INTERSIL LP3929

LP3929
High Speed Bi-Directional Level Shifter and Ultra LowDropout CMOS Voltage Regulator and Line Protection
General Description
Key Specifications
The LP3929 is designed for portable and wireless applications requiring level translation and power supply generation
in a compact footprint.
The device level translates 1.8 V LVCMOS on the host (A)
side to 2.85 V LVCMOS levels on the card (B) side for a miniSD / SD 4-bit bi-directional data bus.
Independent direct control of the CMD, Data0 and Data1-3
paths support mini SD state machine requirements. A shutdown pin is provided for the level shifters and regulator. The
f_CLK_A is a feedback clock to the host which can be used
to overcome level shifter bus delay.
The built-in low-dropout voltage regulator is ideal for mobile
phone and battery powered wireless applications. It provides
up to 200 mA from a 3.05 V to 5.5 V input. It is stable with
small 1.0 µF ±30% ceramic and high quality tantalum output
capacitors, requiring smallest possible PC board area.
The card (B port) side channels have integration of ASIP (Application Specific Integrated Passives) - on chip integrated
pull-up, pull-down, series resistors and capacitors for EMC
filtering. It is designed to tolerate IEC61000-4-2 level 4 ESD:
±15 kV air discharge, ±8 kV direct contact.
Level Shifter:
■ 6-signal Level Shifter (5 bi-directional and 1 uni-direction)
■ 3 ns (typ) propagation delay
■ Channel-to-channel skew < 1 ns (max)
Low-Dropout Regulator:
■ 3.05 V to 5.5 V input range
■ 2.85 V at 200 mA
■ Fast Turn-On time: 30 µs (typ)
■ 110 mV (max) dropout with 200 mA load
■ Thermal shutdown at 160°C (typ)
Protection Block (B Side):
■ Robust IEC ESD Protection: ±15 kV Air Gap, ±8 kV Direct
Contact
■ ASIP / EMI Filtering
Features
■ Ultra small micro SMD 24 bump package
■ 6-signal level translation 1.8 V to 2.85 V
■ LDO stable with ceramic and high quality tantalum
capacitors
Typical Application Circuit
20186801
© 2007 National Semiconductor Corporation
201868
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LP3929 High Speed Bi-Directional Level Shifter and Ultra Low-Dropout CMOS Voltage Regulator
and Line Protection
December 14, 2007
LP3929
Block Diagram
20186802
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2
LP3929
Package Outline and Connection Diagrams
20186812
Note: The actual physical placement of the package marking will vary from part
to part. The package marking “XY” will designate the date code. The “TT” is a
NSC internal code for die traceability; engineering sample parts will be marked
as "ES". Both will vary considerably. The pin 1 marking identifier is the location
of corner bump A1.
