V6210609

REVISIONS
LTR
DESCRIPTION
A
Under Table I, Switching specifications,
ADC output section, Output clock to data
propagation delay (tDC), both LVDS and CMOS
mode tests, delete condition “SDR rising edge”
and replace with “SDR falling edge”. - ro
DATE
APPROVED
13-11-04
C. SAFFLE
CURRENT DESIGN ACTIVITY CAGE CODE 16236
HAS CHANGED NAMES TO:
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
Prepared in accordance with ASME Y14.24
Vendor item drawing
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PMIC N/A
PREPARED BY
RICK OFFICER
Original date of drawing
YY-MM-DD
CHECKED BY
JOSEPH RODENBECK
10-07-22
APPROVED BY
CHARLES F. SAFFLE
SIZE
A
REV
AMSC N/A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
CODE IDENT. NO.
TITLE
MICROCIRCUIT, DIGITAL-LINEAR, 12 BIT,
250 MSPS, ANALOG TO DIGITAL CONVERTER,
MONOLITHIC SILICON
DWG NO.
V62/10609
16236
A
PAGE
1
OF
23
5962-V013-14
1. SCOPE
1.1 Scope. This drawing documents the general requirements of a high performance 12 bit 250 MSPS analog to digital converter
microcircuit, with an operating temperature range of -55°C to +125°C.
1.2 Vendor Item Drawing Administrative Control Number. The manufacturer’s PIN is the item of identification. The vendor item
drawing establishes an administrative control number for identifying the item on the engineering documentation:
V62/10609
-
Drawing
number
01
X
E
Device type
(See 1.2.1)
Case outline
(See 1.2.2)
Lead finish
(See 1.2.3)
1.2.1 Device type(s).
Device type
Generic
01
Circuit function
ISLA112P25MREP
12 bit, 250 MSPS analog to digital converter
1.2.2 Case outline(s). The case outline(s) are as specified herein.
Outline letter
Number of pins
X
72
JEDEC PUB 95
Package style
See figure 1
Quad flat leadless plastic package
1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacture:
Finish designator
A
B
C
D
E
Z
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Material
Hot solder dip
Tin-lead plate
Gold plate
Palladium
Gold flash palladium
Other
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1.3 Absolute maximum ratings.
1/
1.8 V analog supply (AVDD) to analog ground (AVSS) ..............................................
1.8 V output supply (OVDD) to output ground (OVSS) ..............................................
AVSS to OVSS ...........................................................................................................
Analog inputs to AVSS ...............................................................................................
Clock inputs to AVSS .................................................................................................
Logic inputs to AVSS .................................................................................................
Logic inputs to OVSS .................................................................................................
Junction temperature range (TJ) ................................................................................
-0.4 V to 2.1 V
-0.4 V to 2.1 V
-0.3 V to 0.3 V
-0.4 V to AVDD + 0.3 V
-0.4 V to AVDD + 0.3 V
-0.4 V to OVDD + 0.3 V
-0.4 V to OVDD + 0.3 V
+150°C
Storage temperature range (TSTG) ............................................................................ -65°C to +150°C
Thermal resistance, junction to ambient (θJA) ............................................................ 24°C/W 2/
1.4 Recommended operating conditions. 3/
Operating free-air temperature range (TA) ................................................................. -55°C to +125°C
1/
2/
3/
Stresses beyond those listed under “absolute maximum rating” may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those indicated under
“recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may
affect device reliability.
θJA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach”
features.
Use of this product beyond the manufacturers design rules or stated parameters is done at the user’s risk. The manufacturer
and/or distributor maintain no responsibility or liability for product used beyond the stated limits.
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2. APPLICABLE DOCUMENTS
JEDEC PUB 95
-
Registered and Standard Outlines for Semiconductor Devices
IPC/JEDEC J STD-020
-
Moisture/Reflow Sensitivity Classification for Non-Hermetic Solid State Surface Mount Devices
(Applications for copies should be addressed to the JEDEC Office, 3103 North 10th Street, Suite 240-S, Arlington, VA 22201-2107
or online at http://www.jedec.org)
3. REQUIREMENTS
3.1 Marking. Parts shall be permanently and legibly marked with the manufacturer’s part number as shown in 6.3 herein and as
follows:
A.
