CERTIFICATE OF ACCREDITATION ANSI-ASQ National Accreditation Board 500 Montgomery Street, Suite 625, Alexandria, VA 22314, 877-344-3044 This is to certify that Techmaster Electronics, Inc. 46782 Lakeview Blvd. Fremont, CA 94538 has been assessed by ANAB and meets the requirements of international standard ISO/IEC 17025:2005 and national standard ANSI/NCSL Z540-1-1994 while demonstrating technical competence in the field(s) of CALIBRATION Refer to the accompanying Scope(s) of Accreditation for information regarding the types of calibrations and/or tests to which this accreditation applies. AC-1821 Certificate Number ANAB Approval Valid to: 11/13/2017 Version No. 001 Issued: 11/13/2015 This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated January 2009). SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994 Techmaster Electronics, Inc. 46782 Lakeview Blvd. Fremont CA 94538 Robert Tyler [email protected] 760-536-0227, ext.12 www.techmastertest.com CALIBRATION Valid to: November 13, 2017 Certificate Number: AC-1821 I. Electromagnetic - DC/Low Frequency PARAMETER/ EQUIPMENT RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] DC Voltage – Source3 (0 to 220) mV 220 mV to 2.2 V (2.2 to 11) V (11 to 22) V (22 to 220) V (220 to 1 100) V 8 µV/V + 0.6 µV 7 µV/V + 1 µV 7 µV/V + 3.5 µV 7 µV/V + 6.5 µV 8 µV/V + 80 µV 9 µV/V + 0.50 mV (0 to 100) mV 100 mV to 1 V (1 to 10) V (10 to 100) V (100 to 1 000) V 7.2 µV/V + 0.55 µV 7 µV/V + 0.42 µV 6.9 µV/V + 0.86 µV 9.2 µV/V + 38 µV 9.3 µV/V + 0.13 mV Up to 15 kV 2 mV/V DC Voltage - Measure3 Version 001 Issued: 11/13/2015 REFERENCE STANDARD OR EQUIPMENT Fluke 5700A/03 Agilent 3458A Opt 002 Ross Engineering VD-15, Agilent 3458A Opt 002 Page 1 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org METHOD(S) DOD Midas, OEM, and GIDEP Sourced Procedures PARAMETER/ EQUIPMENT AC Voltage - Source3 Version 001 RANGE (0 to 2.2) mV (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz (2.2 to 22) mV (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz (22 to 220) mV (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz 220 mV to 2.2 V (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz (2.2 to 22) V (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz Issued: 11/13/2015 CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] REFERENCE STANDARD OR EQUIPMENT METHOD(S) Fluke 5700A/03 DOD Midas, OEM, and GIDEP Sourced Procedures 0.55 mV/V + 4.5 µV 0.21 mV/V + 4.5 µV 0.11 mV/V + 4.5 µV 0.37 mV/V + 4.5 µV 0.85 mV/V + 7 µV 1.1 mV/V + 13 µV 1.7 mV/V + 25 µV 3.4 mV/V + 25 µV 0.55 mV/V + 5 µV 0.21 mV/V + 5 µV 0.11 mV/V + 5 µV 0.37 mV/V + 5 µV 0.85 mV/V + 7 µV 1.1 mV/V + 12 µV 1.7 mV/V + 25 µV 3.4 mV/V + 25 µV 0.55 mV/V + 13 µV 0.21 mV/V + 8 µV 0.11 mV/V + 8 µV 0.32 mV/V + 8 µV 