DATASHEET

DATASHEET
Low Power 10-Bit, 250/210/170/125MSPS ADC
KAD5510P
Features
The KAD5510P is a family of low power, high performance
10-bit analog-to-digital converters. Designed with Intersil’s
proprietary FemtoCharge™ technology on a standard CMOS
process, the family supports sampling rates of up to
250MSPS. The KAD5510P is part of a pin-compatible portfolio
of 10-, 12- and 14-bit A/Ds with sample rates ranging from
125MSPS to 500MSPS.
• 1.5GHz analog input bandwidth
A Serial Peripheral Interface (SPI) port allows for extensive
configurability, as well as fine control of various parameters
such as gain and offset.
• 60fs clock jitter
• Programmable gain, offset and skew control
• Over-range indicator
• Selectable clock divider: 1, 2 or 4
• Clock phase selection
• Nap and sleep modes
• Two’s complement, gray code or binary data format
Digital output data is presented in selectable LVDS or CMOS
formats. The KAD5510P is available in a 48 Ld QFN package
with an exposed paddle. Operating from a 1.8V supply,
performance is specified across the industrial operating
temperature range (-40°C to +85°C).
• DDR LVDS-compatible or LVCMOS outputs
Key Specifications
Applications
• Programmable built-in test patterns
• Single-supply 1.8V operation
• Pb-free (RoHS compliant)
• Power amplifier linearization
• SNR = 60.7dBFS for fIN = 105MHz (-1dBFS)
• Radar and satellite antenna array processing
• SFDR = 86.1dBc for fIN = 105MHz (-1dBFS)
• Total Power Consumption
- 234/189mW at 250/125MSPS (DDR Mode)
• Broadband communications
Related Literature
• Communications test equipment
• High-performance data acquisition
CLKP
CLKOUTP
CLOCK
GENERATION
CLKN
• WiMAX and microwave receivers
OVDD
AVDD
CLKDIV
• KAD5510P-50 datasheet, “10-Bit, 500MSPS A/D Converter”
0
CLKOUTN
-20
VINP
10-BIT
250 MSPS
ADC
SHA
VINN
VCM
1.25V
+
–
SPI
CONTROL
D[4:0]N
DIGITAL
ERROR
CORRECTION
ORP
ORN
LVDS/CMOS
DRIVERS
OUTFMT
OUTMODE
AMPLITUDE (dBFS)
(DDR)
D[4:0]P
AIN = -1.0dBFS
SNR = 60.7dBFS
SFDR = 85.9dBc
SINAD = 60.7dBFS
-40
-60
-80
FIGURE 1.
February 8, 2016
FN7693.3
1
OVSS
CSB
SCLK
SDIO
SDO
AVSS
NAPSLP
-100
-120
0M
20M
40M
60M
80M
100M
120M
FREQUENCY (Hz)
FIGURE 2. SINGLE-TONE SPECTRUM AT 105MHz (250MSPS)
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC. 2011, 2016. All Rights Reserved
Intersil (and design) and FemtoCharge are trademarks owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
KAD5510P
Table of Contents
Pin-Compatible Family . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Pin Configuration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Pin Descriptions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Thermal Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Recommended Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Digital Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Timing Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Switching Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Typical Performance Curves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Theory of Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Power-On Calibration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
User-Initiated Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog Input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
VCM Output. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Clock Input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Jitter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage Reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Over-Range Indicator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Nap/Sleep. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Data Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
15
15
15
16
16
17
17
17
18
18
18
18
18
19
Serial Peripheral Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SPI Physical Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SPI Configuration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Device Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Indexed Device Configuration/Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Global Device Configuration/Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Device Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
48-Pin Package Notes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SPI Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
21
21
21
22
22
23
24
24
25
Equivalent Circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
ADC Evaluation Platform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Layout Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PCB Layout Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Split Ground and Power Planes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Clock Input Considerations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Exposed Paddle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Bypass and Filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LVDS Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LVCMOS Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Unused Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
28
28
28
28
28
28
28
28
28
General PowerPAD Design Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Revision History. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
About Intersil . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Package Outline Drawing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Submit Document Feedback
2
FN7693.3
February 8, 2016
KAD5510P
Pin-Compatible Family
PACKAGE
RESOLUTION
SPEED
(MSPS)
KAD5514P-25/21/17/12
14
250/210/170/125
KAD5512P-50
12
500
MODEL
Q48EP
Q72EP
X
X
X
KAD5512P-25/21/17/12
12
250/210/170/125
X
X
KAD5512HP-25/21/17/12
12
250/210/170/125
X
X
KAD5510P-50
10
500
KAD5510P-25/21/17/12
10
250/210/170/125
X
X
Pin Configuration
Submit Document Feedback
AVSS
AVDD
SDIO
SCLK
CSB
SDO
OVSS
ORP
ORN
D4P
D4N
OVDD
KAD5510P
(48 LD QFN)
TOP VIEW
48
47
46
45
44
43
42
41
40
39
38
37
AVDD
1
36 D3P
DNC
2
35 D3N
DNC
3
34 D2P
DNC
4
33 D2N
AVSS
5
32 CLKOUTP
VINN
6
31 CLKOUTN
PAD
VINP
7
AVSS
8
29 OVSS
AVDD
9
28 D1P
VCM
10
27 D1N
DNC
11
AVSS
12
3
30 RLVDS
26 D0P
CONNECT THERMAL PAD TO AVSS
14
15
16
17
18
19
20
21
22
23
CLKP
CLKN
NAPSLP
AVDD
RESETN
OVSS
OVDD
DNC
DNC
DNC
24
DNC
13
AVDD
25 D0N
FN7693.3
February 8, 2016
KAD5510P
Pin Descriptions
PIN NUMBER
LVDS [LVCMOS] NAME
LVDS [LVCMOS] FUNCTION
1, 9, 13, 17, 47
AVDD
1.8V Analog Supply
2, 3, 4, 11, 21, 22,
23, 24
DNC
Do Not Connect
5, 8, 12, 48
AVSS
Analog Ground
6, 7
VINN, VINP
10
VCM
14, 15
CLKP, CLKN
16
NAPSLP
Tri-Level Power Control (Nap, Sleep modes)
18
RESETN
Power-On Reset (Active Low, see page 16)
Analog Input Negative, Positive
Common-Mode Output
Clock Input True, Complement
19, 29, 42
OVSS
Output Ground
20, 37
OVDD
1.8V Output Supply
25
D0N
[NC]
LVDS DDR Logical Bits 1, 0 Output Complement
[NC in LVCMOS]
26
D0P
[D0]
LVDS DDR Logical Bits 1, 0 Output True
[CMOS DDR Logical Bits 1, 0 in LVCMOS]
27
D1N
[NC]
LVDS DDR Logical Bits 3, 2 Output Complement
[NC in LVCMOS]
28
D1P
[D1]
LVDS DDR Logical Bits 3, 2 Output True
[CMOS DDR Logical Bits 3, 2 in LVCMOS]
30
RLVDS
31
CLKOUTN
[NC]
LVDS Bias Resistor (Connect to OVSS with a 10kΩ, 1% resistor)
LVDS Clock Output Complement
[NC in LVCMOS]
32
CLKOUTP
[CLKOUT]
LVDS Clock Output True
[LVCMOS CLKOUT]
33
D2N
[NC]
LVDS DDR Logical Bits 5, 4 Output Complement
[NC in LVCMOS]
34
D2P
[D2]
LVDS DDR Logical Bits 5, 4 Output True
[CMOS DDR Logical Bits 5, 4 in LVCMOS]
35
D3N
[NC]
LVDS DDR Logical Bits 7, 6 Output Complement
[NC in LVCMOS]
36
D3P
[D3]
LVDS DDR Logical Bits 7, 6 Output True
[CMOS DDR Logical Bits 7, 6 in LVCMOS]
38
D4N
[NC]
LVDS DDR Logical Bits 9, 8 Output Complement
[NC in LVCMOS]
39
D4P
[D4]
LVDS DDR Logical Bits 9, 8 Output True
[CMOS DDR Logical Bits 9, 8 in LVCMOS]
40
ORN
[NC]
LVDS Over-Range Complement
[NC in LVCMOS]
41
ORP
[OR]
LVDS Over-Range True
[LVCMOS Over-Range]
43
SDO
SPI Serial Data Output (4.7kΩ pull-up to OVDD is required)
44
CSB
SPI Chip Select (active low)
45
SCLK
SPI Clock
46
SDIO
SPI Serial Data Input/Output
PAD
(Exposed Paddle)
AVSS
Analog Ground (Connect to a low thermal impedance analog ground plane with
multiple vias)
NOTE: LVCMOS output mode functionality is shown in brackets (NC = No Connection).
Submit Document Feedback
4
FN7693.3
February 8, 2016
KAD5510P
Ordering Information
PART NUMBER
(Notes 1, 2)
PART
MARKING
SPEED
(MSPS)
TEMP. RANGE
(°C)
PACKAGE
(RoHS Compliant)
PKG.
DWG. #
KAD5510P-25Q48
KAD5510P-25 Q48EP-I
250
-40 to +85
48 Ld QFN
L48.7x7E
KAD5510P-21Q48
KAD5510P-21 Q48EP-I
210
-40 to +85
48 Ld QFN
L48.7x7E
KAD5510P-17Q48
KAD5510P-17 Q48EP-I
170
-40 to +85
48 Ld QFN
L48.7x7E
KAD5510P-12Q48
KAD5510P-12 Q48EP-I
125
-40 to +85
48 Ld QFN
L48.7x7E
NOTES:
1. These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100% matte
tin plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations). Intersil
Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
2. For Moisture Sensitivity Level (MSL), please see device information page for KAD5510P-12, KAD5510P-17, KAD5510P-21, KAD5510P-25. For more
information on MSL please see techbrief TB363.
