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LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
-
Original release
Updated Table II, expanded section 4.0 (Tables III – VI), added section 5.0
(Table VII), corrected various Figures
Corrected subgroups and values in Table II, deleted subgroups 5 and 6 for
Final & Group A and added Post Seal electrical in table IV; corrected typo for
temp testing and added Post Seal electrical in Table III
Remove Non-Destructive Wire Pull as a Standard Screening process for
Space Applications, revised Static Burn-in Condition and corrected typos.
Corrected case outline designator on sheet 2 from F to X
Revise and update to QCI Lot Quantities per MS 883 Method 5005.15 Tables
IIa, IIb, IV
Replace case outline on page 9
Add Dynamic Test and Dynamic Burn-in, and update device ordering
specifications
Rearranged Table 1 Absolute Maximum Ratings, corrected two typos in Table
II Dynamic Accuracy, added 4 parameters to Table VII Post Radiation
Performance, Corrected case outline designator on sheet 2 from A to X,
Added reference to both static and dynamic bias circuits to sections 3.2.5 and
4.2.4
Made revisions to Tables III, V and VI for clarity. Changed Gross leak test
condition from B2 to B3 for compliance to latest rev of MIL-STD-883. Updated
Table VII values to reflect product limits.
Correct Radiation Dose reference document from MIL STD 883 Method 1017
to 1019 Condition A in paragraph 1.8..
04-12-10
B. LaBelle
09-03-10
B. LaBelle
09-16-10
B. LaBelle
01-12-11
B. LaBelle
02-09-11
B. LaBelle
08-30-11
B. LaBelle
11-15-11
B. LaBelle
4-30-13
B. LaBelle
12-19-13
B. LaBelle
8-14-14
B. LaBelle
10/29/14
B. LaBelle
A
B
C
D
E
F
G
H
I
J
Aeroflex RAD, Inc. Proprietary
UNLESS OTHERWISE
SPECIFIED DIMENSIONS ARE IN
INCHES
PREPARED BY
T. Evans
TOLERENCE ON DECIMALS
XX=+- .03 XXX+-.010
CHECKED BY
Aeroflex RAD, Inc.
S. Love
APPROVED BY
Product
Specification
R. LaBelle
DRAWING APPROVAL
DATE
10/29/14
REVISION LEVEL
Rev J
UNCONTROLLED COPY
SPECIFICATION FOR
Microcircuit, Analog to Digital Converter,
14 Bit Sampling, Low Power, RAD1419
SIZE
A
CAGE CODE
3KTA5
SHEET
DRAWING NUMBER
RAD-1419ADC-01
1 OF 19
1.
SCOPE: This drawing documents high reliability requirements for space application (device class V). When
available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.1
PIN. The PIN (Part Identification Number) is as shown in the following example:
RAD1419A -
*
*
*
*
___
__ __ __ __
|
|
|
|
|_______ Temperature Range:
|
|
|
|
(M) = Military
|
|
|
|____________Screening:
|
|
|
(H) Hi Rel
|
|
|
(E) Electromechanical
|
|
|
(P) Prototype
|
|
|________________ Package Type:
|
|
(A) 28 Lead Flatpack (floating lid)
|
|
(B) 28 Lead Flatpack (grounded lid)
|
|____________________ Total Dose:
|
(N) Not Applicable
|
(P) 30krad (Si)
|
(L) 50krad (Si)
|
(R) 100krad (Si)
|
|___________________________ Device Type:
RAD1419A
Notes:
Military temperature range is -55º to 125 ºC.
Prototype tested at 25 º C, no screening.
Electromechanical is a 3 temperature test at 25 ºC, -55 ºC, and 125 ºC, no screening.
1.2
1.3
RHA designator. Device classes Q and V equivalent devices are compliant to the MIL-PRF-38535
specified RHA levels (D,P,L,R) and are marked with the appropriate RHA designator. A dash (-)
indicates a non-RHA device.
Device type(s). The device type(s) identify the circuit function as follows:
Generic number
1419A
1.4
Circuit function
14 bit A to D Converter
Device class designator. The device class designator is a single letter identifying the product
assurance level as follows:
Device class
Device requirements documentation
H
E
P
1.5
Level V Equivalent with MIL-PRF-38535
Electro-Mechanical
Prototype
Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
X
1.6
CDFP4-F28
Terminals
Package style
28
Flat Package
Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes V or MIL-PRF-38535.