0.85 mV/V + 25 µV 1.1 mV/V + 25 µV 1.7 mV/V + 35 µV 3.4 mV/V + 80 µV 0.50 mV/V + 80 µV 0.16 mV/V + 25 µV 75 µV/V + 6 µV 0.12 mV/V + 16 µV 0.25 mV/V + 70 µV 0.43 mV/V + 0.13 mV 1.1 mV/V + 0.35 mV 2.2 mV/V + 0.85 mV 0.50 mV/V + 0.80 mV 0.16 mV/V + 0.25 mV 75 µV/V + 60 µV 0.12 mV/V + 0.16 mV 0.25 mV/V + 0.35 mV 0.50 mV/V + 1.5 mV 1.3 mV/V + 4.3 mV 2.7 mV/V + 8.5 mV Page 2 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org PARAMETER/ EQUIPMENT AC Voltage - Source3 AC Voltage - Source3 Wide Band Absolute Level Output AC Voltage - Source3 Wide Band Flatness relative to 1 kHz DC Current - Source3 RANGE (22 to 220) V (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz 220 V to 1 100 V (15 to 50) Hz 50 Hz to 1 kHz 30 Hz to 500 kHz (0 to 1.1) mV (1.1 to 3) mV (3 to 11) mV (11 to 33) mV (33 to 110) mV (110 to 330) mV 330 mV to 1.1 V (1.1 to 3.5) V 0.50 mV/V + 8 mV 0.16 mV/V + 2.5 mV 80 µV/V + 0.8 mV 0.22 mV/V + 3.5 mV 0.50 mV/V + 8 mV 1.5 mV/V + 90 mV 4.7 mV/V + 90 mV 12 mV/V + 0.19 V 8 mV/V + 2 µV 7 mV/V + 3 µV 7 mV/V + 8 µV 6 mV/V + 16 µV 6 mV/V + 40 µV 5 mV/V + 0.10 mV 5 mV/V + 0.40 mV 4 mV/V + 0.50 mV 3 mV/V 1 mV/V 1 mV/V 1 mV/V 1 mV/V 1 mV/V 1 mV/V + 3 µV 2 mV/V + 3 µV 4 mV/V + 3 µV 10 mV/V + 3 µV (0 to 220) μA 220 μA to 2.2 mA (2.2 to 22) mA (22 to 220) mA 220 mA to 2.2 A (0 to 11) A (11 to 20.5) A 50 µA/A + 8 nA 50 µA/A + 8 nA 50 µA/A + 80 nA 60 µA/A + 0.8 µA 80 µA/A + 25 µA 0.50 mA/A + 0.50 mA 1 mA/A + 0.75 mA Issued: 11/13/2015 REFERENCE STANDARD OR EQUIPMENT METHOD(S) Fluke 5700A/03 0.40 mV/V + 16 mV 80 µV/V + 3.5 mV (10 to 30) Hz (30 to 120) Hz 120 Hz to 1.2 kHz (1.2 to 12) kHz (12 to 120) kHz 120 kHz to 1.2 MHz (1.2 to 2) MHz (2 to 10) MHz (10 to 20) MHz (20 to 30) MHz (0 to 220) A Version 001 CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] 0.50 A Fluke 5700A/03 Wide Band Function DOD Midas, OEM and GIDEP Sourced Procedures Fluke 5700A/03 Wide Band Function Fluke 5700A/03 Fluke 5520A HP 6671A, L&N Current Shunt, Agilent 3458A Opt 002 Page 3 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] Up to 100 nA 100 nA to 1 µA (1 to 10) µA (10 to 100) µA 100 µA to 1 mA (1 to 10) mA (1 to 10) A 22 µA/A + 93 pA 18 µA/A + 0.10 nA 28 µA/A + 0.14 nA 30 µA/A + 0.98 nA 30 µA/A + 6.5 nA 30 µA/A + 63 nA 1.5 mA/A + 0.80 mA Agilent 3458A Opt 002 0.40 A 0.60 A L&N 4361, Agilent 3458A Opt 002 Agilent 3458A Opt 002 PARAMETER/ EQUIPMENT DC Current - Measure3 AC Voltage - Measure3 Version 001 (10 to 100) A (100 to 300) A (0 to 10) mV (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 10 mV to 10 V (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz (1 to 2) MHz (10 to 100) V (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 100 V to 1 kV (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (2 to 10.6) kV 60 