MLX90277 DataSheet DownloadLink 4843

MLX90277
Dual Programmable Linear Hall Effect Sensor
Features and Benefits
Application Examples
Full Redundant Sensor
Analog Signal Processing
Quad Switched Hall Plate
Chopper Stabilized Amplifier
Linear Analog Ratiometric Output Voltage
Programmable Output Quiescent Voltage (VOQ)
-100%VDD…200%VDD Range
Programmable Magnetic Sensitivity
Programmable Low Pass Filter
Programmable Clamping Voltage
Programmable Temperature Compensation
Melexis ID Number
Programmable Customer ID Number
Lead-free package
Linear Position Sensing
Rotary Position Sensing
Current Sensing
Magnetic Field Measurement
Ordering Information
Part No.
MLX90277
Temperature Code
E (-40°C to 85°C)
Package Code
GO (TSSOP 14)
Option Code SR(IC_A, IC_B)
SRA-B, (A = 0, 1, 2, or 3)
(B = 0, 1, 2, or 3)
†
Example: MLX90277EGO SR2-1
†
Please see section 10.4 for detailed information on the option codes.
1 Functional Diagram
Supply
3
2 General Description
10
Filter
OPA
OPA
12
5
2
9
DAC
DAC
DAC
DAC
DAC
6
DAC
14
OPA
Program
decoder
Shift Register
E E P R O M
Figure 1-1 Functional Diagram
Vdd
Out
Vss (Ground)
Test
NC
Table 1: Pin out
3901090277
Rev 004
TSSOP 14 pin out
IC_A
IC_B
3
10
12
5
14
6
2
9
1 - 4 - 7 - 8 - 11 - 13
The MLX90277 is a Dual Programmable
Ratiometric Linear Hall Effect sensor. Two
discrete CMOS ICs are mounted inside a single
package, electrically insulated, and independently
programmable. The MLX90277 is suitable for
applications requiring full redundancy. The linear
output voltages are proportional to the magnetic
flux density. The ratiometric output voltages are
proportional to the supply voltages. The
MLX90277 possesses active error correction
circuitry, which virtually eliminates the offset errors
normally associated with analog Hall Effect
devices. All the parameters of the MLX90277
transfer characteristic are fully programmable.
The VOQ (VOUT @ B = 0 Gauss), the Sensitivity,
the slope polarity, the Output Clamping levels, the
thermal Sensitivity drift, the internal bias point and
a low-pass filter are all programmable in end-user
applications. The MLX90277 has a very stable
thermal compensation for both the Sensitivity and
the VOQ over a broad temperature range. For
traceability purpose the MLX90277 will carry a
unique ID number programmed by Melexis and 24
bits of EEPROM memory are allocated for a user
programmed serial number.
Page 1 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
Table of Contents
1 Functional Diagram ........................................................................................................... 1
2 General Description .......................................................................................................... 1
3 Glossary of Terms............................................................................................................. 3
4 Maximum Ratings ............................................................................................................. 3
5 Detailed Block Diagram..................................................................................................... 4
5.1 Detailed Description .................................................................................................... 4
6 General Electrical Specifications....................................................................................... 5
7 Programming Range ......................................................................................................... 6
8 Timing Specifications ........................................................................................................ 6
9 Accuracy ........................................................................................................................... 6
10 Programmable Features ................................................................................................. 7
10.1 Output Quiescent Voltage (VOQ)................................................................................ 8
10.2 Thermal VOQ Drift (DRIFT) ........................................................................................ 8
10.3 Sensitivity, Rough Gain and Fine Gain ..................................................................... 8
10.4 Sensitivity Range Selection....................................................................................... 9
10.5 Sensitivity Polarity (INVERT)................................................................................... 11
10.6 Clamping Levels (CLAMPLOW, CLAMPHIGH)....................................................... 11
10.7 Filter (FILTER) ........................................................................................................ 12
10.8 Sensitivity Temperature Compensation (TC, TCW, TC2) ........................................ 12
10.9 Diagnostic Output Level (FAULTLEV)..................................................................... 13
10.10 The EEPROM, Parity and Melexis CRC ............................................................... 13
10.11 Output Amplifier Configuration (MODE) ................................................................ 14
10.12 Memory Lock (MEMLOCK) ................................................................................... 14
10.13 IC traceability ........................................................................................................ 14
11 Performance Graphs..................................................................................................... 14
12 Applications Information................................................................................................ 15
12.1 Application Circuits.................................................................................................. 15
12.2 Programming the Sensor ........................................................................................ 16
12.3 Calibration Procedure ............................................................................................. 17
13 Standard information regarding manufacturability of Melexis products with different
soldering processes ........................................................................................................... 18
14 ESD Precautions........................................................................................................... 18
15 Package Information ..................................................................................................... 19
15.1 Package Dimensions .............................................................................................. 19
15.2 Pin-out and Marking ................................................................................................ 20
15.3 Hall Plate Positioning .............................................................................................. 20
16 Disclaimer ..................................................................................................................... 21
3901090277
Rev 004
Page 2 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
Note: All specifications apply to IC_A and IC_B unless otherwise noted.
