Si5020 SiPHY® M ULTI -R ATE SONET/SDH C LOCK AND D ATA R ECOVERY IC Features Complete high-speed, low-power, CDR solution includes the following: Supports OC-48/12/3, STM-16/4/1, Gigabit Ethernet, and 2.7 Gbps FEC Low Power—270 mW (TYP OC-48) Small footprint: 4 x 4 mm DSPLL™ eliminates external loop filter components 3.3 V tolerant control inputs Exceeds all SONET/SDH jitter specifications Jitter generation 2.9 mUIrms (Typ) Device powerdown Loss-of-lock indicator Single 2.5 V Supply Ordering Information: See page 18. Applications Pin Assignments SONET/SDH test equipment Optical transceiver modules SONET/SDH regenerators Board level serial links Description CLKOUT– CLKOUT+ GND Si5020 RATESEL1 SONET/SDH/ATM routers Add/drop multiplexers Digital cross connects Gigabit Ethernet interfaces RATESEL0 20 19 18 17 16 3 REFCLK+ 4 REFCLK– 5 6 7 8 9 10 DIN– GND GND Pad Connection DIN+ 2 VDD 1 VDD GND REXT LOL The Si5020 is a fully-integrated low-power clock and data recovery (CDR) IC designed for high-speed serial communication systems. It extracts timing information and data from a serial input at OC-48/12/3, STM-16/4/1, or Gigabit Ethernet (GbE) rates. Support for 2.7 Gbps data streams is also provided for OC-48/STM-16 applications that employ forward error correction (FEC). DSPLL technology eliminates sensitive noise entry points, making the PLL less susceptible to board-level interaction and helping to ensure optimal jitter performance. 15 PWRDN 14 VDD 13 DOUT+ 12 DOUT– 11 VDD Top View The Si5020 represents a new standard in low jitter, low power, and small size for high-speed CDRs. It operates from a single 2.5 V supply over the industrial temperature range (–40 to 85 °C). Functional Block Diagram LOL D IN + D IN – 2 BU F D SPLLTM Phas e-Locked Loop R etim er BU F 2 D OU T + D OU T – PW R D N /C AL Bias R EXT Rev. 1.6 2/15 2 R ATESEL1-0 2 BU F 2 C LKOU T + C LKOU T – R EF C LKIN + R EF C LKIN – Copyright © 2015 by Silicon Laboratories Si5020 Si5020 2 Rev. 1.6 Si5020 TABLE O F C ONTENTS Section Page 1. Detailed Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 2. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5 3. Typical Application Schematic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 4. Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 4.1. DSPLL™ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11 4.2. PLL Self-Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 4.3. Multi-Rate Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11 4.4. Reference Clock Detect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 4.5. Forward Error Correction (FEC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4.6. Lock Detect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12 4.7. PLL Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4.8. Powerdown . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 4.9. Device Grounding . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.10. Bias Generation Circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.11. Differential Input Circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.12. Differential Output Circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 5. Pin Descriptions: Si5020 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 6. Ordering Guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 7. Top Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 8. Package Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 9. 