MMA62XXAKEG, Analog Dual Axis Micromachined Accelerometer

MMA6222AKEG
Rev 0, 12/2009
Freescale Semiconductor
Technical Data
Analog Dual Axis Micromachined
Accelerometer
MMA6222AKEG
MMA6255AKEG
MMA621010AKEG
The MMA62XXAKEG series of dual axis (X and Y) silicon capacitive,
micromachined accelerometers features a full digital signal processing for
filtering, trim and data formatting. It has been optimized for analog output and
offers an over-damped transducer.
2-AXIS
ACCELEROMETER
Features
•
Available in ±20/20g, ±50/50g, or ±100/100g versions. Additional g-ranges
between 20 and 100g may be available upon request
•
Full-scale range is independently specified for each axis
•
400 Hz, 4 Pole, 16 µs sample time, additional filter options are available
•
Ratiometric analog voltage output
•
Capture/hold input for system-wide synchronization support
•
3.3 or 5 V single supply operation
•
On-chip temperature sensor and voltage regulator
•
Internal self-test
•
Minimal external component requirements
•
Pb-free 20-pin SOIC package
•
KEG SUFFIX (Pb-free)
20-LEAD SOIC
CASE 475A-02
PIN CONNECTIONS
Qualified AEC-Q100, Rev. F Grade 2 (-40°C/ +105°C)
Typical Applications
•
Crash Detection (Airbag)
•
Impact and vibration monitoring
•
N/C
1
20
N/C
N/C
2
19
N/C
XOUT
3
18
CREGA
VSSA
4
17
CREGA
YOUT
5
16
CREF
CAP/HOLD
6
15
CREF
Shock detection
ST
7
14
VCC
VPP
8
13
VSS
CREG
9
12
STATUS
10
11
SCLK
RESET
20-PIN SOIC PACKAGE
N/C: NO INTERNAL CONNECTION
ORDERING INFORMATION
X-Axis g-Level
Y-Axis g-Level
Temperature Range
Package
Packaging
MMA6222AEG
Device Name
20
20
-40 to +105°C
475A-02
Tubes
MMA6222AEGR2
20
20
-40 to +105°C
475A-02
Tape & Reel
MMA6222AKEG*
20
20
-40 to +105°C
475A-02
Tubes
MMA6222AKEGR2*
20
20
-40 to +105°C
475A-02
Tape & Reel
MMA6255AEG
50
50
-40 to +105°C
475A-02
Tubes
MMA6255AEGR2
50
50
-40 to +105°C
475A-02
Tape & Reel
MMA6255AKEG*
50
50
-40 to +105°C
475A-02
Tubes
MMA6255AKEGR2*
50
50
-40 to +105°C
475A-02
Tape & Reel
MMA621010AEG
100
100
-40 to +105°C
475A-02
Tubes
MMA621010AEGR2
100
100
-40 to +105°C
475A-02
Tape & Reel
MMA621010AKEG*
100
100
-40 to +105°C
475A-02
Tubes
MMA621010AKEGR2*
100
100
-40 to +105°C
475A-02
Tape & Reel
*Part number sourced from a different facility.
© Freescale Semiconductor, Inc., 2009. All rights reserved.
VCC
VCC
CREG
CREGA
CREF
100 nF
1 μF
1 μF
100 nF
CS_A
CS_D
SCLK1
SCLK2
SCLK
ST
I/O
MOSI2
DI
STATUS
I/O
MISO2
DO
CS
SCLK
MMA62XXAKEG
VSSA
XOUT
VSS
YOUT
CS
Main MCU
Deployment IC
ADC
VPP/TEST
Safing
Sensor(s)
Filter
/
Comparator
DEPLOY_EN1
DEPLOY_EN2
Note: If one axis of the MMA62XXAKEG sensor is expected to be used as a confirmation of the other axis, Freescale
recommends that MMA62XXAKEG used in conjunction with an additional sensing/safing device for each axis.