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
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RAD-1419ADC-01
SHEET
2 of 20
1.7
TABLE I Absolute maximum ratings
PARAMETER
SYM
MIN
MAX
UNITS
AVDD = VDD = DVDD
(Notes 1,2)
Supply Voltage
VDD
6
V
Negative Supply Voltage
VSS
-6
V
Analog Input Voltage (Note 3)
VIN
VSS 0.3
10
V
VSS 0.3
VDD
+ 0.3
V
VSS 0.3
VDD
+ 0.3
V
500
mW
-55
125
deg. C
-55
125
deg. C
300
deg. C
Digital Input Voltage (Note 4)
VIH/VI
VOH/V
Digital Output Voltage
Power Dissipation
PDIS
Operating Temperature Range
Storage Temperature Range
Lead Temperature (soldering,
10s)
Electrostatic Discharge Voltage
HBM Certification Level 1A
Vesd
250
V
Thermal Resistance Junction to
Case
Θjc
7.5
deg. C/W
See Notes at the end of Table II
1.8
Radiation features: Maximum total dose available (MIL-STD-1019 Condition A)
P, 30krad(Si)
L, 50krad(Si)
R, 100krad(Si)
2.
APPLICABLE DOCUMENTS
2.1
Government specification, standards, and handbooks. The following specification, standards, and
handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the
issues of these documents are those cited in the solicitation or contract.
2.1.1
DEPARTMENT OF DEFENSE SPECIFICATION, MIL-PRF-38535 - Integrated Circuits,
Manufacturing, General Specification for.
2.1.2
DEPARTMENT OF DEFENSE STANDARDS
2.2.1.1
MIL-STD-883 -Test Method Standard Microcircuits.
2.2.1.2
MIL-STD-1835 -Interface Standard Electronic Component Case Outlines.
2.1.3
DEPARTMENT OF DEFENSE HANDBOOKS
2.1.3.1
MIL-HDBK-103 - List of Source Control Drawings.
2.1.3.2
MIL-HDBK-780 - Source Control Drawings.
2.1.4
Order of precedence. In the event of a conflict between the text of this drawing and the references
cited herein, the text of this drawing takes precedence. Nothing in this document, however,
supersedes applicable laws and regulations unless a specific exemption has been obtained.
2.
REQUIREMENTS
3.1
Item requirements. The individual item requirements for Hi-Rel device shall be in accordance with MILPRF-38535 class V and as specified herein or as modified in the device manufacturer's Quality
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
J
DRAWING NUMBER
RAD-1419ADC-01
SHEET
3 of 20
3.2
3.3
3.4
3.5
3.6
3.7
Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as
described herein.
Design, construction, and physical dimensions. The design, construction, and physical dimensions
shall be as specified in MIL-PRF-38535 and herein for device class V.
3.2.1
Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2
Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3
Block or logic diagram(s). The block or logic diagram(s) shall be as specified on figure 3.
3.2.4
Typical Performance Characteristics Figure 4.
3.2.5
Burn-in circuit. The burn-in circuit shall be as specified in figures figure 5 (static) and figure 6
(dynamic).
3.2.6
Life test circuit. The life test circuit shall be as specified on figure 6.
3.2.7
Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 7 .
Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified
herein, the electrical performance characteristics and post irradiation parameter limits are as specified
in 1.7 - Table I and shall apply over the full case operating temperature range.
Electrical test requirements. The electrical test requirements shall be the subgroups specified in Table
II.
Marking. The part shall be marked with the PIN listed in 1.1 herein, date code and manufacture name
or Logo. A unique serial number will be marked on the back of the package.
Certificate of Conformance. A certificate of conformance to the requirements of this drawing will be
provided with each lot of microcircuits delivered to this drawing.
Radiation Certificate. A radiation certificate of conformance shall be provided with each lot reporting the
radiation test results from wafer lot qualification testing per paragraph 5.0 herein. The certificate
guarantees the radiation performance as outlined in this specification.
TABLE II. Electrical performance characteristics.
CONVERTER CHARACTERISTICS * denotes specifications which apply over the full operating temperature range,
otherwise specifications are TA = +25°C. With Internal Reference (Notes 5,6)
PARAMETER
SYM
Resolution
CONDITIONS
(No Missing Codes)
Integral Linearity Error
INL
Differential Linearity
Error
DNL
Note 7/
Offset Error
Note 8/
Full scale Error
Internal Reference
Full scale Error
ExternalReference
Full Scale Tempco
GROUP A
SUBGROUPS
1
2
3
1
2
3
1
2
3
1
2
3
1
MIN
TYP
MAX
14
UNITS
Bits
±0.8
±2
LSB
±0.7
±1.5
LSB
±0.7
±2
LSB
±5
±20
LSB
±10
±60
LSB
2.5V
±5
LSB
IOUT(REF) = 0
±15
ppm/°C
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
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DRAWING NUMBER
RAD-1419ADC-01
SHEET
4 of 20
TABLE II. Electrical performance characteristics.
