Hex D Master-Slave Flip-Flop With Reset

MC10186
Hex D Master-Slave
Flip-Flop with Reset
The MC10186 contains six high–speed, master slave type “D”
flip–flops. Clocking is common to all six flip–flops. Data is entered
into the master when the clock is low. Master to slave data transfer
takes place on the positive–going Clock transition. Thus, outputs may
change only on a positive–going Clock transition. A change in the
information present at the data (D) input will not affect the output
information any other time due to the master–slave construction of this
device. A COMMON RESET IS INCLUDED IN THIS CIRCUIT.
RESET ONLY FUNCTIONS WHEN CLOCK IS LOW.
• PD = 460 mW typ/pkg (No Load)
• ftoggle = 150 MHz (typ)
• tr, tf = 2.0 ns typ (20%–80%)
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MARKING
DIAGRAMS
16
CDIP–16
L SUFFIX
CASE 620
MC10186L
AWLYYWW
1
16
PDIP–16
P SUFFIX
CASE 648
LOGIC DIAGRAM
MC10186P
AWLYYWW
1
5
D0
D1
2
3
6
D2
4
7
1
Q0
PLCC–20
FN SUFFIX
CASE 775
Q1
A
WL
YY
WW
Q2
10186
AWLYYWW
= Assembly Location
= Wafer Lot
= Year
= Work Week
DIP PIN ASSIGNMENT
13 Q3
D3 10
D4
RESET
1
16
VCC
Q0
2
15
Q5
Q1
3
14
Q4
Q2
4
13
Q3
D0
5
12
D5
15 Q5
D1
6
11
D4
VCC = PIN 16
VEE = PIN 8
D2
7
10
D3
VEE
8
9
CLOCK
14 Q4
11
D5 12
CLOCK 9
RESET 1
CLOCKED TRUTH TABLE
R
C
D
Qn + 1
L
L
X
Qn
L
H*
L
L
L
H*
H
H
H
L
X
L
Pin assignment is for Dual–in–Line Package.
For PLCC pin assignment, see the Pin Conversion Tables
on page 18 of the ON Semiconductor MECL Data Book
(DL122/D).
ORDERING INFORMATION
Device
*A clock H is a clock transition
from a low to a high state.
 Semiconductor Components Industries, LLC, 2002
January, 2002 – Rev. 7
1
Package
Shipping
MC10186L
CDIP–16
25 Units / Rail
MC10186P
PDIP–16
25 Units / Rail
MC10186FN
PLCC–20
46 Units / Rail
Publication Order Number:
MC10186/D
MC10186
ELECTRICAL CHARACTERISTICS
Test Limits
Characteristic
Symbol
Pin
Under
Test
Power Supply Drain Current
IE
8
121
IinH
5
9
1
350
495
920
Input Current
–30°C
Min
+25°C
Max
Min
+85°C
Typ
Max
Max
Unit
88
110
121
mAdc
220
310
575
220
310
575
µAdc
0.5
Min
µAdc
IinL
5
0.5
Output Voltage
Logic 1
VOH
2
15
–1.060
–1.060
–0.890
–0.890
–0.960
–0.960
–0.810
–0.810
–0.890
–0.890
0.3
–0.700
–0.700
Vdc
Output Voltage
Logic 0
VOL
2
15
–1.890
–1.890
–1.675
–1.675
–1.850
–1.850
–1.650
–1.650
–1.825
–1.825
–1.615
–1.615
Vdc
Threshold Voltage
Logic 1
VOHA
2
15
–1.080
–1.080
Threshold Voltage
Logic 0
VOLA
2
15
t1+3–
t1+4–
t9+2+
t9+2–
3
4
2
2
1.6
1.6
1.6
1.6
4.6
4.6
4.6
4.6
1.6
1.6
1.6
1.6
2.5
2.5
3.5
3.5
4.5
4.5
4.5
4.5
1.6
1.6
1.6
1.6
5.0
5.0
5.0
5.0
–0.980
–0.980
–0.910
–0.910
–1.655
–1.655
–1.630
–1.630
Vdc
–1.595
–1.595
Switching Times (50Ω Load)
Propagation Delay
Vdc
ns
Rise Time
(20 to 80%)
t2+
2
1.0
4.1
1.1
1.8
4.0
1.1
4.4
Fall Time
(20 to 80%)
t2–
2
1.0
4.1
1.1
1.8
4.0
1.1
4.4
Setup Time
tsetup
2
2.5
2.5
2.5
2.5
ns
Hold Time
thold
2
1.5
1.5
–1.5
1.5
ns
Toggle Frequency (Max)
ftog
2
125
125
150
125
MHz
Output level to be measured after clock pulse.
