Test Report 027 Neutron Testing of the ISL75051SEH Low Dropout Regulator Introduction TABLE 1. PIN ASSIGNMENT This report summarizes results of 1MeV equivalent neutron testing of the ISL75051SEH low dropout voltage linear regulator (LDO). The test was conducted in order to determine the sensitivity of the part to Displacement Damage (DD) caused by neutron or proton environments. Neutron fluences ranged from 2 x 1012 n/cm2 to 1 x 1014 n/cm2. This project was carried out in collaboration with VPT, Inc. (Blacksburg, VA), whose support is gratefully acknowledged. Reference Documents For more information about the ISL75051SEH, refer to the following documentation. • ISL75051SEH datasheet • Standard Microcircuit Drawing (SMD): 5962-11212 • MIL-STD-883 test method 1017 Part Description The ISL75051SEH is a radiation hardened low voltage, high current single output low dropout linear voltage regulator (LDO) specified for a 3.0A output current. The device operates over an input voltage range of 2.2V to 5.5V and is capable of providing output voltages of 0.8V to 4V, with the output voltage adjusted by an external resistor divider network. The ENABLE feature allows the part to be placed into a low quiescent current shutdown mode. The ISL75051SEH Overcurrent Protection (OCP) pin allows the short-circuit output current limit threshold to be programmed with an external resistor. The BiCMOS design consumes significantly lower quiescent current as a function of load in comparison to bipolar LDOs, which results in higher efficiency and the ability to consider packages with smaller footprints. The quiescent current of the part was traded off against a highly competitive load transient response, resulting in a superior total AC regulation band for an LDO in this category. The ISL75051SEH is implemented in the 0.6µm P6 BiCMOS power management process. This process is in volume production under MIL-PRF-38535 certification and is used for a wide range of commercial power management devices. Table 1 shows a pin assignment for the part. TERMINAL NUMBER TERMINAL SYMBOL TERMINAL NUMBER TERMINAL SYMBOL 1 GND 10 EN 2 VOUT 11 OCP 3 VOUT 12 VIN 4 VOUT 13 VIN 5 VOUT 14 VIN 6 VOUT 15 VIN 7 VOUT 16 VIN 8 ADJ 17 VIN 9 BYP 18 PG The ISL75051SEH is specified for a total dose (TID) tolerance of 100krad(Si) at a high (50-300rad(Si)/s) dose rate and at 50krad(Si) at a low (< 0.01rad(Si)/s) dose rate, as specified in MIL-STD-883 test method 1019. The part is acceptance tested on a wafer-by-wafer basis at low dose rate to 50krad(Si) and at high dose rate to 100krad(Si). The ISL75051SEH is also SEE tolerant to a Linear Energy Transfer (LET) value of 86.4MeV•cm2/mg. Single-Event Transients (SET) have evolved into a major issue in power management parts driving voltage-sensitive loads, and the part provides superior performance in this environment. Specifications for radiation hardened QML devices are controlled by the Defense Logistics Agency (DLA) in Columbus, OH. The SMD is the controlling document and must be cited when ordering. Test Description Irradiation Facilities Neutron irradiation was performed by the VPT team at the University of Massachusetts Lowell Fast Neutron Irradiation (FNI) facility, which provides a controlled 1MeV equivalent neutron flux. Parts were tested in an unbiased configuration with all leads shorted together in accordance with TM 1017 of MIL-STD-883. As neutron irradiation activates many of the heavier elements found in a packaged integrated circuit, the parts exposed at the higher neutron levels required (as expected) some ‘cooldown’ time before being shipped back to Intersil (Palm Bay, FL) for electrical testing. Test Fixturing No formal irradiation test fixturing was involved, as these DD tests are ‘bag tests’ in the sense that the parts are irradiated in an electrically inactive state with all leads shorted together. April 14, 2016 TR027.0 1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2016. All Rights Reserved Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries. All other trademarks mentioned are the property of their respective owners. Test Report 027 Characterization Equipment and Procedures Results Electrical testing was performed before and after irradiation using the Intersil production Automated Test Equipment (ATE). All electrical testing was performed at room temperature. Neutron testing of the ISL75051SEH is complete and the results are reported in the balance of this report. It should be carefully realized when interpreting the data that each neutron irradiation was performed on a different five-unit sample; this is not total dose testing, where the damage is cumulative over a number of downpoints. Experimental Matrix Testing proceeded in general accordance with the guidelines of MIL-STD-883 Test Method 1017. The experimental matrix consisted of 5 samples irradiated at 2 x 1012 n/cm2, 5 irradiated at 1 x 1013 n/cm2, 5 irradiated at 3 x 1013 n/cm2 and 5 irradiated at 1 x 1014 n/cm2. Two control units were used. Attributes Data Table 2 shows the attributes data. ISL75051SEHF/PROTO samples were drawn from fabrication lot WTP8WD (serial numbers 1 through 8) and from lot WXW7CAE (serial numbers 9 through 20). Samples were packaged in the standard hermetic 18 Ld ceramic flatpack production package, code K18.E. Samples were screened to the SMD limits over-temperature before the start of neutron testing. TABLE 2. ISL75051SEH ATTRIBUTES DATA PART SERIAL ISL75051SEH SAMPLE SIZE 1 through 5 ISL75051SEH 6 through 10 ISL75051SEH 11 through 15 ISL75051SEH 16 through 20 FLUENCE, n/cm2 PASS (Note 1) FAIL 5 2 x 1012 5 0 All passed 5 1 x 1013 5 0 All passed 5 3 x 1013 5 0 All passed 5 1 x 1014 4 1 S/N 20 failed parametrically, adjusted pin voltage at 1.8V out, 5.0VIN NOTES NOTE: 1. “Pass” indicates a sample that passes all SMD limits. Submit Document Feedback 2 TR027.0 April 14, 2016 Test Report 027 Variables Data The plots in Figures 1 through 23 show data plots for key parameters before and after irradiation to each level. The reported parameters and their datasheet limits are shown in Table 3 on page 15. The plots show the median of each parameter as a function of neutron irradiation. We chose to plot the median because of the small sample sizes (five per cell) involved. We also show the applicable electrical limits taken from the SMD; it should be carefully noted that these limits are provided for guidance only as the ISL75051SEH is not specified or guaranteed for the neutron environment. Intersil does not design, qualify or guarantee its parts for the DD environment, but has performed some limited neutron testing for customer guidance. Variables Data Plots 1.2 1 EN_IIL ENABLE IIH AND IIL (µA) 0.8 EN_IIH Spec limit 0.6 0.4 0.2 0 -0.2 1.00E+11 PRE-RAD 1.00 E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 1. ISL75051SEH enable low and enable high current as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limit is 1.0µA maximum. Submit Document Feedback 3 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 1.5 ADJ_Ibias Spec limit 1 ADJUST PIN BIAS CURRENT (µA) Spec limit 0.5 0 -0.5 -1 -1.5 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 2. ISL75051SEH adjust pin bias current as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are -1.0µA to 1.0µA. 1.4 ENABLE THRESHOLD, RISING (V) 1.2 1 0.8 ENThrRising2.2V 0.6 ENThrRising6V Spec limit Spec limit 0.4 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 3. ISL75051SEH rising enable threshold at 2.2V and 6.0V