired-or” operation on the EVENT bus.
15. Can not be set as long as lock bit B6 is set.
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CAT6095
Table 9. HIGH LIMIT REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
0
0
0
Sign
128°C
64°C
32°C
16°C
B7
B6
B5
B4
B3
B2
B1
B0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
0
0
Table 10. LOW LIMIT REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
0
0
0
Sign
128°C
64°C
32°C
16°C
B7
B6
B5
B4
B3
B2
B1
B0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
0
0
Table 11. TCRIT LIMIT REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
0
0
0
Sign
128°C
64°C
32°C
16°C
B7
B6
B5
B4
B3
B2
B1
B0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
0
0
Table 12. TEMPERATURE DATA REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
TCRIT
HIGH
LOW
Sign
128°C
64°C
32°C
16°C
B7
B6
B5
B4
B3
B2
B1
B0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
(Note 16)
0.125°C
(Note 16)
0.0625°C
(Note 16)
16. When applicable (as defined by Capability bit TRES), unsupported bits will read as 0
Bit
Description
B15
0: Temperature is below the TCRIT limit
1: Temperature is equal to or above the TCRIT limit
B14
0: Temperature is equal to or below the High limit
1: Temperature is above the High limit
B13
0: Temperature is equal to or above the Low limit
1: Temperature is below the Low limit
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CAT6095
Register Data Format
The values used in the temperature data register and the 3
temperature trip point registers are expressed in two’s
complement format. The measured temperature value is
expressed with 12−bit resolution, while the 3 trip
temperature limits are set with 10−bit resolution. The total
temperature range is arbitrarily defined as 256°C, thus
yielding an LSB of 0.0625°C for the measured temperature
and 0.25°C for the 3 limit values. Bit B12 in all temperature
registers represents the sign, with a ‘0’ indicating a positive,
and a ‘1’ a negative value. In two’s complement format,
negative values are obtained by complementing their
positive counterpart and adding a ‘1’, so that the sum of
opposite signed numbers, but of equal absolute value, adds
up to zero.
Note that trailing ‘0’ bits, are ‘0’ irrespective of polarity.
Therefore the don’t care bits (B1 and B0) in the 10−bit
resolution temperature limit registers, are always ‘0’.
Event Pin Functionality
The EVENT output reacts to temperature changes as
illustrated in Figure 15, and according to the operating mode
defined by the Configuration register.
In Interrupt Mode, the enabled EVENT output will be
asserted every time the temperature crosses one of the alarm
window limits, and can be de−asserted by writing a ‘1’ to the
clear event bit (B5) in the configuration register. When the
temperature exceeds the critical limit, the event remains
asserted as long as the temperature stays above the critical
limit and can not be cleared.
In Comparator Mode, the EVENT output is asserted
outside the alarm window limits, while in Critical
Temperature Mode, EVENT is asserted only above the
critical limit. The exact trip limits are determined by the 3
temperature limit settings and the hysteresis offsets, as
illustrated in Figure 16.
Following a TS shut−down request, the converter is
stopped and the most recently recorded temperature value
present in the TDR is frozen; the EVENT output will continue
to reflect the state immediately preceding the shut−down
command. Therefore, if the state of the EVENT output
creates an undesirable bus condition, appropriate action must
be taken either before or after shutting down the TS. This may
require clearing the event, disabling the EVENT output or
perhaps changing the EVENT output polarity.
In normal use, events are triggered by a change in
recorded temperature, but the CAT6095 will also respond to
limit register changes. Whereas recorded temperature
values are updated at sampling rate frequency, limits can be
modified at any time. The enabled EVENT output will react
to limit changes as soon as the respective registers are
updated. This feature may be useful during testing.
Table 13. 12−BIT TEMPERATURE DATA FORMAT
Binary (B12 to B0)
Hex
Temperature
1 1100 1001 0000
1C90
−55°C
1 1100 1110 0000
1CE0
−50°C
1 1110 0111 0000
1E70
−25°C
1 1111 1111 1111
1FFF
−0.0625°C
0 0000 0000 0000
000
0°C
0 0000 0000 0001
001
+0.0625°C
0 0001 1001 0000
190
+25°C
0 0011 0010 0000
320
+50°C
0 0111 1101 0000
7D0
+125°C
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CAT6095
TEMPERATURE
CRITICAL
HYSTERESIS AFFECTS
THESE TRIP POINTS
UPPER
ALARM
WINDOW
LOWER
TIME
SOFTWARE CLEARS EVENT
EVENT IN “INTERRUPT”
EVENT IN “COMPARATOR” MODE
EVENT IN “CRITICAL TEMP ONLY” MODE
*EVENT cannot be cleared once the DUT temperature is greater than the critical temperature
Figure 15. Event Detail
TH
TH − HYST
TL
TL − HYST
BELOW
WINDOW BIT
ABOVE
WINDOW BIT
Figure 16. Hysteresis Detail
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13
CAT6095
PACKAGE DIMENSIONS
TDFN8, 2x3
CASE 511AK−01
ISSUE A
D
A
e
b
E2
E
PIN#1
IDENTIFICATION
A1
PIN#1 INDEX AREA
D2
TOP VIEW
SYMBOL
MIN
SIDE VIEW
NOM
A
0.70
0.75
0.80
0.00
0.02
0.05
A2
0.45
0.55
0.65
A2
0.20 REF
A3
b
0.20
0.25
0.30
D
1.90
2.00
2.10
D2
1.30
1.40
1.50
E
2.90
3.00
3.10
E2
1.20
1.30
1.40
e
L
BOTTOM VIEW
MAX
A1
A3
FRONT VIEW
0.50 TYP
0.20
0.30
L
0.40
Notes:
(1) All dimensions are in millimeters.
(2) Complies with JEDEC MO-229.
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14
CAT6095
Example of Ordering Information
Prefix
Device #
Suffix
CAT
6095
VP2
G
T4
Package
Lead Finish
G: NiPdAu
Tape & Reel (Note 21)
Company ID
VP2: TDFN
T: Tape & Reel
4: 4,000/Reel
Product Number
6095
17. All packages are RoHS−compliant (Lead−free, Halogen−free)
18. The standard lead finish is NiPdAu.
19. This device used in the above example is a CAT6095, in TDFN, NiPdAu Lead Frame, Tape & Reel, 4,000/Reel.
20. For additional package and temperature options, please contact your nearest ON Semiconductor Sales office.
21. For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
ON Semiconductor is licensed by Philips Corporation to carry the I2C Bus Protocol.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
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Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
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Phone: 81−3−5773−3850
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15
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
CAT6095/D
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