Data Sheet

EM783
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Rev. 2 — 17 January 2014
Product data sheet
1. General description
The EM783-SC/SP/TP/MC3/MC6 is an ARM Cortex-M0-based, low-cost 32-bit family of
application processors, designed for energy measurement and monitoring applications.
The EM783 offers programmability and on-chip metrology functionality combined with a
low power, simple instruction set. It also has memory addressing together with reduced
code size compared to existing 8/16-bit architectures.
The EM783 operate at CPU frequencies of up to 48 MHz.
The digital peripherals on the EM783 include:
•
•
•
•
•
•
•
•
32 kB of flash memory
4 kB of EEPROM data memory
8 kB of SRAM data memory
Fast-mode Plus I2C-bus interface
RS-485/EIA-485 USART
one SSP controller
two general-purpose counter/timers
up to 22 general-purpose I/O pins
A metrology engine with built-in temperature sensor is used for energy measurements. A
10-bit DAC and an internal voltage reference are also available.
2. Features and benefits
 System:
 ARM Cortex-M0 processor, running at frequencies of up to 48 MHz.
 ARM Cortex-M0 built-in Nested Vectored Interrupt Controller (NVIC).
 Serial Wire Debug (SWD).
 System tick timer.
 Memory:
 32 kB on-chip flash program memory.
 4 kB on-chip EEPROM data memory for energy registers and calibration
parameters; byte erasable and byte programmable.
 8 kB SRAM data memory.
 16 kB boot ROM.
 In-System Programming (ISP) for flash and In-Application Programming (IAP) for
flash and EEPROM via on-chip bootloader software.
 Includes ROM-based 32-bit integer division routines.
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
 Digital peripherals:
 Up to 22 General Purpose I/O (GPIO) pins with configurable pull-up/pull-down
resistors, repeater mode, and open-drain mode.
 Up to 9 pins are configurable with a digital input glitch filter for removing glitches
with widths of 10 ns. Two pins are configurable for 20ns glitch filter and another
two pins are configurable for 50 ns glitch filters.
 GPIO pins can be used as edge and level sensitive interrupt sources.
 High-current source output driver (20 mA) on one pin (P0_21).
 High-current sink driver (20 mA) on true open-drain pins (P0_2 and P0_3).
 Two general-purpose counter/timers with a total of up to four capture inputs and
five match outputs.
 Programmable Windowed WatchDog Timer (WWDT) with a dedicated, internal
low-power WatchDog Oscillator (WDOsc).
 Analog peripherals:
 Metrology engine for smart metering with one voltage input, one bias input, from
two up to six current inputs and a temperature sensor.
 Internal voltage reference.
 10-bit DAC with flexible conversion triggering.
 Serial interfaces:
 USART with fractional baud rate generation, internal FIFO, support for
RS-485/9-bit mode and synchronous mode.
 One SSP controller with FIFO and multi-protocol capabilities.
 I2C-bus interface supporting the full I2C-bus specification and Fast-mode Plus with
a data rate of 1 Mbit/s with multiple address recognition and monitor mode.
 Clock generation:
 Crystal Oscillator (SysOsc) with an operating range of 1 MHz to 25 MHz.
 12 MHz internal RC Oscillator (IRC) trimmed to 1 % accuracy that can optionally be
used as a system clock.
 Internal low-power, Low-Frequency Oscillator (LFOsc) with programmable
frequency output.
 Clock input for external system clock (25 MHz typical).
 PLL allows CPU operation up to the maximum CPU rate with the IRC, the external
clock, or the SysOsc as clock sources.
 Clock output function with divider that can reflect the SysOsc, the IRC, the main
clock, or the LFOsc.
 Power control:
 Supports ARM Cortex-M0 Sleep mode as reduced power mode.
 Power profiles residing in boot ROM allowed to optimize performance and
minimize power consumption for any given application through one simple function
call.
 Processor wake-up from reduced power mode using any interrupt.
 Power-On Reset (POR).
 BrownOut Detect (BOD) with two separate programmable thresholds for interrupt
and one hardware controlled reset trip point.
 POR and BOD are always enabled for rapid UVLO protection against power supply
voltage drops below 2.4 V.
 Unique device serial number for identification.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
2 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
 Single 3.3 V power supply (2.6 V to 3.6 V).
 Temperature range 40 C to +85 C.
 Available as a 33-pin HVQFN 7 mm  7 mm  0.85 mm package.
3. Applications





Smart plugs and plug meters
Single phase residential meters
Industrial submeters
Server power monitoring
Smart appliances
4. Ordering information
Table 1.
Ordering information
Type number
Package
Name
Description
Version
EM783-SC
HVQFN33
HVQFN: plastic thermal enhanced very thin quad flat package; no
leads; 33 terminals; body 7  7  0.85 mm
n/a
EM783-SP
HVQFN33
HVQFN: plastic thermal enhanced very thin quad flat package; no
leads; 33 terminals; body 7  7  0.85 mm
n/a
EM783-TP
HVQFN33
HVQFN: plastic thermal enhanced very thin quad flat package; no
leads; 33 terminals; body 7  7  0.85 mm
n/a
EM783-MC3
HVQFN33
HVQFN: plastic thermal enhanced very thin quad flat package; no
leads; 33 terminals; body 7  7  0.85 mm
n/a
EM783-MC6
HVQFN33
HVQFN: plastic thermal enhanced very thin quad flat package; no
leads; 33 terminals; body 7  7  0.85 mm
n/a
4.1 Ordering options
Table 2.
Ordering options
Type number
Flash
SRAM
EEPROM
Metrology
engine inputs
10-bit
DAC
USART
SSP/
SPI
I2C
Package
EM783-SC
32 kB
8 kB
4 kB
1x I, 1x V
1
1
1
1
HVQFN33
EM783-SP
32 kB
8 kB
4 kB
2x I, 1x V
1
1
1
1
HVQFN33
EM783-TP
32 kB
8 kB
4 kB
3x I, 3x V
1
1
1
1
HVQFN33
EM783-MC3
32 kB
8 kB
4 kB
3x I, 1x V
1
1
1
1
HVQFN33
EM783-MC6
32 kB
8 kB
4 kB
6x I, 1x V
1
1
1
1
HVQFN33
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
3 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
5. Block diagram
SWD
XTALIN
EM783
RESET
SysOsc
TEST/DEBUG
INTERFACE
ARM
CORTEX-M0
system bus
HIGH-SPEED
GPIO
CLOCK
GENERATION,
POWER CONTROL,
SYSTEM
FUNCTIONS
IRC, LFOSC, WDOSC
BOD
CLKOUT
CLKIN
POR
EEPROM
4 kB
clocks, internal voltage reference,
and controls
FLASH
32 kB
slave
GPIO ports
XTALOUT
ROM
16 kB
SRAM
8 kB
slave
slave
slave
AHB-LITE BUS
slave
AHB TO APB
BRIDGE
RXD
TXD
CTS
RTS
SCLK
CT32B0_MAT[2:0]
CT32B0_CAP[2, 0]
CT16B0_MAT[2:1]
CT16B0_CAP[1:0]
USART
METROLOGY ENGINE
Ix
Ix_L
Ix_H
Vx
VBIAS
10-bit DAC
AOUT
32-bit COUNTER/TIMER 0
16-bit COUNTER/TIMER 0
SCL, SDA(1)
SCL, SDA(2)
SCL, SDA(2)
SCL, SDA(2)
I2C-BUS
IOCONFIG
WINDOWED WATCHDOG
TIMER
SCK0, SSEL0,
MISO0, MOSI0
SSP0
PMU
SYSTEM CONTROL
GPIO pins
GPIO INTERRUPTS
GPIO pins
GPIO GROUP0/1 INTERRUPT
(1) open-drain pins
(2) standard I/O pins
aaa-007681
Fig 1.
EM783 block diagram
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
4 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
6. Pinning information
6.1 Pinning
25
27
26
28
29
30
31
32
terminal 1
index area
1
24
2
23
3
22
4
21
5
20
6
19
7
18
33 VSS
16
15
14
13
12
11
9
17
10
8
aaa-007680
Transparent top view
Fig 2.
Pin configuration HVQFN33 package
6.2 Pin description
All functional pins on the EM783, except for metrology inputs, are mapped to GPIO port 0
(see Table 3). The port pins are multiplexed to accommodate more than one function (see
Table 4).
The IOCONFIG register, controls the pin function (see the EM783 user manual). The
standard I/O pad configuration is illustrated in Figure 24 and a detailed pin description is
given in Table 4.
Table 3.
Pin multiplexing
Function
Type
Port
Glitch
filter
Pin
P0_1
no
3
P0_12
no
31
P0_19
no
9
P0_24
no
7
P0_1
no
3
P0_19
no
9
-
-
4
System clocks, reset, and wake-up
CLKIN
I
CLKOUT
O
XTALIN
I (analog)
XTALOUT
O (analog)
-
-
5
RESET
I
P0_0
20 ns [1]
2
I
P0_2
50 ns [2]
10
P0_5
[2]
19
Serial Wire Debug (SWD)
SWCLK
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
10 ns
© NXP B.V. 2014. All rights reserved.
5 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 3.
Pin multiplexing …continued
Function
Type
Port
Glitch
filter
Pin
SWDIO
I/O
P0_3
50 ns [2]
11
[2]
25
P0_10
10 ns
Metrology engine
V1
I (analog)
-
no
28
VBIAS
I (analog)
-
no
14
V1
I (analog)
-
no
22
VBIAS
I (analog)
-
no
23
I1
I (analog)
-
no
20
I1_L
I (analog)
-
no
20
I1_H
I (analog)
-
no
21
I5
I (analog)
-
no
21
I2_L
I (analog)
-
no
24
I2
I (analog)
-
no
24
I2_H
I (analog)
-
no
25
V2
I (analog)
-
no
25
I6
I (analog)
-
no
25
I3_L
I (analog)
-
no
26
I3
I (analog)
-
no
26
I3_H
I (analog)
-
no
27
I4
I (analog)
-
no
27
V3
I (analog)
-
no
27
AOUT
O (analog)
P0_4
no
18
ATRG0
I (analog)
P0_16
10 ns [2]
13
I/O
P0_2
50 ns [2]
10
P0_12
no
31
P0_16
10 ns [2]
13
P0_24
no
7
Analog peripherals
I2C-bus
interface
SCL
SDA
I/O
50 ns
[2]
11
P0_13
10 ns
[2]
32
P0_15
10 ns [2]
27
P0_25
no
12
P0_3
SSP0 controller
MISO0
I/O
P0_22
10 ns [2]
17
MOSI0
I/O
P0_4
10 ns [2]
18
P0_19
no
9
SCK0
EM783
Product data sheet
I/O
P0_5
10 ns
P0_20
no
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
[2]
19
15
© NXP B.V. 2014. All rights reserved.
6 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 3.
Pin multiplexing …continued
Function
Type
Port
Glitch
filter
Pin
SSEL0
I/O
P0_1
no
3
P0_18
no
8
P0_1
no
3
P0_12
no
31
P0_13
no
32
P0_15
no
27
P0_26
no
USART
RXD
I
TXD
O
SCLK
I/O
I
CTS
O
RTS
1
[2]
26
P0_11
10 ns
P0_21
no
16
P0_23
no
30
P0_9
10 ns [2]
24
P0_21
no
16
P0_10
no
25
P0_23
no
30
P0_2
50 ns [2]
10
P0_18
no
8
16-bit counter/timer CT16B0
CT16B0_CAP0
I
[2]
13
CT16B0_CAP1
I
P0_16
10 ns
CT16B0_MAT1
O
P0_4
no
18
P0_9
no
24
P0_5
no
19
P0_10
no
25
P0_11
10 ns [2]
26
P0_23
no
30
CT16B0_MAT2
O
32-bit counter/timer CT32B0
CT32B0_CAP0
I
CT32B0_CAP2
I
[2]
27
P0_15
10 ns
P0_26
no
1
CT32B0_MAT0
O
P0_12
no
31
CT32B0_MAT1
O
P0_13
no
32
CT32B0_MAT2
O
P0_1
no
3
VDD(IO)
Supply
-
-
6
VDD(3V3)
Supply
-
-
29
VSS
Ground
-
-
33
VSS(IO)
Ground
-
-
33
Supply and ground pins
EM783
Product data sheet
[1]
Always on.
[2]
Programmable on/off. By default, the glitch filter is disabled.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
7 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 4 shows all pins in order of increasing pin number. The default function after reset is
listed first. Port pins P0_0 to P0_26 have internal pull-up resistors enabled after reset
except for the true open-drain pins P0_2 and P0_3.
Pull-up/pull-down configuration, repeater, and open-drain modes can be programmed
through the IOCONFIG registers for each of the port pins.
Table 4.
Pin
no.