Submit Document Feedback
5
FN7693.3
February 8, 2016
KAD5510P
Absolute Maximum Ratings
Thermal Information
AVDD to AVSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.4V to 2.1V
OVDD to OVSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.4V to 2.1V
AVSS to OVSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 0.3V
Analog Inputs to AVSS . . . . . . . . . . . . . . . . . . . . . . . . . -0.4V to AVDD + 0.3V
Clock Inputs to AVSS . . . . . . . . . . . . . . . . . . . . . . . . . . -0.4V to AVDD + 0.3V
Logic Input to AVSS . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.4V to OVDD + 0.3V
Logic Inputs to OVSS . . . . . . . . . . . . . . . . . . . . . . . . . . -0.4V to OVDD + 0.3V
Thermal Resistance (Typical)
JA (°C/W) JC (°C/W)
48 Ld QFN (Notes 3, 4) . . . . . . . . . . . . . . . .
25
0.5
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+150°C
Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see TB493
Recommended Operating Conditions
AVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.8V
OVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.8V
Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40°C to +85°C
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
NOTES:
3. JA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See Tech
Brief TB379.
4. For JC, the “case temp” location is the center of the exposed metal pad on the package underside.
Electrical Specifications
All specifications apply under the following conditions unless otherwise noted: AVDD = 1.8V, OVDD = 1.8V,
TA = -40°C to +85°C (typical specifications at +25°C), AIN = -1dBFS, fSAMPLE = Maximum Conversion Rate (per speed grade). Boldface limits apply
across the operating temperature range, -40°C to +85°C.
PARAMETER
TEST
CONDITIONS
SYMBOL
KAD5510P-25
KAD5510P-21
KAD5510P-17
KAD5510P-12
MIN
TYP
MAX
MIN
TYP
MAX
MIN
TYP
MAX
MIN
TYP
MAX
UNIT
1.40
1.47
1.54
1.40
1.47
1.54
1.40
1.47
1.54
1.40
1.47
1.54
VP-P
DC SPECIFICATIONS
Analog Input
Full-Scale Analog
Input Range
VFS
Differential
Input Resistance
RIN
Differential
1000
1000
1000
1000
Ω
Input Capacitance
CIN
Differential
1.8
1.8
1.8
1.8
pF
Full Scale Range
Temp. Drift
AVTC
Full
temperature
90
90
90
90
ppm/°C
Input Offset Voltage
VOS
Gain Error
EG
Common-Mode
Output Voltage
VCM
Common-Mode
Input Current (per
pin)
ICM
-10
±2
10
-10
±0.6
435
535
±2
10
-10
±0.6
635
435
535
±2
10
-10
±0.6
635
435
535
±2
10
±0.6
635
435
535
mV
%
635
mV
2.5
2.5
2.5
2.5
µA/
MSPS
Input
Common-Mode
Voltage
0.9
0.9
0.9
0.9
V
CLKP,CLKN Input
Swing
1.8
1.8
1.8
1.8
V
Clock Inputs
Power Requirements
1.8V Analog Supply
Voltage
AVDD
1.7
1.8
1.9
1.7
1.8
1.9
1.7
1.8
1.9
1.7
1.8
1.9
V
1.8V Digital Supply
Voltage
OVDD
1.7
1.8
1.9
1.7
1.8
1.9
1.7
1.8
1.9
1.7
1.8
1.9
V
Submit Document Feedback
6
FN7693.3
February 8, 2016
KAD5510P
Electrical Specifications
All specifications apply under the following conditions unless otherwise noted: AVDD = 1.8V, OVDD = 1.8V,
TA = -40°C to +85°C (typical specifications at +25°C), AIN = -1dBFS, fSAMPLE = Maximum Conversion Rate (per speed grade). Boldface limits apply
across the operating temperature range, -40°C to +85°C. (Continued)
PARAMETER
SYMBOL
1.8V Analog Supply
Current
IAVDD
1.8V Digital Supply
Current (DDR)
(Note 5)
I
OVDD
Power Supply
Rejection Ratio
PSRR
TEST
CONDITIONS
KAD5510P-25
MIN
KAD5510P-21
MIN
TYP
MAX
101.5
83
45
38
KAD5510P-17
MIN
TYP
MAX
94.5
77
45
36
KAD5510P-12
TYP
MAX
90
3mA LVDS
39
30MHz,
200mVP-P
signal on AVDD
-36
3mA LVDS
234
254
219
242
204
220
189
205
mW
84
104
80
100
78
97
74
93
mW
CSB at logic
high
2
6
2
6
2
6
2
6
mW
Nap Mode Wakeup
Time (Note 6)
Sample Clock
Running
1
1
1
1
µs
Sleep Mode
Wakeup Time
(Note 6)
Sample Clock
Running
1
1
1
1
ms
-36
MIN
TYP
MAX
UNIT
87.5
69
79.5
mA
40
35
40
mA
-36
-36
dB
Total Power Dissipation
Normal Mode
(DDR)
PD
Nap Mode
PD
Sleep Mode
PD
AC SPECIFICATIONS
Differential
Nonlinearity
DNL
-0.5
±0.12
0.5
-0.5
±0.17
0.5
-0.5
±0.17
0.5
-0.5
±0.17
0.5
LSB
Integral
Nonlinearity
INL
-0.75
±0.2
0.75
-0.75
±0.3
0.75
-0.75
±0.3
0.75 -0.75
±0.3
0.75
LSB
40
MSPS
Minimum
Conversion Rate
(Note 7)
fS MIN
Maximum
Conversion Rate
fS MAX
Signal-to-Noise
Ratio
SNR
Signal-to-Noise and
Distortion
40
250
fIN = 10MHz
fIN = 105MHz
SINAD
Submit Document Feedback
40
210
60.8
59.5
60.7
40
170
60.8
60.0
60.9
125
61.0
60.2
61.0
60.2
MSPS
61.0
dBFS
61.0
dBFS
fIN = 190MHz
60.6
60.8
60.9
60.9
dBFS
fIN = 364MHz
60.5
60.6
60.7
60.7
dBFS
fIN = 695MHz
59.9
60.0
60.1
60.0
dBFS
fIN = 995MHz
59.1
59.2
59.3
59.2
dBFS
fIN = 10MHz
60.7
60.8
60.9
61.0
dBFS
61.0
dBFS
fIN = 105MHz
59.3
60.7
59.9
60.9
60.0
60.9
60.0
fIN = 190MHz
60.5
60.8
60.8
60.9
dBFS
fIN = 364MHz
60.4
60.5
60.6
60.4
dBFS
fIN = 695MHz
56.5
57.3
56.9
56.6
dBFS
fIN = 995MHz
49.8
46.9
47.7
49.1
dBFS
7
FN7693.3
February 8, 2016
KAD5510P
Electrical Specifications
All specifications apply under the following conditions unless otherwise noted: AVDD = 1.8V, OVDD = 1.8V,
TA = -40°C to +85°C (typical specifications at +25°C), AIN = -1dBFS, fSAMPLE = Maximum Conversion Rate (per speed grade). Boldface limits apply
across the operating temperature range, -40°C to +85°C. (Continued)
PARAMETER
SYMBOL
Effective Number of
Bits
ENOB
Spurious-Free
Dynamic Range
Intermodulation
Distortion
TEST
CONDITIONS
TYP
MAX
KAD5510P-21
MIN
9.8
9.5
9.8
TYP
MAX
KAD5510P-17
MIN
9.8
9.6
9.8
TYP
MAX
KAD5510P-12
MIN
9.8
9.6
9.8
9.6
TYP
MAX
UNIT
9.8
Bits
9.8
Bits
fIN = 190MHz
9.8
9.8
9.8
9.8
Bits
fIN = 364MHz
9.7
9.8
9.8
9.7
Bits
fIN = 695MHz
9.1
9.2
9.2
9.1
Bits
fIN = 995MHz
8.0
7.5
7.6
7.9
Bits
fIN = 10MHz
83.0
82.0
78.0
79.0
dBc
85.8
dBc
fIN = 105MHz
IMD
MIN
fIN = 10MHz
fIN = 105MHz
SFDR
KAD5510P-25
73.0
86.1
73.0
86.6
73.0
84.6
73.0
fIN = 190MHz
78.0
80.1
81.0
81.2
dBc
fIN = 364MHz
76.2
77.1
77.9
72.1
dBc
fIN = 695MHz
60.8
61.9
61.0
61.1
dBc
fIN = 995MHz
50.2
47.2
47.9
49.4
dBc
fIN = 70MHz
-86.1
-92.1
-94.5
-95.1
dBFS
fIN = 170MHz
-96.9
-87.1
-91.6
-85.7
dBFS
10-12
10-12
10-12
1.5
1.5
1.5
Word Error Rate
WER
10-12
Full Power
Bandwidth
FPBW
1.5
GHz
NOTES:
5. Digital Supply Current is dependent upon the capacitive loading of the digital outputs. IOVDD specifications apply for 10pF load on each digital output.
6. See “Nap/Sleep” on page 18 for more details.
7. The DLL Range setting must be changed for low speed operation. See “Serial Peripheral Interface” on page 21 for more detail.
Submit Document Feedback
8
FN7693.3
February 8, 2016
KAD5510P
Digital Specifications
PARAMETER
Boldface limits apply across the operating temperature range, -40°C to +85°C.
