Click Here for Military Performance (JAN Class S) Datasheet

INCH-POUND
MIL-M-38510/124D
21 April 2004
SUPERSEDING
MIL-M-38510/124C
20 November 1989
MILITARY SPECIFICATION
MICROCIRCUITS, LINEAR, PRECISION VOLTAGE REFERENCES, MONOLITHIC SILICON
Reactivated after 21 April 2004 and may be used for either new or existing design acquisitions.
This specification is approved for use by all Departments and Agencies of the Department of Defense.
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, precision voltage references.
Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the
complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF38535, (see 6.3)
1.2 Part or identifying number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are internally compensated and are as follows:
Device type
01, 04
02, 06
03
05
07
08
09
Circuit
Precision voltage reference, 6.9 V with temperature stabilizer
Precision voltage reference, 6.9 V without temperature stabilizer
Precision voltage reference, 10 V with guaranteed long term stability
Precision voltage reference, 6.9 V with guaranteed long term stability
Precision voltage reference, 5 V with ultra low drift
Precision voltage reference, 7 V with ultra low drift
Precision voltage reference, 10 V with ultra low drift
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outline. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
G
X
Y
Descriptive designator
Terminals
MACY1-X8
See figure 1
See figure 2
8
2
4
Package style
Can
Can
Can
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43216-5000, or emailed
to [email protected] Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at www.dodssp.daps.mil.
AMSC N/A
FSC 5962
MIL-M-38510/124D
1.3 Absolute maximum ratings.
Voltage reference current
Device types 01, 02, 04, 05, and 06 .............................................
Forward current
Device types 01, 02, 04, 05, and 06 .............................................
Temperature stabilizer voltage
Device types 01, 04, and 05 .........................................................
Reference to substrate voltage
Device types 01, 04, and 05 (negative terminal of stabilizer) ........
-0.1 V
Device type 03
Maximum input voltage ....................................................................
Minimum input voltage .....................................................................
Maximum power dissipation .............................................................
Open circuit duration ........................................................................
40 V
12 V
500 mW
Indefinite 1/
Device types 07, 08, and 09
Maximum input voltage
Device types 07, 08, and 09 .........................................................
Input-output voltage differential
Device types 07, 08, and 09 .........................................................
Output to ground voltage (shunt mode current limit)
Device types 07 and 08 ................................................................
Device type 09 ..............................................................................
Trim pin to ground voltage
Positive .........................................................................................
Negative .......................................................................................
20 mA
1 mA
40 V
44 V
35 V
10 V
16 V
Equal to VO
-20 V
Device types 07 and 09
Output short circuit duration
VIN = 35 V .................................................................................... 10 s
VIN ≤ 20 V ..................................................................................... Indefinite
Device types 07, 08, and 09
Lead temperature (soldering, 10 seconds) ....................................... +300°C
Junction temperature (TJ) ................................................................ +175°C
Storage temperature range .............................................................. -55°C to +150°C
1.4 Recommended operating conditions.
Voltage reference current output
Device type 03 .............................................................................. 0 mA to 8 mA
Voltage reference current range
Device types 01 and 02 ................................................................ 0.5 mA to 15 mA
Operating ambient temperature range (TA) ...................................... -55°C to +125°C
1.5
Power and thermal characteristics.
Package
Case outlines
Maximum allowable power
dissipation
Maximum
θJA
150°C/W
200°C/W
8 lead can
G
330 mW at TA = +125°C
45°C/W
2 lead can
X
4 lead can
Y
115 mW at TA = +125°C
140 mW at TA = +125°C
43°C/W
---
______
1/ Output may be shorted to ground or supply. Rating applies to +125°C case temperature.
2
Maximum
θJC
435°C/W
MIL-M-38510/124D
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this
specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this
specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those
cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535
- Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
MIL-STD-1835
- Test Method Standard for Microelectronics.
- Interface Standard Electronic Component Case Outlines.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or
from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein the text of this document shall takes precedence. Nothing in this document, however, supersedes applicable
laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535 and herein.
3.3.1 Circuit diagrams and terminal connections. The circuit diagrams and terminal connections shall be as
specified on figure 8.
3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to
the qualifying activity and the preparing activity upon request.
3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3.
3.3.4 Package and sealing material. Packaging and sealing material shall be in accordance with MIL-PRF-38510.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I,
and apply over the full recommended operating ambient temperature range, unless otherwise specified.
3
MIL-M-38510/124D
TABLE I. Electrical performance characteristics for device types 01, 02, 04, 05, and 06.
Test
Reference voltage
Symbol
VR
Conditions
-55°C ≤ TA ≤ +125°C
see 3.5
unless otherwise specified
0.5 mA ≤ IR ≤ 10 mA,
Device
type
Limits
Unit
Min
6.80
Max
7.10
02,06
6.70
7.20
01,04,
05
-9
9
01,04,
05
-12
12
0.6 mA ≤ IR ≤ 15 mA, TA = +25°C
02,06
-14
14
0.6 mA ≤ IR ≤ 15 mA,
02,06
-18
18
01,05
-0.5
0.5
04
-1.0
1.0
01,05
-10
10
+85°C ≤ TA ≤ +125°C
04
-15
15
IR = 1.0 mA,
02
-10
10
-55°C ≤ TA ≤ +125°C
06
-20
20
01,04,
05
0
1
02,06
0
1
01,04,
05
0
20
02,06
0
20
01,04,
05
0
50
02,06
0
50
01,04,
05
V
VS = 30 V, TA = +25°C
0.6 mA ≤ IR ≤ 15 mA,
TA = +25°C
Reference voltage change
with current
∆VR
0.5 mA ≤ IR ≤ 10 mA, VS = 30 V,
(current)
TA = +25°C
0.5 mA ≤ IR ≤ 10 mA, VS = 30 V,
-55°C ≤ TA ≤ +125°C
mV
-55°C ≤ TA ≤ +125°C
Reference voltage
temperature
∆VR / ∆T
VS = 30 V, IR = 1.0 mA,
-55°C ≤ TA ≤ +85°C
VS = 30 V, IR = 1.0 mA,
Dynamic impedance
ZD
VS = 30 V, IR = 1.0 mA, ei = 1.0 V,
ppm/°C
Ohm
f = 400 Hz, see figure 3, TA = +25°C
IR = 1.0 mA, ei = 1.0 V,
f = 400 Hz, see figure 3, TA = +25°C
Noise
NO
VS = 30 V, BW = 10 Hz to 10 kHz,
IR = 1.0 mA, see figure 4, TA = +25°C
BW = 10 Hz to 10 kHz,
µV
RMS
IR = 1.0 mA, see figure 4, TA = +25°C
VS = 30 V, BW = 0.1 Hz to 10 kHz,
IR = 1.0 mA, see figure 4, TA = +25°C
BW = 0.1 Hz to 10 kHz,
IR = 1.0 mA, see figure 4, TA = +25°C
See footnotes at end of table.