VIL
VIH appears at clock input (Pin 9).
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2
MC10186
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
Characteristic
Power Supply Drain Current
Input Current
@ Test Temperature
VIHmax
VILmin
VIHAmin
VILAmax
VEE
–30°C
–0.890
–1.890
–1.205
–1.500
–5.2
+25°C
–0.810
–1.850
–1.105
–1.475
–5.2
+85°C
–0.700
–1.825
–1.035
–1.440
–5.2
Symbol
Pin
Under
Test
IE
8
IinH
5
9
1
IinL
5
VOH
2
15
Output Voltage
Logic 0
VOL
2
15
Threshold Voltage
Logic 1
VOHA
2
15
Threshold Voltage
Logic 0
VOLA
2
15
Propagation Delay
3
4
2
2
VEE
(VCC)
Gnd
8
16
8
8
8
16
16
16
8
16
8
8
16
16
8
8
16
16
8
8
16
16
5
12
8
8
16
16
Pulse In
Pulse Out
–3.2 V
+2.0 V
1, 9
1, 9
5, 9
5, 9
3
4
2
2
8
8
8
8
16
16
16
16
VIHAmin
VILAmax
5
12
5
12
5
12
+1.11Vdc
t1+3–
t1+4–
t9+2+
t9+2–
VILmin
5
Logic 1
(50Ω Load)
VIHmax
5
9
1
Output Voltage
Switching Times
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
+0.31V
6
7
Rise Time
(20 to 80%)
t2+
2
5, 9
2
8
16
Fall Time
(20 to 80%)
t2–
2
5, 9
2
8
16
Setup Time
tsetup
2
5, 9
2
8
16
Hold Time
thold
2
5, 9
2
8
16
Toggle Frequency (Max)
ftog
2
8
16
Output level to be measured after clock pulse.
VIL
VIH appears at clock input (Pin 9).
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
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3
MC10186
PACKAGE DIMENSIONS
PLCC–20
FN SUFFIX
PLASTIC PLCC PACKAGE
CASE 775–02
ISSUE C
0.007 (0.180)
B
Y BRK
–N–
M
T L-M
0.007 (0.180)
U
M
N
S
T L-M
S
G1
0.010 (0.250)
S
N
S
D
–L–
–M–
Z
W
20
D
1
X
V
S
T L-M
S
N
S
VIEW D–D
A
0.007 (0.180)
M
T L-M
S
N
S
R
0.007 (0.180)
M
T L-M
S
N
S
Z
0.007 (0.180)
H
M
T L-M
S
N
S
K1
K
C
E
F
0.004 (0.100)
G
J
–T–
VIEW S
G1
0.010 (0.250) S T L-M
S
N
S
0.007 (0.180)
M
T L-M
S
VIEW S
SEATING
PLANE
NOTES:
1. DATUMS -L-, -M-, AND -N- DETERMINED
WHERE TOP OF LEAD SHOULDER EXITS PLASTIC
BODY AT MOLD PARTING LINE.
2. DIMENSION G1, TRUE POSITION TO BE
MEASURED AT DATUM -T-, SEATING PLANE.
3. DIMENSIONS R AND U DO NOT INCLUDE MOLD
FLASH. ALLOWABLE MOLD FLASH IS 0.010 (0.250)
PER SIDE.
4. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
5. CONTROLLING DIMENSION: INCH.
6. THE PACKAGE TOP MAY BE SMALLER THAN THE
PACKAGE BOTTOM BY UP TO 0.012 (0.300).