input voltage as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 0.6V to 1.2V. Submit Document Feedback 4 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 1 ENThrFalling2.2V ENThrFalling_6V Spec limit ENABLE THRESHOLD, FALLING (V) Spec limit 0.8 0.6 0.4 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 4. ISL75051SEH falling enable threshold at 2.2V and 6.0V input voltage as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 0.47V to 0.9V. 350 ENHyst2.2V ENHyst6V 300 Spec limit ENABLE HYSTERESIS (mV) Spec limit 250 200 150 100 50 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 5. ISL75051SEH enable hysteresis at 2.2V and 6.0V input voltage as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 90.0mV to 318.0mV. Submit Document Feedback 5 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 500 ENDelay Spec limit Spec limit ENABLE DELAY (µs) 400 300 200 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 6. ISL75051SEH enable delay as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 225.0µs to 450.0µs. 0.53 2.2V OUTPUT VOLTAGE (V) 0.525 0.52 0.515 V.52V_VIN2.2_NL V.52V_VIN2.2_3A Spec limit Spec limit 0.51 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 7. ISL75051SEH output voltage at 2.2V input voltage, 0.52V output voltage, no load and 3.0A output current, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 0.5122V to 0.5278V. Submit Document Feedback 6 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 0.53 3.6VIN OUTPUT VOLTAGE (V) 0.525 0.52 0.515 V.52V_VIN3.6_NL V.52V_VIN3.6_3A Spec limit Spec limit 0.51 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 8. ISL75051SEH output voltage at 3.6V input voltage, 0.52V output voltage, no load and 3.0A output current, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 0.5122V to 0.5278V. 5.1 5.4VIN OUTPUT VOLTAGE (V) 5.05 5 4.95 V5.0_VIN5.4V_NL V5.0_VIN5.4V_3A Spec limit Spec limit 4.9 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 9. ISL75051SEH output voltage at 5.4V input voltage, 5.0V output voltage, no load and 3.0A output current, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 4.925V to 5.075V. Submit Document Feedback 7 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 5.1 6.0VIN OUTPUT VOLTAGE (V) 5.05 5 4.95 V5.0_Vin6.0V_NL V5.0_Vin6.0V_3A Spec limit Spec limit 4.9 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 10. ISL75051SEH output voltage at 6.0V input voltage, 5.0V output voltage, no-load and 3.0A output current, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 4.925V to 5.075V. 25 LineReg1.5V LineReg1.8V LineReg5.0V LINE REGULATION (mV) 20 Spec limit 1.5V Spec limit 1.8V 15 Spec limit 5.0V 10 5 0 PRE-RAD PRE-RD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 11. ISL75051SEH line regulation at 1.5V, 1.8V and 5.0V output voltage as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 8.0mV maximum (1.5V), 10.5mV maximum (1.8V) and 20.0mV maximum (5.0V). Submit Document Feedback 8 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 25 LOAD REGULATION (mV) 20 15 LoadReg1.5V LoadReg1.8V LoadReg5.0V Spec limit 1.5V Spec limit 1.5V Spec limit 1.8V Spec limit 1.8V Spec limit 5.0V Spec limit 5.0V 10 5 0 -5 -10 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 12. ISL75051SEH load regulation at 1.5V, 1.8V and 5.0V output voltage as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are -4.0mV to -0.1mV (1.5V), -4.0mV to -0.05mV (1.8V) and -15.0mV to -0.05mV (5.0V). 