4x4 mm 20L QFN Recommended PCB Layout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Document Change List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23 Contact Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 Rev. 1.6 3 Si5020 1. Detailed Block Diagram DOUT+ Retim e DOUT– c DIN+ Phase Detector DIN– A/D VCO DSP CLK Divider CLKOUT+ c CLKOUT– n REFCLK+ Lock Detector REFCLK– LOL 2 RATESEL1-0 REXT Calibration Bias G eneration 4 PWRDN/CAL Rev. 1.6 Si5020 2. Electrical Specifications Table 1. Recommended Operating Conditions Parameter Symbol Ambient Temperature Si5020 Supply Voltage2 Test Condition Min1 Typ Max1 Unit TA –40 25 85 °C VDD 2.375 2.5 2.625 V Notes: 1. All minimum and maximum specifications are guaranteed and apply across the recommended operating conditions. Typical values apply at nominal supply voltages and an operating temperature of 25 °C unless otherwise stated. 2. The Si5020 specifications are guaranteed when using the recommended application circuit (including component tolerance) shown in "Typical Application Schematic" on page 10. V SIGNAL+ Differential VICM, VOCM SIGNAL– I/Os VIS Single-Ended Voltage (SIGNAL+) – (SIGNAL–) VID,VOD (VID = 2 VIS) Differential Voltage Swing Differential Peak-to-Peak Voltage t Figure 1. Differential Voltage Measurement (DIN, REFCLK, DOUT, CLKOUT) t C-D DOUT CLKOUT Figure 2. Differential Clock to Data Timing 80% DOUT, CLK OUT 20% tF tR Figure 3. Differential DOUT and CLKOUT Rise/Fall Times Rev. 1.6 5 Si5020 Table 2. DC Characteristics (VDD = 2.5 V ±5%, TA = –40 to 85 °C) Parameter Symbol Supply Current OC-48 and FEC (2.7 GHz) GbE OC-12 OC-3 IDD Power Dissipation OC-48 and FEC (2.7 GHz) GbE OC-12 OC-3 PD Test Condition Min Typ Max Unit — — — — 108 113 117 124 122 127 131 138 mA — — — — 270 283 293 310 320 333 344 362 mW VICM varies with VDD — .80 x VDD — V Single-Ended Input Voltage (DIN, REFCLK)* VIS See Figure 1 200 — 750 mVPP Differential Input Voltage Swing (DIN, REFCLK)* VID See Figure 1 200 — 1500 mVPP Input Impedance (DIN, REFCLK)* RIN Line-to-Line 84 100 116 Differential Output Voltage Swing (DOUT) VOD 100 Load Line-to-Line 780 990 1260 mVPP VOD 100 Load Line-to-Line 550 900 1260 mVPP Output Common Mode Voltage (DOUT,CLKOUT) VOCM 100 Load Line-to-Line — VDD – 0.23 — V Output Impedance (DOUT,CLKOUT) ROUT Single-ended 84 100 116 Output Short to GND (DOUT,CLKOUT) ISC(–) — 25 31 mA Output Short to VDD (DOUT,CLKOUT) ISC(+) –17.5 –14.5 — mA Input Voltage Low (LVTTL Inputs) VIL — — .8 V Input Voltage High (LVTTL Inputs) VIH 2.0 — — V Input Low Current (LVTTL Inputs) IIL — — 10 A Input High Current (LVTTL Inputs) IIH — — 10 A Common Mode Input Voltage (DIN, REFCLK)* OC48/12/3 Differential Output Voltage Swing (CLKOUT) OC48/12/3 Output Voltage Low (LVTTL Outputs) VOL IO = 2 mA — — 0.4 V Output Voltage High (LVTTL Outputs) VOH IO = 2 mA 2.0 — — V Input Impedance (LVTTL Inputs) RIN 10 — — k PWRDN/CAL Leakage Current IPWRDN 15 25 35 A VPWRDN 0.8 V *Note: The DIN and REFCLK inputs may be driven differentially or single-endedly. When driving single-endedly, the voltage swing of the signal applied to the active input must exceed the specified minimum Differential Input Voltage Swing (VID min) and the unused input must be ac coupled to ground. When driving differentially, the difference between the positive and negative input signals must exceed VID min. (Each individual input signal needs to swing only half of this range.) In either case, the voltage applied to any individual pin (DIN+, DIN–, REFCLK+, or REFCLK–) must not exceed the specified maximum Input Voltage Range (VIS max). 