Figure 1-1 Simplified Airbag Application Diagram
1.1
INTRODUCTION
The MMA62XXKEG is trimmed to provide the most accurate voltage representation of acceleration at XOUT and YOUT. This is
done by adjusting the signal within the DSP to compensate for errors within the digital-to-analog converters. The SPI is disabled
when the device is in normal operating mode, and dedicated ST (self-test activation) and STATUS pin functions are assigned.
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1.2
BLOCK DIAGRAM
A block diagram illustrating the major components of the design is shown in Figure 1-2.
VPP
UNIT
PROGRAMMABLE
DATA ARRAY
VCC
CREG
CREGA
VOLTAGE
REGULATOR
CREGA
REFERENCE
OSCILLATOR
CLOCK
MONITOR
PRIMARY
OSCILLATOR
INTERNAL
CLOCK
CREF
CREF
ST
STATUS
VSS
SCLK
CONTROL
LOGIC
VSSA
RESET
CAP/HOLD
g-CELL
(Y)
SD
CONVERTER
CONTROL
IN
SINC
FILTER
STATUS
OUT
DIGITAL
OUT
Y IN
TEMP.
SENSOR
SELF-TEST
INTERFACE
TEMP
DSP
(SEE FIGURE 1-2)
Y OUT
DAC
YOUT
X OUT
DAC
XOUT
X IN
g-CELL
(X)
SD
CONVERTER
SINC
FILTER
Figure 1-2 MMA62XXAKEG Block Diagram
CONTROL
IN
DSP
CONTROL
OUT
OFFSET
MONITOR
Y IN
LOW-PASS
FILTER
X IN
OFFSET,
GAIN,
LINEARITY
ADJUST
OUTPUT
SCALING
TO Y DAC
TO X DAC
TEMP
Figure 1-3 MMA62XXAKEG DSP Block Diagram
NOTE: Models of signal chain are available upon request
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Freescale Semiconductor
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1.3
PIN FUNCTIONS
The pinout for the MMA62XXAKEG device is illustrated in Figure 1-4. Pin functions are described below. When self-test is active,
the output becomes more positive in both axes if ST1 is cleared, or more negative in both axes if ST1 is set.
N/C
1
20
N/C
N/C
2
19
N/C
XOUT
3
18
CREGA
VSSA
4
17
CREGA
YOUT
5
16
CREF
CAP/HOLD
6
15
CREF
ST
7
14
VCC
VPP
8
13
VSS
CREG
9
12
STATUS
10
11
SCLK
RESET
20-PIN SOIC PACKAGE
N/C: NO INTERNAL CONNECTION
X: +1g
Y: 0g
X: 0g
Y: +1g
X: 0g
Y: -1g
TO CENTER OF
GRAVITATION FIELD
X: -1g
Y: 0g
Response to static orientation within 1g field.
Figure 1-4 MMA62XXAKEG Pinout
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Freescale Semiconductor
1.4
1.4.1
PIN FUNCTION DESCRIPTIONS
VCC
This pin supplies power to the device. Careful printed wiring board layout and capacitor placement is critical to ensure best performance. An external bypass capacitor between this pin and VSS is required, as described in Section 1.5.
1.4.2
VSS
This pin is the power supply return node for the digital circuitry on the MMA62XXKEG device.
1.4.3
VSSA
This pin is the power supply return node for analog circuitry on the MMA62XXAKEG device. An external bypass capacitor between this pin and VCC is required, as described in Section 1.5.
1.4.4
CREG
This pin is connected to the internal digital circuitry power supply rail. An external filter capacitor must be connected between this
pin and VSS, as described in Section 1.5.
1.4.5
CREGA
These pins are connected in parallel to the internal analog circuitry power supply rail. One or two external filter capacitors must
be connected between these pins and VSSA, as described in Section 1.5. Two pins are provided to support redundant connection
to the printed wiring board assembly. Redundant external capacitors may be connected to these pins for maximum reliability, as
described in Section 1.5.
1.4.6
CREF
These pins are connected in parallel to an internal reference voltage node utilized by the analog circuitry. One or two external
filter capacitors must be connected between these pins and VSSA, as described shown in Section 1.5. Two pins are provided to
support redundant connection to the printed wiring board assembly. Redundant external capacitors may be connected to these
pins for maximum reliability, as described in Section 1.5.
