R568 - Reliability Data

RELIABILITY DATA
LT4220 / LT4254 / LT4256 / LT4356 / LT4363
3/23/2012
• OPERATING LIFE TEST
PACKAGE
TYPE
SAMPLE
SIZE
OLDEST
DATE CODE
SSOP/TSSOP
SOIC/SOT/MSOP
QFN/DFN
NEWEST
DATE CODE
300
0319
458
0421
227
0630
985
• HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH
PACKAGE
TYPE
SAMPLE
SIZE
OLDEST
DATE CODE
SOIC/SOT/MSOP
204
1017
204
• PRESSURE COOKER TEST AT 15 PSIG, +121°C
PACKAGE
TYPE
SAMPLE
SIZE
SSOP/TSSOP
SOIC/SOT/MSOP
QFN/DFN
50
323
50
50
• TEMP CYCLE FROM -65°C to +150°C
PACKAGE
TYPE
SAMPLE
SIZE
SAMPLE
SIZE
NEWEST
DATE CODE
0301
0748
0915
0301
0922
0915
OLDEST
DATE CODE
NEWEST
DATE CODE
OLDEST
DATE CODE
300.00
458.00
227.00
985.00
K DEVICE
HOURS (4)
AT +85°C
1141
NEWEST
DATE CODE
50
0301
149
0748
94
0840
50
• THERMAL SHOCK FROM -65°C to +150°C
PACKAGE
TYPE
0421
1123
0818
OLDEST
DATE CODE
SSOP/TSSOP
SOIC/SOT/MSOP
QFN/DFN
K DEVICE
HOURS (1)
AT +125°C
326.40
326.40
NEWEST
DATE CODE
17.45
10.15
1.20
17.45
50.10
14.90
9.40
50.10
00-03-6209B R568
Form: 00-03-6209B.
0
0
0
0
0
0
0
0
0
0
NUMBER
OF
FAILURES
K DEVICE
CYCLES
248
0748
0922
93
0840
0915
341
(1) Assumes Activation Energy = 1.0 Electron Volts
(2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 1.86 FITS
(3) Mean Time Between Failures in Years = 61,513
Note: 1 FIT = 1 Failure in One Billion Hours.
NUMBER
OF
FAILURES
NUMBER
OF
FAILURES
K DEVICE
CYCLES
SOIC/SOT/MSOP
QFN/DFN
0
0
0
0
NUMBER
OF
FAILURES
K DEVICE
HOURS
0301
0922
0915
NUMBER
OF (2)
FAILURES
24.80
9.30
34.10
0
0
0
Rev 1