B.
C.
Manufacturer’s name, CAGE code, or logo
Pin 1 identifier
ESDS identification (optional)
3.2 Unit container. The unit container shall be marked with the manufacturer’s part number and with items A and C (if applicable)
above.
3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are
as specified in 1.3, 1.4, and table I herein.
3.4 Design, construction, and physical dimension. The design, construction, and physical dimensions are as specified herein.
3.5 Diagrams.
3.5.1 Case outline. The case outline shall be as shown in 1.2.2 and figure 1.
3.5.2 Terminal connections. The terminal connections shall be as shown in figure 2.
3.5.3 Logic diagram. The logic diagram shall be as shown in figure 3.
3.5.4 Timing waveforms. The timing waveforms shall be as shown in figures 4, 5, 6, 7, 8, 9, 10, and 11.
3.5.5 Application information. Detailed application information may be found in the manufacturer’s datasheet.
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TABLE I. Electrical performance characteristics. 1/
Test
Symbol
Conditions 2/
Temperature,
TA
Device
type
Limits 3/
Min
Max
1.36
1.59
Unit
DC specifications.
Analog input section.
Full scale analog input
range
VFS
Differential
-55°C to +125°C
01
Input resistance
RIN
Differential
+25°C
01
1000 typical
Ω
Input capacitance
CIN
Differential
+25°C
01
1.9 typical
pF
Full scale range
temperature drift
AVTC
+125°C
01
90 typical
ppm /
°C
Input offset voltage
VOS
-55°C to +125°C
01
Gain error
EG
+25°C
01
Common mode output
voltage
VCM
+25°C
01
Inputs common mode
voltage
+25°C
01
0.9 typical
V
CLKP, CLKN input
swing
+25°C
01
1.8 typical
V
-10
VPP
10
mV
2 typical
0.435
%
0.635
V
Clock input section.
Power requirements section.
1.8 V analog supply
voltage
AVDD
-55°C to +125°C
01
1.7
1.9
V
1.8 V digital supply
voltage
OVDD
-55°C to +125°C
01
1.7
1.9
V
1.8 V analog supply
current
IAVDD
-55°C to +125°C
01
96
mA
1.8 V digital supply 4/
current (SDR)
IOVDD
3 mA low voltage differential
signaling (LVDS)
-55°C to +125°C
01
76
mA
1.8 V digital supply 4/
current (DDR)
IOVDD
3 mA LVDS
+25°C
01
39 typical
mA
Power supply rejection
ratio
PSRR
30 MHz, 200 VPP signal on AVDD
+25°C
01
-36 typical
dB
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions 2/
Temperature,
TA
Device
type
Limits 2/
Min
Unit
Max
DC specifications - continued.
Total power dissipation section.
Normal mode (SDR)
PD
3 mA LVDS
-55°C to +125°C
01
Normal mode (DDR)
PD
3 mA LVDS
+25°C
01
Nap mode
PD
-55°C to +125°C
01
92
mW
Sleep mode
PD
-55°C to +125°C
01
18
mW
CSB at logic high
310
mW
234 typical
mW
Nap mode
wakeup time
5/
Sample clock running
+25°C
01
1 typical
µs
Sleep mode
wakeup time
5/
Sample clock running
+25°C
01
1 typical
ms
AC specifications.
6/
Differential nonlinearity
DNL
-55°C to +125°C
01
-0.9
+0.9
LSB
Integral nonlinearity
INL
-55°C to +125°C
01
-2.0
+2.0
LSB
Minimum
7/
conversion rate
fS MIN
-55°C to +125°C
01
40
MSPS
Maximum conversion
rate
fS MAX
-55°C to +125°C
01
Signal to noise ratio
SNR
fIN = 10 MHz
+25°C
01
fIN = 105 MHz
-55°C to +125°C
fIN = 190 MHz
+25°C
65.9 typical
fIN = 364 MHz
+25°C
65.4 typical
fIN = 695 MHz
+25°C
63.8 typical
fIN = 995 MHz
+25°C
62.6 typical
250
MSPS
66.1 typical
dBFS
62.7
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions 2/
Temperature,
TA
Device
type
Limits 3/
Min
Max
AC specifications - continued.