DIMENSIONS R AND U ARE DETERMINED AT THE
OUTERMOST EXTREMES OF THE PLASTIC BODY
EXCLUSIVE OF MOLD FLASH, TIE BAR BURRS,
GATE BURRS AND INTERLEAD FLASH, BUT
INCLUDING ANY MISMATCH BETWEEN THE TOP
AND BOTTOM OF THE PLASTIC BODY.
7. DIMENSION H DOES NOT INCLUDE DAMBAR
PROTRUSION OR INTRUSION. THE DAMBAR
PROTRUSION(S) SHALL NOT CAUSE THE H
DIMENSION TO BE GREATER THAN 0.037 (0.940).
THE DAMBAR INTRUSION(S) SHALL NOT CAUSE
THE H DIMENSION TO BE SMALLER THAN 0.025
(0.635).
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4
DIM
A
B
C
E
F
G
H
J
K
R
U
V
W
X
Y
Z
G1
K1
INCHES
MIN
MAX
0.385
0.395
0.385
0.395
0.165
0.180
0.090
0.110
0.013
0.019
0.050 BSC
0.026
0.032
0.020
--0.025
--0.350
0.356
0.350
0.356
0.042
0.048
0.042
0.048
0.042
0.056
--0.020
2
10 0.310
0.330
0.040
---
MILLIMETERS
MIN
MAX
9.78
10.03
9.78
10.03
4.20
4.57
2.29
2.79
0.33
0.48
1.27 BSC
0.66
0.81
0.51
--0.64
--8.89
9.04
8.89
9.04
1.07
1.21
1.07
1.21
1.07
1.42
--0.50
2
10 7.88
8.38
1.02
---
N
S
MC10186
PACKAGE DIMENSIONS
–A–
16
9
1
8
–B–
CDIP–16
L SUFFIX
CERAMIC DIP PACKAGE
CASE 620–10
ISSUE T
C
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4. DIMENSION F MAY NARROW TO 0.76 (0.030)
WHERE THE LEAD ENTERS THE CERAMIC
BODY.
L
DIM
A
B
C
D
E
F
G
H
K
L
M
N
–T–
K
N
SEATING
PLANE
M
E
F
J
G
D
16 PL
0.25 (0.010)
16 PL
0.25 (0.010)
M
T A
T B
M
S
PDIP–16
P SUFFIX
PLASTIC DIP PACKAGE
CASE 648–08
ISSUE R
–A–
16
9
1
8
B
F
C
L
S
–T–
SEATING
PLANE
K
H
G
D
M
J
16 PL
0.25 (0.010)
M
S
T A
M
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5
INCHES
MIN
MAX
0.750
0.785
0.240
0.295
--0.200
0.015
0.020
0.050 BSC
0.055
0.065
0.100 BSC
0.008
0.015
0.125
0.170
0.300 BSC
0
15 0.020
0.040
MILLIMETERS
MIN
MAX
19.05
19.93
6.10
7.49
--5.08
0.39
0.50
1.27 BSC
1.40
1.65
2.54 BSC
0.21
0.38
3.18
4.31
7.62 BSC
0
15 0.51
1.01
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEADS WHEN
FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD FLASH.
5. ROUNDED CORNERS OPTIONAL.
DIM
A
B
C
D
F
G
H
J
K
L
M
S
INCHES
MIN
MAX
0.740
0.770
0.250
0.270
0.145
0.175
0.015
0.021
0.040
0.70
0.100 BSC
0.050 BSC
0.008
0.015
0.110
0.130
0.295
0.305
0
10 0.020
0.040
MILLIMETERS
MIN
MAX
18.80
19.55
6.35
6.85
3.69
4.44
0.39
0.53
1.02
1.77
2.54 BSC
1.27 BSC
0.21
0.38
2.80
3.30
7.50
7.74
0
10 0.51
1.01
MC10186
Notes
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6
MC10186
Notes
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7
MC10186
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are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular
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including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
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MC10186/D