Test Report 029 1MeV Equivalent Neutron Testing of the HS-117RH Linear Voltage Regulator Introduction Test Description This report summarizes results of 1MeV equivalent neutron testing of the HS-117RH linear voltage regulator. The test was conducted in order to determine the sensitivity of the part to Displacement Damage (DD) caused by neutron or proton environments. Neutron fluences ranged from 2x1012n/cm2 to 1x1014n/cm2. This project was carried out in collaboration with Boeing (El Segundo, CA), whose support is gratefully acknowledged. Irradiation Facilities Reference Documents • MIL-STD-883 test method 1017 1MeV equivalent neutron irradiation was performed by the Boeing team at the White Sands Missile Range fast burst reactor. Dosimetry data can be furnished upon request. Parts were tested in an unbiased configuration with all leads shorted together in general accordance with TM 1017 of MIL-STD-883. As neutron irradiation activates many of the heavier elements found in a packaged integrated circuit, the parts exposed at the higher neutron levels required considerable ‘cooldown’ time before being shipped back to Intersil (Palm Bay, FL) for electrical testing. • HS-117RH data sheet Test Fixturing • Standard Microcircuit Drawing (SMD) 5962-99547 No formal irradiation test fixturing was involved, as these DD tests are termed ‘bag tests’ in the sense that the parts are irradiated in an electrically inactive state with all leads shorted together. Part Description The radiation hardened HS-117RH is an adjustable positive linear voltage regulator capable of operating with input voltages up to 40VDC. The output voltage is adjustable from 1.25V to 37V with two external resistors. The device is capable of sourcing from 5mA to 1.25A maximum (0.5A maximum for the TO-39 package). Current protection is provided by on-chip thermal shutdown and output current limiting circuitry. Constructed in the Intersil dielectrically isolated Radiation Hardened Silicon Gate (RSG) process, the HS-117RH is immune to single event latch-up and has been specifically designed to provide reliable performance in harsh radiation environments. The HS-117RH is acceptance tested to a total dose (TID) level of 300krad(Si) at high dose rate (50-300rad(Si)/s). The HS-117EH variant is acceptance tested to a total dose level of 300krad(Si) at high dose rate and to 50krad(Si) at low dose rate (<0.01rad(Si)/s). TABLE 1. HS-117RH PIN ASSIGNMENTS TERMINAL NUMBER TERMINAL SYMBOL 1 IN 2 ADJ 3 OUT 1 Electrical testing was performed before and after irradiation using the Intersil Palm Bay, FL automated test equipment (ATE). All electrical testing was performed at room temperature. Experimental Matrix The experimental matrix consisted of 5 samples irradiated at 2x1012n/cm2, 5 irradiated at 1x1013n/cm2, 5 irradiated at 3x1013n/cm2 and 5 irradiated at 1x1014n/cm2. Five control units were used. HS-117RHF/PROTO samples were drawn from fabrication lot E0M5PAHC and were packaged in the standard hermetic SMD.5 three-terminal CLCC production package. Samples were screened to the SMD limits over temperature before the start of neutron testing. Results Specifications for radiation hardened QML devices are controlled by the Defense Logistics Agency (DLA) Land and Maritime. The SMD numbers listed in the HS-117RH datasheet Ordering Information table must be used when ordering. Detailed Electrical Specifications for the HS-117RH and HS-117EH are contained in SMD 5962-99547. May 5, 2016 TR029.0 Characterization Equipment and Procedures Neutron testing of the HS-117RH is complete and the results are reported in the balance of this report. It should be carefully realized when interpreting the data that each neutron irradiation was performed on a different five-unit sample; this is not total dose testing, where the damage is cumulative over a number of downpoints. CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2016. All Rights Reserved Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries. All other trademarks mentioned are the property of their respective owners. Test Report 029 Attributes Data Variables Data TABLE 2. HS-117RH ATTRIBUTES DATA SAMPLE FLUENCE PASS SIZE (n/cm2) (Note 1) FAIL NOTES PART SERIAL HS-117RH 1-5 5 2x1012 5 0 All passed HS-117RH 6-10 5 1x1013 5 0 All passed HS-117RH 11-15 5 3x1013 0 5 All failed, parametric HS-117RH 16-20 5 1x1014 0 5 All failed, nonfunctional NOTE: 1. ‘Pass’ indicates a sample that passes all SMD limits. The plots in Figures 1 through 7 show data plots for key parameters before and after irradiation to each level. The reported parameters and their datasheet limits are shown in “Appendices” on page 6. As indicated in Table 2 all samples were nonfunctional after exposure to 1x1014n/cm2. For Figure 7, we elected to not plot the data at this level as it has little meaning and makes the data at the other three levels more difficult to interpret. For reference, Figure 6 shows the same parameter (load regulation) for all four neutron levels. The plots show the population median of each parameter as a function of neutron irradiation as well as population maximum and minimum error bars. We chose to plot the median because of the small sample sizes (five per cell) involved. We also show the applicable post-total dose electrical limits as taken from the SMD; it should be carefully noted that these limits are provided for guidance only as the HS-117RH is not specified or guaranteed for the neutron environment. Intersil does not design, qualify or guarantee its parts for the DD environment, but has performed limited collaborative neutron testing for customer