1
2
3
EM783 pin description
EM783 symbol
SC
SP
TP
Type Reset Description
state
MC3 MC6
P0_26/TXD/CT32B0_CAP2
[1]
[2]
RESET/P0_0
[3]
P0_1/RXD/CLKOUT/CT32B0_
MAT2/SSEL0/CLKIN
[2]
I/O
I; PU
P0_26 — General-purpose digital input/output pin.
O
-
TXD — Transmitter data output for USART.
I
-
CT32B0_CAP2 — Capture input 2 for 32-bit timer 0.
I
I; PU
RESET — External reset input with fixed 20 ns glitch
filter: A LOW going pulse on this pin resets the
device. It causes I/O ports and peripherals to take on
their default states and processor execution to begin
at address 0.
I/O
-
P0_0 — General-purpose digital input/output pin.
I/O
I; PU
P0_1 — General-purpose digital input/output pin. A
LOW level on this pin during reset starts the ISP
command handler.
I
-
RXD — Receiver data input for USART.
O
-
CLKOUT — Clock output.
O
-
CT32B0_MAT2 — Match output 2 for 32-bit timer 0.
I/O
-
SSEL0 — Slave Select for SSP0.
I
-
CLKIN — External clock input.
-
-
Input to the oscillator circuit and internal clock
generator circuits. Input voltage must not exceed 1.8
V.
4
XTALIN
[4]
5
XTALOUT
[4]
-
-
Output from the oscillator amplifier.
VDD(IO)
[5]
-
-
3.3 V input/output supply voltage.
I/O
I; PU
P0_24 — General-purpose digital input/output pin.
I/O
-
SCL — I2C-bus clock input/output. This pin is not an
I2C-bus open-drain pin[10].
I
-
CLKIN — External clock input.
I/O
I; PU
P0_18 — General-purpose digital input/output pin.
I/O
-
SSEL0 — Slave Select for SSP0.
I
-
CT16B0_CAP0 — Capture input 0 for 16-bit timer 0.
I/O
I; PU
P0_19 — General-purpose digital input/output pin.
I
-
CLKIN — External clock input.
O
-
CLKOUT — Clock output.
I/O
-
MOSI0 — Master Out Slave In for SSP0.
6
[6]
7
8
9
P0_24/SCL/CLKIN
P0_18/SSEL0/CT16B0_CAP0
P0_19/CLKIN/CLKOUT/MOSI0
EM783
Product data sheet
[2]
[2]
[2]
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
8 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 4.
Pin
no.
10
11
12
13
EM783 pin description …continued
EM783 symbol
SC
SP
TP
Type Reset Description
state
MC3 MC6
[1]
[7]
P0_2/SCL/SWCLK/CT16B0_CAP0
[7]
P0_3/SDA/SWDIO
[2]
P0_25/SDA
P0_16/ATRG0/CT16B0_CAP1/SCL
[8]
I/O
I; IA
P0_2 — General-purpose digital input/output pin.
High-current sink (20 mA) or standard-current sink (4
mA) programmable; true open-drain for all pin
functions. Input glitch filter (50 ns) capable.
I/O
-
SCL — I2C-bus clock (true open-drain) input/output
with selectable 50 ns input glitch filter. Input glitch
filter (50 ns) capable.
I
-
SWCLK — Serial Wire Debug Clock (secondary).
Input glitch filter (50 ns) capable.
I
-
CT16B0_CAP0 — Capture input 0 for 16-bit timer 0.
I/O
I; IA
P0_3 — General-purpose digital input/output pin.
High-current sink (20 mA) or standard-current sink (4
mA) programmable; true open-drain for all pin
functions. Input glitch filter (50 ns) capable.
I/O
-
SDA — I2C-bus data (true open-drain) input/output.
Input glitch filter (50 ns) capable.
I/O
-
SWDIO — Serial Wire Debug I/O (secondary). Input
glitch filter (50 ns) capable.
I/O
I; PU
P0_25 — General-purpose digital input/output pin.
I/O
-
SDA — I2C-bus data input/output. This pin is not an
I2C-bus open-drain pin[10].
I/O
I; PU
P0_16 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
I
-
ATRG0 — Conversion trigger for DAC. Input glitch
filter (10 ns) capable.
I
-
CT16B0_CAP1 — Capture input 1 for 16-bit timer 0.
Input glitch filter (10 ns) capable.
I/O
-
SCL — I2C-bus clock input/output. This pin is not an
I2C-bus open-drain pin[10]. Input glitch filter (10 ns)
capable.
14
VBIAS
[8]
I
-
VBIAS — Bias voltage input for metrology engine.
15
P0_20/SCK0
[2]
I/O
I; PU
P0_20 — General-purpose digital input/output pin.
I/O
-
SCK0 — Serial clock for SSP0.
P0_21/CTS/SCLK
[2]
I/O
I; PU
P0_21 — General-purpose digital input/output pin. If
configured as output, this pin is a high-current source
output driver (20 mA).
I
-
CTS — Clear To Send input for USART.
I/O
-
SCLK — Serial clock for USART.
I/O
I; PU
P0_22 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
I/O
-
MISO0 — Master In Slave Out for SSP0. Input glitch
filter (10 ns) capable.
16
17
P0_22/MISO0
EM783
Product data sheet
[2]
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
9 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 4.
Pin
no.
18
19
20
21
22
23
24
EM783 pin description …continued
EM783 symbol
SC
SP
TP
P0_4/AOUT/CT16B0_MAT1/MOSI0
SWCLK/P0_5/CT16B0_MAT2/SCK0
I1_L
I1_H
I1_L
I1_H
I1
R
Type Reset Description
state
MC3 MC6
I1_L I1
I1_H I5
[1]
[9]
[8]
[9]
[8]
I/O
I; PU
P0_4 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
O
-
AOUT — DAC output.
O
-
CT16B0_MAT1 — Match output 1 for 16-bit timer 0.
I/O
-
MOSI0 — Master Out Slave In for SSP0. Input glitch
filter (10 ns) capable.
I
I; PU
SWCLK — Primary (default) Serial Wire Debug
Clock. Input glitch filter (10 ns) capable.
I/O
-
P0_5 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
O
-
CT16B0_MAT2 — Match output 2 for 16-bit timer 0.
I/O
-
SCK0 — Serial clock for SSP0. Input glitch filter (10
ns) capable.
I
-
I1_L — Low-gain current input for metrology engine
of SC, SP and MC3 variant.
I
-
I1 — Current input for metrology engine of TP and
MC6 variants.
I
-
I1_H — High-gain current input for metrology engine
of SC, SP and MC3 variant.
I
-
I5 — Current input for metrology engine of MC6
variant.
I
I; PU
R — Reserved
V1
[8]
I
-
V1 — Voltage input for metrology engine.
VBIAS
[8]
I
-
VBIAS — Bias voltage input for metrology engine.
R/P0_9/
CT16B0_
MAT1/CTS
[8]
I
I; PU
R — Reserved
I/O
-
P0_9 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
O
-
CT16B0_MAT1 — Match output 1 for 16-bit timer 0.
I
-
CTS — Clear To Send input for USART. Input glitch
filter (10 ns) capable.
I
-
I2_L — Low-gain current input for metrology engine
of SP and MC3 variant.
I
-
I2 — Current input for metrology engine of TP and
MC6 variants.
EM783
Product data sheet
I2_L
I2
I2_L I2
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
10 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 4.
Pin
no.
25
26
27
28
29
EM783 pin description …continued
EM783 symbol
SC
SP
TP
MC3 MC6
SWDIO/P0_10/
CT16B0MAT2/
RTS
I2_H
V2
I2_H I6
P0_11/SCLK/CT32B0_
CAP0
I3
P0_15/TXD/CT32B0_C V3
AP2/SDA
I3_L I3
I3_H I4
Type Reset Description
state
[1]
[8]
[8]
[8]
I/O
I; PU
SWDIO — Primary (default) Serial Wire Debug I/O.
Input glitch filter (10 ns) capable.
I/O
-
P0_10 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
O
-
CT16B0_MAT2 — Match output 2 for 16-bit timer 0.
O
-
RTS — Request To Send output for USART.
I
-
I2_H — High-gain current input for metrology engine
of SP and MC3 variant.
I
-
I6 — Current input for metrology engine of MC6
variant.
I
-
V2 — Voltage input for metrology engine of TP
variant.
I/O
I; PU
P0_11 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
I/O
-
SCLK — Serial clock for USART. Input glitch filter (10
ns) capable.
I
-
CT32B0_CAP0 — Capture input 0 for 32-bit timer 0.
Input glitch filter (10 ns) capable.
I
-
I3_L — Low-gain current input for metrology engine
of MC3 variant.
I
-
I3 — Current input for metrology engine of TP and
MC6 variants.
I/O
I; PU
P0_15 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
O
-
TXD — Transmitter data output for USART.
I
-
CT32B0_CAP2 — Capture input 2 for 32-bit timer 0.
Input glitch filter (10 ns) capable.
I/O
-
SDA — I2C-bus data input/output. This pin is not an
I2C-bus open-drain pin[10]. Input glitch filter (10 ns)
capable.
I
-
I3_H — High-gain current input for metrology engine
of MC3 variant.
I
-
I4 — Current input for metrology engine of MC6
variant.
I
-
V3 — Voltage input for metrology engine of TP
variant.
V1
[2]
I
-
V1 — Voltage input for metrology engine.
VDD(3V3)
[5]
-
-
3.3 V supply voltage to the metrology engine, internal
regulator, and internal clock generator circuits. Also
used as the metrology engine reference voltage.
I/O
I; PU
P0_23 — General-purpose digital input/output pin.
O
-
RTS — Request To Send output for USART.
I
-
CT32B0_CAP0 — Capture input 0 for 32-bit timer 0.
I/O
-
SCLK — Serial clock for USART.
[6]
30
P0_23/RTS/CT32B0_CAP0/SCLK
EM783
Product data sheet
[2]
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
11 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 4.
Pin
no.
31
32
33
EM783 pin description …continued
EM783 symbol
SC
SP
TP
Type Reset Description
state
MC3 MC6
P0_12/RXD/CT32B0_MAT0/SCL/CLKIN
P0_13/TXD/CT32B0_MAT1/SDA
VSS(IO)/VSS
[1]
[2]
[8]
I/O
I; PU
P0_12 — General-purpose digital input/output pin.
I
-
RXD — Receiver data input for USART.
O
-
CT32B0_MAT0 — Match output 0 for 32-bit timer 0.
I/O
-
SCL — I2C-bus clock input/output. This pin is not an
I2C-bus open-drain pin [10].
I
-
CLKIN — External clock input.
I/O
I; PU
P0_13 — General-purpose digital input/output pin.
Input glitch filter (10 ns) capable.
O
-
TXD — Transmitter data output for USART.
O
-
CT32B0_MAT1 — Match output 1 for 32-bit timer 0.
I/O
-
SDA — I2C-bus data input/output. This pin is not an
I2C-bus open-drain pin [10]. Input glitch filter (10 ns)
capable.
-
-
Ground [11].
[1]
Pin state at reset for default function: I = Input; O = Output; PU = internal pull-up resistor (weak PMOS device) enabled; IA = inactive, no
pull-up/down enabled.
[2]
5 V tolerant pin providing standard digital I/O functions with configurable modes and configurable hysteresis (Figure 24).
[3]
See Figure 25 for the reset configuration.
[4]
When the system oscillator is not used, connect XTALIN and XTALOUT as follows: XTALIN can be left floating or can be grounded
(grounding is preferred to reduce susceptibility to noise). XTALOUT should be left floating. See Section 12.1 if an external clock is
connected to the XTALIN pin.
[5]
If separate supplies are used for VDD(3V3) and VDD(IO), ensure that the power supply pins are filtered for noise. Using separate filtered
supplies reduces the noise to the metrology engine and analog blocks (see also Section 12.1).
[6]
If separate supplies are used for VDD(3V3) and VDD(IO), ensure that the voltage difference between both supplies is smaller than or equal
to 0.5 V.
[7]
I2C-bus pins compliant with the I2C-bus specification for I2C standard mode, I2C Fast-mode, and I2C Fast-mode Plus.
[8]
5 V tolerant pin providing standard digital I/O functions with configurable modes, configurable hysteresis, and analog I/O. When
configured as an analog I/O, digital section of the pin is disabled, and the pin is not 5 V tolerant (Figure 24).
[9]
Not a 5 V tolerant pin due to special analog functionality. Pin provides standard digital I/O functions with configurable modes,
configurable hysteresis, and analog I/O. When configured as an analog I/O, the digital section of the pin is disabled (Figure 24).
[10] I2C-bus pins are standard digital I/O pins and have limited performance and electrical characteristics compared to the full I2C-bus
specification. Pins can be configured with an on-chip pull-up resistor (PMOS device) and with open-drain mode. In this mode, typical bit
rates of up to 100 kbit/s with 20 pF load are supported if the internal pull-ups are enabled. Higher bit rates can be achieved with an
external resistor.
