AMIS 49200 Fieldbus MAU Reference Board Test Report

TND340/D
AMIS-49200 Fieldbus MAU
Reference Board
Physical Layer Conformance Testing
FF−830 Test Results
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TECHNICAL NOTE
Scope
Test Equipment Used:
 Tektronix THS730A 2-channel Isolated Oscilloscope
 KEPCO − Variable Power Supply,
all tests run at 24 V unless otherwise stated
 Discrete Board for Non-Fieldbus Power Supply with
Two Terminators
 L = 5 mH, 18 AWG, 1.3 W Air Core Inductor
(Jantzen)
 RL = 50 W 1%
 Two Terminators Each Consisting of:
 R = 50 W 1 W (Qty = 2)
 C = 2 mF 400 V Crosscap (Qty = 2) (Jantzen)
 Fieldbus Message Source Device
 HP33120A – Arbitrary Waveform Generator
 Waveform Generation Interface – a custom Fieldbus
physical interface circuit card functions as the interface
between the arbitrary waveform generator and the
Fieldbus test network
This document contains the relevant results of the
FOUNDATION Fieldbus Physical Layer Conformance
testing performed on the AMIS−49200 Fieldbus MAU
Reference Board (Rev 1.0). For a detailed explanation of
each test describing its purpose and set-up refer to FF−830.
Definitions, Acronyms and Abbreviations
DUT
FIC
ICS
MAU
MDS
PN
PR
− Device Under Test
− Field Interface Card
− Implementation Conformance Statement
− Medium Attachment Unit
− Medium Dependent Sublayer
− Probe Node
− Probe Response
Device Set-up
All tests were run at room temperature.
Device: AMIS−49200 FF Reference Board
NOTES: The FF−830 specification (from Fieldbus Foundation) is not available from ON Semiconductor to customers.
Please contact the Fieldbus Foundation at www.fieldbus.org to obtain the latest test specifications.
Custom testing services are not provided by ON Semiconductor.
 Semiconductor Components Industries, LLC, 2013
July, 2013 − Rev. 3
1
Publication Order Number:
TND340/D
TND340/D
TEST SUMMARY
Table 1. TEST SUMMARY
Test ID #
Test
Test Notes
See Annex E of FF−830
Test Status
1.1
Valid ID of DUT
(Note 1)
1.2
Static Conformance Review
(Note 1)
1.3
ICS Self-consistency
(Note 1)
1.4
Consistency between DUT and ICS
(Note 1)
2.1
Signal and Power Connections
(Note 1)
2.2
Receive Signal Polarity
(Note 1)
2.3
Transmitted Signal Polarity
(Note 1)
3.1
Output Amplitude
3.2
Output Amplitude with One Terminator
3.3
Signal Bias
Pass
3.4
Output Signal Distortion
Pass
4.1
Bit Rate
(Note 1)
4.2
Bit Time
(Note 1)
4.3
Rise and Fall Times
Pass
4.4
Slew Rate
Pass
4.5
Jitter
(Note 1)
4.6
Transmit Enable Time
(Note 1)
4.7
Quiescent DVC Output
(Note 1)
5.1
Maximum Rate of Current Change
(Note 1)
5.2
Maximum Current
(Note 1)
6.1
Receiver Sensitivity
Pass
6.2
Receiver Noise Rejection
Pass
7.1
Operating Voltage
(Note 1)
7.2
Withstand Voltage
(Note 1)
7.3
Ripple Sensitivity
(Note 1)
8.1
Common Mode Broadband Interference
(Note 1)
8.2
Common Mode Power Frequency
(Note 1)
9.1
Input Impedance
9.2
Unbalanced Capacitance
Pass
(Note 1)
Pass
(Note 1)
1. Accuracy of test requires entire node electronics to be present, including the host microprocessor and associated memory, Fieldbus link
controller and associated support circuitry. Test is to be performed by customer.
Test results for room temperature on tests run indicate the
physical layer DOES conform to all specifications put forth
by the Fieldbus Foundation.
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TND340/D
TEST RESULTS
Test Group 1 – Static Conformance Review
These tests are not applicable. Tests to be performed by
customer.
Test Group 2 – Basic Interconnection Tests
These tests are not applicable. Tests to be performed by
customer.
Test Group 3 – Transmit Levels
Test ID’s: 3.1 Output Amplitude, 3.3 Signal Bias, and
3.4 Output Signal Distortion
Test Results: PASS
Tests were set-up per diagram in “Test Group 3” of FF−830.
