GS8673EQ18/36BK-725S/625S/550S 72Mb SigmaQuad-IIIe™ Burst of 2 ECCRAM™ 260 Pin BGA Commercial Temp Industrial Temp Up to 725 MHz 1.35V VDD 1.2V or 1.35V or 1.5V VDDQ Features Clocking and Addressing Schemes • For use with GSI SRAM Port IP • 2Mb x 36 and 4Mb x 18 organizations available • 725 MHz maximum operating frequency • 1.45 BT/s peak transaction rate (in billions per second) • 104 Gb/s peak data bandwidth (in x36 devices) • Separate I/O DDR Data Buses • Non-multiplexed DDR Address Bus • Two operations - Read and Write - per clock cycle • Burst of 2 Read and Write operations • 3 cycle Read Latency • On-chip ECC with virtually zero SER • 1.35V core voltage • 1.2V or 1.35V or 1.5V I/O interface (HSTL or SSTL) • Configurable ODT (on-die termination) • ZQ pin for programmable driver impedance • ZT pin for programmable ODT impedance • IEEE 1149.1 JTAG-compliant Boundary Scan • 260 pin, 14 mm x 22 mm, 1 mm ball pitch BGA package –K: 5/6 RoHS-compliant package –GK: 6/6 RoHS-compliant package The GS8673EQ18/36BK SigmaQuad-IIIe ECCRAMs are synchronous devices. They employ three pairs of positive and negative input clocks; one pair of master clocks, CK and CK, and two pairs of write data clocks, KD[1:0] and KD[1:0]. All six input clocks are single-ended; that is, each is received by a dedicated input buffer. CK and CK are used to latch address and control inputs, and to control all output timing. KD[1:0] and KD[1:0] are used solely to latch data inputs. Each internal read and write operation in a SigmaQuad-IIIe B2 ECCRAM is two times wider than the device I/O bus. An input data bus de-multiplexer is used to accumulate incoming data before it is simultaneously written to the memory array. An output data multiplexer is used to capture the data produced from a single memory array read and then route it to the appropriate output drivers as needed. Therefore, the address field of a SigmaQuad-IIIe B2 ECCRAM is always one address pin less than the advertised index depth (e.g. the 4M x 18 has 2M addressable index). On-Chip ECC SigmaQuad-IIIe™ Family Overview SigmaQuad-IIIe ECCRAMs are the Separate I/O half of the SigmaQuad-IIIe/SigmaDDR-IIIe family of high performance ECCRAMs. Although very similar to GSI's second generation of networking SRAMs (the SigmaQuad-II/SigmaDDR-II family), these third generation devices offer several new features that help enable significantly higher performance. GSI's ECCRAMs implement an ECC algorithm that detects and corrects all single-bit memory errors, including those induced by SER events such as cosmic rays, alpha particles, etc. The resulting Soft Error Rate of these devices is anticipated to be <0.002 FITs/Mb — a 5-order-of-magnitude improvement over comparable SRAMs with no on-chip ECC, which typically have an SER of 200 FITs/Mb or more. All quoted SER values are at sea level in New York City. Parameter Synopsis Speed Grade Max Operating Frequency Read Latency VDD -725S 725 MHz 3 cycles 1.3V to 1.4V -625S 625 MHz 3 cycles 1.3V to 1.4V -550S 550 MHz 3 cycles 1.3V to 1.4V Rev: 1.03 6/2014 1/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S 4M x 18 (Top View) 6 7 8 1 2 3 4 5 9 10 11 12 13 A VDD VDDQ VDD VDDQ MCL MCH (CFG) MCL ZQ PZT1 VDDQ VDD VDDQ VDD B VSS NUO VSS NUI MVQ MCL (B4M) NC (RSVD) MCH (SIOM) PZT0 D0 VSS Q0 VSS C Q17 VDDQ D17 VDDQ VSS SA VDD SA VSS VDDQ NUI VDDQ NUO D VSS NUO VSS NUI SA VDDQ NC (288 Mb) VDDQ NC (144 Mb) D1 VSS Q1 VSS E Q16 VDDQ D16 VDD VSS SA VSS SA VSS VDD NUI VDDQ NUO F VSS NUO VSS NUI SA VDD VDDQ VDD SA D2 VSS Q2 VSS G Q15 NUO D15 NUI VSS SA MZT1 SA VSS D3 NUI Q3 NUO H Q14 VDDQ D14 VDDQ SA VDDQ W VDDQ SA VDDQ NUI VDDQ NUO J VSS NUO VSS NUI VSS SA VSS SA VSS D4 VSS Q4 VSS K CQ1 VDDQ VREF VDD KD1 VDD CK VDD KD0 VDD VREF VDDQ CQ0 L CQ1 VSS QVLD1 Vss KD1 VDDQ CK VDDQ KD0 VSS QVLD0 VSS CQ0 M VSS Q13 VSS D13 VSS SA VSS SA VSS NUI VSS NUO VSS N NUO VDDQ NUI VDDQ MCL VDDQ R VDDQ MCH VDDQ D5 VDDQ Q5 P NUO Q12 NUI D12 VSS SA MZT0 SA VSS NUI D6 NUO Q6 R VSS Q11 VSS D11 MCH VDD VDDQ VDD RST NUI VSS NUO VSS T NUO VDDQ NUI VDD VSS SA VSS SA VSS VDD D7 VDDQ Q7 U VSS Q10 VSS D10 NUI VDDQ MCL VDDQ NUI NUI VSS NUO VSS V NUO VDDQ NUI VDDQ VSS SA (x18) VDD SA (B2) VSS VDDQ D8 VDDQ Q8 W VSS Q9 VSS D9 TCK MCH NC (RSVD) MCL TMS NUI VSS NUO VSS Y VDD VDDQ VDD VDDQ TDO ZT MCH MCL TDI VDDQ VDD VDDQ VDD Notes: 1. Pins 5A, 5N, 7A, 7U, 8W, and 8Y must be tied Low in this device. 2. Pins 5R, 6W, 7Y, and 9N must be tied High in this device. 3. Pins 5U and 9U are unused in this device. They must be left unconnected or driven Low. 4. Pin 6A is defined as mode pin CFG in the pinout standard. It must be tied High in this device to select x18 configuration. 5. Pin 8B is defined as mode pin SIOM in the pinout standard. It must be tied High in this device to select Separate I/O configuration. 6. Pin 6B is defined as mode pin B4M in the pinout standard. It must be tied Low in this device to select Burst-of-2 configuration. 7. Pin 6V is defined as address pin SA for x18 devices. It is used in this device. 8. Pin 8V is defined as address pin SA for B2 devices. It is used in this device. 9. Pin 9D is reserved as address pin SA for 144 Mb devices. It is a true no connect in this device. 