Top View - TME24 Device Marking
20186811
Top View - Bump Underneath
24 Bump micro SMD Package
See NSC Package Number TME24AAA
Ordering Information
For 24 Bump micro SMD Package
Output Voltage Grade
LP3929 Supplied As 250 Units, Tape & Reel
LP3929 Supplied As 3000 Units, Tape & Reel
2.85 V
LP3929TME-AACQ
LP3929TMEX-AACQ
STD
Tape and Reel Information
20186810
Top View: Tape and Reel Information
3
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LP3929
Pin Descriptions
Pin Name
micro SMD
Bump Identifier
Port / Direction
Type
Function
D0_A
D1
Host / Bidirectional
Push-Pull
1.8 V I/O Channel (Note 14)
D1_A
E1
Host / Bidirectional
Push-Pull
1.8 V I/O Channel (Note 14)
D2_A
A1
Host / Bidirectional
Push-Pull
1.8 V I/O Channel (Note 14)
D3_A
B1
Host / Bidirectional
Push-Pull
1.8 V I/O Channel (Note 14)
CMD_A
D2
Host / Bidirectional
Push-Pull
1.8 V I/O Channel (Note 14)
CLK_A
C1
Host / Input
High Z
fCLK_A
E2
Host / Output
Push-Pull
DIR_0
A3
Host / Input
High Z
1.8 V Input CLK Channel (Note 14)
1.8 V Output CLK Channel
1.8 V Input Direction Control D0 Channel:
VDDA = A → B Direction (Write),
VSS = B → A Direction (Read)
DIR_1-3
E3
Host / Input
High Z
1.8 V Input Direction Control D1-D3 Channel:
VDDA = A → B Direction (Write),
VSS = B → A Direction (Read)
CMD_DIR
A2
Host / Input
High Z
1.8 V Input Direction Control CMD Channel:
VDDA = A → B Direction (Write),
VSS = B → A Direction (Read)
EN
C2
Host / Input
High Z
Device Enable with high impedance pull-down resistor (200
kΩ):
VDDA = Device Active (on),
VSS = Device Disabled (off)
D0_B
D5
Card / Bidirectional
Push-Pull
2.85 V I/O Channel with high impedance pull-up to VDDB
(70 kΩ)
D1_B
E5
Card / Bidirectional
Push-Pull
2.85 V I/O Channel with high impedance pull-up to VDDB
D2_B
A5
Card / Bidirectional
Push-Pull
D3_B
B5
Card / Bidirectional
Push-Pull
CMD_B
D4
Card / Bidirectional
Push-Pull
CLK_B
C5
Card / Output
Push-Pull
VBAT
A4
Host / Input
Power
3.05 V to 5.5 V
VDDA
B3
Host / Input
Power
1.71 V to 1.92 V, 1.8 V (typ)
VDDB
B4
Card / Output
Power
2.85 V (LDO output)
VSS
C3
Ground
VSS
C4
Ground
WP
E4
Host / Card Input
Pull-up
Pull-up to VDDA (100 kΩ)
CD
D3
Host / Card Input
Pull-up
Pull-up to VDDA (100 kΩ)
(70 kΩ)
2.85 V I/O Channel with high impedance pull-up to VDDB
(70 kΩ)
2.85 V I/O Channel with high impedance pull-down to VSS
(470 kΩ)
2.85 V I/O Channel with high impedance pull-up to VDDB
(15 kΩ)
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4
2.85 V Output CLK Channel
LP3929
TABLE 1. Operation Modes
Inputs
Mode
EN
CMD_DIR
DIR_0
DIR_1-3
L
X
X
X
Level shifter / LDO = off (Shutdown Mode)
H
L
L
L
All channels (D0-D3 and CMD): B → A Direction
H
L
L
H
A → B Direction: D1-D3, B → A Direction: CMD and D0
H
L
H
L
A → B Direction: D0, B → A Direction: CMD and D1-D3
H
L
H
H
A → B Direction: D0-D3, B → A Direction: CMD
H
H
L
L
A → B Direction: CMD, B → A Direction: D0-D3
H
H
L
H
A → B Direction: CMD and D1-D3, B → A Direction: D0
H
H
H
L
A → B Direction: CMD and D0, B → A Direction: D1-D3
H
H
H
H
All channels (D0-D3 and CMD): A → B Direction
H = VDDA, L = VSS
5
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LP3929
Maximum Power Dissipation Capacity at 25°C
micro SMD
ESD Rating
HBM - MIL-STD-883E 3015.7 std.
MM - JESD22-A115-A std.
CDM - 500V (JESD22-C 101) Std.