3 Glossary of Terms
mT (milli-Tesla) = Unit of measurement for magnetic flux density. 1mT is equal to 10 Gauss.
VOQ (Output Quiescent Voltage) = Output voltage at zero magnetic field, VOUT for B = 0 mT.
Sensitivity = Change in output voltage versus change in magnetic field, ∆ VOUT / ∆ B.
TempCo (Sensitivity Temperature Compensation) = Change in Sensitivity over temperature. Listed
in units of ppm / °C (100ppm / °C. = 0.01 % / °C.).
PTC (Programming Through the Connector) = Melexis in circuit programming protocol.
MSB = Most Significant Bit.
LSB = Least Significant Bit.
4 Maximum Ratings
Parameter
Maximum Supply Voltage, VDD_MAX (Over
Voltage)
Units
30 V
Maximum Supply Current, IDD_MAX
(Over Voltage)
50 mA
Reverse Voltage, VDD_REV
- 15 V
Reverse Supply Current, IDD_REV
- 85 mA
Positive Output Voltage, VOUT_MAX
24 V
Positive Output Current, IOUT_POS_FAULT
40 mA
Reverse Output Voltage, VOUT_REV
- 0.7 V
Reverse Output Current, IOUT_REV_FAULT
-50 mA
Operating Ambient Temperature Range, TA
-40°C to 150°C
Storage Temperature Range, TS
-55°C to 165°C
Magnetic Flux Density
Table 2: Absolute Maximum Ratings
Infinite
Note: Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolutemaximum-rated conditions for extended periods may affect device reliability.
3901090277
Rev 004
Page 3 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
5 Detailed Block Diagram
Figure 5-1 Detailed Block Diagram
5.1 Detailed Description
Integrated on each individual IC within the MLX90277 is a temperature-compensated quad switched Hall
plate, chopper stabilized amplifiers, adjustable output filter, output driver, voltage protection circuitry and a
programmable EEPROM with security and redundancy. Programming the EEPROM allows each device to be
calibrated in the application.
In normal operation data stored in the EEPROM feeds a register, RAM, that updates internal DACs and
switches that effect the operation of the device. In programming mode the RAM can be directly accessed to
allow faster calibration of the parameters. Communication to the device is done using Melexis' PTC serial
interface.
3901090277
Rev 004
Page 4 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
6 General Electrical Specifications
DC operating parameters at VDD = 5V (unless otherwise specified) and for TA as specified by the temperature
range (E).
Parameter
Symbol
Test Conditions
Min
Typical Max
Units
Nominal Supply Voltage
VDDNOM
5
V
Operating Supply Voltage
VDD†
-
5.5
V
Nominal Supply Current
IDDNOM
VDD = VDDNOM
Supply Current
IDD
VDD = 4.5 … 5.5 V
4.0
7.0
8.0
mA
3.0
-
9.0
mA
VOUTPD
Pull Down Load ≥ 10 kΩ
no clamping
2
96
%VDD
VOUTPU
Pull Up Load ≥ 10 kΩ
no clamping
5
97
%VDD
Output Current
IOUT
VDD = VDDNOM
-1.25
1.25
mA
Output Short-Circuit Current
IOUTSC+
IOUTSC-
VDD = VDDNOM
Output shorted to supply-permanent
Output shorted to ground-permanent
-12
4
-4
12
mA
mA
0.5
%VDD
Output Voltage Swing
4.5
VOUT1
Broken supply,
Pull-down load > 10 kΩ
0
VOUT2
Broken ground,
Pull-down load > 10 kΩ
94
96
100
%VDD
VOUT3
Broken supply,
Pull-up load > 10 kΩ
0
3
5
%VDD
VOUT4
Broken ground,
Pull-up load > 10 kΩ
99.5
100
%VDD
Power on Reset
VDD_POR
Voltage on VDD
1.5
3.8
V
Over Voltage Detection
VDD_OVD
Voltage on VDD
6.5
8.5
V
Diagnostic Output Voltage
Substrate Insulation
RDIES
200VDC across VSS1 and VSS2
0
50
µA
Table 3: Electrical Specifications
†
The ratiometric output voltage is proportional to the supply voltage. When using the supply voltage as a
reference for an A/D converter, fluctuations of ±10% in supply voltage are compensated.
3901090277
Rev 004
Page 5 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
7 Programming Range
TA programming 20°C to 30°C.
Parameter
Symbol
Output Quiescent Voltage
VOQ
Sensitivity
S
Output Clamping Voltage Low
ClampLo
Output Clamping Voltage High
ClampHi
Test Conditions
AGND = Default
AGND = 0…1023
Min
-10
-100
Typical Max
110
200
Units
%VDD
%VDD
2.6
210
mV/mT
0
100
%VDD
0
100
%VDD
0
2300
ppm / °C
1st
Temperature Compensation
TempCo
order
Table 4: Programming Range Specifications
8 Timing Specifications
DC operating parameters at VDD = 5V (unless otherwise specified) and for TA as specified by the temperature
range (E).