ANALOG INPUT (* denotes specifications which apply over the full operating temperature range, otherwise
specifications are TA = +25°C. ) Note 5
PARAMETER
SYM
CONDITIONS
GROUP A
MIN
TYP
MAX
SUBGROUPS
UNITS
Analog Input
Range
VIN
Note 9/, 4.75V < VDD < 5.25V,
-5.25V < VSS< -4.75V *
Analog Input
Leakage Current
IIN
CS\ = HIGH
CIN
Between Conversions
15
pF
CIN
During Conversions
5
pF
tACQ
Note 9/
90
Analog Input
Capacitance
Analog Input
Capacitance
Sample-and-Hold
Acquisition Time
Sample-and-Hold
Aperture Delay
Time
Sample-and-Hold
Aperture Delay
Time Jitter
Analog Input
Common Mode
Rejection Ratio
±2.5
V
1
2
3
±1
µA
300
ns
tAP
-1.5
ns
tjitter
2
psRMS
60
dB
CMRR
-2.5V < (-AIN = AIN) < 2.5V
DYNAMIC ACCURACY (* denotes specifications which apply over the full operating temperature range, otherwise
specifications are TA = +25°C.) Note 5
PARAMETER
Signal-to(Noise +
Distortion) Ratio
SYM
CONDITIONS
S/(N + D)
100kHz Input Signal *
Signal-to(Noise +
Distortion) Ratio
S/(N + D)
390 kHz Input Signal *
Note 9/ *
Total Harmonic
Distortion
THD
100kHz Input Signal, First 5
Harmonics *
Total Harmonic
Distortion
THD
390 kHz Input Signal, First 5
Harmonics *
Note 9/ *
Spurious Free
Dynamic Range
SFDR
100KHz Input Signal *
IMD
fin1 = 29.37kHz, fin2 =
32.446kHz Note 9/ *
Intermodulation
Distortion
Full-Power
Bandwidth
Full-Linear
Bandwidth
Product Specification
Aeroflex RAD, Inc. Proprietary
GROUP A
SUBGROUPS
MIN
4
78
TYP
4
MAX
UNITS
81.5
dB
80.0
dB
-93
-86
-86
4
-95
-86
dB
dB
20
MHz
1
MHz
SIZE
CAGE CODE
A
3KTA5
J
dB
-86
S/(N + D) > 77dB
REVISION LEVEL
dB
DRAWING NUMBER
RAD-1419ADC-01
SHEET
5 of 20
TABLE II. Electrical performance characteristics (continued)
INTERNAL REFERENCE CHARACTERISTICS Note 5
PARAMETER
SYM
CONDITIONS
GROUP A
SUBGROUPS
1
2
3
Output Voltage
VREF
IOUT = 0
Output Tempco
VREF
Line Regulation
VREF
IOUT = 0
4.75V < VDD < 5.25V, -5.25V <
VSS < -4.75V
Output
Resistance
VREF
Output Voltage
REF
comp
MIN
TYP
MAX
UNITS
2.480
2.500
2.520
V
±15
ppm/°C
0.05
LSB/V
-0.1mA < | IOUT | < 0.1mA
2
kΩ
IOUT = 0
4.06
V
DIGITAL INPUTS AND DIGITAL OUTPUTS (* denotes specifications which apply over the full operating temperature
range, otherwise specifications are TA = +25°C.) Note 5
TEST
SYM
TEST CONDITION
High Level Input
Voltage
VIH
VDD = 5.25V *
Note 12
Low Level Input
Voltage
VIL
VDD = 4.75V *
Note 12
Digital Input
Current
IIN
VIN = 0V to VDD *
Digital Input
Capacitance
CIN
Note 9/
5
pF
High Level
Output Voltage
VOH
VDD = 4.75V
IO = -10µA*
4.5
V
High Level
Output Voltage
VOH
VDD = 4.75V
IO = -200µA
Low Level Output
Voltage
VOL
VDD = 4.75V
IO = 160µA
Low Level
Output Voltage
VOL
VDD = 4.75V
IO = 1.6mA *
IOZ
VOUT = 0V to VDD,
CS\ High *
COZ
CS\ High, Note 9/ *
Output Source
Current
ISOURCE
VOUT = 0V
-10
mA
Output Sink
Current
ISINK
VOUT = VDD
10
mA
High-Z Output
Leakage D13 to
D0
High-Z Output
Capacitance D13
to D0
Product Specification
Aeroflex RAD, Inc. Proprietary
GROUP A
SUBGROUPS
1
2
3
1
2
3
1
2
3
1
2
3
MIN
TYP
MAX
2.4
V