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (VBAT)
Supply Voltage (VDDA)
LVCMOS A Port Input Voltage
LVCMOS A Port I/O Voltage
LVCMOS A Port I/O Voltage
Junction Temperature
Storage Temperature
Lead Temperature (Note 13)
Pad Temperature (Note 13)
Derate micro SMD
Package above 25°C
−0.3V to +6.0V
−0.3V to +3.3V
−0.3V to VDDA + 0.3V
−0.3V to VDDA + 0.3V
−0.3V to VDDB + 0.3V
150°C
−65°C to +150°C
235°C
235°C
2.8 W
± 2kV
± 200V
± 500V
IEC61000-4-2 std., 330Ω, 150pF,
Air Gap, B Side (Note 2)
± 15kV
IEC61000-4-2 std., 330Ω, 150pF,
Direct Contact, B Side (Note 2)
± 8kV
Operating Conditions
VBAT to VSS
VDDA to VSS
Ambient Temperature
22.9 mW/°C
3.05V to 5.5V
1.71V to 1.92V
−30°C to +85°C
Electrical Characteristics
Unless otherwise specified: CVBAT = 1 µF, IOUT = 1 mA, CVDDB = 1 µF, CVDDA = 1 µF.
Typical values and limits appearing in standard typeface apply for TA = 25°C. Limits appearing in boldface type apply over the
entire ambient temperature range for operation, −30°C to +85°C. (Notes 3, 4)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
LVCMOS A (Host) Port (VDDA = 1.71V to 1.92V)
VIH
VIL
IIH
Input Voltage High Level
0.65×VDDA
1.92
V
VDDA = 1.71V
1.1115
1.92
V
VDDA = 1.92V
1.248
1.92
V
0
0.30×VDDA
V
VDDA = 1.71V
0
0.513
V
VDDA = 1.92V
0
0.576
V
Input Voltage Low Level
Input Current High Level
VIH = VDDA
−1
0
+1
µA
EN = VSS
−1
0
+1
µA
EN = VDDA
−1
0
+10
µA
−1
0
+1
µA
IIL
Input Current Low Level
VIL = VSS
VOH
Output Voltage High Level
IOH = −4 mA
1.26
1.8
VDDA
V
VOL
Output Voltage Low Level
IOL = 4 mA
VSS
0
0.45
V
VDDB
V
LVCMOS B (Card) Port (VDDB = 2.85V)
VIH
Input Voltage High Level
VIL
Input Voltage Low Level
IIH
Input Current High Level
0.65×VDDB
D0_B to D2_B
D3_B
IIL
Input Current Low Level
VIL = VSS
Short Circuit Current
IOS −
V
0.2
+2
µA
0
6.5
+ 13
µA
CMD_B
−5
0.3
+5
µA
D0_B to D2_B
− 80
−40
0
µA
D3_B
−1
0.1
+1
µA
− 300
− 200
− 20
µA
CMD_B
IOS +
0.35×VDDB
−2
0
VIH = VDDB
VOUTlow = VDDB
VOUThigh = VSS
VOH
Output Voltage High Level
IOH = − 2 mA
VOL
Output Voltage Low Level
IOL = 2 mA
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45
µA
− 20
µA
0.75×VDDB
V
0.25×VDDB
6
V
Symbol
Parameter
Conditions
Min
Typ
Max
Units
4
7
mA
Supply Current
IDD
Supply Current
All Channels Static: A → B mode,
LDO unloaded
VBAT
VDDA
95
200
µA
IDDZ
Supply Current — Shutdown
EN = VSS
VBAT
0.1
2
µA
VDDA
0.2
2
µA
COUT
Output Capacitance (Note 15)
B (card) port
15
20
pF
Level Shifter AC Switching Characteristics Unless otherwise specified: CVBAT = 1 µF, IOUT = 1 mA,
CVDDB = 1 µF, CVDDA = 1 µF. Typical values and limits appearing in standard typeface apply for TA = 25°C. Limits appearing in
boldface type apply over the entire ambient temperature range for operation, −30°C to +85°C. (Notes 3, 5, 15, 16)
Symbol
tPLH
tPHL
tRISE
tFALL
Typ
Max
Units
Propagation Delay A to B or B to A
Parameter
CLB = 15 pF, CLA = 20 pF,
50%-50%
Conditions
Min
3
7
ns