10. Pin 7D is reserved as address pin SA for 288 Mb devices. It is a true no connect in this device. Rev: 1.03 6/2014 2/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S 2M x 36 (Top View) 6 7 8 1 2 3 4 5 9 10 11 12 13 A VDD VDDQ VDD VDDQ MCL MCL (CFG) MCL ZQ PZT1 VDDQ VDD VDDQ VDD B VSS Q35 VSS D35 MVQ MCL (B4M) NC (RSVD) MCH (SIOM) PZT0 D0 VSS Q0 VSS C Q26 VDDQ D26 VDDQ VSS SA VDD SA VSS VDDQ D9 VDDQ Q9 D VSS Q34 VSS D34 SA VDDQ NC (288 Mb) VDDQ NC (144 Mb) D1 VSS Q1 VSS E Q25 VDDQ D25 VDD VSS SA VSS SA VSS VDD D10 VDDQ Q10 F VSS Q33 VSS D33 SA VDD VDDQ VDD SA D2 VSS Q2 VSS G Q24 Q32 D24 D32 VSS SA MZT1 SA VSS D3 D11 Q3 Q11 H Q23 VDDQ D23 VDDQ SA VDDQ W VDDQ SA VDDQ D12 VDDQ Q12 J VSS Q31 VSS D31 VSS SA VSS SA VSS D4 VSS Q4 VSS K CQ1 VDDQ VREF VDD KD1 VDD CK VDD KD0 VDD VREF VDDQ CQ0 L CQ1 VSS QVLD1 VSS KD1 VDDQ CK VDDQ KD0 VSS QVLD0 VSS CQ0 M VSS Q22 VSS D22 VSS SA VSS SA VSS D13 VSS Q13 VSS N Q30 VDDQ D30 VDDQ MCL VDDQ R VDDQ MCH VDDQ D5 VDDQ Q5 P Q29 Q21 D29 D21 VSS SA MZT0 SA VSS D14 D6 Q14 Q6 R VSS Q20 VSS D20 MCH VDD VDDQ VDD RST D15 VSS Q15 VSS T Q28 VDDQ D28 VDD VSS SA VSS SA VSS VDD D7 VDDQ Q7 U VSS Q19 VSS D19 NUI VDDQ MCL VDDQ NUI D16 VSS Q16 VSS V Q27 VDDQ D27 VDDQ VSS NUI (x18) VDD SA (B2) VSS VDDQ D8 VDDQ Q8 W VSS Q18 VSS D18 TCK MCH NC (RSVD) MCL TMS D17 VSS Q17 VSS Y VDD VDDQ VDD VDDQ TDO ZT MCH MCL TDI VDDQ VDD VDDQ VDD Notes: 1. Pins 5A, 5N, 7A, 7U, 8W, and 8Y must be tied Low in this device. 2. Pins 5R, 6W, 7Y, and 9N must be tied High in this device. 3. Pins 5U and 9U are unused in this device. They must be left unconnected or driven Low. 4. Pin 6A is defined as mode pin CFG in the pinout standard. It must be tied Low in this device to select x36 configuration. 5. Pin 8B is defined as mode pin SIOM in the pinout standard. It must be tied High in this device to select Separate I/O configuration. 6. Pin 6B is defined as mode pin B4M in the pinout standard. It must be tied Low in this device to select Burst-of-2 configuration. 7. Pin 6V is defined as address pin SA for x18 devices. It is unused in this device, and must be left unconnected or driven Low. 8. Pin 8V is defined as address pin SA for B2 devices. It is used in this device. 9. Pin 9D is reserved as address pin SA for 144 Mb devices. It is a true no connect in this device. 10. Pin 7D is reserved as address pin SA for 288 Mb devices. It is a true no connect in this device. Rev: 1.03 6/2014 3/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Pin Description Symbol Description Type Address — Read Address is registered on ↑CK and Write Address is registered on ↑CK. Input D[35:0] Write Data — Registered on ↑KD and ↑KD during Write operations. D[17:0] - x18 and x36. D[35:18] - x36 only. Input Q[35:0] Read Data — Aligned with ↑CQ and ↑CQ during Read operations. Q[17:0] - x18 and x36. Q[35:18] - x36 only. Output QVLD[1:0] Read Data Valid—Driven high one half cycle before valid read data. Output SA CK, CK Primary Input Clocks — Dual single-ended. Used for latching address and control inputs, for internal timing control, and for output timing control. Input KD[1:0], KD[1:0] Write Data Input Clocks — Dual single-ended. Used for latching write data inputs. KD0, KD0: latch D[17:0] in x36, D[8:0] in x18. KD1, KD1: latch D[35:18] in x36, D[17:9] in x18. Input CQ[1:0], CQ[1:0] Echo Clocks — Free-running output (echo) clocks, tightly aligned with read data outputs. Facilitate source-synchronous operation. CQ0, CQ0: align with Q[17:0] in x36, Q[8:0] in x18. CQ1, CQ1: align with Q[35:18] in x36, Q[17:9] in x18. Output R Read Enable — Registered on ↑CK. R = 0 initiates a Read operation. Input W Write Enable — Registered on ↑CK. W = 0 initiates a Write operation. Input RST Reset — Holds the device inactive and resets the device to its initial power-on state when asserted High. Weakly pulled Low internally. Input ZQ Driver Impedance Control Resistor Input — Must be connected to VSS through an external resistor RQ to program driver impedance. Input ZT ODT Impedance Control Resistor Input — Must be connected to VSS through an external resistor RT to program ODT impedance. Input MZT[1:0] ODT Mode Select — Set the ODT state globally for all input groups. Must be tied High or Low. MZT[1:0] = 00: disables ODT on all input groups, regardless of PZT[1:0]. MZT[1:0] = 01: enables strong ODT on select input groups, as specified by PZT[1:0]. MZT[1:0] = 10: enables weak ODT on select input groups, as specified by PZT[1:0]. MZT[1:0] = 11: reserved. Input PZT[1:0] ODT Configuration Select — Set the ODT state for various combinations of input groups when MZT[1:0] = 01 or 10. Must be tied High or Low. PZT[1:0] = 00: enables ODT on write data only. PZT[1:0] = 01: enables ODT on write data and input clocks. PZT[1:0] = 10: enables ODT on write data, address, and control. PZT[1:0] = 11: enables ODT on write data, input clocks, address, and control. Input Rev: 1.03 6/2014 4/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Pin Description (Continued) Symbol Description Type MVQ I/O Voltage Select — Indicates what voltage is supplied to the VDDQ pins. Must be tied High or Low. MVQ = 0: Configure for 1.2V or 1.35V nominal VDDQ. MVQ = 1: Configure for 1.5V nominal VDDQ. VDD Core Power Supply — 1.35V nominal core supply voltage. — VDDQ I/O Power Supply — 1.2V or 1.35V or 1.5V nominal I/O supply voltage. Configurable via MVQ pin. — VREF Input Reference Voltage — Input buffer reference voltage. — VSS Ground — TCK JTAG Clock Input TMS JTAG Mode Select — Weakly pulled High internally. Input TDI JTAG Data Input — Weakly pulled High internally. Input TDO JTAG Data Output MCH Must Connect High — May be tied to VDDQ directly or via a 1kΩ resistor. Input MCL Must Connect Low — May be tied to VSS directly or via a 1kΩ resistor. Input NC No Connect — There is no internal chip connection to these pins. They may be left unconnected, or tied High or Low. NUI Not Used Input — There is an internal chip connection to these input pins, but they are unused by the device. They are pulled Low internally. They may be left unconnected or tied/driven Low. They should not be tied/driven High. Input NUO Not Used Output — There is an internal chip connection to these output pins, but they are unused by the device. The drivers are tri-stated internally. They should be left unconnected. Output Rev: 1.03 6/2014 Input Output 5/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. — © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Power-Up and Reset Requirements For reliability purposes, power supplies must power up simultaneously, or in the following sequence: VSS, VDD, VDDQ, VREF and inputs. Power supplies must power down simultaneously, or in the reverse sequence. After power supplies power up, the following start-up sequence must be followed. Step 1 (Recommended, but not required): Assert RST High for at least 1ms. While RST is asserted high: • Read and Write operations are ignored. Note: If possible, RST should be asserted High before input clocks (begin toggling, and remain asserted High until input clocks are stable and toggling within specification, in order to prevent unstable, out-of-spec input clocks from causing trouble in the SRAM. Step 2: Begin toggling input clocks. After input clocks begin toggling, but not necessarily within specification: • CQ, CQ begin toggling, but not necessarily within specification. Step 3: Wait until input clocks are stable and toggling within specification. Step 4: De-assert RST Low (if asserted High). Step 5: Wait at least 160K (163,840) cycles for driver and ODT impedances to calibrate. After the impedances have calibrated: • CQ, CQ begin toggling within specification. Step 6: Begin initiating Read and Write operations. Reset Usage Although not generally recommended, RST may be asserted High at any time after completion of the initial power-up sequence described above, to reset the SRAM control logic to its initial power-on state. However, whenever RST is subsequently de-asserted Low (as in Step 4 in the power up sequence), at least 160K NOP cycles must be initiated (as in Step 5 in the power-up sequence) before Read and Write operations are initiated. Note: Memory array content may be perturbed/corrupted when RST is asserted High. Rev: 1.03 6/2014 6/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Error Correction (ECC) These devices implement a single-bit error detection and correction algorithm (specifically, a Hamming Code) on each DDR data word (comprising two 9-bit data bytes) transmitted on each 9-bit data bus (i.e., transmitted on D/Q[8:0], D/Q[17:9], D/Q[26:18], and D/Q[35:27]). To accomplish this, 5 ECC parity bits (invisible to the user) are utilized per every 18 data bits (visible to the user). The ECC algorithm neither corrects nor detects multi-bit errors. However, ECCRAMs are architected in such a way that a single SER event very rarely causes a multi-bit error across any given “transmitted data unit”, where a “transmitted data unit” represents the data transmitted as the result of a single read or write operation to a particular address. The extreme rarity of multi-bit errors results in the SER mentioned previously (i.e., <0.002 FITs/Mb (measured at sea level)). Not only does the on-chip ECC significantly improve SER performance, but it also frees up the entire memory array for data storage. Frequently, SRAM applications allocate 1/9th of the memory array (i.e., one “error bit” per eight “data bits”) for error detection (either simple parity error detection, or system-level ECC error detection and correction). Such error-bit allocation is unnecessary with ECCRAMs; the entire memory array can be utilized for data storage, effectively providing 12.5% greater storage capacity compared to SRAMs of the same density not equipped with on-chip ECC. Input Timing These devices utilize three pairs of positive and negative input clocks, CK & CK and KD[1:0] & KD[1:0], to latch the various synchronous inputs. Specifically: ↑CK and ↑CK latch all address (SA) inputs. ↑CK latches all control (R, W) inputs. ↑KD[1:0] and ↑KD[1:0] latch particular write data (D) inputs, as follows: • ↑KD0 and ↑KD0 latch D[17:0] in x36, and D[8:0] in x18. • ↑KD1 and ↑KD1 latch D[35:18] in x36, and D[17:9] in x18. Output Timing These devices provide two pairs of positive and negative output clocks (aka “echo clocks”), CQ[1:0] & CQ[1:0], whose timing is tightly aligned with read data in order to enable reliable source-synchronous data transmission. Output timing is generated by ↑CK and ↑CK, as follows: • ↑CK generates ↑CQ[1:0], ↓CQ[1:0], Q1 active, and Q2 inactive. • . ↑CK generates ↑CQ[1:0], ↓CQ[1:0], Q1 inactive, Q2 active, and QVLD active/inactive. Note: Q1 and Q2 indicate the first and second pieces of read data transferred in