Hz Issued: 11/13/2015 REFERENCE STANDARD OR EQUIPMENT METHOD(S) Fluke 8846A 0.36 mV/V + 3.6 µV 0.23 V/V + 1.4 µV 0.32 mV/V + 1.7 µV 1.2 mV/V + 1.6 µV 5.7 mV/V + 2 µV 46 mV/V + 2.6 µV 72 µV/V + 0.85 mV 84 µV/V + 0.26 mV 0.17 mV/V + 0.26 mV 0.35 mV/V + 0.25 mV 0.93 mV/V + 0.27 mV 3.5 mV/V + 1.2 mV 12 mV/V + 1.2 mV 18 mV/V + 1.2 mV DOD Midas, OEM and GIDEP Sourced Procedures 0.24 mV/V + 4.7 mV 0.15 mV/V + 16 mV 0.15 mV/V + 17 mV 0.36 mV/V + 8.6 mV 1.4 mV/V + 3.9 mV 4.8 mV/V + 12 mV 18 mV/V + 12 mV 0.46 mV/V + 50 mV 0.46 mV/V + 28 mV 0.69 mV/V + 29 mV 1.5 mV/V + 24 mV 3.6 mV/V + 24 mV 10 mV/V Ross Engineering VD-15 Agilent 3458A Opt 002 Page 4 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org PARAMETER/ EQUIPMENT AC Current - Source3 Version 001 RANGE (0 to 220) µA (10 to 20) Hz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz 220 µA to 2.2 mA (10 to 20) Hz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (2.2 to 22) mA (10 to 20) Hz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (22 to 220) mA (10 to 20) Hz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz 220 mA to 2.2 A 20 Hz to 1kHz (1 to 5) kHz (5 to10) kHz (20 to 1 000) A (45 to 65) Hz (65 to 440) Hz Issued: 11/13/2015 CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] REFERENCE STANDARD OR EQUIPMENT METHOD(S) Fluke 5700A 0.70 mA/A + 2.5 nA 0.35 mA/A + 20 nA 0.14 mA/A + 16 nA 0.60 mA/A + 40 nA 1.6 mA/A + 80 nA 0.70 mA/A + 40 nA 0.35 mA/A + 35 nA 0.14 mA/A + 35 nA 0.60 mA/A + 0.40 µA 1.6 mA/A + 0.80 µA 0.70 mA/A + 0.40 µA 0.35 mA/A + 0.35 µA 0.14 mA/A + 0.35 µA 0.60 mA/A + 4 µA 1.6 mA/A + 8 µA DOD Midas, OEM and GIDEP Sourced Procedures 0.70 mA/A + 4 µA 0.35 mA/A + 3.5 µA 0.14 mA/A + 3.5 µA 0.60 mA/A + 40 µA 1.6 mA/A + 80 µA 0.66 mA/A + 0.17 mA 0.95 mA/A + 0.38 mA 3.6 mA/A + 0.75 mA 96 mA 43 mA Page 5 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org Fluke 5520A with Fluke Coil PARAMETER/ EQUIPMENT AC Current - Measure3 Resistance - Source3 Version 001 RANGE (0 to 100) µA (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz 100 µA to 100 mA (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz 100 mA to 1 A (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz 10A (3 to 5) Hz (5 to 10) Hz 10 Hz to 5 kHz (5 to 10) kHz 100A (50 to 60) Hz 300A (50 to 60) Hz (0 to 11) Ω (11 to 33) Ω (33 to 110) Ω (110 to 330) Ω 330 Ω to 1.1 kΩ (1.1 to 3.3) kΩ (3.3 to 11) kΩ (11 to 33) kΩ (33 to 110) kΩ (110 to 330) kΩ 330 kΩ to 1.1 MΩ (1.1 to 3.3) MΩ (3.3 to 11) MΩ (11 to 33) MΩ (33 to 110) MΩ (110 to 330) MΩ (330 to 1 100) MΩ Issued: 11/13/2015 CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] REFERENCE STANDARD OR EQUIPMENT METHOD(S) Agilent 3458A Opt 002 4 mA/A + 30 nA 1.5 mA/A + 30 nA 0.60 mA/A + 30 nA 0.60 mA/A + 30 nA 4 mA/A + 20 