IDT 8430S07AKILF

Clock Generator for Cavium Processors
ICS8430S07I
DATA SHEET
General Description
Features
The ICS8430S07I is a PLL-based clock generator
specifically designed for Cavium Networks SoC
HiPerClockS™
processors. This high performance device is optimized
to generate the processor core reference clock, the
DDR reference clocks, the PCI/PCI-X bus clocks, and
the clocks for both the Gigabit Ethernet MAC and PHY. The clock
generator offers ultra low-jitter, low-skew clock outputs, and edge
rates that easily meet the input requirements for the
CN3005/CN3010/CN3020 processors. The output frequencies are
generated from a 25MHz external input source or an external 25MHz
parallel resonant crystal. The extended temperature range of the
ICS8430S07I supports telecommunication, networking, and storage
requirements.
•
One selectable differential LVPECL output pair for DDR
533/400/667
•
Six LVCMOS/ LVTTL outputs, 15Ω typical output impedance
- One selectable core clock for the processor
- One selectable clock for the PCI/ PCI-X bus
- One 125MHz clock reference for GbE MAC
- Three 25MHz clock references for GbE PHY
•
Selectable external crystal or differential (single-ended) input
source
•
Crystal oscillator interface designed for 25MHz, parallel resonant
crystal
•
Differential input pair (CLK, nCLK) accepts LVPECL, LVDS,
LVHSTL, SSTL, HCSL input levels
•
Internal resistor bias on nCLK pin allows the user to drive CLK
input with external single-ended (LVCMOS/ LVTTL) input levels
•
RMS phase jitter @ 125MHz, using a 25MHz crystal
(1.875MHz - 20MHz): 0.78ps (typical), QD output
•
Output supply:
LVPECL – 3.3V Core
LVCMOS – Core/Output
3.3V/3.3V
3.3V/2.5V
•
•
-40°C to 85°C ambient operating temperature
ICS
Applications
Networking, control and storage equipment, including routers,
switches, application-aware gateways, triple-play gateways,
WLAN and 3G/4G access and aggregation devices, storage
arrays, storage networking equipment, servers, and intelligent
NICs
Available in lead-free (RoHS 6) package
802.11 a/b/g/n wireless for home data and multi-media distribution
QoS for high quality Voice, Video, and Data Service
Next-generation PON, VDSL2, and Cable Networks
VDDO_D
QD
GND
Consumer Space Media Server
VDDO_REF
Pin Assignment
QREF2
Audio/Video Storage and Distribution
QREF1
High-performance NAS
QREF0
•
•
•
•
•
•
Systems using CN30XX MIPS64 Broadband Processors
VDDO_REF
•
•
32 31 30 29 28 27 26 25
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
nXTAL_SEL
5
CLK
6
nCLK
7
GND
8
1
9
10 11 12 13 14 15 16
24
VDDO_C
23
QC
22
CORE_SEL
21 GND
20
GND
19
MR/ nOE_ REF
18
QB
17 VDDO_B
VDDA
4
VDD
XTAL_ OUT
32- Lead VFQFN
5mm x 5mm x 0.925mm
package body
K Package
Top View
QA
3
nQA
XTAL_IN
ICS8430S07I
DDR_SEL0
2
DDR_SEL1
nPLL_SEL
PCI_SEL0
1
PCI_SEL1
VDD
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Block Diagram
nPLL_SEL PD
nXTAL_SEL PD
00 = 133.333MHz
01 = 100.000MHz
10 = 83.333MHz
11 = 125.000MHz
DDR533, DDR400, or
QA
DDR667 Reference
nQA Clock (LVPECL)
0 = 50.000MHz
1 = 33.333MHz
QB
Processor Core Clock
(LVCMOS)
00 = 133.333MHz
01 = 100.000MHz
10 = 66.667MHz
11 = 33.333MHz
QC
PCI or PCI-X Clock
(LVCMOS)
125MHz GbE CLK
QD
Gigabit Ethernet MAC
Clock (LVCMOS)
XTAL_IN
25MHz
XTAL_OUT
OSC
0
1
PLL
0
1
CLK PD
25MHz
nCLK PU/PD
DDR_SEL1:0 PD
CORE_SEL PD
QREF0
Clock Output
Control Logic
25MHz GbE CLK
PCI_SEL1:0 PD
\
\ Gigabit Ethernet
QREF1 / PHY Clocks
/ (LVCMOS)
QREF2
MR/nOE_REF PD
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Table 1. Pin Descriptions
Number
Name
1, 15
VDD
Type
Description
Power
Core supply pins.
PLL bypass. When LOW, selects PLL (PLL Enable). When HIGH, bypasses
the PLL. LVCMOS/LVTTL interface levels.
2
nPLL_SEL
Input
Pulldown
3, 4
XTAL_IN,
XTAL_OUT
Input
5
nXTAL_SEL
Input
Pulldown
Selects XTAL inputs when LOW. Selects differential clock (CLK, nCLK) input
when HIGH. LVCMOS/LVTTL interface levels.