0.8
V
±10
µA
4.0
V
0.05
1
2
3
1
2
3
0.10
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
J
UNITS
V
0.4
V
±10
µA
15
pF
DRAWING NUMBER
RAD-1419ADC-01
SHEET
6 of 20
TABLE II. Electrical performance characteristics (continued)
POWER REQUIREMENTS (* denotes specifications which apply over the full operating temperature range,
otherwise specifications are TA = +25°C.) Note 5
PARAMETER
Positive Supply
Voltage
Negative Supply
Voltage
Positive Supply
Current
Positive Supply
Current
Positive Supply
Current
Negative Supply
Current
Negative Supply
Current
Negative Supply
Current
SYM
CONDITIONS
VDD
Note 10/
VSS
Note 10/
GROUP A
SUBGROUPS
IDD
ISS
MAX
UNITS
4.75
5.25
V
-4.75
-5.25
V
20
mA
11
Nap Mode: SHDN\ = 0V,
CS\ = 0V
Sleep Mode: SHDN\ = 0V, CS\
= 5V
1
2
3
ISS
ISS
TYP
1
2
3
IDD
IDD
MIN
PDIS
Power
Dissipation
PDIS
Nap Mode: SHDN\ = 0V, CS\ =
0V
Power
Dissipation
PDIS
Sleep Mode: SHDN\ = 0V, CS\
= 5V
mA
250
µA
19
Nap Mode: SHDN\ = 0V, CS\ =
0V
Sleep Mode: SHDN\ = 0V, CS\
= 5V
Power Dissipation
1.5
1
2
3
1
2
3
30
mA
100
µA
1
µA
150
240
mW
7.5
12
mW
1.2
mW
TIMING CHARACTERISTICS (* denotes specifications which apply over the full operating temperature range,
otherwise specifications are TA = +25°C.) Note 5
PARAMETER
SYM
CONDITIONS
GROUP A
MIN
TYP
MAX
UNITS
SUBGROUPS
9
Maximum Sampling
fSAMPLE(MAX)
800
kHz
10
Frequency
Note 9/ *
11
9
Conversion Time
tCONV
950
1150
ns
10
Note 9/ *
11
9
Acquisition Time
tACQ
90
300
ns
10
Note 9/ *
11
9
Acquisition +
tACQ + CONV
Note 9/ *
10
1040
1250
ns
Conversion Time
11
CS\ to RD\ Setup Time
t1
Note 9/ *
0
ns
CS\ to CONVST\
t2
Note 9/ *
40
ns
Setup Time
CS\ to SHDN\ Setup
t3
Note 9/
40
ns
Time
SHDN\ to CONVST\
t4
Note 10/
400
ns
Wake-up Time
9
CONVST\ Low Time
t5
Notes 9/,11/ *
10
40
ns
11
Product Specification
Aeroflex RAD, Inc. Proprietary
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PARAMETER
SYM
CONDITIONS
GROUP A
SUBGROUPS
CONVST\ to BUSY\
Delay
t6
CL = 25pF
9
CONVST\ to BUSY\
Delay
t6
CL = 25pF, Note 9/
9
10
11
Data Ready Before
BUSY\
t7
Data Ready Before
BUSY\
t7
Note 9/
Delay Between
Conversions
t8
Note 9/ *
t9
Note 9/ *
t10
CL = 25pF
9
Data Access Time
After RD\
t10
CL = 25pF, Note 9/
9
10
11
Data Access Time
After RD\
t10
CL = 100pF, Note
9/
9
CL = 100pF, Note
9/
9
10
11
Wait Time RD\ After
BUSY\
Data Access Time
After RD\
Data Access Time
After RD\
t10
MIN
TYP
MAX
UNITS
20
ns
50
9
20
9
10
11
9
10
11
ns
50
ns
15
ns
40
ns
-5
ns
15
20
25
ns
35
ns
35
ns
50
ns
TABLE II. Electrical performance characteristics (continued)
TIMING CHARACTERISTICS (* denotes specifications which apply over the full operating temperature range,
otherwise specifications are TA = +25°C.) Note 5
PARAMETER
SYM
CONDITIONS
GROUP A
SUBGROUPS
Bus Relinquish Time
t11
Note 9/
9
Bus Relinquish Time
t11
RD\ Low Time
t12
Note 9/ *
CONVST\ High Time
t13
Note 9/ *
9
10
11
9
10
11
9
10
11
MIN
TYP
MAX
UNITS
10
20
ns
35
t10
ns
40
ns
NOTES:
Parameters listed only as “Typical” are not tested in production.