4
µVp-p
MIL-M-38510/124D
TABLE I. Electrical performance characteristics for device types 01, 02, 04, 05, and 06 – Continued.
Test
Temperature stabilizer
supply current
Symbol
IS
Conditions
-55°C ≤ TA ≤ +125°C
see 3.5
unless otherwise specified
VS = 40 V, IR = 0 mA, TA = +25°C
Device
type
01,04,
05
Limits
Unit
Min
4
Max
20
VS = 40 V, IR = 0 mA, TA = -55°C
01,04,
05
6
40
mA
Initial temperature
stabilizer supply current
ISI
9 V ≤ VS ≤ 40 V, IR = 0 mA, TA = +25°C
01,04,
05
---
200
mA
Reference voltage
temperature cycling
hysteresis
∆VR
VS = 30 V, IR = 1 mA, see figure 5,
-10
10
mV
(temp
-55°C ≤ TA ≤ +125°C
01,04,
05
cycle)
IR = 1 mA, see figure 5,
02,06
-1
1
05
-20
20
-55°C ≤ TA ≤ +125°C
Long term stability
∆VR /
VS = 30 V, IR = 1 mA ±10 %,
∆Time
Time = 600 hours, TA = +25°C
See footnotes at end of table.
5
ppm /
600 hrs
MIL-M-38510/124D
TABLE I. Electrical performance characteristics for device types 03.
Test
Symbol
Reference voltage
VO
Output adjustment
VO adj+
range
Conditions
-55°C ≤ TA ≤ +125°C
see 3.5 and figure 6
unless otherwise specified
VS = 15 V, IL = 0 mA, TA = +25°C
Device
type
VRLINE
Unit
Min
9.97
Max
10.03
VS = 15 V, IL = 0 mA, TA = +125°C
9.958
10.042
VS = 15 V, IL = 0 mA, TA = -55°C
9.962
10.038
0.3
---
---
-0.3
-0.010
0.010
-0.015
0.015
-0.008
0.008
-0.012
0.012
---
1.4
---
2.0
VS = 15 V, IL = 0 mA, TA = +25°C
03
03
VO adj-
Line regulation
Limits
VS = 13 V to 33 V, IL = 0 mA, TA = +25°C
03
VS = 13 V to 33 V, IL = 0 mA,
V
V
%/V
-55°C ≤ TA ≤ +125°C
Load regulation
VRLOAD
VS = 15 V, IL = 0 to 10 mA, TA = +25°C
03
VS = 15 V, IL = 0 to 8 mA,
%/mA
-55°C ≤ TA ≤ +125°C
Quiescent supply
ICC
current
VS = 15 V, IL = 0 mA, TA = +25°C
03
VS = 15 V, IL = 0 mA,
mA
-55°C ≤ TA ≤ +125°C
Output short circuit
current
Output voltage
1/
temperature
coefficient
IOS
VS = 15 V, VO = 0 V, TA = +25°C
03
---
50
∆VOUT1 /
∆T
VS = 15 V, IL = 0 mA,
03
-10
10
∆VOUT2 /
∆T
Output voltage noise
enp-p
mA
ppm /
°C
-55°C ≤ TA ≤ +25°C
-12
12
03
---
30
µVp-p
03
-50
50
ppm /
1000
hrs.
VS = 15 V, IL = 0 mA,
+25°C ≤ TA ≤ +125°C
VS = 15 V, IL = 0 mA, TA = +25°C,
BW = 0.1 Hz to 10 Hz, see figure 7
Long term drift
2/
VLTD
VS = 15 V, IL = 0 mA, TA = +40°C
See footnotes at end of table.
6
MIL-M-38510/124D
TABLE I. Electrical performance characteristics for device type 07.
Test
Reference voltage
Line regulation
Symbol
VO
3/
VRLINE
4/
Load regulation
VRLOAD
4/
Conditions
-55°C ≤ TA ≤ +125°C
VIN = 10 V, IOUT = 0 mA,
see 3.5 and figure 8
unless otherwise specified
TA = +25°C
Device
type
Limits
Unit
Min
Max
4.950
5.050
TA = +125°C
4.9475
5.0525
TA = -55°C
4.948
5.052
-0.17
0.17
VIN = 10 V, 7.2 V, TA = +125°C, -55°C
-0.28
0.28
VIN = 10 V, 40 V, TA = +25°C
-0.9
0.9
VIN = 10 V, 40 V, TA = +125°C, -55°C
-1.5
1.5
-5.0
5.0
IOUT = 0 mA, 10 mA, TA = +125°C, -55°C
-7.5
7.5
IOUT = 0 mA, -10 mA, TA = +25°C
-1.0
1.0
IOUT = 0 mA, -10 mA, TA = +125°C, -55°C
-1.75
1.75
VIN = 10 V, 7.2 V, TA = +25°C
IOUT = 0 mA, 10 mA, TA = +25°C
07
07
07
V
mV
mV
Trim voltage
VTRIM
ITRIM = 0 mA, TA = +25°C
07
-3.5
---
V
Delta voltage /
∆VO /
TA = -55°C to +25°C
07
---
5.0
ppm / °C
∆T
TA = +25°C to +125°C
---
5.0
Noise
NO 5/
VIN = 15 V, 10 Hz ≤ f ≤ 1 kHz, TA = +25°C
07
---
3.5
µV RMS
Supply current
ICC
TA = +25°C
07
---
1.2
mA
---
1.5
-50
---
delta temperature
TA = +125°C, -55°C
Output short circuit
current
IOS
VO = 0 V, TA = +25°C
See footnotes at end of table.
7
07
mA
MIL-M-38510/124D
TABLE I. Electrical performance characteristics for device type 08.
