Data Sheet

NPIC6C4894-Q100
Power logic 12-bit shift register; open-drain outputs
Rev. 1 — 17 April 2014
Product data sheet
1. General description
The NPIC6C4894-Q100 is a 12-stage serial shift register. It has a storage latch associated
with each stage for strobing data from the serial input (D) to the parallel open-drain
outputs (QP0 to QP11). Data is shifted on positive-going clock (CP) transitions. The data
in each shift register stage is transferred to the storage register when the latch enable (LE)
input is HIGH. Data in the storage register drives the gate of the output extended-drain
NMOS transistor whenever the output enable input (OE) is HIGH. A LOW on OE causes
the outputs to assume a high-impedance OFF-state. Operation of the OE input does not
affect the state of the registers. Two serial outputs (QS1 and QS2) are available for
cascading a number of NIC6C4894-Q100 devices. Serial data is available at QS1 on
positive-going clock edges to allow high-speed operation in cascaded systems with a fast
clock rise time. The same serial data is available at QS2 on the next negative going clock
edge. It is used for cascading NPIC6C4894-Q100 devices when the clock has a slow rise
time. The open-drain outputs are 33 V/100 mA continuous current extended-drain NMOS
transistors designed for use in systems that require moderate load power such as LEDs.
Integrated voltage clamps in the outputs, provide protection against inductive transients.
This protection makes the device suitable for power driver applications such as relays,
solenoids and other low-current or medium-voltage loads.
This product has been qualified to the Automotive Electronics Council (AEC) standard
Q100 (Grade 1) and is suitable for use in automotive applications.
2. Features and benefits
 Automotive product qualification in accordance with AEC-Q100 (Grade 1)
 Specified from 40 C to +125 C
 Low RDSon
 12 Power EDNMOS transistor outputs of 100 mA continuous current
 250 mA current limit capability
 Output clamping voltage 33 V
 30 mJ avalanche energy capability
 Low power consumption
 Latch-up performance exceeds 100 mA per JESD 78 Class II level A
 ESD protection:
 HBM AEC-Q100-002 revision D class H2 exceeds 2500 V
 CDM AEC-Q100-011 revision C1 class C6 exceeds 1000 V
NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
3. Applications
 LED sign
 Graphic status panel
 Fault status indicator
4. Ordering information
Table 1.
Ordering information
Type number
NPIC6C4894D-Q100
Package
Temperature range Name
Description
Version
40 C to +125 C
SO20
plastic small outline package; 20 leads;
body width 7.5 mm
SOT163-1
TSSOP20
plastic thin shrink small outline package; 20 leads; SOT360-1
body width 4.4 mm
NPIC6C4894PW-Q100 40 C to +125 C
5. Functional diagram
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Fig 1.
DDD
Logic symbol
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
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Functional diagram
VCC
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Fig 3.
DDD
Schematic of all inputs
Fig 4.
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Schematic of open-drain outputs (QPn)
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Fig 5.
43
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Logic diagram
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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Power logic 12-bit shift register; open-drain outputs
6. Pinning information
6.1 Pinning
13,&&4
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43 43
43 43
43 43
43 43
43 43
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Fig 6.
Pin configuration SO20 and TSSOP20
6.2 Pin description
Table 2.
Pin description
Symbol
Pin
Description
LE
1
latch enable input
D
2
serial data input
CP
3
clock input
QP0 to QP11
4, 5, 6, 7, 8, 9, 18, 17, 16, 15, 14, 13
parallel output
GND
10
ground (0 V)
QS1
11
serial output
QS2
12
serial output
OE
19
output enable input
VCC
20
supply voltage
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
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NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
7. Functional description
Table 3.
Function table[1]
At the positive clock edge, the information in the 10th register stage is transferred to the 11th register stage and the QS output
Control
Input
Parallel output
Serial output
CP
OE
LE
D
QP0
QPn
QS1[2]
QS2[3]

