INCH-POUND MIL-M-38510/124D 21 April 2004 SUPERSEDING MIL-M-38510/124C 20 November 1989 MILITARY SPECIFICATION MICROCIRCUITS, LINEAR, PRECISION VOLTAGE REFERENCES, MONOLITHIC SILICON Reactivated after 21 April 2004 and may be used for either new or existing design acquisitions. This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535. 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic silicon, precision voltage references. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF38535, (see 6.3) 1.2 Part or identifying number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein. 1.2.1 Device types. The device types are internally compensated and are as follows: Device type 01, 04 02, 06 03 05 07 08 09 Circuit Precision voltage reference, 6.9 V with temperature stabilizer Precision voltage reference, 6.9 V without temperature stabilizer Precision voltage reference, 10 V with guaranteed long term stability Precision voltage reference, 6.9 V with guaranteed long term stability Precision voltage reference, 5 V with ultra low drift Precision voltage reference, 7 V with ultra low drift Precision voltage reference, 10 V with ultra low drift 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outline. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter G X Y Descriptive designator Terminals MACY1-X8 See figure 1 See figure 2 8 2 4 Package style Can Can Can Comments, suggestions, or questions on this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43216-5000, or emailed to [email protected]. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at www.dodssp.daps.mil. AMSC N/A FSC 5962 MIL-M-38510/124D 1.3 Absolute maximum ratings. Voltage reference current Device types 01, 02, 04, 05, and 06 ............................................. Forward current Device types 01, 02, 04, 05, and 06 ............................................. Temperature stabilizer voltage Device types 01, 04, and 05 ......................................................... Reference to substrate voltage Device types 01, 04, and 05 (negative terminal of stabilizer) ........ -0.1 V Device type 03 Maximum input voltage .................................................................... Minimum input voltage ..................................................................... Maximum power dissipation ............................................................. Open circuit duration ........................................................................ 40 V 12 V 500 mW Indefinite 1/ Device types 07, 08, and 09 Maximum input voltage Device types 07, 08, and 09 ......................................................... Input-output voltage differential Device types 07, 08, and 09 ......................................................... Output to ground voltage (shunt mode current limit) Device types 07 and 08 ................................................................ Device type 09 .............................................................................. Trim pin to ground voltage Positive ......................................................................................... Negative ....................................................................................... 20 mA 1 mA 40 V 44 V 35 V 10 V 16 V Equal to VO -20 V Device types 07 and 09 Output short circuit duration VIN = 35 V .................................................................................... 10 s VIN ≤ 20 V ..................................................................................... Indefinite Device types 07, 08, and 09 Lead temperature (soldering, 10 seconds) ....................................... +300°C Junction temperature (TJ) ................................................................ +175°C Storage temperature range .............................................................. -55°C to +150°C 1.4 Recommended operating conditions. Voltage reference current output Device type 03 .............................................................................. 0 mA to 8 mA Voltage reference current range Device types 01 and 02 ................................................................ 0.5 mA to 15 mA Operating ambient temperature range (TA) ...................................... -55°C to +125°C 1.5 Power and thermal characteristics. Package Case outlines Maximum allowable power dissipation Maximum θJA 150°C/W 200°C/W 8 lead can G 330 mW at TA = +125°C 45°C/W 2 lead can X 4 lead can Y 115 mW at TA = +125°C 140 mW at TA = +125°C 43°C/W --- ______ 1/ Output may be shorted to ground or supply. Rating applies to +125°C case temperature. 2 Maximum θJC 435°C/W MIL-M-38510/124D 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard for Microelectronics. - Interface Standard Electronic Component Case Outlines. (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein the text of this document shall takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.4). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Circuit diagrams and terminal connections. The circuit diagrams and terminal connections shall be as specified on figure 8. 3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request. 3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3. 3.3.4 Package and sealing material. Packaging and sealing material shall be in accordance with MIL-PRF-38510. 3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply over the full recommended operating ambient temperature range, unless otherwise specified. 3 MIL-M-38510/124D TABLE I. Electrical performance characteristics for device types 01, 02, 04, 05, and 06. Test Reference voltage Symbol VR Conditions -55°C ≤ TA ≤ +125°C see 3.5 unless otherwise specified 0.5 mA ≤ IR ≤ 10 mA, Device type Limits Unit Min 6.80 Max 7.10 02,06 6.70 7.20 01,04, 05 -9 9 01,04, 05 -12 12 0.6 mA ≤ IR ≤ 15 mA, TA = +25°C 02,06 -14 14 0.6 mA ≤ IR ≤ 15 mA, 02,06 -18 18 01,05 -0.5 0.5 04 -1.0 1.0 01,05 -10 10 +85°C ≤ TA ≤ +125°C 04 -15 15 IR = 1.0 mA, 02 -10 10 -55°C ≤ TA ≤ +125°C 06 -20 20 01,04, 05 0 1 02,06 0 1 01,04, 05 0 20 02,06 0 20 01,04, 05 0 50 02,06 0 50 01,04, 05 V VS = 30 V, TA = +25°C 0.6 mA ≤ IR ≤ 15 mA, TA = +25°C Reference voltage change with current ∆VR 0.5 mA ≤ IR ≤ 10 mA, VS = 30 V, (current) TA = +25°C 0.5 mA ≤ IR ≤ 10 mA, VS = 30 V, -55°C ≤ TA ≤ +125°C mV -55°C ≤ TA ≤ +125°C Reference voltage temperature ∆VR / ∆T VS = 30 V, IR = 1.0 mA, -55°C ≤ TA ≤ +85°C VS = 30 V, IR = 1.0 mA, Dynamic impedance ZD VS = 30 V, IR = 1.0 mA, ei = 1.0 V, ppm/°C Ohm f = 400 Hz, see figure 3, TA = +25°C IR = 1.0 mA, ei = 1.0 V, f = 400 Hz, see figure 3, TA = +25°C Noise NO VS = 30 V, BW = 10 Hz to 10 kHz, IR = 1.0 mA, see figure 4, TA = +25°C BW = 10 Hz to 10 kHz, µV RMS IR = 1.0 mA, see figure 4, TA = +25°C VS = 30 V, BW = 0.1 Hz to 10 kHz, IR = 1.0 mA, see figure 4, TA = +25°C BW = 0.1 Hz to 10 kHz, IR = 1.0 mA, see figure 4, TA = +25°C See footnotes at end of table. 4 µVp-p MIL-M-38510/124D TABLE I. Electrical performance characteristics for device types 01, 02, 04, 05, and 06 – Continued. Test Temperature stabilizer supply current Symbol IS Conditions -55°C ≤ TA ≤ +125°C see 3.5 unless otherwise specified VS = 40 V, IR = 0 mA, TA = +25°C Device type 01,04, 05 Limits Unit Min 4 Max 20 VS = 40 V, IR = 0 mA, TA = -55°C 01,04, 05 6 40 mA Initial temperature stabilizer supply current ISI 9 V ≤ VS ≤ 40 V, IR = 0 mA, TA = +25°C 01,04, 05 --- 200 mA Reference voltage temperature cycling hysteresis ∆VR VS = 30 V, IR = 1 mA, see figure 5, -10 10 mV (temp -55°C ≤ TA ≤ +125°C 01,04, 05 cycle) IR = 1 mA, see figure 5, 02,06 -1 1 05 -20 20 -55°C ≤ TA ≤ +125°C Long term stability ∆VR / VS = 30 V, IR = 1 mA ±10 %, ∆Time Time = 600 hours, TA = +25°C See footnotes at end of table. 5 ppm / 600 hrs MIL-M-38510/124D TABLE I. Electrical performance characteristics for device types 03. Test Symbol Reference voltage VO Output adjustment VO adj+ range Conditions -55°C ≤ TA ≤ +125°C see 3.5 and figure 6 unless otherwise specified VS = 15 V, IL = 0 mA, TA = +25°C Device type VRLINE Unit Min 9.97 Max 10.03 VS = 15 V, IL = 0 mA, TA = +125°C 9.958 10.042 VS = 15 V, IL = 0 mA, TA = -55°C 9.962 10.038 0.3 --- --- -0.3 -0.010 0.010 -0.015 0.015 -0.008 0.008 -0.012 0.012 --- 1.4 --- 2.0 VS = 15 V, IL = 0 mA, TA = +25°C 03 03 VO adj- Line regulation Limits VS = 13 V to 33 V, IL = 0 mA, TA = +25°C 03 VS = 13 V to 33 V, IL = 0 mA, V V %/V -55°C ≤ TA ≤ +125°C Load regulation VRLOAD VS = 15 V, IL = 0 to 10 mA, TA = +25°C 03 VS = 15 V, IL = 0 to 8 mA, %/mA -55°C ≤ TA ≤ +125°C Quiescent supply ICC current VS = 15 V, IL = 0 mA, TA = +25°C 03 VS = 15 V, IL = 0 mA, mA -55°C ≤ TA ≤ +125°C Output short circuit current Output voltage 1/ temperature coefficient IOS VS = 15 V, VO = 0 V, TA = +25°C 03 --- 50 ∆VOUT1 / ∆T VS = 15 V, IL = 0 mA, 03 -10 10 ∆VOUT2 / ∆T Output voltage noise enp-p mA ppm / °C -55°C ≤ TA ≤ +25°C -12 12 03 --- 30 µVp-p 03 -50 50 ppm / 1000 hrs. VS = 15 V, IL = 0 mA, +25°C ≤ TA ≤ +125°C VS = 15 V, IL = 0 mA, TA = +25°C, BW = 0.1 Hz to 10 Hz, see figure 7 Long term drift 2/ VLTD VS = 15 V, IL = 0 mA, TA = +40°C See footnotes at end of table. 