µA 1.5 mA/A + 20 µA 0.60 mA/A + 20 µA 0.30 mA/A + 20 µA 4 mA/A + 0.20 mA 1.6 mA/A + 0.20 mA 0.80 mA/A + 0.20 mA 1 mA/A + 0.20 mA Fluke 8846A 20 mA/A + 6 mA 11 mA/A + 6 mA 1.5 mA/A + 6 mA 3.5 mA/A + 70 mA 0.60 A 0.80 A 5.7 µΩ/Ω + 1.1 mΩ 35 µΩ/Ω + 1.8 mΩ 29 µΩ/Ω + 0.57 Ω 33 µΩ/Ω + 2.4 mΩ 30 µΩ/Ω + 4.3 mΩ 33 µΩ/Ω + 27 mΩ 4.5 µΩ/Ω + 1.7 Ω 34 µΩ/Ω + 0.23 Ω 33 µΩ/Ω + 0.33 Ω 35 µΩ/Ω + 4 Ω 37 µΩ/Ω + 2.4 Ω 71 µΩ/Ω + 36 Ω 0.15 mΩ/Ω + 67 Ω 0.39 mΩ/Ω + 3 kΩ 0.58 mΩ/Ω + 4.8 kΩ 3.5 mΩ/Ω + 0.12 MΩ 18 mA/A + 0.59 MΩ Leeds & Northrup 4361 w/3458A Leeds & Northrup 4363 w/3458A Fluke 5520A Page 6 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org DOD Midas, OEM and GIDEP Sourced Procedures PARAMETER/ EQUIPMENT RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] Resistance - Source3 Fixed Points 1Ω 1.9 Ω 10 Ω 19 Ω 100 Ω 190 Ω 1 kΩ 1.9 kΩ 10 kΩ 19 kΩ 100 kΩ 190 kΩ 1 MΩ 1.9 MΩ 10 MΩ 19 MΩ 100 MΩ 0.12 mΩ 0.22 mΩ 0.28 mΩ 0.58 mΩ 1.3 mΩ 2.4 mΩ 10 mΩ 20 mΩ 90 mΩ 0.19 Ω 1.3 Ω 2.5 Ω 24 Ω 47 Ω 0.47 kΩ 1.3 kΩ 12 kΩ Fluke 5700A/003 10 Ω 100 Ω 1 kΩ 10 kΩ 100 kΩ 1 MΩ 10 MΩ 100 MΩ 1 GΩ 22 µΩ/Ω + 62 µΩ 18 µΩ/Ω + 0.61 mΩ 16 µΩ/Ω + 0.73 mΩ 15 µΩ/Ω + 13 mΩ 15 µΩ/Ω + 67 mΩ 21 µΩ/Ω + 2.7 Ω 46 µΩ/Ω + 0.39 kΩ 0.56 mΩ/Ω + 1.2 kΩ 6 mΩ/Ω + 12 kΩ Agilent 3458A Opt 002 Resistance - Measure3 Fixed Points (4 WIRE) Fluke 5520A Capacitance - Source3 190 pF to 1.1 nF (1.1 to 11) nF (11 to 110) nF (110 to 330) nF 330 nF to 1.1 µF (1.1 to 3.3) µF (3.3 to 11) µF (11 to 33) µF (33 to 110) µF (110 to 330) µF 330 µF to 1.1 mF 10 Hz to 10 kHz 10 Hz to 3 kHz 10 Hz to 1 kHz 10 Hz to 1 kHz (10 to 600) Hz (10 to 300) Hz (10 to 150) Hz (10 to 120) Hz (10 to 80) Hz (0 to 50) Hz (0 to 20) Hz 5 mF/F + 12 pF 5.8 mF/F + 12 pF 2.9 mF/F + 0.12 nF 2.9 mF/F + 0.35 nF 3 mF/F + 1.2 nF 4.1 mF/F + 3.5 nF 4.1 mF/F + 11 nF 4.7 mF/F + 35 nF 5.9 mF/F + 0.11 µF 8.1 mF/F + 0.35 µF 12 mF/F + 0.27 µF 1 pF 10 pF 100 pF 1 nF 1 kHz 1 kHz 1 kHz 1 kHz 1.2 fF 12 fF 0.12 pF 1.2 pF Version 001 REFERENCE STANDARD OR EQUIPMENT Issued: 11/13/2015 Agilent 16380C Page 7 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org METHOD(S) DOD Midas, OEM and GIDEP Sourced Procedures RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] (-200 to -50) °C (-50 to 1 372) °C 0.56 °C (1 °F) 0.28 °C (0.5 °F) (-200 to -50) °C (-50 to 400) °C 0.56 °C (1 °F) 0.28 °C (0.5 °F) Type J (-210 to -50) °C (-50 to 760) °C 0.56 °C (1 °F) 0.28 °C (0.5 °F) Type E (-230 to -50) °C (-50 to 1 000) °C 0.56 °C (1 °F) 0.28 °C (0.5 °F) Type R Oscilloscopes Square Wave Signal 10 Hz to 10 kHz 50 Ω 1MΩ DC Signal Into 50Ω Into 1MΩ (0 to 1 768) °C 0.95 °C (1.8 °F) 1 mV to 6.6 V p-p 1 mV to 130 V p-p 2.5 mV/V + 40 µV 0.50 mV/V + 5 µV 1 mV to 6.6 V p-p 1 mV to 130 V p-p 2.5mV/V + 40 µV 0.50 mV/V + 5 µV Absolute Amplitude 50 kHz Reference 