6
CLK
Input
Pulldown
Non-inverting differential clock input.
7
nCLK
Input
Pullup/
Pulldown
Inverting differential clock input. Internal resistor bias to VDD/2.
8, 20, 21, 27
GND
Power
9, 10
PCI_SEL1,
PCI_SEL0
Input
Pulldown
Selects the PCI/PCI-X reference clock output frequency. See Table 3C.
LVCMOS/LVTTL interface levels.
11, 12
DDR_SEL1,
DDR_SEL0
Input
Pulldown
Selects the DDR reference clock output frequency. See Table 3B.
LVCMOS/LVTTL interface levels.
13, 14
nQA, QA
Output
Differential output pair. LVPECL interface levels.
16
VDDA
Power
Analog supply pin.
17
VDDO_B
Power
Bank B output supply pin. 3.3 V or 2.5V supply.
18, 23, 26,
29, 30,
31
QB, QC, QD,
QREF2, QREF1,
QREF0
Output
Single-ended outputs. LVCMOS/LVTTL interface levels.
Parallel resonant crystal interface. XTAL_OUT is the output, XTAL_IN is the
input.
Power supply ground.
19
MR/nOE_REF
Input
Pulldown
Active HIGH Master Reset. Active LOW output enable. When logic HIGH, the
internal dividers are reset and the QREF[2:0] outputs are in high impedance
(HI-Z). When logic LOW, the internal dividers and the outputs are enabled.
LVCMOS/ LVTTL interface levels.
22
CORE_SEL
Input
Pulldown
Selects the processor core clock output frequency. The output frequency is
50MHz when LOW, and 33.333MHz when HIGH. See Table 3A.
LVCMOS/LVTTL interface levels.
24
VDDO_C
Power
25
VDDO_D
Power
Bank D output supply pin. 3.3 V or 2.5V supply.
28, 32
VDDO_REF
Power
REF bank output supply pins. 3.3 V or 2.5V supply.
Bank C output supply pin. 3.3 V or 2.5V supply.
NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Table 2. Pin Characteristics
Symbol
Parameter
Test Conditions
CIN
Input Capacitance
CPD
Power Dissipation Capacitance
(per output)
RPULLUP
Input Pullup Resistor
Output Impedance
Typical
Maximum
Units
2
pF
VDD, VDDO_X = 3.465V
4
pF
VDD = 3.465V, VDDO_X = 2.625V
4
pF
51
kΩ
51
kΩ
RPULLDOWN Input Pulldown Resistor
ROUT
Minimum
QB, QC, QD,
QREF[0:2]
VDDO_X = 3.465V
15
Ω
QB, QC, QD,
QREF[0:2]
VDDO_X = 2.625V
20
Ω
NOTE: VDDO_X denotes VDDO_B, VDDO_C, VDDO_D and VDDO_REF.
Function Tables
Table 3A. QB Output Control Input Function Table
Input
Output Frequency
CORE_SEL
QB
0 (default)
50MHz
1
33.333MHz
Table 3B. QA Output Control Input Function Table
Inputs
Output Frequency
DDR_SEL1
DDR_SEL0
QA, nQA
0 (default)
0 (default)
133.333MHz
0
1
100.000MHz
1
0
83.333MHz
1
1
125.000MHz
Table 3C. QC Output Control Input Function Table
Inputs
Output Frequency
PCI_SEL1
PCI_SEL0
QC
0 (default)
0 (default)
133.333MHz
0
1
100.000MHz
1
0
66.6667MHz
1
1
33.333MHz
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect product reliability.
Item
Rating
Supply Voltage, VDD
4.6V
Inputs, VI
-0.5V to VDD + 0.5V
Outputs, VO (LVCMOS)
-0.5V to VDD + 0.5V
Outputs, IO (LVPECL)
Continuos Current
Surge Current
50mA
100mA
Package Thermal Impedance, θJA
39.5°C/W (0 mps)
Storage Temperature, TSTG
-65°C to 150°C
DC Electrical Characteristics
Table 4A. Power Supply DC Characteristics, VDD = VDDO_X = 3.3V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
VDD
Core Supply Voltage
VDDA
Test Conditions
Minimum
Typical
Maximum
Units
3.135
3.3
3.465
V
Analog Supply Voltage
VDD – 0.20
3.3
VDD
V
VDDO_X
Output Supply Voltage
3.135
3.3
3.465
V
IDD
Power Supply Current
170
mA
IDDA
Analog Supply Current
20
mA
IDDO_X
Output Supply Current
25
mA
NOTE: VDDO_X denotes VDDO_B, VDDO_C, VDDO_D and VDDO_REF.
NOTE: IDDO_X = IDDO_B, IDDO_C, IDDO_D and IDDO_REF.