Parameter
Symbol
Test Conditions
Min
Typical Max
Units
Power On Delay
TPO
FILTER = 0, RG = 0
0.4
0.8
ms
FILTER = 0, RG = 15
0.6
1.2
ms
FILTER = 15, RG = 0
1.1
2.2
ms
10
ms
FILTER = 15, RG = 15
5
Step Response Time
RG = 0 to 3, FILTER = 0
RG = 4 to 7, FILTER = 0
RG = 8 to 11, FILTER = 0
RG = 12 to 15, FILTER = 0
24
48
100
200
32
64
132
264
µs
µs
µs
µs
Table 5: Timing Specifications
9 Accuracy
DC operating parameters at VDD = 5V (unless otherwise specified) and for TA as specified by the temperature
range (E).
Parameter
Symbol††
Test Conditions
Min
Typical Max
Units
∆TVOQ
VOQ = 2.5V(1), 25°C / 150°C
Thermal Voq Drift
- 0.2
+ 0.2
%VDD
VOQ = 2.5V(1), 25°C / -40°C
- 0.4
+ 0.4
%VDD
∆L∆TVOQ
Life Time Drift of the Thermal
- 0.2
+ 0.2
%VDD
Voq Drift
∆LVOQ
Life Time Voq Drift
- 0.3
+ 0.3
%VDD
∆LS
Life Time Sensitivity Drift
-1
+1
%
0 to 500 ppm / °C
± 100 ppm / °C
Sensitivity Temperature
TCs
†
Coefficient
500 to 1200 ppm / °C
± 150 ppm / °C
1200 to 2300 ppm / °C
± 200 ppm / °C
∆TTC
ppm / °C
Thermal Drift of Sensitivity
150
Temperature Compensation
Thermal Drift Output Clamping ∆TVOUTCLAMP
- 0.4
+ 0.4
%VDD
Levels
Life Time Drift Output Clamping ∆LVOUTCLAMP
- 0.2
+ 0.2
%VDD
Levels
Linearity error
Le
0.2
%
Table 6: Accuracy Specifications
3901090277
Rev 004
Page 6 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
†
Valid for Rough Gain within the specified option code.
∆L = Life Time Drift (based on HTOL data [1000 hours @ 150°C]).
∆T = Thermal Drift.
(1) For other test conditions, please contact the Melexis Sales representative of your area.
††
10 Programmable Features
The MLX90277 has many programmable features for adjusting the output characteristics. The parameters
are independently programmable for IC A and IC B. The features are utilized by writing data into the
redundant non-volatile EEPROM. Below is a quick list and description of all the programmable parameters.
Many of the parameters are set by Melexis and they are not used by the end customer. Later sections of the
data sheet give details on how the parameters are used.
Parameter
Internal Bias Point
Analog Clock
Choice†
Symbol
Description
AGND
Coarse adjustment of VOQ.
CKANACH
Adjustment for amplifier clock generator.
Number of
Bits
10
Default
IC_A
Trimmed
Default
IC_B
Trimmed
2
Preset
Preset
Clamping High
CLAMPHIGH Adjustment of upper output clamping
voltage.
10
768
256
Clamping Low
CLAMPLOW Adjustment of lower output clamping
voltage.
10
768
256
Customer ID††
CUSTID
Open bits for customer programming.
24
Preset
Preset
Offset Drift†
DRIFT
VOQ temperature drift compensation.
4
Trimmed
Trimmed
EEPROM Fault Level
FAULTLEV
Output state for EEPROM parity error.
1
0
0
Fine Gain
FG
Fine adjustment for Sensitivity.
10
0
0
Filter
FILTER
Adjustment for low pass output filter.
4
0
0
Invert Slope
INVERT
Sensitivity polarity selection.
1
0
0
Memory Lock
1
0
0
Preset
Preset
MEM_LOCK
Used to lock the entire EEPROM.
Melexis
ID†
MLX_ID
Melexis IC identification number.
Melexis
Lock†
MLX_LOCK
Used to lock Melexis area of the EEPROM.
1
0
0
Output Driver†
MODE
Adjustment for output stage amplifier.
2
1
1
Offset DAC
OFFSET
Fine adjustment of VOQ.
10
0
0
OSCADJ
Chip oscillator frequency adjustment.
4
Preset
Preset
Oscillator
Adjust†
EEPROM Parity
PARITY
Ensures the integrity of the EEPROM data.
3
Calculated
Calculated
Rough Gain
RG
Rough adjustment for Sensitivity.
4
0
0
Slow†
SLOW
Amplifier speed adjustment.
1
Preset
Preset
Temperature
Compensation Window
TCW
Range adjustment for Sensitivity
Temperature Compensation.
3
0
0
Temperature
Compensation
TC
Fine adjustment of Sensitivity
Temperature Compensation.