1.4.7
VPP
This pin should be tied directly to VSS.
1.4.8
SCLK
This input may be left unconnected unless it is desired to initiate device reset as described in Section 1.4.9.
1.4.9
RESET
This pin may be used to initiate a hardware reset. If RESET is held low and SCLK is held high for 512 μs, the internal reset signal
is asserted.
An internal pull-up device is connected to this pin.
1.4.10
STATUS
This pin provides an indicator of internal status. The STATUS output will be driven to a logic high level should any of the following
fault conditions be detected:
• Internal parity fault
• Over-temperature condition
• Internal clock frequency fault
• Device reset
• Device initialization
Immediately following device reset, STATUS is placed in a high impedance state for approximately 800 μs. At the end of this time,
STATUS is driven high and a 3ms stabilization delay required by the internal circuitry begins. The STATUS condition may not be
cleared during the stabilization delay. Reset is reported by the device so the system can be aware of potential difficulties if unexpected resets occur.
Once asserted, the STATUS output will remain high until the ST pin is driven from a logic low to a logic high state. If a fault condition persists, the STATUS output will be driven high again as soon as it is cleared.
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Freescale Semiconductor
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1.4.11
ST
This pin performs a dual function. When driven to a logic high level, the internal self-test voltage generator is activated. A low-tohigh transition on this pin will clear the internal STATUS latch. Note that under certain fault conditions, the STATUS latch will be
immediately reset, indicating a terminal fault condition.
A diagram illustrating operation of the STATUS latch following device initialization is illustrated in Figure 1-5.
SELF TEST ENABLE
ST
VDD
D
STATUS
Q
R
FAULT DETECT
Figure 1-5 ST and STATUS Interaction
1.4.12
CAP/HOLD
When this input pin is low, acceleration data is updated by the DSP whenever a data sample becomes available. Upon a low-tohigh transition of CAP/HOLD acceleration data is frozen. Acceleration data is not updated as long as the pin remains at a logic
‘1’ level. This pin may be tied directly to VSS if the hold function is not desired.
1.4.13
XOUT, YOUT
Two digital-to-analog converters (DACs) are provided. These converters translate output of the DSP block into voltage levels proportional to the magnitude of the numerical result and ratiometric to VCC.
1.5
EXTERNAL COMPONENTS
The connections illustrated in Figure 1-1 are recommended. Careful printed wiring board layout and component placement is essential for best performance. Low ESR capacitors must be connected to CREG and CREGA pins for the best performance. A
grounded land area with solder mask should be placed under the package for improved shielding of the device from external
effects. If a land area is not provided, no signals should be routed beneath the package. See Figure 1-1.
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SECTION 2 PERFORMANCE SPECIFICATION
2.1
MAXIMUM RATINGS
Maximum ratings are the extreme limits to which the device can be exposed without permanently damaging it. The device contains circuitry to protect the inputs against damage from high static voltages; however, do not apply voltages higher than those
shown in the table below. Keep input and output voltages within the range VSS ≤ V ≤ VCC.
Ref
Rating
Symbol
Value
Unit
1 Supply Voltage
VCC
-0.3 to +7
V
(1)
2 CREG, CREGA, CREF
VREG
-0.3 to +3
V
(1)
3 VPP
VREG
-0.3 to +11
V
(1)
4 SCLK, ST, CAP/HOLD
VIN
-0.3 to VCC + 0.3
V
(1)
5 STATUS (high impedance state)
VIN
-0.3 to VCC + 0.3
V
(1)
VDAC
-0.3 to VCC + 0.3
V
(1)
I
10
mA
(1)
8 Acceleration (without hitting internal g-cell stops)
gmax
±800
g
(1)
9 Powered Shock (six sides, 0.5 ms duration)
gpms
±1500
g
(1)
10 Unpowered Shock (six sides, 0.5 ms duration)
gshock
±2000
g
(1)
11 Drop Shock (to concrete surface)
hDROP
1.2
m
(1)
VESD
VESD
VESD
±2000
±500
±200
V
V
V
(1)
(1)
(1)
Tstg
-40 to +125
°C
(1)
6 XOUT, YOUT (DACEN = 0)
7 Current Drain per Pin Excluding VCC and VSS
12
13
14
Electrostatic Discharge
Human Body Model (HBM)
Charge Device Model (CDM)
Machine Model (MM)
15 Storage Temperature Range
Notes:
1. Verified by characterization, not tested in production.
2.2
OPERATING RANGE
The operating ratings are the limits normally expected in the application and define the range of operation.