Test
Reference voltage
Line regulation
Symbol
VO
3/
VRLINE
4/
Load regulation
VRLOAD
4/
Minimum current
IMIN
shunt mode
Shunt mode regulation
Conditions
-55°C ≤ TA ≤ +125°C
VIN = 12 V, IOUT = 0 mA,
see 3.5 and figure 8
unless otherwise specified
TA = +25°C
Device
type
Limits
Min
Max
6.950
7.050
TA = +125°C
6.9465
7.0535
TA = -55°C
6.9472
7.0528
-0.1
0.1
VIN = 12 V, 8.5 V, TA = +125°C, -55°C
-0.2
0.2
VIN = 12 V, 40 V, TA = +25°C
-0.39
0.39
VIN = 12 V, 40 V, TA = +125°C, -55°C
-0.78
0.78
-1.75
1.75
-2.8
2.8
VIN = 12 V, 8.5 V, TA = +25°C
IOUT = 0 mA, -10 mA, TA = +25°C
08
08
08
IOUT = 0 mA, -10 mA, TA = +125°C, -55°C
VIN is open, TA = +25°C
08
1
VIN is open, IOUT = 1.2 mA, 10 mA,
V
mV
mV
mA
1.2
VIN is open, TA = +125°C, -55°C
VSHUNT
Unit
08
-6.16
6.16
mV
-9.24
9.24
---
5.0
ppm /
---
5.0
°C
TA = +25°C
4/ 6/
VIN is open, IOUT = 1.2 mA, 10 mA,
TA = +125°C, -55°C
Delta voltage /
08
∆VO /
TA = -55°C to +25°C
∆T
TA = +25°C to +125°C
Noise
NO 5/
VIN = 15 V, 10 Hz ≤ f ≤ 1 kHz
08
---
4
Supply current
ICC
TA = +25°C
08
---
1.2
---
1.5
-50
---
delta temperature
TA = +125°C, -55°C
Output short circuit
current
IOS
VIN = 12 V, VO = 0 V, TA = +25°C
See footnotes at end of table.
8
08
µV
RMS
mA
mA
MIL-M-38510/124D
TABLE I. Electrical performance characteristics for device type 09.
Test
Reference voltage
Line regulation
Symbol
VO
3/
VRLINE
4/
Load regulation
VRLOAD
4/
Minimum current shunt
IMIN
mode
Shunt mode regulation
Conditions
-55°C ≤ TA ≤ +125°C
VIN = 15 V, IOUT = 0 mA,
see 3.5 and figure 8
unless otherwise specified
TA = +25°C
Device
type
Limits
Min
Max
9.950
10.050
TA = +125°C
9.945
10.055
TA = -55°C
9.946
10.054
-0.12
0.12
VIN = 11.5 V, 14.5 V, TA = +125°C, -55°C
-0.18
0.18
VIN = 14.5 V, 40 V, TA = +25°C
-0.5
0.5
VIN = 14.5 V, 40 V, TA = +125°C, -55°C
-1.0
1.0
-2.5
2.5
-4.0
4.0
VIN = 11.5 V, 14.5 V, TA = +25°C
IOUT = 0 mA, -10 mA, TA = +25°C
09
09
09
IOUT = 0 mA, -10 mA, TA = +125°C, -55°C
VIN is open, TA = +25°C
09
1.5
VIN is open, IOUT = 1.7 mA, 10 mA,
V
mV
mV
mA
1.7
VIN is open, TA = +125°C, -55°C
VSHUNT
Unit
09
-8.3
8.3
-12.4
12.4
mV
TA = +25°C
4/ 6/
VIN is open, IOUT = 1.7 mA, 10 mA,
TA = +125°C, -55°C
Trim voltage
VTRIM
ITRIM = 0 mA, TA = +25°C
09
-4.3
---
V
Delta voltage /
∆VO /
TA = -55°C to +25°C
09
---
5.0
ppm /
∆T
TA = +25°C to +125°C
---
5.0
°C
Noise
NO 5/
VIN = 15 V, 10 Hz ≤ f ≤ 1 kHz, TA = +25°C
09
---
6
Supply current
ICC
TA = +25°C
09
---
1.7
---
2.0
-50
---
delta temperature
TA = +125°C, -55°C
Output short circuit
current
IOS
VO = 0 V, TA = +25°C
See footnotes at end of table.
9
09
µV
RMS
mA
mA
MIL-M-38510/124D
TABLE I. Electrical performance characteristics – Continued.
1/
Output voltage temperature coefficient is defined as the absolute difference between the output voltage at
TA = +125°C and the output voltage at TA = -55°C divided by the product of the absolute temperature range and the
output voltage multiplied by one million, example:
6
∆VOUT1 / ∆T = [ ( VO (+25°C) – VO (-55°C) ) / ((+80°C) 10 V) ] x 10 .
6
∆VOUT2 / ∆T = [ ( VO (+125°C) – VO (+25°C) ) / ((+100°C) 10 V) ] x 10 .
2/
Long term drift specification applies only to device under continuous power.
3/
Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically
less than 0.005 percent
4/
Line, load, and shunt mode regulation are measured on a pulse basis. Pulse is not to exceed 30 ms.
5/
RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1kHz.
6/
Shunt voltage is measured with the input open. With the input connected, the shunt mode current can be
reduced to 0 mA. Load regulation will remain the same.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.7.1 Serialization. All class S devices shall be serialized in accordance with MIL-PRF-38535.
3.7.2 Correctness of indexing and markings. All devices shall be subjected to the final electrical tests specified in
table II after part marking to verify that they are correctly indexed and identified by part number. Optionally, an
approved electrical test may be devised especially for this requirement.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 59 (see MIL-PRF-38535, appendix A).
10
MIL-M-38510/124D
TABLE II. Electrical test requirements.
Subgroups (see table III)
Class S
Class B 1/
devices
devices
MIL-PRF-38535
test requirements
Interim electrical parameters
1
1
Final electrical test parameters
1*, 2, 3
1*, 2, 3
Group A test requirements
1, 2, 3, 4
1, 2, 3, 4
Group B electrical test parameters when
using the method 5005 QCI option
Group C end-point electrical
parameters
Group D end-point electrical
parameters
Additional electrical subgroups for
Group D periodic inspections
1, 2, 3, 5 and
table IV delta limits
1, 2, 3, 5 and
table IV delta limits
1, 2, 3
*
1/
N/A
N/A
1 and table IV
delta limits
1
5
PDA applies to subgroup 1.
Subgroup 4, as defined in table III (tests 18-20, for device types 01, 04, and 05;
tests 13-15, device types 02 and 06) are used for initial and redesign qualification
(class B only).
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or
as modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not
effect the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior
to qualification and quality conformance inspection. The following additional criteria shall apply:
a.
The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified
in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be
maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1015 of MIL-STD-883.
NOTE: If accelerated high temperature test conditions are used, the device manufacturer shall ensure
that at least 85 percent of the applied voltage is dropped across the device at temperature. The device
is not considered functional under accelerated test conditions.
b.
Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c.
Additional screening for space level product shall be as specified in MIL-PRF-38535.
11
MIL-M-38510/124D
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 6, 7, 8, 9, 10, and 11 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a.
End point electrical parameters shall be as specified in table II herein.
b.
The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB)
in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535.
a.
End point electrical parameters shall be as specified in table II herein.
b.
A special subgroup shall be added to the group D inspection requirements and shall consists of the tests,
conditions, and limits specified for subgroup 5 of group A. The accept sample number for the subgroup
shall be 15 devices with 0 failures for both classes.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows.
4.5.1 Voltage and current. All voltage values given are referenced to the ground terminal of the device under test
(DUT). Currents given are conventional current and are positive when flowing into the referenced terminal.