5
0
0
6
0
0
2nd Order Temperature TC2
Linearization adjustment of the Sensitivity
Compensations
Temperature Compensation.
Table 7: Programmable Parameters
†
Melexis parameter adjusted at final test.
††
Not included in redundant area of the EEPROM.
3901090277
Rev 004
Page 7 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
10.1 Output Quiescent Voltage (VOQ)
Two parameters, AGND and OFFSET, are used for adjustment of the VOQ. The AGND is a 10 bit parameter
for coarse adjustment of VOQ. It has a resolution of approximately 0.014V and a range of -100%VDD to
200%VDD. The OFFSET is a 10 bit parameter with a resolution of approximately -0.005V. The OFFSET
parameter is used for fine adjustment of the VOQ, while the AGND parameter is used to set the range. The
large adjustable range allows the MLX90277 to be used in an unipolar magnetic system without limiting the
output voltage span. The formula below shows how the AGND and OFFSET parameters combine to set the
VOQ.
 14.25V
  5.0V

VOQ = −0.75V + 
∗ AGND  +  −
∗ OFFSET 
 1023
  1023
 VDD =5.00V
This formula approximates the typical VOQ of the MLX90277's individual sensors. The actual VOQ formula
varies slightly from IC to IC. Melexis calibrates the AGND setting during final test so that the VOQ is
approximately 50%VDD with OFFSET set to 512. This gives the VOQ a range of 0%VDD to 100%VDD without
adjusting the AGND value. The OFFSET parameter is often used to set the application's offset output
transfer characteristic.
10.2 Thermal VOQ Drift (DRIFT)
The Thermal VOQ Drift is tuned using 4 bits. This parameter, DRIFT, is calibrated for each unit by Melexis
during final test. The value is set to achieve a VOQ accuracy below 10mV over a temperature span of 25°C to
150°C. This parameter is not used by the end customer.
10.3 Sensitivity, Rough Gain and Fine Gain
The Sensitivity of the MLX90277's individual sensors is controlled through parameters linked to dedicated
internal amplification stages. The parameter Rough Gain (RG), or pre-amplifier, has 4 bits for adjustment of
two stages. The two MSB affect the Differential Input Differential Output (DIDO) stage. The two LSB effect
the Differential to Single output (DTS) stage. The gain of both the DIDO and DTS are multiplied to get the
total RG. The table below shows typical values of the small signal amplifier gain vs. the parameter RG. The
pre-amplifier is chopper stabilized and the refresh frequency is adapted automatically to the RG setting to
match the chopper gain-bandwidth product.
Rough Gain (MSB LSB)
DIDO
DTS
Gain
00 (00 00)
16
1.0
16
01 (00 01)
16
1.5
24
02 (00 10)
16
2.33
37
03 (00 11)
16
4.0
64
04 (01 00)
39
1.0
39
05 (01 01)
39
1.5
59
06 (01 10)
39
2.33
91
07 (01 11)
39
4.0
156
08 (10 00)
82
1.0
82
09 (10 01)
82
1.5
123
10 (10 10)
82
2.33
191
11 (10 11)
82
4.0
328
12 (11 00)
205
1.0
205
13 (11 01)
205
1.5
308
14 (11 10)
205
2.33
477
15 (11 11)
205
4.0
820
Table 8: MLX90277 Rough Gain Small Signal Amplifier Gain
3901090277
Rev 004
Page 8 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
The MLX90277 sensors also have an additional stage, Fine Gain, for fine tuning the Sensitivity. The stage
(parameter FG) follows the RG and provides a 10 bit adjustment. The small signal gain of the FG is within
1.0 and 2.5. The RG and FG parameters are adjusted in the application to calibrate the sensitivity (gain) and
output slope transfer characteristic of the device. The function for the fine gain is given in the following
equation:
1
Fine Gain =
1 − 0.6 *
FG
1023
Note. The one bit parameter INVERT is used to fix the “sign” of the sensitivity. A value of 0 makes the gain
positive and the output voltage increases in response to a South magnetic field. A value of 1 makes the gain
negative and the output voltage decrease in response to a South magnetic field. Refer to section 10.5,
Sensitivity Polarity for more information on INVERT.
10.4 Sensitivity Range Selection
Each unit is characterized over temperature during final test to optimize its performance and accuracy. To
achieve the best possible Sensitivity Temperature Compensation, TempCo., each unit is optimized for use
within a specific Sensitivity range. This is represented in the ordering information by the option code. There
are four available ranges, option codes 0, 1, 2 and 3. The option code corresponds with the two MSB of the
RG parameter. Each device is tested to meet the TempCo specification in the Sensitivity range determined
by the RG parameter (RG = 0…3, RG = 4…7, RG = 8...11 or RG = 12…15), regardless of the FG parameter.
The Sensitivity range is selected independently for Sensor A and Sensor B. Melexis may limit the available
combinations.