Ref
Characteristic
Supply Voltage
Standard Operating Voltage, 3.3V operating range
16
Standard Operating Voltage, 5V operating range
17
Symbol
Min
Typ
Max
Units
VCC
VCC
VL
+3.15
+4.75
+3.3
+5.0
VH
+3.45
+5.25
V
V
(1)
(1)
TA
TL
-40
⎯
TH
+105
C
(2)
Operating Temperature Range
18
Notes:
1. Characterized at all values of VL and VH. Production test is conducted at typical voltage unless otherwise noted.
2. Parameters tested 100% at final test.
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2.3
ELECTRICAL CHARACTERISTICS
VL ≤ (VCC - VSS) ≤ VH, TL ≤ TA ≤ TH, |ΔTA| < 4 K/min unless otherwise specified
Ref
Characteristic
Symbol
Min
Typ
Max
Units
⎯
9.0
mA
(1)
19
Supply Current Drain
Analog-only output configuration
20
21
22
23
Power-On Recovery Threshold (See Figure 2-1)
VCC
CREG
CREGA
CREF
VPOR_N
VPOR_N
VPOR_N
VPOR_N
2.77
1.80
2.18
1.11
⎯
⎯
⎯
⎯
3.15
2.32
2.50
1.29
V
V
V
V
(2)
(2)
(2)
(2)
24
25
26
27
Power-On Reset Threshold (See Figure 2-1)
VCC
CREG
CREGA
CREF
VPOR_A
VPOR_A
VPOR_A
VPOR_A
2.77
1.80
2.18
1.11
⎯
⎯
⎯
2.95
2.10
2.31
1.19
V
V
V
V
(2)
(2)
(2)
(2)
28
29
30
31
Hysteresis (VPOR_N - VPOR_A, See Figure 2-1)
VCC
CREG
CREGA
CREF
VHYST
VHYST
VHYST
VHYST
0
0
0
0
388
300
261
150
mV
mV
mV
mV
VDACU
⎯
⎯
2.0
V
(2)
VDD
V2.5
VREF
2.42
2.42
1.20
2.50
2.50
1.25
2.58
2.58
1.29
V
V
V
(1)
(1)
(1)
CREG
ESR
800
⎯
1000
⎯
⎯
200
nF
mΩ
(2)
(2)
IDD
32 Minimum Functional Voltage (See Figure 2-1)
⎯
⎯
⎯
⎯
33
34
35
Internally Regulated Voltages
CREG
CREGA (3)
CREF
36
37
External Filter Capacitor (CREG, CREGA)
Value
ESR (including interconnect resistance)
38
Power Supply Coupling (4)
Analog output
39
40
41
42
Analog Sensitivity (XOUT, YOUT)
20g Range
35g Range
50g Range
100g Range
*
*
*
*
ASENS
ASENS
ASENS
ASENS
⎯
⎯
⎯
⎯
23.40
13.40
9.37
4.68
⎯
⎯
⎯
⎯
mV/V/g
mV/V/g
mV/V/g
mV/V/g
(1)(5)
(1)(5)
(1)(5)
(1)(5)
43
44
Sensitivity Error
TA = 25°C
40°C ≤ TA ≤ 105°C
*
*
ΔSENS
ΔSENS
-8
-8
⎯
⎯
+8
+8
%
%
(1)(5)
(1)(5)
45
Offset at 0g
Analog output (XOUT, YOUT)
*
AOUT
0.46 × VCC
0.5 × VCC
0.54 × VCC
V
(1)(5)
Notes:
1.
2.
3.
4.
5.
(#)
(*)
*
*
See Figure 2-2
(2)
Parameters tested 100% at final test.
Verified by characterization, not tested in production.