1/
Absolute Maximum Ratings are those values beyond which the life of a device may be
impaired.
2/
All voltage values are with respect to ground with DGND and AGND wired together unless
otherwise noted.
3/
When these pin voltages are taken below VSS or above VDD, they will be clamped by internal
diodes. This product can handle input currents greater than 100mA below VSS or above VDD
without latch up.
4/
When these pin voltages are taken below VSS, they will be clamped by internal diodes. This
product can handle input currents greater than 100mA below VSS without latch up. These pins
are not clamped to VDD.
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
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3KTA5
REVISION LEVEL
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DRAWING NUMBER
RAD-1419ADC-01
SHEET
8 of 20
5/
6/
7/
8/
9/
10/
11/
12/
VDD = 5V, VSS = –5V, fSAMPLE = 800kHz, tr = tf = 5ns unless otherwise specified.
Linearity, offset and full-scale specifications apply for a single ended +AIN input with – AIN
grounded.
Integral nonlinearity is defined as the deviation of a code from a straight line passing through
the actual endpoints of the transfer curve. The deviation is measured from the center of the
quantization band.
Bipolar offset is the offset voltage measured from –0.5LSB when the output code flickers
between 0000 0000 0000 00 and 1111 1111 1111 11.
Guaranteed by design or characterization, not subject to test in production.
Recommended operating conditions.
The falling edge of CONVST\ starts a conversion. If CONVST\ returns high at a critical point
during the conversion it can create small errors. For best performance ensure that CONVST\
returns high either within 650ns after the start of the conversion or after BUSY\ rises.
VIH and VIL will be guaranteed by testing VOH and VOL at the appropriate levels.
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
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RAD-1419ADC-01
SHEET
9 of 20
FIGURE 1. Case outline.
0.109± 0.010
0.720±0.008
0.031±0.005
28
0.410±0.006
Pin 1
Location
0.280±0.006
1
0.355±0.010
0.050±0.005
26 PLACES
0.017±0.002
28 PLACES
0.005±0.001
28 PLACES
All dimensions are in inches
FIGURE 2. Terminal connections.
Function
+AIN
-AIN
REF
REFcomp
AGND
D13
D12
D11
D10
D9
D8
D7
D6
DGND
Pin
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Pin
28
27
26
25
24
23
22
21
20
19
18
17
16
15
Function
AVDD
DVDD
VSS
BUSY\
CS\
CONVST\
RD\
SHDN\
D0
D1
D2
D3
D4
D5
Order Shown According to Top View
Product Specification
Aeroflex RAD, Inc. Proprietary
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CAGE CODE
A
3KTA5
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DRAWING NUMBER
RAD-1419ADC-01
SHEET
10 of 20
FIGURE 3. Block diagram.
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
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DRAWING NUMBER
RAD-1419ADC-01
SHEET
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FIGURE 4. Typical Performance Characteristics
Product Specification
Aeroflex RAD, Inc. Proprietary
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CAGE CODE
A
3KTA5
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DRAWING NUMBER
RAD-1419ADC-01
SHEET
12 of 20
FIGURE 5. Static Burn-in Schematic (for reference only)
FIGURE 6. Dynamic Burn–in and Life Test Schematic (for reference only)
Product Specification
Aeroflex RAD, Inc. Proprietary
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CAGE CODE
A
3KTA5
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RAD-1419ADC-01
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13 of 20
FIGURE 7. Radiation Bias Connection Table
FUNCTION
PIN NUMBER
BIAS CONNECTIONS DURING IRRADIATION
+AIN
-AIN
VREF
REFCOMP
AGND
D13 (MSB)
D12
D11
D10
D9
D8
D7
D6
DGND
D5
D4
D3
D2
D1
D0
SHDN/
RD/
CONVST/
CS/
BUSY/
VSS
DVDD
AVDD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
+2.5V, 1000pF Ceramic to -AIN
GND
10µF Ceramic to GND
10µF Ceramic to GND
GND
Open
Open
Open
Open
Open
Open
Open
Open
GND
Open
Open
Open
Open
Open
Open
+5.5 V ± 0.15 V
GND
500 kHz Square Wave @ 5 % Duty Cycle
GND
Open
-5.5 V ± 0.15 V, 10µF Ceramic to GND
Pin 28
+5.5 V ± 0.15 V, 10µF Ceramic to GND
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
J
DRAWING NUMBER
RAD-1419ADC-01
SHEET
14 of 20
4.