Option Code
Rough Gain
0
0-3 (00 xx)
1
4-7 (01 xx)
2
8-11 (10 xx)
3
12-15 (11 xx)
Table 9: Optimized Sensitivity Range
Sensitivity Range
(mV/mT)
2.6 < S < 15
10 < S < 35
18 < S < 90
50 < S < 210
Typical Magnetic Field Range
(mT, BMAX - BMIN)
333 < B < 800
156 < B < 333
62 < B < 156
6 < B < 62
The next figures show the typical Sensitivity versus the FG and RG parameters. The gray areas are
representative of the chip to chip dispersion (i.e.: for the same RG and FG parameters, the Sensitivity can
vary from chip to chip). There is large overlap between the different ranges for use of one range for
applications with large magnetic and/or mechanical dispersions. The Sensitivity graphs and tables can be
used to select the right device type for the application. If one is unsure of the application’s magnetic design
and the desired Sensitivity range Melexis recommends option code 2.
3901090277
Rev 004
Page 9 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
Sensitivity VS Fine Gain for RG = 0..3
MLX90277 SR0
25
Sensitivity VS Fine Gain for RG = 4..7
MLX90277 SR1
70
RG=3
22.5
60
RG=7
20
50
17.5
15
40
RG=2
12.5
RG=6
30
10
RG=1
RG=5
7.5
RG=0
20
RG=4
5
10
2.5
0
0
0
128
256
Sensitivity Range 0
140
384
512
640
768
896
0
1023
Fine Gain
128
256
Sensitivity Range 1
Sensitivity VS Fine Gain for RG = 8..11
MLX90277 SR2
320
384
512
640
768
896
1023
Fine Gain
Sensitivity VS Fine Gain for RG = 12..15
MLX90277 SR3
280
120
RG=11
RG=15
240
100
200
80
RG=10
RG=14
160
60
120
RG=13
80
RG=12
RG=9
40
RG=8
20
40
0
0
0
128
256
Sensitivity Range 2
384
512
640
768
896
1023
Fine Gain
0
128 256
Sensitivity Range 3
384
512
640
768
896
1023
Fine Gain
Figures 10.4-1…10.4-4 Sensitivity versus RG and FG
3901090277
Rev 004
Page 10 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
10.5 Sensitivity Polarity (INVERT)
The slope transfer characteristic defines the Sensitivity. The INVERT parameter changes the Sensitivity's
polarity, or the slope's direction. This allows the device to accommodate the application requirements and
the magnet's polarity. The slope is inverted in the first stage of the IC, at the Hall Plate. With INVERT set to 0,
the output voltage increases as a South magnetic field is applied and decreases in the presence of a North
magnetic field. An INVERT value of 1 causes the output voltage to increase in the presence of a North
magnetic field and decrease in the presence of a South magnetic field. The magnetic field polarity is
referenced to the field component perpendicular to the top-face of the MLX90277.
10.6 Clamping Levels (CLAMPLOW, CLAMPHIGH)
Two independent values, called the clamping levels, can limit the output voltage range or swing. The
CLAMPLOW parameter adjusts the minimum output voltage level, ClampLo. The CLAMPHIGH sets the
maximum output voltage level, ClampHi. Both parameters have 10 bits of adjustment with a resolution of
approximately 0.005V. The formulas below give a close approximation of the output clamp voltage. The
actual clamping level formulas vary slightly from chip to chip. If CLAMPLOW exceeds CLAMPHIGH the
output voltage is fixed at the high clamp voltage level. The CLAMPHIGH and CLAMPLOW initial value of 768
for IC_A, set by Melexis, results in a fixed output voltage of approximately 76% VDD. The CLAMPHIGH and
CLAMPLOW initial value of 256 for IC_B, set by Melexis, results in a fixed output voltage of approximately
25% VDD.
ClampLo =
5.10V
∗ CLAMPLOW
1023
V DD = 5.00V
ClampHi =
5.10V
∗ CLAMPHIGH
1023
V DD = 5.00V
At the point the output voltage switches between the linear operating region and the clamping region the
output can deviate slightly. This is represented by the grey areas in the figure below. The limits for deviation
in the Y axis are listed in Table 10. The deviation in the X axis is calculated from the application's transfer
function. The Clamp Comparator Offset does not effect the output linearity or clamp voltage accuracy.
During calibration it is recommended to set the clamp voltage outside of the transition region (0V to 5V).
VOUT
CLAMP HIGH
Linear Operating
Region
CLAMP LOW
Transition Point
FIELD
Figure 10.6 Output Voltage Clamping Deviation
DC operating parameters at VDD = 5V (unless otherwise specified) and for TA as specified by the temperature
range (E or L).