Figure 1. Power Supply = 24 V
Table 2. TEST CASE 3.1
Test Case 3.1 Output Amplitude Clause 223.1a
Power Supply = 24 V
Step
Measured or Calculated
Data (mV)
Action-Behavior
3.1.2
Transmit PN and Capture DUT Response
3.1.3
Measure Maximum Positive Peak Level of Response Waveform
380
Measure Minimum Positive Trough Level of Response Waveform
372
Calculate Positive Mid-voltage (‘mid-voltage peak to trough’)
376
Measure Maximum Negative Peak Level of Response Waveform
−408
Measure Minimum Negative Trough Level of Response Waveform
−392
Calculate Negative Mid-voltage (‘mid-voltage peak to trough’)
−400
Calculate Output Amplitude from Negative to Positive Mid-voltage
776
3.1.4
3.1.5
If Amplitude is between 0.75 V and 1.0 V Peak-to-peak Pass, otherwise Fail
3.3.5
Calculate | Positive Mid-voltage | – | Negative Mid-voltage |
Pass
24
If Absolute Difference Does Not Exceed 50mV Peak Pass, otherwise Fail
Calculate 10% of Peak-to-peak
Verdict
Pass
77.6
Calculate 10% Point
−322.4
Calculate 90% Point
298.4
Set Cursors to 10% and 90% Points on the Waveform for Reference
3.4.3
Check Each Response Waveform Rise from 10−90% Peak-to-peak
If No Negative Going Transitions in 10−90% pk-pk Range Pass, otherwise Fail
3.4.4
Check Each Response Waveform Fall from 90−10% Peak-to-peak
If No Positive Going Transitions in 90−10% pk-pk Range Pass, otherwise Fail
3.4.5
Pass
Check Each Response Waveform Region above 90% Peak-to-peak
If No Variation  10% pk-pk Including All Distortions Pass, otherwise Fail
3.4.6
Pass
Pass
Check Each Response Waveform Region below 10% Peak-to-peak
If No Variation  10% pk-pk Test Including All Distortions Pass, otherwise Fail
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Pass
TND340/D
Test ID: 3.2 Output Amplitude One Trunk Terminator
Removed
This test is not applicable. Test to be performed by
customer.
10 % point = negative mid-voltage + 10% of peak-to-peak =
= −400 mV + 77.6 mV = −322.4 mV
90 % point = positive mid-voltage – 10% of peak-to-peak =
= 376 mV – 77.6 mV = 298.4 mV
Test Group 4 – Transmit Timing and Quiescent Output
Test ID’s: 4.1 Bit Rate, 4.2 Bit Time
These tests are not applicable. Tests to be performed by
customer.
Test ID’s: 4.3 Rise and Fall Times, 4.4 Slew Rate
Test Results: PASS
1. Test ID 4.3 Rise and Fall Times:
Positive mid−voltage +
Positive Peak * Positive Trough
)
2
) Positive Trough
Positive mid−voltage +
380 mV * 372 mV
) 372 mV +
2
Figure 2. Fall Time 6.184 ms
+ 376 mV
Negative mid−voltage +
Negative Peak * Negative Trough
)
2
) Negative Trough
Negative mid−voltage +
* 408 mV * (* 392 mV)
* 392 mV +
2
+ * 400 mV
Peak-to-peak voltage = |Positive mid-voltage| +
+ |Negative mid-voltage|
Peak-to-peak voltage = |376 mV| + |−400 mV| = 776 mV
10 % of peak-to-peak = 0.1  776 mV = 77.6 mV
Figure 3. Rise Time 6.824 ms
Table 3. TEST CASE 4.3
Test Case 4.3 Rise and Fall Times Clause 22.3.3a
Step
Action-Behavior
Verdict
4.3.1
Set-up for Group 4 with Supply Set for 24 V 0.1 V D.C. at DUT
4.3.2
Transmit PN and Capture DUT Response (or Use Response from 4.2)
4.3.3
Measure Sample Response Waveform Fall from 90−10% Peak
(it is Suggested to Use the Bit Cycle Selected for Test Case 4.2)
Pass
If Time Does Not Exceed 8 ms for 90−10% Peak-to-peak Pass, otherwise Fail
4.3.4
Measure Sample Response Waveform Rise from 90−10% Peak
Pass
If Time Does Not Exceed 8 ms for 10−90% Peak-to-peak Pass, otherwise Fail
2. Test ID 4.4 Slew Rate:
Slew Rate +
Volts
;
Time
Requirement :
0.2 V
Volts
x
Time
1 mS
90% * 10% Range
;
0.165 VńmS
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10% * 90% Range
0.150 VńmS
TND340/D
Table 4. TEST CASE 4.4
Test Case 4.4 Slew Rate Clause 22.3.3b
Step
Action-Behavior
Verdict
4.4.1
Set-up for Group 4 with Supply Set for 24 V 0.1 V D.C. at DUT
4.4.2
Transmit PN and Capture DUT Response (or Use Response from 4.3)
4.4.3
Measure Each Response Waveform Fall from 90−10% Peak-peak
Calculate Maximum Slew Rate between Each Pair of Sample Points
If Slew Rate  0.2 V per ms at any Point in Range 10% to 90% Pass, otherwise Fail
Pass
Measure Each Response Waveform Rise from 10−90% Peak-peak
Calculate Maximum Slew Rate between Each Pair of Sample Points
If Slew Rate  0.2 V per ms at any Point in Range 10% to 90% Pass, otherwise Fail
Test ID’s: 4.5 Jitter, 4.6 Transmit Enable Time,
4.7 Quiescent Transmitter Output
These tests are not applicable. Tests to be performed by
customer.