0.545 Vbyp_VIN2.2 Vbyp_VIN6.0 0.535 Spec limit BYPASS PIN VOLTAGE (V) Spec limit 0.525 0.515 0.505 0.495 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 13. ISL75051SEH bypass pin voltage at 2.2V and 6.0V input voltage as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 0.5V to 0.54V. Submit Document Feedback 9 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 14 GROUND CURRENT (mA) 12 10 8 Ignd_V1.5_V IN2.2_NL Ignd_V1.5_VIN2.2_3A Spec limit_NL Spec limit, 3A 6 4 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 14. ISL75051SEH ground current at 1.5V output voltage and 2.2V input voltage, no load and 3.0A load cases, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 12.0mA maximum (no load) and 13.0mA maximum (3.0A load). 20 GROUND CURRENT (mA) 18 16 14 12 Ignd_V5.0_Vin6.0V_NL 10 Ignd_V5.0_Vin6.0V_3A 8 Spec limit 6 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 15. ISL75051SEH ground current at 5.0V output voltage and 6.0V input voltage, no load and 3.0A load cases, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 18.0mA (no load and 3.0A load). Submit Document Feedback 10 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 350 DROPOUT VOLTAGE (mV) 300 250 Vdropout_1A Vdropout_2A Vdropout_3A Spec limit_1A Spec limit_2A Spec limit_3A 200 150 100 50 0 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 16. ISL75051SEH dropout voltage, 1.0A, 2.0A and 3.0A output current, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 100.0mV maximum (1.0A), 200.0mV maximum (2.0A) and 300.0mV maximum (3.0A). 1.2 PG_Lkg Spec limit 1 PGOOD LEAKAGE (µA) 0.8 0.6 0.4 0.2 0 -0.2 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 17. ISL75051SEH PGOOD leakage as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits is 1.0µA maximum. Submit Document Feedback 11 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 450 PG_Vol_1ma 400 PG_Vol_6ma Spec limit_1mA 350 Spec limit_6mA PGOOD VOL (mV) 300 250 200 150 100 50 0 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 18. ISL75051SEH PGOOD output low voltage at 1.0mA and 6.0mA as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 100.0mV maximum (1.0mA) and 400.0mV maximum (6.0mA). PGOOD THRESHOLD (%) 95 PG_FallingThr_6V PG_RisingThr_6V Spec limit Spec limit Spec limit Spec limit 90 85 80 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 19. ISL75051SEH PGOOD rising and falling threshold, 6.0V input voltage, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 82% to 93% (falling) and 85% to 96% (rising). Submit Document Feedback 12 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 4.5 PG_HystVin_6.0V PG_HystVin_2.2V Spec limit 4 PGOOD HYSTERESIS (%) Spec limit 3.5 3 2.5 2 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 20. ISL75051SEH PGOOD hysteresis at 2.2V and 6.0V input voltage, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 2.5% to 4.0%. PGOOD THRESHOLD (%) 95 PG_FallingThr_2.2V PG_RisingThr_2.2V Spec limit Spec limit Spec limit Spec limit 90 85 80 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 21. PGOOD rising and falling threshold, 2.2V input voltage, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The data sheet limits are 82% to 93% (falling) and 85% to 96% (rising). Submit Document Feedback 13 TR027.0 April 14, 2016 Test Report 027 Variables Data Plots (Continued) 10 CURRENT LIMIT (A) 8 Ilimit_5.11K_VIN_2.2V Ilimit_511_VIN_2.2V Spec limit_5.11K Spec limit_5.11K Spec limit_511ohm Spec limit_511ohm 6 4 2 0 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE(n/cm2) FIGURE 22. ISL75051SEH output current limit, 2.2V input voltage, 5.11kΩ and 511Ω set resistor cases as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 0.65A to 1.6A (5.11kΩ set resistor) and 4.6A to 7.5A (511Ω set resistor). 