any given clock cycle during Read operations. ↑CQ[1:0] and ↑CQ[1:0] align with particular read data (Q) and read data valid (QVLD) outputs, as follows: • ↑CQ0 and ↑CQ0 align with Q[17:0], QVLD0 in x36, and with Q[8:0], QVLD0 in x18. • ↑CQ1 and ↑CQ1 align with Q[35:18], QLVD1 in x36, and with Q[17:9], QVLD1 in x18. Rev: 1.03 6/2014 7/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Driver Impedance Control Programmable Driver Impedance is implemented on the following output signals: • CQ, CQ, Q, QVLD. Driver impedance is programmed by connecting an external resistor RQ between the ZQ pin and VSS. Driver impedance is set to the programmed value within 160K cycles after input clocks are operating within specification and RST is de-asserted Low. It is updated periodically thereafter to compensate for temperature and voltage fluctuations in the system. Output Signal Pull-Down Impedance (ROUTL) Pull-Up Impedance (ROUTH) CQ, CQ, Q, QVLD RQ*0.2 ± 15% RQ*0.2 ± 15% Notes: 1. ROUTL and ROUTH apply when 175Ω ≤ RQ ≤ 225Ω.. 2. The mismatch between ROUTL and ROUTH is less than 10%, guaranteed by design. ODT Impedance Control Programmable ODT Impedance is implemented on the following input signals: • CK, CK, KD, KD, SA, R, W, D. ODT impedance is programmed by connecting an external resistor RT between the ZT pin and VSS. ODT impedance is set to the programmed value within 160K cycles after input clocks are operating within specification and RST is de-asserted Low. It is updated periodically thereafter to compensate for temperature and voltage fluctuations in the system Input Signal CK, CK, KD, KD PZT[1:0] MZT[1:0] Pull-Down Impedance (RINL) Pull-Up Impedance (RINH) X0 XX disabled disabled 01 RT ± 15% RT ± 15% 10 RT*2 ± 20% RT*2 ± 20% XX disabled disabled 01 RT ± 15% RT ± 15% 10 RT*2 ± 20% RT*2 ± 20% 01 RT ± 15% RT ± 15% 10 RT*2 ± 20% RT*2 ± 20% X1 0X SA, R, W D 1X XX Notes: 1. When MZT[1:0] = 00, ODT is disabled on all inputs. MZT[1:0] = 11 is reserved for future use. 2. RINL and RINH apply when 105Ω ≤ RT ≤ 135Ω. 3. The mismatch between RINL and RINH is less than 10%, guaranteed by design. 4. All ODT is disabled during JTAG EXTEST and SAMPLE-Z instructions. Note: When ODT impedance is enabled on a particular input, that input should always be driven High or Low; it should never be tri-stated (i.e., in a High- Z state). If the input is tri-stated, the ODT will pull the signal to VDDQ / 2 (i.e., to the switch point of the diff-amp receiver), which could cause the receiver to enter a meta-stable state and consume more power than it normally would. This could result in the device’s operating currents being higher. Rev: 1.03 6/2014 8/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Truth Table SA R W Current Operation D Q ↑CK (tn) ↑CK (tn+½) ↑CK (tn) ↑CK (tn) (tn) ↑KD (tn) ↑KD (tn+½) ↑CQ (tn+3) ↑CQ (tn+3½) X X 1 1 NOP X X Hi-Z / 0 X V 1 0 Write Only D1 D2 Hi-Z / 0 V X 0 1 Read Only X X Q1 Q2 V V 0 0 Read + Write D1 D2 Q1 Q2 Notes: 1. 1 = High; 0 = Low; V = Valid (High or Low); X = Don’t Care. 2. D1 and D2 indicate the first and second pieces of write data transferred during Write operations. 3. Q1 and Q2 indicate the first and second pieces of read data transferred during Read operations. 4. When D ODT is disabled (MZT[1:0] = 00), Q pins are tri-stated for one cycle in response to NOP and Write Only commands, 3 cycles after the command is sampled. 5. When D ODT is enabled (MZT[1:0] = 01 or 10), Q pins are driven Low for one cycle in response to NOP and Write Only commands, 3 cycles after the command is sampled. Rev: 1.03 6/2014 9/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Electrical Specifications Absolute Maximum Ratings Parameter Symbol Rating Units Core Supply Voltage VDD -0.3 to +1.6 V I/O Supply Voltage when MVQ = 0 VDDQ -0.3 to VDD V I/O Supply Voltage when MVQ = 1 VDDQ -0.3 to VDD + 0.3 V Input Voltage when MVQ = 0 VIN -0.3 to VDDQ + 0.3 (1.7 max) V Input Voltage when MVQ = 1 VIN -0.3 to VDDQ + 0.3 (2.0 max) V Maximum Junction Temperature TJ 125 °C Storage Temperature TSTG -55 to 125 °C Note: Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended Operating Conditions. Exposure to conditions exceeding the Recommended Operating Conditions, for an extended period of time, may affect reliability of this component. Recommended Operating Conditions Parameter Symbol Min Typ Max Units Core Supply Voltage VDD 1.3 1.35 1.4 V I/O Supply Voltage - 1.2V nominal when MVQ = 0 VDDQ 1.15 1.2 1.25 V I/O Supply Voltage - 1.35V nominal when MVQ = 0 VDDQ 1.3 1.35 VDD V I/O Supply Voltage - 1.5V nominal when MVQ = 1 VDDQ 1.4 1.5 1.6 V Commercial Junction Temperature TJC 0 — 85 °C Industrial Junction Temperature TJI -40 — 100 °C Note: For reliability purposes, power supplies must power up simultaneously, or in the following sequence: VSS, VDD, VDDQ, VREF, and Inputs. Power supplies must power down simultaneously, or in the reverse sequence. Thermal Impedance Package θ JA (C°/W) Airflow = 0 m/s θ JA (C°/W) Airflow = 1 m/s θ JA (C°/W) Airflow = 2 m/s θ JB (C°/W) θ JC (C°/W) FBGA 15.5 13.1 12.1 4.4 0.2 Rev: 1.03 6/2014 10/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S I/O Capacitance Parameter Symbol Min Max Units Notes Input Capacitance CIN — 5.0 pF 1, 3 Output Capacitance COUT — 5.5 pF 2, 3 Parameter Symbol Min Max Units Notes DC Input Reference Voltage VREFdc 0.48 * VDDQ 0.52 * VDDQ V — DC Input High Voltage VIH1dc VREF + 0.08 VDDQ + 0.15 V 4 DC Input Low Voltage VIL1dc –0.15 VREF – 0.08 V 4 DC Input High Voltage VIH2dc 0.75 * VDDQ VDDQ + 0.15 V 5 DC Input Low Voltage VIL2dc –0.15 0.25 * VDDQ V 5 AC Input Reference Voltage VREFac 0.47 * VDDQ 0.53 * VDDQ V 1 AC Input High Voltage VIH1ac VREF + 0.15 VDDQ + 0.25 V 2, 3, 4 AC Input Low Voltage VIL1ac –0.25 VREF – 0.15 V 2, 3, 4 AC Input High Voltage VIH2ac VDDQ – 0.2 VDDQ + 0.25 V 2, 5 AC Input Low Voltage VIL2ac – 0.25 0.2 V 2, 5 Notes: 1. VIN = VDDQ/2. 