L
X
X
Z
Z
Q10S
no change

L
X
X
Z
Z
no change
Q11S

H
L
X
no change
no change
Q10S
no change

H
H
L
Z
QPn1
Q10S
no change

H
H
H
L
QPn1
Q10S
no change

H
H
H
no change
no change
no change
Q11S
[1]
H = HIGH voltage level; L = LOW voltage level; X = don’t care;  = LOW-to-HIGH clock transition;  = HIGH-to-LOW clock transition;
Z = high-impedance OFF-state.
[2]
Q10S = the data in register stage 10 before the LOW to HIGH clock transition.
[3]
Q11S = the data in register stage 11 before the HIGH to LOW clock transition.
&3LQSXW
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RXWSXW
VHULDO46
RXWSXW
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Fig 7.
Timing diagram
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
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NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
8. Limiting values
Table 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V).
Symbol
Parameter
Conditions
Min
Max
Unit
VCC
supply voltage
0.5
+7.0
V
VI
input voltage
VDS
drain-source voltage
QPn
0.3
+7.0
V
-
+33
V
VO
output voltage
QSn
0.5
+7.0
V
IIK
input clamping current
VI < 0.5 V or VI > VCC + 0.5 V
-
50
mA
IOK
output clamping current
QSn; VO < 0.5 V or VO > VCC + 0.5 V
Id(SD)
source-drain diode current
continuous
-
100
mA
-
250
mA
-
500
mA
-
100
mA
[2]
-
250
mA
single output; Tamb = 25 C
[2]
-
250
mA
-
30
mJ
-
200
mA
65
+150
C
-
1500
mW
-
1250
mW
[1]
pulsed
drain current
ID
[2]
Tamb = 25 C
continuous; each output; all outputs
on
pulsed; each output; all outputs on
peak drain current
IDM
EAS
non-repetitive avalanche
energy
single pulse; see Figure 8 and
Figure 16
[3]
IAL
avalanche current
see Figure 8 and Figure 16
[3]
Tstg
storage temperature
Tamb = 25 C
[4]
total power dissipation
Ptot
SO20
TSSOP20
Tamb = 125 C
[4]
SO20
-
300
mW
TSSOP20
-
250
mW
[1]
Each power EDNMOS source is internally connected to GND.
[2]
Pulse duration  100 s and duty cycle  2 %.
[3]
VDS = 15 V; starting junction temperature (Tj) = 25 C; L = 1.5 H; avalanche current (IAL) = 200 mA.
[4]
For SO20 package: above 25 C the value of Ptot derates linearly with 12 mW/C.
For TSSOP20 package: above 25 C the value of Ptot derates linearly with 10 mW/C.
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
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Power logic 12-bit shift register; open-drain outputs
8.1 Test circuit and waveform
