INTERSIL HS2-3530AEH-Q

Radiation Hardened Programmable Low Power Op
Amps
HS-3530ARH, HS-3530AEH
Features
The HS-3530ARH, HS-3530AEH are Low Power Operational
Amplifiers, which are internally compensated monolithic
devices offering a wide range of performance specifications.
Parameters such as power dissipation, slew rate, bandwidth,
noise and input DC parameters are programmed by selecting
an external resistor or current source. Supply voltages as low
as ±3V may be used with little degradation of AC performance.
The HS-3530ARH, HS-3530AEH have been specifically
designed to meet exposure to space radiation environments.
Operation from -55°C to +125°C is guaranteed.
• Radiation Performance
- Gamma Dose . . . . . . . . . . . . . . . . . . . . . . . . 3 x 105 RAD(Si)
- SEL . . . . . . . . . . . . . . . . . . . . . . . . Immune (RSG DI Process)
- Low dose rate . . . . . . . . . . . . . . . . . . . . . . . . . . 100krad(Si)*
A major advantage of the HS-3530ARH, HS-3530AEH is that
operating characteristics remain virtually constant over a wide
supply range (±3V to ±15V), allowing the amplifiers to offer
maximum performance in almost any system, including
battery operated equipment. A primary application for these
devices is in active filtering and conditioning for a wide variety
of signals that differ in frequency and amplitude. Also, by
modulating the set current, they can be used for designs such
as current controlled oscillators/modulators, sample and hold
circuits and variable active filters.
*Product capability established by initial characterization. The EH
version is acceptance tested on a wafer by wafer basis to
50krad(Si) at low dose rate.
• Wide Range AC Programming
- Slew Rate . . . . . . . . . . . . . . . . . . . . . . . . . 0.025 to 0.1V/µs
- Gain X Bandwidth . . . . . . . . . . . . . . . . . . 30kHz to 750kHz
• Wide Range DC Programming
- Power Supply Range . . . . . . . . . . . . . . . . . . . ±3.0V to ±15V
• Supply Current . . . . . . . . . . . . . . . . . . . . . . . . . 15µA to 150µA
• Output Current . . . . . . . . . . . . . . . . . . . . . . . 0.25mA to 2.5mA
• Quiescent Power . . . . . . . . . . . . . . . . . . . . . . . . . 4.8mW (Max)
• Dielectrically Isolated Device Islands
• Short Circuit Protection
Specifications
• Full -55°C to +125°C Military Temperature Range
Specifications for Rad Hard QML devices are controlled by the
Defense Logistics Agency Land and Maritime (DLA). The SMD
numbers listed below must be used when ordering.
Pin Configurations
HS2-3530ARH (CAN), MACY1-X8
TOP VIEW
Detailed Electrical Specifications for the HS-3530ARH,
HS-3530AEH are contained in SMD 5962-95687. A “hot-link”
to the DLA website is also provided on the Product Information
page for downloading the document.
www.intersil.com/products/deviceinfo.asp?pn=HS-3530ARH
The Intersil Quality Management Plan, listing all screening
operations, is available on our website.
www.intersil.com/design/quality/manuals.asp
ISET
8
OFFSET
NULL
INVERTING
INPUT
1
7
2
NON-INVERTING
INPUT
6
5
3
4
Ordering Information
ORDERING
NUMBER
PART
NUMBER
TEMP.
RANGE (°C)
HS2-3530ARH-8
-55 to +125
5962F9568701VGA
HS2-3530ARH-Q
-55 to +125
5962F9568702VGA
HS2-3530AEH-Q
5962F9568701VXC
HS9-3530ARH-Q
OFFSET
NULL
HS9-3530ARH, HS9-3530AEH(FLATPACK), CDFP3-F10
TOP VIEW
NC
1
10
ISET
OFFSET
2
9
V+
-55 to +125
- IN
3
8
OUTPUT
-55 to +125
+ IN
4
7
OFFSET
V-
5
6
NC
5962F9568702VXC
HS9-3530AEH-Q
-55 to +125
5962F9568701V9A
HS0-3530ARH-Q
-55 to +125
5962F9568702V9A
HS0-3530AEH-Q
-55 to +125
HS2-3530ARH/PROTO HS2-3530ARH/Proto
-55 to +125
HS9-3530ARH/PROTO HS9-3530ARH/Proto
-55 to +125
1
OUTPUT
V-
5962F9568701QGA
December 12, 2012
FN4653.1
V+
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
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Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
HS-3530ARH, HS-3530AEH
Die Characteristics
ASSEMBLY RELATED INFORMATION
SUBSTRATE POTENTIAL:
DIE DIMENSIONS:
Unbiased (DI)
1720µm x 1390µm x 533µm ±25.4µm
(68 mils x 55 mils x 21 mils ±1 mil)
ADDITIONAL INFORMATION
INTERFACE MATERIALS
WORST CASE CURRENT DENSITY:
GLASSIVATION
<2.0 x 105 A/cm2
Type: Silox (SiO2)
Thickness: 8.0kA ±1.0kA
TRANSISTOR COUNT:
49
TOP METALLIZATION
Type: AlSiCu
Thickness: 16.0kA ±2kA
SUBSTRATE:
Radiation Hardened Silicon Gate,
Dielectric Isolation
BACKSIDE FINISH:
Silicon
Metallization Mask Layout
Pin Numbers shown are for the Can Package
HS-3530ARH, HS-3530AEH
IN+
(3)
IN(2)
OFFSET
(1)
NC
V- (4)
NC
ISET
(8)
NC
OFFSET (5)
OUTPUT (6)
NC
V+ (7)
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Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems as noted
in the quality certifications found at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
2
FN4653.1
December 12, 2012