6 Rev. 1.6 Si5020 Table 3. AC Characteristics (Clock & Data) (VA 2.5 V ±5%, TA = –40 to 85 °C) Parameter Symbol Test Condition Output Clock Rate fCLK Output Rise/Fall Time (differential) tR,tF Figure 3 Clock to Data Delay FEC (2.7 GHz) OC-48 GbE OC-12 OC-3 tC-D Figure 2 Input Return Loss 100 kHz–2.5 GHz 2.5 GHz–4.0 GHz Min Typ Max Unit .15 — 2.7 GHz — 80 110 ps 225 225 460 835 4040 250 250 500 880 4090 270 270 540 930 4140 ps — — 16 13 — — dB dB Table 4. AC Characteristics (PLL Characteristics) (VA 2.5 V ±5%, TA = –40 to 85 °C) Parameter Symbol Test Condition Min Typ Max Unit Jitter Tolerance (OC-48)* JTOL(PP) f = 600 Hz 40 — — UIPP f = 6000 Hz 4 — — UIPP f = 100 kHz 4 — — UIPP f = 1 MHz 0.4 — — UIPP f = 30 Hz 40 — — UIPP f = 300 Hz 4 — — UIPP f = 25 kHz 4 — — UIPP f = 250 kHz 0.4 — — UIPP f = 30 Hz 60 — — UIPP f = 300 Hz 6 — — UIPP f = 6.5 kHz 6 — — UIPP f = 65 kHz 0.6 — — UIPP Jitter Tolerance (OC-12 Mode) Jitter Tolerance (OC-3 Mode) * * JTOL(PP) JTOL(PP) Jitter Tolerance (Gigabit Ethernet) Receive Data Total Jitter Tolerance TJT(PP) IEEE 802.3z Clause 38.68 600 — — ps Jitter Tolerance (Gigabit Ethernet) Receive Data Deterministic Jitter Tolerance DJT(PP) IEEE 802.3z Clause 38.69 370 — — ps RMS Jitter Generation* JGEN(rms) with no jitter on serial data — 2.9 5.0 mUI Peak-to-Peak Jitter Generation* JGEN(PP) with no jitter on serial data — 25 55 mUI Rev. 1.6 7 Si5020 Table 4. AC Characteristics (PLL Characteristics) (Continued) (VA 2.5 V ±5%, TA = –40 to 85 °C) Parameter Jitter Transfer Bandwidth* Jitter Transfer Peaking* Acquisition Time Input Reference Clock Duty Cycle Symbol Test Condition Min Typ Max Unit JBW OC-48 Mode — — 2.0 MHz OC-12 Mode — — 500 kHz OC-3 Mode — — 130 kHz — 0.03 0.1 dB After falling edge of PWRDN/CAL 1.45 1.5 1.7 ms From the return of valid data 40 60 150 s 40 50 60 % 19.44 — 168.75 MHz JP TAQ CDUTY Reference Clock Range Input Reference Clock Frequency Tolerance CTOL –100 — 100 ppm Frequency Difference at which Receive PLL goes out of Lock (REFCLK compared to the divided down VCO clock) LOL 450 600 750 ppm Frequency Difference at which Receive PLL goes into Lock (REFCLK compared to the divided down VCO clock) LOCK 150 300 450 ppm *Note: Bellcore specifications: GR-253-CORE, Issue 3, September 2000. Using PRBS 223 – 1 data pattern. 8 Rev. 1.6 Si5020 Table 5. Absolute Maximum Ratings Parameter Symbol Value Unit DC Supply Voltage VDD –0.5 to 2.8 V LVTTL Input Voltage VDIG –0.3 to 3.6 V Differential Input Voltages VDIF –0.3 to (VDD+ 0.3) V ±50 mA Maximum Current any output PIN Operating Junction Temperature TJCT –55 to 150 °C Storage Temperature Range TSTG –55 to 150 °C 1 kV ESD HBM Tolerance (100 pf, 1.5 k) Note: Permanent device damage may occur if the above absolute maximum ratings are exceeded. Functional operation should be restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 6. Thermal Characteristics Parameter Thermal Resistance Junction to Ambient Symbol Test Condition Value Unit JA Still Air 38 °C/W Rev. 1.6 9 Si5020 3. Typical Application Schematic LVTTL Control Inputs Loss-of-Lock Indicator LOL DOUT+ DIN– DOUT– Si5020 REFCLK+ CLKOUT+ CLKOUT– VDD GND REFCLK– REXT System Reference Clock DIN+ PWRDN/CAL High-Speed Serial Input RATESEL1-0 2 0.1 F 10 k VDD 2200 pF 20 pF 10 Rev. 1.6 Recovered Data Recovered Clock Si5020 4. Functional Description The Si5020 utilizes a phase-locked loop (PLL) to recover a clock synchronous to the input data stream. This clock is used to retime the data, and both the recovered clock and data are output synchronously via current mode logic (CML) drivers. Optimal jitter performance is obtained by using Silicon Laboratories' DSPLL technology to eliminate the noise entry points caused by external PLL loop filter components. 