ESD102-U2-099EL Data Sheet (1.6 MB, EN)

TVS Diodes
Transient Voltage Suppressor Diodes
ESD102-U2-099EL
2-Line Ultra-low Capacitance ESD / Transient Protection Diodes
ESD102-U2-099EL
Data Sheet
Revision 1.1, 2013-05-15
Final
Power Management & Multimarket
Edition 2013-05-15
Published by
Infineon Technologies AG
81726 Munich, Germany
© 2013 Infineon Technologies AG
All Rights Reserved.
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ESD102-U2-099EL
Revision History: Revision 1.0, 2013-03-21
Page or Item
Subjects (major changes since previous revision)
Revision 1.1, 2013-05-15
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Instruments Incorporated. VXWORKS™, WIND RIVER™ of WIND RIVER SYSTEMS, INC. ZETEX™ of Diodes
Zetex Limited.
Last Trademarks Update 2010-06-09
Final Data Sheet
3
Revision 1.1, 2013-05-15
ESD102-U2-099EL
2-Line Ultra-low Capacitance ESD / Transient Protection Diodes
1
2-Line Ultra-low Capacitance ESD / Transient Protection Diodes
1.1
Features
•
•
•
•
•
•
•
ESD / transient protection of high speed data lines exceeding:
– IEC61000-4-2 (ESD): ±20 kV (air / contact)
– IEC61000-4-4 (EFT): ±2.5 kV / 50 A (5/50ns)
– IEC61000-4-5 (Surge): ±3 A (8/20μs)
Maximum working voltage: VRWM = 3.3 V
Ultra low capacitance CL = 0.4 pF (typ.) I/O to GND, 0.2 pF (typ.) I/O to I/O
Very low clamping voltage: VCL = 8 V (typ.) at IPP = 16 A
Very low dynamic resistance: RDYN = 0.19 Ω (typ.)
TSLP-4-10 package with pad pitch 0.4 mm, smallest 2 line package
Pb-free and halogen free package (RoHS compliant)
1.2
•
•
•
Application Examples
USB 3.0, 10/100/1000 Ethernet, Firewire
DVI, HDMI, S-ATA, DisplayPort
Mobile HDMI Link, MDDI, MIPI, etc.
1.3
Product Description
ESD102-U2-099EL
TSLP-4-x
Pin 1
A1
A2
B1
B2
Pin 1
Pin 4
A1
A2
B1
Pin 2
B2
Pin 3
b) Schematic diagram
a) Pin configuration
PG-TSLP-4-x_Dual_Diode_PinConf_and_SchematicDiag.vsd
Figure 1
Pin Configuration and Schematic Diagram
Table 1
Ordering Information
Type
Package
Configuration
Marking code
ESD102-U2-099EL
TSLP-4-10
2 Lines anti-parallel, uni-directional
B
Final Data Sheet
4
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ESD102-U2-099EL
Characteristics
2
Characteristics
Table 2
Maximum Rating at TA = 25 °C, unless otherwise specified
Parameter
Symbol
Values
Unit
Min.
Typ.
Max.
VESD
-20
–
20
kV
IPP
-3
–
3
A
Operating temperature
TOP
-40
–
125
°C
Storage temperature
1) VESD according to IEC61000-4-2
2) IPP according to IEC61000-4-5
Tstg
-65
–
150
°C
ESD air / contact discharge
1)
Peak pulse current (tp = 8/20 μs)
2.1
2)
Electrical Characteristics at TA = 25 °C, unless otherwise specified
VF
Forward voltage
IF
Forward current
VR
IR
IF
RDYN
V Trig
I PP
Reverse voltage
VCL
RDYN
Reverse current
VHold
V RWM
VHold
VTrig
VR
VRWM
VCL
VFC
VF
Dynamic resistance
Triggering reverse voltage
Clamping voltage
Holding reverse voltage
Reverse working voltage maximum
VFC
Forward clamping voltage
ITrig
Triggering reverse current
ITrig
IHold
Holding reverse current
IHold
IPP
IRWM
IRWM
RDYN
Peak pulse current
Reverse working current maximum
-I PP
IR
Diode_Charac teris tic _Curv e_with _s napbac k_Uni-direc tional .v s d
Figure 2
Definitions of electrical characteristics[1]
Table 3
DC Characteristics at TA = 25 °C, unless otherwise specified
Parameter
Symbol
Values
Unit
Note /
Test Condition
Min.