[11] Thermal pad. Connect to ground.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
12 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
7. Functional description
7.1 ARM Cortex-M0 processor
The ARM Cortex-M0 is a general purpose, 32-bit microprocessor, which offers high
performance and very low power consumption.
7.2 On-chip flash program memory
The EM783 contains up to 32 kB of on-chip flash program memory.
7.3 On-chip EEPROM data memory
The EM783 contains up to 4 kB of on-chip EEPROM data memory.
Remark: The top 64 bytes of the 4 kB EEPROM are reserved and cannot be written to.
7.4 On-chip SRAM
The EM783 contain a total of 8 kB, 4 kB, or 2 kB on-chip static RAM data memory.
7.5 Memory map
The EM783 incorporate several distinct memory regions, shown in the following figures.
Figure 3 shows the overall map of the entire address space from the user program
viewpoint following reset. The interrupt vector area supports address remapping.
The AHB peripheral area is 2 MB in size, and is divided to allow for up to 128 peripherals.
The APB peripheral area is 512 kB in size and is divided to allow for up to 32 peripherals.
Each peripheral of either type is allocated 16 kB of space. This space allows simplifying
the address decoding for each peripheral.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
13 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
EM783
4 GB
0xFFFF FFFF
reserved
0xE010 0000
private peripheral bus
0xE000 0000
APB peripherals
reserved
0x5000 4000
GPIO
0x4008 0000
25 - 31 reserved
0x5000 0000
0x4006 4000
24
GPIO GROUP1 INT
23
GPIO GROUP0 INT
22
reserved
0x4008 0000
21
reserved
0x4000 0000
20
reserved
19
GPIO interrupts
18
system control
17
IOCONFIG
16
15
SSP0
flash/EEPROM controller
14
PMU
reserved
APB peripherals
1 GB
reserved
0x2000 0000
0.5 GB
reserved
0x1FFF 4000
16 kB boot ROM
11 - 13 reserved
0x1FFF 0000
reserved
0x1000 2000
8 kB SRAM
0x1000 0000
reserved
0x0000 8000
32 kB on-chip flash
0x4006 0000
0x4005 C000
0x4005 8000
0x4005 4000
0x4005 0000
0x4004 C000
0x4004 8000
0x4004 4000
0x4004 0000
0x4003 C000
0x4003 8000
0x4002 C000
10
reserved
9
DAC
8
reserved
0x4002 0000
7
reserved
0x4001 C000
6
reserved
0x4001 8000
5
32-bit counter/timer 0
0x4001 4000
4
reserved
0x4001 0000
3
16-bit counter/timer 0
0x4000 C000
2
USART
0x4000 8000
1
0
WWDT
0x4000 4000
I2C-bus
0x4000 0000
0x4002 8000
0x4002 4000
0x0000 00C0
active interrupt vectors
0x0000 0000
0x0000 0000
0 GB
aaa-007682
Fig 3.
EM783 memory map
7.6 Nested Vectored Interrupt Controller (NVIC)
The Nested Vectored Interrupt Controller (NVIC) is an integral part of the Cortex-M0. The
tight coupling to the CPU allows for low interrupt latency and efficient processing of late
arriving interrupts.
7.6.1 Features
• Controls system exceptions and peripheral interrupts.
• In the EM783, the NVIC supports 32 vectored interrupts including up to 8 inputs to the
start logic from the individual GPIO pins.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
14 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
• Four programmable interrupt priority levels with hardware priority level masking.
• Software interrupt generation.
7.6.2 Interrupt sources
Each peripheral device has one interrupt line connected to the NVIC but may have several
interrupt flags. Individual interrupt flags may also represent more than one interrupt
source.
Up to eight GPIO pins can be programmed to generate an interrupt for a level, and/or a
rising edge, and/or a falling edge. The interrupt generating GPIOs can be selected from
the GPIO pins with a configurable input glitch filter. The interrupts can be generated
regardless of the selected function.
7.7 IOCONFIG block
The IOCONFIG block allows selected pins of the microcontroller to have more than one
function. Configuration registers control the multiplexers to allow connection between the
pin and the on-chip peripherals.
Peripherals should be connected to the appropriate pins before being activated and prior
to any related interrupts being enabled. Activity of any enabled peripheral function that is
not mapped to a related pin should be considered undefined.
Up to 9 pins can be configured with a digital input glitch filter for removing voltage glitches
with widths of 10 ns (see Table 3 and Table 4). Two pins can be configured with a 20 ns
input glitch filter. Another two pins can be configured with a 50 ns digital input glitch filter.
7.8 Fast general-purpose parallel I/O
The GPIO registers control the device pins that are not connected to a specific peripheral
function. Pins may be dynamically configured as inputs or outputs. Multiple outputs can be
set or cleared in one write operation.
EM783 use accelerated GPIO functions:
• GPIO registers are a dedicated AHB peripheral so that the fastest possible I/O timing
can be achieved.
• An entire port value can be written in one instruction.
GPIO pins providing a digital function (maximum 22 pins), can be programmed to
generate an interrupt for a level, and/or a rising edge, and/or a falling edge.
7.8.1 Features
• Bit level port registers allow a single instruction to set and clear any number of bits in
one write operation.
• Direction control of individual bits.
• All I/O default to inputs with internal pull-up resistors enabled after reset, except for
the I2C-bus true open-drain pins P0_2 and P0_3.
• Pull-up/pull-down configuration, repeater, and open-drain modes can be programmed
through the IOCONFIG block for each GPIO pin. For the functional diagrams, see
Figure 24 and Figure 25.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
15 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
• Control of the digital output slew rate allowing to switch more outputs simultaneously
without degrading the power/ground distribution of the device.
7.9 USART
The EM783 contains one USART.
Support for RS-485/9-bit mode allows both software address detection and automatic
address detection using 9-bit mode.
The USART includes a fractional baud rate generator. Standard baud rates such as
115200 Bd can be achieved with any crystal frequency above 2 MHz.
7.9.1 Features
•
•
•
•
•
Maximum USART data bit rate of 3.125 MBit/s.
•
•
•
•
FIFO control mechanism that enables software flow control implementation.
16 byte Receive and Transmit FIFOs.
Register locations conform to 16C550 industry standard.
Receiver FIFO trigger points at 1 B, 4 B, 8 B, and 14 B.
Built-in fractional baud rate generator covering wide range of baud rates without a
need for external crystals of particular values.
Support for RS-485/9-bit mode.
Supports a full modem control handshake interface.
Support for synchronous mode.
7.10 SSP serial I/O controller
The EM783 contains one SSP controller.
The SSP controller can operate on a SPI, 4-wire SSI, or Microwire bus. It can interact with
multiple masters and slaves on the bus. Only a single master and a single slave can
communicate on the bus during a given data transfer. The SSP supports full-duplex
transfers, with frames of 4 bits to 16 bits of data. The data flows from the master to the
slave and from the slave to the master. In practice, often only one of the data-flows carries
meaningful data.
7.10.1 Features
• Maximum SSP speed of 25 Mbit/s (master) or 4.17 Mbit/s (slave) (in SPI mode).
• Compatible with Motorola SPI, 4-wire Texas Instruments SSI, and National
Semiconductor Microwire buses.
•
•
•
•
EM783
Product data sheet
Synchronous serial communication.
Master or slave operation.
8-frame FIFOs for both transmit and receive.
4-bit to 16-bit frame.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
16 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
7.11 I2C-bus serial I/O controller
The EM783 contains one I2C-bus controller.
The I2C-bus is bidirectional for inter-IC control using only two wires: a serial clock line
(SCL) and a serial data line (SDA). A unique address recognizes each device which can
operate as either a receiver-only device (e.g., an LCD driver) or a transmitter with the
capability to both receive and send information (such as memory). Transmitters and/or
receivers can operate in either master or slave mode, depending on whether the chip has
to initiate a data transfer or is only addressed. The I2C is a multi-master bus that can be
controlled by more than one bus master connected to it.
7.11.1 Features
• The I2C-interface is a standard I2C-bus compliant interface with open-drain pins
(P0_2 and P0_3). The I2C-bus interface also supports Fast-mode Plus with bit rates
up to 1 Mbit/s.
• The true open-drain pins P0_2 and P0_3 can be configured with a 50 ns digital input
glitch filter.
• If the true open-drain pins are used for other purposes, a limited-performance I2C-bus
interface can be configured from a choice of six GPIO pins. The six GPIO pins are
configured in open-drain mode and with a pull-up resistor. In this mode, typical bit
rates of up to 100 kbit/s with 20 pF load are supported if the internal pull-ups are
enabled. Higher bit rates can be achieved with an external resistor.
• Easy to configure as master, slave, or master/slave.
• Fail-safe operation. When the power to an I2C-bus device is switched off, the SDA
and SCL pins connected to the I2C-bus are floating and do not disturb the bus.
•
•
•
•
Programmable clocks allow versatile rate control.
Bidirectional data transfer between masters and slaves.
Multi-master bus (no central master).
Arbitration between simultaneously transmitting masters without corruption of serial
data on the bus.
• Serial clock synchronization allows devices with different bit rates to communicate via
one serial bus.
• Serial clock synchronization can be used as a handshake mechanism to suspend and
resume serial transfer.
• The I2C-bus can be used for test and diagnostic purposes.
• The I2C-bus controller supports multiple address recognition and a bus monitor mode.
7.12 Metrology engine
The EM783 contains a metrology engine designed to collect voltage and current inputs. It
uses these inputs to calculate the active power, reactive power, apparent power and
power factor of a load. The purpose of the metrology engine is for billing and non-billing
applications such as plug meters, smart appliances, industrial and consumer submeters.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
17 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
7.12.1 Features
• Up to 1.0 % accurate for scalable input sources. It maintains this accuracy with a
factor of 1 to 1000 down from the maximum current.
• Automatically calculates:
– Vrms
– Irms
– active power in W
– reactive power in VAR
– apparent power in VA
– power factor
– fundamental reactive power in VAR
– fundamental apparent power in VA
– fundamental power factor
– non-fundamental apparent power
– non-active power
– total harmonic distortion of the current
– mains frequency
– CPU core temperature
• Standard API for initializing, starting, stopping and reading data from the metrology
engine using the ARM Cortex-M0.
• Temperature measurement supporting temperature compensation. The temperature
sensor has a maximum error of 3 degrees C over the ambient temperature range of
40 C to +85 C.
•
•
•
•
Very accurate mains frequency measurement.
Mains frequency operating range of 45 Hz to 65 Hz.
EEPROM can be used for energy registers and calibration parameters.
Measurements and active power according to IEC 62053-21.
7.13 10-bit DAC
The DAC allows generation of a variable, rail-to-rail analog output.
7.13.1 Features
•
•
•
•
•
•
10-bit DAC.
Resistor string architecture.
Buffered output.
Power-down mode.
Conversion speed controlled via a programmable bias current.
Optional output update modes:
– write operations to the DAC register.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
18 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
– a transition of pin ATRG0. Input signal must be held for a minimum of three system
clock periods.
– a timer match signal.
• If the DAC is not powered down, it holds the output value during Sleep mode.
7.14 Internal voltage reference
The internal voltage reference is an accurate 0.9 V and is the output of a low voltage band
gap circuit. A typical value at Tamb = 25 C is 0.903 V. This value varies typically only
3 mV over the 0 C to 85 C temperature range (see Table 21 and Figure 21).
7.15 General-purpose external event counter/timers
The EM783 includes one 32-bit counter/timer and one 16-bit counter/timer. The
counter/timer is designed to count cycles of the system derived clock. It can optionally
generate interrupts or perform other actions at specified timer values, based on four
match registers. Each counter/timer also includes four capture inputs to trap the timer
value when an input signal transitions, optionally generating an interrupt.
7.15.1 Features
• A 32-bit/16-bit timer/counter with a programmable 32-bit/16-bit prescaler.
• Counter or timer operation.
• Four capture channels per timer, that can take a snapshot of the timer value when an
input signal transitions. A capture event may also generate an interrupt. Up to three
capture channels are pinned out.
• Four match registers per timer that allow:
– Continuous operation with optional interrupt generation on match.
– Stop timer on match with optional interrupt generation.
– Reset timer on match with optional interrupt generation.
• Up to four external outputs corresponding to match registers, with the following
capabilities:
– Set LOW on match.
– Set HIGH on match.
– Toggle on match.
– Do nothing on match.
7.16 System tick timer
The ARM Cortex-M0 includes a system tick timer (SYSTICK) that is intended to generate
a dedicated SYSTICK exception at a fixed time interval (typically 10 ms).
7.17 Windowed WatchDog Timer (WWDT)
If software fails to service the controller periodically within a programmable time window,
the purpose of the watchdog is to reset it.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
19 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
7.17.1 Features
• Internally resets chip if not periodically reloaded during the programmable time-out
period.