2. VOUT = VDDQ/2. 3. TA = 25°C, f = 1 MHz. Input Electrical Characteristics when MVQ = 0 Notes: 1. VREFac is equal to VREFdc plus noise. 2. VIH max and VIL min apply for pulse widths less than one-quarter of the cycle time. 3. 4. 5. Input rise and fall times must be a minimum of 1 V/ns, and within 10% of each other. Applies to: CK, CK, KD, KD, SA, R, W, D. Applies to: RST, MVQ, MZT, PZT. Rev: 1.03 6/2014 11/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Input Electrical Characteristics when MVQ = 1 Parameter Symbol Min Max Units Notes DC Input Reference Voltage VREFdc 0.47 * VDDQ 0.53 * VDDQ V — DC Input High Voltage VIH1dc VREF + 0.1 VDDQ + 0.15 V 4 DC Input Low Voltage VIL1dc –0.15 VREF – 0.1 V 4 DC Input High Voltage VIH2dc 0.75 * VDDQ VDDQ + 0.15 V 5 DC Input Low Voltage VIL2dc –0.15 0.25 * VDDQ V 5 AC Input Reference Voltage VREFac 0.46 * VDDQ 0.54 * VDDQ V 1 AC Input High Voltage VIH1ac VREF + 0.2 VDDQ + 0.25 V 2, 3, 4 AC Input Low Voltage VIL1ac –0.25 VREF – 0.2 V 2, 3, 4 AC Input High Voltage VIH2ac VDDQ – 0.2 VDDQ + 0.25 V 2, 5 AC Input Low Voltage VIL2ac –0.25 0.2 V 2, 5 Notes: 1. VREFac is equal to VREFdc plus noise. 2. VIH max and VIL min apply for pulse widths less than one-quarter of the cycle time. 3. Input rise and fall times must be a minimum of 1V/ns, and within 10% of each other. 4. Applies to: CK, CK, KD, KD, SA, R, W, D. 5. Applies to: RST, MVQ, MZT, PZT. Output Electrical Characteristics Parameter Symbol Min Max Units Notes DC Output High Voltage VOHdc — VDDQ + 0.15 V 1 DC Output Low Voltage VOLdc -0.15 — V 1 AC Output High Voltage VOHac — VDDQ + 0.25 V 1 AC Output Low Voltage VOLac -0.25 — V 1 Notes: 1. Applies to: CQ, CQ, Q, QVLD. Rev: 1.03 6/2014 12/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Leakage Currents Parameter Symbol Min Max Units Notes ILI1 -2 2 uA 1, 2 ILI2 -20 2 uA 1, 3 ILI3 -2 20 uA 1, 4 ILO -2 2 uA 5, 6 Input Leakage Current Output Leakage Current Notes: 1. VIN = VSS to VDDQ. 2. Applies to: CK, CK, KD, KD, SA, R, W, D when ODT is disabled. Applies to: MVQ, MZT, PZT, TCK. 3. Applies to: TMS, TDI (weakly pulled up). 4. Applies to: RST (weakly pulled down). 5. VOUT = VSS to VDDQ. 6. Applies to: CQ, CQ, Q, QVLD, TDO. Operating Currents Parameter x18 Operating Current x36 Operating Current Symbol IDD IDD Operating Frequency @ 1.3V VDD @ 1.35V VDD @ 1.4V VDD Units 725 MHz 2140 2260 2380 mA 625 MHz 1900 2000 2110 mA 550 MHz 1720 1820 1930 mA 725 MHz 3020 3170 3330 mA 625 MHz 2680 2820 2970 mA 550 MHz 2410 2540 2670 mA Notes: 1. IOUT = 0 mA; VIN = VIH or VIL. 2. Applies at 100% Reads + Writes. Rev: 1.03 6/2014 13/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S AC Test Conditions for 1.2V nominal VDDQ (MVQ = 0) Parameter Symbol Conditions Units Core Supply Voltage VDD 1.3 to 1.4 V I/O Supply Voltage VDDQ 1.15 to 1.25 V Input Reference Voltage VREF 0.6 V Input High Level VIH 0.9 V Input Low Level VIL 0.3 V Input Rise and Fall Time — 2.0 V/ns Input and Output Reference Level — 0.6 V Parameter Symbol Conditions Units Core Supply Voltage VDD 1.3 to 1.4 V I/O Supply Voltage VDDQ 1.4 to 1.6 V Input Reference Voltage VREF 0.75 V Input High Level VIH 1.25 V Input Low Level VIL 0.25 V Input Rise and Fall Time — 2.0 V/ns Input and Output Reference Level — 0.75 V Note: Output Load Conditions RQ = 200Ω. Refer to figure below. AC Test Conditions for 1.5V nominal VDDQ (MVQ = 1) Note: Output Load Conditions RQ = 200Ω. Refer to figure below. AC Test Output Load 50Ω Q, CQ 50Ω VDDQ/2 5 pF Rev: 1.03 6/2014 14/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S AC Timing Specifications Parameter Symbol Min Max Units Notes — ns 1 Input Clock Timing (Met by the IP) Clk Cycle Time (-725) Clk Cycle Time (-625) 1.38 tKHKH 1.6 Clk Cycle Time (-550) 1.8 Clk High Pulse Width tKHKL 0.45 — cycles 1 Clk Low Pulse Width tKLKH 0.45 — cycles 1 Clk High to Clk High tKHKH 0.45 0.55 cycles 2 Clk High to Write Data Clk High tKHKDH -200 200 ps 3 Input Timing (Met by the IP) Input Valid to Clk High tIVKH not specified — ps 4 Clk High to Input Hold tKHIX not specified — ps 4 Input Pulse Width tIPW 200 — ps 5 Output Timing (Accounted for by the IP) Clk High to Data Output Valid / Hold tKHQV/X 1.0 2.5 ns 6 Clk High to Echo Clock High tKHCQH 1.0 2.5 ns 7 Echo Clk High to Echo Clk High tCQHCQH tKHKH (min) - 50 tKHKH (max) + 50 ps 8, 11 Echo Clk High to Echo Clk High tCQHCQH tKHKH (min) - 50 tKHKH (max) + 50 ps 9, 11 Echo Clk High to Data Output Valid / Hold tCQHQV/X -150 150 ps 10, 11 Notes: All parameters are measured from the mid-point of the object signal to the mid-point of the reference signal. 1. Parameters apply to CK, CK, KD, KD. 2. Parameters specify ↑CK → ↑CK and ↑KD → ↑KD requirements. 3. Parameters specify ↑CK → ↑KD and ↑CK → ↑KD requirements. 