Table 4B. Power Supply DC Characteristics, VDD = 3.3V ± 5%, VDDO_X = 2.5V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
VDD
Core Supply Voltage
VDDA
Test Conditions
Minimum
Typical
Maximum
Units
3.135
3.3
3.465
V
Analog Supply Voltage
VDD – 0.20
3.3
VDD
V
VDDO_X
Output Supply Voltage
2.375
2.5
2.625
V
IDD
Power Supply Current
160
mA
IDDA
Analog Supply Current
20
mA
IDDO_X
Output Supply Current
20
mA
NOTE: VDDO_X denotes VDDO_B, VDDO_C, VDDO_D and VDDO_REF.
NOTE: IDDO_X = IDDO_B, IDDO_C, IDDO_D and IDDO_REF.
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Table 4B. LVCMOS/LVTTL DC Characteristics, VDD = 3.3V ± 5%, VDDO_X = 3.3V ± 5% or 2.5V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
Test Conditions
VIH
Input High Voltage
VIL
Input Low Voltage
Minimum
Typical
Maximum
Units
2
VDD + 0.3
V
-0.3
0.8
V
150
µA
Input
High Current
nPLL_SEL,
CORE_SEL,
nXTAL_SEL,
PCI_SEL[0:1],
DDR_SEL[0:1],
MR/nOE_REF
VDD = VIN = 3.465V
IIL
Input
Low Current
nPLL_SEL,
CORE_SEL,
nXTAL_SEL,
PCI_SEL[0:1],
DDR_SEL[0:1],
MR/nOE_REF
VDD = 3.465V, VIN = 0V
-10
µA
V
Output High Voltage; NOTE 1
VDDO_X = 3.465V
2.6
VOH
VDDO_X = 2.625V
1.8
V
VOL
Output Low Voltage: NOTE 1
IIH
VDDO_X = 3.465V or 2.625V
0.6
V
NOTE 1: Outputs terminated with 50Ω to VDDO_X/2. See Parameter Measurement Information, Output Load Test Circuit diagram.
Table 4C. Differential DC Characteristics, VDD = 3.3V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
Test Conditions
IIH
Input High Current
IIL
Input Low Current
VPP
Peak-to-Peak Input Voltage; NOTE 1
0.15
1.3
V
VCMR
Common Mode Input Voltage; NOTE 1, 2
0.5
VDD – 0.85
V
CLK/nCLK
Minimum
Typical
VDD = VIN = 3.465V
Maximum
Units
150
µA
CLK
VDD = 3.465V, VIN = 0V
-10
µA
nCLK
VDD = 3.465V, VIN = 0V
-150
µA
NOTE 1: VIL should not be less than -0.3V.
NOTE 2. Common mode voltage is defined as VIH.
Table 4D. LVPECL DC Characteristics, VDD = 3.3V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
VOH
Output High Voltage; NOTE 1
VOL
Output Low Voltage; NOTE 1
VSWING
Peak-to-Peak Output Voltage Swing
Test Conditions
Minimum
Typical
Maximum
Units
VDD – 1.4
VDD – 0.8
V
VDD – 2.0
VDD – 1.7
V
0.55
1.0
V
NOTE 1: Outputs terminated with 50Ω to VDD – 2V.
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Table 5. Crystal Characteristics
Parameter
Test Conditions
Mode of Oscillation
Minimum
Typical
Maximum
Units
Fundamental
Frequency
25
MHz
Equivalent Series Resistance (ESR)
50
Ω
Shunt Capacitance
7
pF
300
µW
Drive Level
NOTE: Characterized using an 18pF parallel resonant crystal.
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
AC Electrical Characteristics
Table 6. AC Characteristics, VDD = 3.3V ± 5%, VDDO_X = 3.3V ± 5% or 2.5V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
Test Conditions
QA/nQA
Output Frequency
DDR_SEL[1:0] = 00
Typical
Maximum
Units
133.333
MHz
QA/nQA
DDR_SEL[1:0] = 01
100
MHz
QA/nQA
DDR_SEL[1:0] = 10
83.333
MHz
QA/nQA
DDR_SEL[1:0] = 11
125
MHz
CORE_SEL = 0
50
MHz
QB
fMAX
Minimum
QB
CORE_SEL = 1
33.333
MHz
QC
PCI_SEL[1:0] = 00
133.333
MHz
QC
PCI_SEL[1:0] = 01
100
MHz
QC
PCI_SEL[1:0] = 10
66.667
MHz
QC
PCI_SEL[1:0] = 11
33.333
MHz
QD
125
MHz
QREF[0:2]
25
MHz
tsk(b)
Bank Skew;
NOTE 2, 4
QREF[0:2]
35
ps
tsk(pp)
Part-to-Part Skew;
NOTE 3, 4
QREF[0:2]
400
ps
QB, QC,
270
ps
tjit(cc)
Cycle-to-Cycle Jitter;
NOTE 4, 5
QA/nQA
measured at crosspoint
QD
95
ps
200
ps
tjit(per)
Period Jitter (pk-pk);
NOTE 4
QA/nQA
measured at crosspoint
-90
90
ps
tjit(hper)
Half-period Jitter
(pk-pk)
QA/nQA
measured at crosspoint
-90
90
ps
tjit(Ø)
RMS Phase Jitter,
(Random); NOTE 1
QREF[0:2]
25MHz (10kHz to 5MHz)
QD
125MHz (1.875MHz to 20MHz)
QB
tR / tF
odc
Output
Rise/Fall Time
Output Duty Cycle
0.73
ps
0.78
ps
100
450
ps
100
300
ps
100
450
ps
QD
100
450
ps
QA/nQA
49
51
%
QB, QC, QD,
QREF[0:2]
45
55
%
QA/nQA
QC, QREF[0:2]
20% to 80%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: All parameters measured at fMAX unless noted otherwise.
