HS-3530RH Low Power, Radiation Hardened Programmable Operational Amplifier August 1995 Features Pinout • Radiation Environment - Neutron Fluence (Φ) 5 x 1012 n/cm2 (E ≥ 10KeV) - Gamma Rate (γ) 1 x 109 RAD (Si)/s - Gamma Dose (γ) 1 x 106 RAD (Si) 8 LEAD METAL CAN PACKAGE (CAN) MIL-STD-1835 MACY1-X8 TOP VIEW ISET 8 • Wide Range AC Programming - Slew Rate 0.06 to 3V/µs - Gain X Bandwidth 100kHz to 5.0MHz OFFSET NULL INVERTING INPUT • Wide Range DC Programming - Power Supply Range ±3.0V to ±15V • Supply Current 10µA to 1.2mA 1 V+ 7 2 NON-INVERTING INPUT OUTPUT 6 OFFSET NULL 5 3 4 V- • Dielectrically Isolated Device Islands • Short Circuit Protection NOTE: 1. Case tied to V-. Description The HS-3530RH is a Low Power Operational Amplifier which is an internally compensated monolithic device offering a wide range of performance specifications. Parameters such as power dissipation, slew rate, bandwidth, noise and input DC parameters are programmed by selecting an external resistor or current source. Supply voltages as low as ±3V may be used with little degradation of AC performance. The HS-3530RH has been specifically designed to meet exposure to space radiation environments. Operation from -55oC to +125oC is guaranteed. Functional Diagram A major advantage of the HS-3530RH is that operating characteristics remain virtually constant over a wide supply range (±3V to ±15V), allowing the amplifier to offer maximum performance in almost any system, including battery operated equipment. A primary application for this device is in active filtering and conditioning for a wide variety of signals that differ in frequency and amplitude. Also, by modulating the set current, it can be used for designs such as current controlled oscillators/modulators, sample and hold circuits and variable active filters. +V OFFSET NULL 2 7 -IN +IN 2 5 6 3 OUT 8 1 4 ISET -V OFFSET NULL 1 Ordering Information TEMPERATURE RANGE PACKAGE HS2-3530RH-8 -55oC to +125oC 8 Lead Metal Can HS2-3530RH-Q -55oC to +125oC 8 Lead Metal Can +25oC 8 Lead Metal Can PART NUMBER DB NA HS2-3530RH/SAMPLE CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999 762 Spec Number File Number 518079 3024.2 Specifications HS-3530RH Absolute Maximum Ratings Reliability Information Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . . 40V Differential Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20V Voltage at Either Input Terminal . . . . . . . . . . . . . . . . . . . . . . V+ to VISET (Current at ISET) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500µA VSET (Voltage to GND at ISET). . . . . . . . . (V+ -2.0V) < VSET < V+ Output Short Circuit Duration (Note 1) . . . . . . . . . . . . . . . . Indefinite Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC Storage Temperature Range . . . . . . . . . . . . . . . . . -65oC to +150oC ESD Rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . <2000V Lead Temperature (Soldering 10s) . . . . . . . . . . . . . . . . . . . . . 275oC Thermal Resistance θJA θJC Metal Can Package . . . . . . . . . . . . . . . . . 