4. Parameters apply to SA, and are referenced to ↑CK & ↑CK. Parameters apply to R, W, and are referenced to ↑CK. Parameters apply to D, and are referenced to ↑KD & ↑KD. The unspecified setup and hold time requirements for these inputs are met by the IP (via per-pin calibration for the DDR inputs). 5. Parameter applies to SA, R, W, D. 6. Parameters apply to Q and are referenced to ↑CK & ↑CK. 7. Parameters specify ↑CK → ↑CQ and ↑CK → ↑CQ timing. 8. Parameter specifies ↑CQ → ↑CQ timing. tKHKH (min) and tKHKH (max) are the minimum and maximum input delays from ↑CK to ↑CK. 9. Parameter specifies ↑CQ → ↑CQ timing. tKHKH (min) and tKHKH (max) are the minimum and maximum input delays from ↑CK to ↑CK. 10. Parameters apply to Q, QVLD and are referenced to ↑CQ & ↑CQ. 11. Parameters are not tested. They are guaranteed by design, and verified through extensive corner-lot characterization. Rev: 1.03 6/2014 15/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Read and Write Timing Diagram Rd + Wr Rd Only Wr Only Rd + Wr Wr Only Rd Only NOP Rd + Wr Rd + Wr NOP Rd Only KD tKHKH tKHKL tKLKH tKHKH KD tIVKH D D21 D22 tKHKDH D41 D42 tIVKH tKHIX D61 D62 D71 D72 DA1 DA2 tKHIX DC1 DC2 tKHKDH CK tKHKH tKHKL tKLKH tKHKH CK tIVKH SA A1 A2 A3 A4 tIVKH tKHIX A5 A7 A6 A8 A9 AA Q51 Q52 tKHIX AB AD AC tIVKH tKHIX R W tKHQV Q tKHQX Q11 Q12 Q31 Q32 Q81 Q82 QVLD tCQHQX tKHCQH tCQHQV tCQHQX tCQHQX tCQHQV tCQHQV CQ tCQHCQH CQ Rev: 1.03 6/2014 16/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S JTAG Test Mode Description These devices provide a JTAG Test Access Port (TAP) and Boundary Scan interface using a limited set of IEEE std. 1149.1 functions. This test mode is intended to provide a mechanism for testing the interconnect between master (processor, controller, etc.), ECCRAM, other components, and the printed circuit board. In conformance with a subset of IEEE std. 1149.1, these devices contain a TAP Controller and multiple TAP Registers. The TAP Registers consist of one Instruction Register and multiple Data Registers. The TAP consists of the following four signals: Pin Pin Name I/O Description TCK Test Clock I Induces (clocks) TAP Controller state transitions. TMS Test Mode Select I Inputs commands to the TAP Controller. Sampled on the rising edge of TCK. TDI Test Data In I Inputs data serially to the TAP Registers. Sampled on the rising edge of TCK. TDO Test Data Out O Outputs data serially from the TAP Registers. Driven from the falling edge of TCK. Concurrent TAP and Normal ECCRAM Operation According to IEEE std. 1149.1, most public TAP Instructions do not disrupt normal device operation. In these devices, the only exceptions are EXTEST and SAMPLE-Z. See the Tap Registers section for more information. Disabling the TAP When JTAG is not used, TCK should be tied Low to prevent clocking the ECCRAM. TMS and TDI should either be tied High through a pull-up resistor or left unconnected. TDO should be left unconnected. JTAG DC Operating Conditions Parameter Symbol Min Max Units Notes JTAG Input High Voltage VTIH 0.75 * VDDQ VDDQ + 0.15 V 1 JTAG Input Low Voltage VTIL –0.15 0.25 * VDDQ V 1 JTAG Output High Voltage VTOH VDDQ – 0.2 — V 2, 3 JTAG Output Low Voltage VTOL — 0.2 V 2, 4 Notes: 1. Parameters apply to TCK, TMS, and TDI during JTAG Testing. 2. Parameters apply to TDO during JTAG testing. 3. ITOH = –2.0 mA. 4. ITOL = 2.0 mA. Rev: 1.03 6/2014 17/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S JTAG AC Timing Specifications Parameter Symbol Min Max Units TCK Cycle Time tTHTH 50 — ns TCK High Pulse Width tTHTL 20 — ns TCK Low Pulse Width tTLTH 20 — ns TMS Setup Time tMVTH 10 — ns TMS Hold Time tTHMX 10 — ns TDI Setup Time tDVTH 10 — ns TDI Hold Time tTHDX 10 — ns Capture Setup Time (Address, Control, Data, Clock) tCS 10 — ns Capture Hold Time (Address, Control, Data, Clock) tCH 10 — ns TCK Low to TDO Valid tTLQV — 10 ns TCK Low to TDO Hold tTLQX 0 — ns JTAG Timing Diagram tTHTL tTLTH tTHTH TCK tMVTH tTHMX TMS tDVTH tTHDX TDI tTLQV tTLQX TDO Rev: 1.03 6/2014 18/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S TAP Controller The TAP Controller is a 16-state state machine that controls access to the various TAP Registers and executes the operations associated with each TAP Instruction. State transitions are controlled by TMS and occur on the rising edge of TCK. The TAP Controller enters the Test-Logic Reset state in one of two ways: 1. At power up. 2. When a logic 1 is applied to TMS for at least 5 consecutive rising edges of TCK. The TDI input receiver is sampled only when the TAP Controller is in either the Shift-IR state or the Shift-DR state. The TDO output driver is enabled only when the TAP Controller is in either the Shift-IR state or the Shift-DR state. TAP Controller State Diagram 1 Test-Logic Reset 0 0 Run-Test / Idle 1 Select DR-Scan 1 Select IR-Scan 0 0 1 1 Capture-DR Capture-IR 0 0 0 Shift-DR 1 1 Exit1-DR Exit1-IR 0 0 0 Pause-DR 1 0 Exit2-IR Update-DR Rev: 1.03 6/2014 0 19/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. 