6/
Signal to noise and
distortion
fIN = 10 MHz
+25°C
fIN = 105 MHz
-55°C to +125°C
fIN = 190 MHz
+25°C
64.6 typical
fIN = 364 MHz
+25°C
63.9 typical
fIN = 695 MHz
+25°C
56.9 typical
fIN = 995 MHz
+25°C
49.6 typical
fIN = 10 MHz
+25°C
fIN = 105 MHz
-55°C to +125°C
fIN = 190 MHz
+25°C
10.4 typical
fIN = 364 MHz
+25°C
10.3 typical
fIN = 695 MHz
+25°C
9.2 typical
fIN = 995 MHz
+25°C
7.9 typical
fIN = 10 MHz
+25°C
fIN = 105 MHz
-55°C to +125°C
fIN = 190 MHz
+25°C
79 typical
fIN = 364 MHz
+25°C
76 typical
fIN = 695 MHz
+25°C
61 typical
fIN = 995 MHz
+25°C
51 typical
Effective number of bits
Spurious free dynamic
range
SINAD
ENOB
SFDR
01
Unit
65.3 typical
dBFS
62.2
01
10.6 typical
Bits
10.1
01
83.0 typical
dBc
67
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions 2/
Temperature,
TA
Device
type
Limits 3/
Min
AC specifications - continued.
6/
Intermodulation
distortion
fIN = 70 MHz
+25°C
fIN = 170 MHz
+25°C
IMD
01
Unit
Max
-86 typical
dBFS
-97 typical
Word error rate
WER
+25°C
01
Full power dissipation
FPBW
+25°C
01
10
-12
typical
1300
typical
MHz
Digital specifications.
Inputs section.
Input current high
(SDIO, RESETN)
IIH
VIN = 1.8 V
-55°C to +125°C
01
-1
1
µA
Input current low
(SDIO, RESETN)
IIL
VIN = 0 V
-55°C to +125°C
01
-25
-5
µA
Input voltage high
(SDIO, RESETN)
VIH
-55°C to +125°C
01
1.17
Input voltage low
(SDIO, RESETN)
VIL
-55°C to +125°C
01
Input current high 8/
(OUTMODE,
NAPSLP, CLKDIV,
OUTFMT)
IIH
-55°C to +125°C
01
Input current low
(OUTMODE,
NAPSLP, CLKDIV,
OUTFMT)
IIL
-55°C to +125°C
01
Input capacitance
CDI
+25°C
01
V
0.63
V
15
40
µA
-40
-15
µA
3 typical
pF
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions 2/
Temperature,
TA
Device
type
Limits 3/
Min
Unit
Max
Digital specifications - continued.
Low voltage differential signaling (LVDS) outputs section.
Differential output
voltage
VT
3 mA mode
+25°C
01
620 typical
Output offset voltage
VOS
3 mA mode
-55°C to +125°C
01
Output rise time
tR
+25°C
01
500 typical
ps
Output fall time
tF
+25°C
01
500 typical
ps
950
mVPP
980
mV
CMOS output section.
Voltage output high
VOH
IOH = -500 µA
-55°C to +125°C
01
Voltage output low
VOL
IOL = 1 mA
-55°C to +125°C
01
Output rise time
tR
+25°C
01
1.8 typical
ns
Output fall time
tF
+25°C
01
1.3 typical
ns
Switching specifications.
OVDD
- 0.3
V
0.3
V
See figures 4 and 5.
ADC output section
Aperture delay
tA
+25°C
01
375 typical
ps
RMS aperture jitter
jA
+25°C
01
60 typical
fs
Output clock to 9/ 10/
data propagation
delay, LVDS mode
tDC
-55°C to +125°C
01
DDR rising edge
-260
120
DDR falling edge
-160
230
SDR falling edge
-260
230
ps
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions 2/
Temperature,
TA
Device
type
Limits 3/
Min
Max
-220
200
DDR falling edge
-310
110
SDR falling edge
-310
200
Unit
Switching specifications.
