INTERSIL HS1-139RH/PROTO

HS-139RH
®
Data Sheet
December 22, 2004
Radiation Hardened Quad Voltage
Comparator
FN3573.3
Features
• QML Qualified Per MIL-PRF-38535 Requirements
The Radiation Hardened HS-139RH consists of four
independent single or dual supply voltage comparators on a
single monolithic substrate. The common mode input
voltage range includes ground, even when operated from a
single supply, and the low supply current makes these
comparators suitable for low power applications. These
types were designed to directly interface with TTL and
CMOS.
The HS-139RH is fabricated on our dielectrically isolated
Rad Hard Silicon Gate (RSG) process, which provides an
immunity to Single Event Latch-up and the capability of
highly reliable performance in any radiation environment.
• Radiation Environment
- Latch-up Free Under any Conditions
- Total Dose (Max) . . . . . . . . . . . . . . . . . 3 x 105 RAD(Si)
- SEU LET Threshold . . . . . . . . . . . . . . . 20MeV/cm2/mg
- Low Dose Rate Effects Immunity
• 100V Output Voltage Withstand Capability
• ESD Protection to >3000V
• Differential Input Voltage Range Equal to the Supply
Voltage
• Input Offset Voltage (VIO) . . . . . . . . . . . . . . . . 2mV (Max)
Specifications for Rad Hard QML devices are controlled
by the Defense Supply Center in Columbus (DSCC). The
SMD numbers listed below must be used when ordering.
• Quiescent Supply Current . . . . . . . . . . . . . . . . 2mA (Max)
Detailed Electrical Specifications for the HS-139RH are
contained in SMD 5962-98613. A “hot-link” is provided
on our homepage with instructions for downloading.
www.intersil.com/spacedefense/newsafclasst.asp
• Pulse Generators
Applications
• Timing Circuitry
• Level Shifting
• Analog to Digital Conversion
Ordering Information
ORDERING
NUMBER
INTERNAL
MKT. NUMBER
Pinouts
HS-139RH (SBDIP CDIP2-T14)
TOP VIEW
s
TEMP. RANGE (oC)
5962F9861301VCC
HS1-139RH-Q
-55 to 125
5962F9861301QCC
HS1-139RH-8
-55 to 125
HS1-139RH/Proto
HS1-139RH/Proto
-55 to 125
V+ 3
5962F9861301VXC
HS9-139RH-Q
-55 to 125
- IN 1 4
11 + IN 4
5962F9861301QXC
HS9-139RH-8
-55 to 125
+ IN 1 5
10 - IN 4
HS9-139RH/Proto
HS9-139RH/Proto
-55 to 125
- IN 2 6
9 + IN 3
+ IN 2 7
8 - IN 3
OUT 2 1
14 OUT 3
OUT 1 2
13 OUT 4
12 GND
HS-139RH (FLATPACK CDFP3-F14)
TOP VIEW
1
OUT 2
1
14
OUT 3
OUT 1
2
13
OUT 4
V+
3
12
GND
- IN 1
4
11
+ IN 4
+ IN 1
5
10
- IN 4
- IN 2
6
9
+ IN 3
+IN 2
7
8
- IN 3
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
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HS-139RH
Die Characteristics
DIE DIMENSIONS:
Backside Finish:
3750µm x 2820µm (148 mils x 111 mils)
483µm ± 25.4µm (19 mils ± 1 mil)
Silicon
ASSEMBLY RELATED INFORMATION:
INTERFACE MATERIALS:
Substrate Potential:
Glassivation:
Unbiased (DI)
Type: Silox (SiO2)
Thickness: 8.0kÅ ± 1.0kÅ
ADDITIONAL INFORMATION:
Worst Case Current Density:
Top Metallization:
<2.0 x 105 A/cm2
Type: AlSiCu
Thickness: 16.0kÅ ± 2kÅ
Transistor Count:
Substrate:
49
Radiation Hardened Silicon Gate, Dielectric Isolation
Metallization Mask Layout
HS-139RH
GND
(12)
+IN4
(11)
-IN4
(10)
OUT4
(13)
+IN3
(9)
OUT3
(14)
-IN3
(8)
+IN2
(7)
OUT2
(1)
-IN2
(6)
OUT1
(2)
V+
(3)
-IN1
(4)
+IN1
(5)
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Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
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2
FN3573.3
December 22, 2004