Propagation Delay CLK_A to fCLK_A
CLA = 20 pF, 50%-50%
5
14
ns
Propagation Delay A to B or B to A
CLB = 15 pF, CLA = 20 pF,
50%-50%
3
7
ns
Propagation Delay CLK_A to fCLK_A
CLA = 20 pF, 50%-50%
5
14
ns
Rise Time A Side Output Figure 2
CLA = 20 pF, 20%-70%
1.1
3
ns
Rise Time B Side Output with ASIP Figure 2
CLB = 15 pF, 20%-70%
1.6
3
ns
Fall Time A Side Output Figure 2
CLA = 20 pF, 20%-70%
1.0
3
ns
Fall Time B Side Output with ASIP Figure 2
CLB = 15 pF, 20%-70%
1.9
3
ns
<0.5
1.0
ns
Enable Time
30
200
µs
tDIS
Disable Time
18
50
ns
tTA
Level-Shifter Direction Switch Response
(Turn Around) Time
13
20
ns
tSKEW
Skew between D0–D3, CLK and CMD outputs
(either edge)
tEN
7
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LP3929
Electrical Characteristics Unless otherwise specified: CVBAT = 1 µF, IOUT = 1 mA, CVDDB = 1 µF, CVDDA = 1 µF.
Typical values and limits appearing in standard typeface apply for TA = 25°C. Limits appearing in boldface type apply over the
entire ambient temperature range for operation, −30°C to +85°C. (Notes 3, 4)
LP3929
LDO Electrical Characteristics
Unless otherwise specified: CVBAT = 1 µF, IOUT = 1 mA, CVDDB = 1 µF, CVDDA = 1 µF. Typical values and limits appearing in standard
typeface apply for TA = 25°C. Limits appearing in boldface type apply over the entire ambient temperature range for operation,
−30°C to +85°C. (Note 3)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
2.76
2.85
2.93
V
2
3
% of
VOUT(nom)
0.15
%/V
0.01
%/mA
VOUT
Output Voltage, VOUT = VDDB
IOUT = 200mA, VBAT = 3.05V to 5.5V
ΔVOUT
Output Voltage Tolerance
IOUT = 1 mA
Line Regulation Error (Note 6)
VBAT = (VOUT(nom) + 0.5V) to 5.5V, IOUT = 1 mA −0.15
Load Regulation Error (Note 7)
IOUT = 1 mA to 200 mA
Output AC Line Regulation
VBAT = VOUT(nom) + 1V,
IOUT = 100 mA, COUT = 1.0 µF
1.5
mVPP
Power Supply Rejection Ratio (Note
15)
VBAT = VOUT(nom) + 1V,
f = 1 kHz, IOUT = 50 mA
40
dB
VBAT = VOUT(nom) + 1V,
f = 10 kHz, IOUT = 50 mA
30
IOUT = 1 mA
1
IOUT = 50 mA
20
IOUT = 100 mA
35
PSRR
ΔVDO
Dropout Voltage (Note 8)
−2
−3
−0.01
IOUT = 200 mA
60
VBAT = 5.5V, Output Grounded (Steady State)
750
Output Noise Density
f = 1 kHz, COUT = 1.0 µF
0.6
en
Output Noise Voltage
BW = 10 Hz to 100 kHz, COUT = 1.0 µF
Output
Capacitor
Output Filter Capacitance (Note 10)
VBAT = 3.05V to 5.5V,
IOUT = 1mA to 200 mA
0.7
Output Filter Capacitance ESR (Note
11)
VBAT = 3.05V to 5.5V,
IOUT = 1mA to 200mA
5
ISC
Short Circuit Current Limit
TON
Turn-On Time (Notes 9, 15)
ρn (1/f)
Thermal
Thermal Shutdown Temperature
Shutdown (Notes 12, 15)
30
mV
110
mA
200
45
VBAT = 3.05V to 5.5V,
IOUT = 1mA to 200mA
Thermal Shutdown Hysteresis (Note
15)
1.0
µs
µV/√Hz
µVrms
22
µF
500
mΩ
160
°C
20
°C
Note 1: "Absolute Maximum Ratings" are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the device
should be operated at these limits. The tables of "Electrical Characteristics" specify conditions for device operation.