• Optional windowed operation requires reload to occur between a minimum and
maximum time period, both programmable.
• Optional warning interrupt can be generated at a programmable time before a
watchdog time-out.
• Enabled by software but requires a hardware reset or a watchdog reset/interrupt to be
disabled.
•
•
•
•
If enabled, an incorrect feed sequence causes a reset or interrupt.
Flag to indicate watchdog reset.
Programmable 24-bit timer with internal prescaler.
Selectable time period from (Tcy(WDCLK)  256  4) to (Tcy(WDCLK)  224  4) in
multiples of Tcy(WDCLK)  4.
• The WatchDog Clock (WDCLK) source can be selected from the internal RC oscillator
(IRC), or the dedicated watchdog oscillator (WDOsc). This gives a wide range of
potential timing choices of watchdog operation under different power conditions.
7.18 Clocking and power control
7.18.1 Crystal and internal oscillators
The EM783 include four independent oscillators.
1. The crystal oscillator (SysOsc) operating at frequencies between 1 MHz and 25 MHz.
2. The internal RC Oscillator (IRC) with a fixed frequency of 12 MHz, trimmed to 1 %
accuracy.
3. The internal low-power, Low-Frequency Oscillator (LFOsc) with a programmable
nominal frequency between 9.4 kHz and 2.3 MHz with 40 % accuracy.
4. The dedicated WatchDog Oscillator (WDOsc) with a programmable nominal
frequency between 9.4 kHz and 2.3 MHz with 40 % accuracy.
Each oscillator, except the WDOsc, can be used for more than one purpose as required in
a particular application.
Following reset, the EM783 operates from the IRC until switched by software. This allows
systems to operate without any external crystal and the bootloader code to operate at a
known frequency.
See Figure 4 for an overview of the EM783 clock generation.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
20 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
system
SYSTEM CLOCK
DIVIDER
system clock
18
memories
and peripherals
SYSCLKCTRL[1:18]
SSP0 PERIPHERAL
CLOCK DIVIDER
IRC
SSP0
main clock
LFOsc
USART PERIPHERAL
CLOCK DIVIDER
USART
CLKOUT PIN CLOCK
DIVIDER
CLKOUT pin
MAINCLKSEL
(main clock select)
IRC
SysOsc
CLKIN
IRC
SysOsc
LFOsc
SYSTEM PLL
SYSPLLCLKSEL
(system PLL clock select)
CLKOUTUEN
(CLKOUT update enable)
IRC
WWDT CLOCK
DIVIDER
WWDT
WDOsc
WDCLKSEL
Fig 4.
aaa-009615
EM783 clock generation block diagram
7.18.1.1
Internal RC Oscillator (IRC)
The IRC may be used as the clock source for the WWDT, and/or as the clock that drives
the PLL and subsequently the CPU. The nominal IRC frequency is 12 MHz. The IRC is
trimmed to 1 % accuracy over the entire voltage and temperature range.
The IRC can be used as a clock source for the CPU with or without using the PLL. The
IRC frequency can be boosted to a higher frequency, up to the maximum CPU operating
frequency, by the system PLL.
Upon power-up or any chip reset, the EM783 use the IRC as the clock source. Software
may later switch to one of the other available clock sources.
7.18.1.2
Crystal Oscillator (SysOsc)
The crystal oscillator can be used as the clock source for the CPU, with or without using
the PLL.
The SysOsc operates at frequencies of 1 MHz to 25 MHz. This frequency can be boosted
to a higher frequency, up to the maximum CPU operating frequency, by the system PLL.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
21 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
7.18.1.3
Internal Low-Frequency Oscillator (LFOsc) and WatchDog Oscillator (WDOsc)
The LFOsc and the WDOsc are identical internal oscillators. The nominal frequency is
programmable between 9.4 kHz and 2.3 MHz. The frequency spread over silicon process
variations is 40 %.
The WDOsc is a dedicated oscillator for the windowed WWDT.
The LFOsc can be used as a clock source that directly drives the CPU or the CLKOUT
pin.
7.18.2 Clock input
A 3.3 V external clock source (25 MHz typical) can be supplied on the selected CLKIN pin.
A 1.8 V external clock source can be supplied on the XTALIN pin (see Section 12.1).
7.18.3 System PLL
The PLL accepts an input clock frequency in the range of 10 MHz to 25 MHz. The input
frequency is multiplied up to a high frequency with a Current Controlled Oscillator (CCO).
The multiplier can be an integer value from 1 to 32. The CCO operates in the range of
156 MHz to 320 MHz. There is an additional divider in the loop to keep the CCO within its
frequency range while the PLL is providing the desired output frequency. The output
divider may be set to divide by 2, 4, 8, or 16 to produce the output clock. Since the
minimum output divider value is 2, it is insured that the PLL output has a 50 % duty cycle.
Software can enable the PLL and it is turned off and bypassed following a chip reset. The
program must configure and activate the PLL, wait for the PLL to lock, and then connect to
the PLL as a clock source. The PLL settling time is 100 s.
7.18.4 Clock output
The EM783 features a clock output function that routes the IRC, the SysOsc, the LFOsc,
or the main clock to an output pin.
7.18.5 Wake-up process
The EM783 begin operation at power-up and when awakened from Deep power-down
mode by using the IRC as the clock source. This allows chip operation to resume quickly.
If the application requires the SysOsc, the external clock source, or the PLL, software
must enable these features. Before using them as a clock source, wait for them to
stabilize.
7.18.6 Power control
The EM783 supports the ARM Cortex-M0 Sleep mode. The CPU clock rate may also be
controlled as needed by changing clock sources, reconfiguring PLL values, and/or altering
the CPU clock divider value. This control allows a trade-off of power versus processing
speed based on application requirements. In addition, a register is provided for shutting
down the clocks to individual on-chip peripherals. The clock control allows fine-tuning of
power consumption. It eliminates all dynamic power use in any peripherals that are not
required for the application. Selected peripherals have their own clock divider which
provides even better power control.
7.18.6.1
Sleep mode
When Sleep mode is entered, the clock to the core is stopped. Resumption from the Sleep
mode does not need any special sequence but re-enabling the clock to the ARM core.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
22 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
In Sleep mode, execution of instructions is suspended until either a reset or interrupt
occurs. Peripheral functions continue operation during Sleep mode and may generate
interrupts to cause the processor to resume execution. Sleep mode eliminates dynamic
power used by the processor itself, memory systems and related controllers, and internal
buses.
7.18.6.2
Power profiles
The power consumption in Active and Sleep modes can be optimized for the application
through simple calls to the power profile. The power configuration routine configures the
EM783 for one of the following power modes:
• Power mode 0: Default mode corresponding to power configuration after reset.
• Power mode 1: CPU performance mode corresponding to optimized processing
capability.
• Power mode 2: Efficiency mode corresponding to optimized balance of current
consumption and CPU performance.
• Power mode 3: Low-current mode corresponding to lowest power consumption.
In addition, the power profile includes routines to select the optimal PLL settings for a
given system clock and PLL input clock.
7.19 System control
7.19.1 UnderVoltage LockOut (UVLO) protection
See Section 10.1 “Power supply fluctuations” for details on the settling times of the BOD
and POR circuits. These circuits constitute the UVLO protection.
7.19.2 Reset
Reset has four sources on the EM783: the RESET pin, the WatchDog reset, power-on
reset (POR), the ARM SYSRESETREQ software request and the BrownOut Detection
(BOD) circuit. The RESET pin is a Schmitt trigger input pin and uses a special pad (see
Figure 25). Assertion of chip reset by any source (after the operating voltage attains a
usable level) starts the IRC and initializes the flash controller. After the BOD and the POR
resets are released, the internal reset timer counts for 100 s until the internal reset is
removed.
When the internal Reset is removed, the processor begins executing at address 0, which
is initially the Reset vector mapped from the boot block. At that point, all of the processor
and peripheral registers have been initialized to predetermined values.
Writing to a special function register allows the software to reset peripherals such as the
I2C-bus interface, USART, SSP controller, counter/timers and DAC.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
23 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
7.19.3 Brownout detection
The EM783 includes two programmable levels for monitoring the voltage on the VDD(3V3)
pin. If this voltage falls below one of the four selected levels, the BOD asserts an interrupt
signal to the NVIC. To cause a CPU interrupt, this signal is enabled for interrupt in the
Interrupt Enable Register in the NVIC. Software can monitor the signal by reading a
dedicated status register. In addition, the BOD circuit supports one hardware controlled
voltage level for triggering a chip reset.
7.19.4 Code security (Code Read Protection - CRP)
This feature of the EM783, allows different levels of security to be enabled in the system.
It is used to restrict access to the on-chip flash and use of the Serial Wire Debugger
(SWD) and In-System-Programming (ISP). When needed, CRP is invoked by
programming a specific pattern into a dedicated flash location. The CRP does not affect
IAP commands.
In addition, ISP entry via the P0_1 pin can be disabled without enabling CRP. Refer to the
EM783 user manual for specific details.
There are three levels of Code Read Protection:
1. CRP1 disables access to the chip via the SWD and allows partial flash update
(excluding flash sector 0) using a limited set of the ISP commands. This mode is
useful when CRP is required and flash field updates are needed but all sectors cannot
be erased.
2. CRP2 disables access to the chip via the SWD and only allows full flash erase and
update using a reduced set of the ISP commands.
3. Running an application with level CRP3 selected fully disables any access to the chip
via the SWD pins and the ISP. This mode effectively disables ISP override using P0_1
pin. To enable flash update via the USART, the user application must provide a flash
update mechanism using IAP calls or call reinvoke ISP command.
CAUTION
If level three Code Read Protection (CRP3) is selected, no future factory testing can be
performed on the device.
In addition to the three CRP levels, sampling of pin P0_1 for valid user code can be
disabled. Refer to the EM783 user manual for specific details.
7.19.5 APB interface
The APB peripherals are located on one APB bus.
7.19.6 AHBLite
The AHBLite connects the CPU bus of the ARM Cortex-M0 to the flash memory, the main
static RAM, and the Boot ROM.
7.19.7 External interrupt inputs
All GPIO pins can be level or edge sensitive interrupt inputs.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
24 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
7.20 Emulation and debugging
Debug functions are integrated into the ARM Cortex-M0. Serial Wire Debug (SWD) with
four breakpoints and two watchpoints is supported.
8. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).[1]
Symbol
Parameter
Conditions
Min
Max
Unit
VDD(3V3)
supply voltage (3.3 V)
[2]
0.5
+4.6
V
VDD(IO)
input/output supply voltage
[2]
0.5
+4.6
V
[2][3][4]
0.5
+5.5
V
on pins P0_2 and
P0_3
[5]
0.5
+5.5
V
3 V tolerant I/O
pins without
over-voltage
protection
[6]
0.5
VDD(IO)
V
metrology
[7]
0.5
+4.6
V
input voltage
VI
5 V tolerant I/O
pins; only valid
when the VDD(IO)
supply voltage is
present
IDD
supply current
per supply pin
-
100
mA
ISS
ground current
per ground pin
-
100
mA
Ilatch
I/O latch-up current
(0.5VDD(IO)) < VI <
(1.5VDD(IO));
-
100
mA
Tj < 125 C
[8]
Tstg
storage temperature
Tj(max)
maximum junction temperature
Ptot(pack)
total power dissipation (per package)
based on package
heat transfer, not
device power
consumption
VESD
electrostatic discharge voltage
human body
model; all pins
[1]
[9]
65
+150
C
-
150
C
-
1.5
W
6500
+6500
V
The following applies to the limiting values:
a) This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive
static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated
maximum.
b) Parameters are valid over operating temperature range unless otherwise specified. All voltages relate to VSS unless otherwise noted.
[2]
Maximum/minimum voltage above the maximum operating voltage (see Table 6) and below ground that can be applied for a short time
(< 10 ms) to a device without leading to irrecoverable failure. Failure includes the loss of reliability and shorter lifetime of the device.
[3]
Applies to all 5 V tolerant I/O pins except true open-drain pins P0_2 and P0_3 and except the 3 V tolerant pins P0_4 and P0_5.
[4]
Including the voltage on outputs in 3-state mode.
[5]
VDD(IO) present or not present. Compliant with the I2C-bus standard. 5.5 V can be applied to this pin when VDD(IO) is powered down.
[6]
Applies to 3 V tolerant pins P0_4 and P0_5.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
25 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
[7]
A Metrology engine input voltage above 3.6 V can be applied for a short time without leading to immediate, unrecoverable failure.
Accumulated exposure to elevated voltages at 4.6 V must be less than 10^6 s total over the lifetime of the device. Applying an elevated
voltage to the metrology engine inputs for a long time affects the reliability of the device and reduces its lifetime.
[8]
Dependent on package type.
[9]
Human body model: equivalent to discharging a 100 pF capacitor through a 1.5 k series resistor.