guidance. Variables Data Plots 1.35 REFERENCE VOLTAGE (V) 1.3 1.25 1.2 1.15 VREF 3V VREF 40V 1.1 Spec limit Spec limit 1.05 1E+11 PRE-RAD 1E+12 1E+13 1E+14 NEUTRON LEVEL (n/cm2) FIGURE 1. HS-117RH reference voltage for the 3V and 40V supply cases, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. The plot shows the population median and minimum and maximum error bars at each downpoint. Sample size for each cell was 5. The post-total dose irradiation SMD limits are 1.2V to 1.3V. Submit Document Feedback 2 TR029.0 May 5, 2016 Test Report 029 Variables Data Plots (Continued) 10.4 10.2 OUTPUT VOLTAGE (V) 10 9.8 9.6 9.4 Output voltage, 40V input 9.2 PRE-RAD 1E+11 1E+12 1E+13 1E+14 NEUTRON LEVEL (n/cm2) FIGURE 2. HS-117RH output voltage at 40V input as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. The plot shows the population median and minimum and maximum error bars at each downpoint. Sample size for each cell was 5. This is an informational parameter only and is not specified in the SMD. 0.16 Line regulation 0.14 Spec limit Spec limit 0.12 LINE REGULATION (%/V) 0.1 0.08 0.06 0.04 0.02 0 -0.02 -0.04 PRE-RAD 1E+11 1E+12 1E+13 1E+14 NEUTRON LEVEL (n/cm2) FIGURE 3. HS-117RH line regulation, 3V to 40V, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. The plot shows the population median and minimum and maximum error bars at each downpoint. Sample size for each cell was 5. The post-total dose irradiation SMD limits are -0.02%/V to 0.02%/V. Submit Document Feedback 3 TR029.0 May 5, 2016 Test Report 029 Variables Data Plots (Continued) 120 ADJUST PIN CURRENT (µA) 100 80 60 40 Adjust pin current, 3V 20 Adjust pin current, 40V Spec limit 0 PRE-RAD 1E+11 1E+12 1E+13 1E+14 NEUTRON LEVEL (n/cm2) FIGURE 4. HS-117RH adjust pin current, 3V and 40V cases, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. The plot shows the population median and minimum and maximum error bars at each downpoint. Sample size for each cell was 5. The post-total dose irradiation SMD limit is 100µA maximum. 10 Adjust pin change Spec limit 8 Spec limit ADJUST PIN CURRENT CHANGE (µA) 6 4 2 0 -2 -4 -6 -8 1E+11 PRE-RAD 1E+12 1E+13 1E+14 NEUTRON LEVEL (n/cm2) FIGURE 5. HS-117RH adjust pin current change, difference of the adjust pin current at 3V and 40V, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. The plot shows the population median and minimum and maximum error bars at each downpoint. Sample size for each cell was 5. The post-total dose irradiation SMD limits are -6µA to 6µA. Submit Document Feedback 4 TR029.0 May 5, 2016 Test Report 029 Variables Data Plots (Continued) 20 0 LOAD REGULATION (%) -20 -40 -60 -80 -100 Load regulation, 500mA Load regulation, 1.5A -120 Spec limit Spec limit -140 1E+11 PRE-RAD 1E+12 1E+13 1E+14 NEUTRON LEVEL (n/cm2) FIGURE 6. HS-117RH load regulation, 500mA and 1.5A cases, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. The plot shows the population median and minimum and maximum error bars at each downpoint. Sample size for each cell was 5. The post-total dose irradiation SMD limits are -1.5% to 1.5%. 2 1 0 LOAD REGULATION (%) -1 -2 -3 -4 Load regulation, 500mA -5 Load regulation, 1.5A Spec limit -6 Spec limit -7 PRE-RAD 1E+11 1E+12 1E+13 1E+14 NEUTRON LEVEL (n/cm2) FIGURE 7. HS-117RH load regulation, 500mA and 1.5A cases, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2 and 3x1013n/cm2. The plot is the same as Figure 6 with the 1x1014n/cm2 data suppressed in order to enable evaluation of the parameter’s response after 3x1013n/cm2. The plot shows the population median and minimum and maximum error bars at each downpoint. Sample size for each cell was 5. The post-total dose irradiation SMD limits are -1.5% to 1.5%. Submit Document Feedback 5 TR029.0 May 5, 2016 Test Report 029 Conclusion This report summarizes results of 1MeV equivalent neutron testing of the HS-117RH linear voltage regulator. The test was conducted in order to determine the sensitivity of the part to Displacement Damage (DD) caused by neutron or proton environments in space. Neutron fluences ranged from 2x1012n/cm2 to 1x1014n/cm2. This test was carried out as part of a collaborative project with Boeing (El Segundo, CA), whose support is gratefully acknowledged. The samples met all specifications (Bin 1) after 2x1011n/cm2 and 1x1013n/cm2. All five samples failed the several load regulation parameters after 3x1013n/cm2. All samples were nonfunctional after the 1x1014n/cm2 irradiation testing, and we omitted plotting the resulting extreme ATE overrange values for Figure 7 as they are meaningless and make the data at the other three levels much more difficult to interpret by distorting the vertical axis scale. Appendices Reported Parameters Reported parameters are shown in Table 3. The limits are taken from the applicable SMD and are provided for guidance only as the part is not designed or guaranteed for the neutron environment. A number of parameters are plotted in the same figure in order to save space. The plots show the population median, minimum and maximum error bars at each downpoint. TABLE 3. FIGURE # PARAMETER LIMIT, LOW LIMIT, HIGH UNITS 1.2 1.3 V 3V and 40V Information only 1 Reference Voltage 2 Output Voltage - - V 3 Line Regulation -0.02 0.02 %/V 4 Adjust Pin Current - 100 µA 5 Adjust Pin Current Change -6 6 µA 6 Load Regulation -1.5 1.5 % 7 Load Regulation -1.5 1.5 % NOTES 3V to 40V Expanded scale plot Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that the document is current before proceeding. For information regarding Intersil Corporation and its products, see www.intersil.com Submit Document Feedback 6 TR029.0 May 5, 2016