Transient Immunity Standards: IEC 61000-4-x - AN96-07

AN96-07
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TVS Diode Application Note
PROTECTION PRODUCTS
TRANSIENT IMMUNITY STANDARDS:
IEC 61000-4-x
just prior to contact (Air discharge method). Contact
discharge is the preferred test method, but air discharge is used where contact discharge cannot be
applied.
On January 1, 1996, exports into Europe began facing
some tough transient immunity standards. The International Electrotechnical Commission (IEC), a worldwide organization promoting international cooperation
on questions concerning standardization in electrical &
electronic fields, has developed transient immunity
standards which have become minimum requirements
for manufacturers wanting to do business in the
European Community (EC). The basic standards for
immunity testing had become known as the IEC 801-X
standards, but recently underwent a numbering change
to IEC 61000-4-X. Three of the IEC standards deal
with transient immunity:
!
!
!
The ESD threat is divided into four threat levels depending on material and ambient humidity (See Table
1). Threat level 1 is considered the least severe while
threat level 4 is the most severe. Levels 1 & 2 are
reserved for equipment which is installed in a controlled environment and in the presence of anti-static
materials. Level 3 is used for equipment which is
sparsely but not continuously handled. Level 4 is
required for any equipment which is continuously
handled.
IEC 61000-4-2 also specifies the ESD current waveform and parameters shown in Figure1 & Table 2. The
rise time is extremely fast, defined as 0.7 to 1ns, with
a second peak at 30ns and a total duration of only
60ns. The total energy contained within the pulse is
approximately a few hundred microjoules.
IEC 61000-4-2 : Electrostatic Discharge (ESD)
IEC 61000-4-4 : Electrical Fast Transient/Burst
(EFT)
IEC 61000-4-5 : Surge Immunity
The following sections provide a summary of each of
the transient immunity standards.
Transient voltage suppression (TVS) diodes are an ideal
choice for meeting the ESD transient immunity requirements of IEC 61000-4-2 and have proved to be
capable of suppressing ESD events. The extremely
fast response time of the TVS diode is essential for
responding to the 1ns rise time of the ESD pulse.
Additionally, TVS diodes are capable of clamping the
incoming transient to a low enough level as not to
cause damage to the protected semiconductor. Al-
IEC 61000-4-2 - ELECTROSTATIC DISCHARGE (ESD)
STANDARD
IEC 61000-4-2 addresses one of the most common
forms of transients in electronic systems : Electrostatic
discharge (ESD). ESD results from conditions which
allow the build up of electrical charge from contact and
separation of two non-conductive materials. When the
charged body is brought in proximity of another object
of lower potential, energy is released in the form of
electrostatic discharge.
The standard defines immunity requirements for ESD
which can be coupled into the equipment directly or
through radiation. Direct coupling includes any user
accessible entry points such as I/O ports, switches,
computer keyboards, panel displays, and equipment
housings. Radiated coupling results from the discharge
between two bodies which are external to the system.
Because the human body is one of the most common
generators of ESD, the IEC standard defines a test set
up which is designed to simulate an ESD event from a
human body. The “Human Body Model” as it is referred to, is considered a valid representation of worst
case ESD stresses. Discharge into equipment may be
through direct contact (Contact discharge method) or
Revision 02/4/2002
Figure 1 - ESD Waveform
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PROTECTION PRODUCTS
Class
R elative
Humidity as
low as
Anitstatic
Material
Synthetic
Material
Maximum
Charge
Voltage
Test Voltage
(Contact
Discharge)
Test Voltage
(Air Discharge)
kV
kV
kV
%
1
35
X
2
2
2
2
10
X
4
4
4
3
50
X
8
6
8
4
10
X
15
8
15
Table 1 - IEC 61000-4-2 Severity Levels and Test Voltages
Le ve l
Indicate d
Vo ltage
Fir st pe ak
cur r e nt o f
dischar ge +/10%
R ise time (tr )
w ith dischar ge
sw itch
Cur r e nt
(+/- 30%)
at 30 ns
Cur r e nt
(+/- 30%)
at 60 ns
kV
A
ns
A
A
1
2
7.5
0.7 to 1
4
2
2
4
15
0.7 to 1
8
4
3
6
22.5
0.7 to 1
12
6
4
8
30
0.7 to 1
16
8
Table 2 - IEC 61000-4-2 Waveform Parameters
burst of high voltage spikes at a repetition rate ranging
from 2kHz to 5kHz. The burst length is defined as
15ms with bursts repeated every 300ms. Each individual burst pulse is a double exponential waveform
with a rise time of 5ns and a total duration of 50ns. A
diagram showing the EFT waveform and the EFT burst
though axial leaded devices are effective ESD suppressors, surface mount devices offer the best choice. All
TVS diode devices and families offered by Semtech
may be used to suppress ESD to level 4 of IEC 610004-2. The fast response and low clamping levels make
TVS diodes suitable for ESD suppression on data and
I/O ports.