VERIFICATION
4.1
Sampling and inspection. For HI-REL device, sampling and inspection procedures shall be in
accordance with the tables in this section unless otherwise specified in customer documentation.
4.2
Screening. For HI-REL device, screening shall be in accordance with Table III, test methods form MILSTD-883, and shall be conducted on all devices prior to qualification and technology conformance
inspection.
4.2.1
Scanning Electron Microscope (SEM) Inspection. SEM inspection, when required, shall be
performed on a random sampling of die from one wafer in each wafer lot. SEM inspection
shall be per Method 2018, Table II of MIL-STD-883.
4.2.2
Internal Visual Inspection. Internal visual inspection shall be performed in accordance with
Method 2010 of MIL-STD-883 as applicable.
4.2.3
Interim and Final Electrical Parameters. Interim and final electrical test parameters shall be as
specified in Table II herein. Variables data for each test of each device when specified shall
be recorded and traceability shall be maintained by individual device serial number and by lot
number.
4.2.4
Burn-In. Burn-in shall be in accordance with Method 1015 of MIL-STD-883, and Table II
herein. The burn-in circuit(s) as specified in Figures 5 and 6 herein.
4.2.5
Percent Defective Allowable (PDA). The PDA, when required shall be calculated on those
devices whose measured characteristics after burn-in exceed the specified delta limits or
exceed the electrical parameter limits specified in Table II. The verified failures divided by the
total number of die in the lot initially submitted to burn-in shall be used to determine the
percent defective for the lot and the lot shall be accepted or rejected based on the specified
PDA. The PDA shall be three (3) percent or 1 part whichever is greater, based on the exact
number of devices submitted to each burn-in.
TABLE III: Screening
SCREEN
METHOD
CONDITION
Non-destructive bond pull
2023
Internal visual
2010
Condition A
--
Serialization
NOTES
Temperature cycling
1010
Constant Acceleration
2001
-Condition C, 10 cycles
-65 C to +150 C
Condition E, Y1 Axis
PIND
2020
Condition A
Radiography
2018
Y1 Axis
--
25 Deg C , See Tables II & IV
Pre-burn in electrical test
Dynamic Burn-In
Interim electrical test
Static burn-In
2/
1015
240 hrs at 125 C
--
25 Deg C, See Tables II & IV
3/
1015
72 hrs at 125C
Final electrical test, room
--
25 Deg C , See Tables II & IV
Final electrical test, hot
--
125 Deg C , See Tables II & IV
Final electrical test, cold
--
-55 Deg C , See Tables II & IV
Delta calculation
--
--
PDA- calculation
3%
--
Seal test
1014
Cond. B1, B3
External visual
2009
--
1/
2/
3/
1/
3/
May be performed anytime before pre-burn in electrical test.
May be performed anytime after serialization.
The order of dynamic burn-in versus static burn-in may be reversed.
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
J
DRAWING NUMBER
RAD-1419ADC-01
SHEET
15 of 20
4.3
Qualification and conformance inspection for Hi-Rel device. Unless otherwise specified, qualification
and conformance inspection shall be in accordance with Tables IV, V and VI below.
4.3.1
Group A inspection.