4.1. DSPLL™ The PLL structure (shown in Figure 1 on page 5) utilizes Silicon Laboratories' DSPLL technology to eliminate the need for external loop filter components found in traditional PLL implementations. This is achieved by using a digital signal processing (DSP) algorithm to replace the loop filter commonly found in analog PLL designs. This algorithm processes the phase detector error term and generates a digital control value to adjust the frequency of the voltage-controlled oscillator (VCO). Because external loop filter components are not required, sensitive noise entry points are eliminated, making the DSPLL less susceptible to board-level noise sources that make SONET/SDH jitter compliance difficult to attain. 4.2. PLL Self-Calibration The Si5020 achieves optimal jitter performance by using self-calibration circuitry to set the loop gain parameters within the DSPLL. For the self-calibration circuitry to operate correctly, the power supply voltage must exceed 2.25 V when calibration occurs. For best performance, the user should force a self-calibration once the supply has stabilized on powerup. A self-calibration can be initiated by forcing a high-tolow transition on the powerdown control input, PWRDN/ CAL, while a valid reference clock is supplied to the REFCLK input. The PWRDN/CAL input should be held high at least 1 s before transitioning low to guarantee a self-calibration. Several application circuits that could be used to initiate a power-on self-calibration are provided in Silicon Laboratories’ “AN42: Controlling DSPLL™ Self-Calibration for the Si5020/5018/5010 CDR Devices and Si531x Clock Multiplier/Regenerator Devices.” Multi-rate operation is achieved by configuring the device to divide down the output of the VCO to the desired data rate. The divide factor is configured by the RATESEL0-1 pins. The RATESEL0-1 configuration and associated data rates are given in Table 7. Table 7. Multi-Rate Configuration SDH Gigabit Ethernet OC-48 with 15/14 FEC 00 2.488 Gbps — 2.67 Gbps 1 10 1.244 Gbps 1.25 Gbps — 2 01 622.08 Mbps — — 4 11 155.52 Mbps — — 16 RATESEL [0:1] SONET/ Divider 4.4. Reference Clock Detect The Si5020 CDR requires an external reference clock applied to the REFCLK input for normal device operation. When REFCLK is absent, the LOL alarm will always be asserted when it has been determined that no activity exists on REFCLK, indicating the frequency lock status of the PLL is unknown. Additionally, the Si5020 uses the reference clock to center the VCO output frequency so that clock and data can be recovered from the input data stream. The device self configures for operation with one of three reference clock frequencies. This eliminates the need to externally configure the device to operate with a particular reference clock. The reference clock centers the VCO for a nominal output of between 2.5 GHz and 2.7 GHz. The VCO frequency is centered at 16, 32, or 128 times the reference clock frequency. Detection circuitry continuously monitors the reference clock input to determine whether the device should be configured for a reference clock that is 1/16, 1/32, or 1/128 the nominal VCO output. Approximate reference clock frequencies for some target applications are given in Table 8. Table 8. Typical REFCLK Frequencies 4.3. Multi-Rate Operation The Si5020 supports clock and data recovery for OC-48 and STM-16 data streams. In addition, the PLL was designed to operate at data rates up to 2.7 Gbps to support OC-48/STM-16 applications that employ forward error correction (FEC). CLK SONET/SDH Gigabit Ethernet SONET/ SDH with 15/14 FEC Ratio of VCO to REFCLK 19.44 MHz 19.53 MHz 20.83 MHz 128 77.76 MHz 78.125 MHz 83.31 MHz 32 155.52 MHz 156.25 MHz 166.63 MHz 