160oC/W 70oC/W Maximum Package Power Dissipation at +125oC Ambient: Metal Can Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.31W If device power exceeds package dissipation capability, provide heat sinking or derate linearly at the following rate: Metal Can Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.3mW/oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Operating Conditions Operating Temperature Range . . . . . . . . . . . . . . . . -55oC to +125oC Operating Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . ±3V to ±15V VINcm ≤ 1/2 (V+ - V-) RL ≥ 2kV TABLE 1A. DC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: Supply Voltage = ±15V, RSOURCE = 100Ω, RLOAD = 500kΩ, VOUT = 0V, Unless Otherwise Specified. PARAMETER Input Offset Voltage Input Bias Current SYMBOL VIO Large Signal Voltage Gain +IB IIO +AVOL -AVOL Common Mode Rejection Ratio +CMRR -CMRR Output Voltage Swing VCM = 0V 1 2, 3 -IB Input Offset Current CONDITIONS GROUP A SUBGROUP +VOUT VCM = 0V, +RS = 10kΩ -RS = 100Ω Note 2 VCM = 0V, +RS = 100Ω -RS = 10kΩ Note 2 VCM = 0V, +RS = 10kΩ -RS = 10kΩ Note 2 VOUT = 0V and +10V Note 1 VOUT = 0V and -10V Note 1 ∆VCM = +5V, +V = +10V -V = -20V, VOUT = -5V ∆VCM = -5V, +V = +20V -V = -10V, VOUT = +5V Note 1 1 2, 3 Note 1 +IOUT -IOUT RL = 2kΩ RL = 2kΩ TEMPERATURE MIN MAX MIN MAX UNITS +25oC -3 3 -3 3 mV -5 5 -5 5 mV - - -40 40 nA - - -50 +50 nA +125oC, -55oC +25oC +125oC, 0oC -55oC - - -60 60 nA 1 +25oC - - -40 40 nA - - -50 +50 nA 2, 3 +125oC, 0oC 3 -55oC - - -60 60 nA 1 +25oC - - -15 15 nA - - -20 +20 nA 2, 3 +125oC, 0oC 3 -55oC - - -30 30 nA 4 +25oC 65 - 80 - kV/V 25 - 50 - kV/V 65 - 80 - kV/V 25 - 50 - kV/V 80 - 80 - dB 5, 6 4 5, 6 1 2, 3 +125oC, -55oC +25oC +125oC, -55oC +25oC +125oC, -55oC 80 - 80 - dB 1 +25oC 80 - 80 - dB 2, 3 +125oC, -55oC 80 - 80 - dB 1 +25oC 12.5 - 12.5 - V 10.5 - 10.5 - V - -12.5 - -12.5 V 1 2, 3 Output Current ISET = 15µA 3 2, 3 -VOUT ISET = 1.5µA +125oC, -55oC +25oC +125oC, -55oC - -10.5 - -10.5 V 1 +25oC 0.25 - 2.5 - mA 1 +25oC - -0.25 - -2.5 mA Spec Number 763 518079 Specifications HS-3530RH TABLE 1A. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) Device Tested at: Supply Voltage = ±15V, RSOURCE = 100Ω, RLOAD = 500kΩ, VOUT = 0V, Unless Otherwise Specified. PARAMETER Quiescent Power Supply Current SYMBOL +ICC CONDITIONS GROUP A SUBGROUP 1 IOUT = 0mA 2, 3 -ICC IOUT = 0mA 1 2, 3 Power Supply Rejection Ratio +PSRR -PSRR ∆VSUP = 10V +V = +10V, -V = -15V +V = +20V, -V = -15V ∆VSUP = 10V +V = +15V, -V = -10V +V = +15V, -V = -20V ISET = 1.5µA ISET = 15µA TEMPERATURE MIN MAX MIN MAX UNITS +25oC - 15 - 150 µA - 15 - 160 µA -15 - -150 - µA -15 - -160 - µA +125oC, -55oC +25oC +125oC, -55oC 1 +25oC 80 - 80 - dB 2, 3 +125oC, -55oC 80 - 80 - dB 1 +25oC 80 - 80 - dB 2, 3 +125oC, -55oC 80 - 80 - dB NOTES: 1. RL = 75kΩ at ISET = 1.5µA, RL = 5kΩ at ISET = 15µA. 2. Temperature 0oC performed for Intersil -8 product flow only. TABLE 1B. DC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: Supply Voltage = ±3V, RSOURCE = 100Ω, RLOAD = 500kΩ, VOUT = 0V, Unless Otherwise Specified. PARAMETER Input Offset Voltage Large