NOTE 1: Refer to the phase noise plot.
NOTE 2: Defined as skew within a bank of outputs at the same supply voltage and with equal load conditions.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltage and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at VDDO/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 5: All outputs running at corresponding fMAX.
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
➝
Typical Phase Noise at 125MHz (QD output @ 3.3V)
GbE Filter
➝
Noise Power
dBc
Hz
125MHz
RMS Phase Jitter (Random)
1.875MHz to 20MHz = 0.78ps (typical)
➝
Raw Phase Noise Data
Phase Noise Result by adding a
GbE filter to raw data
Offset Frequency (Hz)
➝
Typical Phase Noise at 25MHz (QREF output @ 3.3V)
GbE Filter
➝
Raw Phase Noise Data
➝
Noise Power
dBc
Hz
125MHz
RMS Phase Jitter (Random)
1.875MHz to 20MHz = 0.73ps (typical)
Phase Noise Result by adding a
GbE filter to raw data
Offset Frequency (Hz)
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Parameter Measurement Information
2V
1.65V±5%
2V
1.65V±5%
VDD
Qx
SCOPE
VDD,
SCOPE
VDDO_X
VDDA
VDDA
Qx
LVCMOS
LVPECL
GND
nQx
VEE
-1.65V±5%
-1.3V±0.165V
3.3V Core/3.3V LVPECL Output Load AC Test Circuit
3.3V Core/3.3V LVCMOS Output Load AC Test Circuit
2.05V±5%
1.25V±5%
VDD
2.05V±5%
SCOPE
VDD
nCLK
VDDO_X
V
PP
Qx
LVCMOS VDDA
V
Cross Points
CMR
CLK
GND
GND
-
-1.25V±5%
3.3V Core/2.5V LVCMOS Output Load AC Test Circuit
Differential Input Level
VOH
nQA
QA
➤
➤
t half period n
t half period
1
fo
n+1
VREF
➤
➤
VOL
➤
➤
t jit(hper) = t half period n — 1
t jit (pk-pk)
2*fo
Reference Point
(Trigger Edge)
Histogram
Mean Period
(First edge after trigger)
10,000 cycles
Half Period Jitter
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
Period Jitter
10
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Parameter Measurement Information, continued
VDDO_REF
2
QREF[0:2]
Par t 1
V
DDO_REF
Q_REFx
VDDO_REF
2
QREF[0:2]
2
Par t 2
V
DDO_REF
Q_REFy
2
tsk(pp)
tsk(b)
LVCMOS Bank Skew
LVCMOS Part-to-Part Skew
nQA
V
tcycle n+1
➤
➤
➤
➤
DDOX
2
DDOX
2
➤
➤
tcycle n
V
V
DDOX
QB:QD,
QREF[0:2]
QA
➤
tcycle n
2
tcycle n+1
➤
tjit(cc) = |tcycle n – tcycle n+1|
1000 Cycles
tjit(cc) = |tcycle n – tcycle n+1|
1000 Cycles
LVPECL Cycle-to-Cycle Jitter
LVCMOS Cycle-to-Cycle Jitter
Noise Power
Phase Noise Plot
nQA
80%
80%
VSW I N G
Phase Noise Mask
QA:QD,
QREF[0:2]
20%
20%
tR
f1
Offset Frequency
tF
f2
RMS Jitter = Area Under the Masked Phase Noise Plot
RMS Phase Jitter
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
Output Rise/Fall Time
11
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Parameter Measurement Information, continued
nQA
V
DDOX
QB:QD,
QREF[0:2]
2
QA
t PW
t PW
t
odc =
t
PERIOD
t PW
PERIOD
t PW
odc =
x 100%
x 100%
t PERIOD
t PERIOD
LVCMOS Output Duty Cycle/Pulse Width/Period
LVPECL Output Duty Cycle/Pulse Width/Period
Application Information
Wiring the Differential Input to Accept Single-Ended Levels
Figure 1 shows how the differential input can be wired to accept
single-ended levels. The reference voltage V_REF = VDD/2 is
generated by the bias resistors R1, R2 and C1. This bias circuit
should be located as close as possible to the input pin. The ratio of
R1 and R2 might need to be adjusted to position the V_REF in the
center of the input voltage swing. For example, if the input clock swing
is only 2.5V and VDD = 3.3V, V_REF should be 1.25V and R2/R1 =
0.609.