ADC output section - continued.
See figures 4 and 5.
Output clock to
9/
data propagation
delay, CMOS mode
DDR rising edge
tDC
01
-55°C to +125°C
ps
Latency
(pipeline delay)
L
+25°C
01
7.5 typical
cycles
Overvoltage recovery
tOVR
+25°C
01
1 typical
cycles
SPI interface section.
10/ 11/ 12/
See figures 8 and 9.
SCLK period
tCLK
Write operation
-55°C to +125°C
01
Read operation
16
cycles
8/
66
cycles
SCLK duty cycle
tHI / tCLK
or
tLO / tCLK
Read or write
-55°C to +125°C
01
25
75
%
CSB↓ to SCLK↑ setup
time
tS
Read or write
-55°C to +125°C
01
1
cycles
CSB↑ after SCLK↑
hold time
tH
Read or write
-55°C to +125°C
01
3
cycles
Data valid to SCK↑
setup time
tDSW
Write
-55°C to +125°C
01
1
cycles
Data valid after SCK↑
hold time
tDHW
Write
-55°C to +125°C
01
3
cycles
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions 2/
Temperature,
TA
Device
type
Limits 3/
Min
Unit
Max
Switching specifications.
SPI interface section - continued. 10/ 11/ 12/ See figures 8 and 9.
Data valid after SCK↓
time
tDVR
Read
-55°C to +125°C
01
16.5
cycles
Data invalid after
SCK↑ time
tDHR
Read
-55°C to +125°C
01
3
cycles
Sleep mode
13/
CSB↓ to SCLK↑
setup time
tS
Read or write in sleep mode
-55°C to +125°C
01
150
µs
1/
Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over
the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters
may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization
and/or design.
2/
Unless otherwise specified, AVDD = 1.8 V, OVDD = 1.8 V, AIN = -1 dBFS, fSAMPLE = maximum conversion rate (per speed grade).
3/
Parameters with min and/or max limits are 100% production tested at their worst case temperature extreme (+125°C).
4/
Digital supply current is dependent upon the capacitive loading of the loading of the digital outputs. IOVDD specifications apply
for 10 pF load on each digital output.
5/
See nap / sleep mode description in the datasheet for more details
6/
AC specifications apply after internal calibration of the analog digital converter is invoked at the given sample rate and temperature.
Refer to “power on calibration” and “user initiated reset” in the device datasheet for more details.
7/
The DLL range setting must be changed for low speed operation.
8/
The tri-level inputs internal switching thresholds are approximately 0.43 V and 1.34 V. It is advised to float the inputs,
tie to ground or AVDD depending on desired function.
9/
The input clock to output clock delay is a function of sample rate, using the output clock to latch the data simplifies data capture
for most application.
10/ Parameter guaranteed by characterization and not 100% tested.
11/ Serial peripheral interface (SPI) interface timing is directly proportional to the ADC sample period (tS). 4 ns at 250 MSPS.
Minimum and maximum limits guaranteed by characterization, and not 100% tested.
12/ The SPI may operate asynchronously with respect to the ADC sample clock.
13/ The SPI chip select (CSB) setup time increases in sleep mode due to the reduced power state, CSB setup time in nap mode
is equal to normal mode CSB setup time ( 4 ns minimum).
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Case X
FIGURE 1. Case outline.
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Case X - continued.
Dimensions
Inches
Symbol
Millimeters
Min
Max
Min
Max
A
---
0.035
---
0.90
A1
---
0.007
---
0.2
b
0.009
---
0.24
---
D/E
0.393 BSC
10.00 BSC
D1/E1
0.334 BSC
8.50 BSC
D2/E2
0.236 BSC
6.00 BSC
e
0.019 BSC
0.50 BSC
L
0.015
N
---
0.40
72
--72
NOTES:
1. Controlling dimensions are millimeter, inch dimensions are given for reference only.
2. Dimension b applies to the metalized terminal and is measured between 0.15 mm (inch) and
0.30 mm (inch) from the terminal tip.
3. The configuration of the pin 1 identifier is optional, but must be located within the zone indicated.
The pin 1 identifier may be either a mold or mark feature.
