Why Ultra-Reliable MCUs Matter

Ultra-Reliable MCUs
Why Ultra-Reliable
Processors Matter
Freescale’s portfolio of ultra-reliable processors is the broadest in the industry and is ideal
for challenging environments found in industrial, infrastructure, automation, communications,
transportation and medical applications. It offers best-in-class quality, reliability and safety for
applications that need to perform in the harshest environments.
Why Safety Matters
• Eliminate risks due to hazards caused by malfunctioning of electronic systems
• Avoid random failures, main impairment to safety
Latent Failure
Common Cause Failure
Danger with second fault
Annul redundancy-based measures
MCU
LF
INPUT
MCU
WRONG
OUTPUT
INPUT
MCU
CORRECT
OUTPUT
INPUT
MCU
Freescale Solution
Freescale Solution
Freescale Solution
• Structure redundancy [Core, DMA]
• Hardware self test [memory, logic]
• Delayed checker core
• Information redundancy [E2E, ECC, EDC]
• 90% stuck-at-fault
• Clock, temp, power monitor
• Independent safety clock
Comparator
Single Point Failure
Immediate potential for hazard
OK
What Makes an MCU Ultra-Reliable?
Features
Ultra-Reliable
Consumer
Traditional Industrial
Reliable
Dielectric Lifetime (TDDB)
• < 1ppm
• < 1000 ppm
• < 1000 ppm
• < 10 ppm
• Auto-specific model
• Standard model
• Auto-specific model
• Voltage limit checking
• Subset voltage limit
checking
• Industrial model / standard
model
Transistor Aging (HCI, BTI)
• Circuit use-profile
• Limited margining
• Voltage limit checking
• Subset voltage limit
checking
• Limited margining
• Custom-aged model
• Circuit use-profile
• Custom-aged model
Metalization Reliability
(Electromigration)
• < 1 ppm
• < 1000 ppm
• < 1000 ppm
• < 10 ppm
• Current mode/ profile
specific
• Current mode/ profile
specific
• Current mode/ profile
specific
• Current mode/ profile
specific
Metalization Reliability
(Stress Migration)
• Zero failure in stress
• Zero failure in stress
• Zero failure in stress
• Zero failure in stress
• Geometry specific design
rules
• Geometry specific design
rules
• Geometry specific design
rules
• Geometry specific design
rules
Metalization Dielectric
Lifetime (TDDB)
• < 1 ppm
• < 1000 ppm
• < 1000 ppm
• < 10 ppm
• Auto-specific model
• Standard model
• Auto-specific model
• Geometry / use condition
design rules
• Subset voltage limit
checking
• Industrial model /standard
model
• SER: < 1 FIT
• SER: < 100000 FIT
• SER: < 1000 FIT
• SER: < 1000 FIT
• SEL: < 0.1 FIT
• SEL: < 1000 FIT
• SEL: < 10 FIT
• SEL: < 10 FIT
Radiation Immunity
(SER / SEL)
• Subset voltage limit
checking
• Geometry / use condition
design rules
For more information, visit freescale.com/UltraReliableMCUs
Freescale and the Freescale logo are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. All other product or
service names are the property of their respective owners. All rights reserved. © 2015 Freescale Semiconductor, Inc.