AS5510 Errata Sheet

AS5510 - Errata
AS5510
Errata Document of Datasheet [v1-07] 2015-Feb-27
This Errata Sheet is valid for AS5510 integrated circuits. It is only valid for parts with the
datecodes listed below. Parts with other datecodes are not affected.
Deviation 1
Pin A1 indicator marking
Affected Parts:
Ordering #
Datecode#
Datecode#4-character
AS5510-DWLT
1033JAH
B32H
AS5510-DWLM
Description:
All parameters are according to the AS5510_Datasheet, Rev1-23 except the Pin A1 indicator
marking position. Details are shown in Figure 1.
according data sheet
affected material
Pin A1 indicator
on wrong position
Figure 1: Pin A1 Indicator Marking
Workaround:
Consider for placing the affected parts.
ams Errata Sheet
[v2-00] 2015-Mar-02
Page 1
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AS5510 - Errata
Deviation 2
Test pin issue
Affected Parts:
Ordering #
Datecode#
Datecode#4-character
AS5510-DWLT
AS5510-DWLM
AS5510-DSOT
AS5510-DSOM
1013JAD, 1019JAB, 1033JAH,
1106JAG, 1123JAJ, 1118JAI,
1123JAF, 1310JAD, 1308JAA,
1304JAK, 1326JAA, 1319JAB,
1317JAC, 1317JAA, 1334RAA,
1341RAA, 1350JAC, 1333RAB,
1341RAB, 1416JAB, 1407JAD,
1412JAB
A0J5, BCER, B32H,
DW84, EUT3, EKYI,
EUTZ, KP6T, KL8I,
KECC, LLSI, K7YR,
K30K, K30I, M06, NHU,
NXE, MW68, NFN, NXF,
OCJ3, NUR5, N4NN,
JAAR, JAII
Description:
Connecting the pin Test to ground for affected parts could lead to startup problems of the de vice
especially at cold temperature caused by the internal test structure. In this case, the device might
not power-up at lower temperatures. This effect is only visible if the device is powered down for
more than 400ms before a power-up. This is only related to the start-up sequence. Once the
device is powered-up, the device is working failure-free unaffected form possible temperature
changes.
Workaround:
This issue can be avoided for the affected parts by not connecting the test pin to ground. The
recommended workaround is to use a pull-down resistor or a capacitor connected between the Test pin
and ground pin as shown below in Figure 2.
Option: Keep the Test pin open or connect a 100k
pull-down
Improved Option: Capacitor to GND
An open Test-pin or a pull-down resistor of 100KΩ
to GND with minimum wiring to I2C signals will
permanently solve the failure behavior.
For improved EMV and noise disturbance
performance, a capacitor of 100 … 470 pF
between Test pin and GND is recommended.
VDD =
2.5 ~ 3.6V
VDD =
2.5 ~ 3.6V
VDD
VDD
100nF
AS5510
#1
SCL
I²C ADDR= SDA
56h
ADR
100nF
AS5510
SCL
SDA
ADR
VSS
MCU
I²C
#1
VDD
2.7 ~ 10k
2.7 ~ 10k
VSS
VDD
SCL
I²C ADDR= SDA
56h
ADR
MCU
SCL
SDA
I²C
ADR
Test
Test
100K
100 … 470pF
Figure 2: Recommended Workarounds
ams Errata Sheet
[v2-00] 2015-Mar-02
Page 2
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AS5510 - Errata
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ams Errata Sheet
[v2-00] 2015-Mar-02
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