16 Rev. 1.6 11 Si5020 4.5. Forward Error Correction (FEC) Sinusoidal Input Jitter (UI p-p) The Si5020 supports FEC in SONET OC-48 (SDH STM-16) applications for data rates up to 2.7 Gbps. In FEC applications, the appropriate reference clock frequency is determined by dividing the input data rate by 16, 32, or 128. For example, if an FEC code is used that produces a 2.70 Gbps data rate, the required reference clock would be 168.75, 84.375, or 21.09 MHz. Slope = 20 dB/Decade 15 1.5 0.15 4.6. Lock Detect The Si5020 provides lock-detect circuitry that indicates whether the PLL has achieved frequency lock with the incoming data. The circuit compares the frequency of a divided-down version of the recovered clock with the frequency of the applied reference clock (REFCLK). If the recovered clock frequency deviates from that of the reference clock by the amount specified in Table 4 on page 7, the PLL is declared out-of-lock, and the loss-oflock (LOL) pin is asserted high. In this state, the PLL will periodically try to reacquire lock with the incoming data stream. During reacquisition, the recovered clock may drift over a ±600 ppm range relative to the applied reference clock, and the LOL output alarm may toggle until the PLL has reacquired frequency lock. Due to the low noise and stability of the DSPLL, under the condition where data is removed from the inputs, there is the possibility that the PLL will not drift enough to render an out-of-lock condition. If REFCLK is removed, the LOL output alarm will always be asserted when it has been determined that no activity exists on REFCLK, indicating the frequency lock status of the PLL is unknown. Note: LOL is not asserted during PWRDN/CAL. 4.7. PLL Performance The PLL implementation used in the Si5020 is fully compliant with the jitter specifications proposed for SONET/SDH equipment by Bellcore GR-253-CORE, Issue 2, December 1995 and ITU-T G.958. f0 f2 f3 ft Frequency SONET Data Rate F0 (Hz) F1 (Hz) F2 (Hz) F3 (kHz) Ft (kHz) OC- 48 10 600 6000 1000 1000 OC- 12 10 30 300 25 250 OC- 3 10 30 300 6.5 65 Figure 4. Jitter Tolerance Specification 4.7.2. Jitter Transfer The Si5020 is fully compliant with the relevant Bellcore/ ITU specifications related to SONET/SDH jitter transfer. Jitter transfer is defined as the ratio of output signal jitter to input signal jitter as a function of jitter frequency (see Figure 5). These measurements are made with an input test signal that is degraded with sinusoidal jitter whose magnitude is defined by the mask in Figure 4. 4.7.3. Jitter Generation The Si5020 exceeds all relevant specifications for jitter generation proposed for SONET/SDH equipment. The jitter generation specification defines the amount of jitter that may be present on the recovered clock and data outputs when a jitter free input signal is provided. The Si5020 typically generates less than 3.0 mUIrms of jitter when presented with jitter-free input data. 4.7.1. Jitter Tolerance The Si5020’s tolerance to input jitter exceeds that of the Bellcore/ITU mask shown in Figure 4. This mask defines the level of peak-to-peak sinusoid jitter that must be tolerated when applied to the differential data input of the device. Note: There are no entries in the mask table for the data rate corresponding to OC-24 as that rate is not specified by either GR-253 or G.958. 12 f1 Rev. 1.6 Si5020 When PWRDN/CAL is released (set to low) the digital logic resets to a known initial condition, recalibrates the DSPLL, and will begin to lock to the data stream. Jitter Trans f er 4.9. Device Grounding 0.1 dB The Si5020 uses the GND pad on the bottom of the 20pin micro leaded package (MLP) for device ground. This pad should be connected directly to the analog supply ground. See Figures 10 and 12 for the ground (GND) pad location. 