4.3.1.1
Tests shall be as specified in Table IV herein. Group A testing shall be accordance
with MIL-STD-883, Method 5005, Table I and footnotes. (NOTE: Post burn-in electrical
reject devices from the same inspection lot may be used for all Groups B and D
subgroups when end-point measurements are not required
TABLE IV. Electrical test requirements
Subgroups
Test Requirements
Pre Burn-in electrical parameters
1,4,9
Interim electrical parameters
1,4,9
Final electrical test parameters
1,2,3,4 ,9,10,11
Post Seal electrical test parameters
1
Group A electrical test parameters
1,2,3,4,9,10,11
Group B electrical test parameters
1,4,9
Group C electrical test parameters
1,4,9
Group D electrical test parameters
1,4,9
Subgroups
1
2
3
4
5
6
9
10
11
Product Specification
Aeroflex RAD, Inc. Proprietary
Definitions
Static Characteristics 25°C
Static Characteristics 125°C
Static Characteristics -55°C
Dynamic Characteristics 25°C
Dynamic Characteristics 125°C
Dynamic Characteristics -55°C
Switching Characteristics 25°C
Switching Characteristics 125°C
Switching Characteristics -55°C
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
J
DRAWING NUMBER
RAD-1419ADC-01
SHEET
16 of 20
4.3.2
Group B inspection. Group B inspection shall be performed as follows in Table V
TABLE V: Group B Conformance Inspection
SUBGROUP & TEST
1/ 2/ 3/
Subgroup 1 5/
a) Physical dimensions
b) Internal water-vapor content
Subgroup 2
a) Resistance to solvents
b) Internal visual
c) Bond strength 6/
d) Die shear
MIL-STD-883
METHOD
SAMPLE SIZE
(ACC NO.) 4/
CONDITION
2016
1018
5000ppm max water
@ 100C
2(0)
3(0) or 5(1)
2015
2013/2014
2011
2019
3(0)
2(0)
22(0)
3(0)
Subgroup 3
a) Solderability 7/
2003
22(0)
Subgroup 4 5/
a) Lead integrity 8/
b) Seal 9/ (fine and gross)
c) Lid torque 10/
2004
1014
2024
Condition B1, B3
45(0)
3(0)
3(0)
1005
1000 hrs @125 °C
45(0)
Subgroup 6 11/
a) Electrical parameters
b) Temperature cycling
1010
c) Constant acceleration,
d) Seal (fine and gross)
2001
1014
Condition C 100 cycles
-65°C to +150°C
Condition E, Y1 Only
Condition B1, B3
15(0)
Subgroup 5 11/
a) Electrical parameters
b) Steady state life
c) Electrical parameters
e) Electrical parameters
1/
Post burn-in electrical reject devices from the same inspection lot may be used for all subgroups when endpoint measurements are not required. Sequence of tests may be altered at supplier's option.
2/ Delta failures may be used for Subgroups 1 through 4.
3/
Unless otherwise specified, all electrical test conditions and end points shall be per customer SCD or
product specification.
4/
Quantities stated represent minimum quantities. If larger sample sizes are used, the reject criteria shall not
change, unless otherwise specified.
5/
Not required if performed for Group D testing
6/
Pull 22 wires from a minimum of 4 devices.
7/
Perform solderability testing on 22 leads from a minimum of 3 devices.
8/
Perform lead integrity testing on 45 leads from a minimum of 3 devices.
9/
Test Conditions D and E prohibited.
10/ Lid torque test shall apply only to glass-frit sealed packages.
11/ Samples shall be randomly selected from the lot after successful completion of Group A. Group A data may
be used for pre-electrical test data.
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
J
DRAWING NUMBER
RAD-1419ADC-01
SHEET
17 of 20
4.3.3
Group D inspection. Group D qualification inspection shall be as follows in Table VI.
TABLE VI: Group D Qualification Inspection
SUBGROUP & TEST
1/ 2/ 4/ 9/
MIL-STD-883
METHOD
SAMPLE SIZE
(ACC NO.) 3/
CONDITION
Subgroup 1
Physical dimensions 7/
Subgroup 2
a) Lead integrity 7/ 8/
2016
15(0)
2004
Condition B2
45(0)
Subgroup 3
a) Thermal shock,
1011
b) Temperature cycling
1010
Condition B
15 Cycles, -55°C to
125°C
Condition C
100 Cycles, -65°C to
150°C
15(0)
c)
d)
e)
f)
Moisture resistance
Visual examination
Seal 4/ (fine and gross)
End point electrical
parameters 6/
1004
1004/1010
1014
--
B1, B3
Subgroup 4 5/
a) Mechanical shock
2002
b) Vibration, variable frequency
2007
c) Constant acceleration
2001
d) Seal 4/ (fine and gross)
e) Visual examination
f) End-point electrical parameters
1014
Condition B
1.5Kg (peak) 0.5 ms
pulse
Condition A
20g peak
Condition E
Y1 Orientation
B1, B3
1009
Condition A
1014
B1, B3
1018
5000ppm max water
@ 100C
15(0)
Subgroup 5 1/
a) Salt atmosphere
b) Visual examination
c) Seal (fine and gross)
Subgroup 6
b) Internal water-vapor content
15(0)
3(0) or 5(1)
Subgroup 7
a) Adhesion of lead finish 8/
Product Specification
Aeroflex RAD, Inc. Proprietary
2025
15(0)
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
J
DRAWING NUMBER
RAD-1419ADC-01
SHEET
18 of 20
1/
Post burn-in electrical reject devices from the same inspection lot may be used for all subgroups when endpoint measurements are not required. Sequence of tests may be altered at supplier's option.
Unless otherwise specified, all electrical test conditions and end points shall be per customer SCD or
product specification.
Quantities stated represent minimum quantities. If larger sample sizes are used, the reject criteria shall not
change, unless otherwise specified.