Pass
 Verified that Communication Remained Intact for
Several Minutes and RXA Remains Active
Test Group 5 – Special Tests for Bus-powered Devices
These tests are not applicable. Tests to be performed by
customer.
Test Group 6 – Receive Characteristics Plus Transmit
Disable Time
Test ID’s 6.1 Receive Sensitivity, 6.2 Receiver Noise
Rejection
Test Results: PASS
1. Test ID 6.1 Receive Sensitivity:
 Trigger on the Response from DUT
 Established Communication with the Device
 Reduced the Amplitude of the Waveform Generator
until it is at 155 mVpp
Figure 4. Channel 1 is PN in at 155 mV,
Channel 2 is RXA Going Active
Table 5. TEST CASE 6.1
Test Case 6.1 Receiver Sensitivity Part of Clause 22.4.2
Step
Action-Behavior
6.1.1
Set-up for Group 6, Supply Set for 24 V 0.1 V D.C. at DUT
6.1.2
Set Waveform Generator for 155 mV 5 mV pk-pk at DUT
6.1.3
Transmit PN, Capture Response from DUT and Examine
Verdict
PR Length
Preamble
Start Delimiter
End Delimiter
Frame Control
If Valid PR as Defined for Test Group 2 Pass, otherwise Fail
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Pass
TND340/D
2. Test ID 6.2 Receiver Noise Rejection:
 Trigger on the RxA Pin
 Established Communication with the Device
 Reduced the Amplitude of the Waveform Generator
until it is at 70 mVpp
 Verified that Communication Fails and RxA Remains
Inactive
Figure 5. Channel 1 is PN in at 70 mV
Channel 2 is RXA Staying Active
Table 6. TEST CASE 6.2
Test Case 6.2 Receiver Noise Rejection Part of Clause 22.4.2
Step
Action-Behavior
6.2.1
Set-up for Group 6, Supply Set for 24 V 0.1 V D.C. at DUT
6.2.2
Set Waveform Generator for 70 mV 5 mV pk-pk at DUT
6.2.3
Transmit PN, Capture Response from DUT
Verdict
If No Response, neither Valid nor Invalid Waveform, Pass
Test Group 7 – Network Power Distribution
Pass
Test Group 9 – Input Circuit Parameter Measurement
These tests are not applicable. Tests to be performed by
customer.
Test ID 9.1 Input Impedance
Test Results: PASS
 Set-up according to Annex B for Bus-powered Devices
 Spec. Impedance  3 kW DUT
 Results: Powered but Idle at 9 V
Test Group 8 – Interference Sensitivity
These tests are not applicable. Tests to be performed by
customer.
Table 7. RESULTS
Supply (V)
Frequency in (kHz)
Vz (Vp-p)
Rs (W)
Vrs (mVp-p)
Z = (Rs/Vrs) * Vz (W)
9
7.8
0.3535
100.4
0.733
48419
9
15.625
0.3542
100.4
0.766
46425
9
31.25
0.3533
100.4
1.707
20780
9
39
0.3537
100.4
2.151
16509
Test ID 9.2 Unbalanced Capacitance
This test is not applicable. Test to be performed by
customer.
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TND340/D
REFERENCES
[1] FF−830 Fieldbus Foundation Specification 31.25 kbit/s Physical Layer Conformance Test – Rev. 1.50
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