4.5.2 Life test and burn-in cooldown procedure. When devices are measured at +25°C following application of the
steady state life or burn-in test condition, they shall be cooled within +10°C of their power stable condition prior to
removal of the bias.
12
MIL-M-38510/124D
Symbol
A
φb
φb1
φD
φD1
e
e1
F
K
K1
K2
L
L1
L2
α
Dimensions
Inches
Millimeters
Min
Max
Min
Max
.075
.093
1.90
2.36
.016
.019
0.41
0.48
.016
.021
0.41
0.53
.209
.219
5.31
5.56
.178
.195
4.52
4.95
.100
BSC
2.54
BSC
.050
BSC
1.27
BSC
--.050
--1.27
.036
.046
.91
1.17
.028
.048
.71
1.22
.009
.041
.23
1.04
.500
--12.70
----.050
--1.27
.250
--6.35
--BSC
BSC
45°
45°
Notes
2
2
4
4
3
4
NOTES:
1. Dimensions are in inches.
2. (All leads) φb applies between L1 and L2, φb1 applies between L2 and .500 (12.70 mm) from the
reference plane. Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the reference plane.
3. Measured from the maximum diameter of the product.
4. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane
.054 (1.37 mm) + .001 (.03 mm) - .000 (.00 mm) below the base plane of the product shall be
within .007 (.18 mm) of their true position relative to a maximum width tab.
5. The product may be measured by direct methods or by gauge.
6. Metric equivalents are given for general information only.
FIGURE 1. Case outline X.
13
MIL-M-38510/124D
Symbol
A
φb
φb1
φD
e
e1
F
k
k1
L
L1
m
m1
α
Dimensions
Inches
Millimeters
Min
Max
Min
Max
.224
.234
5.69
5.94
.016
.019
0.41
0.48
.016
.021
0.41
0.53
Notes
2
.398
.100
.050
.409
BSC
BSC
10.11
2.54
1.27
10.39
BSC
BSC
4
4
.010
.047
.008
BSC
BSC
BSC
0.25
1.19
0.20
BSC
BSC
BSC
3
.400
.200
-----
10.16
5.08
-----
.145
.175
BSC
BSC
3.68
4.44
BSC
BSC
45°
BSC
45°
BSC
4
NOTES:
1. Dimensions are in inches.
2. (All leads) φb applies between L1 and the seating plane. φb1 applies between L1 and .400 (10.16 mm)
from the seating plane.
3. Measured from the maximum diameter of the product.
4. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane
.054 (1.37 mm) + .001 (.03 mm) - .000 (.00 mm) below the base plane of the product shall be
within .007 (.18 mm) of their true position relative to a maximum width tab.
5. The product may be measured by direct methods or by gauge.
6. Metric equivalents are given for general information only.
FIGURE 1. Case outline Y.
14
MIL-M-38510/124D
NOTES:
Test conditions for reference device current, IR, and for heater voltage, VS are defined in table III.
FIGURE 3. Dynamic impedance test circuit.
FIGURE 4. Noise test circuit.
15
MIL-M-38510/124D
NOTE: Test conditions for reference device current, IR, and for heater voltage, VS are defined in table III.
FIGURE 5. Reference voltage.
Figure 6. Test circuit for static tests.
16
MIL-M-38510/124D
NOTES:
1. Test time = 10 seconds.
2. VOUT measured with differential amplifier 7A22 and lower frequency set to 0.1 Hz.
Figure 7. Low frequency noise test circuit.
17
MIL-M-38510/124D
NOTE: The 60 Hz notch filter is used in noisy environments.
Figure 7. Low frequency noise test circuit – Continued.
18
MIL-M-38510/124D
NOTES:
1. No trim pin on device type 08 (do not connect external circuitry to pin 5).
2.
For device types 07, 08, and 09, pins 1, 3, 7, and 8 are connected internally.
Do not connect external circuitry to these pins.
FIGURE 8. Circuit diagrams and terminal connections.
19
20
ISI1
ISI2
∆VR 1/
temp
cycle
TA =
+25°C
1/
NO
4
VS = 30 V
IR = 1.0 mA
BW = 0.1 Hz to 10 Hz
VS = 40 V
IR = 0 mA
VS = 9 V
IR = 0 mA
VS = 30 V
IR = 1 mA
VS = 30 V
IR = 1 mA
VS = 30 V
IR = 1 mA
IR = 0 mA
IR = 1.0 mA
IR = 0.5 mA
IR = 10 mA
IR = 1.0 mA
IR = 0.5 mA
IR = 10 mA
IR = 1.0 mA
VR13
VR14
VR15
VR12
VR11
VR9
VR10
VR8
VR6
VR7
VR5
∆VR = VR13 – VR14
∆VR = VR14 – VR15
NO = VR12
-10
-10
---
0
6
-0.5
-12
∆VR = VR9 – VR10
∆VR / ∆T = (VR11 - VR5 ) / 140
-10
-12
---
4
0
∆VR / ∆T = (VR8 - VR5 ) / 40
∆VR = VR6 – VR7
NO = VR4
-9
.5 mA ≤ IR ≤ 10 mA
Min
6.80
6.80
6.80
∆VR = VR1 – VR3
Equations
IR = .5 mA
IR = 1.0 mA
IR = 10 mA
VR4
value
Measured
Limit
10
10
200
50
40
0.5
12
10
12
---
20
20
9
7.10
7.10
7.10
Max
mV
mA
µVp-p
°C
mA
ppm /
°C
mV
ppm /
mV
---
mA
µV RMS
mV
V
Unit
Following the measurement (VR13), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for
measurement (VR14). Following the measurement (VR14), the temperature TA shall be cycled to –55°C for 1 hour and
returned to +25°C for measurement (VR15).
16
17
18
19
20
15
VS = 40 V
14
∆VR /
∆T
IS
TA =
-55°C
VS = 30 V
VS = 30 V
VS = 30 V
11
12
13
VS = 30 V
10
∆VR /
∆T
∆VR
current
TA =
+125°C
3
VS = 30 V
VS = 30 V
VS = 30 V
8
9
7
VS = 30 V
VS = 30 V
VS = 30 V
∆VR
current
TA =
+85°C
2
2
6
VS = 30 V
IR = 1.0 mA
BW = 10 Hz to 10 kHz
VS = 40 V
IR = 0 mA
5
IS
∆VR /
∆T
VS = 30 V
4
∆VR
current
NO
TA =
+25°C
1
2
3
Current
VR1
VR2
VR3
Voltage
1
no.
Conditions
see figures 3, 4, and 5
unless otherwise specified
Symbol
Subgroup
Test
TABLE III. Group A inspection for all device type 01.