0 1 1 1 0 Pause-IR 1 Exit2-DR 0 Shift-IR 1 1 1 Update-IR 1 0 © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S TAP Registers TAP Registers are serial shift registers that capture serial input data (from TDI) on the rising edge of TCK, and drive serial output data (to TDO) on the subsequent falling edge of TCK. They are divided into two groups: Instruction Registers (IR), which are manipulated via the IR states in the TAP Controller, and Data Registers (DR), which are manipulated via the DR states in the TAP Controller. Instruction Register (IR - 3 bits) The Instruction Register stores the various TAP Instructions supported by ECCRAM. It is loaded with the IDCODE instruction (logic 001) at power-up, and when the TAP Controller is in the Test-Logic Reset and Capture-IR states. It is inserted between TDI and TDO when the TAP Controller is in the Shift-IR state, at which time it can be loaded with a new instruction. However, newly loaded instructions are not executed until the TAP Controller has reached the Update-IR state. The Instruction Register is 3 bits wide, and is encoded as follows: Code (2:0) 000 001 Instruction Description EXTEST Loads the logic states of all signals composing the ECCRAM I/O ring into the Boundary Scan Register when the TAP Controller is in the Capture-DR state, and inserts the Boundary Scan Register between TDI and TDO when the TAP Controller is in the Shift-DR state. Also transfers the contents of the Boundary Scan Register associated with all output signals (Q, QVLD, CQ, CQ) directly to their corresponding output pins. However, newly loaded Boundary Scan Register contents do not appear at the output pins until the TAP Controller has reached the Update-DR state. Also disables all ODT. See the Boundary Scan Register description for more information. IDCODE Loads a predefined device- and manufacturer-specific identification code into the ID Register when the TAP Controller is in the Capture-DR state, and inserts the ID Register between TDI and TDO when the TAP Controller is in the Shift-DR state. See the ID Register description for more information. Loads the logic states of all signals composing the ECCRAM I/O ring into the Boundary Scan Register when the TAP Controller is in the Capture-DR state, and inserts the Boundary Scan Register between TDI and TDO when the TAP Controller is in the Shift-DR state. Also disables all ODT. Also forces Q output drivers to a High-Z state. See the Boundary Scan Register description for more information. 010 SAMPLE-Z 011 PRIVATE Reserved for manufacturer use only. 100 SAMPLE Loads the logic states of all signals composing the ECCRAM I/O ring into the Boundary Scan Register when the TAP Controller is in the Capture-DR state, and inserts the Boundary Scan Register between TDI and TDO when the TAP Controller is in the Shift-DR state. See the Boundary Scan Register description for more information. 101 PRIVATE Reserved for manufacturer use only. 110 PRIVATE Reserved for manufacturer use only. 111 BYPASS Loads a logic 0 into the Bypass Register when the TAP Controller is in the Capture-DR state, and inserts the Bypass Register between TDI and TDO when the TAP Controller is in the Shift-DR state. See the Bypass Register description for more information. Rev: 1.03 6/2014 20/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Bypass Register (DR - 1 bit) The Bypass Register is one bit wide, and provides the minimum length serial path between TDI and TDO. It is loaded with a logic 0 when the BYPASS instruction has been loaded in the Instruction Register and the TAP Controller is in the Capture-DR state. It is inserted between TDI and TDO when the BYPASS instruction has been loaded into the Instruction Register and the TAP Controller is in the Shift-DR state. ID Register (DR - 32 bits) The ID Register is loaded with a predetermined device- and manufacturer-specific identification code when the IDCODE instruction has been loaded into the Instruction Register and the TAP Controller is in the Capture-DR state. It is inserted between TDI and TDO when the IDCODE instruction has been loaded into the Instruction Register and the TAP Controller is in the Shift-DR state. The ID Register is 32 bits wide, and is encoded as follows: See BSDL Model (31:12) GSI ID (11:1) Start Bit (0) XXXX XXXX XXXX XXXX XXXX 0001 1011 001 1 Bit 0 is the LSB of the ID Register, and Bit 31 is the MSB. When the ID Register is selected, TDI serially shifts data into the MSB, and the LSB serially shifts data out through TDO. Boundary Scan Register (DR - 127 bits) The Boundary Scan Register is equal in length to the number of active signal connections to the ECCRAM (excluding the TAP pins) plus a number of place holder locations reserved for functional and/or density upgrades. It is loaded with the logic states of all signals composing the ECCRAM’s I/O ring when the EXTEST, SAMPLE, or SAMPLE-Z instruction has been loaded into the Instruction Register and the TAP Controller is in the Capture-DR state. It is inserted between TDI and TDO when the EXTEST, SAMPLE, or SAMPLE-Z instruction has been loaded into the Instruction Register and the TAP Controller is in the Shift-DR state. Additionally, the contents of the Boundary Scan Register associated with the ECCRAM outputs (Q, QVLD, CQ, CQ) are driven directly to the corresponding ECCRAM output pins when the EXTEST instruction is selected. However, after the EXTEST instruction has been selected, any new data loaded into Boundary Scan Register when the TAP Controller is in the Shift-DR state does not appear at the output pins until the TAP Controller has