Note 2: IEC61000-4-2 level 4 ESD tolerance applies to VDDB, D0_B–D3_B, CMD_B, CLK_B, WP and CP pins only. Device is tested in application (common
ground, bypass capacitors of 1.0 µF present on VBAT, VDDA and VDDB).
Note 3: Typical values are given for VDDA = 1.8V, VBAT = 3.6V, TA = 25°C
Note 4: Current into device pins is defined as positive. Current out of device pins is defined as negative. Voltages are reference to ground unless otherwise
specified.
Note 5: Input signal for test purpose is defined as: A side – 0V to 1.8V with 2ns rise time (20%-70%) and B side – 0V to 2.85V with 2ns rise time (20%-70%)
Note 6: The output voltage changes slightly with line voltage. An increase in the line voltage results in a slight increase in the output voltage and vice versa.
Note 7: The output voltage changes slightly with load current. An increase in the load current results in a slight decrease in the output voltage and vice versa.
Note 8: Dropout voltage is the input-to-output voltage difference at which the output voltage is 100 mV below its nominal value. This specification does not apply
for input voltages below 2.7V.
Note 9: Turn-on time is that between when the enable input is high an the output voltage just reaching 95% of its nominal value.
Note 10: Range of capacitor value for which the device will remain stable. This electrical specification is guaranteed by design.
Note 11: Range of capacitor ESR values for which the device will remain stable. This electrical specification is guaranteed by design.
Note 12: The built-in thermal shut-down of the LDO is also used to put all A and B outputs in tri-state mode.
Note 13: Additional information on lead temperature and pad temperature can be found in National Semiconductor Application Note (AN-1112).
Note 14: Unused inputs must be terminated.
Note 15: This electrical specification is guaranteed by design.
Note 16: The SD/MMC card specification calls for a total of 30 pF capacitance. A load of 15 pF is internal to the LP3929, so the external load capacitance on the
B side should comprise the remaining (15 pF or less).
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LP3929
20186805
FIGURE 1. A to B Timing Diagram (propagation delay, skew)
20186806
FIGURE 2. Output Transition Time (A and B Side)
9
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LP3929
20186807
FIGURE 3. B to A Direction (37 MHz Example)
Typical Performance Characteristics
Unless otherwise specified: CVBAT = 1 µF, CVDDA = 1 µF, CVDDB =
1 µF, VBAT = 3.85 V, VDDA = 1.8 V, TA = 25°C.
ASIP / EMI Filter Response
Power Supply Rejection Ration (VBAT = 3.85V)
20186809
20186808
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EXTERNAL CAPACITORS
Like any low-dropout regulator, the LP3929 requires external
capacitors for regulator stability. The LP3929 is specifically
designed for portable applications requiring minimum board
space and smallest components. These capacitors must be
correctly selected for good performance.
INPUT CAPACITOR
An input capacitance of 1 µF is required between the LP3929
VBAT pin and ground (the amount of the capacitance may be
increased without limit).
This capacitor must be located a distance of not more than
1 cm from the VBAT pin and returned to a clean analog ground.
Any good quality ceramic, tantalum, or film capacitor may be
used at the input.
Important: Tantalum capacitors can suffer catastrophic failures due to surge current when connected to a lowimpedance source of power (like a battery or a very large
capacitor). If a tantalum capacitor is used at the input, it must
be guaranteed by the manufacturer to have a surge current
rating sufficient for the application.