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNIT
0
1
10
µA
-25
-12
-5
µA
INPUTS
Input Current High (SDIO, RESETN, CSB, SCLK)
IIH
VIN = 1.8V
Input Current Low (SDIO, RESETN, CSB, SCLK)
IIL
VIN = 0V
Input Voltage High (SDIO, RESETN, CSB, SCLK)
VIH
Input Voltage Low (SDIO, RESETN, CSB, SCLK)
VIL
Input Current High (NAPSLP) (Note 9)
IIH
15
Input Current Low (NAPSLP)
IIL
-40
Input Capacitance
CDI
1.17
V
0.63
V
25
40
µA
25
-15
µA
3
pF
620
mVP-P
LVDS OUTPUTS
Differential Output Voltage
Output Offset Voltage
VT
3mA Mode
VOS
3mA Mode
950
965
980
mV
Output Rise Time
tR
500
ps
Output Fall Time
tF
500
ps
OVDD - 0.1
V
CMOS OUTPUTS
Voltage Output High
VOH
IOH = -500µA
Voltage Output Low
VOL
IOL = 1mA
OVDD - 0.3
0.1
0.3
V
Output Rise Time
tR
1.8
ns
Output Fall Time
tF
1.4
ns
Submit Document Feedback
9
FN7693.3
February 8, 2016
KAD5510P
Timing Diagrams
SAMPLE N
INP
INN
tA
CLKN
CLKP
tCPD
LATENCY = L CYCLES
CLKOUTN
CLKOUTP
tDC
tPD
D[8/6/4/2/0]P
ODD BITS
N-L
D[8/6/4/2/0]N
EVEN BITS ODD BITS EVEN BITS ODD BITS EVEN BITS
N-L + 1
N-L + 1
N-L + 2
N-L + 2
N-L
EVEN BITS
N
FIGURE 3. DDR LVDS TIMING DIAGRAM (See “Digital Outputs” on page 18)
SAMPLE N
INP
INN
tA
CLKN
CLKP
tCPD
LATENCY = L CYCLES
CLKOUT
tDC
tPD
D[8/6/4/2/0]
ODD BITS
N-L
EVEN BITS ODD BITS
N-L + 1
N-L
EVEN BITS
N-L + 1
ODD BITS EVEN BITS
N-L + 2
N-L + 2
EVEN BITS
N
FIGURE 4. DDR CMOS TIMING DIAGRAM (See “Digital Outputs” on page 18)
Submit Document Feedback
10
FN7693.3
February 8, 2016
KAD5510P
Switching Specifications
PARAMETER
Boldface limits apply across the operating temperature range, -40°C to +85°C.
TEST CONDITIONS
SYMBOL
MIN
(Note 8)
TYP
MAX
(Note 8)
UNIT
ADC OUTPUT
Aperture Delay
tA
375
ps
RMS Aperture Jitter
jA
60
fs
Output Clock to Data Propagation Delay,
LVDS Mode (Note 10)
Output Clock to Data Propagation Delay,
CMOS Mode (Note 10)
DDR Rising Edge
tDC
-260
-50
120
ps
DDR Falling Edge
tDC
-160
10
230
ps
SDR Falling Edge
tDC
-260
-40
230
ps
DDR Rising Edge
tDC
-220
-10
200
ps
DDR Falling Edge
tDC
-310
-90
110
ps
SDR Falling Edge
tDC
-310
-50
200
ps
Latency (Pipeline Delay)
Overvoltage Recovery
L
7.5
cycles
tOVR
1
cycles
SPI INTERFACE (Notes 11, 12)
SCLK Period
Write Operation
t
CLK
16
cycles
(Note 11)
Read Operation
tCLK
66
cycles
SCLK Duty Cycle (tHI/tCLK or tLO/tCLK)
Read or Write
CSBto SCLK Set-Up Time
Read or Write
tS
1
cycles
CSBafter SCLK Hold Time
Read or Write
tH
3
cycles
Data Valid to SCLK Set-Up Time
Write
tDSW
1
cycles
Data Valid after SCLK Hold Time
Write
tDHW
3
cycles
Data Valid after SCLK Time
Read
tDVR
Data Invalid after SCLK Time
Read
tDHR
3
cycles
Sleep Mode CSBto SCLK Set-Up Time
(Note 13)
Read or Write in Sleep Mode
tS
150
µs
25
50
75
16.5
%
cycles
NOTES:
8. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
9. The Tri-Level Inputs internal switching thresholds are approximately 0.43V and 1.34V. It is advised to float the inputs, tie to ground or AVDD depending
on desired function.
10. The input clock to output clock delay is a function of sample rate, using the output clock to latch the data simplifies data capture for most
applications. Contact factory for more info if needed.
11. SPI Interface timing is directly proportional to the ADC sample period (4ns at 250Msps).
12. The SPI may operate asynchronously with respect to the ADC sample clock but the ADC sample clock must be active to access SPI registers.
13. The CSB set-up time increases in sleep mode due to the reduced power state, CSB setup time in Nap mode is equal to normal mode CSB set-up time
(4ns min).
Submit Document Feedback
11
FN7693.3
February 8, 2016
KAD5510P
Typical Performance Curves
All Typical Performance Characteristics apply under the following conditions
unless otherwise noted: AVDD = OVDD = 1.8V, TA = +25°C, AIN = -1dBFS, fIN = 105MHz, fSAMPLE = Maximum conversion rate (per speed grade).
-50
85
HD2 AND HD3 MAGNITUDE (dBc)
SNR (dBFS) AND SFDR (dBc)
90
SFDR AT 125MSPS
80
SFDR AT 250MSPS
75
70
SNR AT 125MSPS
65
60
55
SNR AT 250MSPS
50
0M
200M
400M
600M
800M
-55
-65
-70 HD2 AT 250MSPS
-75
HD3 AT 125MSPS
-80
-85
HD3 AT 250MSPS
-90
-95
-100
1G
HD2 AT 125MSPS
-60
0M
200M
INPUT FREQUENCY (Hz)
90
SNR AND SFDR
HD2 AND HD3 MAGNITUDE
SFDRFS (dBFS)
80
70
60
SNRFS (dBFS)
50
40
SFDR (dBc)
30
SNR (dBc)
20
10
-60
-50
-40
-30
-20
-10
-10
0
-20
-30
-40
-50
HD2 (dBc)
-60
-70
HD2 (dBFS)
-80
-90
-100
-110
-60
0
HD3 (dBc)
HD3 (dBFS)
-50
-40
-30
-20
INPUT AMPLITUDE (dBFS)
INPUT AMPLITUDE (dBFS)
FIGURE 7. SNR AND SFDR vs AIN
FIGURE 8. HD2 AND HD3 vs AIN
90
-60
HD2 AND HD3 MAGNITUDE (dBc)
SNR (dBFS) AND SFDR (dBc)
1G
-10
100
85
SFDR
80
75
70
65
SNR
60
55
800M
FIGURE 6. HD2 AND HD3 vs fIN
FIGURE 5. SNR AND SFDR vs fIN
0
400M
600M
INPUT FREQUENCY (Hz)
40
70
100
130
160
190
SAMPLE RATE (MSPS)
FIGURE 9. SNR AND SFDR vs fSAMPLE
Submit Document Feedback
12
220
250
-70
HD3
-80
-90
HD2
-100
-110
-120
40
70
100
130
160
190
220
250
SAMPLE RATE (MSPS)
FIGURE 10. HD2 AND HD3 vs fSAMPLE
FN7693.3
February 8, 2016
KAD5510P
Typical Performance Curves
All Typical Performance Characteristics apply under the following conditions
unless otherwise noted: AVDD = OVDD = 1.8V, TA = +25°C, AIN = -1dBFS, fIN = 105MHz, fSAMPLE = Maximum conversion rate (per speed grade).
250
0.25
0.15
0.10
DNL (LSBs)
TOTAL POWER (mW)
0.20
200
150
100
0.05
0.00
-0.05
-0.10
50
-0.15
-0.20
0
40
70
100
130
160
190
SAMPLE RATE (MSPS)
220
-0.25
250
0
FIGURE 11. POWER vs fSAMPLE IN 3mA LVDS MODE
85
SNR (dBFS) AND SFDR (dBc)
90
0.20
0.15
INL (LSBs)
0.10
0.05
0.00
-0.05
-0.10
-0.15
-0.20
0
128
256
384
512
CODE
640
768
896
512
CODE
640
768
896
1024
SFDR
75
70
65
SNR
60
55
50
300
1024
400
500
600
700
800
INPUT COMMON-MODE (mV)
FIGURE 14. SNR AND SFDR vs VCM
70000
0
40000
Ain = -1.0dBFS
SNR = 60.7dBFS
SFDR = 82.5dBc
SINAD = 60.7dBFS
-20
10000
AMPLITUDE (dBFS)
NUMBER OF HITS
384
80
FIGURE 13. INTEGRAL NONLINEARITY
80000
50000
20000
90000
60000
-40
-60
-80
-100
30000
0
2050
256
FIGURE 12. DIFFERENTIAL NONLINEARITY
0.25
-0.25
128
2051
2052
2053
2054 2055
CODE
2056
FIGURE 15. NOISE HISTOGRAM
Submit Document Feedback
13
2057
2058
-120
0M
20M
40M
60M
80M
FREQUENCY (Hz)
100M
120M
FIGURE 16. SINGLE-TONE SPECTRUM AT 10MHz
FN7693.3
February 8, 2016
KAD5510P
Typical Performance Curves
All Typical Performance Characteristics apply under the following conditions
unless otherwise noted: AVDD = OVDD = 1.8V, TA = +25°C, AIN = -1dBFS, fIN = 105MHz, fSAMPLE = Maximum conversion rate (per speed grade).