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(1) The word generator has the following characteristics: tr, tf  10 ns; ZO = 50 .
(2) The input pulse duration (tW) is increased until peak current IAL = 200 mA. Energy test level is defined as:
EAS = IAL  V(BR)DSS  tAL/2 = 30 mJ.
Fig 8.
Test circuit and waveform for measuring single-pulse avalanche energy
9. Recommended operating conditions
Table 5.
Recommended operating conditions
Symbol
Parameter
VCC
supply voltage
VI
input voltage
ID
drain current
Tamb
ambient temperature
Conditions
4.5
pulsed drain output current;
VCC = 5 V; Tamb = 25 C;
all outputs on
Pulse duration  100 s and duty cycle  2 %.
[2]
Technique should limit Tj  Tamb to 10 C maximum.
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 17 April 2014
[1][2]
Typ
Max
Unit
5.0
5.5
V
-
5.5
V
-
-
250
mA
40
-
+125
C
0
[1]
NPIC6C4894_Q100
Min
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Power logic 12-bit shift register; open-drain outputs
10. Static characteristics
Table 6.
Static characteristics
At recommended operating conditions unless otherwise specified; Voltages are referenced to GND (ground = 0 V).
Symbol Parameter
Tamb = 25 C
Conditions
Tamb = 40 C to 125 C Unit
Min
Typ
Max
Min
Typ
Max
VIH
HIGH-level
input voltage
0.85VCC
-
-
-
-
-
V
VIL
LOW-level
input voltage
-
-
0.15VCC
-
-
-
V
VOH
HIGH-level
QSn; VI = VIH or VIL
output voltage
IO = 20 A; VCC = 4.5 V
4.4
4.49
-
-
-
-
V
IO = 4 mA; VCC = 4.5 V
4.0
4.2
-
-
-
-
V
LOW-level
QSn; VI = VIH or VIL
output voltage
IO = 20 A; VCC = 4.5 V
VOL
-
0.005
0.1
-
-
-
V
-
0.3
0.5
-
-
-
V
-
-
1
-
-
-
A
37
-
-
-
-
V
1.2
0.85
-
-
-
-
V
OE = LOW
-
0.006
200
-
-
-
A
OE = HIGH
-
0.01
500
-
-
-
A
OE = LOW; CP = 5 MHz;
see Figure 15 and Figure 17
-
1
5
-
-
-
mA
-
140
-
-
-
-
mA
-
0.002
0.2
-
0.15
0.3
A
VCC = 4.5 V; IO = 50 mA
-
2.7
9
-
VCC = 4.5 V; IO = 100 mA
-
2.8
10
-
IO = 4 mA; VCC = 4.5 V
input leakage
current
II
VCC = 5.5 V; VI = VCC or GND
V(BR)DSS drain-source
breakdown
voltage
QPn; IO = 1 mA
33
VSD
source-drain
voltage
QPn; IO = 100 mA
ICC
supply current VCC = 5.5 V; VI = VCC or GND
[1][2][3]
IO
output current QPn; VO = 0.5 V
IOZ
OFF-state
QPn; VCC = 5.5 V; VDS = 30 V
output current
RDSon
drain-source
on-state
resistance
see Figure 18 and Figure 19
[1][2]
[1]
Technique should limit Tj  Tamb to 10 C maximum.
[2]
These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts.
[3]
4.3