There are no requirements for the ESR on the input capacitor,
but tolerance, bias voltage and temperature coefficient must
be considered when selecting the capacitor to ensure the capacitance will be 1 µF over the entire operating conditions.
OUTPUT CAPACITOR
The LP3929 is designed specifically to work with very small
ceramic output capacitors, any ceramic capacitor (dielectric
types Z5U, Y5V or X7R) in 1.0 µF to 2.2 µF range with 5
mΩ to 500 mΩ ESR range is suitable in the LP3929 application circuit.
It may also be possible to use tantalum or film capacitors at
the output, but these are not as attractive for reasons of size
and cost (see section Capacitor Characteristics).
The output capacitor must meet the requirement for minimum
amount of capacitance and also have an ESR (Equivalent
Series Resistance) value which is within a stable range.
The output capacitor should be placed as near as possible to
the VDDB pin.
FAST ON-TIME
The LP3929 utilizes a speed up circuitry to ramp up the internal VREF voltage to its final value to achieve a fast output
turn on time.
NO-LOAD STABILITY
The LDO of the LP3929 will remain stable and in regulation
with no external load connected to the LDO output VDDB. This
is especially important in CMOS RAM keep-alive applications.
CAPACITOR CHARACTERISTICS
The LP3929 is designed to work with ceramic capacitors on
the output to take advantage of the benefits they offer: for
capacitance values in the range of 1 µF to 4.7 µF range, ceramic capacitors are the smallest, least expensive and have
the lowest ESR values (which makes them best for eliminating high frequency noise). The ESR of a typical 1 µF ceramic
capacitor is in the range of 20 mΩ to 40 mΩ, which easily
meets the ESR requirement for stability by the LP3929.
The ceramic capacitor’s capacitance can vary with temperature.
Most large value ceramic capacitors (2.2 µF) are manufactured with Z5U or Y5V temperature characteristics, which
results in the capacitance dropping by more than 50% as the
temperature goes from 25°C to 85°C.
A better choice for temperature coefficient in ceramic capacitor is X7R, which holds the capacitance within ±15%.
MICRO SMD ASSEMBLY
For assembly recommendations of micro SMD package
please refer to National Semiconductor Application Note
AN-1112.
MICRO SMD LIGHT SENSITIVITY
Exposing the micro SMD device to direct sunlight will cause
misoperation of the device. Light sources such as Halogen
lamps can effect electrical performance if brought near to the
device.
The wavelengths which have most detrimental effect are reds
and infra-reds, which means that the fluorescent lighting used
inside most buildings has very little effect on performance.
11
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LP3929
Tantalum capacitors are less desirable than ceramic for use
as output capacitors because they are more expensive when
comparing equivalent capacitance and voltage ratings in the
1 µF to 4.7 µF range.
Another important consideration is that tantalum capacitors
have higher ESR values than equivalent size ceramics. This
means that while it may be possible to find a tantalum capacitor with an ESR value within the stable range, it would have
to be larger in capacitance (which means bigger and more
costly) than a ceramic capacitor with the same ESR value. It
should also be noted that the ESR of a typical tantalum will
increase about 2:1 as the temperature goes from 25°C down
to −40°C, so some guard band must be allowed.
Application Information
LP3929
Physical Dimensions inches (millimeters) unless otherwise noted
micro SMD, 24 Bump
NS Package Number: TME24AAA
The dimensions for X1, X2 and X3 are as follows:
X1 = 2.015mm ± 30μm
X2 = 2.015mm ± 30μm
X3 = 0.600mm ± 75μm
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12
LP3929
Notes
13
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LP3929 High Speed Bi-Directional Level Shifter and Ultra Low-Dropout CMOS Voltage Regulator
and Line Protection
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NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
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COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
Life support devices or systems are devices which (a) are intended for surgical implant into the body, or (b) support or sustain life and
whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected
to result in a significant injury to the user. A critical component is any component in a life support device or system whose failure to perform
can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness.
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