6 MIL-M-38510/124D TABLE I. Electrical performance characteristics for device type 07. Test Reference voltage Line regulation Symbol VO 3/ VRLINE 4/ Load regulation VRLOAD 4/ Conditions -55°C ≤ TA ≤ +125°C VIN = 10 V, IOUT = 0 mA, see 3.5 and figure 8 unless otherwise specified TA = +25°C Device type Limits Unit Min Max 4.950 5.050 TA = +125°C 4.9475 5.0525 TA = -55°C 4.948 5.052 -0.17 0.17 VIN = 10 V, 7.2 V, TA = +125°C, -55°C -0.28 0.28 VIN = 10 V, 40 V, TA = +25°C -0.9 0.9 VIN = 10 V, 40 V, TA = +125°C, -55°C -1.5 1.5 -5.0 5.0 IOUT = 0 mA, 10 mA, TA = +125°C, -55°C -7.5 7.5 IOUT = 0 mA, -10 mA, TA = +25°C -1.0 1.0 IOUT = 0 mA, -10 mA, TA = +125°C, -55°C -1.75 1.75 VIN = 10 V, 7.2 V, TA = +25°C IOUT = 0 mA, 10 mA, TA = +25°C 07 07 07 V mV mV Trim voltage VTRIM ITRIM = 0 mA, TA = +25°C 07 -3.5 --- V Delta voltage / ∆VO / TA = -55°C to +25°C 07 --- 5.0 ppm / °C ∆T TA = +25°C to +125°C --- 5.0 Noise NO 5/ VIN = 15 V, 10 Hz ≤ f ≤ 1 kHz, TA = +25°C 07 --- 3.5 µV RMS Supply current ICC TA = +25°C 07 --- 1.2 mA --- 1.5 -50 --- delta temperature TA = +125°C, -55°C Output short circuit current IOS VO = 0 V, TA = +25°C See footnotes at end of table. 7 07 mA MIL-M-38510/124D TABLE I. Electrical performance characteristics for device type 08. Test Reference voltage Line regulation Symbol VO 3/ VRLINE 4/ Load regulation VRLOAD 4/ Minimum current IMIN shunt mode Shunt mode regulation Conditions -55°C ≤ TA ≤ +125°C VIN = 12 V, IOUT = 0 mA, see 3.5 and figure 8 unless otherwise specified TA = +25°C Device type Limits Min Max 6.950 7.050 TA = +125°C 6.9465 7.0535 TA = -55°C 6.9472 7.0528 -0.1 0.1 VIN = 12 V, 8.5 V, TA = +125°C, -55°C -0.2 0.2 VIN = 12 V, 40 V, TA = +25°C -0.39 0.39 VIN = 12 V, 40 V, TA = +125°C, -55°C -0.78 0.78 -1.75 1.75 -2.8 2.8 VIN = 12 V, 8.5 V, TA = +25°C IOUT = 0 mA, -10 mA, TA = +25°C 08 08 08 IOUT = 0 mA, -10 mA, TA = +125°C, -55°C VIN is open, TA = +25°C 08 1 VIN is open, IOUT = 1.2 mA, 10 mA, V mV mV mA 1.2 VIN is open, TA = +125°C, -55°C VSHUNT Unit 08 -6.16 6.16 mV -9.24 9.24 --- 5.0 ppm / --- 5.0 °C TA = +25°C 4/ 6/ VIN is open, IOUT = 1.2 mA, 10 mA, TA = +125°C, -55°C Delta voltage / 08 ∆VO / TA = -55°C to +25°C ∆T TA = +25°C to +125°C Noise NO 5/ VIN = 15 V, 10 Hz ≤ f ≤ 1 kHz 08 --- 4 Supply current ICC TA = +25°C 08 --- 1.2 --- 1.5 -50 --- delta temperature TA = +125°C, -55°C Output short circuit current IOS VIN = 12 V, VO = 0 V, TA = +25°C See footnotes at end of table. 8 08 µV RMS mA mA MIL-M-38510/124D TABLE I. Electrical performance characteristics for device type 09. Test Reference voltage Line regulation Symbol VO 3/ VRLINE 4/ Load regulation VRLOAD 4/ Minimum current shunt IMIN mode Shunt mode regulation Conditions -55°C ≤ TA ≤ +125°C VIN = 15 V, IOUT = 0 mA, see 3.5 and figure 8 unless otherwise specified TA = +25°C Device type Limits Min Max 9.950 10.050 TA = +125°C 9.945 10.055 TA = -55°C 9.946 10.054 -0.12 0.12 VIN = 11.5 V, 14.5 V, TA = +125°C, -55°C -0.18 0.18 VIN = 14.5 V, 40 V, TA = +25°C -0.5 0.5 VIN = 14.5 V, 40 V, TA = +125°C, -55°C -1.0 1.0 -2.5 2.5 -4.0 4.0 VIN = 11.5 V, 14.5 V, TA = +25°C IOUT = 0 mA, -10 mA, TA = +25°C 09 09 09 IOUT = 0 mA, -10 mA, TA = +125°C, -55°C VIN is open, TA = +25°C 09 1.5 VIN is open, IOUT = 1.7 mA, 10 mA, V mV mV mA 1.7 VIN is open, TA = +125°C, -55°C VSHUNT Unit 09 -8.3 8.3 -12.4 12.4 mV TA = +25°C 4/ 6/ VIN is open, IOUT = 1.7 mA, 10 mA, TA = +125°C, -55°C Trim voltage VTRIM ITRIM = 0 mA, TA = +25°C 09 -4.3 --- V Delta voltage / ∆VO / TA = -55°C to +25°C 09 --- 5.0 ppm / ∆T TA = +25°C to +125°C --- 5.0 °C Noise NO 5/ VIN = 15 V, 10 Hz ≤ f ≤ 1 kHz, TA = +25°C 09 --- 6 Supply current ICC TA = +25°C 09 --- 1.7 --- 2.0 -50 --- delta temperature TA = +125°C, -55°C Output short circuit current IOS VO = 0 V, TA = +25°C See footnotes at end of table. 9 09 µV RMS mA mA MIL-M-38510/124D TABLE I. Electrical performance characteristics – Continued. 1/ Output voltage temperature coefficient is defined as the absolute difference between the output voltage at TA = +125°C and the output voltage at TA = -55°C divided by the product of the absolute temperature range and the output voltage multiplied by one million, example: 6 ∆VOUT1 / ∆T = [ ( VO (+25°C) – VO (-55°C) ) / ((+80°C) 10 V) ] x 10 . 6 ∆VOUT2 / ∆T = [ ( VO (+125°C) – VO (+25°C) ) / ((+100°C) 10 V) ] x 10 . 2/ Long term drift specification applies only to device under continuous power. 3/ Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically less than 0.005 percent 4/ Line, load, and shunt mode regulation are measured on a pulse basis. Pulse is not to exceed 30 ms. 5/ RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1kHz. 6/ Shunt voltage is measured with the input open. With the input connected, the shunt mode current can be reduced to 0 mA. Load regulation will remain the same. 3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. 3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. 3.7.1 Serialization. All class S devices shall be serialized in accordance with MIL-PRF-38535. 3.7.2 Correctness of indexing and markings. All devices shall be subjected to the final electrical tests specified in table II after part marking to verify that they are correctly indexed and identified by part number. Optionally, an approved electrical test may be devised especially for this requirement. 