Parameter
Symbol
Test Conditions
Min
Typical Max
Units
CLAMPOFF -40°C to 85°C
Clamp Comparator Offset
- 0.7
+ 0.7
%VDD
Table 10: Clamp Comparator Offset Specification
3901090277
Rev 004
Page 11 of 21
Data Sheet
Nov/06
MLX90277
Dual Programmable Linear Hall Effect Sensor
10.7 Filter (FILTER)
Each die of the MLX90277 includes two programmable low-pass filters located within the chopper amplifier
stages. The two low-pass filters are controlled through a 4 bit parameter, FILTER. The FILTER value 0
corresponds to minimum filtering, maximum speed (impulse response time), and maximum output noise. The
value 15 provides the maximum filtering, minimum speed, and minimum output noise. It is important to note
the noise is also linked to the gain settings. The FILTER parameter needs to be adjusted to achieve optimal
performance. The next table shows typical values of the cut-off frequency at -3 dB versus FILTER and RG
parameters. FILTER values from 8 to 11 are not used. For most applications FILTER values 7 or 15 are
recommended.
Cut-off frequency at -3 dB (Hz) – Typical
Filter
MLX90277 SR0
MLX90277 SR1
MLX90277 SR2
Rough Gain 0…3 Rough Gain 4…7 Rough Gain 8…11
0
22900
14300
7000
1
19500
11450
5550
2
12300
10000
3000
3
10400
6750
2100
4
7450
3900
1500
5
5850
2900
1125
6
5700
2700
1350
7
5050
2550
1380
8
Not used
9
Not used
10
Not used
11
Not used
12
2200
840
565
13
1000
480
470
14
920
380
290
15
800
330
250
Table 11: Cut-off Frequency versus FILTER and RG Parameters
MLX90277 SR3
Rough Gain 12…15
3850
2950
2300
1100
850
860
715
650
250
190
155
135
10.8 Sensitivity Temperature Compensation (TC, TCW, TC2)
The change in the device's Sensitivity versus temperature is defined as the Sensitivity Temperature
Compensation, TempCo. In an application the slope output transfer characteristic is often affected by
temperature. Fluctuations in temperature can cause variations in the air gap, mechanical alignment and
magnetic field. The Sensitivity Temperature Compensation feature compensates for these effects.
2
Three parameters, TC, TCW, TC are used for adjustment of the TempCo. The TCW is used to adjust the
TempCo range, TC is for fine adjustment of the TempCo value, and TC2 effects the TempCo linear response.
To simplify use of these parameters Melexis stores a look up table within the EEPROM of each device. The
look up table is optimized for each device by characterizing the unit over temperature at final test.
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Dual Programmable Linear Hall Effect Sensor
The value of TempCo is often determined by the magnet. In the application the TempCo is adjusted to
compensate for the temperature coefficient of the magnet. To adjust the value the look up table is read from
the device. The parameters are then calculated to match the desired value. The Melexis PTC hardware and
software tools contain built in functions for programming the TempCo.
TempCo Range (ppm / °C)
0 to 500
500 to 1200
1200 to 2000
Table 12: TempCo Accuracy
Accuracy (ppm / °C)
± 100
± 150
± 200
Note: The budget error of the whole system, the compensation mismatch (system vs. IC) tolerance should be
taken into consideration during the design. Table 11 is valid for Rough Gain within the specified option code.
See section 10.4 for information on selecting the option code.
10.9 Diagnostic Output Level (FAULTLEV)
The MLX90277 sensors' EEPROM memory content is secured through a parity check. This self-diagnostic
feature brings the output to a defined range in case of a parity error. The parameter, FAULTLEV, is used to
define the parity error diagnostic state. With the FAULTLEV set to 0 a parity error event will result in an
output diagnostic voltage low. With the FAULTLEV set to 1 a parity error event will result in an output
diagnostic voltage high. To get rid of the output load influence the output diagnostic voltage level can be
fixed to either Ground (to be used with pull-down load) or VDD (to be used with pull-up load). Melexis PTC
software and hardware tools have built in functions for calculating and programming the parity.
Note: The MLX90277 sensors' EEPROM is also redundant. Each parameter bit is written in three separate
cells and a “majority voting” is applied to determine its status. A parity error is detected only if two out of the
three cells unexpectedly change state. The bits available for the customer ID are not redundant.
10.10 The EEPROM, Parity and Melexis CRC
The memory cells of the EEPROM are arranged in a table of four columns and one hundred twenty eight
rows. This configuration gives redundancy to the parameters stored in the EEPROM. Each parameter bit is
written in three separate cells in an individual row. A majority voting applied to the three cells determines the
logic status of the bit.
A parameter bit only toggles state in error if two out of three memory cells, within a row, unexpectedly
change. If this happens the feature, PARITY, forces the output voltage to the FAULTLEV diagnostic level.
This ensures the device does not operate with a critical memory fault.
The remaining memory cells are used for data storage. The status of these cells does not effect the device
operation. For example the Customer ID, CUSTID, is stored in this area. Melexis stores the device ID
information, TempCo look-up table and CRC bits in the extra cells. The CRC bits ensure the integrity of the
Melexis data.
Note: To avoid parity and CRC errors, the entire contents of the EEPROM must be read before
programming. Melexis PTC software and hardware tools have built in functions for reading the EEPROM and
handling parity.