12 10 Ilimit_5.11K_Vin_6.0V Ilimit_511_Vin_6.0V Spec limit_5.11K Spec limit_5.11K Spec limit_511ohm Spec limit_511ohm CURRENT LIMIT (A) 8 6 4 2 0 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 23. ISL75051SEH output current limit, 6.0V input voltage, 5.11kΩ and 511Ω set resistor cases, as a function of 1MeV equivalent neutron irradiation at 2 x 1012 n/cm2, 1 x 1013 n/cm2, 3 x 1013 n/cm2 and 1 x 1014 n/cm2. Sample size for each cell was 5. The datasheet limits are 0.5A to 1.7A (5.11kΩ set resistor) and 4.3A to 8.5A (511Ω set resistor). Submit Document Feedback 14 TR027.0 April 14, 2016 Test Report 027 Conclusion Appendices This report summarizes the results of 1MeV equivalent neutron testing of the ISL75051SEH low dropout voltage linear regulator. The test was conducted in order to determine the sensitivity of the part to displacement damage (DD) caused by neutron or proton environments in space. Neutron fluences ranged from 2 x 1012 n/cm2 to 1 x 1014 n/cm2. This project was carried out in collaboration with VPT, Inc. (Blacksburg, VA), and their support is gratefully acknowledged. Reported Parameters The limits are from the SMD and are provided for guidance only in Table 3 as the ISL75051SEH part is not designed or guaranteed for the neutron environment. A number of parameters are plotted in the same figure (i.e., Figure 1, on page 3, which plots the neutron response of both the enable low and enable High currents) in order to save space. The part performed very well. The samples met all specifications (Bin 1) after 2 x 1011 n/cm2, 1 x 1013 n/cm2 and 3 x 1013 n/cm2. ATE testing showed one parametric reject after 1 x 1014 n/cm2. The part marginally failed the adjust pin voltage at the high end of the spec. The part may be usable to a neutron level of 3 x 1013 n/cm2. TABLE 3. REPORTED PARAMETERS FIGURE NUMBER PARAMETER LIMIT, LOW LIMIT, HIGH UNITS NOTES 1 Enable Low current - 1.0 µA 1 Enable High current - 1.0 µA 2 Adjust pin bias current -1.0 1.0 µA 3 Enable threshold, rising 0.6 1.2 µA 4 Enable threshold, falling 0.47 0.9 µA 5 Enable hysteresis 90.0 318.0 mV 6 Enable delay 225.0 450.0 µs 7 Output voltage, 0.52V 0.5122 0.5278 V No load, 2.2VIN 7 Output voltage, 0.52V 0.5122 0.5278 V 3.0A load, 2.2VIN 8 Output voltage, 0.52V 0.5122 0.5278 V No load, 3.6VIN 8 Output voltage, 0.52V 0.5122 0.5278 V 3.0A load, 3.6VIN 9 Output voltage, 5.0V 4.925 5.075 V No load, 5.4VIN 9 Output voltage, 5.0V 4.925 5.075 V 3.0A load, 5.4VIN 10 Output voltage, 5.0V 4.925 5.075 V No load, 6.0VIN 10 Output voltage, 5.0V 4.925 5.075 V 3.0A load, 6.0VIN 11 Line regulation - 8.0 mV 1.5VOUT 11 Line regulation - 10.5 mV 1.8VOUT 11 Line regulation - 20.0 mV 5.0VOUT 12 Load regulation -4.0 -0.1 mV 1.5VOUT 12 Load regulation -4.0 -0.05 mV 1.8VOUT 12 Load regulation -15.0 -0.05 mV 5.0VOUT 13 Bypass pin voltage 0.5 0.54 V 14 Ground current, 1.5V - 12.0 mA No load, 2.2VIN 14 Ground current, 1.5V - 13.0 mA 3.0A load, 2.2VIN 15 Ground current, 5.0V - 18.0 mA No load, 6.0VIN 15 Ground current, 5.0V - 18.0 mA 3.0A load, 6.0VIN 16 Dropout voltage, 1.0A - 100.0 mV Submit Document Feedback 15 TR027.0 April 14, 2016 Test Report 027 TABLE 3. REPORTED PARAMETERS (Continued) FIGURE NUMBER PARAMETER LIMIT, LOW LIMIT, HIGH UNITS NOTES 16 Dropout voltage, 2.0A - 200.0 mV 16 Dropout voltage, 3.0A - 300.0 mV 17 PGOOD leakage - 1.0 µA 18 PGOOD VOL - 100 mV 1mA 18 PGOOD VOL - 400 mV 6mA 19 PGOOD Rising threshold 85 96 % 6.0VIN 19 PGOOD Falling threshold 82 93 % 6.0VIN 20 PGOOD hysteresis 2.5 4.0 % 6.0V and 2.2VIN 21 PGOOD Rising threshold 85 96 V 2.2VIN 21 PGOOD Falling threshold 82 93 % 2.2VIN 22 Output current limit, 5.11kΩ 0.65 1.6 % 2.2VIN 22 Output current limit, 511Ω 4.6 7.5 A 2.2VIN 23 Output current limit, 5.11kΩ 0.5 1.7 A 6.0VIN 23 Output current limit, 511Ω 4.3 8.5 A 6.0VIN Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that the document is current before proceeding. For information regarding Intersil Corporation and its products, see www.intersil.com Submit Document Feedback 16 TR027.0 April 14, 2016