5962-09208

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Paragraph 1.5, correct maximum total dose available from 300 Krads
(Si) to ≥ 300 Krads (Si). Paragraph 4.3.5.1a, last sentence, correct
5962F0824601 to 5962F0921001. Update boilerplate paragraphs. -gz
11-04-05
Charles F. Saffle
REV
SHEET
REV
SHEET
REV STATUS
REV
A
A
A
A
A
A
A
A
A
A
A
OF SHEETS
SHEET
1
2
3
4
5
6
7
8
9
10
11
PMIC N/A
PREPARED BY
Gary Zahn
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
CHECKED BY
Greg Cecil
APPROVED BY
Charles F. Saffle
DRAWING APPROVAL DATE
09-07-29
REVISION LEVEL
A
MICROCIRCUIT, HYBRID, LINEAR, POSITIVE,
LOW DROPOUT, ADJUSTABLE VOLTAGE
REGULATOR
SIZE
A
SHEET
DSCC FORM 2233
APR 97
CAGE CODE
5962-09208
67268
1 OF
11
5962-E196-11
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962



Federal
stock class
designator
\
F



RHA
designator
(see 1.2.1)
01



Device
type
(see 1.2.2)
09208
/
K



Device
class
designator
(see 1.2.3)
X



Case
outline
(see 1.2.4)
X



Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type. The device type identify the circuit function as follows:
Device type
01
Generic number
MSK 5824RH
Circuit function
Radiation hardened, 3.5 A, adjustable voltage regulator
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
Device performance documentation
K
Highest reliability class available. This level is intended for use in space
applications.
H
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
G
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C, and D).
E
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
D
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
2
1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
X
Y
See figure 1
See figure 1
8
8
Package style
Flat pack with gull wing leads, glass sealed
Flat pack with straight leads, glass sealed
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Input voltage (VIN) ......................................................................
Output current ............................................................................
Junction temperature (TJ) ..........................................................
Thermal resistance, junction-to-case (JC), TC = +125C ...........
Storage temperature ..................................................................
Lead temperature (soldering, 10 seconds) ................................
+7.0 V dc
3.5 A 2/
+150C
6.5C/W
-65C to +150C
+300C
1.4 Recommended operating conditions.
Input voltage range (VIN) ............................................................
Case operating temperature range (TC).....................................
+2.9 V dc to +6.5 V dc
-55C to +125C
1.5 Radiation features.
Maximum total dose available ..................................................
≥ 300 Krads (Si) 3/ 4/ 5/
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
1/
2/
3/
4/
5/
Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
Output current limit is dependent on the value of VIN - VOUT .
These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A. Dose rate shall be in accordance with MIL-STD-883, method 1019, condition A.
Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device
types have not been characterized for displacement damage.
See figure 3.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
3
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Radiation exposure circuits. The radiation exposure circuits shall be as specified on figure 3.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that the
manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Symbol
Reference voltage
VREF
VRLINE
Line regulation
Conditions 1/ 2/ 3/
-55C  TC +125C
unless otherwise specified
Group A
subgroups
VIN = 3.3 V, IOUT = 50 mA,
VOUT = VREF
VRLOAD
Unit
Min
Max
1,2,3
01
1.225
1.305
M,D,P,L,R,F 1/
1
01
1.225
1.310
2.97 V  VIN  3.63 V, IOUT = 50 mA
1
01
-0.25
0.25
-0.50
0.50
-1.0
1.0
-2.0
2.0
2,3
Load regulation
Limits
Device
type
VIN = 3.3 V, 50 mA  IOUT  3.0 A
1
01
2,3
%/V
%/A
Dropout voltage
VDO
IOUT = 3.0 A
1,2,3
01
Current limit 4/
IOUT
VIN = 3.3 V
1,2,3
01
3.0
Shutdown threshold
VST
VIN = 3.3 V
1,2,3
01
1.0
1.6
V
Output voltage at
shutdown
VOUTSD
VIN = VSHDN = 3.3 V,
IOUT = 50 mA
1,2,3
01
-0.1
0.1
V
1/
2/
3/
4/
0.5
V
V
A
Device type 01 has been characterized through all levels M, D, P, L, R, F of irradiation and tested to 1.5 times
at the F level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post
irradiation electrical measurements for any RHA level, TC = +25C.
Unless otherwise specified, VIN = 3.3 V, VSHUTDOWN = 0 V, VOUT = 2.5 V, and IOUT = 50 mA.
These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A.
Current limit is dependent upon the value of VIN.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
5
Case outline X.
Symbol
A
A1
øb
D/E
D1
e
e1
L
L1
R
S1
Millimeters
Min
Max
--4.83
0.076
0.18
0.58
0.69
18.92
19.18
27.18
27.69
2.54 TYP
7.49
7.75
2.79
3.81
0.76
1.27
0.76 REF
5.21
6.22
Inches
Min
Max
--.190
.003
.007
.023
.027
.745
.755
1.070
1.090
.100 TYP
.295
.305
.110
.150
.030
.050
.030 REF
.205
.245
NOTES:
1. A1 is measured from the bottom of the lead to the bottom of the package.
2. Pin 1 is indicated by the ESD marking on the package. Pin numbers are for reference only.
3. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound
units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the
inch-pound units shall take precedence.
4. Case outline X weight: 5.5 grams typical.
FIGURE 1. Case outlines.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
6
Case outline Y.
Symbol
A
A1
øb
D/E
e
e1
L
S1
Millimeters
Min
Max
--4.57
1.78
2.03
0.58
0.69
18.92
19.18
2.54 TYP
7.49
7.75
10.16
--5.21
6.22
Inches
Min
Max
--.180
.070
.080
.023
.027
.745
.755
.100 TYP
.295
.305
.400
--.205
.245
NOTES:
1. Pin 1 is indicated by the ESD class marking. Pin numbers are for reference.
2. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound
units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the
inch-pound units shall take precedence.
3. Pin numbers are for reference only.
4. Case outline Y weight: 5.8 grams typical.
FIGURE 1. Case outlines - Continued.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
7
Device type
01
Case outlines
X and Y
Terminal number
Terminal symbol
1
GND
2
GND
3
SHUTDOWN
4
ADJUST
5
VOUT
6
VOUT
7
VIN
8
VIN
FIGURE 2. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
8
FIGURE 3. Radiation exposure circuits.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
9
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
---
Final electrical parameters
1*, 2, 3
Group A test requirements
1, 2, 3
Group C end-point electrical
parameters
1, 2, 3
End-point electrical parameters
for radiation hardness assurance
(RHA) devices
1
* PDA applies to subgroup 1.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
b.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in method 1015 of MIL-STD-883.
(2)
TC = +125C minimum.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
End-point electrical parameters shall be as specified in table II herein.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
10
b.
Steady-state life test, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in method 1005 of MIL-STD-883.
(2)
TC = +125C minimum.
(3)
Test duration: 1,000 hours minimum as specified in 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA qualification is required for those devices with the RHA
designator as specified herein. End-point electrical parameters for radiation hardness assurance (RHA) devices shall be
specified in table II. Radiation testing will be in accordance with the qualifying activity (DLA Land and Maritime-VQ) approved
plan and with MIL-PRF-38534, Appendix G.
4.3.5.1 Total dose irradiation testing. Total dose irradiation testing shall be in accordance with MIL-STD-883 method 1019,
condition A and as specified herein. Sample testing in accordance with table I shall be performed on a representative device
type (similar device) at initial qualification and after any design or process changes which may affect the RHA response.
Sample size is a minimum of 8 devices (4 biased and 4 not biased). This sample testing is repeated for each new combination
for wafers of active elements on the most complex device.
a.
Similar device, in this application, means that if two or more device types have the same schematic function (same
active circuit design) and contain the same microcircuit and semiconductor elements, then the devices may be
considered similar and sample radiation testing would be performed on the device that is most complex of the similar
devices. The device types on drawings 5962-08246, 5962-09208, 5962-09209, and 5962-09210 are similar device
types. Device type 5962F0921001 is considered the most complex device.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534.
6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system application requires
configuration control and the applicable SMD. DLA Land and Maritime will maintain a record of users and this list will be used
for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DLA Land and Maritime-VA, telephone (614) 692-0547.
6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-1081.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103
and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime-VA and have agreed to
this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-09208
A
REVISION LEVEL
A
SHEET
11
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 11-04-05
Approved sources of supply for SMD 5962-09208 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information
bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML-38534. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962F0920801HXA
5962F0920801HXC
5962F0920801HYA
5962F0920801HYC
51651
51651
51651
51651
MSK 5824HRHG
MSK 5824HRHG
MSK 5824HRH
MSK 5824HRH
5962F0920801KXA
5962F0920801KXC
5962F0920801KYA
5962F0920801KYC
51651
51651
51651
51651
MSK 5824KRHG
MSK 5824KRHG
MSK 5824KRH
MSK 5824KRH
1/
2/
The lead finish shown for each PIN representing a hermetic
package is the most readily available from the manufacturer
listed for that part. If the desired lead finish is not listed
contact the Vendor to determine its availability.
Caution. Do not use this number for item acquisition. Items
acquired to this number may not satisfy the performance
requirements of this drawing.
Vendor CAGE
number
51651
Vendor name
and address
M. S. Kennedy Corporation
4707 Dey Road
Liverpool, NY 13088
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.