3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 59 (see MIL-PRF-38535, appendix A). 10 MIL-M-38510/124D TABLE II. Electrical test requirements. Subgroups (see table III) Class S Class B 1/ devices devices MIL-PRF-38535 test requirements Interim electrical parameters 1 1 Final electrical test parameters 1*, 2, 3 1*, 2, 3 Group A test requirements 1, 2, 3, 4 1, 2, 3, 4 Group B electrical test parameters when using the method 5005 QCI option Group C end-point electrical parameters Group D end-point electrical parameters Additional electrical subgroups for Group D periodic inspections 1, 2, 3, 5 and table IV delta limits 1, 2, 3, 5 and table IV delta limits 1, 2, 3 * 1/ N/A N/A 1 and table IV delta limits 1 5 PDA applies to subgroup 1. Subgroup 4, as defined in table III (tests 18-20, for device types 01, 04, and 05; tests 13-15, device types 02 and 06) are used for initial and redesign qualification (class B only). 4. VERIFICATION. 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. NOTE: If accelerated high temperature test conditions are used, the device manufacturer shall ensure that at least 85 percent of the applied voltage is dropped across the device at temperature. The device is not considered functional under accelerated test conditions. b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. c. Additional screening for space level product shall be as specified in MIL-PRF-38535. 11 MIL-M-38510/124D 4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 6, 7, 8, 9, 10, and 11 shall be omitted. 4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End point electrical parameters shall be as specified in table II herein. b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. 4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. a. End point electrical parameters shall be as specified in table II herein. b. A special subgroup shall be added to the group D inspection requirements and shall consists of the tests, conditions, and limits specified for subgroup 5 of group A. The accept sample number for the subgroup shall be 15 devices with 0 failures for both classes. 4.5 Methods of inspection. Methods of inspection shall be specified and as follows. 4.5.1 Voltage and current. All voltage values given are referenced to the ground terminal of the device under test (DUT). Currents given are conventional current and are positive when flowing into the referenced terminal. 4.5.2 Life test and burn-in cooldown procedure. When devices are measured at +25°C following application of the steady state life or burn-in test condition, they shall be cooled within +10°C of their power stable condition prior to removal of the bias. 12 MIL-M-38510/124D Symbol A φb φb1 φD φD1 e e1 F K K1 K2 L L1 L2 α Dimensions Inches Millimeters Min Max Min Max .075 .093 1.90 2.36 .016 .019 0.41 0.48 .016 .021 0.41 0.53 .209 .219 5.31 5.56 .178 .195 4.52 4.95 .100 BSC 2.54 BSC .050 BSC 1.27 BSC --.050 --1.27 .036 .046 .91 1.17 .028 .048 .71 1.22 .009 .041 .23 1.04 .500 --12.70 ----.050 --1.27 .250 --6.35 --BSC BSC 45° 45° Notes 2 2 4 4 3 4 NOTES: 1. Dimensions are in inches. 2. (All leads) φb applies between L1 and L2, φb1 applies between L2 and .500 (12.70 mm) from the reference plane. Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the reference plane. 3. Measured from the maximum diameter of the product. 4. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane .054 (1.37 mm) + .001 (.03 mm) - .000 (.00 mm) below the base plane of the product shall be within .007 (.18 mm) of their true position relative to a maximum width tab. 5. The product may be measured by direct methods or by gauge. 6. Metric equivalents are given for general information only. FIGURE 1. Case outline X. 13 MIL-M-38510/124D Symbol A φb φb1 φD e e1 F k k1 L L1 m m1 α Dimensions Inches Millimeters Min Max Min Max .224 .234 5.69 5.94 .016 .019 0.41 0.48 .016 .021 0.41 0.53 Notes 2 .398 .100 .050 .409 BSC BSC 10.11 2.54 1.27 10.39 BSC BSC 4 4 .010 .047 .008 BSC BSC BSC 0.25 1.19 0.20 BSC BSC BSC 3 .400 .200 ----- 10.16 5.08 ----- .145 .175 BSC BSC 3.68 4.44 BSC BSC 45° BSC 45° BSC 4 NOTES: 1. Dimensions are in inches. 2. (All leads) φb applies between L1 and the seating plane. φb1 applies between L1 and .400 (10.16 mm) from the seating plane. 3. Measured from the maximum diameter of the product. 4. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane .054 (1.37 mm) + .001 (.03 mm) - .000 (.00 mm) below the base plane of the product shall be within .007 (.18 mm) of their true position relative to a maximum width tab. 5. The product may be measured by direct methods or by gauge. 6. Metric equivalents are given for general information only. FIGURE 1. Case outline Y. 14 MIL-M-38510/124D NOTES: Test conditions for reference device current, IR, and for heater voltage, VS are defined in table III. FIGURE 3. Dynamic impedance test circuit. FIGURE 4. Noise test circuit. 