9. Static characteristics
Table 6.
Static characteristics
Tamb = 40 C to +85 C, unless otherwise specified.
Min
Typ[1]
Max
Unit
supply voltage (3.3 V)
2.6
3.3
3.6
V
VDD(IO)
input/output supply
voltage
2.6
3.3
3.6
V
IDD
supply current
Symbol
Parameter
VDD(3V3)
Conditions
Active mode; code
while(1){}
executed from flash;
VDD(3V3) = VDD(IO) = 3.3 V;
low-current mode (see
Section 7.18.6.2)
system clock = 12 MHz;
all peripherals disabled
[2][4][5]
-
3
-
mA
system clock = 48 MHz;
all peripherals disabled
[2][6][5]
-
8
-
mA
all peripherals disabled;
12 MHz
[2][4][5]
-
2
-
mA
all peripherals disabled;
48 MHz
[2][4][5]
-
5
-
mA
Sleep mode;
system clock = 12 MHz;
VDD(3V3) = VDD(IO) = 3.3 V;
power mode 0 (see
Section 7.18.6.2)
Standard port pins, RESET
IIL
LOW-level input current VI = 0 V; on-chip pull-up
resistor disabled
-
0.5
1000
nA
IIH
HIGH-level input
current
VI = VDD(IO); on-chip
pull-down resistor
disabled
-
0.5
1000
nA
IOZ
OFF-state output
current
VO = 0 V; VO = VDD(IO);
on-chip pull-up/down
resistors disabled
-
0.5
1000
nA
VI
input voltage
pin configured to provide
a digital function
0
-
5.0
V
[7][8]
5 V tolerant pins
3 V tolerant pins:
P0_4 and P0_5
VO
output voltage
VIH
HIGH-level input
voltage
EM783
Product data sheet
[7][8]
output active
VDD(IO)
0
-
VDD(IO)
V
0.7VDD(IO)
-
-
V
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
26 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 6.
Static characteristics …continued
Tamb = 40 C to +85 C, unless otherwise specified.
Min
Typ[1]
Max
Unit
-
-
0.3VDD(IO)
V
3.0 V  VDD(IO) 3.6 V
0.4
-
-
V
HIGH-level output
voltage
2.6 V  VDD(IO) 3.6 V;
IOH = 4 mA
0.85VDD(IO) -
-
V
VOL
LOW-level output
voltage
2.6 V  VDD(IO) 3.6 V;
IOL = 4 mA
-
-
0.15VDD(IO) V
IOH
HIGH-level output
current
VOH = VDD(IO)  0.4 V;
4
-
-
mA
LOW-level output
current
VOL = 0.4 V
4
-
-
mA
Symbol
Parameter
VIL
LOW-level input voltage
Vhys
hysteresis voltage
VOH
IOL
Conditions
2.6 V  VDD(IO) 3.6 V
2.6 V  VDD(IO) 3.6 V
IOHS
HIGH-level short-circuit VOH = 0 V
output current
[9]
-
-
45
mA
IOLS
LOW-level short-circuit
output current
VOL = VDD(IO)
[9]
-
-
50
mA
Ipd
pull-down current
VI = 5 V
10
50
150
A
Ipu
pull-up current
VI = 0 V;
15
50
85
A
0
0
0
A
[10]
2.6 V  VDD(IO) 3.6 V
VDD(IO) < VI < 5 V
High-drive output pin (P0_21)
IIL
LOW-level input current VI = 0 V; on-chip pull-up
resistor disabled
-
0.5
10
nA
IIH
HIGH-level input
current
VI = VDD(IO); on-chip
pull-down resistor
disabled
-
0.5
10
nA
IOZ
OFF-state output
current
VO = 0 V; VO = VDD(IO);
on-chip pull-up/down
resistors disabled
-
0.5
10
nA
VI
input voltage
pin configured to provide
a digital function
0
-
5.0
V
VO
output voltage
output active
0
-
VDD(IO)
V
VIH
HIGH-level input
voltage
0.7VDD(IO)
-
-
V
VIL
LOW-level input voltage
-
-
0.3VDD(IO)
V
Vhys
hysteresis voltage
0.4
-
-
V
VOH
HIGH-level output
voltage
2.6 V  VDD(IO) 3.6 V;
IOH = 20 mA
VDD(IO) 
0.4
-
-
V
2.6 V  VDD(IO)  2.5 V;
IOH = 12 mA
VDD(IO) 
0.4
-
-
V
[7][8]
VOL
LOW-level output
voltage
2.6 V  VDD(IO) 3.6 V;
IOL = 4 mA
-
-
0.4
V
IOH
HIGH-level output
current
VOH = VDD(IO)  0.4 V;
20
-
-
mA
EM783
Product data sheet
2.6 V  VDD(IO) 3.6 V
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
27 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 6.
Static characteristics …continued
Tamb = 40 C to +85 C, unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ[1]
Max
Unit
IOL
LOW-level output
current
VOL = 0.4 V
4
-
-
mA
IOHS
HIGH-level short-circuit VOH = 0 V
output current
[9]
-
-
160
mA
IOLS
LOW-level short-circuit
output current
VOL = VDD(IO)
[9]
-
-
50
mA
Ipd
pull-down current
VI = 5 V
10
50
150
A
Ipu
pull-up current
VI = 0 V
15
50
85
A
0
0
0
A
2.6 V  VDD(IO) 3.6 V
2.6 V  VDD(IO) 3.6 V
VDD(IO) < VI < 5 V
I2C-bus
pins (P0_2 and P0_3)
VIH
HIGH-level input
voltage
0.7VDD(IO)
-
-
V
VIL
LOW-level input voltage
-
-
0.3VDD(IO)
V
Vhys
hysteresis voltage
-
0.05VDD(IO) -
V
4
-
-
mA
20
-
-
mA
-
2
4
A
-
10
22
A
LOW-level output
current
IOL
I2C-bus
VOL = 0.4 V;
pins
configured as standard
mode pins
2.6 V  VDD(IO) 3.6 V
IOL
LOW-level output
current
VOL = 0.4 V; I2C-bus pins
configured as high-current
sink pins
ILI
input leakage current
VI = VDD(IO)
2.6 V  VDD(IO) 3.6 V
VI = 5 V
[11]
Oscillator pins
Vi(xtal)
crystal input voltage
0.5
1.8
1.95
V
Vo(xtal)
crystal output voltage
0.5
1.8
1.95
V
[1]
Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply voltages.
[2]
Tamb = 25 C.
[3]
IDD measurements were performed with all pins configured as GPIO outputs driven LOW and pull-up resistors disabled.
[4]
IRC enabled; SysOsc disabled; system PLL disabled.
[5]
All digital peripherals disabled in the SYSCLKCTRL register except ROM, RAM, and flash. Peripheral clocks to USART and SSP0/1
disabled in system configuration block. Analog peripherals disabled in the PDRUNCFG register except flash memory.
[6]
IRC disabled; SysOsc enabled; system PLL enabled.
[7]
Including voltage on outputs in 3-state mode.
[8]
All supply voltages must be present.
[9]
Allowed as long as the current limit does not exceed the maximum current allowed by the device.
[10] Does not apply to 3 V tolerant pins P0_4.
[11] To VSS.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
28 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
9.1 Power consumption
Power measurements in Active and Sleep modes were performed under the following
conditions (see EM783 user manual):
• Configure all pins as GPIO with pull-up resistor disabled in the IOCONFIG block.
• Configure GPIO pins as outputs using the GPIOn DIR registers.
• Drive all GPIO outputs to low.
002aah184
8
IDD
(mA)
48 MHz(2)
6.4
36 MHz(2)
4.8
24 MHz(2)
3.2
12 MHz(1)
1.6
0
-40
-15
10
35
60
temperature (°C)
85
Conditions: VDD(3V3) = 3.3 V; active mode entered executing code while(1){} from flash; all
peripherals disabled in the SYSAHBCLKCTRL register; all peripheral clocks disabled; all analog
peripherals disabled in the PDRUNCFG register; power mode 0 (see Section 7.18.6.2).
(1) SysOsc and system PLL disabled; IRC enabled.
(2) SysOsc and system PLL enabled; IRC disabled.
Fig 5.
EM783
Product data sheet
Active mode: Typical supply current IDD versus temperature for different system
clock frequencies (all peripherals disabled)
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
29 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
002aah185
8
IDD
(mA)
48 MHz(2)
6.4
36 MHz(2)
4.8
24 MHz(2)
3.2
12 MHz(1)
1.6
0
2.7
3
3.3
3.6
VDD(3V3) (V)
Conditions: VDD(3V3) = 3.3 V; active mode entered executing code while(1){} from flash; all
peripherals enabled in the SYSAHBCLKCTRL register; all analog peripherals enabled in the
PDRUNCFG register; power mode 0 (see Section 7.18.6.2).
(1) SysOsc and system PLL disabled; IRC enabled.
(2) SysOsc and system PLL enabled; IRC disabled.
Fig 6.
Active mode: Typical supply current IDD versus temperature for different system
clock frequencies (all peripherals enabled)
002aah186
8
IDD
(mA)
6.4
48 MHz(2)
4.8
36 MHz(2)
3.2
24 MHz(2)
12 MHz(1)
1.6
0
-40
-15
10
35
60
temperature (°C)
85
Conditions: VDD(3V3) = 3.3 V; sleep mode entered from flash; all peripherals disabled in the
SYSAHBCLKCTRL register and PDRUNCFG register; all peripheral clocks disabled; BOD
disabled; power mode 0 (see Section 7.18.6.2).
(1) SysOsc and system PLL disabled; IRC enabled.
(2) SysOsc and system PLL enabled; IRC disabled.
Fig 7.
EM783
Product data sheet
Sleep mode: Typical supply current IDDversus temperature for different system
clock frequencies (all peripherals disabled)
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
30 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
9.2 Peripheral power consumption
The supply current per peripheral is measured as the difference in supply current between
the peripheral block enabled and the peripheral block disabled in the SYSAHBCLKCFG
and PDRUNCFG (for analog blocks) registers. All other blocks are disabled in both
registers and no code is executed. Measured on a typical sample at Tamb = 25 C.
Table 7.
Power consumption for individual analog and digital blocks
Peripheral
Average A/MHz
Typical supply current in mA
12 MHz
[1]
Analog peripherals
BOD
0.05
-
Metrology engine
0.10
-
DAC
0.26
-
USART
0.15
12
I2C
0.02
2
16-bit counter/timer 0
0.02
2
32-bit counter/timer 0
0.02
2
WWDT
0.02
2
Digital peripherals
[1]
IRC on; PLL off.
9.3 Electrical pin characteristics
002aae990
3.6
VOH
(V)
T = 85 °C
25 °C
−40 °C
3.2
2.8
2.4
2
0
10
20
30
40
50
60
IOH (mA)
Conditions: VDD(IO) = 3.3 V; on pin P0_21.
Fig 8.
EM783
Product data sheet
High-current source output driver: Typical HIGH-level output voltage VOH versus
HIGH-level output current IOH
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
31 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
002aaf019
60
T = 85 °C
25 °C
−40 °C
IOL
(mA)
40
20
0
0
0.2
0.4
0.6
VOL (V)
Conditions: VDD(IO) = 3.3 V; on pins P0_2 and P0_3.
Fig 9.
High-current sink pins: Typical LOW-level output current IOL versus LOW-level
output voltage VOL
002aae991
15
IOL
(mA)
T = 85 °C
25 °C
−40 °C
10
5
0
0
0.2
0.4
0.6
VOL (V)
Conditions: VDD(IO) = 3.3 V; standard port pins and P0_21.
Fig 10. Typical LOW-level output current IOL versus LOW-level output voltage VOL
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
32 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
002aae992
3.6
VOH
(V)
T = 85 °C
25 °C
−40 °C
3.2
2.8
2.4
2
0
8
16
24
IOH (mA)
Conditions: VDD(IO) = 3.3 V; standard port pins.
Fig 11. Typical HIGH-level output voltage VOH versus HIGH-level output source current
IOH
002aae988
10
Ipu
(μA)
−10
−30
T = 85 °C
25 °C
−40 °C
−50
−70
0
1
2
3
4
5
VI (V)
Conditions: VDD(IO) = 3.3 V; standard port pins.
Fig 12. Typical pull-up current Ipu versus input voltage VI
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
33 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
002aae989
80
T = 85 °C
25 °C
−40 °C
Ipd
(μA)
60
40
20
0
0
1
2
3
4
5
VI (V)
Conditions: VDD(IO) = 3.3 V; standard port pins.
Fig 13. Typical pull-down current Ipd versus input voltage VI
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
34 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
10. Dynamic characteristics
10.1 Power supply fluctuations
If the input voltage (VDD(3V3)) to the internal regulator fluctuates, the EM783 is held in
reset during a brownout condition as long as the UVLO circuit is operating. The settling
times of the BOD and POR circuits, which constitute the UVLO, determine the minimum
time the supply level must remain in the shallow or deep brownout condition. This time
ensures that the internal reset is asserted properly.
