AN5000, EMC and Transient Performance For the Dual SOIC 24 V High-side Switc ...

Freescale Semiconductor, Inc.
Application Note
Document Number: AN5000
Rev. 1.0, 11/2014
EMC and Transient Performance
For the Dual SOIC 24 V High-side Switch Family (MC24XS4)
1
Introduction
This application note describes the EMC and fast transient
pulse capability of the MC22XS4200 and MC50XS4200
devices. These intelligent high-side switches are designed
to be used in 24 V systems such as trucks, busses, and
special engines. They can be used in some industrial and
12 V applications as well. The low RDS(on) channels can
control incandescent lamps, LEDs, solenoids, or DC
motors. Control, device configuration, and diagnostics are
performed through a 16-bit SPI interface, allowing easy
integration into existing applications. For a complete feature
description, refer to the individual data sheets.
© Freescale Semiconductor, Inc., 2014. All rights reserved.
Contents
1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
2 EMC Board Setup. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
3 Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
4 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
5 Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
EMC Board Setup
2
EMC Board Setup
The KIT22XS4200EKEVB and KIT50XS4200EKEVB are composed of four layers. They are used for testing with the following resistor and
capacitor values (X7R 100 V):
•
On VPWR: 100 nF and 1.0 uF are placed close to the 22XS4200 and 50XS4200 devices
•
For each output: 22 nF is located at the output connector
•
Low pass filter on the CSNS output pin: 10  + 22 nF
Figure 1. 24 V High-side Switch Evaluation Board
AN5000 EMC and Transient Performance Rev. 1.0
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EMC Board Setup
Figure 2. Application Schematic
AN5000 EMC and Transient Performance Rev. 1.0
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3
Measurements
3
Measurements
3.1
Conducted Emission Measurements
Conducted emission is the emission produced by the device on the battery cable. The bench test is described by the CISPR25 standard.
The Line Impedance Stabilization Network (LISN), also called the Artificial Network (AN), in a given frequency range (150 kHz to
108 MHz), provides a specified load impedance for the measurement of disturbance voltages, and isolates the equipment under test (EUT)
from the supply in that frequency range. The EUT must operate under typical loading and other conditions, just as it is in the vehicle, so
that a maximum emission state occurs. These operating conditions are clearly defined in the test plan to ensure that both supplier and
customer are performing identical tests.
For the testing described, the device was in 24 V, 160 mA Sleep and Normal modes, and each output pins of the 22XS4200 and
50XS4200, was connected to 24 V lamp(s) or 24 V 160 mA LEDs. One 2.2 nF COG was added on VPWR for better performance.The
ground return of the lamps was connected to the chassis and the ground path of the EUT flowed into the LISN. The power supply voltage
is 24 V (double car battery). The SPI watchdog feature was disabled for this test.
The results of those measurements are represented in Table 2:
Table 1. Conducted Emission Results 22XS4200
CISPR25 2008 Level (peak)
Conducted Emissions
All outputs OFF
Outputs PWMing with 0 phase shift at 400 Hz with 50% of
duty cycle
Loads per Output
Mode
21 W Lamp +
5.0 W Lamp
Sleep
High Band
> 1.0 MHz
Class5
Class5
Medium
Class5
Class5
21 W Lamp +
5.0 W Lamp
Fast
Class4
Class5
Medium
Class5
Class5
Fast
Class5
Class5
Medium
Class4
Class5
Fast
Class4
Class5
21 W Lamp +
5.0 W Lamp
Normal
AN5000 EMC and Transient Performance Rev. 1.0
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Low Band
< 1.0 MHz
21 W Lamp +
5.0 W Lamp
160 mA LED
Outputs PWMing with 180 ° phasing at 400 Hz with 50%
of duty cycle
Slew Rate
Freescale Semiconductor, Inc.
Measurements
Figure 3. 22XS4200 Normal Mode - Both Outputs in Phase PWMing at 400 Hz with 50% of Duty Cycle
Table 2. Conducted Emission Results 50XS4200
CISPR25 2008 Level (average)
Conducted Emissions
All outputs OFF
Loads per Output
Mode
2 x 5.0 W Lamp
Sleep
Slew Rate
2 x 25 W Lamp
Outputs PWMing in same time at 400 Hz with 50% of duty
cycle
Normal
160 mA LED
Outputs PWMing with 180 ° phasing at 400 Hz with 50%
of duty cycle
2 x 5.0 W Lamp
Normal
Class5
Medium
Class5
Fast
Class5
Medium
Class5
Fast
Class5
Medium
Class5
Fast
Class5
AN5000 EMC and Transient Performance Rev. 1.0
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Measurements
Figure 4. 50XS4200 Normal Mode - Both Outputs in Phase PWMing at 400 Hz with 50% of Duty Cycle
3.2
Conducted Immunity Measurements
Conducted immunity is the device susceptibility for RF injection applied directly on a device terminal. The bench test is described by the
62132-4 specification (Direct Power Injection) from the International Electrotechnical Commission. Table 3 describes the performance
grades have been used to characterize the device performance:
Table 3. Performance Grades Description
Class A
All functions of the IC perform as designed during and after exposure to a disturbance.