MIL-M-38510/124D
21
∆VR /
∆T
NO
∆VR 1/
temp
cycle
TA =
-55°C
4
TA =
+25°C
1/
9
10
IR = 1.0 mA
BW = 0.1 Hz to 10 Hz
IR = 1.0 mA
IR = 1.0 mA
IR = 1.0 mA
VR12
VR13
VR14
VR11
VR8
VR9
VR10
VR7
VR5
VR6
∆VR = VR12 – VR13
∆VR = VR13 – VR14
NO = VR11
-1
-1
0
-10
-18
∆VR = VR8 – VR9
∆VR / ∆T = (VR2 - VR10 ) / 80
-10
-18
∆VR / ∆T = (VR7 - VR2 ) / 100
∆VR = VR5 – VR6
0
Limits
1
1
50
10
18
10
18
20
14
7.20
7.20
7.20
Max
mV
°C
µVp-p
ppm /
°C
mV
ppm /
mV
µV RMS
mV
V
Unit
Following the measurement (VR12), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for
measurement (VR13). Following the measurement (VR13), the temperature TA shall be cycled to –55°C for 1 hour and
returned to +25°C for measurement (VR14).
13
14
15
12
IR = 1.0 mA
IR = 0.6 mA
IR = 15 mA
8
∆VR /
∆T
∆VR
current
TA =
+125°C
3
11
IR = 1.0 mA
6
7
∆VR
current
NO = VR4
-14
Min
.6 mA ≤ IR ≤ 15 mA
∆VR = VR1 – VR3
Equations
6.70
6.70
6.70
VR4
value
Measured
IR = .6 mA
IR = 1.0 mA
IR = 15 mA
Current
IR = 1.0 mA
BW = 10 Hz to 10 kHz
IR = 0.6 mA
IR = 15 mA
Voltage
Conditions
see figures 3, 4, and 5
unless otherwise specified
2
5
4
∆VR
current
NO
TA =
+25°C
1
2
3
VR1
VR2
VR3
1
no.
Test
Symbol
Subgroup
TABLE III. Group A inspection for all device type 02.
MIL-M-38510/124D
VS = 15 V
IL = 0 mA
TRIM 10 V
2
22
4
TA =
+25°C
5
TA =
+40°C
TA =
-55°C
3
TA =
+125°C
2
TA =
+25°C
VS = 15 V
1
VO
VS = 13 V
VS = 33 V
VS = 15 V
VS = 15 V
VS = 15 V
VO = 15 V
4
5
6
7
8
9
VO adj-
VRLINE
VRLOAD
IOS
VS = 15 V
VS = 33 V
VS = 15 V
VS = 15 V
12
13
14
15
16
VO
VRLINE
VRLOAD
∆VOUT/∆T
25
∆VOUT/∆T
VLTD
23
VRLOAD
24
VS = 15 V
VS = 15 V
21
22
VRLINE
enp-p
VS = 13 V
VS = 33 V
19
20
VO
IL = 0 mA
IL = 0 mA
IL = 8 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 8 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 0 mA
IL = 10 mA
IL = 0 mA
VS = 15 V
IL = 0 mA
VS = 15 V
IL = 0 mA
BW = 0.1 Hz to 10 Hz
VS = 15 V
VS = 15 V
VS = 15 V
17
18
ICC
VS = 15 V
VS = 15 V
VS = 15 V
10
11
ICC
VS = 15 V
IL = 0 mA
VS = 15 V
TRIM 10 V
3
VO adj+
IL = 0 mA
Current
ICC
Voltage
1
no.
Conditions
see figures 6 and 7
unless otherwise specified
Symbol
Subgroup
Test
V19
V17
V18
V15
V16
V14
V13
V9
V10
V11
V12
V8
V4
V5
V6
V7
V3
V2
V1
value
Measured
Device under continuous power for 1000 hours.
6
∆VOUT/∆T = [ ( V1 – V19 ) / (80°C) (10 V) ] x 10
VRLOAD = [ ( V17 – V18 ) / (10 V) (8 mA) ] x 100
VLINE = [ ( V15 – V16 ) / (10 V) (20 V) ] x 100
6
∆VOUT/∆T = [ ( V13 – V1 ) / (100°C) (10 V) ] x 10
VRLOAD = [ ( V11 – V12 ) / (10 V) (8 mA) ] x 100
VRLINE = [ ( V9 – V10 ) / (10 V) (20 V) ] x 100
VLINE = [ ( V6 – V7 ) / (10 V) (10 mA) ] x 100
VLINE = [ ( V4 – V5 ) / (10 V) (20 V) ] x 100
( V1 – V3 ) 10
( V1 – V2 ) 10
Equations
TABLE III. Group A inspection for all device type 03.
-50
---
-10
-0.012
-0.015
9.962
---
-12
-0.012
-0.015
9.958
---
---
-0.008
-0.010
---
0.3
9.970
---
Min
2.0
50
0.008
0.010
-0.3
---
10.030
1.4
Max
50
30
10
0.012
0.015
10.038
2.0
12
0.012
0.015
10.0420
Limits
ppm /
1000 hrs
µVp-p
ppm / °C
% / mA
%/V
V
mA
ppm / °C
%/mA
%/V
V
mA
mA
% / mA
%/V
V
V
V
mA
Unit
MIL-M-38510/124D
23
18
19
20
ISI1
ISI2
∆VR 1/
temp
cycle
TA =
+25°C
1/
16
17
NO
4
VS = 30 V
VS = 30 V
VS = 30 V
IR = 1 mA
IR = 1 mA
IR = 1 mA
VS = 30 V
IR = 1.0 mA
BW = 0.1 Hz to 10 Hz
VS = 40 V
IR = 0 mA
VS = 9 V
IR = 0 mA
IR = 0 mA
IR = 1.0 mA
IR = 0.5 mA
IR = 10 mA
IR = 0.5 mA
IR = 10 mA
IR = 1.0 mA
IR = 1.0 mA
VR13
VR14
VR15
VR12
VR11
VR9
VR10
VR6
VR7
VR8
VR5
∆VR = VR13 – VR14
∆VR = VR14 – VR15
NO = VR12
-10
-10
---
0
6
-1.0
-12
∆VR = VR9 – VR10
∆VR / ∆T = (VR11 - VR5 ) / 140
-15
-12
---
4
0
∆VR / ∆T = (VR8 - VR5 ) / 40
∆VR = VR6 – VR7
NO = VR4
-9
.5 mA ≤ IR ≤ 10 mA
Min
6.80
6.80
6.80
∆VR = VR1 – VR3
Equations
IR = .5 mA
IR = 1.0 mA
IR = 10 mA
VR4
value
Measured
Limits
10
10
200
50
40
1.0
12
15
12
---
20
20
9
7.10
7.10
7.10
Max
mV
mA
µVp-p
°C
mA
ppm /
°C
mV
ppm /
mV
---
mA
µV RMS
mV
V
Unit
Following the measurement (VR13), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for
measurement (VR14). Following the measurement (VR14), the temperature TA shall be cycled to –55°C for 1 hour and
returned to +25°C for measurement (VR15).