15 MIL-M-38510/124D NOTE: Test conditions for reference device current, IR, and for heater voltage, VS are defined in table III. FIGURE 5. Reference voltage. Figure 6. Test circuit for static tests. 16 MIL-M-38510/124D NOTES: 1. Test time = 10 seconds. 2. VOUT measured with differential amplifier 7A22 and lower frequency set to 0.1 Hz. Figure 7. Low frequency noise test circuit. 17 MIL-M-38510/124D NOTE: The 60 Hz notch filter is used in noisy environments. Figure 7. Low frequency noise test circuit – Continued. 18 MIL-M-38510/124D NOTES: 1. No trim pin on device type 08 (do not connect external circuitry to pin 5). 2. For device types 07, 08, and 09, pins 1, 3, 7, and 8 are connected internally. Do not connect external circuitry to these pins. FIGURE 8. Circuit diagrams and terminal connections. 19 20 ISI1 ISI2 ∆VR 1/ temp cycle TA = +25°C 1/ NO 4 VS = 30 V IR = 1.0 mA BW = 0.1 Hz to 10 Hz VS = 40 V IR = 0 mA VS = 9 V IR = 0 mA VS = 30 V IR = 1 mA VS = 30 V IR = 1 mA VS = 30 V IR = 1 mA IR = 0 mA IR = 1.0 mA IR = 0.5 mA IR = 10 mA IR = 1.0 mA IR = 0.5 mA IR = 10 mA IR = 1.0 mA VR13 VR14 VR15 VR12 VR11 VR9 VR10 VR8 VR6 VR7 VR5 ∆VR = VR13 – VR14 ∆VR = VR14 – VR15 NO = VR12 -10 -10 --- 0 6 -0.5 -12 ∆VR = VR9 – VR10 ∆VR / ∆T = (VR11 - VR5 ) / 140 -10 -12 --- 4 0 ∆VR / ∆T = (VR8 - VR5 ) / 40 ∆VR = VR6 – VR7 NO = VR4 -9 .5 mA ≤ IR ≤ 10 mA Min 6.80 6.80 6.80 ∆VR = VR1 – VR3 Equations IR = .5 mA IR = 1.0 mA IR = 10 mA VR4 value Measured Limit 10 10 200 50 40 0.5 12 10 12 --- 20 20 9 7.10 7.10 7.10 Max mV mA µVp-p °C mA ppm / °C mV ppm / mV --- mA µV RMS mV V Unit Following the measurement (VR13), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for measurement (VR14). Following the measurement (VR14), the temperature TA shall be cycled to –55°C for 1 hour and returned to +25°C for measurement (VR15). 16 17 18 19 20 15 VS = 40 V 14 ∆VR / ∆T IS TA = -55°C VS = 30 V VS = 30 V VS = 30 V 11 12 13 VS = 30 V 10 ∆VR / ∆T ∆VR current TA = +125°C 3 VS = 30 V VS = 30 V VS = 30 V 8 9 7 VS = 30 V VS = 30 V VS = 30 V ∆VR current TA = +85°C 2 2 6 VS = 30 V IR = 1.0 mA BW = 10 Hz to 10 kHz VS = 40 V IR = 0 mA 5 IS ∆VR / ∆T VS = 30 V 4 ∆VR current NO TA = +25°C 1 2 3 Current VR1 VR2 VR3 Voltage 1 no. Conditions see figures 3, 4, and 5 unless otherwise specified Symbol Subgroup Test TABLE III. Group A inspection for all device type 01. MIL-M-38510/124D 21 ∆VR / ∆T NO ∆VR 1/ temp cycle TA = -55°C 4 TA = +25°C 1/ 9 10 IR = 1.0 mA BW = 0.1 Hz to 10 Hz IR = 1.0 mA IR = 1.0 mA IR = 1.0 mA VR12 VR13 VR14 VR11 VR8 VR9 VR10 VR7 VR5 VR6 ∆VR = VR12 – VR13 ∆VR = VR13 – VR14 NO = VR11 -1 -1 0 -10 -18 ∆VR = VR8 – VR9 ∆VR / ∆T = (VR2 - VR10 ) / 80 -10 -18 ∆VR / ∆T = (VR7 - VR2 ) / 100 ∆VR = VR5 – VR6 0 Limits 1 1 50 10 18 10 18 20 14 7.20 7.20 7.20 Max mV °C µVp-p ppm / °C mV ppm / mV µV RMS mV V Unit Following the measurement (VR12), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for measurement (VR13). Following the measurement (VR13), the temperature TA shall be cycled to –55°C for 1 hour and returned to +25°C for measurement (VR14). 13 14 15 12 IR = 1.0 mA IR = 0.6 mA IR = 15 mA 8 ∆VR / ∆T ∆VR current TA = +125°C 3 11 IR = 1.0 mA 6 7 ∆VR current NO = VR4 -14 Min .6 mA ≤ IR ≤ 15 mA ∆VR = VR1 – VR3 Equations 6.70 6.70 6.70 VR4 value Measured IR = .6 mA IR = 1.0 mA IR = 15 mA Current IR = 1.0 mA BW = 10 Hz to 10 kHz IR = 0.6 mA IR = 15 mA Voltage Conditions see figures 3, 4, and 5 unless otherwise specified 2 5 4 ∆VR current NO TA = +25°C 1 2 3 VR1 VR2 VR3 1 no. Test Symbol Subgroup TABLE III. Group A inspection for all device type 02. MIL-M-38510/124D VS = 15 V IL = 0 mA TRIM 10 V 2 22 4 TA = +25°C 5 TA = +40°C TA = -55°C 3 TA = +125°C 2 TA = +25°C VS = 15 V 1 VO VS = 13 V VS = 33 V VS = 15 V VS = 15 V VS = 15 V VO = 15 V 4 5 6 7 8 9 VO adj- VRLINE VRLOAD IOS VS = 15 V VS = 33 V VS = 15 V VS = 15 V 12 13 14 15 16 VO VRLINE VRLOAD ∆VOUT/∆T 25 ∆VOUT/∆T VLTD 23 VRLOAD 24 VS = 15 V VS = 15 V 21 22 VRLINE enp-p VS = 13 V VS = 33 V 19 20 VO IL = 0 mA IL = 0 mA IL = 8 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 8 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 0 mA IL = 10 mA IL = 0 mA VS = 15 V IL = 0 mA VS = 15 V IL = 0 mA BW = 0.1 Hz to 10 Hz VS = 15 V VS = 15 V VS = 15 V 17 18 ICC VS = 15 V VS = 15 V VS = 15 V 10 11 ICC VS = 15 V IL = 0 mA VS = 15 V TRIM 10 V 3 VO adj+ IL = 0 mA Current ICC Voltage 1 no. Conditions see figures 6 and 7 unless otherwise specified Symbol Subgroup Test V19 V17 V18 V15 V16 V14 V13 V9 V10 V11 V12 V8 V4 V5 V6 V7 V3 V2 V1 value Measured Device under continuous power for 1000 hours. 