VDD
R1
1K
Single Ended Clock Input
CLK
V_REF
nCLK
C1
0.1u
R2
1K
Figure 1. Single-Ended Signal Driving Differential Input
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Power Supply Filtering Technique
As in any high speed analog circuitry, the power supply pins are
vulnerable to random noise. To achieve optimum jitter perform ance,
power supply isolation is required. The ICS8430S07I provides
separate power supplies to isolate any high switching noise from the
outputs to the internal PLL. VDD, VDDA and VDDO_X should be
individually connected to the power supply plane through vias, and
0.01µF bypass capacitors should be used for each pin. Figure 2
illustrates this for a generic VDD pin and also shows that VDDA
requires that an additional 10Ω resistor along with a 10µF bypass
capacitor be connected to the VDDA pin.
3.3V
VDD
.01µF
10Ω
.01µF
10µF
VDDA
Figure 2. Power Supply Filtering
Recommendations for Unused Input and Output Pins
Inputs:
Outputs:
CLK/nCLK Inputs
LVPECL Outputs
For applications not requiring the use of the differential input, both
CLK and nCLK can be left floating. Though not required, but for
additional protection, a 1kΩ resistor can be tied from CLK to ground.
The unused LVPECL output can be left floating. We recommend that
there is no trace attached. Both sides of the differential output pair
should either be left floating or terminated.
Crystal Inputs
LVCMOS Outputs
All unused LVCMOS output can be left floating. There should be no
trace attached.
For applications not requiring the use of the crystal oscillator input,
both XTAL_IN and XTAL_OUT can be left floating. Though not
required, but for additional protection, a 1kΩ resistor can be tied from
XTAL_IN to ground.
LVCMOS Control Pins
All control pins have internal pulldowns; additional resistance is not
required but can be added for additional protection. A 1kΩ resistor
can be used.
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
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©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Differential Clock Input Interface
The CLK /nCLK accepts LVDS, LVPECL, LVHSTL, SSTL, HCSL and
other differential signals. Both VSWING and VOH must meet the VPP
and VCMR input requirements. Figures 3A to 3F show interface
examples for the HiPerClockS CLK/nCLK input driven by the most
common driver types. The input interfaces suggested here are
examples only. Please consult with the vendor of the driver
component to confirm the driver termination requirements. For
example, in Figure 3A, the input termination applies for IDT
HiPerClockS open emitter LVHSTL drivers. If you are using an
LVHSTL driver from another vendor, use their termination
recommendation.
3.3V
3.3V
3.3V
1.8V
Zo = 50Ω
Zo = 50Ω
CLK
CLK
Zo = 50Ω
nCLK
Zo = 50Ω
nCLK
HiPerClockS
Input
LVHSTL
R1
50
IDT
HiPerClockS
LVHSTL Driver
HiPerClockS
Input
LVPECL
R2
50
R1
50
R2
50
R2
50
Figure 3A. HiPerClockS CLK/nCLK Input
Driven by an IDT Open Emitter
HiPerClockS LVHSTL Driver
Figure 3B. HiPerClockS CLK/nCLK Input
Driven by a 3.3V LVPECL Driver
3.3V
3.3V
3.3V
R3
125
3.3V
R4
125
3.3V
Zo = 50Ω
Zo = 50Ω
CLK
CLK
R1
100
Zo = 50Ω
nCLK
HiPerClockS
Input
LVPECL
R1
84
R2
84
Figure 3C. HiPerClockS CLK/nCLK Input
Driven by a 3.3V LVPECL Driver
2.5V
nCLK
Zo = 50Ω
Receiver
LVDS
Figure 3D. HiPerClockS CLK/nCLK Input
Driven by a 3.3V LVDS Driver
2.5V
3.3V
3.3V
2.5V
*R3
33
R3
120
Zo = 50Ω
R4
120
Zo = 60Ω
CLK
CLK
Zo = 50Ω
Zo = 60Ω
nCLK
nCLK
HCSL
*R4
33
R1
50
R2
50
HiPerClockS
Input
HiPerClockS
SSTL
R1
120
R2
120
*Optional – R3 and R4 can be 0Ω
Figure 3F. HiPerClockS CLK/nCLK Input
Driven by a 2.5V SSTL Driver
Figure 3E. HiPerClockS CLK/nCLK Input
Driven by a 3.3V HCSL Driver
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
14
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Crystal Input Interface
The ICS8430S07I has been characterized with 18pF parallel
resonant crystals. The capacitors C1 and C2 are not required, but
can be populated for optimal ppm accuracy. The C1 and C2 values
can be slightly adjusted to minimize ppm error for different board
layouts.
