5章 信頼性 PDF [137KB]

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第 5 章
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信頼性
目次
1
ページ
信頼性試験
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本章では信頼性について説明します。
5-1
5-2
第5章
1
信頼性
信頼性試験
富士電機では長期信頼性確保のために、各種信頼性試験を実施し設計検証を行なっています。下記の表
車載用 IGBT モジュールについて、代表的な信頼性試験一覧の抜粋を示します。なお詳細につきましては
納入仕様書を参照願います。
表 5-1 車載用 IGBT モジュールの信頼性試験(環境試験)
5. Reliability test results
5-1. Reliability test item
Test
categories
Test items
Test methods and conditions
1 Mounting Strength Screw torque
: 5.8 N·m (M6)
4.5 N·m (M5)
Test time
Mechanical Tests
2 Vibration
3 Solderabitlity
Reference norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of
sample
Acceptance
number
Test Method 402
5
(0:1)
5
(0:1)
5
(0:1)
5
(0:1)
Test Method 201
5
(0:1)
Test Method 202
5
(0:1)
5
(0:1)
5
(0:1)
method Ⅰ
: 10 ± 1 sec.
Range of frequency : 10 ~ 500 Hz
Sweeping time
: 15 min.
Acceleration
: 100 m/sec2
Sweeping direction
: Each X, Y, Z axis
Test time
: 10 hr. / one axis
Test Method 403
Reference 1
Condition code B
Solder temp.
: 245 ± 5 ℃
Test Method 303
Immersion time
: 5 ± 0.5 sec.
Condition code A
Test time
: 1 time
Each terminal should be immersed in solder
within 1~1.5mm the body.
4 Resistance to
solderring heat
Solder temp.
: 260 ± 5 ℃
Test Method 302
Immersion time
: 10 ± 1 sec.
Condition code A
Test time
: 1 time
Each terminal should be immersed in solder
within 1~1.5mm the body.
1 High Temperature Storage temp.
: 125 ± 5 ℃
Storage
Environment Tests
2 Low Temperature
Storage
3 Temperature
Test duration
: 1000 hr.
Storage temp.
: -40 ± 5 ℃
Test duration
: 1000 hr.
Storage temp.
: 85 ± 2 ℃
Test Method 103
Test code C
Humidity
Relative humidity
: 85 ± 5 %
Storage
Test duration
: 1000 hr.
Test temp.
: low temp. -40±5 ℃
Dwell time
: High ~ Low
Number of cycles
: 1000 cycles
4 Temperature
Cycle
high temp. 125±5 ℃
1 hr
1 hr
5-2
Test Method 105
第5章
信頼性
表 5-2 V シリーズでの信頼性試験(耐久試験)
Test
categories
Test items
1 High temperature
reverse bias
Test methods and conditions
Test temp.
: Tj = 150 ℃(-0 ℃/+5 ℃)
Bias Voltage
: VC = 0.8 × VCES
Bias Method
: Applied DC voltage to C-E
Test duration
: 1000 hr.
Test temp.
: Tj = 150 ℃(-0 ℃/+5 ℃)
Reference norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of
sample
Acceptance
number
Test Method 101
5
(0:1)
Test Method 101
5
(0:1)
5
(0:1)
5
(0:1)
VGE = 0 V
2 High temperature
Endurance Test
bias (for gate)
Bias Voltage
: VC = VGE = +20 V or -20 V
Bias Method
: Applied DC voltage to G-E
Test duration
: 1000 hr.
Test temp.
: 85±2 ℃
Test Method 102
and
Relative humidit : 85±5 %
Condition code C
humidity bias
Bias Voltage
: VC = 0.8 × VCES
Bias Method
: Applied DC voltage to C-E
VCE = 0 V
3 Temperature
VGE = 0 V
Test duration
: 1000 hr.
4 Intermittent
ON time
: 2 sec.
operating
OFF time
: 18 sec.
life
Test temp.
: 100±5 ℃
No. of cycles
: 30000 cycles
(⊿Tj power cycle)
Test Method 106
Tj ≦ 150 ℃, Ta=25±5 ℃
5-3
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