Tested at VCC = VL and VCC = VH.
Power supply ripple at frequencies greater than 900 kHz should be minimized to the greatest extent possible.
Devices are trimmed at 100 Hz with 1000 Hz low-pass filter option selected.
Indicates a FSL significant parameter (CPK > 1.33).
Indicates a FSL critical parameter (CPK > 1.67).
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Freescale Semiconductor
2.3
ELECTRICAL CHARACTERISTICS (CONTINUED)
VL ≤ (VCC - VSS) ≤ VH, TL ≤ TA ≤ TH, |ΔTA| < 4 K/min unless otherwise specified
Ref
Characteristic
Symbol
Min
Typ
Max
Units
gOVER
gOVER
gOVER
gOVER
+20.0
+35.0
+50.0
+100.1
+20.9
+36.6
+52.1
+104.3
+22.1
+38.7
+55.3
+110.5
g
g
g
g
(3)
(3)
(3)
(3)
gUNDER
gUNDER
gUNDER
gUNDER
-20.1
-35.1
-50.1
-100.3
-20.9
-36.6
-52.2
-104.5
-22.2
-38.8
-55.4
-110.7
g
g
g
g
(3)
(3)
(3)
(3)
gSAT
-200
—
+200
g
(3)
NLOUT
-1
—
1
% FSR
(3)
56 Noise (1Hz-1kHz)
nSD
—
—
1.1
mg/√Hz
(3)
Positive Self Test Output Change
(XOUT, YOUT, analog)
TA = 25°C
57
58
-40°C ≤ TA ≤ 105°C
ΔST
ΔST
10
10
—
—
18
18
% FS
% FS
(1)
(1)
VZX
VYX
VZY
VXY
-4
-4
-4
-4
—
—
—
—
+4
+4
+4
+4
%
%
%
%
(3)
(3)
(3)
(3)
AVLOW
AVHIGH
OFST
GERR
DNL
—
VCC - 0.25
-0.2
-0.3
-2
—
—
—
—
0.25
—
+0.2
+0.3
+2
V
V
%FSR
%FSR
digit
(2)
(2)
(2)
(2)
(2)
INL
INL
-3
-3.5
—
—
+3
+3.5
digit
digit
(2)
(3)
Output High Voltage
STATUS (ILoad = -100 μA)
70 3.15 V ≤ (VCC - VSS) ≤ 3.45 V
71 4.75 V ≤ (VCC - VSS) ≤ 5.25 V
VOH
VOH
3.25
3.75
—
—
—
—
V
V
(2)
(2)
Output Low Voltage
STATUS (ILoad = 100 μA)
72 3.15 V ≤ (VCC - VSS) ≤ 3.45 V
73 4.75 V ≤ (VCC - VSS) ≤ 5.25 V
VOL
VOL
—
—
—
—
0.4
0.4
V
V
(2)
(2)
Output Loading (STATUS)
Load Resistance
Load Capacitance
ZOUT
COUT
47
—
—
—
—
35
kΩ
pF
(3)
(3)
Output value on overrange
46
47
48
49
20g Range
35g Range
50g Range
100g Range
Output value on Underrange
50
51
52
53
20g Range
35g Range
50g Range
100g Range
Maximum acceleration without saturation of internal
circuitry
All ranges
54
55 Nonlinearity
59
60
61
62
Cross-Axis Sensitivity
VZX
VYX
VZY
VXY
DAC Characteristics (XOUT, YOUT)
Minimum Output Level, IOUT = -200 μA
Maximum Output Level, IOUT = 200 μA
Offset Error
Gain Error
Differential Nonlinearity
Integral Nonlinearity
TA = 25°C
68
69
-40°C ≤ TA ≤ 105°C
63
64
65
66
67
74
75
Notes:
1. Parameters tested 100% at final test.
2. Parameters tested 100% at unit probe.
3. Verified by characterization, not tested in production.
MMA6222AKEG
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Freescale Semiconductor
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2.3
ELECTRICAL CHARACTERISTICS (CONTINUED)
VL ≤ (VCC - VSS) ≤ VH, TL ≤ TA ≤ TH, |ΔTA| < 4 K/min unless otherwise specified
Ref
Symbol
Min
Typ
Max
Units
ZOUT
COUT
25
—
—
—
—
60
kΩ
pF
(3)
(3)
Input High Voltage
RESET, SCLK, ST, CAP/HOLD
78 3.15 V ≤ (VCC - VSS) ≤ 3.45 V
79 4.75 V ≤ (VCC - VSS) ≤ 5.25 V
VIH
VIH
1.5
2.5
—
—
—
—
V
V
(2)
(2)
Input Low Voltage
RESET, SCLK, ST, CAP/HOLD
80 3.15 V ≤ (VCC - VSS) ≤ 3.45 V
81 4.75 V ≤ (VCC - VSS) ≤ 5.25 V
VIL
VIL
—
—
—
—
0.85
1.0
V
V
(2)
(2)
IIH
RIN
-30
190
-50
270
-260
350
μA
kΩ
(2)
(2)
IIL
30
50
260
μA
(2)
76
77
82
83
84
85
Characteristic
Output Loading (XOUT, YOUT)
Load Resistance
Load Capacitance
Input Current
High (at VIH)
SCLK, ST, CAP/HOLD
VPP/TEST (internal pulldown resistor)
Low (at VIL)
RESET
Notes:
2. Parameters tested 100% at unit probe.
3. Verified by characterization, not tested in production.
MMA6222AEG
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Freescale Semiconductor
2.4
CONTROL TIMING
VL ≤ (VCC - VSS) ≤ VH, TL ≤ TA ≤ TH, |ΔTA| < 4 K/min unless otherwise specified
Ref
Characteristic
Symbol
Min
Typ
Max
Units
fC(LPF)
380
400
420
Hz
fC(LPF)
335
353
371
Hz
OLPF
—
4
—
1
(7)
tXY
——
—
10
ms
(1)
90 Internal Oscillator Frequency
fOSC
3.8
4.0
4.2
MHz
(1)
91 Clock Monitor Threshold
fMON
3.6
—
4.4
MHz
(7)
tCSRES
486
512
538
μs
(7)
nPOLES
fC
—
5
1
10
—
20
unit
kHz
(1)
(7)
BWGCELL
—
3
—
kHz
(1)
DSP Low-Pass Filter (Note 9)
Cutoff frequency (Note 10)
86
Filter Option $0C, $1F
DSP Low-Pass Filter
Cutoff frequency (-3dB, referenced to 0 Hz)
87
Filter $0C, $1F
Filter Order
Filter $00 - $12
88
Power-On Recovery Time
89
Power applied to XOUT, YOUT valid
92 Chip Select to Internal Reset (See Figure 2-3)
93
94
DAC Low-Pass Filter
Number of Poles
Cutoff Frequency
95 Sensing Element Rolloff Frequency (-3 dB)
Notes:
1.
2.
3.
4.
7.
9.
10.
(7)
(7)
Parameters tested 100% at final test.
Parameters tested 100% at unit probe.
Verified by characterization, not tested in production.
(*) Indicates a FSL critical parameter (CPK > 1.67). (#) Indicates a FSL significant parameter (CPK > 1.33).
Functionality verified 100% via scan. Timing characteristic is directly determined by internal oscillator frequency.
Devices are trimmed at 100 Hz with 1000 Hz low-pass filter option selected.
Low-pass filter characteristics match those of other Freescale accelerometer devices. Cutoff frequencies shown are -4dB
referenced to 0 Hz response, to correspond with previous specifications.
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5.5V
VPOR_N
VPOR_A
VDACU
VCC
POR
tXY
XOUT/YOUT
DAC OUTPUT
UNCERTAIN
Figure 2-1 Power-Up Timing
Figure 2-2 Power Supply Coupling - DAC Outputs
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Freescale Semiconductor
CS
tCSRES
INTERNAL RESET
SCLK
Figure 2-3 CS Reset Timing
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PACKAGE DIMENSIONS
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Freescale Semiconductor
PACKAGE DIMENSIONS
MMA6222AKEG
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Freescale Semiconductor
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MMA6222AKEG
Rev. 0
12/2009