50 kHz to 100 MHz (100 to 300) MHz (300 to 500) MHz (500 to 600) MHz 20 mV/V + 0.30 mV 35 mV/V + 0.30 mV 40 mV/V + 0.30 mV 55 mV/V + 0.30 mV 60 mV/V + 0.30 mV Flatness referenced to 50 kHz reference 10 MHz Reference 600 MHz to 1.6 GHz (1.6 to 2.1) GHz 20 mV/V + 0.30 mV 70 mV/V + 0.30 mV 80 mV/V + 0.30 mV Time Markers (5-2-1 sequence) into a 50 Ω load 50 kHz to 100 MHz (100 to 300) MHz (300 to 500) MHz (500 to 600) MHz 600 MHz to 1.6 GHz (1.6 to 2.1) GHz 15 mV/V + 0.10 mV 20 mV/V + 0.10 mV 35 mV/V + 0.10 mV 40 mV/V + 0.10 mV 50 mV/V + 0.10 mV 60 mV/V + 0.10 mV Fast Edge Mode 5 s to 50 ms 20 ms to 500 ps 2.5 µs/s + 5 µHz 0.33 µs/s (1 to 100) kHz < 0.15 ns/s +/- 25 ps PARAMETER/ EQUIPMENT Electrical Simulation of Thermocouple Indicating Devices – Source and Measure3 Type K Type T Leveled Sine Wave REFERENCE STANDARD OR EQUIPMENT Fluke 5520A Version 001 Issued: 11/13/2015 DOD Midas, OEM and GIDEP Sourced Procedures Fluke 5820A ++ DOD Midas, OEM and GIDEP Sourced Procedures + 2.1 GHz option Programmable Rise Time METHOD(S) Page 8 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org II. Electromagnetic - RF/Microwave PARAMETER/ EQUIPMENT RF Tuned Power Measure 100 kHz to 26.5 GHz 100 kHz to 3 GHz RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] 0 dB -10 dB -20 dB -30 dB -40 dB -50 dB -60 dB -70 dB -80 dB -90 dB -100 dB 0.01 dB 0.02 dB 0.03 dB 0.04 dB 0.05 dB 0.05 dB 0.07 dB 0.08 dB 0.10 dB 0.10 dB 0.11 dB -110 dB -120 dB -130 dB 0.11 dB 0.22 dB 0.56 dB REFERENCE STANDARD OR EQUIPMENT Agilent E4440A Option 233 Digital Modulation Measure Carrier Frequency 2 MHz to 2.65 GHz HP 89441A Option AYA DOD Midas, OEM and GIDEP Sourced Procedures Error Vector Magnitude for Modulation Types: MSK, GMSK, BPSK, DQPSK, Π/4DQPSK, 8PSK, 16QAM, 32 QAM and QPSK (1 to 100) kHz 100 kHz to 1 MHz 1 MHz to 2.65 GHz 0.3 % 0.5 % 1.0 % Phase Error for Modulation Types: MSK, GMSK, BPSK, DQPSK, Π/4DQPSK, 8PSK, 16QAM, 32 QAM and QPSK (1 to 100) kHz (0.1 to 1) MHz 1 MHz to 2.65 GHz 0.17 ° 0.34 ° 0.57 ° Error Vector Magnitude for FSK Modulation Modulation Frequency 3.2 kHz 1.152 kHz 0.3 % 1.0 % DC to 100 kHz 0.46 dB Amplitude Modulation – Source Rate: 10 MHz to 50 GHz 0 % to 100 % Version 001 METHOD(S) Issued: 11/13/2015 Agilent 83650B Page 9 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] 100 kHz to 10 MHz 0.75 % rdg. + 0.01 % 10 MHz to 3 GHz 0.5 % rdg. + 0.01 % 2.5 % rdg. + 0.01 % PARAMETER/ EQUIPMENT Amplitude Modulation Measure Rate: 50 Hz to 10 kHz, 5 % to 99 % 50 Hz to 100 kHz, 20 % to 99 % 5 % to 20 % 50 Hz to 100 kHz, 20 % to 99 % 5 % to 20 % Frequency Modulation Measure Rate: 20 Hz to 10 kHz (3 to 26.5) GHz Dev: 200 Hz to 40 kHz pk 15 mHz/Hz + 1.5 Hz 10 mHz/Hz + 1.5 Hz Rate: 50 Hz to 200 kHz Dev:250 Hz to 400 kHz pk 10 MHz to 6.6 