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Dual Programmable Linear Hall Effect Sensor
10.11 Output Amplifier Configuration (MODE)
The output buffer can be configured to accommodate capacitive loads and improve the saturation voltage
(output swing). The two bit parameter, MODE, sets the current capacity of the output amplifier. Melexis sets
this parameter to 1 at final test. This parameter is not used by the end customer.
10.12 Memory Lock (MEMLOCK)
The Memory Lock feature prevents the device from entering programming mode and from any changes to the
EEPROM. The entire EEPROM is locked by setting the MEMLOCK parameter to 1. This should be the last
parameter set in the application.
10.13 IC traceability
A unique ID number is programmed into the EEPROM of every IC. The ID number gives Melexis additional
traceability to better service its customers. The ID number is composed of the lot number, wafer number and
wafer coordinates (X and Y). Memory is also available for the customer to add a serial number of the product
or any other data.
11 Performance Graphs
Typical IDD VS VDD
Typical I DD VS VDDNOM
60
8.5
20
8
Over Voltage
40
V DDNOM
7.5
Under Voltage
0
I DD (mA)
IDD (mA)
7
-20
6.5
6
-40
5.5
150°C
-40°C
25°C
-60
-80
-10
0
10
20
150°C
-40°C
25°C
5
30
VDD (Volts)
4.5
4
4.5
5
5.5
6
VDD (Volts)
Figure 11-1…11-2 IDD versus VDD
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Dual Programmable Linear Hall Effect Sensor
12 Applications Information
12.1 Application Circuits
The TEST pins are not used in applications. For EMC protection it is recommended to connect the TEST
pins to Ground as close as possible to the device pins. The values for capacitors, C11, C12, C21 and C22,
can be adjusted to satisfy ESD and EMC requirements according to the environment. Ceramic capacitors
are recommended for use in the application. However for stable operation, C12 and C21 should each not be
higher than 150nF. If higher capacitors (due to special ESD or EMC requirements) or special circuit
configurations are requested, please contact Melexis.
The MLX90277 can operate with a high impedance load; a load resistor is not required.
Figures 12.1-1…12.1-2 Application Circuits
A voltage of 9V is required on VDD for programming. All additional components connected to VDD must be
able to withstand the voltage.
The MLX90277 is designed for operation with a stable 5V supply. If fast voltage transients occur additional
filtering may be required.
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12.2 Programming the Sensor
To program the individual MLX90277 sensors, connection to VDD, GND, and VOUT is required. The device is
placed into program mode by increasing the supply voltage to the VDD program level. In program mode data
is clocked into the device through the output pin using the Melexis tri-level PTC protocol. The clock and data
are integrated into one serial data stream, eliminating the need for a dedicated clock signal. The data is
clocked at the leading edge of each bit.
Figure 12.2-1 VDD Programming Level
5.0V
VOUT
Program Wave Form
2.5V
0V
Device
Decoded
Clock
Device
Decoded
Data
X
1
X
0
X
Figure 12.2-2 Tri-Level PTC
Note: External capacitors and resistors will effect the rise and fall times for the programming waveforms.
Program pulse timings may require adjustment for the application. The device can not be programmed if
MEMLOCK equals 1.
The EEPROM contents can be read from the device. This procedure, known as a read back, is done by
sending a read command and then measuring the supply current. To successfully read the EEPROM it must
be possible to measure the supply current to the device. The Melexis PTC hardware and software tools
contain built in functions for reading the EEPROM.
The MLX90277 sensors can be programmed by using the PTC-04 programmer and the dedicated software
tools. The timing and voltage levels are controlled through the programming hardware and software. Further
details can be found in the MLX90277 software documentation.
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12.3 Calibration Procedure
The programmable features of the device allow it to be calibrated within the application. This section gives
general information for a two point calibration procedure. The two point calibration is the most common,
however, it is possible to adapt other procedures.
1.) The first step in the calibration procedure is to initialize the device. This is done by establishing
communication and reading the contents of the EEPROM.
2.)The second step is to set the TempCo and FILTER settings.
3.) Step three is the evaluation of position one. During this step the output voltage is measured with initial
values for RG, FG and OFFSET.
4.) Step four is the evaluation of position two. During this step, the output voltage is measured with the same
values from step 3. From the measurements it is possible to calculate the slope and offset error. Next the
output slope transfer characteristic versus FG and RG is interpolated. With this information the initial settings
are adjusted and the output voltage is measured again.
5.) Step five is the final check and adjustment. At this stage small corrections are made to the OFFSET and
FG parameters. Next, the output clamping parameters, CLAMPHIGH and CLAMPLOW, are determined.
6.) The sixth step is the program phase. Now that all the parameters are determined and the application
requirements are satisfied, the settings are programmed into the EEPROM.
7.) The final step, seven, is the lock and verify step. Here the customer can perform any number of additional
measurements and verify the EEPROM contents. After this is completed the MEMLOCK is set and the
EEPROM is locked, preventing any further programming.
