RELIABILITY DATA LT1083 / 84 / 85 / 86 / 87 / 1185 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE HERMETIC TO-3 DD PACK TO-220 TO-3P NEWEST DATE CODE 80 0330 2,286 8701 1,356 9404 6,097 8951 6,651 8710 16,470 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP DD PACK TO-220 TO-3P 39 0007 1,069 9209 2,149 9119 907 9133 4,164 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SAMPLE SIZE HERMETIC TO-3 DD PACK TO-220 TO-3P HERMETIC TO-3 DD PACK TO-220 TO-3P SAMPLE SIZE 80.80 4,387.47 6,778.39 20,119.54 18,625.82 49,992.02 K DEVICE (4) HOURS AT +85°C 0007 9549 9904 9913 9209 8951 8710 0620 0611 0623 OLDEST DATE CODE NEWEST DATE CODE 34 474 22,666 27,047 16,249 66,470 • THERMAL SHOCK FROM -65°C to +150°C PACKAGE TYPE NEWEST DATE CODE NEWEST DATE CODE 18,751 35,180 23,740 77,671 • TEMP CYCLE FROM -65°C to +150°C PACKAGE TYPE 0330 0305 9727 0045 0046 OLDEST DATE CODE DD PACK TO-220 TO-3P K DEVICE HOURS (1) AT +125°C 0237 9028 9209 8914 8825 0330 0539 0620 0611 0617 OLDEST DATE CODE NEWEST DATE CODE 37.44 1,899.06 5,456.78 1,882.62 9,275.90 K DEVICE HOURS 2,037.04 3,326.71 2,789.54 8,153.29 K DEVICE CYCLES 3.40 110.05 4,954.99 4,736.61 4,281.19 14,086.24 K DEVICE CYCLES 34 0237 0330 370 9028 0539 9,243 9209 0620 12,569 8951 0611 12,293 8825 0617 34,509 (1) Assumes Activation Energy = 1.0 Electron Volts (2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 0.17 FITS (3) Mean Time Between Failures in Years = 671,042 (4) Assumes 20X Acceleration from 85°C to +131°C Note: 1 FIT = 1 Failure in One Billion Hours. Form: 00-03-6209B. R006 0.51 135.91 3,213.07 3,533.43 3,676.35 10,559.27 NUMBER OF (2) FAILURES 0 3 0 0 0 3 NUMBER OF FAILURES 0 0 0 0 0 NUMBER OF FAILURES 0 0 0 0 NUMBER OF FAILURES 0 0 0 0 0 0 NUMBER OF FAILURES 0 0 0 0 0 0 Rev 43