FIGURE 1. Case outline - continued.
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Device type
01
Case outline
X
Terminal
number
Terminal
symbol
Terminal
number
Terminal
symbol
Terminal
number
Terminal
symbol
1
AVDD
25
RESETN
49
D6N
2
DNC
26
OVSS
50
D6P
3
DNC
27
OVDD
51
D7N
4
DNC
28
DNC
52
D7P
5
DNC
29
DNC
53
D8N
6
AVDD
30
DNC
54
D8P
7
AVSS
31
DNC
55
OVSS
8
AVSS
32
D0N
56
OVDD
9
VINN
33
D0P
57
D9N
10
VINP
34
D1N
58
D9P
11
AVSS
35
D1P
59
D10N
12
AVDD
36
OVDD
60
D10P
13
DNC
37
D2N
61
D11N
14
DNC
38
D2P
62
D11P
15
VCM
39
D3N
63
ORN
16
CLKDIV
40
D3P
64
ORP
17
DNC
41
D4N
65
OVSS
18
DNC
42
D4P
66
SDO
19
AVDD
43
D5N
67
CSB
20
CLKP
44
D5P
68
SCLK
21
CLKN
45
OVSS
69
SDIO
22
OUTMODE
46
RLVDS
70
OUTFMT
23
NAPSLP
47
CLKOUTN
71
AVDD
24
AVDD
48
CLKOUTP
72
AVSS
FIGURE 2. Terminal connections.
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Terminal
symbol
LVDS function
SDR mode
AVDD
1.8 V analog supply.
DNC
Do not connect.
AVSS
Analog ground.
VINN, VINP
VCM
CLKDIV
CLKP, CLKN
OUTMODE
DDR mode comments
Analog input negative, positive.
Common mode output.
Clock divider control.
Clock input true, complement.
Output mode (LVDS).
NAPSLP
Power control, (nap, sleep modes).
RESETN
Power on reset (active low).
OVSS
Output ground.
OVDD
1.8 V output supply.
D0N
LVDS bit 0 (LSB) output complement.
DDR logical bits 1, 0 (LVDS)
D0P
LVDS bit 0 (LSB) output true.
DDR logical bits 1, 0 (LVDS)
D1N
LVDS bit 1 output complement.
NC in DDR
D1P
LVDS bit 1 output true.
NC in DDR
D2N
LVDS bit 2 output complement.
DDR logical bits 3, 2 (LVDS)
D2P
LVDS bit 2 output true.
DDR logical bits 3, 2 (LVDS)
D3N
LVDS bit 3 output complement.
NC in DDR
D3P
LVDS bit 3 output true.
NC in DDR
D4N
LVDS bit 4 output complement.
DDR logical bits 5, 4 (LVDS)
D4P
LVDS bit 4 output true.
DDR logical bits 5, 4 (LVDS)
D5N
LVDS bit 5 output complement.
NC in DDR
D5P
LVDS bit 5 output true.
NC in DDR
FIGURE 2. Terminal connections - continued.
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Terminal
symbol
LVDS function
SDR mode
RLVDS
LVDS bias resistor (connect to OVSS with
a 10 kΩ 1% resistor).
CLKOUTN
LVDS clock output complement.
CLKOUTP
LVDS clock output true.
DDR mode comments
D6N
LVDS bit 6 output complement.
DDR logical bits 7, 6 (LVDS)
D6P
LVDS bit 6 output true.
DDR logical bits 7, 6 (LVDS)
D7N
LVDS bit 7 output complement.
NC in DDR
D7P
LVDS bit 7 output true.
NC in DDR
D8N
LVDS bit 8 output complement.
DDR logical bits 9, 8 (LVDS)
D8P
LVDS bit 8 output true.
DDR logical bits 9, 8 (LVDS)
D9N
LVDS bit 9 output complement.
NC in DDR
D9P
LVDS bit 9 output true.
NC in DDR
D10N
LVDS bit 10 output complement.
DDR logical bits 11, 10 (LVDS)
D10P
LVDS bit 10 output true.
DDR logical bits 11, 10 (LVDS)
D11N
LVDS bit 11 output complement.