12
-
-

The output current is defined for a consistent comparison between devices from different sources. It is the current that produces a
voltage drop of 0.5 V.
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
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Power logic 12-bit shift register; open-drain outputs
11. Dynamic characteristics
Table 7.
Dynamic characteristics
At recommended operating conditions unless otherwise specified; Voltages are referenced to GND (ground = 0 V); For test
circuit, see Figure 15.
Symbol Parameter
Tamb = 25 C
Conditions
Unit
Min
Typ
Max
-
5
-
ns
QPn; see Figure 12
-
60
-
ns
QSn; see Figure 9
-
6
-
ns
HIGH to LOW output
transition time
QPn; see Figure 12
-
18
-
ns
QSn; see Figure 9
-
6
-
ns
tPLZ
LOW to OFF-state
propagation delay
CP, LE and OE to QPn; IO = 75 mA;
see Figure 10, Figure 11, Figure 12 and Figure 20
-
105
-
ns
tPZL
OFF-state to LOW
propagation delay
CP, LE and OE to QPn; IO = 75 mA;
see Figure 10, Figure 11, Figure 12 and Figure 20
-
10
-
ns
fclk(max)
maximum clock
frequency
CP; see Figure 9
10
-
-
MHz
tsu
set-up time
D to CP; see Figure 13
20
-
-
ns
th
hold time
D to CP; see Figure 13
20
-
-
ns
tW
pulse width
CP, LE; see Figure 9 and Figure 11
trr
ta
reverse recovery
current rise time
[1]
tpd is the same as tPLH and tPHL.
tpd
propagation delay
CP to QSn; see Figure 9
tTLH
LOW to HIGH output
transition time
tTHL
[2]
[1]
[2]
40
-
-
ns
reverse recovery time IO = 100 mA; dI/dt = 10 A/s; see Figure 14
[3][4]
-
120
-
ns
IO = 100 mA; dI/dt = 10 A/s; see Figure 14
[3][4]
-
100
-
ns
This is the maximum serial clock frequency assuming cascaded operation where serial data is passed from one stage to a second
stage. The clock period allows for CP → QSn propagation delay and setup time plus some timing margin.
[3]
Technique should limit Tj  Tamb to 10 C maximum.
[4]
These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts.
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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Power logic 12-bit shift register; open-drain outputs
11.1 Waveforms and test circuits
IFONPD[
9,
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W3/+
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92+
90
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W7/+
W7+/
DDD
Measurement points are given in Table 8.
VOL and VOH are typical output voltage levels that occur with the output load.
Fig 9.
Propagation delay clock (CP) to output (QS1, QS2), clock pulse width, maximum clock frequency and
output transition time
9,
90
&3LQSXW
*1'
W3/=
W3=/
9
43QRXWSXW
92/
9<
9;
DDD
Measurement points are given in Table 8.
VOL and VOH are typical output voltage levels that occur with the output load.
Fig 10. Propagation delay clock (CP) to output (QPn)
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
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NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
9,
90
&3LQSXW
*1'
9,
/(LQSXW
90
*1'
W:
W3/=
W3=/
9
9<
43QRXWSXW
9;
92/
DDD
Measurement points are given in Table 8.
VOL is the typical output voltage level that occurs with the output load.
Fig 11. Latch enable (LE) to output (QPn) propagation delays and the latch enable pulse width
9,
2(LQSXW
90
*1'
W3/=
9
W3=/
9<
9<
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9;
92/
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RXWSXWV
HQDEOHG
W7+/
RXWSXWV
GLVDEOHG
RXWSXWV
HQDEOHG
DDD
Measurement points are given in Table 8.
VOL is the typical output voltage level that occurs with the output load.
Fig 12. Output enable (OE) to output (QPn) and output transition time
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
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Power logic 12-bit shift register; open-drain outputs
9,
90
&3LQSXW
*1'
WVX
9,
WVX
WK
WK
90
'LQSXW
*1'
9
43QRXWSXW
92/
DDD
Measurement points are given in Table 8.
The shaded areas indicate when the input is permitted to change for predictable output performance.
VOL is the typical output voltage level that occurs with the output load.
Fig 13. Set-up and hold times
Table 8.
Measurement points
Supply voltage
Input
Output
VCC
VM
VM
VX
VY
5V
0.5VCC
0.5VDS
0.1VDS
0.9VDS
.
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GULYHU
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(1) The open-drain QPn terminal under test is connected to testpoint K. All other terminals are connected together and connected
to testpoint A.
(2) The VI amplitude and RG are adjusted for dI/dt = 10 A/s. A VI double-pulse train is used to set IO = 0.1 A, where t1 = 10 s, t2
= 7 s and t3 = 3 s.
Fig 14. Test circuit and waveform for measuring reverse recovery current
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
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Power logic 12-bit shift register; open-drain outputs
W:
9,
QHJDWLYH
SXOVH
90
90
9
9,
WI
WU
WU
WI
90
SRVLWLYH
SXOVH
90
9
W:
9(;7 9
9
5/
9&&
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5/
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DDD
(1) The word generator has the following characteristics: tr, tf  10 ns; tW = 300 ns; pulsed repetition rate (PRR) = 5 kHz; ZO = 50 .
(2) CL includes probe and jig capacitance.
Test data is given in Table 9. Definitions for test circuit:
VEXT = External voltage for measuring switching times.