IEC 61000-4-4 - ELECTRICAL FAST TRANSIENT (EFT)
STANDARD
Voltage
Electrical fast transients occur as a result of arcing
contacts in switches and relays. EFT disturbances are
common in industrial environments where electromechanical switches are used to connect and disconnect inductive loads. IEC 61000-4-4 specifies the EFT
threat in both power and data lines. The electrical fast
transient is described in terms of a voltage across a
50Ω load from a generator having a nominal dynamic
source impedance of 50Ω. The output occurs as a
 2002 Semtech Corp.
5 x 50 ns
Voltage
15 ms
300 ms
Figure 2 - EFT Burst
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IEC 61000-4-5 - SURGE STANDARD
repetition rate and burst period is shown in Figure 2.
Four severity levels are defined in terms of an open
circuit voltage as a function of installation environment. The installation environments are defined as :
1
2
3
4
IEC 61000-4-5 addresses the most severe transient
conditions on both power and data lines. These are
transient caused by lightning strikes and switching.
Switching transients may be the result of power system
switching, load changes in power distribution systems,
or short circuit fault conditions. Lightning transients
may result from a direct strike or induced voltages and
currents due to an indirect strike.
The IEC 61000-4-5 standard defines a transient entry
point and a set of installation conditions. The transient
is defined in terms of a generator producing a given
waveform and having a specified open circuit voltage
and source impedance. Two surge waveforms are
specified : the 1.2 x 50µs open-circuit voltage waveform and the 8 x 20µs short-circuit current waveform
(Figures 3 & 4 respectively).
- Well Protected
- Protected
- Typical Industrial
- Severe Industrial
Peak Amplitude
Pow er Supply Port
I/O, Signal, Data &
Control Lines
Level
VOC
(kV)
ISC
(A )
VOC
(kV)
ISC
(A )
1
0.5
10
0.25
5
2
1
20
0.5
10
3
2
40
1
20
4
4
80
2
40
Table 3 - IEC 61000-4-4 Severity Levels
Table 3 provides the open-circuit voltages for each threat
level and for both power supply and data lines. Short
circuit current values are estimated by dividing the EFT
open-circuit voltage by its 50Ω source impedance. This
represents the worse case stresses
seen by the suppression element.
T1
50µs
T1 x 1.67 = 1.2 µ s
Figure 3 - IEC 61000-4-5 Voltage Impulse
Like ESD, EFT can be especially fatal on data and I/O
lines. The fast rise time of the EFT pulses demands a
suppression element with the same characteristics as
that which are required for suppression of an ESD
pulse. Again TVS diodes offer the best solution for
suppressing the expected transient energy while
keeping clamping voltages across the protected
elements to a minimum. Additionally, the extremely fast
response time of TVS diodes is essential for responding to the 5ns rise time of the EFT pulse. Due to the
repetitive nature of the EFT pulses, TVS diodes with
slightly higher power handling capability will be required
for protection at threat level 4.