GHz Beta > 0.2 Beta > 0.45 15 mHz/Hz + 1.5 Hz 10 mHz/Hz + 1.5 Hz Rate: 50 Hz to 200 kHz Dev:250 Hz to 400 kHz pk (6.6 to 13.2) GHz Beta > 0.2 Beta > 8 25 mHz/Hz + 3 Hz 10 mHz/Hz + 3 Hz Rate: 50 Hz to 100 kHz Dev:250 Hz to 400 kHz pk (13.2 to 26.5) GHz Beta > 0.2 Beta > 16 38 mHz/Hz + 6.0 Hz 10 mHz/Hz + 6.0 Hz Frequency Modulation Source 1 kHz rate Max. Dev. 2 MHz Max. Dev. 1 MHz Max. Dev. 2 MHz Max. Dev. 4 MHz Max. Dev. 8 MHz Max. Dev. 16 MHz Max. Dev. 32 MHz Max. Dev. 64 MHz 250 kHz to 250 MHz (250 to 500) MHz 500 MHz to 1 GHz (1 to 2) GHz (2 to 3.2) GHz (3.2 to 10) GHz (10 to 20) GHz (20 to 40) GHz Max Dev. 8 MHz 40 MHz to 50 GHz Issued: 11/13/2015 METHOD(S) Agilent N5531S Option 233 1.5 % rdg. + 0.01 % 4.5 % rdg. + 0.01 % 250 kHz to 10 MHz Beta > 0.2 Beta > 1.2 Version 001 REFERENCE STANDARD OR EQUIPMENT Agilent N5531S Option 233 35 mHz/Hz + 20 Hz @ 1 kHz rate Agilent E8257D Option UNT 100 mHz/Hz @ 1 MHz rate Agilent 83650B Page 10 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org DOD Midas, OEM and GIDEP Sourced Procedures RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] 100 kHz to 6.6 GHz (6.6 to 13.2) GHz (13.2 to 26.5) GHz 10 mrad/rad + 0.0017 rad 10 mrad/rad + 0.0033 rad 10 mrad/rad + 0.0066 rad PARAMETER/ EQUIPMENT Phase Modulation Measure >0.7 rad Dev. >0.6 rad Dev. >1.2 rad Dev. Phase Modulation Source 250 kHz to 250 MHz (250 MHz to 500 MHz 500 MHz to 1 GHz (1 to 2) GHz (2 to 3.2) GHz (3.2 to 10) GHz (10 to 20) GHz (20 to 40) GHz 20 rad 10 rad 20 rad 40 rad 80 rad 160 rad 320 rad 640 rad REFERENCE STANDARD OR EQUIPMENT Agilent N5531S Option 233 50 mrad/rad + 0.01 rad Agilent E8257D Option UNT Distortion - Measure Rate: 20 Hz to 250 kHz (0.01 to 100) % 250 kHz to 26.5 GHz +/- 1 dB Agilent N5531S 20 Hz to 20 kHz (20 to 100) kHz +/- 1 dB +/- 2 dB Agilent 8903B Power - Measure, 1 mW reference 50 MHz 1 mW Power Reference 0.3 % or 0.003 mW Agilent 432A Agilent 478A Opt H76 Agilent 3458A 100 kHz to 4.2 GHz 0.08 dB Agilent E4419B Agilent 8482A 10 MHz to 12.4 GHz (12.4 to 18) GHz 0.08 dB 0.1 dB 50 MHz to 12.4 GHz (12.4 to 26.5) GHz 0.1 dB 0.15 dB (26.5 to 40) GHz (40 to 50) GHz 0.16 dB 0.24 dB Noise Figure - Source 15 dB ENR 10 MHz to 10 GHz (10 to 26.5) GHz 0.14 dB 0.17 dB Agilent 346C Noise Figure - Measure 10 MHz to 10 GHz (10 to 26.5) GHz 0.16 dB 0.18 dB Agilent 346C, Agilent E4440A Opt 219, Agilent 8449B Single Sideband Phase Noise - Measure 1 MHz to 3 GHz 0.85 dB Agilent E4440A Opt 226 Power Flatness 0 dBm or 1 mW Version 001 Issued: 11/13/2015 METHOD(S) Agilent E4419B Agilent 8481A Agilent E4419B Agilent 8485A Agilent E4419B Agilent 8487A Page 11 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org DOD Midas, OEM and GIDEP Sourced Procedures PARAMETER/ EQUIPMENT Transmission S12/S22 Measure