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
Fig 15. Test circuit for measuring switching times
Table 9.
Test data
Supply voltage Input
5V
[1]
Load
VI
tr, tf
VM
CL
RL1
RL2[1]
5V
 10 ns
50%
30 pF
200 
2 k
Do not connect RL2 when measuring the supply current (ICC).
NPIC6C4894_Q100
Product data sheet
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Rev. 1 — 17 April 2014
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NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
aaa-002562
1
DDD
,&&
P$
IAL
(A)
10-1
10-2
10-1
1
10
IO0+]
Tamb = 25 C; VCC = 5 V.
Tamb = 40 C to 125 C; VCC = 5 V.
Fig 16. Avalanche current (peak) versus time duration
of avalanche
DDD
Fig 17. Supply current versus frequency
DDD
5'6RQ
ȍ
tAL (ms)
5'6RQ
ȍ
,2P$
VCC = 4.5 V; VI = VCC or GND.
VI = VCC or GND; IO = 50 mA.
(1) Tamb = 125 C
(2) Tamb = 85 C
(2) Tamb = 85 C
(3) Tamb = 25 C
(3) Tamb = 25 C
(4) Tamb = 40 C
(4) Tamb = 40 C
Fig 18. Drain-source on-state resistance versus drain
current
Product data sheet
9&&9
(1) Tamb = 125 C
NPIC6C4894_Q100
Fig 19. Static drain-source on-state resistance versus
supply voltage
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Power logic 12-bit shift register; open-drain outputs
DDD
W
QV
7DPEƒ&
VCC = 5 V; IO = 75 mA, this technique should limit Tj  Tamb to 10 C maximum.
(1) tPLZ.
(2) tTLH.
(3) tTHL.
(4) tPZL.
Fig 20. Switching time versus temperature
NPIC6C4894_Q100
Product data sheet
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Power logic 12-bit shift register; open-drain outputs
12. Package outline
62SODVWLFVPDOORXWOLQHSDFNDJHOHDGVERG\ZLGWKPP
627
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NPIC6C4894_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 17 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
16 of 21
NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
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NPIC6C4894_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 17 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
17 of 21
NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
13. Abbreviations
Table 10.
Abbreviations
Acronym
Description
CDM
Charged Device Model
CMOS
Complementary Metal Oxide Semiconductor
DUT
Device Under Test
EDNMOS
Extended Drain Negative Metal Oxide Semiconductor
ESD
ElectroStatic Discharge
HBM
Human Body Model
TTL
Transistor-Transistor Logic
14. Revision history
Table 11.
Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
NPIC6C4894_Q100 v.1
20140417
Product data sheet
-
-
NPIC6C4894_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 17 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
18 of 21
NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
15. Legal information
15.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
15.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information. NXP Semiconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
NPIC6C4894_Q100
Product data sheet
Suitability for use in automotive applications — This NXP
Semiconductors product has been qualified for use in automotive
applications. Unless otherwise agreed in writing, the product is not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconductors products in such equipment or
applications and therefore such inclusion and/or use is at the customer's own
risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications and
products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 17 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
19 of 21
NPIC6C4894-Q100
NXP Semiconductors
Power logic 12-bit shift register; open-drain outputs
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
15.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
16. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
NPIC6C4894_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 17 April 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
20 of 21
NXP Semiconductors
NPIC6C4894-Q100
Power logic 12-bit shift register; open-drain outputs
17. Contents
1
2
3
4
5
6
6.1
6.2
7
8
8.1
9
10
11
11.1
12
13
14
15
15.1
15.2
15.3
15.4
16
17
General description . . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Ordering information . . . . . . . . . . . . . . . . . . . . . 2
Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
Pinning information . . . . . . . . . . . . . . . . . . . . . . 4
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4
Functional description . . . . . . . . . . . . . . . . . . . 5
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 6
Test circuit and waveform . . . . . . . . . . . . . . . . . 7
Recommended operating conditions. . . . . . . . 7
Static characteristics. . . . . . . . . . . . . . . . . . . . . 8
Dynamic characteristics . . . . . . . . . . . . . . . . . . 9
Waveforms and test circuits . . . . . . . . . . . . . . 10
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 16
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 18
Legal information. . . . . . . . . . . . . . . . . . . . . . . 19
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 19
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Contact information. . . . . . . . . . . . . . . . . . . . . 20
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP Semiconductors N.V. 2014.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 17 April 2014
Document identifier: NPIC6C4894_Q100