15
VS = 40 V
14
∆VR /
∆T
IS
TA =
-55°C
VS = 30 V
VS = 30 V
VS = 30 V
11
12
13
VS = 30 V
10
∆VR /
∆T
∆VR
current
TA =
+125°C
3
VS = 30 V
VS = 30 V
VS = 30 V
8
9
7
VS = 30 V
VS = 30 V
VS = 30 V
∆VR
current
TA =
+85°C
2
2
6
VS = 30 V
IR = 1.0 mA
BW = 10 Hz to 10 kHz
VS = 40 V
IR = 0 mA
5
IS
∆VR /
∆T
VS = 30 V
4
∆VR
current
NO
TA =
+25°C
1
2
3
Current
VR1
VR2
VR3
Voltage
1
no.
Conditions
see figures 3, 4, and 5
unless otherwise specified
Symbol
Subgroup
Test
TABLE III. Group A inspection for all device type 04.
MIL-M-38510/124D
24
18
19
20
21
ISI1
ISI2
∆VR 1/
temp
cycle
∆VR /
∆time
TA =
+25°C
1/
15
VS = 30 V
VS = 30 V
VS = 30 V
VS = 30 V
IR = 1 mA
IR = 1 mA
IR = 1 mA
IR = 1 mA
VS = 30 V
IR = 1.0 mA
BW = 0.1 Hz to 10 Hz
VS = 40 V
IR = 0 mA
VS = 9 V
IR = 0 mA
IR = 0 mA
IR = 1.0 mA
IR = 0.5 mA
IR = 10 mA
IR = 1.0 mA
IR = 0.5 mA
IR = 10 mA
IR = 1.0 mA
VR13
VR14
VR15
VR16
VR12
VR11
VR9
VR10
VR8
VR6
VR7
VR5
∆VR = VR13 – VR14
∆VR = VR14 – VR15
∆VR = VR16 – VR2
NO = VR12
-10
-10
-20
---
0
6
-0.5
-12
∆VR = VR9 – VR10
∆VR / ∆T = (VR11 - VR5 ) / 140
-10
-12
---
4
0
∆VR / ∆T = (VR8 - VR5 ) / 40
∆VR = VR6 – VR7
NO = VR4
-9
.5 mA ≤ IR ≤ 10 mA
Min
6.80
6.80
6.80
∆VR = VR1 – VR3
Equation
IR = .5 mA
IR = 1.0 mA
IR = 10 mA
VR4
value
Measured
Limits
10
10
20
200
50
40
0.5
12
10
12
---
20
20
9
7.10
7.10
7.10
Max
ppm /
600 hrs
mV
mA
µVp-p
°C
mA
ppm /
°C
mV
ppm /
mV
---
mA
µV RMS
mV
V
Unit
Following the measurement (VR13), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for
measurement (VR14). Following the measurement (VR14), the temperature TA shall be cycled to –55°C for 1 hour and
returned to +25°C for measurement (VR15).
TA =
+25°C
5
16
17
NO
4
VS = 40 V
14
∆VR /
∆T
IS
TA =
-55°C
VS = 30 V
VS = 30 V
VS = 30 V
11
12
13
VS = 30 V
10
∆VR /
∆T
∆VR
current
TA =
+125°C
3
VS = 30 V
VS = 30 V
VS = 30 V
8
9
7
VS = 30 V
VS = 30 V
VS = 30 V
∆VR
current
TA =
+85°C
2
2
6
VS = 30 V
IR = 1.0 mA
BW = 10 Hz to 10 kHz
VS = 40 V
IR = 0 mA
5
IS
∆VR /
∆T
VS = 30 V
4
∆VR
current
NO
TA =
+25°C
1
2
3
Current
VR1
VR2
VR3
Voltage
1
no.
Conditions
see figures 3, 4, and 5
unless otherwise specified
Symbol
Subgroup
Test
TABLE III. Group A inspection for all device type 05.
MIL-M-38510/124D
25
1/
∆VR 1/
temp
cycle
TA =
+25°C
VR12
VR13
VR14
VR11
VR10
VR8
VR9
VR7
VR5
VR6
∆VR = VR12 – VR13
∆VR = VR13 – VR14
NO = VR11
-1
-1
0
-20
-18
∆VR = VR8 – VR9
∆VR / ∆T = (VR2 - VR10 ) / 80
-20
-18
∆VR / ∆T = (VR7 - VR2 ) / 100
∆VR = VR5 – VR6
0
Limits
1
1
50
20
18
20
18
20
14
7.20
7.20
7.20
Max
mV
°C
µVp-p
ppm /
°C
mV
ppm /
mV
µV RMS
mV
V
Unit
Following the measurement (VR12), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for
measurement (VR13). Following the measurement (VR13), the temperature TA shall be cycled to –55°C for 1 hour and
returned to +25°C for measurement (VR14).
13
14
15
IR = 1.0 mA
BW = 0.1 Hz to 10 Hz
IR = 1 mA
IR = 1 mA
IR = 1 mA
∆VR /
∆T
NO
TA =
-55°C
4
12
9
10
IR = 1.0 mA
IR = 0.6 mA
IR = 15 mA
8
∆VR /
∆T
∆VR
current
TA =
+125°C
3
11
IR = 1.0 mA
6
7
∆VR
current
NO = VR4
-14
Min
.6 mA ≤ IR ≤ 15 mA
∆VR = VR1 – VR3
Equation
6.70
6.70
6.70
VR4
value
Measured
IR = .6 mA
IR = 1.0 mA
IR = 15 mA
Current
IR = 1.0 mA
BW = 10 Hz to 10 kHz
IR = 0.6 mA
IR = 15 mA
Voltage
Conditions
see figures 3, 4, and 5
unless otherwise specified
2
5
4
∆VR
current
NO
TA =
+25°C
1
2
3
VR1
VR2
VR3
1
no.
Test
Symbol
Subgroup
TABLE III. Group A inspection for all device type 06.
MIL-M-38510/124D
V2
V3
V4
V5
V6
V7
I2
3
4
5
6
7
8
9
VRLINE
2/
VRLOAD
2/
VTRIM
IOS
26
17
∆VO / ∆T
25
∆VO / ∆T
ICC = I1
∆VO / ∆T = (V14– V1) / 80
See figure 7
VRLOAD = V17 – V18
VRLOAD = V17 – V19
VRLINE = V14 – V15
VRLINE = V14 – V16
VO = V14
ICC = I4
∆VO / ∆T = (V8 – V1) / 100
VRLOAD = V11 – V12
VRLOAD = V11 – V13
VRLINE = V8 – V9
VRLINE = V8 – V10
VO = V8
ICC = I3
IOS = I2
VTRIM = V7
VRLOAD = V4 – V5
VRLOAD = V4 – V6
VRLINE = V1 – V2
VRLINE = V1 – V3
VO = V1
---
-7.5
-1.75
-0.28
-1.5
4.948
---
---
-7.5
-1.75
-0.28
-1.5
4.9475
---
-50
3.5
-5.0
-1.0
-0.17
-0.9
4.950
3.5
5
7.5
1.75
0.28
1.5
5.052
1.5
5
7.5
1.75
0.28
1.5
5.0525
1.5
---
---
5.0
1.0
0.17
0.9
5.050
1.2
Max
RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1 kHz.