0
-20
AMPLITUDE (dBFS)
-20
AMPLITUDE (dBFS)
0
AIN = -1.0dBFS
SNR = 60.7dBFS
SFDR = 85.9dBc
SINAD = 60.7dBFS
-40
-60
-80
-40
-60
-80
-100
-100
-120
AIN = -1.0dBFS
SNR = 60.6dBFS
SFDR = 78.5dBc
SINAD = 60.5dBFS
0M
20M
40M
60M
80M
100M
-120
120M
0M
20M
40M
FIGURE 17. SINGLE-TONE SPECTRUM AT 105MHz
0
-60
-80
-100
120M
-40
-60
-80
-100
0M
20M
40M
60M
80M
100M
-120
120M
0M
20M
FREQUENCY (Hz)
0
0
IMD = -86.1dBFS
100M
120M
IMD = -96.9dBFS
-20
AMPLITUDE (dBFS)
-20
-40
-60
-80
-40
-60
-80
-100
-100
-120
40M
60M
80M
FREQUENCY (Hz)
FIGURE 20. SINGLE-TONE SPECTRUM AT 995MHz
FIGURE 19. SINGLE-TONE SPECTRUM AT 495MHz
AMPLITUDE (dBFS)
100M
AIN = -1.0dBFS
SNR = 58.9dBFS
SFDR = 49.8dBc
SINAD = 49.5dBFS
-20
AMPLITUDE (dBFS)
AMPLITUDE (dBFS)
0
-40
-120
80M
FIGURE 18. SINGLE-TONE SPECTRUM AT 190MHz
AIN = -1.0dBFS
SNR = 60.2dBFS
SFDR = 68.9dBc
SINAD = 59.4dBFS
-20
60M
FREQUENCY (Hz)
FREQUENCY (Hz)
0M
20M
40M
60M
80M
FREQUENCY (Hz)
100M
FIGURE 21. TWO-TONE SPECTRUM AT 70MHz
Submit Document Feedback
14
120M
-120
0M
20M
40M
60M
80M
FREQUENCY (Hz)
100M
120M
FIGURE 22. TWO-TONE SPECTRUM AT 170MHz
FN7693.3
February 8, 2016
KAD5510P
Theory of Operation
A user-initiated reset can subsequently be invoked in the event
that the previously mentioned conditions cannot be met at
power-up.
Functional Description
The KAD5510P is based upon a 10-bit, 250MSPS A/D converter
core that utilizes a pipelined successive approximation
architecture (Figure 23). The input voltage is captured by a
Sample-Hold Amplifier (SHA) and converted to a unit of charge.
Proprietary charge-domain techniques are used to successively
compare the input to a series of reference charges. Decisions
made during the successive approximation operations determine
the digital code for each input value. The converter pipeline
requires six samples to produce a result. Digital error correction
is also applied, resulting in a total latency of seven and one half
clock cycles. This is evident to the user as a time lag between the
start of a conversion and the data being available on the digital
outputs.
Power-On Calibration
The ADC performs a self-calibration at start-up. An internal
Power-On Reset (POR) circuit detects the supply voltage ramps
and initiates the calibration when the analog and digital supply
voltages are above a threshold. The following conditions must be
adhered to for the power-on calibration to execute successfully:
• A frequency-stable conversion clock must be applied to the
CLKP/CLKN pins
• DNC pins must not be pulled up or down
• SDO must be high
• RESETN will be pulled low by the ADC during POR then
released
The SDO pin requires an external 4.7kΩ pull-up to OVDD. If the
SDO pin is pulled low externally during power-up, calibration will
not be executed properly.
After the power supply has stabilized, the internal POR releases
RESETN and an internal pull-up pulls it high starting the
calibration sequence. When the RESETN pin is driven by external
logic, it should be connected to an open-drain output with
open-state leakage of less than 0.5mA to assure exit from the
reset state. A driver that can be switched from logic LOW to HIGH
impedance can also be used to drive RESETN provided the high
impedance state leakage is less than 0.5mA and the logic
voltages are the same.
The calibration sequence is initiated on the rising edge of
RESETN, as shown in Figure 24 on page 16. The Over-Range
output (OR) is set high once RESETN is pulled low and remains in
that state until calibration is complete. The OR output returns to
normal operation at that time, so it is important that the analog
input be within the converter’s full-scale range to observe the
transition. If the input is in an over-range condition, the OR pin
will stay high and it will not be possible to detect the end of the
calibration cycle.
While RESETN is low, the output clock (CLKOUTP/CLKOUTN) is
set low. Normal operation of the output clock resumes at the
next input clock edge (CLKP/CLKN) after RESETN is deasserted.
At 250MSPS the nominal calibration time is 200ms, while the
maximum calibration time is 550ms.
• SPI communications must not be attempted
CLOCK
GENERATION
INP
SHA
INN
1.25V
+
–
2.5-BIT
FLASH
6-STAGE
1.5-BIT/STAGE
3-STAGE
1-BIT/STAGE
3-BIT
FLASH
DIGITAL
ERROR
CORRECTION
LVDS/LVCMOS
OUTPUTS
FIGURE 23. ADC CORE BLOCK DIAGRAM
Submit Document Feedback
15
FN7693.3
February 8, 2016
KAD5510P
CLKN
CLKP
RESETN
CALIBRATION
BEGINS
ORP
SNR CHANGE (dBfs)
3
CALIBRATION TIME
CALIBRATION
COMPLETE
CAL DONE AT
+85°C
2
1
0
-1
-2
-3
-4
-40
CLKOUTP
CAL DONE AT
+25°C
CAL DONE AT
-40°C
-15
10
35
60
85
TEMPERATURE (°C)
FIGURE 25. SNR PERFORMANCE vs TEMPERATURE
FIGURE 24. CALIBRATION TIMING
15
Recalibration of the ADC can be initiated at any time by driving
the RESETN pin low for a minimum of one clock cycle. An
open-drain driver with less than 0.5mA open-state leakage is
recommended so the internal high impedance pull-up to OVDD
can assure exit from the reset state. As is the case during
power-on reset, the SDO, RESETN and DNC pins must be in the
proper state for the calibration to successfully execute.
The performance of the KAD5510P changes with variations in
temperature, supply voltage, or sample rate. The extent of these
changes may necessitate recalibration, depending on system
performance requirements. Best performance will be achieved
by recalibrating the ADC under the environmental conditions at
which it will operate.
A supply voltage variation of less than 100mV will generally
result in an SNR change of less than 0.5dBFS and SFDR change
of less than 3dBc.
In situations where the sample rate is not constant, best results
will be obtained if the device is calibrated at the highest sample
rate. Reducing the sample rate by less than 75MSPS will typically
result in an SNR change of less than 0.5dBFS and an SFDR
change of less than 3dBc.
Figures 25 and 26 show the effect of temperature on SNR and
SFDR performance with calibration performed at -40°C, +25°C,
and +85°C. Each plot shows the variation of SNR/SFDR across
temperature after a single calibration at -40°C, +25°C and
+85°C. Best performance is typically achieved by a user-initiated
calibration at the operating conditions, as stated earlier.
However, it can be seen that performance drift with temperature
is not a very strong function of the temperature at which the
calibration is performed. Full rated performance will be achieved
after power-up calibration regardless of the operating conditions.
SFDR CHANGE (dBc)
User-Initiated Reset
CAL DONE AT
-40°C
10
5
0
-5
CAL DONE AT
+85°C
-10
-15
-40
-15
CAL DONE AT
+25°C
10
35
TEMPERATURE (°C)
60
85
FIGURE 26. SFDR PERFORMANCE vs TEMPERATURE
Analog Input
The ADC core contains a fully differential input (VINP/VINN) to
the sample and hold amplifier (SHA). The ideal full-scale input
voltage is 1.45V, centered at the VCM voltage of 0.535V as
shown in Figure 27.
Best performance is obtained when the analog inputs are driven
differentially. The common-mode output voltage, VCM, should be
used to properly bias the inputs as shown in Figures 28 through
30. An RF transformer will give the best noise and distortion
performance for wideband and/or high intermediate frequency
(IF) inputs. Two different transformer input schemes are shown in
Figures 28 and 29.
1.8
1.4
1.0
INN
0.725V
INP
0.6
VCM
0.535V
0.2
FIGURE 27. ANALOG INPUT RANGE
Submit Document Feedback
16
FN7693.3
February 8, 2016
KAD5510P
This dual transformer scheme is used to improve common-mode
rejection, which keeps the common-mode level of the input
matched to VCM. The value of the shunt resistor should be
determined based on the desired load impedance. The
differential input resistance of the KAD5510P is 1000Ω.
ADT1-1WT
ADT1-1WT
1000pF
KAD5512P
VCM
used to calculate the expected voltage drop across any series
resistance.
VCM Output
The VCM output is buffered with a series output impedance of
20Ω. It can easily drive a typical ADC driver’s 10kΩ
common-mode control pin. If an external buffer is not used, the
voltage drop across the internal 20Ω impedance must be
considered when calculating the expected DC bias voltage at the
analog input pins.
Clock Input
0.1µF
FIGURE 28. TRANSFORMER INPUT FOR GENERAL PURPOSE
APPLICATIONS
ADTL1-12
ADTL1-12
1000pF
0.1µF
KAD5512P
1000pF
The clock input circuit is a differential pair (see Figure 44 on
page 27). Driving these inputs with a high level (up to 1.8VP-P on
each input) sine or square wave will provide the lowest jitter
performance. A transformer with 4:1 impedance ratio will
provide increased drive levels.
The recommended drive circuit is shown in Figure 31. A duty
cycle range of 40% to 60% is acceptable. The clock can be driven
single-ended, but this will reduce the edge rate and may impact
SNR performance. The clock inputs are internally self-biased to
AVDD/2 to facilitate AC coupling.
VCM
200pF
TC4-1W
FIGURE 29. TRANSMISSION-LINE TRANSFORMER INPUT FOR
HIGH IF APPLICATIONS
The SHA design uses a switched capacitor input stage
(see Figure 43 on page 27), which creates current spikes when
the sampling capacitance is reconnected to the input voltage.
This causes a disturbance at the input, which must settle before
the next sampling point. Lower source impedance will result in
faster settling and improved performance. Therefore, a 1:1
transformer and low shunt resistance are recommended for
optimal performance.
348Ω
69.8Ω
0.22µF
49.9Ω
217Ω
KAD5512P
VCM
100Ω
25Ω
69.8Ω
348Ω
0.1µF
FIGURE 30. DIFFERENTIAL AMPLIFIER INPUT
A differential amplifier, as shown in Figure 30, can be used in
applications that require DC-coupling. In this configuration, the
amplifier will typically dominate the achievable SNR and
distortion performance.
The current spikes from the SHA will try to force the analog input
pins toward ground. In cases where the input pins are biased with
more than 50Ω in series from VCM, care must be taken to make
sure the input common-mode range is not violated. The provided
ICM value (250µA/MHz*250MHz = 625µA at 250MSPS) may be
Submit Document Feedback
17
1000pF
200pF
Ω
200O
CLKN
200pF
FIGURE 31. RECOMMENDED CLOCK DRIVE
A selectable 2x frequency divider is provided in series with the
clock input. The divider can be used in the 2x mode with a
sample clock equal to twice the desired sample rate. This allows
the use of the Phase Slip feature, which enables synchronization
of multiple ADCs.