NC in DDR
D11P
LVDS bit 11 output true.
NC in DDR
ORN
LVDS over range complement.
ORP
LVDS over range true.
SDO
Serial peripheral interface (SPI) serial
data output (4.7 kΩ pull-up to OVDD is
required).
CSB
SPI chip select (active low).
SCLK
SPI clock.
SDIO
SPI serial data input/output.
OUTFMT
AVSS
Output data format (two’s complement,
gray code, offset binary).
Analog ground.
NOTE: SDR is the default state at power up the package.
FIGURE 2. Terminal connections - continued.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
SIZE
A
CODE IDENT NO.
16236
REV
A
DWG NO.
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FIGURE 3. Block diagram.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
SIZE
A
CODE IDENT NO.
16236
REV
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DWG NO.
V62/10609
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FIGURE 4. LVDS timing waveforms.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
SIZE
A
CODE IDENT NO.
16236
REV
A
DWG NO.
V62/10609
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FIGURE 5. CMOS timing waveforms.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
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CODE IDENT NO.
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Input voltage
Offset binary
Two’s complement
Gray code
-Full scale
000 00 000 00 00
100 00 000 00 00
000 00 000 00 00
-Full scale + 1 LSB
000 00 000 00 01
100 00 000 00 01
000 00 000 00 01
Mid-scale
100 00 000 00 00
000 00 000 00 00
110 00 000 00 00
+Full scale - 1 LSB
111 11 111 11 10
011 11 111 11 10
100 00 00 00 01
+Full scale
111 11 111 11 11
011 11 111 111 1
100 00 000 00 00
Input voltage to output code mapping
FIGURE 6. MSB first addressing waveforms.
FIGURE 7. LSB first addressing waveforms.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
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CODE IDENT NO.
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FIGURE 8. SPI write waveforms.
FIGURE 9. SPI read waveforms.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
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CODE IDENT NO.
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REV
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FIGURE 10. 2 byte transfer waveforms.
FIGURE 11. N byte transfer waveforms.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
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4. VERIFICATION
4.1 Product assurance requirements. The manufacturer is responsible for performing all inspection and test requirements as
indicated in their internal documentation. Such procedures should include proper handling of electrostatic sensitive devices,
classification, packaging, and labeling of moisture sensitive devices, as applicable.
5. PREPARATION FOR DELIVERY
5.1 Packaging. Preservation, packaging, labeling, and marking shall be in accordance with the manufacturer’s standard commercial
practices for electrostatic discharge sensitive devices.
6. NOTES
6.1 ESDS. Devices are electrostatic discharge sensitive and are classified as ESDS class 1 minimum.
6.2 Configuration control. The data contained herein is based on the salient characteristics of the device manufacturer’s data book.
The device manufacturer reserves the right to make changes without notice. This drawing will be modified as changes are provided.
6.3 Suggested source(s) of supply. Identification of the suggested source(s) of supply herein is not to be construed as a guarantee
of present or continued availability as a source of supply for the item. DLA Land and Maritime maintains an online database of all
current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Vendor item drawing
administrative control
number 1/
Device
manufacturer
CAGE code
Part marking 2/
Vendor part number
V62/10609-01XE
34371
ISLA112P25MREP
ISLA112P25MREP
1/ The vendor item drawing establishes an administrative control number for identifying the item
on the engineering documentation.
2/ This lead (Pb) free plastic package employ special Pb free material sets; molding compounds/die
attach materials and nickel (Ni), Pb, and gold (Au) plate - precious metals (e4) termination finish, which
Restriction of Hazardous Substances Directive (RoHS) compliant and compatible with both
tin lead (SnPb) and Pb free soldering operations. This Pb free device is moisture sensitivity level (MSL)
classified at Pb free peak reflow temperatures that meet or exceed the Pb free requirements of
IPC/JEDEC J STD-020.
CAGE code
34371
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
Source of supply
Intersil Corporation
1001 Murphy Ranch Road
Milpitas, CA 95035-6803
SIZE
A
CODE IDENT NO.
16236
REV
A
DWG NO.
V62/10609
PAGE
23