Signal Voltage Gain SYMBOL VIO +AVOL -AVOL Common Mode Rejection Ratio +CMRR -CMRR Output Voltage Swing +VOUT -VOUT CONDITIONS VCM = 0V VOUT = 0V and +1V Note 1 VOUT = 0V and -1V Note 1 ∆VCM = +1.5V +V = +1.5V, -V = -4.5V VOUT = -1.5V ∆VCM = -1.5V +V = +4.5V, -V = -1.5V VOUT = +1.5V Note 1 Note 1 +ICC -ICC IOUT = 0mA IOUT = 0mA +PSRR -PSRR ∆VSUP = 1.5V +V = +3V, -V = -3V +V = +4.5V, -V = -3V ∆VSUP = 1.5V +V = +3V, -V = -3V +V = +3V, -V = -4.5V MIN MIN 1 +25oC -3 3 -3 3 mV 2, 3 +125oC, -55oC -5 5 -5 5 mV 4 +25oC 25 - 25 - kV/V 15 - 25 - kV/V 5, 6 +125oC, -55oC MAX MAX UNITS 4 +25oC 25 - 25 - kV/V 5, 6 +125oC, -55oC 15 - 25 - kV/V 1 +25oC 80 - 80 - dB 80 - 80 - dB 80 - 80 - dB 80 - 80 - dB 2, 3 1 2, 3 +125oC, -55oC +25oC +125oC, -55oC 1 +25oC 2.0 - 2.0 - V 2, 3 +125oC, -55oC 2.0 - 2.0 - V 1 +25oC - -2.0 - -2.0 V - -2.0 - -2.0 V +125oC, -55oC 1 +25oC - 15 - 150 µA 2, 3 +125oC, -55oC - 15 - 160 µA 1 +25oC -15 - -150 - µA -15 - -160 - µA 2, 3 Power Supply Rejection Ratio ISET = 15µA TEMPERATURE 2, 3 Quiescent Power Supply Current ISET = 1.5µA GROUP A SUBGROUP +125oC, -55oC 1 +25oC 80 - 80 - dB 2, 3 +125oC, -55oC 80 - 80 - dB 1 +25oC 80 - 80 - dB 80 - 80 - dB 2, 3 +125oC, -55oC NOTE: 1. RL = 75kΩ at ISET = 1.5µA, RL = 5kΩ at ISET = 15µA. Spec Number 764 518079 Specifications HS-3530RH TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: CL = 100pF, AVCL = +1, RL = 75kΩ, Unless Otherwise Specified. PARAMETER SYMBOL CONDITIONS GROUP A SUBGROUP ISET = 1.5µA ISET = 15µA TEMPERATURE MIN MAX MIN MAX UNITS VSUPPLY = ±15V +SR VOUT = -10V to +10V 9 +25oC 0.025 - 0.25 - V/µs -SR VOUT = +10V to -10V 9 +25oC 0.025 - 0.25 - V/µs Rise & Fall Time TR VOUT = 0 to +400mV 10% < TR < 90% 9 +25oC - 8.0 - 0.8 µs TF VOUT = 0 to -400mV 10% < TF < 90% 9 +25oC - 8.0 - 0.8 µs +OS VOUT = 0 to +400mV 9 +25oC - 35 - 35 % -OS VOUT = 0 to -400mV 9 +25oC - 35 - 35 % +SR VOUT = -2V to +2V 9 +25oC 0.01 - 0.1 - V/µs -SR VOUT = +2V to -2V 9 +25oC 0.01 - 0.1 - V/µs Slew Rate Note 1 Overshoot VSUPPLY = ±3V Slew Rate Note 1 TABLE 3. AC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Characterized at: RSOURCE = 50Ω, CL = 100pF, AVCL = +1, Unless Otherwise Specified. PARAMETER SYMBOL CONDITIONS ISET = 1.5µA ISET = 15µA NOTES TEMPERATURE MIN MAX MIN MAX UNITS 1 +25oC 50 - 50 - MΩ 1, 2 +25oC 0.4 - 4 - kHz -55oC to +125oC +1 - +1 - V/V +25oC - 10 - 10 Ω - 4.8 - 4.8 mW VSUPPLY = ±15V Differential Input Resistance RIN VCM = 0V Full Power Bandwidth FPBW VPEAK = 10V Minimum Closed Loop Stable Gain CLSG RL = 2kΩ, CL = 50pF 1 Output Resistance ROUT Open Loop 1 Quiescent Power Consumption Output Short-Circuit Current Gain Bandwidth Product PC IOSC -55oC to +125oC VOUT = 0V, IOUT = 0mA 1, 3 VOUT = 0V 1, 4 +25oC -14 38 -27 42 mA GBWP AVCL = 10V/V VO = 200mV, fO = 10kHz 1 +25oC 45 - 750 - kHz GBWP AVCL = 10V/V VO = 200mV, fO = 10kHz 1 +25oC 30 - 600 - kHz VSUPPLY = ±3V Gain Bandwidth Product NOTES: 1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon data from multiple production runs which reflect lot to lot and within lot variation. 2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πVPEAK). 3. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs). 4. Caution: Continuous long-duration short-circuit operation may degrade the operating life of the device. Spec Number 765 518079 Specifications HS-3530RH TABLE 4. POST RAD DC ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Open Loop Voltage Gain Input Offset Voltage CONDITIONS TEMPERATURE MIN MAX UNITS AVOL VSUPPLY = ±15V ISET = 15µA +25oC 15 - kV/V VIO VSUPPLY = ±15V ISET = 15µA +25oC - 5.0 mV TABLE 5. BURN-IN DELTA PARAMETERS GROUP B, SUBGROUPS 5 (TA = +25oC) PARAMETER DELTA LIMIT VIO ±0.5mV IBIAS ±30nA TABLE 6. APPLICABLE SUBGROUPS GROUP A SUBGROUPS CONFORMANCE GROUP MIL-STD-883 METHOD TESTED FOR -Q RECORDED FOR -Q TESTED FOR -8 Initial Test 100% 5004 1, 4, 9 1 (Note 2) 1, 4, 9 Interim Test 100% 5004 1, 4, 9, ∆ 1, ∆ (Note 2) 1, 4, 9 PDA 100% 5004 1, ∆ - 1 Final Test 100% 5004 2, 3, 5, 6 - 2, 3, 5, 6 Group A (Note 1) Sample 5005 1, 2, 3, 4, 5, 6, 9 - 1, 2, 3, 4, 5, 6, 9 Subgroup B5 Sample 5005 1, 2, 3, 4, 5, 6, 9, ∆ 1, 2, 3, ∆ (Note 2) - Subgroup B6 Sample 5005 1, 4, 9 - - Group C Sample 5005 - - 1, 2, 3, 4, 5, 6, 9 Group D Sample 5005 1, 4, 9 - 1, 4, 9 Group E, Subgroup 2 Sample 5005 1 - 1 RECORDED FOR -8 NOTES: 1. Alternate Group A testing in accordance with MIL-STD-883 method 5005 may be exercised. 2. Table 5 parameters only Spec Number 766 518079 HS-3530RH Intersil Space Level Product Flow -Q Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, 4 Samples/Wafer, 0 Rejects 100% Initial Electrical Test (T0) 100% Static Burn-In, Condition A or B, 240 Hours, +125oC or Equivalent, Method 1015 100% Interim Electrical Test 1 (T1) 100% Nondestructive Bond Pull, Method 2023 100% Delta Calculation (T0-T1) Sample - Wire Bond Pull Monitor, Method 2011 100% PDA, Method 5004 (Note 1) Sample - Die Shear Monitor, Method 2019 or 2027 100% Final Electrical Test 100% Internal Visual Inspection, Method 2010, Condition A 100% Fine/Gross Leak, Method 1014 100% Temperature Cycle, Method 1010, Condition C, 10 Cycles 100% Radiographic (X-Ray), Method 2012 (Note 2) 100% Constant Acceleration, Method 2001, Condition per Method 5004 Sample - Group A, Method 5005 (Note 3) 100% PIND, Method 2020, Condition A 100% External Visual 100% Serialization 100% External Visual, Method 2009 Sample - Group B, Method 5005 (Note 4) Sample - Group D, Method 5005 (Notes 4 and 5) 100% Data Package Generation (Note 6) NOTES: 1. Failures from subgroup 1 and deltas are used for calculating PDA. The maximum allowable PDA = 5%. 2. Radiographic (X-Ray) inspection may be performed at any point after serialization as allowed by Method 5004. 3. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005. 4. Group B and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include separate line items for Group B test, Group B samples, Group D test and Group D samples. 5. Group D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required, the P.O. should include a separate line item for Group D generic data. Generic data is not guaranteed to be available and is therefore not available in all cases. 