Magnitude Transmission S12/S22 Measure Phase Transmission S12/S22 Measure Magnitude Version 001 RANGE 45 MHz to 2 GHz (0 to - 20) dB (- 20 to - 30) dB (- 30 to - 40) dB (- 40 to - 50) dB (- 50 to - 60) dB (2 to 20) GHz (0 to - 30) dB (- 30 to - 40) dB (- 40 to - 50) dB (- 50 to - 60) dB (20 to 40) GHz (0 to - 30 dB (- 30 to - 40 dB (- 40 to - 50 dB (- 50 to - 60 dB (40 to 50) GHz (0 to - 20) dB (- 20 to - 30) dB (- 30 to - 40) dB (- 40 to - 50) dB (- 50 to - 60) dB 45 MHz to 2 GHz (0 to - 20) dB (2 to 20) GHz 0 to - 20) dB (20 to 40) GHz (0 to - 20) dB (40 to 50) GHz (0 to - 20) dB 45 MHz to 2 GHz (0 to - 25) dB (- 25 to - 40) dB (- 40 to - 55) dB (- 55 to - 70) dB (2 to 8) GHz (0 to - 30) dB (- 30 to - 50) dB (- 50 to - 60) dB (- 60 to - 70) dB (8 to 20) GHz (0 to - 30) dB (- 30 to - 40) dB (- 40 to - 50) dB (- 50 to - 60) dB (- 60 to - 70) dB (20 to 26.5) GHz (0 to - 20) dB (- 20 to - 30) dB (- 30 to - 40) dB (- 40 to - 50) dB (- 50 to - 60) dB (- 60 to - 70) dB Issued: 11/13/2015 CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] REFERENCE STANDARD OR EQUIPMENT METHOD(S) 0.03 dB 0.05 dB 0.15 dB 0.4 dB 1.5 dB 0.06 dB 0.08 dB 0.16 dB 0.35 dB 0.18 dB 0.34 dB 0.8 dB 2.5 dB Agilent 8510/8517A, Agilent 85056A 0.25 dB 0.4 dB 1.1 dB 4 dB 11 dB 0.15° DOD Midas, OEM and GIDEP Sourced Procedures 0.4° 0.9° 1.2° 0.03 dB 0.05 dB 0.1 dB 0.4 dB 0.02 dB 0.04 dB 0.2 dB 0.7 dB 0.03 dB 0.06 dB 0.15 dB 0.6 dB 1.5 dB Agilent 8510/8515A, Agilent 85052D 0.04 dB 0.06 dB 0.2 dB 0.6 dB 2 dB 9 dB Page 12 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org PARAMETER/ EQUIPMENT Transmission S12/S22 Measure Phase Reflection S11/S22 Measure Magnitude RANGE 45 MHz to 2 GHz (0 to - 20 dB (2 to 8) GHz (0 to - 20) dB (8 to 20) GHz (0 to - 20) dB (20 to 26.5) GHz (0 to - 20) dB 45 MHz to 2 GHz (2 to 20) GHz (20 to 40) GHz (40 to 50) GHz CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] REFERENCE STANDARD OR EQUIPMENT METHOD(S) 0.2 ° 0.15 ° Agilent 8510/8515A Agilent 85052D 0.18 ° 0.25 ° 0.02 dB 0.03 dB 0.04 dB 0.05 dB Reflection S11/S22 Measure Phase 45 MHz to 50 GHz 16 ° Reflection S11/S22 Measure Magnitude 45 MHz to 2 GHz (2 to 26.5) GHz 0.015 dB 0.01 dB Agilent 8510/8517A Agilent 85056A DOD Midas, OEM and GIDEP Sourced Procedures Agilent 8510/8515A Agilent 85052D Reflection S11/S22 Measure Phase 45 MHz to 26.5 GHz 4° RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] III. Time & Frequency PARAMETER/ EQUIPMENT 1 μHz to 80 MHz Frequency - Source3 5 x 10-125 x 10-12 5 x 10-12 REFERENCE STANDARD OR EQUIPMENT Agilent 3325A HP 33250A with Agilent 58503B 58503B Agilent E8257D with Agilent E8257D 58503B Agilent58503B 10 MHz to 26.5 GHz 5 x 10-12 (26.5 To 50) GHz 1 Hz 1 μHz to 225 MHz 5 x 10-12 Agilent 53132A Agilent 58503B 10 Hz to 