XTAL_IN
C1
Spare
X1
18pF Parallel Crystal
XTAL_OUT
C2
Spare
Figure 4. Crystal Input Interface
LVCMOS to XTAL Interface
The XTAL_IN input can accept a single-ended LVCMOS signal
through an AC coupling capacitor. A general interface diagram is
shown in Figure 5. The XTAL_OUT pin can be left floating. The input
edge rate can be as slow as 10ns. For LVCMOS signals, it is
recommended that the amplitude be reduced from full swing to half
swing in order to prevent signal interference with the power rail and
to reduce noise. This configuration requires that the output
impedance of the driver (Ro) plus the series resistance (Rs) equals
VDD
the transmission line impedance. In addition, matched termination at
the crystal input will attenuate the signal in half. This can be done in
one of two ways. First, R1 and R2 in parallel should equal the
transmission line impedance. For most 50Ω applications, R1 and R2
can be 100Ω. This can also be accomplished by removing R1 and
making R2 50Ω. By overdriving the crystal oscillator, the device will
be functional, but note, the device performance is guaranteed by
using a quartz crystal.
VDD
R1
Ro
Rs
0.1µf
50Ω
XTAL_IN
Zo = Ro + Rs
R2
XTAL_OUT
Figure 5. General Diagram for LVCMOS Driver to XTAL Input Interface
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
15
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Termination for 3.3V LVPECL Outputs
The clock layout topology shown below is a typical termination for
LVPECL outputs. The two different layouts mentioned are
recommended only as guidelines.
transmission lines. Matched impedance techniques should be used
to maximize operating frequency and minimize signal distortion.
Figures 6A and 6B show two different layouts which are
recommended only as guidelines. Other suitable clock layouts may
exist and it would be recommended that the board designers
simulate to guarantee compatibility across all printed circuit and clock
component process variations.
The differential output pair is low impedance follower outputs that
generate ECL/LVPECL compatible outputs. Therefore, terminating
resistors (DC current path to ground) or current sources must be
used for functionality. These outputs are designed to drive 50Ω
R3
125Ω
3.3V
3.3V
Zo = 50Ω
3.3V
R4
125Ω
3.3V
3.3V
Zo = 50Ω
+
+
_
LVPECL
Input
Zo = 50Ω
_
LVPECL
R1
50Ω
R2
50Ω
R1
84Ω
VCC - 2V
RTT =
1
* Zo
((VOH + VOL) / (VCC – 2)) – 2
Input
Zo = 50Ω
R2
84Ω
RTT
Figure 6A. 3.3V LVPECL Output Termination
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
Figure 6B. 3.3V LVPECL Output Termination
16
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
VFQFN EPAD Thermal Release Path
In order to maximize both the removal of heat from the package and
the electrical performance, a land pattern must be incorporated on
the Printed Circuit Board (PCB) within the footprint of the package
corresponding to the exposed metal pad or exposed heat slug on the
package, as shown in Figure 7. The solderable area on the PCB, as
defined by the solder mask, should be at least the same size/shape
as the exposed pad/slug area on the package to maximize the
thermal/electrical performance. Sufficient clearance should be
designed on the PCB between the outer edges of the land pattern
and the inner edges of pad pattern for the leads to avoid any shorts.
and dependent upon the package power dissipation as well as
electrical conductivity requirements. Thus, thermal and electrical
analysis and/or testing are recommended to determine the minimum
number needed. Maximum thermal and electrical performance is
achieved when an array of vias is incorporated in the land pattern. It
is recommended to use as many vias connected to ground as
possible. It is also recommended that the via diameter should be 12
to 13mils (0.30 to 0.33mm) with 1oz copper via barrel plating. This is
desirable to avoid any solder wicking inside the via during the
soldering process which may result in voids in solder between the
exposed pad/slug and the thermal land. Precautions should be taken
to eliminate any solder voids between the exposed heat slug and the
land pattern. Note: These recommendations are to be used as a
guideline only. For further information, please refer to the Application
Note on the Surface Mount Assembly of Amkor’s Thermally/
Electrically Enhance Leadframe Base Package, Amkor Technology.