6 ∆VOUT/∆T = [ ( V1 – V19 ) / (80°C) (10 V) ] x 10 VRLOAD = [ ( V17 – V18 ) / (10 V) (8 mA) ] x 100 VLINE = [ ( V15 – V16 ) / (10 V) (20 V) ] x 100 6 ∆VOUT/∆T = [ ( V13 – V1 ) / (100°C) (10 V) ] x 10 VRLOAD = [ ( V11 – V12 ) / (10 V) (8 mA) ] x 100 VRLINE = [ ( V9 – V10 ) / (10 V) (20 V) ] x 100 VLINE = [ ( V6 – V7 ) / (10 V) (10 mA) ] x 100 VLINE = [ ( V4 – V5 ) / (10 V) (20 V) ] x 100 ( V1 – V3 ) 10 ( V1 – V2 ) 10 Equations TABLE III. Group A inspection for all device type 03. -50 --- -10 -0.012 -0.015 9.962 --- -12 -0.012 -0.015 9.958 --- --- -0.008 -0.010 --- 0.3 9.970 --- Min 2.0 50 0.008 0.010 -0.3 --- 10.030 1.4 Max 50 30 10 0.012 0.015 10.038 2.0 12 0.012 0.015 10.0420 Limits ppm / 1000 hrs µVp-p ppm / °C % / mA %/V V mA ppm / °C %/mA %/V V mA mA % / mA %/V V V V mA Unit MIL-M-38510/124D 23 18 19 20 ISI1 ISI2 ∆VR 1/ temp cycle TA = +25°C 1/ 16 17 NO 4 VS = 30 V VS = 30 V VS = 30 V IR = 1 mA IR = 1 mA IR = 1 mA VS = 30 V IR = 1.0 mA BW = 0.1 Hz to 10 Hz VS = 40 V IR = 0 mA VS = 9 V IR = 0 mA IR = 0 mA IR = 1.0 mA IR = 0.5 mA IR = 10 mA IR = 0.5 mA IR = 10 mA IR = 1.0 mA IR = 1.0 mA VR13 VR14 VR15 VR12 VR11 VR9 VR10 VR6 VR7 VR8 VR5 ∆VR = VR13 – VR14 ∆VR = VR14 – VR15 NO = VR12 -10 -10 --- 0 6 -1.0 -12 ∆VR = VR9 – VR10 ∆VR / ∆T = (VR11 - VR5 ) / 140 -15 -12 --- 4 0 ∆VR / ∆T = (VR8 - VR5 ) / 40 ∆VR = VR6 – VR7 NO = VR4 -9 .5 mA ≤ IR ≤ 10 mA Min 6.80 6.80 6.80 ∆VR = VR1 – VR3 Equations IR = .5 mA IR = 1.0 mA IR = 10 mA VR4 value Measured Limits 10 10 200 50 40 1.0 12 15 12 --- 20 20 9 7.10 7.10 7.10 Max mV mA µVp-p °C mA ppm / °C mV ppm / mV --- mA µV RMS mV V Unit Following the measurement (VR13), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for measurement (VR14). Following the measurement (VR14), the temperature TA shall be cycled to –55°C for 1 hour and returned to +25°C for measurement (VR15). 15 VS = 40 V 14 ∆VR / ∆T IS TA = -55°C VS = 30 V VS = 30 V VS = 30 V 11 12 13 VS = 30 V 10 ∆VR / ∆T ∆VR current TA = +125°C 3 VS = 30 V VS = 30 V VS = 30 V 8 9 7 VS = 30 V VS = 30 V VS = 30 V ∆VR current TA = +85°C 2 2 6 VS = 30 V IR = 1.0 mA BW = 10 Hz to 10 kHz VS = 40 V IR = 0 mA 5 IS ∆VR / ∆T VS = 30 V 4 ∆VR current NO TA = +25°C 1 2 3 Current VR1 VR2 VR3 Voltage 1 no. Conditions see figures 3, 4, and 5 unless otherwise specified Symbol Subgroup Test TABLE III. Group A inspection for all device type 04. MIL-M-38510/124D 24 18 19 20 21 ISI1 ISI2 ∆VR 1/ temp cycle ∆VR / ∆time TA = +25°C 1/ 15 VS = 30 V VS = 30 V VS = 30 V VS = 30 V IR = 1 mA IR = 1 mA IR = 1 mA IR = 1 mA VS = 30 V IR = 1.0 mA BW = 0.1 Hz to 10 Hz VS = 40 V IR = 0 mA VS = 9 V IR = 0 mA IR = 0 mA IR = 1.0 mA IR = 0.5 mA IR = 10 mA IR = 1.0 mA IR = 0.5 mA IR = 10 mA IR = 1.0 mA VR13 VR14 VR15 VR16 VR12 VR11 VR9 VR10 VR8 VR6 VR7 VR5 ∆VR = VR13 – VR14 ∆VR = VR14 – VR15 ∆VR = VR16 – VR2 NO = VR12 -10 -10 -20 --- 0 6 -0.5 -12 ∆VR = VR9 – VR10 ∆VR / ∆T = (VR11 - VR5 ) / 140 -10 -12 --- 4 0 ∆VR / ∆T = (VR8 - VR5 ) / 40 ∆VR = VR6 – VR7 NO = VR4 -9 .5 mA ≤ IR ≤ 10 mA Min 6.80 6.80 6.80 ∆VR = VR1 – VR3 Equation IR = .5 mA IR = 1.0 mA IR = 10 mA VR4 value Measured Limits 10 10 20 200 50 40 0.5 12 10 12 --- 20 20 9 7.10 7.10 7.10 Max ppm / 600 hrs mV mA µVp-p °C mA ppm / °C mV ppm / mV --- mA µV RMS mV V Unit Following the measurement (VR13), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for measurement (VR14). Following the measurement (VR14), the temperature TA shall be cycled to –55°C for 1 hour and returned to +25°C for measurement (VR15). TA = +25°C 5 16 17 NO 4 VS = 40 V 14 ∆VR / ∆T IS TA = -55°C VS = 30 V VS = 30 V VS = 30 V 11 12 13 VS = 30 V 10 ∆VR / ∆T ∆VR current TA = +125°C 3 VS = 30 V VS = 30 V VS = 30 V 8 9 7 VS = 30 V VS = 30 V VS = 30 V ∆VR current TA = +85°C 2 2 6 VS = 30 V IR = 1.0 mA BW = 10 Hz to 10 kHz VS = 40 V IR = 0 mA 5 IS ∆VR / ∆T VS = 30 V 4 ∆VR current NO TA = +25°C 1 2 3 Current VR1 VR2 VR3 Voltage 1 no. Conditions see figures 3, 4, and 5 unless otherwise specified Symbol Subgroup Test TABLE III. Group A inspection for all device type 05. MIL-M-38510/124D 25 1/ ∆VR 1/ temp cycle TA = +25°C VR12 VR13 VR14 VR11 VR10 VR8 VR9 VR7 VR5 VR6 ∆VR = VR12 – VR13 ∆VR = VR13 – VR14 NO = VR11 -1 -1 0 -20 -18 ∆VR = VR8 – VR9 ∆VR / ∆T = (VR2 - VR10 ) / 80 -20 -18 ∆VR / ∆T = (VR7 - VR2 ) / 100 ∆VR = VR5 – VR6 0 Limits 1 1 50 20 18 20 18 20 14 7.20 7.20 7.20 Max mV °C µVp-p ppm / °C mV ppm / mV µV RMS mV V Unit Following the measurement (VR12), the temperature TA shall be cycled to +125°C for 1 hour and returned to +25°C for measurement (VR13). Following the measurement (VR13), the temperature TA shall be cycled to –55°C for 1 hour and returned to +25°C for measurement (VR14). 