 2002 Semtech Corp.
T1
20 µs
T1 x 1.25 = 8.0µ s
Figure 4 - IEC 61000-4-5 Current Impulse
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Class
Power Supply
Unsym Lines
(Long Distance Bus)
Sym Lines
Data Bus
(Short Distance)
Coupling Mode
Coupling Mode
Coupling Mode
Coupling Mode
Line-GN D
Zs=42 Ω
Line-GN D
Zs=42 Ω
0.5KV
1.0KV
(n/a)
12A
24A
Line-Line
Zs=2 Ω
Line-GN D
Zs=12 Ω
Line-Line
Zs=42 Ω
voltage
0
2
3
4
5
WAVE
FORMs
N O REQUIREMEN T
current
voltage
1
Line-GN D
Zs=42 Ω
(n/a)
current
0.5KV
(n/a)
42A
voltage
0.5KV
1.0KV
0.5KV
1.0KV
1.0KV
0.5KV
current
250A
83A
12A
24A
24A
12A
voltage
1.0KV
2.0KV
1.0KV
2.0KV
2.0KV
(n/a)
current
500A
167A
24A
48A
48A
voltage
2.0KV
4.0KV
2.0KV
4.0KV
(n/a)
current
1KA
333A
48A
95A
voltage
(N OTE 1)
(N OTE 1)
2.0KV
4.0KV
4.0KV
48A
95A
95A
current
(n/a)
voltage
(1.2 x 50µs)
(1.2 x 50µs)
(1.2 x 50µs)
(1.2 x 50µs)
(1.2 x 50µs)
(1.2 x 50µs)
current
(8 x 20µs)
(8 x 20µs)
(8 x 20µs)
(8 x 20µs)
(8 x 20µs)
(8 x 20µs)
Note 1: Depends on class of local power supply system.
Table 4 - IEC 61000-4-5 Severity Levels
level a has no transient stress requirements. The class 5
environment is the most severe and requires the highest
transient stress level testing.
Table 4 summarizes threat levels as a function of installation class. Values of voltage stress using the 1.2 x
50µs waveform are given. Corresponding current values
are calculated by dividing the open-circuit voltages by the
source impedances. The short-circuit current values are
more useful in choosing a suppression element. The
short circuit current stress levels are defined with the 8 x
20µs waveform for power supply applications with a 2Ω
source impedance. For data lines requiring a 42Ω
source impedance, the short-circuit current waveform is
defined as 8 x 20µs. For telecommunications applications, the open-circuit voltage is defined as 10 x 700µs
Transient stress levels for each entry point into the
system are defined by installation class. The six
classes are defined as :
Class 0 : Well Protected Environment
Class 1 : Partially Protected Environment
Class 2 : Well Separated Cables
Class 3 : Cables Run in Parallel
Class 4 : Multi - Wire Cables for both Electronic &
Electrical circuits
Class 5 : Connection to telecommunications cables
and overhead power lines (Low density populated
areas)
A class 0 environment is considered the lowest threat
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TVS Diode Application Note
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suppression devices must be carefully chosen for each of
the standards.
BIBLIOGRAPHY
! Makowski, Leo P., “IEC 1000-4-X (801) Series of
Standards,” EMC Test & Design, October 1994
and the short-circuit current is a 5 x 300µs waveform.
The source impedance is given as 40Ω.
The type of suppression element needed for IEC 610004-5 class surges depends upon the threat level and
installation class. For power supply applications high
power devices are required. A discrete device or an
assembly may be required depending on the application.
TVS diodes are the best choice for data line applications
and secondary board level protection because of their
superior clamping voltage characteristics and fast
response time.
!
Clark, O.M., “Electrical-Transient Immunity: A
Growing Imperative for System Design,” Electronic
Design, January 23, 1992
!
IEC Publication 1000-4-2 “Electromagnetic Compatibility for Industrial Process Measurement and
Control Equipment - Part 4, Electrostatic Discharge
Requirements,” International Electromechanical
Commission, 1995
!
IEC Publication 1000-4-4 “Electromagnetic Compatibility for Industrial Process Measurement and
Control Equipment - Part 4, Electrical Fast Transient/Burst Requirements,” International Electromechanical Commission, 1995
!
IEC Publication 1000-4-5 “Electromagnetic Compatibility for Industrial Process Measurement and
Control Equipment - Part 4, Surge Immunity Test,”
International Electromechanical Commission, 1995
CONCLUSION
Any OEM equipment manufacturer who plans to sell in
the European market will have to meet the requirements of IEC 61000-4. IEC defines three transient
immunity standards which provide equipment suppliers
with a susceptibilty level which can be designed against
to produce more reliable products. Each of the transient immunity standards defines transient sources,
entry paths into a system, severity levels, and test
methods. Equipment application will determine what
level of transient protection is needed. Transient
SOURCES FOR STANDARDS
Compliance Engineering
One Tech Drive
Andover, MA 01810-2452 U.S.A.
TEL 508-681-6600
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