While the land pattern on the PCB provides a means of heat transfer
and electrical grounding from the package to the board through a
solder joint, thermal vias are necessary to effectively conduct from
the surface of the PCB to the ground plane(s). The land pattern must
be connected to ground through these vias. The vias act as “heat
pipes”. The number of vias (i.e. “heat pipes”) are application specific
PIN
PIN PAD
SOLDER
EXPOSED HEAT SLUG
GROUND PLANE
THERMAL VIA
SOLDER
LAND PATTERN
(GROUND PAD)
PIN
PIN PAD
Figure 7. P.C. Assembly for Exposed Pad Thermal Release Path – Side View (drawing not to scale)
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
17
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Application Schematic
Figure 8 shows a schematic example of using an ICS8430S07I. The
crystal inputs are parallel resonant crystal with load capacitor
CL=18pF. The frequency fine tuning capacitors C1 and C2 are
optional. The tuning capacitor value can be slightly adjusted to
optimize the frequency accuracy. This schematic example shows
hardwired logic control input handling. The logic inputs can also be
driven by 3.3V LVCMOS drivers. It is recommended to have one
bypass capacitor per power pin. In general, the bypass capacitor
values are ranged from 0.01uF to 0.1uF. Each bypass capacitor
should be located as close as possible to the power pin. The low pass
filter R6, C3 and C4 for clean analog supply should also be located
as close to the VDDA pin as possible. Only two examples of LVPECL
termination and one example of LVCMOS termination are shown in
this schematic. Additional examples of LVPECL terminations and
LVCMOS terminations can be found in the LVPECL Termination and
LVCMOS Termination Application Notes.
Figure 8. ICS8430S07I Schematic Example
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
18
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Power Considerations
This section provides information on power dissipation and junction temperature for the ICS8430S07I.
Equations and example calculations are also provided.
1.
Power Dissipation.
The total power dissipation for the ICS8430S07I is the sum of the core power plus the analog power plus the power dissipated in the load(s).
The following is the power dissipation for VDD = 3.3V + 5% = 3.465V, which gives worst case results.
Core and LVPECL Output Power Dissipation
•
Power (core)_MAX = VDD_MAX * (IEE_MAX + IDDA + IDDO) = 3.465V * (170mA + 20mA + 25mA) = 744.98mW
•
Power (output)_MAX = 30mW/Loaded Output Pair
LVCMOS Output Power Dissipation
•
Output Impedance ROUT Power Dissipation due to Loading 50Ω to VDDO/2
Output Current IOUT = VDDO_MAX / [2 * (50Ω + ROUT)] = 3.465V / [2 * (50Ω + 15Ω)] = 26.7mA
•
Power Dissipation on the ROUT per LVCMOS output
Power (ROUT) = ROUT * (IOUT)2 = 15Ω * (26.7mA)2 = 10.7mW per output
•
Total Power Dissipation on the ROUT
Total Power (ROUT) = 10.7mW * 6 = 64.2mW
•
Dynamic Power Dissipation at 25MHz
Power (25MHz) = CPD * Frequency * (VDDO)2 = 4pF * 25MHz * (3.465V)2 = 1.5mW per output
Total Power (25MHz) = 1.5mW * 3 = 4.5mW
•
Dynamic Power Dissipation at 133MHz
Power (133MHz) = CPD * Frequency * (VDDO)2 = 4pF * 133MHz * (3.465V)2 = 8mW per output
Total Power (133MHz) = 8mW * 3 = 24mW
Total Power Dissipation
•
Total Power
= Power (core) + Power (LVPECL output) + Total Power (ROUT) + Total Power (25MHz) + Total Power (125MHz)
= 745mW + 30mW + 64.2mW + 4.5mW + 24mW
= 867.7mW
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
19
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad directly affects the reliability of the device. The
maximum recommended junction temperature for HiPerClockS devices is 125°C. Limiting the internal transistor junction temperature, Tj, to
125°C ensures that the bond wire and bond pad temperature remains below 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θJA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming no air flow and
a multi-layer board, the appropriate value is 39.5°C/W per Table 7 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.868W * 39.5°C/W = 119.2°C. This is below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow and the type of
board.
Table 7. Thermal Resistance θJA for 32 Lead VFQFN, Forced Convection
θJA Vs. Air Flow
Meters per Second
Multi-Layer PCB, JEDEC Standard Test Boards
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
0
1
2.5
39.5°C/W
34.5°C/W
31.0°C/W
20
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
3. Calculations and Equations.
The purpose of this section is to calculate the power dissipation for the LVPECL output pair.
LVPECL output driver circuit and termination are shown in Figure 9.
VCC
Q1
VOUT
RL
50Ω
VCC - 2V
Figure 9. LVPECL Driver Circuit and Termination
To calculate worst case power dissipation into the load, use the following equations which assume a 50Ω load, and a termination voltage of
VDD – 2V.
•
For logic high, VOUT = VOH_MAX = VDD_MAX – 0.9V
(VDD_MAX – VOH_MAX) = 0.9V
•
For logic low, VOUT = VOL_MAX = VDD_MAX – 1.7V
(VDD_MAX – VOL_MAX) = 1.7V
Pd_H is power dissipation when the output drives high.
Pd_L is the power dissipation when the output drives low.