The clock divider can be controlled through the SPI port. Details
on this are contained in “Serial Peripheral Interface” on page 21.
25Ω
100Ω
CM
CLKP
A Delay-Locked Loop (DLL) generates internal clock signals for
various stages within the charge pipeline. If the frequency of the
input clock changes, the DLL may take up to 52µs to regain lock
at 250MSPS. The lock time is inversely proportional to the
sample rate.
Jitter
In a sampled data system, clock jitter directly impacts the
achievable SNR performance. The theoretical relationship
between clock jitter (tJ) and SNR is shown in Equation 1 and is
illustrated in Figure 32 on page 18.
1
SNR = 20 log 10  --------------------
 2f t 
(EQ. 1)
IN J
FN7693.3
February 8, 2016
KAD5510P
Over-Range Indicator
100
95
tj = 0.1ps
90
14 BITS
SNR (dB)
85
80
tj = 1ps
75
12 BITS
Power Dissipation
70
tj = 10ps
65
60
10 BITS
tj = 100ps
55
50
The Over-Range (OR) bit is asserted when the output code reaches
positive full-scale (e.g. 0xFFF in offset binary mode). The output
code does not wrap around during an over-range condition. The OR
bit is updated at the sample rate.
1
10
100
INPUT FREQUENCY (MHz)
1000
FIGURE 32. SNR vs CLOCK JITTER
The power dissipated by the KAD5510P is primarily dependent
on the sample rate and the output modes: LVDS vs CMOS and
DDR vs SDR. There is a static bias in the analog supply, while the
remaining power dissipation is linearly related to the sample
rate. The output supply dissipation is approximately constant in
LVDS mode, but linearly related to the clock frequency in CMOS
mode. Figures 36 and 37 illustrate these relationships.
This relationship shows the SNR that would be achieved if clock
jitter were the only non-ideal factor. In reality, achievable SNR is
limited by internal factors such as linearity, aperture jitter and
thermal noise. Internal aperture jitter is the uncertainty in the
sampling instant shown in Figure 32. The internal aperture jitter
combines with the input clock jitter in a root-sum-square fashion,
since they are not statistically correlated, and this determines
the total jitter in the system. The total jitter, combined with other
noise sources, then determines the achievable SNR.
Nap/Sleep
Voltage Reference
Wake-up time from sleep mode is dependent on the state of
CSB; in a typical application CSB would be held high during sleep,
requiring a user to wait 150µs maximum after CSB is asserted
(brought low) prior to writing ‘001x’ to SPI Register 25. The
device would be fully powered up, in normal mode 1ms after this
command is written.
A temperature compensated voltage reference provides the
reference charges used in the successive approximation
operations. The full-scale range of each A/D is proportional to the
reference voltage. The voltage reference is internally bypassed
and is not accessible to the user.
Digital Outputs
Portions of the device may be shut down to save power during
times when operation of the ADC is not required. Two power saving
modes are available: Nap, and Sleep. Nap mode reduces power
dissipation to less than 95mW and recovers to normal operation in
approximately 1µs. Sleep mode reduces power dissipation to less
than 6mW but requires approximately 1ms to recover from a sleep
command.
Wake-up from Sleep Mode Sequence (CSB high):
• Pull CSB low
Output data is available as a parallel bus in LVDS-compatible or
CMOS Double Data Rate (DDR) modes. When CLKOUT is low the
MSB and all odd logical bits are output, while on the high phase
the LSB and all even logical bits are presented. Figures 3 and 4
show the timing relationships for LVDS/CMOS DDR modes.
The KAD5510P is only offered in the 48-QFN package with five
LVDS data output pin pairs. It only supports outputs in DDR
mode.
LVDS output drive current can be set to a nominal 3mA or a
power-saving 2mA. The lower current setting can be used in
designs where the receiver is in close physical proximity to the
ADC. The applicability of this setting is dependent upon the PCB
layout, therefore the user should experiment to determine if
performance degradation is observed.
The output mode and LVDS drive current are selected via SPI
registers. Details are contained in “Serial Peripheral Interface” on
page 21.
Care should be taken when using the DDR CMOS outputs at clock
rates greater than 200MHz. Series termination resistors close to
the ADC should drive short traces with minimum parasitic
loading to assure adequate signal integrity.
• Wait 150µs
• Write ‘001x’ to Register 25
• Wait 1ms until ADC fully powered on
In an application where CSB was kept low in sleep mode, the
150µs CSB setup time is not required as the SPI registers are
powered on when CSB is low, the chip power dissipation
increases by ~ 15mW in this case. The 1ms wake-up time after
the write of a ‘001x’ to register 25 still applies. It is generally
recommended to keep CSB high in sleep mode to avoid any
unintentional SPI activity on the ADC.
All digital outputs (Data, CLKOUT and OR) are placed in a high
impedance state during Nap or Sleep. The input clock should
remain running and at a fixed frequency during Nap or Sleep, and
CSB should be high. Recovery time from Nap mode will increase
if the clock is stopped, since the internal DLL can take up to 52µs
to regain lock at 250MSPS.
By default after the device is powered on, the operational state is
controlled by the NAPSLP pin as shown in Table 1 on page 19.
An external resistor creates the bias for the LVDS drivers. A 10kΩ,
1% resistor must be connected from the RLVDS pin to OVSS.
Submit Document Feedback
18
FN7693.3
February 8, 2016
KAD5510P
TABLE 1. NAPSLP PIN SETTINGS
NAPSLP PIN
MODE
AVSS
Normal
Float
Sleep
AVDD
Nap
The power-down mode can also be controlled through the SPI
port, which overrides the NAPSLP pin setting. Details on this are
contained in “Serial Peripheral Interface” on page 21. This is an
indexed function when controlled from the SPI, but a global
function when driven from the pin.
BINARY
9
8
7
••••
1
0
••••
GRAY CODE
9
8
••••
7
1
0
FIGURE 33. BINARY TO GRAY CODE CONVERSION
Data Format
Output data can be presented in three formats: two’s complement,
Gray code and offset binary. The data format can be controlled
through the SPI port. Details on this are contained in “Serial
Peripheral Interface” on page 21.
GRAY CODE
9
8
7
Offset binary coding maps the most negative input voltage to
code 0x000 (all zeros) and the most positive input to 0xFFF (all
ones). Two’s complement coding simply complements the MSB
of the offset binary representation.
••••
1
0
••••
When calculating Gray code the MSB is unchanged. The
remaining bits are computed as the XOR of the current bit
position and the next most significant bit. Figure 33 shows this
operation.
••••
Converting back to offset binary from Gray code must be done
recursively, using the result of each bit for the next lower bit as
shown in Figure 34.
Mapping of the input voltage to the various data formats is
shown in Table 2.
BINARY
9
8
7
••••
1
0
FIGURE 34. GRAY CODE TO BINARY CONVERSION
TABLE 2. INPUT VOLTAGE TO OUTPUT CODE MAPPING
INPUT VOLTAGE
OFFSET BINARY
TWO’S COMPLEMENT
GRAY CODE
–Full Scale
000 00 000 00
100 00 000 00
000 00 000 00
–Full Scale + 1LSB
000 00 000 01
100 00 000 01
000 00 000 01
Mid–Scale
100 00 000 00
000 00 000 00
110 00 000 00
+Full Scale – 1LSB
111 11 111 10
011 11 111 10
100 00 000 01
+Full Scale
111 11 111 11
011 11 111 11
100 00 000 00
Submit Document Feedback
19
FN7693.3
February 8, 2016
KAD5510P
CSB
SCLK
SDIO
R/W
W1
W0
A12
A11
A1
A10
A0
D7
D6
D5
D4
D3
D2
D1D
0
D2
D3
D4
D5
D6
D7
FIGURE 35. MSB-FIRST ADDRESSING
CSB
SCLK
SDIO
A0
A1
A2
A11
A12
W0
W1
R/W
D1
D0
FIGURE 36. LSB-FIRST ADDRESSING
tDSW
CSB
tCLK
tHI
tDHW
tS
tH
tLO
SCLK
SDIO
R/W
W1
W0
A12
A11
A10
A9
A8
A7
D5
D4
D3
D2
D1
D0
SPI WRITE
FIGURE 37. SPI WRITE
tDSW
CSB
tDHW
tS
tCLK
tHI
tH
tDHR
tDVR
tLO
SCLK
WRITING A READ COMMAND
SDIO
R/W
W1
W0
A12
A11
A10
A9
A2
A1
READING DATA (3 WIRE MODE)
A0
D7
SDO
D6
D3
D2
D1 D0
(4 WIRE MODE)
D7
D3
D2
D1 D0
SPI READ
FIGURE 38. SPI READ
CSB STALLING
CSB
SCLK
SDIO
INSTRUCTION/ADDRESS
DATA WORD 1
DATA WORD 2
FIGURE 39. 2-BYTE TRANSFER
Submit Document Feedback
20
FN7693.3
February 8, 2016
KAD5510P
LAST LEGAL
CSB STALLING
CSB
SCLK
SDIO
INSTRUCTION/ADDRESS
DATA WORD 1
DATA WORD N
FIGURE 40. N-BYTE TRANSFER
Serial Peripheral Interface
A Serial Peripheral Interface (SPI) bus is used to facilitate
configuration of the device and to optimize performance. The SPI
bus consists of Chip-Select Bit (CSB), Serial Clock (SCLK) Serial
Data Output (SDO) and Serial Data Input/Output (SDIO). The
maximum SCLK rate is equal to the ADC sample rate (fSAMPLE)
divided by 16 for write operations and fSAMPLE divided by 66 for
reads. At fSAMPLE = 250MHz, maximum SCLK is 15.63MHz for
writing and 3.79MHz for read operations. There is no minimum
SCLK rate but the ADC clock (CLKP/CLKN) must be active to
access the SPI registers.