20 dB/Dec ade Slope A c c eptable Range 4.10. Bias Generation Circuitry The Si5020 makes use of an external resistor to set internal bias currents. The external resistor allows precise generation of bias currents, which significantly reduces power consumption versus traditional implementations that use an internal resistor. The bias generation circuitry requires a 10 k (1%) resistor connected between REXT and GND. Fc Frequenc y SONET Data Rate OC-48 OC-12 OC-3 Fc (k Hz ) 2000 500 130 4.11. Differential Input Circuitry Figure 5. Jitter Transfer Specification 4.8. Powerdown The Si5020 provides a powerdown pin, PWRDN/CAL, that disables the output drivers (DOUT, CLKOUT). When the PWRDN/CAL pin is driven high, the positive and negative terminals of CLKOUT and DOUT are each tied to VDD through 100 on-chip resistors. This feature is useful in reducing power consumption in applications that employ redundant serial channels. The Si5020 provides differential inputs for both the highspeed data (DIN) and the reference clock (REFCLK) inputs. An example termination for these inputs is shown in Figure 6. In applications where direct dc coupling is possible, the 0.1 F capacitors may be omitted. The DIN and REFCLK input amplifiers require an input signal with a minimum differential peak-to-peak voltage listed in Table 2 on page 6. Dif f erential Driv er Si5020 V DD 2.5 k 0.1 F Z o = 50 R F C LK + 10 k 0.1 F Z o = 50 2.5 k 102 R F C LK – 10 k GND Figure 6. Input Termination for DIN and REFCLK (AC-coupled) Rev. 1.6 13 Si5020 Si5020 Clock source VDD 2.5 k 0.1 F Zo = 50 REFCLK + 10 k 2.5 k 100 102 REFCLK – 10 k 0.1 F GND Figure 7. Single-Ended Input Termination for REFCLK (AC-coupled) Si5020 Clock source VDD 2.5 k 0.1 F Zo = 50 DIN + 10 k 2.5 k 100 102 DIN – 10 k 0.1 F GND Figure 8. Single-Ended Input Termination for DIN (AC-coupled) 14 Rev. 1.6 Si5020 4.12. Differential Output Circuitry The Si5020 utilizes a current mode logic (CML) architecture to output both the recovered clock (CLKOUT) and data (DOUT). An example of output termination with ac coupling is shown in Figure 9. In applications in which direct dc coupling is possible, the 0.1 F capacitors may be omitted. The differential peak-to-peak voltage swing of the CML architecture is listed in Table 2 on page 6. Si5020 V DD 50 V DD 100 DOUT +, CLKOUT + 0.1 F Z o = 50 DOUT –, CLKOUT – 0.1 F Z o = 50 100 V DD 50 V DD Figure 9. Output Termination for DOUT and CLKOUT (AC-coupled) Rev. 1.6 15 Si5020 CLKOUT– CLKOUT+ GND RATESEL0 RATESEL1 5. Pin Descriptions: Si5020 20 19 18 17 16 REXT 1 15 PWRDN VDD 2 14 VDD GND 3 13 DOUT+ REFCLK+ 4 12 DOUT– REFCLK– 5 11 VDD 6 7 8 9 10 LOL VDD GND DIN+ DIN– GND Pad Connection Figure 10. Si5020 Pin Configuration Table 9. Si5020 Pin Descriptions 16 Pin # Pin Name I/O Signal Level Description 1 REXT 4 5 REFCLK+ REFCLK– I See Table 2 Differential Reference Clock. The reference clock sets the initial operating frequency used by the onboard PLL for clock and data recovery. Additionally, the reference clock is used to derive the clock output when no data is present. 6 LOL O LVTTL Loss-of-Lock. This output is driven high when the recovered clock frequency deviates from the reference clock by the amount specified in Table 4 on page 7. 