− 第 ５ 章 − 信頼性 目次 １ ページ 信頼性試験 ･･････････････････････････ 本章では信頼性について説明します。 5-1 5-2 第５章 １ 信頼性 信頼性試験 富士電機では長期信頼性確保のために、各種信頼性試験を実施し設計検証を行なっています。下記の表 車載用 IGBT モジュールについて、代表的な信頼性試験一覧の抜粋を示します。なお詳細につきましては 納入仕様書を参照願います。 表 5-1 車載用 IGBT モジュールの信頼性試験(環境試験) 5. Reliability test results 5-1. Reliability test item Test categories Test items Test methods and conditions 1 Mounting Strength Screw torque : 5.8 N·m (M6) 4.5 N·m (M5) Test time Mechanical Tests 2 Vibration 3 Solderabitlity Reference norms EIAJ ED-4701 (Aug.-2001 edition) Number of sample Acceptance number Test Method 402 5 (0:1) 5 (0:1) 5 (0:1) 5 (0:1) Test Method 201 5 (0:1) Test Method 202 5 (0:1) 5 (0:1) 5 (0:1) method Ⅰ : 10 ± 1 sec. Range of frequency : 10 ~ 500 Hz Sweeping time : 15 min. Acceleration : 100 m/sec2 Sweeping direction : Each X, Y, Z axis Test time : 10 hr. / one axis Test Method 403 Reference 1 Condition code B Solder temp. : 245 ± 5 ℃ Test Method 303 Immersion time : 5 ± 0.5 sec. Condition code A Test time : 1 time Each terminal should be immersed in solder within 1~1.5mm the body. 4 Resistance to solderring heat Solder temp. : 260 ± 5 ℃ Test Method 302 Immersion time : 10 ± 1 sec. Condition code A Test time : 1 time Each terminal should be immersed in solder within 1~1.5mm the body. 1 High Temperature Storage temp. : 125 ± 5 ℃ Storage Environment Tests 2 Low Temperature Storage 3 Temperature Test duration : 1000 hr. Storage temp. : -40 ± 5 ℃ Test duration : 1000 hr. Storage temp. : 85 ± 2 ℃ Test Method 103 Test code C Humidity Relative humidity : 85 ± 5 % Storage Test duration : 1000 hr. Test temp. : low temp. -40±5 ℃ Dwell time : High ~ Low Number of cycles : 1000 cycles 4 Temperature Cycle high temp. 125±5 ℃ 1 hr 1 hr 5-2 Test Method 105 第５章 信頼性 表 5-2 V シリーズでの信頼性試験(耐久試験) Test categories Test items 1 High temperature reverse bias Test methods and conditions Test temp. : Tｊ = 150 ℃(-0 ℃/+5 ℃) Bias Voltage : VC = 0.8 × VCES Bias Method : Applied DC voltage to C-E Test duration : 1000 hr. Test temp. : Tｊ = 150 ℃(-0 ℃/+5 ℃) Reference norms EIAJ ED-4701 (Aug.-2001 edition) Number of sample Acceptance number Test Method 101 5 (0:1) Test Method 101 5 (0:1) 5 (0:1) 5 (0:1) VGE = 0 V 2 High temperature Endurance Test bias (for gate) Bias Voltage : VC = VGE = +20 V or -20 V Bias Method : Applied DC voltage to G-E Test duration : 1000 hr. Test temp. : 85±2 ℃ Test Method 102 and Relative humidit : 85±5 % Condition code C humidity bias Bias Voltage : VC = 0.8 × VCES Bias Method : Applied DC voltage to C-E VCE = 0 V 3 Temperature VGE = 0 V Test duration : 1000 hr. 4 Intermittent ON time : 2 sec. operating OFF time : 18 sec. life Test temp. : 100±5 ℃ No. of cycles : 30000 cycles (⊿Tj power cycle) Test Method 106 Tj ≦ 150 ℃, Ta=25±5 ℃ 5-3