reached the Update-DR state. The value captured in the boundary scan register for NU pins is determined by the external pin state while the NC pins are 0 regardless of the external pin state. The value captured in the internal cells is 1. Output Driver State During EXTEST EXTEST allows the Internal Cell (Bit 127) in the Boundary Scan Register to control the state of Q drivers. That is, when Bit 127 = 1, Q drivers are enabled (i.e., driving High or Low), and when Bit 127 = 0, Q drivers are disabled (i.e., forced to High-Z state). See the Boundary Scan Register section for more information. ODT State During EXTEST and SAMPLE-Z ODT on all inputs is disabled during EXTEST and SAMPLE-Z. Rev: 1.03 6/2014 21/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Boundary Scan Register Bit Order Assignment The table below depicts the order in which the bits are arranged in the Boundary Scan Register. Bit 1 is the LSB and Bit 127 is the MSB. When the Boundary Scan Register is selected, TDI serially shifts data into the MSB, and the LSB serially shifts data out through TDO. Bit Pad Bit Pad Bit Pad Bit Pad Bit Pad 1 7L 27 10F 53 10U 79 3V 105 3G 2 7K 28 12F 54 13V 80 1V 106 2F 3 9L 29 11G 55 11V 81 4U 107 4F 4 9K 30 13G 56 12W 82 2U 108 1E 5 8J 31 10G 57 10W 83 3T 109 3E 6 7H 32 12G 58 8V 84 1T 110 2D 7 9H 33 11H 59 9U 85 4R 111 4D 8 7G 34 13H 60 8T 86 2R 112 1C 9 8G 35 10J 61 9R 87 3P 113 3C 10 9F 36 12J 62 8P 88 1P 114 2B 11 8E 37 13K 63 9N 89 4P 115 4B 12 7D 38 13L 64 8M 90 2P 116 6A 13 9D 39 11L 65 6M 91 3N 117 6B 14 8C 40 12M 66 7N 92 1N 118 6C 15 8B 41 10M 67 5N 93 4M 119 5D 16 9B 42 13N 68 7P 94 2M 120 6E 17 7A 43 11N 69 6P 95 3L 121 5F 18 9A 44 12P 70 5R 96 1L 122 6G 19 10B 45 10P 71 6T 97 1K 123 5H 20 12B 46 13P 72 7U 98 2J 124 6J 21 11C 47 11P 73 5U 99 4J 125 5K 22 13C 48 12R 74 6V 100 1H 126 5L 23 10D 49 10R 75 6W 101 3H 127 Internal 24 12D 50 13T 76 7Y 102 2G 25 11E 51 11T 77 4W 103 4G 26 13E 52 12U 78 2W 104 1G Rev: 1.03 6/2014 22/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S 260-Pin BGA Package Drawing (Package K) 0.08 S C 0.08 S C A S B S Ø Ø Ø 0.50~Ø0.70(260x) 13 12 11 10 9 8 7 6 5 4 3 2 1 A B C D E F G H J K L M N P R T U V W Y 19.00 17.40 ± 0.05 22.00 ± 0.05 1.00 PIN #1 CORNER 12.60 ± 0.05 B A 1.00 14.00 ± 0.05 12.00 Rev: 1.03 6/2014 C 0.15 0.05 SEATING PLANE 0.40~0.60 0.51 REF C 4–R0.5 (MAX) 0.50 + 0.03 0.10 HEAT SPREADER // 1.09 REF C 2.10 + 0.2/–0.3 0.05(4X) Ball Pitch: 1.00 Substrate Thickness: Ball Diameter: 0.60 Mold Thickness: 0.51 — 23/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Ordering Information — GSI SigmaQuad-IIIe ECCRAMs Org Part Number Type Package Speed (MHz) TA 4M x 18 GS8673EQ18BK-725S SigmaQuad-IIIe B2 260 Pin BGA 725 C 4M x 18 GS8673EQ18BK-625S SigmaQuad-IIIe B2 260 Pin BGA 625 C 4M x 18 GS8673EQ18BK-550S SigmaQuad-IIIe B2 260 Pin BGA 550 C 4M x 18 GS8673EQ18BK-725IS SigmaQuad-IIIe B2 260 Pin BGA 725 I 4M x 18 GS8673EQ18BK-625IS SigmaQuad-IIIe B2 260 Pin BGA 625 I 4M x 18 GS8673EQ18BK-550IS SigmaQuad-IIIe B2 260 Pin BGA 550 I 2M x 36 GS8673EQ36BK-725S SigmaQuad-IIIe B2 260 Pin BGA 725 C 2M x 36 GS8673EQ36BK-625S SigmaQuad-IIIe B2 260 Pin BGA 625 C 2M x 36 GS8673EQ36BK-550S SigmaQuad-IIIe B2 260 Pin BGA 550 C 2M x 36 GS8673EQ36BK-725IS SigmaQuad-IIIe B2 260 Pin BGA 725 I 2M x 36 GS8673EQ36BK-625IS SigmaQuad-IIIe B2 260 Pin BGA 625 I 2M x 36 GS8673EQ36BK-550IS SigmaQuad-IIIe B2 260 Pin BGA 550 I 4M x 18 GS8673EQ18BGK-725S SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 725 C 4M x 18 GS8673EQ18BGK-625S SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 625 C 4M x 18 GS8673EQ18BGK-550S SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 550 C 4M x 18 GS8673EQ18BGK-725IS SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 725 I 4M x 18 GS8673EQ18BGK-625IS SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 625 I 4M x 18 GS8673EQ18BGK-550IS SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 550 I 2M x 36 GS8673EQ36BGK-725S SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 725 C 2M x 36 GS8673EQ36BGK-625S SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 625 C 2M x 36 GS8673EQ36BGK-550S SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 550 C 2M x 36 GS8673EQ36BGK-725IS SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 725 I 2M x 36 GS8673EQ36BGK-625IS SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 625 I 2M x 36 GS8673EQ36BGK-550IS SigmaQuad-IIIe B2 RoHS-compliant 260 Pin BGA 550 I Note: C = Commercial Temperature Range. I = Industrial Temperature Range. Rev: 1.03 6/2014 24/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology GS8673EQ18/36BK-725S/625S/550S Revision History Rev. Code Types of Changes Format or Content GS8673EQ1836BK_r1 Revisions Creation of new datasheet GS8673EQ1836BK_r1_01 Content Corrected P/Ns for Industrial Temp Range (“I” before “S”) GS8673EQ1836BK_r1_02 Content Redefined pin 5B from MCH to MVQ. Added support for VDDQ = 1.2V (requires MVQ = 0). Content Redefined pins 3L, 11L from DNUO to QVLD1, QVLD0. Redefined pins 9A, 9B from MCH to PZT1, PZT0. Redefined pins 7G, 7P from MCL, MCH to MZT1, MZT0. Added support for VDDQ = 1.35V (requires MVQ = 0). Updated Power-Up and Reset Requirements section. GS8673EQ1836BK_r1_03 Rev: 1.03 6/2014 25/25 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. © 2012, GSI Technology