9 10 DIN+ DIN– I See Table 2 Differential Data Input. Clock and data are recovered from the differential signal present on these pins. 12 13 DOUT– DOUT+ O CML Differential Data Output. The data output signal is a retimed version of the data recovered from the signal present on DIN. It is phase aligned with CLKOUT and is updated on the rising edge of CLKOUT. External Bias Resistor. This resistor is used by onboard circuitry to establish bias currents within the device. This pin must be connected to GND through a 10 k1resistor. Rev. 1.6 Si5020 Table 9. Si5020 Pin Descriptions (Continued) Pin # Pin Name I/O Signal Level Description 15 PWRDN/CAL I LVTTL Powerdown. To shut down the high-speed outputs and reduce power consumption, hold this pin high. For normal operation, hold this pin low. Calibration. To initiate an internal self-calibration, force a highto-low transition on this pin. (See "PLL Self-Calibration" on page 11.) Note: This input has a weak internal pulldown. 16 17 CLKOUT– CLKOUT+ O CML Differential Clock Output. The output clock is recovered from the data signal present on DIN. In the absence of data, the output clock is derived from REFCLK. 19 20 RATESEL0 RATESEL1 I LVTTL Data Rate Select. These pins configure the onboard PLL for clock and data recovery at one of four user selectable data rates. See Table 7 for configuration settings. Note: These inputs have weak internal pulldowns. 2, 7, 11, 14 VDD 2.5 V Supply Voltage. Nominally 2.5 V. 3, 8, 18, and GND Pad GND GND Supply Ground. Nominally 0.0 V. The GND pad found on the bottom of the 20-pin micro leaded package (see Figure 12) must be connected directly to supply ground. Rev. 1.6 17 Si5020 6. Ordering Guide Part Number Package Voltage Pb-Free Temperature Si5020-X-GM 20-Lead QFN 2.5 Yes –40 to 85 °C 1. “X” denotes product revision. 2. Add an “R” at the end of the device to denote tape and reel option; 2500 quantity per reel. 3. These devices use a NiPdAu pre-plated finish on the leads that is fully RoHS6 compliant while being fully compatible with both leaded and lead-free card assembly processes. 18 Rev. 1.6 Si5020 7. Top Marking Figure 11. Si5020 Top Marking Table 10. Top Marking Explanation Silicon Labs Part Number Die Revision (R) Assembly Date (YWW) Si5020-B-GM B Y = Last digit of current year WW= Work week Rev. 1.6 19 Si5020 8. Package Outline Figure 12 illustrates the package details for the Si5020. Table 11 lists the values for the dimensions shown in the illustration. Figure 12. 20-pin Quad Flat No-Lead (QFN) Table 11. Package Dimensions Dimension Min Nom Max Dimension Min Nom Max A 0.80 0.85 0.90 E2 2.0 2.10 2.20 A1 0.00 0.02 0.05 L 0.50 0.60 0.70 b 0.18 0.25 0.30 aaa 0.15 bbb 0.10 ccc 0.08 D D2 4.00 BSC 2.0 2.10 2.20 e 0.50 BSC ddd 0.05 E 4.00 BSC eee 0.05 Notes: 1. All dimensions shown are in millimeters (mm) unless otherwise noted. 2. Dimensioning and Tolerancing per ANSI Y14.5M-1994. 3. This drawing conforms to JEDEC outline MO-220, variation VGGD-1. 4. Recommended card reflow profile is per the JEDEC/IPC J-STD-020C specification for Small Body Components. 20 Rev. 1.6 Si5020 9. 4x4 mm 20L QFN Recommended PCB Layout See Note 8 Gnd Pin See Note 9 Gnd Pin Gnd Pin Figure 13. 4x4 mm 20L QFN PCB Layout Table 12. PCB Land Pattern Dimensions Symbol Parameter Dimensions Min Nom Max A Pad Row/Column Width/Length 2.23 2.25 2.28 D Thermal Pad Width/Height 2.03 2.08 2.13 e Pad Pitch — 0.50 BSC — G Pad Row/Column Separation 2.43 2.46 2.48 Notes: 1. All dimensions listed are in millimeters (mm). 2. The perimeter pads are to be Non-Solder Mask Defined (NSMD). Solder mask openings should be designed to leave 60-75 mm separation between solder mask and pad metal, all the way around the pad. 3. The center thermal pad is to be Solder Mask Defined (SMD). 