Table 8.
supply
voltage
VDD(3V3)
POR and BOD circuit settling characteristics
Symbol
Parameter
Conditions
ts
settling time
power droop:
cold
start-up
Min
Typ
Max
Unit
from active level to
shallow brownout level
(0.9 V  VDD(3V3)  2.4 V)
5
-
-
s
from active level to deep
brownout level
(0 V < VDD(3V3) < 0.9 V)
12
-
-
s
brown-out
shallow
brown-out
deep
External
power supply
BOD trip point
(typical)
2.4 V
> 5 μs
POR trip point
(typical)
0.9 V
0V
> 12 μs
internal reset
time
002aah326
Fig 14. UVLO timing
10.2 Power supply voltage profile
The use of power supply ramp-up and ramp-down procedures outside of the specification
shown in Table 9 results in functional failure of the EM783.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
35 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 9.
Power supply ramp characteristics
Tamb = –40C to 85C. [1]
Symbol
Parameter Conditions
Min
Typ
Max
Unit
-
-
-
-
0
-
-
s
150
-
-
s
Cold power-up (see regions A to C in Figure 15)
wait time
twait
Region A: power-down
[1]
supply voltage = GND
tr
rise time
Region B: ramp up
GND  supply voltage  VDD
wait time
twait
Region C: powered-up
supply voltage = VDD
Shallow power droop cycle (see regions D to G in Figure 15); BOD enabled
fall time
tf
Region D: ramp down
0
-
-
s
5
-
-
s
0
-
-
s
5
-
-
s
12
-
-
s
0
-
-
s
150
-
-
s
-
900
-
mV
VDD  supply voltage > Vth(fast_ramp)
twait
wait time
Region E: power-down
Vth(fast_ramp)  supply voltage <
Vth(UVLO)
tr
rise time
Region F: ramp up
twait
wait time
Region G: powered-up
Vth(fast_ramp)  supply voltage < VDD
supply voltage = VDD
Deep power droop cycle (see regions H to J in Figure 15)
wait time
twait
Region H: power-down
GND < supply voltage < Vth(fast_ramp)
tr
rise time
Region I: ramp up
GND  supply voltage < VDD
wait time
twait
Region J: powered-up
supply voltage = VDD
Voltage thresholds
Vth(droop)
[1]
EM783
Product data sheet
droop
threshold
voltage
Values are derived from simulation.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
36 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
regions A - C
(cold power up)
regions D - G
(shallow power droop cycle)
G:
twait
A
B:
tr
C:
twait
D:
tf
E:
twait
F:
tr
VDD
BOD reset level
supply voltage
on pin VDD
Vth(droop) = 300 mV
GND
H:
twait
I:
tr
regions H - J
(deep power droop cycle)
J:
twait
aaa-009616
Fig 15. Power supply voltage profile
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
37 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
10.3 Flash/EEPROM memory
Table 10. Flash characteristics
Tamb = 40 C to +85 C. Based on JEDEC NVM qualification. Failure rate < 10 ppm for parts as
specified below.
Symbol
Parameter
Conditions
Min
[1]
Nendu
endurance
tret
retention time
ter
erase time
tprog
programming
time
Typ
Max
Unit
10000
100000
-
cycles
powered
10
20
-
years
unpowered
20
40
-
years
sector or multiple
consecutive
sectors
95
100
105
ms
0.95
1
1.05
ms
[2]
[1]
Number of program/erase cycles.
[2]
Programming times are given for writing 256 bytes to the flash. Data must be written to the flash in blocks of
256 bytes. Flash programming is accomplished via IAP calls (see EM783 user manual). Execution time of
IAP calls depends on the system clock and is typically between 1.5 ms and 2 ms per 256 bytes.
Table 11. EEPROM characteristics
Tamb = 40 C to +85 C; VDD(3V3) = 2.6 V to 3.6 V. Based on JEDEC NVM qualification. Failure rate
< 10 ppm for parts as specified below.
Symbol
Parameter
Conditions
Nendu
endurance
tret
retention time
ter
erase time
tprog
programming
time
Min
Typ
Max
Unit
100000
1000000
-
cycles
powered
100
200
-
years
unpowered
150
300
-
years
64 bytes
-
1.8
-
ms
64 bytes
-
1.1
-
ms
10.4 External clock for oscillator in slave mode
Remark: The input voltage on the XTALIN pin must be  1.95 V (see Table 6). For
connecting the oscillator to the XTALIN/XTALOUT pins, see Section 12.1.
Table 12. Dynamic characteristic: external clock (XTALIN or CLKIN pin)
Tamb = 40 C to +85 C; VDD(3V3) over specified ranges.[1]
EM783
Product data sheet
Min
Typ[2]
Max
Unit
oscillator frequency
1
-
25
MHz
tcy(clk)
clock cycle time
40
-
1000
ns
tCHCX
clock HIGH time
tcy(clk)  0.4
-
-
ns
tCLCX
clock LOW time
tcy(clk)  0.4
-
-
ns
tCLCH
clock rise time
-
-
5
ns
tCHCL
clock fall time
-
-
5
ns
Symbol
Parameter
fosc
Conditions
[1]
Parameters are valid over operating temperature range unless otherwise specified.
[2]
Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply
voltages.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
38 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
tCHCL
tCHCX
tCLCH
tCLCX
Tcy(clk)
002aaa907
Fig 16. External clock timing (with an amplitude of at least Vi(RMS) = 200 mV)
10.5 Internal oscillators
Table 13. Dynamic characteristic: IRC
Tamb = 40 C to +85 C; 2.7 V  VDD(3V3)  3.6 V.[1]
Symbol
Parameter
Conditions
fosc(RC)
internal RC oscillator frequency -
Min
Typ[2]
Max
Unit
11.88
12
12.12
MHz
[1]
Parameters are valid over operating temperature range unless otherwise specified.
[2]
Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply
voltages.
aaa-009888
12.15
f
(MHz)
VDD = 3.6 V
3.3 V
3.0 V
2.7 V
12.05
11.95
11.85
-40
-15
10
35
60
85
temperature (°C)
Conditions: Frequency values are typical values. 12 MHz  1 % accuracy is guaranteed for
2.7 V  VDD(3V3)  3.6 V and Tamb = 40 C to +85 C. Variations between parts may cause the
IRC to fall outside the 12 MHz  1 % accuracy specification for voltages below 2.7 V.
Fig 17. Internal IRC frequency vs. temperature
Table 14.
Dynamic characteristics: WDOsc and LFOsc
Min
Typ[1]
Max
Unit
internal oscillator DIVSEL = 0x1F, FREQSEL = 0x1
frequency
in the WDTOSCCTRL register;
[2][3]
-
9.4
-
kHz
DIVSEL = 0x00, FREQSEL = 0xF
in the WDTOSCCTRL register
[2][3]
-
2300
-
kHz
Symbol Parameter
fosc(int)
[1]
EM783
Product data sheet
Conditions
Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply
voltages.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
39 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
[2]
The typical frequency spread over processing and temperature (Tamb = 40 C to +85 C) is  40 %.
[3]
See the EM783 user manual.
10.6 I/O pins
Table 15. Dynamic characteristic: digital I/O pins[1]
Tamb = 40 C to +85 C; 3.0 V  VDD(IO)  3.6 V; load capacitor = 30 pF.
Symbol
Parameter
Conditions
tr
rise time
pin
configured as
output
fall time
tf
Min
Typ
Max
Unit
SSO = 1
[2][3]
2.5
-
5.0
ns
SSO = 6
[2][3]
2.5
-
4.5
ns
SSO = 16
[2][4]
3.0
-
5.0
ns
pin
configured as
output
[2][3]
SSO = 1
2.0
-
4.5
ns
SSO = 6
[2][3]
2.0
-
4.5
ns
SSO = 16
[2][4]
2.5
-
5.0
ns
[1]
Applies to standard port pins and RESET pin. Simulated results.
[2]
SSO indicates maximum number of simultaneously switching digital output pins. The pins are optimized for
half of the maximum SSO.
[3]
Set SLEW bit in the IOCONFIG register to 1.
[4]
Set SLEW bit in the IOCONFIG register to 0.
10.7 I2C-bus
Remark: All I2C modes (Standard-mode, Fast-mode, Fast-mode Plus) can be configured
for the true open-drain pins P0_2 and P0_3. If the limited-performance I2C-bus pins are
used (I2C-bus functions on standard I/O pins), only Standard-mode with internal pull-up
enabled or Fast-mode with external pull-up resistor are supported.
Table 16. Dynamic characteristic: I2C-bus pins[1]
Tamb = 40 C to +85 C.[2]
Symbol
Parameter
Conditions
Min
Max
Unit
fSCL
SCL clock
frequency
Standard-mode
0
100
kHz
Fast-mode
0
400
kHz
tf
[4][5][6][7]
fall time
Fast-mode Plus
0
1
MHz
of both SDA and
SCL signals
-
300
ns
Fast-mode
20 + 0.1  Cb
300
ns
Fast-mode Plus
-
120
ns
4.7
-
s
Standard-mode
tLOW
EM783
Product data sheet
LOW period of
the SCL clock
Standard-mode
Fast-mode
1.3
-
s
Fast-mode Plus
0.5
-
s
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
40 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 16. Dynamic characteristic: I2C-bus pins[1] …continued
Tamb = 40 C to +85 C.[2]
Symbol
Parameter
Conditions
Min
Max
Unit
tHIGH
HIGH period of
the SCL clock
Standard-mode
4.0
-
s
Fast-mode
0.6
-
s
data hold time
tHD;DAT
data set-up
time
tSU;DAT
[1]
[3][4][8]
[9][10]
Fast-mode Plus
0.26
-
s
Standard-mode
0
-
s
Fast-mode
0
-
s
Fast-mode Plus
0
-
s
Standard-mode
250
-
ns
Fast-mode
100
-
ns
Fast-mode Plus
50
-
ns
See the I2C-bus specification UM10204 for details.
[2]
Parameters are valid over operating temperature range unless otherwise specified.
[3]
tHD;DAT is the data hold time that is measured from the falling edge of SCL; applies to data in transmission
and the acknowledge.
[4]
A device must provide an internal hold time of at least 300 ns for the SDA signal (with respect to the
VIH(min) of the SCL signal). The hold time is to bridge the undefined region of the falling edge of SCL.
[5]
Cb = total capacitance of one bus line in pF.
[6]
The maximum tf for the SDA and SCL bus lines is specified at 300 ns. The maximum fall time for the SDA
output stage tf is specified at 250 ns. This allows series protection resistors to be connected in between the
SDA and the SCL pins and the SDA/SCL bus lines without exceeding the maximum specified tf.
[7]
In Fast-mode Plus, fall time is specified the same for both output stage and bus timing. If series resistors
are used, designers should allow for this when considering bus timing.
[8]
The maximum tHD;DAT can be 3.45 s and 0.9 s for Standard-mode and Fast-mode but must be less than
the maximum of tVD;DAT or tVD;ACK by a transition time (see UM10204). This maximum must only be met if
the device does not stretch the LOW period (tLOW) of the SCL signal. If the clock stretches the SCL, the
data must be valid by the set-up time before it releases the clock.
[9]
tSU;DAT is the data set-up time that is measured with respect to the rising edge of SCL. It applies to data in
transmission and the acknowledge.
[10] A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system but the requirement tSU;DAT =
250 ns must then be met. This is automatically the case if the device does not stretch the LOW period of the
SCL signal. If such a device does stretch the LOW period of the SCL signal, it must output the next data bit
to the SDA line tr(max) + tSU;DAT = 1000 + 250 = 1250 ns before the SCL line is released. This is in
accordance with the Standard-mode I2C-bus specification. Also the acknowledge timing must meet this
set-up time.
tf
SDA
tSU;DAT
70 %
30 %
70 %
30 %
tHD;DAT
tf
70 %
30 %
SCL
tVD;DAT
tHIGH
70 %
30 %
70 %
30 %
70 %
30 %
tLOW
S
1 / fSCL
002aaf425
Fig 18. I2C-bus pins clock timing
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
41 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
10.8 SSP interface
Table 17. Dynamic characteristics of SSP pins in SPI mode
2.6 V <= VDD(3V3) = VDD(IO) <= 3.6 V.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
SSP master (in SPI mode)
full-duplex mode
[1]
50
-
-
ns
when only transmitting
[1]
40
-
-
ns
in SPI mode
[2]
15
-
-
ns
in SPI mode
[2]
0
-
-
ns
tv(Q)
data output valid time in SPI mode
[2]
-
-
10
ns
th(Q)
data output hold time in SPI mode
[2]
0
-
-
ns
tcy(clk)
clock cycle time
data set-up time
tDS
data hold time
tDH
SSP slave (in SPI mode)
tcy(PCLK)
PCLK cycle time
20
-
-
ns
tDS
data set-up time
in SPI mode
[3][4]
0
-
-
ns
tDH
data hold time
in SPI mode
[3][4]
3  tcy(PCLK) + 4
-
-
ns
data output valid time in SPI mode
[3][4]
-
-
3  tcy(PCLK) + 11
ns
data output hold time in SPI mode
[3][4]
-
-
2  tcy(PCLK) + 5
ns
tv(Q)
th(Q)
[1]
tcy(clk) = (SSPCLKDIV  (1 + SCR)  CPSDVSR) / fmain. The clock cycle time derived from the SSP bit rate tcy(clk), is a function of the
main clock frequency fmain, the SSP peripheral clock divider (SSPCLKDIV), the SSP SCR parameter (specified in the SSP0CR0
register) and the SSP CPSDVSR parameter (specified in the SSP clock prescale register).