6. Data Package Contents: • Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quantity). • Wafer Lot Acceptance Report (Method 5007). Includes reproductions of SEM photos with percent of step coverage. • GAMMA Radiation Report. Contains Cover page, disposition, RAD Dose, Lot Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read and Record data on file at Intersil. • X-Ray report and film. Includes penetrometer measurements. • Screening, Electrical, and Group A attributes (Screening attributes begin after package seal). • Lot Serial Number Sheet (Good units serial number and lot number). • Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test. • Group B and D attributes and/or Generic data is included when required by the P.O. • The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed by an authorized Quality Representative. Spec Number 767 518079 HS-3530RH Intersil Space Level Product Flow -8 GAMMA Radiation Verification (Each Wafer) Method 1019, 4 Samples/Wafer, 0 Rejects 100% Static Burn-In, Condition A or B, 160 Hours, +125oC or Equivalent, Method 1015 Periodic- Wire Bond Pull Monitor, Method 2011 100% Interim Electrical Test Periodic- Die Shear Monitor, Method 2019 or 2027 100% PDA, Method 5004 (Note 1) 100% Internal Visual Inspection, Method 2010, Condition B 100% Final Electrical Test 100% Temperature Cycle, Method 1010, Condition C, 10 Cycles 100% Fine/Gross Leak, Method 1014 100% Constant Acceleration, Method 2001, Condition per Method 5004 Sample - Group A, Method 5005 (Note 2) 100% External Visual 100% Initial Electrical Test 100% External Visual, Method 2009 Sample - Group B, Method 5005 (Note 3) Sample - Group C, Method 5005 (Notes 3 and 4) Sample - Group D, Method 5005 (Notes 3 and 4) 100% Data Package Generation (Note 4) NOTES: 1. Failures from subgroup 1 are used for calculating PDA. The maximum allowable PDA = 5%. 2. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005. 3. Group B, C and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include separate line items for Group B test, Group B samples, Group C test and Group C samples and Group D test and Group D samples. 4. Group C and/or D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required, the P.O. should include a separate line item for Group C generic data and/or D generic data. Generic data is not guaranteed to be available and is therefore not available in all cases. 5. Data Package Contents: • Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quantity). • GAMMA Radiation Report. Contains Cover page, disposition, RAD Dose, Lot Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read and Record data on file at Intersil. • Screening, Electrical, and Group A attributes (Screening attributes begin after package seal). • Group B, C and D attributes and/or Generic data is included when required by the P.O. • The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed by an authorized Quality Representative. Spec Number 768 518079 HS-3530RH Test Circuit ACOUT +VCC 0.1 10K 1 FOR LOOP STABILITY, USE MIN VALUE CAPACITOR TO PREVENT OSCILLATION 