4. Thermal/Ground vias placed in the center pad should be no less than 0.2 mm (8 mil) diameter and tented from the top to prevent solder from flowing into the via hole. 5. The stencil aperture should match the pad size (1:1 ratio) for the perimeter pads. A 3x3 array of 0.5 mm square stencil openings, on a 0.65 mm pitch, should be used for the center thermal pad. 6. A stencil thickness of 5 mil is recommended. The stencil should be laser cut and electropolished, with trapezoidal walls to facilitate paste release. 7. A “No-Clean”, Type 3 solder paste should be used for assembly. Nitrogen purge during reflow is recommended. 8. Do not place any signal or power plane vias in these “keep out” regions. 9. Suggest four 0.38 mm (15 mil) vias to the ground plane. Rev. 1.6 21 Si5020 Table 12. PCB Land Pattern Dimensions Symbol Parameter Dimensions Min Nom Max R Pad Radius — 0.12 REF — X Pad Width 0.23 0.25 0.28 Y Pad Length — 0.94 REF — Z Pad Row/Column Extents 4.26 4.28 4.31 Notes: 1. All dimensions listed are in millimeters (mm). 2. The perimeter pads are to be Non-Solder Mask Defined (NSMD). Solder mask openings should be designed to leave 60-75 mm separation between solder mask and pad metal, all the way around the pad. 3. The center thermal pad is to be Solder Mask Defined (SMD). 4. Thermal/Ground vias placed in the center pad should be no less than 0.2 mm (8 mil) diameter and tented from the top to prevent solder from flowing into the via hole. 5. The stencil aperture should match the pad size (1:1 ratio) for the perimeter pads. A 3x3 array of 0.5 mm square stencil openings, on a 0.65 mm pitch, should be used for the center thermal pad. 6. A stencil thickness of 5 mil is recommended. The stencil should be laser cut and electropolished, with trapezoidal walls to facilitate paste release. 7. A “No-Clean”, Type 3 solder paste should be used for assembly. Nitrogen purge during reflow is recommended. 8. Do not place any signal or power plane vias in these “keep out” regions. 9. Suggest four 0.38 mm (15 mil) vias to the ground plane. 22 Rev. 1.6 Si5020 DOCUMENT CHANGE LIST Revision 1.2 to Revision 1.3 Added "Top Marking" on page 19. Updated "Package Outline" on page 20. Added "4x4 mm 20L QFN Recommended PCB Layout" on page 21. Revision 1.3 to Revision 1.4 Made minor note corrections to "4x4 mm 20L QFN Recommended PCB Layout" on page 21. Revision 1.4 to Revision 1.5 Added "Top Marking" on page 19. Updated "Ordering Guide" on page 18. Updated "Package Outline" on page 20. Revision 1.5 to Revision 1.6 Updated “Package Outline” . Rev. 1.6 23 ClockBuilder Pro One-click access to Timing tools, documentation, software, source code libraries & more. Available for Windows and iOS (CBGo only). www.silabs.com/CBPro Timing Portfolio www.silabs.com/timing SW/HW Quality Support and Community www.silabs.com/CBPro www.silabs.com/quality community.silabs.com Disclaimer Silicon Laboratories intends to provide customers with the latest, accurate, and in-depth documentation of all peripherals and modules available for system and software implementers using or intending to use the Silicon Laboratories products. Characterization data, available modules and peripherals, memory sizes and memory addresses refer to each specific device, and "Typical" parameters provided can and do vary in different applications. Application examples described herein are for illustrative purposes only. Silicon Laboratories reserves the right to make changes without further notice and limitation to product information, specifications, and descriptions herein, and does not give warranties as to the accuracy or completeness of the included information. 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