[2]
Tamb = 40 C to +85 C.
[3]
tcy(clk) = 12  tcy(PCLK).
[4]
Tamb = 25 C; for normal voltage supply range: VDD(3V3) = 3.3 V.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
42 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
tcy(clk)
SCK (CPOL = 0)
SCK (CPOL = 1)
tv(Q)
th(Q)
DATA VALID
MOSI
DATA VALID
tDS
DATA VALID
MISO
tDH
DATA VALID
tv(Q)
MOSI
th(Q)
DATA VALID
DATA VALID
tDS
MISO
CPHA = 1
DATA VALID
tDH
CPHA = 0
DATA VALID
aaa-009617
Pin names SCK, MISO, and MOSI refer to pins for SSP peripheral SSP0.
Fig 19. SSP master timing in SPI mode
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
43 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
tcy(clk)
SCK (CPOL = 0)
SCK (CPOL = 1)
tDS
MOSI
DATA VALID
tDH
DATA VALID
tv(Q)
MISO
DATA VALID
DATA VALID
tDS
MOSI
DATA VALID
tDH
DATA VALID
tv(Q)
MISO
DATA VALID
CPHA = 1
th(Q)
CPHA = 0
th(Q)
DATA VALID
aaa-009618
Pin names SCK, MISO, and MOSI refer to pins for SSP peripheral SSP0.
Fig 20. SSP slave timing in SPI mode
11. Characteristics of analog peripherals
Table 18. BOD static characteristics[1]
Tamb = 25 C.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Vth
threshold voltage
interrupt level 2
assertion
-
2.52
-
V
de-assertion
-
2.66
-
V
interrupt level 3
[1]
EM783
Product data sheet
assertion
-
2.80
-
V
de-assertion
-
2.90
-
V
Interrupt levels are selected by writing the level value to the BOD control register BODCTRL, see EM783
User manual.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
44 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 19. DAC static and dynamic characteristics
VDD(3V3) = 2.7 V to 3.6 V; Tamb = 40 C to +85 C unless otherwise specified
Symbol
Parameter
ED
Min
Typ
Max
Unit
differential
linearity error
-
-
1
LSB
EL(adj)
integral
non-linearity
-
-
2
LSB
EO
offset error
-
-
25
mV
EG
gain error
-
-
25
mV
CL
load capacitance
-
-
200
pF
RL
load resistance
1
-
-
k

RO
output resistance
-
< 40
DAC conversion
frequency
-
0.4
1
MHz
ts
settling time
-
-
1
s
VO
output voltage
Output voltage range with
less than 1 LSB deviation;
with minimum RL
connected to ground or
power supply
0.3
-
VDD(3V3) V
 0.3
with minimum RL
connected to ground or
power supply
0.175
-
VDD(3V3) V
 0.175
Measured on typical samples.
Table 20.
DAC sampling frequency range and power consumption
Bias bit
Maximum current
DAC sampling frequency range
0
700 A
0 MHz to 1 MHz
1
350 A
0 MHz to 400 kHz
Table 21.
Internal voltage reference static and dynamic characteristics
Symbol
Parameter
Conditions
output voltage
VO
ts(pu)
Product data sheet
[1]
fc(DAC)
[1]
EM783
Conditions
power-up
settling time
Min
Typ
Max
Unit
Tamb = 40 C to +85 C
[1]
0.855
0.900
0.945
V
Tamb = 70 C to +85 C
[2]
-
0.906
-
V
Tamb = 50 C
[2]
-
0.905
-
V
Tamb = 25 C
[3]
0.893
0.903
0.913
V
Tamb = 0 C
[2]
-
0.902
-
V
Tamb = 20 C
[2]
-
0.899
-
V
Tamb = 40 C
[2]
-
0.896
-
V
up to 90 % of VO
[3]
-
144
195
s
[1]
Characterized through simulation.
[2]
Characterized on a typical silicon sample.
[3]
Measured over process variations.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
45 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
002aag063
910
VO
(mV)
905
900
895
890
-40
-15
10
35
60
85
temperature (°C)
VDD(3V3) = 3.3 V
Fig 21. Typical internal voltage reference output voltage
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
46 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
12. Application information
12.1 XTAL input
The input voltage to the on-chip oscillators is limited to 1.8 V. If a clock in slave mode
drives the oscillator, it is recommended that the input is coupled through a capacitor with
Ci = 100 pF. To limit the input voltage to the specified range, choose an additional
capacitor to ground Cg which attenuates the input voltage by a factor Ci/(Ci + Cg). In slave
mode, a minimum of 200 mV(RMS) is needed.
EMxxx
XTALIN
Ci
100 pF
Cg
aaa-009613
Fig 22. Slave mode operation of the on-chip oscillator
In slave mode, the input clock signal should be coupled using a capacitor of 100 pF
(Figure 22), with an amplitude between 200 mV (RMS) and 1000 mV (RMS). This
corresponds to a square wave signal with a signal swing of between 280 mV and 1.4 V.
The XTALOUT pin in this configuration can be left unconnected.
External components and models used in oscillation mode are shown in Figure 23 and in
Table 22 and Table 23. Since the feedback resistance is integrated on chip, for
fundamental mode oscillation, only connect a crystal and the capacitances CX1 and CX2
externally. L, CL and RS define the fundamental frequency. Capacitance CP in Figure 23
represents the parallel package capacitance and should not be larger than 7 pF.
Parameters FOSC, CL, RS and CP are supplied by the crystal manufacturer (see Table 22).
EMxxx
XTALIN
XTALOUT
L
XTAL
=
CX1
CX2
CL
CP
RS
aaa-009614
Fig 23. Oscillation mode of operation and external crystal model used for CX1/CX2
evaluation
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
47 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Table 22.
Recommended values for CX1/CX2 in oscillation mode (low frequency mode)
Fundamental oscillation frequency XTAL load capacitance Max. XTAL series resistance External load capacitors
FOSC
CL
1 MHz - 5 MHz
5 MHz - 10 MHz
10 MHz - 15 MHz
15 MHz - 20 MHz
Table 23.
RS
CX1
CX2
10 pF
< 300 
18 pF
18 pF
20 pF
< 300 
39 pF
39 pF
30 pF
< 300 
57 pF
57 pF
10 pF
< 300 
18 pF
18 pF
20 pF
< 200 
39 pF
39 pF
30 pF
< 100 
57 pF
57 pF
10 pF
< 160 
18 pF
18 pF
20 pF
< 60 
39 pF
39 pF
10 pF
< 80 
18 pF
18 pF
Recommended values for CX1/CX2 in oscillation mode (high frequency mode)
Fundamental oscillation frequency XTAL load capacitance Max. XTAL series resistance External load capacitors
FOSC
CL
RS
CX1
CX2
15 MHz - 20 MHz
10 pF
< 180 
18 pF
18 pF
20 pF
< 100 
39 pF
39 pF
10 pF
< 160 
18 pF
18 pF
20 pF
< 80 
39 pF
39 pF
20 MHz - 25 MHz
12.2 XTAL Printed-Circuit Board (PCB) layout guidelines
The crystal should be connected on the PCB as close as possible to the oscillator input
and output pins of the chip. Take care that the load capacitors Cx1, Cx2, and Cx3 in case of
third overtone crystal usage have a common ground plane. The external components
must also be connected to the ground plain. To keep the noise coupled in via the PCB as
small as possible, loops must be made as small as possible. Also parasitics should stay
as small as possible. Values of Cx1 and Cx2 should be chosen to accommodate the
increase in parasitics of the PCB layout.
12.3 Standard I/O pad configuration
Figure 24 shows the possible pin modes for standard I/O pins with analog input function:
•
•
•
•
•
•
EM783
Product data sheet
Digital output driver with configurable open-drain output
Digital input: Weak pull-up resistor (PMOS device) enabled/disabled
Digital input: Weak pull-down resistor (NMOS device) enabled/disabled
Digital input: Repeater mode enabled/disabled
Digital input: Input glitch filter selectable on 17 pins
Analog input
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
48 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
VDD
VDD
open-drain enable
pin configured
as digital output
driver
strong
pull-up
output enable
ESD
data output
PIN
strong
pull-down
ESD
VSS
VDD
weak
pull-up
pull-up enable
weak
pull-down
repeater mode
enable
pin configured
as digital input
pull-down enable
data input
10 ns RC
GLITCH FILTER
select data
inverter
select glitch
filter
select analog input
pin configured
as analog input
analog input
002aaf695
Fig 24. Standard I/O pad configuration
12.4 Reset pad configuration
VDD
VDD
VDD
Rpu
reset
ESD
20 ns RC
GLITCH FILTER
PIN
ESD
VSS
002aaf274
Remark: The internal pull-up Rpu is disconnected in Deep-power down mode. To prevent the RESET pin from floating in Deep
power-down mode, an external pull-up resistor should be added.
Fig 25. Reset pad configuration
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
49 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
12.5 UVLO protection and reset timer circuit
VEXT
3.3 V
INTERNAL
REGULATOR
VINT
1.8 V
VEXT
VINT
UVLO
BOD
OR
analog reset
OR
POR
internal reset
VREF
VINT
100 μs RESET
TIMER
POR
external
RESET
002aah324
Fig 26. Functional diagram of the UVLO protection and reset timer circuit
12.6 Guidelines for selecting a power supply filter for UVLO protection
For the UVLO circuits to hold the part in reset during shallow and deep brownout
conditions, the power supply line must be filtered to allow the BOD and POR circuits to
settle when short voltage drops occur (see Section 10.1 “Power supply fluctuations”).
Select the capacitance of the decoupling/bypass capacitor in accordance with the
following guidelines.
C >> IDD  ts/VDD(3V3) with:
•
•
•
•
VDD(3V3)  100 mV for a voltage drop below the BOD and POR trip points.
IDD  3 mA with the IRC running and PLL/SysOsc off (see Figure 6).
ts = 5 s for shallow brownout (see Table 8).
ts = 12 s for deep brownout (see Table 8).
With these parameters, the value of the decoupling/bypass capacitor to be added to the
supply line is:
• C = 0.15 F for shallow brownout.
• C = 0.36 F for deep brownout.
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
50 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
13. Package outline
HVQFN33: plastic thermal enhanced very thin quad flat package; no leads;
33 terminals; body 7 x 7 x 0.85 mm
A
B
D
terminal 1
index area
E
A
A1
c
detail X
e1
e
9
16
C
C A B
C
v
w
b
y
y1 C
L
8
17
e
e2
Eh
33
1
terminal 1
index area
24
32
X
25
Dh
0
2.5
scale
Dimensions
Unit
mm
5 mm
A(1)
A1
b
max 1.00 0.05 0.35
nom 0.85 0.02 0.28
min 0.80 0.00 0.23
c
D(1)
Dh
E(1)
0.2
7.1
7.0
6.9
4.85
4.70
4.55
7.1
7.0
6.9
Eh
e
e1
e2
L
0.75
4.85
4.70 0.65 4.55 4.55 0.60
0.45
4.55
v
0.1
w
y
0.05 0.08
y1
0.1
Note
1. Plastic or metal protrusions of 0.075 mm maximum per side are not included.
Outline
version
References
IEC
JEDEC
JEITA
---
hvqfn33_po
European
projection
Issue date
09-03-17
09-03-23
Fig 27. Package outline HVQFN33
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
51 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
14. Soldering
Footprint information for reflow soldering of HVQFN33 package
OID = 8.20 OA
PID = 7.25 PA+OA
OwDtot = 5.10 OA
evia = 4.25
0.20 SR
chamfer (4×)
W = 0.30 CU
SPD = 1.00 SP
LaE = 7.95 CU
PIE = 7.25 PA+OA
LbE = 5.80 CU
evia = 4.25
evia = 1.05
0.45 DM
SPE = 1.00 SP
GapE = 0.70 SP
4.55 SR
SEhtot = 2.70 SP
EHS = 4.85 CU
OwEtot = 5.10 OA
OIE = 8.20 OA
e = 0.65
0.45 DM
GapD = 0.70 SP
evia = 2.40
B-side
SDhtot = 2.70 SP
4.55 SR
DHS = 4.85 CU
Solder resist
covered via
0.30 PH
LbD = 5.80 CU
0.60 SR cover
LaD = 7.95 CU
0.60 CU
(A-side fully covered)
number of vias: 20
solder land
solder land plus solder paste
solder paste deposit
solder resist
occupied area
Dimensions in mm
Remark:
Stencil thickness: 0.125 mm
001aao134
Fig 28. Reflow soldering of the HVQFN33(7x7) package
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
52 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
15. Abbreviations
Table 24.