---
2
2
2
2
2
2
1
2
2
2
2
2
2
1
2
3
2
2
2
2
2
2
---
Min
3/
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
1
Limits
Line and load regulation are measured on a pulse basis. Pulse is not to exceed 30 ms.
0 mA
0 mA
10 mA
-10 mA
0 mA
0 mA
0 mA
0 mA
0 mA
10 mA
-10 mA
0 mA
0 mA
0 mA
0 mA
0V
0 mA
0 mA
10 mA
-10 mA
0 mA
0 mA
0 mA
3
0 mA
Equation
2/
15 V
10 V
10 V
10 V
7.2 V
40 V
10 V
10 V
10 V
10 V
10 V
7.2 V
40 V
10 V
10 V
10 V
10 V
10 V
10 V
10 V
7.2 V
40 V
10 V
2
0 mA
Pin
measurement
Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically less that 0.005 percent.
N1
V17
V18
V19
22
23
24
VRLOAD
2/
NO 3/
V15
V16
20
21
26
V14
19
VRLINE
2/
VO 1/
14
15
16
VRLOAD
2/
I4
V11
V12
V13
12
13
VRLINE
2/
18
V9
V10
11
ICC
I3
V8
10
ICC
VO 1/
1
10 V
see figure 6
Adapter pin number
1/
TA = +25°C
4
TA =
-55°C
3
TA =
+125°C
2
TA =
+25°C
I1
V1
2
ICC
VO 1/
value
1
Measurement
1
no.
Test
Symbol
Subgroup
TABLE III. Group A inspection for all device type 07.
µV RMS
ppm/°C
mV
mV
mV
mV
V
ppm/°C
mA
mV
mV
mV
mV
V
mA
mA
V
mV
mV
mV
mV
V
mA
Unit
MIL-M-38510/124D
1/
2/
3/
4/
V2
V3
V4
V5
V6
I2
V8
V9
I3
3
4
5
6
7
8
9
10
11
VRLINE
2/
VRLOAD
2/
IMIN
VSHUNT
2/ 3/
IOS
27
V24
I7
V26
V27
29
30
31
32
33
IMIN
VSHUNT
2/ 3/
∆VO / ∆T
N1
V22
V23
27
28
VRLOAD
2/
NO 4/
V20
V21
25
26
VRLINE
2/
34
I6
V19
22
∆VO / ∆T
24
V17
V18
20
21
VSHUNT
2/ 3/
23
V15
I5
18
19
IMIN
ICC
V13
V14
16
17
VRLOAD
2/
VO 1/
V10
V11
V12
13
14
15
VO 1/
VRLINE
2/
I4
12
ICC
15 V
0 mA
0 mA
12 V
12 V
0 mA
0 mA
8.5 V
40 V
12 V
12 V
0 mA
0 mA
0 mA
0 mA
8.5 V
40 V
12 V
12 V
12 V
12 V
12 V
0 mA
0 mA
0 mA
0 mA
8.5 V
40 V
12 V
12 V
12 V
12 V
1
0 mA
V25
1.2 mA
10 mA
0 mA
-10 mA
2 mA
0 mA
0 mA
0 mA
0 mA
V16
1.2 mA
10 mA
2 mA
0 mA
0 mA
0 mA
-10 mA
0 mA
0 mA
0V
V7
1.2 mA
10 mA
2 mA
0 mA
0 mA
0 mA
-10 mA
0 mA
0 mA
2
see figure 6
Adapter pin number
---
2
2
2
2
2
2
2
2
2
1
2
2
2
2
2
2
2
2
2
1
2
2
2
2
2
2
2
2
2
2
1
measurement
Pin
∆VO / ∆T = (V19 – V1) /80
---
---
-2.8
---
-0.2
-0.78
6.9472
---
---
-9.24
---
-2.8
-0.2
-0.78
-9.24
See figure 7
Limits
6.9465
---
-50
-6.16
---
-1.75
-0.1
-0.39
6.950
---
Min
VSHUNT = V27 – V26
VRLOAD = V22 – V23
V25 = V24 – 50 mV
IMIN = I7
VRLINE = V19 – V20
VRLINE = V19 – V21
VO = V19
ICC = I6
∆VO / ∆T = (V10 – V1) /100
VSHUNT = V18 – V17
V16 = V15 – 50 mV
IMIN = I5
VRLOAD = V13 – V14
VRLINE = V10 – V11
VRLINE = V10 – V12
VO = V10
ICC = I4
IOS = I3
VSHUNT = V9 – V8
V7 = V6 – 50 mV
IMIN = I2
VRLOAD = V4 – V5
VRLINE = V1 – V2
VRLINE = V1 – V3
VO = V1
ICC = I1
Equation
4
5
9.24
2.8
--1.2
0.2
0.78
7.0528
1.5
5
9.24
--1.2
2.8
0.2
0.78
7.0535
1.5
---
6.16
--1
1.75
0.1
0.39
7.050
1.2
Max
µV RMS
ppm/°C
mV
mV
mA
mV
mV
V
mA
ppm/°C
mV
mA
mV
mV
mV
V
mA
mA
mV
mA
mV
mV
mV
V
mA
Unit
Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically less that 0.005 percent.
Line, load, and shunt mode regulation are measured on a pulse basis. Pulse is not to exceed 30 ms.
Shunt voltage is measured with the input open. With the input connected, the shunt mode current can be reduced to 0 mA. Load regulation will remain the same.
RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1 kHz.
TA = +25°C
4
TA =
-55°C
3
TA =
+125°C
2
TA =
+25°C
I1
V1
1
2
ICC
value
VO 1/
Measurement
1
no.
Symbol
Subgroup
Test
TABLE III. Group A inspection for all device type 08.