40 GHz 5 x 10-12 Agilent 53152A Agilent 58503B Agilent 83650L Agilent 58503B Frequency - Measure3 Version 001 Issued: 11/13/2015 METHOD(S) Page 13 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org DOD Midas, OEM and GIDEP Sourced Procedures IV. Thermodynamic PARAMETER/ EQUIPMENT Temperature - Measure Relative Humidity Measure RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] (0 to 50) °C 0.25 °C Hart Scientific 1620A with 2626-S (-40 to 100) °F (100 to 212) °F (-40 to 100) °C 0.21 °F 0.25 °F 0.11°C Oakton 340 with S-08491-10 Surface Probe (0 to 80) % RH 2 %RH Vaisala HMI41/HMP46 REFERENCE STANDARD OR EQUIPMENT METHOD(S) DOD Midas, OEM and GIDEP Sourced Procedures V. Mechanical PARAMETER/ EQUIPMENT Scales 3 Balances 3 3 Torque - Source Version 001 Issued: 11/13/2015 RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] REFERENCE STANDARD OR EQUIPMENT 5 lb 10 lb 20 lb 50 lb 0.15 lb (0.02 g) 0.14 lb ( 0.031 g) 0.18 lb (0.05 g) 0.18 lb (0.51 g) Troemner Weights (5 to 50) lbs Class F 100 g to 1 kg 0.00015 % of reading 10 mg 20 mg 100 mg 200 mg 500 mg 1g 2g 5g 10 g 20 g 50 g 100 g 0.21 mg 0.26 mg 0.43 mg 0.54 mg 0.72 mg 0.9 mg 1.1 mg 1.5 mg 2.0 mg 4.0 mg 10 mg 20 mg Up to 50 ft/lb (2 to 25) ft/lb (0.6 % + 0.003) ft lb (0.6 % + 0.003) ft lb (2 to 25) in/lb (0.5 % + 0.03) in lb METHOD(S) Troemner Weights 100 g to 1 kg Generic Weight Set 10 mg to 100 g Mountz LTT-2100 Mountz BMX25i with Mountz LTT-2100 Page 14 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org DOD Midas, OEM and GIDEP Sourced Procedures VI. Dimensional PARAMETER/ EQUIPMENT RANGE CALIBRATION & MEASUREMENT CAPABILITY [EXPRESSED AS UNCERTAINTY(±)] Calipers 3 Inside Diameter (Fixed Points) 1.0000 in 1.6000 in 820 µin + 21.1 µin/in 820 µin + 21.1 µin/in Calipers 3 Outside Diameter 0.05000 in to 8.000 in 790 µin + 4.2 µin/in REFERENCE STANDARD OR EQUIPMENT Ringmaster Ring Gages Mitutoyo Gage Blocks Micrometers 3Outside Diameter 0.05000 in to 8.000 in METHOD(S) DOD Midas, OEM and GIDEP Sourced Procedures 41 µin + 22.6 µin/in Notes: 1. 2. 3. 4. Calibration and Measurement Capabilities (Expanded Uncertainties) are based on approximately a 95% confidence interval, using a coverage of k=2. This laboratory offers calibration services in-laboratory and on-site at customer-designated locations. Since on-site conditions are typically more variable than those in the laboratory, larger measurement uncertainties are expected on-site than what is reported on the accredited scope. These parameters are available for on-site calibration. This scope is formatted as part of a single document including the Certificate of Accreditation No. AC-1821 Vice President Version 001 Issued: 11/13/2015 Page 15 of 15 500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org