A5191HRTNGEVB Test Procedure

A5191HRTNGEVB Test Procedure
Author: Koenraad Van den Eeckhout/Gert Naert
Date:
Revision:
v2.1
8 april 2011
Test equipment required
Oscilloscope, Power supply, Signal generator, Multimeter
General remarks
When performing measurements on an oscilloscope capture the oscilloscope must be set so that a
stable trigger is achieved. Average over the largest possible number of measurements, and limit the
bandwidth to eliminate noise. Stop acquisition when taking measurements, so that all measurements
are of the same waveform.
A test result page is provided on the end of this document. Fill in the result of each test and print out the
page for each board.
When connector pin numberings are supplies, look for a square pad. This is pin 1. The connector pin
numbering follows the numbering in figure 1
Figure 1: Connector pin numbering
TEST 0: Visual inspection
Perform a brief visual inspection of the board

Check if the board is properly etched

Check solder connections (loose pins, tombstoning, etc )

Components that should not be populated: IDC3, J1, J2, components on the bottom of the
board (a single resistor is populated on the bottom of the first run, this should not generate a
fail). All other components should be present.
TEST 1: Idle Operation

Power the board by applying VDD (nominal 3V3) and GND to the test bench.

Measure the current consumption of the board by attaching a multimeter in series with the
power supply

Measure AREF (IDC3 pin 9). Use a GND pin on IDC3 pin8 for the negative measure point.

Measure nRTS (PIN A on the test bench).
TEST 2: Transmit Operation

Place a jumper on the pins B of the test bench

Connect an oscilloscope to pin C of the test bench. An image similar to figure 1 should be visible.
Figure 2: Output waveform (mark)

Measure peak-to-peak amplitude VPP,MARK of the waveform

Measure the cycle time TMARK of the waveform. Measure between two points with the
greatest slope so as to provide the most accurate measurement.

Place a jumper on the pins D of the test bench

Measure again peak-to-peak amplitude VPP,SPACE and cycle time TSPACE
TEST 3: Receive Operation

Remove jumper from pins B

Using a signal generator, apply a 1200Hz sine wave to pin F. Set the amplitude to 200mV peakto-peak.

Connect a probe to IDC3 pin 5. You should see a 1200 Hz sine wave. Measure the peak-to-peak
voltage RXF,MARK

Measure the delay TD,MARK between the applied sine wave and the measured wave.

Measure CD,MARK on pin G

Measure RXD,MARK on pin H

Reduce the applied wave amplitude to 40mV. Pin G should now be low.

Repeat the above measurements for the space frequency 2200Hz.
Test Report A5191HRT
Test performed by:
Date:
NAME
MIN
NOM
MAX
VDD
2V85
3V3
3V15
IDD,Q
400uA
420uA
440uA
AREF
1V20
1V24
1V30
nRTS
2V4
3V
3V15
NAME
MIN
NOM
MAX
VPP,MARK
490mV
500mV
510mV
TMARK
828us
835us
843us
VPP,SPACE
490mV
500mV
510mV
TSPACE
452us
455us
460us
NAME
MIN
NOM
MAX
VDD,MIN
2V62
2V7
2V78
nRST
0V
0V
1V
NAME
MIN
NOM
MAX
RXF,MARK
330mV
350mV
370mV
TD,MARK
680us
700us
720us
CD,MARK
2V4
3V
3V15
RXD,MARK
2V4
3V
3V15
VDET,MARK
140mV
150mV
160mV
RXF,SPACE
330mV
350mV
370mV
TD,SPACE
400us
420us
440us
CD,MARK
2V4
3V
3V15
RXD,MARK
0V
0V
0V4
VDET,SPACE
140mV
150mV
160mV
MEASURED
PASS/FAIL
MEASURED
PASS/FAIL
MEASURED
PASS/FAIL
MEASURED
PASS/FAIL
Similar pages