The following sections describe various registers that are used to
configure the SPI or adjust performance or functional
parameters. Many registers in the available address space (0x00
to 0xFF) are not defined in this document. Additionally, within a
defined register there may be certain bits or bit combinations
that are reserved. Undefined registers and undefined values
within defined registers are reserved and should not be selected.
Setting any reserved register or value may produce
indeterminate results.
SPI Physical Interface
The serial clock pin (SCLK) provides synchronization for the data
transfer. By default, all data is presented on the serial data
input/output (SDIO) pin in three-wire mode. The state of the SDIO
pin is set automatically in the communication protocol
(described in the following). A dedicated serial data output pin
(SDO) can be activated by setting 0x00[7] high to allow operation
in four-wire mode.
SDO should always be connected to OVDD with a 4.7kΩ resistor
even if not used. If the 4.7kΩ resistor is not present the ADC will
not exit the reset state.
The SPI port operates in a half duplex master/slave
configuration, with the KAD5510P functioning as a slave.
Multiple slave devices can interface to a single master in
three-wire mode only, since the SDO output of an unaddressed
device is asserted in four-wire mode.
The Chip-Select Bar (CSB) pin determines when a slave device is
being addressed. Multiple slave devices can be written to
concurrently, but only one slave device can be read from at a
given time (again, only in three-wire mode). If multiple slave
devices are selected for reading at the same time, the results will
be indeterminate.
The communication protocol begins with an instruction/address
phase. The first rising SCLK edge following a HIGH to LOW
transition on CSB determines the beginning of the two-byte
Submit Document Feedback
21
instruction/address command; SCLK must be static low before
the CSB transition. Data can be presented in MSB-first order or
LSB-first order. The default is MSB-first, but this can be changed
by setting 0x00[6] high. Figures 35 and 36 show the appropriate
bit ordering for the MSB-first and LSB-first modes, respectively. In
MSB-first mode the address is incremented for multi-byte
transfers, while in LSB-first mode it is decremented.
In the default mode, the MSB is R/W, which determines if the
data is to be read (active high) or written. The next two bits, W1
and W0, determine the number of data bytes to be read or
written (see Table 3). The lower 13 bits contain the first address
for the data transfer. This relationship is illustrated in Figure 37,
and timing values are given in “Switching Specifications” on
page 11.
After the instruction/address bytes have been read, the
appropriate number of data bytes are written to or read from the
ADC (based on the R/W bit status). The data transfer will
continue as long as CSB remains low and SCLK is active. Stalling
of the CSB pin is allowed at any byte boundary
(instruction/address or data) if the number of bytes being
transferred is three or less. For transfers of four bytes or more,
CSB is allowed stall in the middle of the instruction/address
bytes or before the first data byte. If CSB transitions to a high
state after that point the state machine will reset and terminate
the data transfer.
TABLE 3. BYTE TRANSFER SELECTION
[W1:W0]
BYTES TRANSFERRED
00
1
01
2
10
3
11
4 or more
Figures 39 and 40 illustrate the timing relationships for
2-byte and N-byte transfers, respectively. The operation for a
3-byte transfer can be inferred from these diagrams.
SPI Configuration
ADDRESS 0X00: CHIP_PORT_CONFIG
Bit ordering and SPI reset are controlled by this register. Bit order
can be selected as MSB to LSB (MSB first) or LSB to MSB (LSB
first) to accommodate various microcontrollers.
Bit 7 SDO Active
FN7693.3
February 8, 2016
KAD5510P
ADDRESS 0X20: OFFSET_COARSE AND
Bit 6 LSB First
Setting this bit high configures the SPI to interpret serial data
as arriving in LSB to MSB order.
Bit 5 Soft Reset
Setting this bit high resets all SPI registers to default values.
Bit 4 Reserved
This bit should always be set high.
Bits 3:0 These bits should always mirror bits 4:7 to avoid
ambiguity in bit ordering.
ADDRESS 0X21: OFFSET_FINE
The input offset of the ADC core can be adjusted in fine and
coarse steps. Both adjustments are made via an 8-bit word as
detailed in Table 4.
The default value of each register will be the result of the
self-calibration after initial power-up. If a register is to be
incremented or decremented, the user should first read the
register value then write the incremented or decremented value
back to the same register.
TABLE 4. OFFSET ADJUSTMENTS
ADDRESS 0X02: BURST_END
If a series of sequential registers are to be set, burst mode can
improve throughput by eliminating redundant addressing. In
3-wire SPI mode the burst is ended by pulling the CSB pin high. If
the device is operated in 2-wire mode the CSB pin is not
available. In that case, setting the burst_end address determines
the end of the transfer. During a write operation, the user must
be cautious to transmit the correct number of bytes based on the
starting and ending addresses.
Bits 7:0 Burst End Address
This register value determines the ending address of the burst
data.
Device Information
0x20[7:0]
COARSE OFFSET
0x21[7:0]
FINE OFFSET
Steps
255
255
–Full Scale (0x00)
-133LSB (-47mV)
-5LSB (-1.75mV)
Mid–Scale (0x80)
0.0LSB (0.0mV)
0.0LSB
+Full Scale (0xFF)
+133LSB (+47mV)
+5LSB (+1.75mV)
Nominal Step Size
1.04LSB (0.37mV)
0.04LSB (0.014mV)
ADDRESS 0X22: GAIN_COARSE
ADDRESS 0X23: GAIN_MEDIUM
ADDRESS 0X24: GAIN_FINE
ADDRESS 0X08: CHIP_ID
ADDRESS 0X09: CHIP_VERSION
The generic die identifier and a revision number, respectively, can
be read from these two registers.
Indexed Device Configuration/Control
ADDRESS 0X10: DEVICE_INDEX_A
A common SPI map, which can accommodate single-channel or
multichannel devices, is used for all Intersil ADC products.
Certain configuration commands (identified as Indexed in the SPI
map) can be executed on a per-converter basis. This register
determines which converter is being addressed for an Indexed
command. It is important to note that only a single converter can
be addressed at a time.
This register defaults to 00h, indicating that no ADC is
addressed. Therefore Bit 0 must be set high in order to execute
any Indexed commands. Error code ‘AD’ is returned if any
indexed register is read from without properly setting
device_index_A.
Submit Document Feedback
PARAMETER
22
Gain of the ADC core can be adjusted in coarse, medium and fine
steps. Coarse gain is a 4-bit adjustment while medium and fine
are 8-bit. Multiple Coarse Gain bits can be set for a total
adjustment range of ±4.2% (‘0011’ =~ -4.2% and
‘1100’ =~ +4.2%). It is recommended to use one of the coarse
gain settings (-4.2%, -2.8%, -1.4%, 0, 1.4%, 2.8%, 4.2%) and
fine-tune the gain using the registers at 23h and 24h.
The default value of each register will be the result of the
self-calibration after initial power-up. If a register is to be
incremented or decremented, the user should first read the
register value then write the incremented or decremented value
back to the same register.
TABLE 5. COARSE GAIN ADJUSTMENT
0x22[3:0]
NOMINAL COARSE GAIN ADJUST
(%)
Bit 3
+2.8
Bit 2
+1.4
Bit 1
-2.8
Bit 0
-1.4
FN7693.3
February 8, 2016
KAD5510P
TABLE 6. MEDIUM AND FINE GAIN ADJUSTMENTS
PARAMETER
0x23[7:0]
MEDIUM GAIN
0x24[7:0]
FINE GAIN
Steps
256
256
–Full Scale (0x00)
-2%
-0.20%
Mid–Scale (0x80)
0.00%
0.00%
+Full Scale (0xFF)
+2%
+0.2%
Nominal Step Size
0.016%
0.0016%
Bit 0 at address 71h followed by writing a ‘1’ to Bit 0 at address
71h (32 sclk cycles).
CLK = CLKP – CLKN
CLK
1.00ns
CLK÷4
4.00ns
CLK÷4
SLIP ONCE
ADDRESS 0X25: MODES
Two distinct reduced power modes can be selected. By default,
the tri-level NAPSLP pin can select normal operation or sleep
modes (refer to “Nap/Sleep” on page 18). This functionality can
be overridden and controlled through the SPI. This is an indexed
function when controlled from the SPI, but a global function
when driven from the pin. This register is not changed by a soft
reset.
TABLE 7. POWER-DOWN CONTROL
CLK÷4
SLIP TWICE
FIGURE 41. PHASE SLIP: CLK4 MODE, fCLOCK = 1000MHz
ADDRESS 0X72: CLOCK_DIVIDE
The KAD5510P has a selectable clock divider that can be set to
divide by four, two or one (no division, refer to “Clock Input” on
page 17). This functionality can be controlled through the SPI, as
shown in Table 8. This register is not changed by a soft reset.
VALUE
0x25[2:0]
POWER-DOWN MODE
000
Pin Control
001
Normal Operation
010
Nap Mode
VALUE
0x72[2:0]
CLOCK DIVIDER
100
Sleep Mode
000
Pin Control
001
Divide by 1
Nap mode must be entered by executing the following sequence:
SEQUENCE
REGISTER
VALUE
1
0x10
0x01
2
0x25
0x02
3
0x10
0x02
4
0x25
0x02
Return to normal operation as follows:
TABLE 8. CLOCK DIVIDER SELECTION
010
Divide by 2
100
Divide by 4
ADDRESS 0X73: OUTPUT_MODE_A
The output_mode_A register controls the physical output format
of the data, as well as the logical coding. The KAD5510P can
present output data in two physical formats: LVDS or LVCMOS.
Additionally, the drive strength in LVDS mode can be set high
(3mA) or low (2mA). This functionality can be controlled through
the SPI, as shown in Table 9.