MIL-M-38510/124D
1/
2/
3/
4/
V2
V3
V4
V5
V6
V7
I2
V9
V10
V11
I3
3
4
5
6
7
8
9
10
11
12
13
VRLINE
2/
VRLOAD
2/
IMIN
VSHUNT
2/ 3/
VTRIM
IOS
28
V26
V27
V28
I7
V30
V31
31
32
33
34
35
36
37
38
VRLOAD
2/
IMIN
VSHUNT
2/ 3/
∆VO / ∆T
NO 4/
N1
V23
V24
V25
28
29
30
∆VO / ∆T
VRLINE
2/
25
V22
V20
V21
23
24
VSHUNT
2/ 3/
27
V18
I5
21
22
IMIN
VO 1/
V16
V17
19
20
VRLOAD
2/
I6
V13
V14
V15
16
17
18
VRLINE
2/
26
V12
15
VO 1/
ICC
I4
14
ICC
15 V
0 mA
0 mA
0 mA
0 mA
15 V
15 V
11.5 V
14.5 V
40 V
15 V
15 V
0 mA
0 mA
0 mA
0 mA
15 V
15 V
11.5 V
14.5 V
40 V
15 V
15 V
15 V
15 V
0 mA
0 mA
0 mA
0 mA
11.5 V
14.5 V
40 V
15 V
15 V
15 V
0 mA
V29
1.7 mA
10 mA
2 mA
0 mA
-10 mA
0 mA
0 mA
0 mA
0 mA
0 mA
V19
1.7 mA
10 mA
2 mA
0 mA
-10 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0V
0 mA
V8
1.7 mA
10 mA
2 mA
0 mA
0 mA
0 mA
0 mA
-10 mA
0 mA
0 mA
3
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
0 mA
Pin
---
2
2
2
2
2
2
2
2
2
2
1
2
2
2
2
2
2
2
2
2
2
1
2
3
2
2
2
2
2
2
2
2
2
2
1
measurement
∆VO / ∆T = (V22 – V1) / 80
See figure 7
VSHUNT = V31 – V30
V29 = V28 – 50 mV
IMIN = I7
VRLOAD = V27 – V26
VRLINE = V24 – V23
VRLINE = V24 – V25
VO = V22
---
---
-12.4
---
-4.0
-0.18
-1.0
9.946
6
5
12.4
--1.7
4.0
0.18
1.0
10.054
2.0
∆VO / ∆T = (V12 – V1) / 100
---
5
ICC = I6
12.4
---
--1.7
4.0
0.18
1.0
10.055
2.0
---
---
8.3
--1.5
2.5
0.12
0.5
10.050
1.7
Max
-12.4
---
-4.0
-0.18
-1.0
9.945
---
-50
4.3
-8.3
---
-2. 5
-0.12
-0.5
9.950
---
Min
Limits
VSHUNT = V21 – V20
V19 = V18 – 50 mV
IMIN = I5
VRLOAD = V17 – V16
VRLINE = V14 – V13
VRLINE = V14 – V15
VO = V12
ICC = I4
IOS = I3
VTRIM = V11
VSHUNT = V9 – V10
V8 = V7 – 50 mV
IMIN = I2
VRLOAD = V5 – V6
VRLINE = V3 – V2
VRLINE = V3 – V4
VO = V1
ICC = I1
Equation
µV RMS
ppm/°C
mV
mA
mV
mV
mV
V
ppm/°C
mA
mV
mA
mV
mV
mV
V
mA
mA
V
mV
mA
mV
mV
mV
V
mA
Unit
Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically less that 0.005 percent.
Line, load, and shunt mode regulation are measured on a pulse basis. Pulse is not to exceed 30 ms.
Shunt voltage is measured with the input open. With the input connected, the shunt mode current can be reduced to 0 mA. Load regulation will remain the same.
RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1 kHz.
TA = +25°C
4
TA =
-55°C
3
TA =
+125°C
2
TA =
+25°C
V1
2
VO 1/
1
15 V
2
I1
value
1
ICC
see figure 6
Adapter pin number
Measurement
1
no.
Test
Symbol
Subgroup
TABLE III. Group A inspection for all device type 09.
MIL-M-38510/124D
MIL-M-38510/124D
TABLE IV. Group C end point electrical parameters. TA = 25°C
Device
type
Characteristics
01, 04, 05
Reference voltage
VS = 30 V, TA = +25°C
VR1,
VR2,
VR3
02, 06
Reference voltage
TA = +25°C
VR1,
1/
Symbol
Delta
limits
1/
Limits
Unit
±2 mV
Min
6.80
Max
7.10
V
±3 mV
6.70
7.20
V
VR2,
VR3
03
Reference voltage
VS = 15 V, TA = +25°C
VO
±3 mV
9.970
10.030
V
07
Reference voltage
VIN = 10 V, TA = +25°C
VO
±3 mV
4.95
5.05
V
08
Reference voltage
VIN = 12 V, TA = +25°C
VO
±3 mV
6.95
7.05
V
09
Reference voltage
VIN = 15 V, TA = +25°C
VO
±3 mV
9.95
10.05
V
Delta limits apply to the measured value (see delta limit definition in MIL-PRF-38535).
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or
order (see 6.2). When actual packaging of materiel is to be performed by DoD personnel, these personnel need to contact the
responsible packaging activity to ascertain requisite packaging requirements. Packaging requirements are maintained by the
Inventory Control Point's packaging activity within the Military Department of Defense Agency, or within the Military Department's
System Command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's
automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
29
MIL-M-38510/124D
6. NOTES
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and
logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a.
Title, number, and date of the specification.
b.
PIN and compliance identifier, if applicable (see 1.2).
c.
Requirements for delivery of one copy of the conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d.
Requirements for certificate of compliance, if applicable.
e.
Requirements for notification of change of product or process to acquiring activity in addition to
notification of the qualifying activity, if applicable.
f.
Requirements for failure analysis (including required test condition of MIL-STD-883, method 5003),
corrective action and reporting of results, if applicable.
g.
Requirements for product assurance options.
h.
Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not
affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by
or direct shipment to the Government.
i.
Requirements for "JAN" marking.
j.
Packaging requirements (see 5.1).
6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-38510 in
this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this
specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid
adversely impacting existing government logistics systems and contractor's parts lists.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the
time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have
actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are
urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that
they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information
pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
30
MIL-M-38510/124D
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-STD-1331.
6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified, microcircuits
acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4).
Longer length leads and lead forming should not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered
by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have
equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M38510 device types and may have slight physical variations in relation to case size. The presence of this information should not
be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of
MIL-PRF-38535.
Military device type
01
02
03
04
05
06
07
08
09
Generic-industry type
LM199A
LM129A
REF-10
LM199
LM199A-20
LM129B
LT1021-5
LT1021-7
LT1021-10
6.8 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous
issue, due to the extensiveness of the changes.
Custodians:
Army – CR
Navy - EC
Air Force - 11
NASA - NA
DLA – CC
Preparing activity:
DLA - CC
Project 5962-2032
Review activities:
Army - MI, SM
Navy - AS, CG, MC, SH, TD
Air Force – 03, 19, 99
NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and
responsibilities can change, you should verify the currency of the information above using the ASSIT Online database at
www.dodssp.daps.mil.
31
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