Note: EEPROM verification is done by reading the contents of the EEPROM and comparing it to the data
written. It is possible to read the EEPROM contents regardless of the status of MEMLOCK.
The Melexis PTC software tools contain built in functions and procedures for calibrating the MLX90277.
Please refer to the software documentation for more information on how to use the calibration tools.
The outputs of the MLX90277 are ratiometric. To avoid calibration errors from fluctuations in the supply
voltage, the output voltage should be measured as a percentage of the supply voltage.
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13 Standard information regarding manufacturability of Melexis
products with different soldering processes
Our products are classified and qualified regarding soldering technology, solderability and moisture sensitivity
level according to following test methods:
Reflow Soldering SMD’s (Surface Mount Devices)
•
•
IPC/JEDEC J-STD-020
Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices
(classification reflow profiles according to table 5-2)
EIA/JEDEC JESD22-A113
Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
(reflow profiles according to table 2)
Wave Soldering SMD’s (Surface Mount Devices) and THD’s (Through Hole Devices)
•
•
EN60749-20
Resistance of plastic- encapsulated SMD’s to combined effect of moisture and soldering heat
EIA/JEDEC JESD22-B106 and EN60749-15
Resistance to soldering temperature for through-hole mounted devices
Iron Soldering THD’s (Through Hole Devices)
•
EN60749-15
Resistance to soldering temperature for through-hole mounted devices
Solderability SMD’s (Surface Mount Devices) and THD’s (Through Hole Devices)
•
EIA/JEDEC JESD22-B102 and EN60749-21
Solderability
For all soldering technologies deviating from above mentioned standard conditions (regarding peak
temperature, temperature gradient, temperature profile etc) additional classification and qualification tests
have to be agreed upon with Melexis.
The application of Wave Soldering for SMD’s is allowed only after consulting Melexis regarding assurance of
adhesive strength between device and board.
Melexis is contributing to global environmental conservation by promoting lead free solutions. For more
information on qualifications of RoHS compliant products (RoHS = European directive on the Restriction Of
the use of certain Hazardous Substances) please visit the quality page on our website:
http://www.melexis.com/quality.asp
14 ESD Precautions
Electronic semiconductor products are sensitive to Electro Static Discharge (ESD).
Always observe Electro Static Discharge control procedures whenever handling semiconductor products.
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Dual Programmable Linear Hall Effect Sensor
15 Package Information
The TSSOP14 package is lead-free and is released for MSL3/260°C.
15.1 Package Dimensions
0.65 TYP
12O TYP
0.20 TYP
0.09 MIN
1.0 DIA
4.30
4.50**
6.4 TYP
0.09 MIN
1.0
12O TYP
0.50
0.75
0O
8O
1.0
1.0 TYP
0.85
0.95
4.90
5.10*
1.1 MAX
0.19
0.30***
0.09
0.20
0.05
0.15
NOTES:
All dimensions are in millimeters (anlges in degrees).
* Dimension does not include mold flash, protrusions or gate burrs (shall not exceed 0.15 per side).
** Dimension does not include interleads flash or protrusion (shall not exceed 0.25 per side).
*** Dimension does not include dambar protrusion. Allowable dambar protrusion shall be 0.08 mm total in excess of the dimension at
maximum material condition. Dambar cannot be located on the lower radius of the foot.
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Dual Programmable Linear Hall Effect Sensor
15.2 Pin-out and Marking
15.3 Hall Plate Positioning
0.641
0.741
0.641
0.741
14
8
0.003
0.103
Hall plate 1
Hall plate 2
0.003
0.103
MLX90277
1
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0.360
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16 Disclaimer
Devices sold by Melexis are covered by the warranty and patent indemnification provisions appearing in its
Term of Sale. Melexis makes no warranty, express, statutory, implied, or by description regarding the
information set forth herein or regarding the freedom of the described devices from patent infringement.
Melexis reserves the right to change specifications and prices at any time and without notice. Therefore, prior
to designing this product into a system, it is necessary to check with Melexis for current information. This
product is intended for use in normal commercial applications. Applications requiring extended temperature
range, unusual environmental requirements, or high reliability applications, such as military, medical lifesupport or life-sustaining equipment are specifically not recommended without additional processing by
Melexis for each application.
The information furnished by Melexis is believed to be correct and accurate. However, Melexis shall not be
liable to recipient or any third party for any damages, including but not limited to personal injury, property
damage, loss of profits, loss of use, interrupt of business or indirect, special incidental or consequential
damages, of any kind, in connection with or arising out of the furnishing, performance or use of the technical
data herein. No obligation or liability to recipient or any third party shall arise or flow out of Melexis’ rendering
of technical or other services.
© 2006 Melexis NV. All rights reserved.
For the latest version of this document, go to our website at
www.melexis.com
Or for additional information contact Melexis Direct:
Europe, Africa, Asia:
Phone: +32 1367 0495
E-mail: [email protected]
America:
Phone: +1 603 223 2362
E-mail: [email protected]
ISO/TS 16949 and ISO14001 Certified
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