TABLE 9. OUTPUT MODE CONTROL
SEQUENCE
REGISTER
VALUE
VALUE
0x93[7:5]
1
0x10
0x01
000
Pin Control
2
0x25
0x01
001
LVDS 2mA
3
0x10
0x02
010
LVDS 3mA
4
0x25
0x01
100
LVCMOS
Global Device Configuration/Control
ADDRESS 0X71: PHASE_SLIP
When using the clock divider, it’s not possible to determine the
synchronization of the incoming and divided clock phases. This is
particularly important when multiple ADCs are used in a
time-interleaved system. The phase slip feature allows the rising
edge of the divided clock to be advanced by one input clock cycle
when in CLK/4 mode, as shown in Figure 41. Execution of a
phase_slip command is accomplished by first writing a ‘0’ to
Submit Document Feedback
23
Data can be coded in three possible formats: two’s complement,
Gray code or offset binary. This functionality can be controlled
through the SPI, as shown in Table 10.
This register is not changed by a soft reset.
TABLE 10. OUTPUT FORMAT CONTROL
VALUE
0x93[2:0]
OUTPUT FORMAT
000
Pin Control
FN7693.3
February 8, 2016
KAD5510P
TABLE 10. OUTPUT FORMAT CONTROL (Continued)
VALUE
0x93[2:0]
OUTPUT FORMAT
001
Two’s Complement
010
Gray Code
100
Offset Binary
ADDRESS 0XC0: TEST_IO
Bits 7:6 User Test Mode
These bits set the test mode to static (0x00) or alternate
(0x01) mode. Other values are reserved.
The four LSBs in this register (Output Test Mode) determine the
test pattern in combination with registers 0xC2 through 0xC5.
Refer to Table 12.
ADDRESS 0X74: OUTPUT_MODE_B
TABLE 12. OUTPUT TEST MODES
ADDRESS 0X75: CONFIG_STATUS
Bit 6 DLL Range
This bit sets the DLL operating range to fast (default) or slow.
Internal clock signals are generated by a Delay-Locked Loop
(DLL), which has a finite operating range. Table 11 shows the
allowable sample rate ranges for the slow and fast settings.
TABLE 11. DLL RANGES
VALUE
0xC0[3:0]
OUTPUT TEST MODE
0000
Off
0001
Midscale
WORD 1
WORD 2
0x8000
N/A
0010
Positive Full-Scale
0xFFFF
N/A
0011
Negative Full-Scale
0x0000
N/A
0100
Checkerboard
0xAAAA
0x5555
0101
Reserved
N/A
N/A
DLL RANGE
MIN
MAX
UNIT
Slow
40
100
MSPS
0110
Reserved
N/A
N/A
MSPS
0111
One/Zero
0xFFFF
0x0000
1000
User Pattern
user_patt1
user_patt2
Fast
80
fS MAX
The output_mode_B and config_status registers are used in
conjunction to enable DDR mode and select the frequency range
of the DLL clock generator. The method of setting these options
is different from the other registers.
ADDRESS 0XC2: USER_PATT1_LSB AND
ADDRESS 0XC3: USER_PATT1_MSB
These registers define the lower and upper eight bits,
respectively, of the first user-defined test word.
READ
OUTPUT_MODE_B
0x74
ADDRESS 0XC4: USER_PATT2_LSB AND
READ
CONFIG_STATUS
0x75
WRITE TO
0x74
DESIRED
VALUE
FIGURE 42. SETTING OUTPUT_MODE_B REGISTER
The procedure for setting output_mode_B is shown in Figure 42.
Read the contents of output_mode_B and config_status and XOR
them. Then XOR this result with the desired value for
output_mode_B and write that XOR result to the register.
Bit 4 DDR Enable
This bit sets the output mode to DDR or SDR.
This bit is set high by default enabling DDR outputs. Do not set
this bit low or invalid output data will result.
Device Test
The KAD5510 can produce preset or user defined patterns on the
digital outputs to facilitate in-site testing. A static word can be
placed on the output bus, or two different words can alternate. In
the alternate mode, the values defined as Word 1 and Word 2 (as
shown in Table 12) are set on the output bus on alternating clock
phases. The test mode is enabled asynchronously to the sample
clock, therefore several sample clock cycles may elapse before
the data is present on the output bus.
Submit Document Feedback
24
ADDRESS 0XC5: USER_PATT2_MSB
These registers define the lower and upper eight bits,
respectively, of the second user-defined test word.
48-Pin Package Notes
The KAD5510 is only available in a 48-pin package. While fully
compatible with other family members in the 48-pin package
there are some key differences from the 72-pin package. The
48-pin package option supports LVDS DDR only. A reduced set of
pin selectable functions are available in the 48-pin package due
to the reduced pinout; (OUTMODE, OUTFMT, and CLKDIV pins are
not available). Table 13 shows the default state for these
functions for the 48-pin package. Note that these functions are
available through the SPI, allowing a user to set these modes as
they desire, offering the same flexibility as the 72-pin family
members.
TABLE 13. 48 PIN SPI - ADDRESSABLE FUNCTIONS
FUNCTION
DESCRIPTION
DEFAULT STATE
CLKDIV
Clock Divider
Divide by 1
OUTMODE
Output Driver Mode
LVDS, 3mA (DDR)
OUTFMT
Data Coding
Two’s Complement
FN7693.3
February 8, 2016
KAD5510P
SPI Memory Map
INDEXED DEVICE CONFIG/CONTROL
INFO
SPI CONFIG
TABLE 14. SPI MEMORY MAP
ADDR
(HEX)
PARAMETER
NAME
BIT 7
(MSB)
00
port_config
SDO
Active
01
Reserved
Reserved
02
burst_end
Burst end address [7:0]
03-07
Reserved
Reserved
08
chip_id
09
chip_version
10
device_index_A
11-1F
Reserved
Reserved
20
offset_coarse
21
offset_fine
22
gain_coarse
23
gain_medium
24
gain_fine
25
modes
26-5F
Reserved
Reserved
60-6F
Reserved
Reserved
70
Reserved
Reserved
71
phase_slip
BIT 5
LSB First
Soft
Reset
BIT 2
BIT 1
BIT 0
(LSB)
DEF. VALUE
(HEX)
INDEXED/
GLOBAL
Mirror
(bit5)
Mirror
(bit6)
Mirror
(bit7)
00h
G
00h
G
Chip ID #
Read only
G
Chip Version #
Read only
G
00h
I
Coarse Offset
cal. value
I
Fine Offset
cal. value
I
cal. value
I
Medium Gain
cal. value
I
Fine Gain
cal. value
I
00h
Not
affected by
soft reset
I
00h
G
Clock Divide [2:0]
000 = Pin Control
001 = Divide by 1
010 = Divide by 2
100 = Divide by 4
other codes = Reserved
00h
Not
affected by
soft reset
G
Output Format [2:0]
000 = Pin Control
001 = Twos Complement
010 = Gray Code
100 = Offset Binary
other codes = Reserved
00h
Not
affected by
soft reset
G
BIT 4
BIT 3
Reserved
Reserved
ADC00
Coarse Gain
Reserved
Power-Down Mode [2:0]
000 = Pin Control
001 = Normal Operation
010 = Nap
100 = Sleep
other codes = Reserved
Reserved
72
GLOBAL DEVICE CONFIG/CONTROL
BIT 6
clock_divide
73
output_mode_A
74
output_mode_B
DLL Range
0 = Fast
1 = Slow
DDR
Enable
(Note 14)
00h
Not
affected by
soft reset
G
75
config_status
XOR
Result
XOR
Result
Read Only
G
76-BF
Reserved
Submit Document Feedback
Output Mode [2:0]
000 = Pin Control
001 = LVDS 2mA
010 = LVDS 3mA
100 = LVCMOS
other codes = Reserved
Next
Clock
Edge
Reserved
25
FN7693.3
February 8, 2016
KAD5510P
Device Test
TABLE 14. SPI MEMORY MAP (Continued)
ADDR
(HEX)
PARAMETER
NAME
C0
test_io
BIT 7
(MSB)
BIT 6
BIT 5
BIT 4
BIT 3
BIT 2
BIT 1
BIT 0
(LSB)
Output Test Mode [3:0]
User Test Mode [1:0]
00 = Single
01 = Alternate
10 = Reserved
11 = Reserved
0 = Off
1 = Midscale Short
2 = +FS Short
3 = -FS Short
4 = Checker Board
5 = Reserved
6 = Reserved
DEF. VALUE
(HEX)
INDEXED/
GLOBAL
00h
G
00h
G
7 = One/Zero Word
Toggle
8 = User Input
9 to 15 = Reserved
C1
Reserved
Reserved
C2
user_patt1_lsb
B7
B6
B5
B4
B3
B2
B1
B0
00h
G
C3
user_patt1_msb
B15
B14
B13
B12
B11
B10
B9
B8
00h
G
C4
user_patt2_lsb
B7
B6
B5
B4
B3
B2
B1
B0
00h
G
C5
user_patt2_msb
B15
B14
B13
B12
B11
B10
B9
B8
00h
G
C6-FF
Reserved
Reserved
NOTE:
14. At power-up, the DDR Enable bit is set to a logic ‘1’ internally for the 48 pin package by an internal pull-up. Do not set this bit low or invalid output data
will result.