500K 2 S1 1 2 S4 1 OPEN 2 DUT 1 S5 S2 1 500K S9 1 1 + V1 -1 100pF† 2K OPEN 2 2 S7 + S8 OPEN 1 2 3 4 2K 5K 75K + 1 FB 2 V2 10K VAC 0.1 100 100 5K 2 -VEE 1 x2 EOUT S3 †Includes Stray Capacitance All Resistors = ± 1% (Ω) All Capacitors = ± 10% (µF) 1 50K Simplified Transient Response/Slew Rate Circuit 2 3 6 VOUT + 8 100pF RL RSET VINN -V Burn-In Circuit Irradiation Circuit +V +15V D1 C1 7 1MΩ 2 - 0.01µF +V OUTPUT 8 6 ISET 3 - 8 R1 7 2 + + 3 R2 6 4 4 0.01µF -V C2 D2 -15V Spec Number 769 518079 HS-3530RH Typical Performance Curves 100 SUPPLY CURRENT (µA) BIAS CURRENT (nA) 1000 PRE-RAD 10 VSUPPLY = ±15V 100 VSUPPLY = ±15V VSUPPLY = ±3V 10 1 1 10 1 100 10 FIGURE 1. INPUT BIAS CURRENT vs SET CURRENT FIGURE 2. PRERAD POSITIVE SUPPLY CURRENT 6 GAIN-BANDWIDTH PRODUCT (MHz) 200K AVOL (V/V) 100K VSUPPLY = ±15V VSUPPLY = ±3V 10K 100 SET CURRENT (µA) SET CURRENT (µA) 4 2 1 0.8 0.6 0.4 0.2 0.1 1 10 SET CURRENT (µA) 1 100 FIGURE 3. PRERAD LARGE SIGNAL VOLTAGE GAIN vs ISET 10 SET CURRENT (µA) 100 FIGURE 4. GAIN BANDWIDTH PRODUCT vs SET CURRENT 10 25 1.0 20 SLEW RATE = 0.1 VP-P SLEW RATE (V/µs) 30 SR+ = SR2 VSUPPLY = ±15V VSUPPLY = ±3V ISET = 15µA ISET = 1.5µA 15 VSUPPLY = 15V T = +25oC 10 PRE-RAD 5 0.01 1 1K 10 100 SET CURRENT (µA) 10K 100K 1M RLOAD (Ω) FIGURE 5. SLEW RATE vs SET CURRENT FIGURE 6. OUTPUT VOLTAGE SWING vs LOAD RESISTANCE Spec Number 770 518079 HS-3530RH Typical Performance Curves (Continued) 200K 25 VSUPPLY = ±15V BIAS CURRENT (nA) 20 100K AVOL (V/V) ISET = 15µA PRE-RAD 15 10 VSUPPLY = ±3V ISET = 15µA ISET = 1.5µA 5 VSUPPLY = ±15V -50 -25 0 25 50 75 100 10K 125 -50 -25 TEMPERATURE (oC) 0 25 50 75 100 125 TEMPERATURE (oC) FIGURE 7. INPUT BIAS CURRENT vs TEMPERATURE FIGURE 8. OPEN LOOP VOLTAGE GAIN vs TEMPERATURE Schematic VCC D2 R1 20Ω 20W Q23 Q23 Q24 Q37 Q44 Q1 Q39A Q25 Q39B Q31 Q26 8 Q4 Q5 Q42 2pF Q22 1 SET 2 Q9 IN- D13 D14 Q0 Q34 Q27 D47 D48 D49 D50 R2 20Ω D32 27pF Q28 Q11 R5 20Ω Q12 Q19 OUT 6 Q20 D43 D33 R3 20Ω D28 Q41 Q7 Q45 Q18 Q46 Q35 Q30 Q8 Q36 D15 D6 4 VEE Q16 3 IN+ R7 3K 1 VOS1 R8 D17 3K R4 20Ω D29 5 VOS2 Spec Number 771 518079 HS-3530RH Metallization Topology DIE DIMENSIONS: 54 x 67 x 11.5mils (1370 x 1700 x 290µm) DIE ATTACH: Temperature: Metal Can - 420oC (Max) WORST CASE CURRENT DENSITY: 0.544 x 105 A/cm2 at 2.5mA METALLIZATION: Type: Al Thickness: 12.5kÅ ± 2kÅ SUBSTRATE POTENTIAL (POWERED UP): -V TRANSISTOR COUNT: 49 GLASSIVATION: Type: SiO2 Thickness: 8kÅ ± 1kÅ PROCESS: Complimentary Bipolar Metallization Mask Layout HS-3530RH +IN -IN OFFSET NULL -V (& PACKAGE) ISET +V OFFSET NULL OUTPUT Spec Number 772 518079 HS-3530RH All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web site http://www.intersil.com Sales Office Headquarters NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (407) 724-7000 FAX: (407) 724-7240 EUROPE Intersil SA Mercure Center 100, Rue de la Fusee 1130 Brussels, Belgium TEL: (32) 2.724.2111 FAX: (32) 2.724.22.05 ASIA Intersil (Taiwan) Ltd. Taiwan Limited 7F-6, No. 101 Fu Hsing North Road Taipei, Taiwan Republic of China TEL: (886) 2 2716 9310 FAX: (886) 2 2715 3029 Spec Number 773 518079