Abbreviations
Acronym
Description
AHB
Advanced High-performance Bus
AMBA
Advanced Microcontroller Bus Architecture
APB
Advanced Peripheral Bus
BOD
BrownOut Detection
GPIO
General Purpose Input/Output
I2C
Inter-Integrated Circuit
JEDEC
Joint Electron Devices Engineering Council
NVM
Non-Volatile Memory
PLL
Phase-Locked Loop
SPI
Serial Peripheral Interface
SSI
Serial Synchronous Interface
TTL
Transistor-Transistor Logic
USART
Universal Synchronous/Asynchronous Receiver/Transmitter
UVLO
Under-Voltage Lockout
16. Revision history
Table 25.
Revision history
Document ID
Release date
Data sheet status
Change notice Supersedes
EM783 v.2
20140117
Product data sheet
-
EM783 v.1
EM783 v.1
20131108
Objective data sheet
-
-
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
53 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
17. Legal information
17.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
17.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
17.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information. NXP Semiconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
EM783
Product data sheet
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconductors products in such equipment or
applications and therefore such inclusion and/or use is at the customer’s own
risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications and
products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
54 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It is neither qualified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in automotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automotive specifications and standards, customer
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such automotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconductors for any
liability, damages or failed product claims resulting from customer design and
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
17.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
I2C-bus — logo is a trademark of NXP B.V.
18. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
55 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
19. Tables
Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Ordering information . . . . . . . . . . . . . . . . . . . . .3
Ordering options . . . . . . . . . . . . . . . . . . . . . . . .3
Pin multiplexing . . . . . . . . . . . . . . . . . . . . . . . .5
EM783 pin description . . . . . . . . . . . . . . . . . . .8
Limiting values . . . . . . . . . . . . . . . . . . . . . . . . .25
Static characteristics . . . . . . . . . . . . . . . . . . . .26
Power consumption for individual analog
and digital blocks . . . . . . . . . . . . . . . . . . . . . . .31
POR and BOD circuit settling characteristics . .35
Power supply ramp characteristics . . . . . . . . .36
Flash characteristics . . . . . . . . . . . . . . . . . . . . .38
EEPROM characteristics . . . . . . . . . . . . . . . . .38
Dynamic characteristic: external clock
(XTALIN or CLKIN pin) . . . . . . . . . . . . . . . . . .38
Dynamic characteristic: IRC . . . . . . . . . . . . . . .39
Dynamic characteristics: WDOsc and LFOsc. .39
Table 15. Dynamic characteristic: digital I/O pins[1] . . . . . 40
Table 16. Dynamic characteristic: I2C-bus pins[1] . . . . . . 40
Table 17. Dynamic characteristics of SSP pins in
SPI mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Table 18. BOD static characteristics[1] . . . . . . . . . . . . . . . 44
Table 19. DAC static and dynamic characteristics . . . . . 45
Table 20. DAC sampling frequency range and power
consumption. . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Table 21. Internal voltage reference static and dynamic
characteristics . . . . . . . . . . . . . . . . . . . . . . . . . 45
Table 22. Recommended values for CX1/CX2 in oscillation
mode (low frequency mode) . . . . . . . . . . . . . . 48
Table 23. Recommended values for CX1/CX2 in oscillation
mode (high frequency mode) . . . . . . . . . . . . . . 48
Table 24. Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 25. Revision history . . . . . . . . . . . . . . . . . . . . . . . . 53
20. Figures
Fig 1.
Fig 2.
Fig 3.
Fig 4.
Fig 5.
Fig 6.
Fig 7.
Fig 8.
Fig 9.
Fig 10.
Fig 11.
Fig 12.
Fig 13.
Fig 14.
Fig 15.
Fig 16.
Fig 17.
Fig 18.
Fig 19.
Fig 20.
Fig 21.
EM783 block diagram . . . . . . . . . . . . . . . . . . . . . .4
Pin configuration HVQFN33 package . . . . . . . . . .5
EM783 memory map . . . . . . . . . . . . . . . . . . . . . .14
EM783 clock generation block diagram . . . . . . . .21
Active mode: Typical supply current IDD versus
temperature for different system clock frequencies
(all peripherals disabled) . . . . . . . . . . . . . . . . . . .29
Active mode: Typical supply current IDD versus
temperature for different system clock frequencies
(all peripherals enabled) . . . . . . . . . . . . . . . . . . .30
Sleep mode: Typical supply current IDDversus
temperature for different system clock frequencies
(all peripherals disabled) . . . . . . . . . . . . . . . . . . .30
High-current source output driver: Typical
HIGH-level output voltage VOH versus
HIGH-level output current IOH . . . . . . . . . . . . . . .31
High-current sink pins: Typical LOW-level output
current IOL versus LOW-level output voltage
VOL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .32
Typical LOW-level output current IOL versus
LOW-level output voltage VOL . . . . . . . . . . . . . . .32
Typical HIGH-level output voltage VOH versus
HIGH-level output source current IOH . . . . . . . . .33
Typical pull-up current Ipu versus input voltage
VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33
Typical pull-down current Ipd versus input
voltage VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .34
UVLO timing . . . . . . . . . . . . . . . . . . . . . . . . . . . .35
Power supply voltage profile . . . . . . . . . . . . . . . .37
External clock timing (with an amplitude
of at least Vi(RMS) = 200 mV) . . . . . . . . . . . . . . . .39
Internal IRC frequency vs. temperature . . . . . . . .39
I2C-bus pins clock timing . . . . . . . . . . . . . . . . . . .41
SSP master timing in SPI mode. . . . . . . . . . . . . .43
SSP slave timing in SPI mode . . . . . . . . . . . . . . .44
Typical internal voltage reference output voltage.46
EM783
Product data sheet
Fig 22. Slave mode operation of the on-chip oscillator . . 47
Fig 23. Oscillation mode of operation and external crystal
model used for CX1/CX2 evaluation . . . . . . . . . . . 47
Fig 24. Standard I/O pad configuration . . . . . . . . . . . . . . 49
Fig 25. Reset pad configuration . . . . . . . . . . . . . . . . . . . 49
Fig 26. Functional diagram of the UVLO protection and
reset timer circuit. . . . . . . . . . . . . . . . . . . . . . . . . 50
Fig 27. Package outline HVQFN33 . . . . . . . . . . . . . . . . . 51
Fig 28. Reflow soldering of the HVQFN33(7x7) package 52
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
56 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
21. Contents
1
2
3
4
4.1
5
6
6.1
6.2
7
7.1
7.2
7.3
7.4
7.5
7.6
7.6.1
7.6.2
7.7
7.8
7.8.1
7.9
7.9.1
7.10
7.10.1
7.11
7.11.1
7.12
7.12.1
7.13
7.13.1
7.14
7.15
General description . . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Ordering information . . . . . . . . . . . . . . . . . . . . . 3
Ordering options . . . . . . . . . . . . . . . . . . . . . . . . 3
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Pinning information . . . . . . . . . . . . . . . . . . . . . . 5
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 5
Functional description . . . . . . . . . . . . . . . . . . 13
ARM Cortex-M0 processor . . . . . . . . . . . . . . . 13
On-chip flash program memory . . . . . . . . . . . 13
On-chip EEPROM data memory. . . . . . . . . . . 13
On-chip SRAM . . . . . . . . . . . . . . . . . . . . . . . . 13
Memory map. . . . . . . . . . . . . . . . . . . . . . . . . . 13
Nested Vectored Interrupt Controller (NVIC) . 14
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Interrupt sources. . . . . . . . . . . . . . . . . . . . . . . 15
IOCONFIG block . . . . . . . . . . . . . . . . . . . . . . 15
Fast general-purpose parallel I/O . . . . . . . . . . 15
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
USART . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
SSP serial I/O controller . . . . . . . . . . . . . . . . . 16
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
I2C-bus serial I/O controller . . . . . . . . . . . . . . 17
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Metrology engine . . . . . . . . . . . . . . . . . . . . . . 17
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
10-bit DAC . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Internal voltage reference . . . . . . . . . . . . . . . . 19
General-purpose external event
counter/timers . . . . . . . . . . . . . . . . . . . . . . . . . 19
7.15.1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
7.16
System tick timer . . . . . . . . . . . . . . . . . . . . . . 19
7.17
Windowed WatchDog Timer (WWDT) . . . . . . 19
7.17.1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
7.18
Clocking and power control . . . . . . . . . . . . . . 20
7.18.1
Crystal and internal oscillators . . . . . . . . . . . . 20
7.18.1.1 Internal RC Oscillator (IRC) . . . . . . . . . . . . . . 21
7.18.1.2 Crystal Oscillator (SysOsc). . . . . . . . . . . . . . . 21
7.18.1.3 Internal Low-Frequency Oscillator (LFOsc) and
WatchDog Oscillator (WDOsc) . . . . . . . . . . . . 22
7.18.2
Clock input . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
7.18.3
System PLL . . . . . . . . . . . . . . . . . . . . . . . . . . 22
7.18.4
Clock output . . . . . . . . . . . . . . . . . . . . . . . . . . 22
7.18.5
Wake-up process . . . . . . . . . . . . . . . . . . . . . . 22
7.18.6
Power control . . . . . . . . . . . . . . . . . . . . . . . . . 22
7.18.6.1 Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . 22
7.18.6.2 Power profiles . . . . . . . . . . . . . . . . . . . . . . . . 23
7.19
System control . . . . . . . . . . . . . . . . . . . . . . . . 23
7.19.1
UnderVoltage LockOut (UVLO) protection . . . 23
7.19.2
Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
7.19.3
Brownout detection . . . . . . . . . . . . . . . . . . . . 24
7.19.4
Code security (Code Read Protection - CRP) 24
7.19.5
APB interface . . . . . . . . . . . . . . . . . . . . . . . . . 24
7.19.6
AHBLite . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
7.19.7
External interrupt inputs . . . . . . . . . . . . . . . . . 24
7.20
Emulation and debugging . . . . . . . . . . . . . . . 25
8
Limiting values . . . . . . . . . . . . . . . . . . . . . . . . 25
9
Static characteristics . . . . . . . . . . . . . . . . . . . 26
9.1
Power consumption . . . . . . . . . . . . . . . . . . . 29
9.2
Peripheral power consumption . . . . . . . . . . . 31
9.3
Electrical pin characteristics. . . . . . . . . . . . . . 31
10
Dynamic characteristics. . . . . . . . . . . . . . . . . 35
10.1
Power supply fluctuations . . . . . . . . . . . . . . . 35
10.2
Power supply voltage profile . . . . . . . . . . . . . 35
10.3
Flash/EEPROM memory . . . . . . . . . . . . . . . . 38
10.4
External clock for oscillator in slave mode . . . 38
10.5
Internal oscillators . . . . . . . . . . . . . . . . . . . . . 39
10.6
I/O pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
10.7
I2C-bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
10.8
SSP interface . . . . . . . . . . . . . . . . . . . . . . . . . 42
11
Characteristics of analog peripherals. . . . . . 44
12
Application information . . . . . . . . . . . . . . . . . 47
12.1
XTAL input . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
12.2
XTAL Printed-Circuit Board (PCB) layout
guidelines. . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
12.3
Standard I/O pad configuration . . . . . . . . . . . 48
12.4
Reset pad configuration . . . . . . . . . . . . . . . . . 49
12.5
UVLO protection and reset timer circuit . . . . . 50
12.6
Guidelines for selecting a power supply filter for
UVLO protection . . . . . . . . . . . . . . . . . . . . . . 50
13
Package outline. . . . . . . . . . . . . . . . . . . . . . . . 51
14
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
15
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . 53
16
Revision history . . . . . . . . . . . . . . . . . . . . . . . 53
17
Legal information . . . . . . . . . . . . . . . . . . . . . . 54
17.1
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 54
17.2
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
17.3
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . 54
17.4
Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 55
continued >>
EM783
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 17 January 2014
© NXP B.V. 2014. All rights reserved.
57 of 58
EM783
NXP Semiconductors
Energy metering IC; 32 kB flash, 8 kB SRAM, 4 kB EEPROM
18
19
20
21
Contact information. . . . . . . . . . . . . . . . . . . . .
Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
55
56
56
57
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2014.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 17 January 2014
Document identifier: EM783
Similar pages