Submit Document Feedback
26
FN7693.3
February 8, 2016
KAD5510P
Equivalent Circuits
AVDD
TO
CLOCKPHASE
GENERATION
AVDD
CLKP
AVDD
CSAMP
1.6pF
TO
CHARGE
PIPELINE

F3
INP
2
F
1
F
Ω
1000O
CSAMP
1.6pF
AVDD
TO
CHARGE
PIPELINE
3
F
INN
2
F
1
F
AVDD
11k
AVDD

CLKN
(20k PULL-UP
ON RESETN
ONLY)
Ω
75kO
TO
SENSE
LOGIC
Ω
75kO
Ω
280O
INPUT
18k

FIGURE 44. CLOCK INPUTS
AVDD
AVDD

AVDD 11k
FIGURE 43. ANALOG INPUTS
AVDD
18k 

OVDD
OVDD
OVDD
20k
INPUT
TO
LOGIC
280
Ω
75kO
Ω
75kO
FIGURE 45. TRI-LEVEL DIGITAL INPUTS
FIGURE 46. DIGITAL INPUTS
OVDD
2mA OR
3mA
OVDD
DATA
DATA
D[11:0]P
OVDD
OVDD
OVDD
D[11:0]N
DATA
DATA
DATA
D[11:0]
2mA OR
3mA
FIGURE 47. LVDS OUTPUTS
Submit Document Feedback
27
FIGURE 48. CMOS OUTPUTS
FN7693.3
February 8, 2016
KAD5510P
Equivalent Circuits
(Continued)
AVDD
VCM
0.535V
+
–
FIGURE 49. VCM_OUT OUTPUT
ADC Evaluation Platform
Intersil offers an ADC Evaluation platform, which can be used to
evaluate any of the KADxxxxx ADC family. The platform consists
of a FPGA based data capture motherboard and a family of ADC
daughtercards. This USB based platform allows a user to quickly
evaluate the ADC’s performance at a user’s specific application
frequency requirements. More information is available at:
http://www.intersil.com/converters/adc_eval_platform/
Layout Considerations
bypass capacitors very close to device pins. Longer traces will
increase inductance, resulting in diminished dynamic
performance and accuracy. Make sure that connections to
ground are direct and low impedance. Avoid forming ground
loops.
LVDS Outputs
Output traces and connections must be designed for 50Ω (100Ω
differential) characteristic impedance. Keep traces direct and
minimize bends where possible. Avoid crossing ground and
power-plane breaks with signal traces.
LVCMOS Outputs
PCB Layout Example
For an example application circuit and PCB layout, please refer to
the evaluation board documentation provided in the web product
folder at:
• KAD5510P-12
• KAD5510P-17
Output traces and connections must be designed for 50Ω
characteristic impedance. Care should be taken when using the
DDR CMOS outputs at clock rates greater than 200MHz. Series
termination resistors close to the ADC should drive short traces
with minimum parasitic loading to assure adequate signal
integrity
• KAD5510P-21
Unused Inputs
• KAD5510P-25
Standard logic inputs (RESETN, CSB, SCLK, SDIO), which will not
be operated do not require connection to ensure optimal ADC
performance. These inputs can be left floating if they are not
used. The SDO output must be connected to OVDD with a 4.7kΩ
resistor or the ADC will not exit the reset state. Tri-level inputs
(NAPSLP) accept a floating input as a valid state, and therefore
should be biased according to the desired functionality.
Split Ground and Power Planes
Data converters operating at high sampling frequencies require
extra care in PC board layout. Many complex board designs
benefit from isolating the analog and digital sections. Analog
supply and ground planes should be laid out under signal and
clock inputs. Locate the digital planes under outputs and logic
pins. Grounds should be joined under the chip.
Clock Input Considerations
Use matched transmission lines to the transformer inputs for the
analog input and clock signals. Locate transformers and
terminations as close to the chip as possible.
General PowerPAD Design
Considerations
Figure 50 is a generic illustration of how to use vias to remove
heat from a QFN package with an exposed thermal pad. A
specific example can be found in the evaluation board PCB
layout previously referenced.
Exposed Paddle
The exposed paddle must be electrically connected to analog
ground (AVSS) and should be connected to a large copper plane
using numerous vias for optimal thermal performance.
Bypass and Filtering
Bulk capacitors should have low equivalent series resistance.
Tantalum is a good choice. For best performance, keep ceramic
Submit Document Feedback
28
FIGURE 50. PCB VIA PATTERN
FN7693.3
February 8, 2016
KAD5510P
Filling the exposed thermal pad area with vias provides optimum
heat transfer to the PCB’s internal plane(s). Vias should be evenly
distributed from edge-to-edge on the exposed pad to maintain a
constant temperature across the entire pad. Setting the
center-to-center spacing of the vias at three times the via pad
radius will provide good heat transfer for high power devices. The
vias below the KAD5510P may be spaced further apart as shown
on the evaluation board since it is a low-power device. The via
diameter should be small but not too small to allow solder
wicking during reflow. PCB fabrication and assembly companies
can provide specific guidelines based on the layer stack and
assembly process.
Connect all vias under the KAD5510P to AVSS. It is important to
maximize the heat transfer by avoiding the use of “thermal relief”
patterns when connecting the vias to the internal AVSS plane(s).
Definitions
Analog Input Bandwidth is the analog input frequency at which
the spectral output power at the fundamental frequency (as
determined by FFT analysis) is reduced by 3dB from its full-scale
low-frequency value. This is also referred to as Full Power
Bandwidth.
Aperture Delay or Sampling Delay is the time required after the
rise of the clock input for the sampling switch to open, at which
time the signal is held for conversion.
Aperture Jitter is the RMS variation in aperture delay for a set of
samples.
Clock Duty Cycle is the ratio of the time the clock wave is at logic
high to the total time of one clock period.
Differential Non-Linearity (DNL) is the deviation of any code width
from an ideal 1 LSB step.
Effective Number of Bits (ENOB) is an alternate method of
specifying Signal to Noise-and-Distortion Ratio (SINAD). In dB, it
is calculated as: ENOB = (SINAD - 1.76)/6.02
Integral Non-Linearity (INL) is the maximum deviation of the
ADC’s transfer function from a best fit line determined by a least
squares curve fit of that transfer function, measured in units of
LSBs.
Least Significant Bit (LSB) is the bit that has the smallest value or
weight in a digital word. Its value in terms of input voltage is
VFS/(2N-1) where N is the resolution in bits.
Missing Codes are output codes that are skipped and will never
appear at the ADC output. These codes cannot be reached with
any input value.
Most Significant Bit (MSB) is the bit that has the largest value or
weight.
Pipeline Delay is the number of clock cycles between the
initiation of a conversion and the appearance at the output pins
of the data.
Power Supply Rejection Ratio (PSRR) is the ratio of the observed
magnitude of a spur in the ADC FFT, caused by an AC signal
superimposed on the power supply voltage.
Signal to Noise-and-Distortion (SINAD) is the ratio of the RMS
signal amplitude to the RMS sum of all other spectral
components below one half the clock frequency, including
harmonics but excluding DC.
Signal-to-Noise Ratio (without Harmonics) is the ratio of the RMS
signal amplitude to the RMS sum of all other spectral
components below one-half the sampling frequency, excluding
harmonics and DC.
SNR and SINAD are either given in units of dB when the power of
the fundamental is used as the reference, or dBFS (dB to full
scale) when the converter’s full-scale input power is used as the
reference.
Spurious-Free-Dynamic Range (SFDR) is the ratio of the RMS
signal amplitude to the RMS value of the largest spurious
spectral component. The largest spurious spectral component
may or may not be a harmonic.
Gain Error is the ratio of the difference between the voltages that
cause the lowest and highest code transitions to the full-scale
voltage less 2 LSB. It is typically expressed in percent.
Submit Document Feedback
29
FN7693.3
February 8, 2016
KAD5510P
Revision History
DATE
REVISION
CHANGE
February 8, 2016
FN7693.3
Applied Intersil’s new standards throughout datasheet.
In the Electrical Specification table on page 7 updated the following:
-Changed the maximum specs for all four devices for NAP Mode.
-Changed the maximum specifications for all four devices for 1.8V Analog Supply Current (IAVDD).
Replaced Products section with About Intersil.
April 7, 2011
FN7693.2
Corrected Figure number from 1 to 4 for “DDR CMOS TIMING DIAGRAM (See “Digital Outputs” on page 18)” on
page 10 (duplicate Figure #)
Corrected Figure number from 1 to 3 for "DDR LVDS TIMING DIAGRAM (See “Digital Outputs” on page 18)" on page
10 (duplicate Figure #)
Corrected Figure 11 on page 13 to match “Electrical Specifications” table on page 7.
January 3, 2011
FN7693.1
Initial release to web.
About Intersil
Intersil Corporation is a leading provider of innovative power management and precision analog solutions. The company's products
address some of the largest markets within the industrial and infrastructure, mobile computing and high-end consumer markets.
For the most updated datasheet, application notes, related documentation and related parts, please see the respective product
information page found at www.intersil.com.
You may report errors or suggestions for improving this datasheet by visiting www.intersil.com/ask.
Reliability reports are also available from our website at www.intersil.com/support.
For additional products, see www.intersil.com/en/products.html
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
Submit Document Feedback
30
FN7693.3
February 8, 2016
KAD5510P
Package Outline Drawing
L48.7x7E
48 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE
Rev 1, 2/09
7.00
PIN 1
INDEX AREA
PIN 1
INDEX AREA
4X 5.50
A
6
B
37
6
48
1
36
44X 0.50
Exp. DAP
5.60 Sq.
7.00
(4X)
12
25
0.15
24
13
48X 0.25
48X 0.40
TOP VIEW
4
0.10 M C A B
BOTTOM VIEW
SEE DETAIL "X"
0.90 Max
0.10 C
C
0.08 C
SEATING PLANE
SIDE VIEW
44X 0.50
6.80 Sq
C
48X 0.25
0 . 2 REF
5
5.60 Sq
0 . 00 MIN.
0 . 05 MAX.
DETAIL "X"
48X 0.60
TYPICAL RECOMMENDED LAND PATTERN
NOTES:
1.
Dimensions are in millimeters.
Dimensions in ( ) for Reference Only.
2. Dimensioning and tolerancing conform to AMSEY14.5m-1994.
3. Unless otherwise specified, tolerance : Decimal ± 0.05
4. Dimension b applies to the metallized terminal and is measured
between 0.15mm and 0.30mm from the terminal tip.
5. Tiebar shown (if present) is a non-functional feature.
6. The configuration of the pin #1 identifier is optional, but must be
located within the zone indicated. The pin #1 identifier may be
either a mold or mark feature.
Submit Document Feedback
31
FN7693.3
February 8, 2016
Similar pages