Typ.
Max.
Reverse working voltage VRWM
–
–
3.3
V
I/O to GND
Reverse current
–
1
50
nA
VR = 3.3 V,
I/O to GND
Final Data Sheet
IR
5
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ESD102-U2-099EL
Characteristics
Table 4
RF Characteristics at TA = 25 °C, unless otherwise specified
Parameter
Symbol
1)
Line capacitance
CL
Values
Unit
Note /
Test Condition
Min.
Typ.
Max.
–
0.4
0.65
pF
VR = 0 V, f = 1 MHz,
I/O to GND
–
0.2
0.35
pF
VR = 0 V, f = 1 MHz,
I/O to I/O
Channel capacitance
matching between
I/O to GND
∆Ci/o-GND –
Channel capacitance
matching between
I/O to I/O
∆Ci/o-i/o
–
0.01
–
pF
VR = 0 V, f = 1 MHz,
I/O to GND
0.005
–
pF
VR = 0 V, f = 1 MHz,
I/O to I/O
1) Total capacitance line to ground
Table 5
ESD Characteristics at TA = 25 °C, unless otherwise specified
Parameter
Symbol
1)
Clamping voltage [2]
Forward clamping
voltage1) [2]
Dynamic resistance1) [2]
VCL
VFC
RDYN
Values
Unit
Note /
Test Condition
Min.
Typ.
Max.
–
8
–
V
ITLP = 16 A,
from I/O to GND
–
11
–
V
ITLP = 30 A,
from I/O to GND
–
6
–
V
ITLP = 16 A,
from GND to I/O
–
9
–
V
ITLP = 30 A,
from GND to I/O
–
0.19
–
Ω
I/O to GND
0.23
–
Ω
GND to I/O
1) Please refer to Application Note AN210. TLP parameter: Z0 = 50 Ω , tp = 100ns, tr = 300ps, averaging window: t1 = 30 ns
to t2 = 60 ns, extraction of dynamic resistance using least squares fit of TLP characteristic between ITLP1 = 10 A and
ITLP2 = 40 A.
–
Final Data Sheet
6
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ESD102-U2-099EL
Typical Characteristics at TA = 25 °C, unless otherwise specified
Typical Characteristics at TA = 25 °C, unless otherwise specified
10
-7
10
-8
10-9
IR [A]
3
10-10
10
-11
10-12
1
2
VR [V]
3
4
Reverse current, IR = (VR)
10
-6
10
-7
10
-8
IR [A]
Figure 3
0
10-9
25
50
75
100
125
150
TA [°C]
Figure 4
Reverse current: IR = f(TA), VR = 3.3 V
Final Data Sheet
7
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ESD102-U2-099EL
Typical Characteristics at TA = 25 °C, unless otherwise specified
0.8
0.7
CL [pF]
0.6
0.5
0.4
0.3
0.2
Figure 5
0
0.5
1
1.5
2
VR [V]
2.5
3
3.5
Line capacitance: CL = f(VR), f = 1MHz, from I/O to GND
Final Data Sheet
8
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ESD102-U2-099EL
Typical Characteristics at TA = 25 °C, unless otherwise specified
50
25
ESD102-U2-099EL
RDYN
40
20
30
15
20
10
10
5
0
0
-10
-5
-20
-10
Equivalent VIEC [kV]
ITLP [A]
RDYN = 0.19 Ω
RDYN = 0.23 Ω
-30
-15
-40
-20
-50
-25
-20
-15
-10
-5
0
5
10
15
20
-25
25
VTLP [V]
Figure 6
Clamping voltage VTLP = f(ITLP)[2]
Note: TLP parameter: Z0 = 50 Ω, tp = 100 ns, tr = 300 ps, averaging window: t1 = 30 ns to t2 = 60 ns, extraction of
dynamic resistance using least squares fit of TLP characteristic between ITLP1 = 10 A and ITLP2 = 40 A. The
equivalent stress level VIEC according IEC 61000-4-2 (R = 330 Ω, C = 150 pF) is calculated at the broad