13 14 15 IR = 1.0 mA BW = 0.1 Hz to 10 Hz IR = 1 mA IR = 1 mA IR = 1 mA ∆VR / ∆T NO TA = -55°C 4 12 9 10 IR = 1.0 mA IR = 0.6 mA IR = 15 mA 8 ∆VR / ∆T ∆VR current TA = +125°C 3 11 IR = 1.0 mA 6 7 ∆VR current NO = VR4 -14 Min .6 mA ≤ IR ≤ 15 mA ∆VR = VR1 – VR3 Equation 6.70 6.70 6.70 VR4 value Measured IR = .6 mA IR = 1.0 mA IR = 15 mA Current IR = 1.0 mA BW = 10 Hz to 10 kHz IR = 0.6 mA IR = 15 mA Voltage Conditions see figures 3, 4, and 5 unless otherwise specified 2 5 4 ∆VR current NO TA = +25°C 1 2 3 VR1 VR2 VR3 1 no. Test Symbol Subgroup TABLE III. Group A inspection for all device type 06. MIL-M-38510/124D V2 V3 V4 V5 V6 V7 I2 3 4 5 6 7 8 9 VRLINE 2/ VRLOAD 2/ VTRIM IOS 26 17 ∆VO / ∆T 25 ∆VO / ∆T ICC = I1 ∆VO / ∆T = (V14– V1) / 80 See figure 7 VRLOAD = V17 – V18 VRLOAD = V17 – V19 VRLINE = V14 – V15 VRLINE = V14 – V16 VO = V14 ICC = I4 ∆VO / ∆T = (V8 – V1) / 100 VRLOAD = V11 – V12 VRLOAD = V11 – V13 VRLINE = V8 – V9 VRLINE = V8 – V10 VO = V8 ICC = I3 IOS = I2 VTRIM = V7 VRLOAD = V4 – V5 VRLOAD = V4 – V6 VRLINE = V1 – V2 VRLINE = V1 – V3 VO = V1 --- -7.5 -1.75 -0.28 -1.5 4.948 --- --- -7.5 -1.75 -0.28 -1.5 4.9475 --- -50 3.5 -5.0 -1.0 -0.17 -0.9 4.950 3.5 5 7.5 1.75 0.28 1.5 5.052 1.5 5 7.5 1.75 0.28 1.5 5.0525 1.5 --- --- 5.0 1.0 0.17 0.9 5.050 1.2 Max RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1 kHz. --- 2 2 2 2 2 2 1 2 2 2 2 2 2 1 2 3 2 2 2 2 2 2 --- Min 3/ 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 1 Limits Line and load regulation are measured on a pulse basis. Pulse is not to exceed 30 ms. 0 mA 0 mA 10 mA -10 mA 0 mA 0 mA 0 mA 0 mA 0 mA 10 mA -10 mA 0 mA 0 mA 0 mA 0 mA 0V 0 mA 0 mA 10 mA -10 mA 0 mA 0 mA 0 mA 3 0 mA Equation 2/ 15 V 10 V 10 V 10 V 7.2 V 40 V 10 V 10 V 10 V 10 V 10 V 7.2 V 40 V 10 V 10 V 10 V 10 V 10 V 10 V 10 V 7.2 V 40 V 10 V 2 0 mA Pin measurement Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically less that 0.005 percent. N1 V17 V18 V19 22 23 24 VRLOAD 2/ NO 3/ V15 V16 20 21 26 V14 19 VRLINE 2/ VO 1/ 14 15 16 VRLOAD 2/ I4 V11 V12 V13 12 13 VRLINE 2/ 18 V9 V10 11 ICC I3 V8 10 ICC VO 1/ 1 10 V see figure 6 Adapter pin number 1/ TA = +25°C 4 TA = -55°C 3 TA = +125°C 2 TA = +25°C I1 V1 2 ICC VO 1/ value 1 Measurement 1 no. Test Symbol Subgroup TABLE III. Group A inspection for all device type 07. µV RMS ppm/°C mV mV mV mV V ppm/°C mA mV mV mV mV V mA mA V mV mV mV mV V mA Unit MIL-M-38510/124D 1/ 2/ 3/ 4/ V2 V3 V4 V5 V6 I2 V8 V9 I3 3 4 5 6 7 8 9 10 11 VRLINE 2/ VRLOAD 2/ IMIN VSHUNT 2/ 3/ IOS 27 V24 I7 V26 V27 29 30 31 32 33 IMIN VSHUNT 2/ 3/ ∆VO / ∆T N1 V22 V23 27 28 VRLOAD 2/ NO 4/ V20 V21 25 26 VRLINE 2/ 34 I6 V19 22 ∆VO / ∆T 24 V17 V18 20 21 VSHUNT 2/ 3/ 23 V15 I5 18 19 IMIN ICC V13 V14 16 17 VRLOAD 2/ VO 1/ V10 V11 V12 13 14 15 VO 1/ VRLINE 2/ I4 12 ICC 15 V 0 mA 0 mA 12 V 12 V 0 mA 0 mA 8.5 V 40 V 12 V 12 V 0 mA 0 mA 0 mA 0 mA 8.5 V 40 V 12 V 12 V 12 V 12 V 12 V 0 mA 0 mA 0 mA 0 mA 8.5 V 40 V 12 V 12 V 12 V 12 V 1 0 mA V25 1.2 mA 10 mA 0 mA -10 mA 2 mA 0 mA 0 mA 0 mA 0 mA V16 1.2 mA 10 mA 2 mA 0 mA 0 mA 0 mA -10 mA 0 mA 0 mA 0V V7 1.2 mA 10 mA 2 mA 0 mA 0 mA 0 mA -10 mA 0 mA 0 mA 2 see figure 6 Adapter pin number --- 2 2 2 2 2 2 2 2 2 1 2 2 2 2 2 2 2 2 2 1 2 2 2 2 2 2 2 2 2 2 1 measurement Pin ∆VO / ∆T = (V19 – V1) /80 --- --- -2.8 --- -0.2 -0.78 6.9472 --- --- -9.24 --- -2.8 -0.2 -0.78 -9.24 See figure 7 Limits 6.9465 --- -50 -6.16 --- -1.75 -0.1 -0.39 6.950 --- Min VSHUNT = V27 – V26 VRLOAD = V22 – V23 V25 = V24 – 50 mV IMIN = I7 VRLINE = V19 – V20 VRLINE = V19 – V21 VO = V19 ICC = I6 ∆VO / ∆T = (V10 – V1) /100 VSHUNT = V18 – V17 V16 = V15 – 50 mV IMIN = I5 VRLOAD = V13 – V14 VRLINE = V10 – V11 VRLINE = V10 – V12 VO = V10 ICC = I4 IOS = I3 VSHUNT = V9 – V8 V7 = V6 – 50 mV IMIN = I2 VRLOAD = V4 – V5 VRLINE = V1 – V2 VRLINE = V1 – V3 VO = V1 ICC = I1 Equation 4 5 9.24 2.8 --1.2 0.2 0.78 7.0528 1.5 5 9.24 --1.2 2.8 0.2 0.78 7.0535 1.5 --- 6.16 --1 1.75 0.1 0.39 7.050 1.2 Max µV RMS ppm/°C mV mV mA mV mV V mA ppm/°C mV mA mV mV mV V mA mA mV mA mV mV mV V mA Unit Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically less that 0.005 percent. Line, load, and shunt mode regulation are measured on a pulse basis. Pulse is not to exceed 30 ms. Shunt voltage is measured with the input open. With the input connected, the shunt mode current can be reduced to 0 mA. Load regulation will remain the same. RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1 kHz. TA = +25°C 4 TA = -55°C 3 TA = +125°C 2 TA = +25°C I1 V1 1 2 ICC value VO 1/ Measurement 1 no. Symbol Subgroup Test TABLE III. Group A inspection for all device type 08. MIL-M-38510/124D 1/ 2/ 3/ 4/ V2 V3 V4 V5 V6 V7 I2 V9 V10 V11 I3 3 4 5 6 7 8 9 10 11 12 13 VRLINE 2/ VRLOAD 2/ IMIN VSHUNT 2/ 3/ VTRIM IOS 28 V26 V27 V28 I7 V30 V31 31 32 33 34 35 36 37 38 VRLOAD 2/ IMIN VSHUNT 2/ 3/ ∆VO / ∆T NO 4/ N1 V23 V24 V25 28 29 30 ∆VO / ∆T VRLINE 2/ 25 V22 V20 V21 23 24 VSHUNT 2/ 3/ 27 V18 I5 21 22 IMIN VO 1/ V16 V17 19 20 VRLOAD 2/ I6 V13 V14 V15 16 17 18 VRLINE 2/ 26 V12 15 VO 1/ ICC I4 14 ICC 15 V 0 mA 0 mA 0 mA 0 mA 15 V 15 V 11.5 V 14.5 V 40 V 15 V 15 V 0 mA 0 mA 0 mA 0 mA 15 V 15 V 