Pd_H = [(VOH_MAX – (VDD_MAX – 2V))/RL] * (VDD_MAX – VOH_MAX) = [(2V – (VDD_MAX – VOH_MAX))/RL] * (VDD_MAX – VOH_MAX) =
[(2V – 0.9V)/50Ω] * 0.9V = 19.8mW
Pd_L = [(VOL_MAX – (VDD_MAX – 2V))/RL] * (VDD_MAX – VOL_MAX) = [(2V – (VDD_MAX – VOL_MAX))/RL] * (VDD_MAX – VOL_MAX) =
[(2V – 1.7V)/50Ω] * 1.7V = 10.2mW
Total Power Dissipation per output pair = Pd_H + Pd_L = 30mW
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
21
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Reliability Information
Table 8. θJA vs. Air Flow Table for a 32 Lead VFQFN
θJA vs. Air Flow
Meters per Second
Multi-Layer PCB, JEDEC Standard Test Boards
0
1
2.5
39.5°C/W
34.5°C/W
31.0°C/W
Transistor Count
The transistor count for ICS8430S07I is: 10,871
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
22
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Package Outline and Package Dimensions
Package Outline - K Suffix for 32 Lead VFQFN
(Ref.)
S eating Plan e
N &N
Even
(N -1)x e
(R ef.)
A1
Ind ex Area
A3
N
To p View
Anvil
Anvil
Singulation
Singula tion
or
OR
Sawn
Singulation
L
N
e (Ty p.)
2 If N & N
1
are Even
2
E2
(N -1)x e
(Re f.)
E2
2
b
A
(Ref.)
D
e
N &N
Odd
Chamfer 4x
0.6 x 0.6 max
OPTIONAL
0. 08
Th er mal
Ba se
D2
2
C
D2
C
Bottom View w/Type A ID
Bottom View w/Type B ID
Bottom View w/Type C ID
BB
4
CHAMFER
4
N N-1
There are 3 methods of indicating pin 1 corner
at the back of the VFQFN package are:
1. Type A: Chamfer on the paddle (near pin 1)
2. Type B: Dummy pad between pin 1 and N.
3. Type C: Mouse bite on the paddle (near pin 1)
2
1
2
1
CC
2
1
4
N N-1
DD
4
RADIUS
4
N N-1
AA
4
NOTE: The following package mechanical drawing is a generic
drawing that applies to any pin count VFQFN package. This drawing
is not intended to convey the actual pin count or pin layout of this
device. The pin count and pinout are shown on the front page. The
package dimensions are in Table 9.
Table 9. Package Dimensions
JEDEC Variation: VHHD-2/-4
All Dimensions in Millimeters
Symbol
Minimum
Nominal
Maximum
N
32
A
0.80
1.00
A1
0
0.05
A3
0.25 Ref.
b
0.18
0.25
0.30
8
ND & NE
D&E
5.00 Basic
D2 & E2
3.0
3.3
e
0.50 Basic
L
0.30
0.40
0.50
Reference Document: JEDEC Publication 95, MO-220
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
23
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Ordering Information
Table 10. Ordering Information
Part/Order Number
8430S07AKILF
8430S07AKILFT
Marking
ICS30S07AIL
ICS30S07AIL
Package
“Lead-Free” 32 Lead VFQFN
“Lead-Free” 32 Lead VFQFN
Shipping Packaging
Tray
2500 Tape & Reel
Temperature
-40°C to 85°C
-40°C to 85°C
NOTE: Parts that are ordered with an "LF" suffix to the part number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology (IDT) assumes no responsibility for either its use or for the
infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal
commercial and industrial applications. Any other applications, such as those requiring high reliability or other extraordinary environmental requirements are not recommended without
additional processing by IDT. IDT reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support
devices or critical medical instruments.
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
24
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
CLOCK GENERATOR FOR CAVIUM PROCESSORS
Revision History Sheet
Rev
A
Table
Page
23
Description of Change
Date
Package Outline & Dimensions - added pin 1 indicator in package drawing.
ICS8430S07AKI REVISION A SEPTEMBER 3, 2009
25
9/3/09
©2009 Integrated Device Technology, Inc.
ICS8430S07I Data Sheet
6024 Silver Creek Valley Road
San Jose, California 95138
CLOCK GENERATOR FOR CAVIUM PROCESSORS
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800-345-7015 (inside USA)
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Fax: 408-284-2775
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[email protected]
+480-763-2056
DISCLAIMER Integrated Device Technology, Inc. (IDT) and its subsidiaries reserve the right to modify the products and/or specifications described herein at any time and at IDT’s sole discretion. All information in this document,
including descriptions of product features and performance, is subject to change without notice. Performance specifications and the operating parameters of the described products are determined in the independent state and are not
guaranteed to perform the same way when installed in customer products. The information contained herein is provided without representation or warranty of any kind, whether express or implied, including, but not limited to, the
suitability of IDT’s products for any particular purpose, an implied warranty of merchantability, or non-infringement of the intellectual property rights of others. This document is presented only as a guide and does not convey any
license under intellectual property rights of IDT or any third parties.
IDT’s products are not intended for use in life support systems or similar devices where the failure or malfunction of an IDT product can be reasonably expected to significantly affect the health or safety of users. Anyone using an IDT
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Copyright 2009. All rights reserved.