peak of the IEC waveform at t = 30 ns with 2 A / kV
Final Data Sheet
9
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ESD102-U2-099EL
Typical Characteristics at TA = 25 °C, unless otherwise specified
5
ESD102-U2-099EL
RDYN
4
3
RDYN = 0.70 Ω
2
IPP [A]
1
0
-1
-2
RDYN = 0.44 Ω
-3
-4
-5
-10
Figure 7
-8
-6
-4
-2
0
VCL [V]
2
4
6
8
10
Pulse current (IEC61000-4-5) versus clamping voltage: IPP = f(VCL)
Final Data Sheet
10
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ESD102-U2-099EL
Typical Characteristics at TA = 25 °C, unless otherwise specified
80
Scope: 6 GHz, 20 GS/s
60
VCL [V]
VCL-max-peak = 81 [V]
VCL-30ns-peak = 7 [V]
40
20
0
-20
-100
Figure 8
0
100
200
300
400
tp [ns]
500
600
700
800
900
IEC61000-4-2 VCL = f(t), 8 kV positive pulse from pin 1 to pin 2
20
Scope: 6 GHz, 20 GS/s
0
VCL [V]
-20
VCL-max-peak = -72 [V]
-40
VCL-30ns-peak = -3 [V]
-60
-80
-100
Figure 9
0
100
200
300
400
tp [ns]
500
600
700
800
900
IEC61000-4-2 VCL = f(t), 8 kV negative pulse from pin 1 to pin 2
Final Data Sheet
11
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ESD102-U2-099EL
Typical Characteristics at TA = 25 °C, unless otherwise specified
100
Scope: 6 GHz, 20 GS/s
VCL [V]
80
VCL-max-peak = 104 [V]
VCL-30ns-peak = 9 [V]
60
40
20
0
-20
-100
Figure 10
0
100
200
300
400
tp [ns]
500
600
700
800
900
IEC61000-4-2 VCL = f(t), 15 kV positive pulse from pin 1 to pin 2
20
Scope: 6 GHz, 20 GS/s
0
VCL [V]
-20
-40
VCL-max-peak = -98 [V]
VCL-30ns-peak = -7 [V]
-60
-80
-100
-100
Figure 11
0
100
200
300
400
tp [ns]
500
600
700
800
900
IEC61000-4-2 VCL = f(t), 15 kV negative pulse from pin 1 to pin 2
Final Data Sheet
12
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ESD102-U2-099EL
Package Information
4
Package Information
4.1
TSLP-4-10 (mm)
+0.1
0.31-0.2
0.05 MAX.
0.75 ±0.035
0.25 ±0.035 1)
2
0.4
3
4
1
0.75 ±0.035
Bottom view
0.25 ±0.035 1)
Top view
0.4
Pin 1 marking
1) Dimension applies to plated terminals
Figure 12
TSLP-4-10-PO V01
TSLP-4-10: Package outline (dimension in mm)
0.4
0.4
0.25
TSLP-4-10-FP V01
Figure 13
TSLP-4-10: Footprint (dimension in mm)
0.92
Pin 1
marking
8
0.4
2
0.92
TSLP-4-10-TP V01
Figure 14
TSLP-4-10: Packing dimension in mm)
Pin 1 marking
1
Type code
TSLP-4-10-MK V01
Figure 15
TSLP-4-10: Marking (example)
Final Data Sheet
13
Revision 1.1, 2013-05-15
ESD102-U2-099EL
References
References
[1]
On-chip ESD protection for integrated circuits, Albert Z. H. Wang, ISBN:0-7923-7647-1
[2]
Infineon Technologie AG - Application Note AN210: Effective ESD Protection Design at System Level
Using VF-TLP Characterization Methodology
[3]
Infineon Technologie AG - Application Note AN240: Effective ESD Protection for USB3.0, combined with
perfect Signal Intergrity.
Final Data Sheet
14
Revision 1.1, 2013-05-15
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