Test conditions D and E prohibited.
Subgroup 3 samples may be used for Subgroup 4.
At the supplier’s option, end-point electrical parameters may be performed after moisture resistance and
prior to Seal test.
Electrical rejects form the inspection lot may be used for samples.
Sample size specified is the number of leads sampled from 3 devices
2/
3/
4/
5/
6/
7/
8/
5.
Radiation Characterization. Radiation specifications for TID, ELDRS, SEU, Neutron Displacement Damage and
Prompt Dose are listed below.
5.1
Total Ionizing Dose (TID) – Post-rad performance specifications are as shown in Table VII. A detailed
TID characterization report is available.
5.2
Enhanced Low Dose Rate Sensitivity (ELDRS) – Immune by technology.
2
5.3
Single Event Latch-up (SEL) – No latch-up exhibited at any LET of 55MeV-cm /mg or lower at a case
temperature of 85°C. A detailed SEL characterization report is available.
5.4
Neutron Displacement Damage – Immune by technology.
5.5
Prompt Dose Latch Up – Not characterized.
TABLE VII. Post Radiation Performance
TEST
SYM
Integral
Linearity Error
Differential
Linearity
Error
TEST
CONDITION
10krad(Si)
30krad(Si)
50krad(Si)
100krad(Si)
Units
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
INL
-2
2
-2
2
-2
2
-3
3
-5
5
LSB
DNL
-1
1
-1
1
-1
1
-1
1
-3
3
LSB
-20
20
-20
20
-20
20
-30
20
-40
20
LSB
1
-1
1
-1
1
-1
1
-1
1
µA
Offset Error
Analog Input
Leakage Current
Signal-to
(Noise +
Distortion)
Ratio
Total
Harmonic
Distortion
Spurious
Free
Dynamic
Range
Output
Voltage
High Level Input
Voltage
Digital Input
Current
Low Level Input
Voltage
High Level
Output
Voltage
Low Level
Output
Voltage
High-Z Output
Leakage D13 to
D0
0krad(Si)
IIN
CS\ = HIGH
-1
S(N + D)
100kHz Input
Signal
78
THD
100kHz Input
Signal, First 5
Harmonics
SFDR
100kHz Input
Signal
86
VREF
IOUT = 0
2.48
VDD = 5.25V
Note 12
VIN = 0V to
VDD
VDD = 4.75V
Note 12
2.4
-10
VOH
VDD = 4.75V
IO = -200µA
4
VOL
VDD = 4.75V
IO = 1.6mA
IOZ
VOUT = 0V to
VDD,
CS\ High
VIH
IIN
VIL
Product Specification
Aeroflex RAD, Inc. Proprietary
78
-86
-86
86
2.52
2.48
10
-10
2.52
2.48
10
-10
-10
2.52
4
10
2.48
-10
2.52
10
10
CAGE CODE
A
3KTA5
J
100
µA
0.8
V
4
SIZE
REVISION LEVEL
V
V
-100
0.4
-10
2.52
2.4
4
10
dB
dB
2.48
0.8
0.4
-10
-75
79
2.4
10
dB
-75
0.8
0.4
70
79
2.4
4
10
-75
0.8
0.4
75
79
2.4
0.8
-10
75
-10
V
0.4
V
10
µA
DRAWING NUMBER
RAD-1419ADC-01
SHEET
19 of 20
Positive Supply
Current
ICC
SHDN/ = 5 V,
CS/ =0 V
20
20
20
20
20
mA
Negative Supply
Current
ISS
SHDN/ = 5 V,
CS/ =0 V
30
30
30
30
30
mA
60
60
60
60
60
LSB
1150
1150
1150
1150
1150
ns
Full scale Error
Internal
Reference
Conversion Time
6.
7.
tCONV
PACKAGING
6.1
Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535
for device classes Q and V.
NOTES
7.1
Substitutability. Device class Q devices will replace device class M devices.
7.2
Configuration control of this drawing. All proposed changes will be coordinated with the users of
record.
7.3
Record of users. Military and industrial users should inform Aeroflex RAD, Inc. when a system
application requires configuration control.
7.4
Comments. Comments on this drawing should be directed to Aeroflex RAD, Inc. (719)-531-0800
7.5
Updates. This document is not controlled for up-dates. Please contact Aeroflex RAD to check the
latest revision.
Product Specification
Aeroflex RAD, Inc. Proprietary
SIZE
CAGE CODE
A
3KTA5
REVISION LEVEL
J
DRAWING NUMBER
RAD-1419ADC-01
SHEET
20 of 20