11.5 V 14.5 V 40 V 15 V 15 V 15 V 15 V 0 mA 0 mA 0 mA 0 mA 11.5 V 14.5 V 40 V 15 V 15 V 15 V 0 mA V29 1.7 mA 10 mA 2 mA 0 mA -10 mA 0 mA 0 mA 0 mA 0 mA 0 mA V19 1.7 mA 10 mA 2 mA 0 mA -10 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0V 0 mA V8 1.7 mA 10 mA 2 mA 0 mA 0 mA 0 mA 0 mA -10 mA 0 mA 0 mA 3 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA 0 mA Pin --- 2 2 2 2 2 2 2 2 2 2 1 2 2 2 2 2 2 2 2 2 2 1 2 3 2 2 2 2 2 2 2 2 2 2 1 measurement ∆VO / ∆T = (V22 – V1) / 80 See figure 7 VSHUNT = V31 – V30 V29 = V28 – 50 mV IMIN = I7 VRLOAD = V27 – V26 VRLINE = V24 – V23 VRLINE = V24 – V25 VO = V22 --- --- -12.4 --- -4.0 -0.18 -1.0 9.946 6 5 12.4 --1.7 4.0 0.18 1.0 10.054 2.0 ∆VO / ∆T = (V12 – V1) / 100 --- 5 ICC = I6 12.4 --- --1.7 4.0 0.18 1.0 10.055 2.0 --- --- 8.3 --1.5 2.5 0.12 0.5 10.050 1.7 Max -12.4 --- -4.0 -0.18 -1.0 9.945 --- -50 4.3 -8.3 --- -2. 5 -0.12 -0.5 9.950 --- Min Limits VSHUNT = V21 – V20 V19 = V18 – 50 mV IMIN = I5 VRLOAD = V17 – V16 VRLINE = V14 – V13 VRLINE = V14 – V15 VO = V12 ICC = I4 IOS = I3 VTRIM = V11 VSHUNT = V9 – V10 V8 = V7 – 50 mV IMIN = I2 VRLOAD = V5 – V6 VRLINE = V3 – V2 VRLINE = V3 – V4 VO = V1 ICC = I1 Equation µV RMS ppm/°C mV mA mV mV mV V ppm/°C mA mV mA mV mV mV V mA mA V mV mA mV mV mV V mA Unit Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically less that 0.005 percent. Line, load, and shunt mode regulation are measured on a pulse basis. Pulse is not to exceed 30 ms. Shunt voltage is measured with the input open. With the input connected, the shunt mode current can be reduced to 0 mA. Load regulation will remain the same. RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1 kHz. TA = +25°C 4 TA = -55°C 3 TA = +125°C 2 TA = +25°C V1 2 VO 1/ 1 15 V 2 I1 value 1 ICC see figure 6 Adapter pin number Measurement 1 no. Test Symbol Subgroup TABLE III. Group A inspection for all device type 09. MIL-M-38510/124D MIL-M-38510/124D TABLE IV. Group C end point electrical parameters. TA = 25°C Device type Characteristics 01, 04, 05 Reference voltage VS = 30 V, TA = +25°C VR1, VR2, VR3 02, 06 Reference voltage TA = +25°C VR1, 1/ Symbol Delta limits 1/ Limits Unit ±2 mV Min 6.80 Max 7.10 V ±3 mV 6.70 7.20 V VR2, VR3 03 Reference voltage VS = 15 V, TA = +25°C VO ±3 mV 9.970 10.030 V 07 Reference voltage VIN = 10 V, TA = +25°C VO ±3 mV 4.95 5.05 V 08 Reference voltage VIN = 12 V, TA = +25°C VO ±3 mV 6.95 7.05 V 09 Reference voltage VIN = 15 V, TA = +25°C VO ±3 mV 9.95 10.05 V Delta limits apply to the measured value (see delta limit definition in MIL-PRF-38535). 5. PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD personnel, these personnel need to contact the responsible packaging activity to ascertain requisite packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Department of Defense Agency, or within the Military Department's System Command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 29 MIL-M-38510/124D 6. NOTES 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. PIN and compliance identifier, if applicable (see 1.2). c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. Requirements for certificate of compliance, if applicable. e. Requirements for notification of change of product or process to acquiring activity in addition to notification of the qualifying activity, if applicable. f. Requirements for failure analysis (including required test condition of MIL-STD-883, method 5003), corrective action and reporting of results, if applicable. g. Requirements for product assurance options. h. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the Government. i. Requirements for "JAN" marking. j. Packaging requirements (see 5.1). 6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists. 6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199. 30 MIL-M-38510/124D 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-STD-1331. 6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified, microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4). Longer length leads and lead forming should not affect the part number. 6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M38510 device types and may have slight physical variations in relation to case size. The presence of this information should not be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535. Military device type 01 02 03 04 05 06 07 08 09 Generic-industry type LM199A LM129A REF-10 LM199 LM199A-20 LM129B LT1021-5 LT1021-7 LT1021-10 6.8 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. Custodians: Army – CR Navy - EC Air Force - 11 NASA - NA DLA – CC Preparing activity: DLA - CC Project 5962-2032 Review activities: Army - MI, SM Navy - AS, CG, MC, SH, TD Air Force – 03, 19, 99 NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIT Online database at www.dodssp.daps.mil. 31