Class B
All functions of the IC perform as designed during exposure, however, one or more of them may go beyond the specified tolerance. All functions
return automatically to within normal limits after exposure is removed. Memory functions shall remain in class A.
Class C
A function of the IC doesn’t perform as designed during exposure but returns automatically to normal operation after exposure is removed.
Class D
A function of the IC doesn’t perform as designed during exposure, and doesn’t return to normal operation until exposure is removed and the IC
is reset by simple operator action (e.g. put off supply...).
Class E
One or more functions of an integrated circuit do not perform as designed during and after exposure and cannot be returned to proper operation.
For the testing described, the device was in Sleep, and Normal modes, and each output terminal of the 50XS4200 was connected to 5.0 W
lamp(s). The ground return of the bulb was connected to the chassis, and the ground path of the EUT flowed into the LISN. The power
supply voltage is 24 V (double car battery).
The results of these measurements are represented in Table 4. Output states, analog current sensing, and digital fault reporting are in
accordance with the grade description and power injection from 1.0 MHz to 1.0 GHz on the VPWR pin.
AN5000 EMC and Transient Performance Rev. 1.0
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Measurements
Table 4. 50XS4200 Conducted Immunity Results
Feature
Load
Mode
All outputs OFF
2 x 5.0 W lamps
Sleep
31 dBm
35 dBm
A
All outputs ON
2 x 5.0 W lamps
Normal
31 dBm
37 dBm
A
Outputs PWMing in same time at 400 Hz with 50% of duty cycle 2 x 5.0 W lamps
Normal
29 dBm
33 dBm
A
3.3
Power Injection (CW) Power Injection (AM)
Class
Fast Transient Pulse Measurements
Transient pulse immunity is the device susceptibility for fast transient pulse applied directly on the VPWR and HS pins. The transient
pulses are described by the ISO7637-2 standard from the International Electrotechnical Commission. The power supply voltage is 28 V.
For the testing on VPWR, the device was in Sleep state or Fail-safe mode and the output pins of the 50XS4200 were connected to a
resistive load. The 22XS4200 performances are covered by 50XS4200 results The results of those measurements are represented in
Table 5.
Table 5. 50XS4200 Fast Transient Pulse Results (disturbance on VPWR)
Schaffner Pulses Applied on VPWR
Sleep State All Outputs OFF
Pulse 1 (RI = 50 , -600 V, 1000 occurrences, Rload = 2 )
Class C
Pulse 2a (RI = 2.0 , +50 V, 1000 occurrences)
Class C
Pulse 3a (RI = 50 W, -200 V, 8.0 min)
Class C
Pulse 3b (RI = 50 W, +200 V, 8.0 min)
Class C
Pulse 5b (RI = 1.0 W, +87 V clamped at +58 V, 10 occurrences)
Class C
Pulse 4 (No load, VPWR – 16 V, 1 occurrence)
Class C
In the case of an open load condition or high-ohmic load (> 2 ), the transient pulses are handled by the application with a transient voltage
suppressor between VPWR and GND, as presented in Decoupling Capacitors Role section.
3.4
Decoupling Capacitors Role
The following table summarizes the mission of each component.
Table 6. Component Role and Value
VPWR
Close to 06XS4200 device
Reduction of emission and immunity
100 nF (X7R 100 V) 
1.0 µF (X7R 100 V)
VDD
Close to 06XS4200 device
Reduction of emission and immunity
100 nF (X7R 100 V)
HSx
Close to output connectors
Reduction of emission and fast transient negative pulse sustaining
22 nF (X7R 100 V)
CSNS
Close to MCU
Low pass filter to remove noise during immunity test
10 k + 22 nF (X7R 16 V)
To increase device robustness against fast transient pulse robustness:
VPWR
Close to ECU connector to
increase device robustness
Sustain pulse #1 in case of high-ohmic load (or without loads)
40 V zener diode and 1N5353 diode
in series per battery line
AN5000 EMC and Transient Performance Rev. 1.0
Freescale Semiconductor, Inc.
7
References
4
References
Following are URLs where you can obtain information on related Freescale products and application solutions:
Freescale.com
Support Pages
Description
URL
MC22XS4200
Data Sheet
http://cache.freescale.com/files/analog/doc/data_sheet/MC22XS4200.pdf
MC50XS4200
Data Sheet
http://cache.freescale.com/files/analog/doc/data_sheet/MC50XS4200.pdf
KIT22XS4200EKEVB Evaluation Board
User Guide
http://cache.freescale.com/files/analog/doc/user_guide/KT22XS4200UG.pdf
KIT50XS4200EKEVB Evaluation Board
User Guide
http://cache.freescale.com/files/analog/doc/user_guide/KT50XS4200UG.pdf
KITUSBSPIEVME
http://www.freescale.com/webapp/sps/site/prod_summary.jsp?code=KITUSBSPIEVME
Interface Dongle
AN5000 EMC and Transient Performance Rev. 1.0
Freescale Semiconductor, Inc.
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Revision History
5
Revision History
Revision
Date
Description
1.0
11/2014
• Initial release
AN5000 EMC and Transient Performance Rev. 1.0
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© 2014 Freescale Semiconductor, Inc.
Document Number: AN5000
Rev. 1.0
11/2014
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