AN3921
Rev 1, 04/2010
Freescale Semiconductor
Application Note
Low Power Modes and Auto-Wake/Sleep
Using the MMA8450Q
by: Kimberly Tuck
Applications Engineer
1.0
Introduction
Accelerometers are commonly used in hand held
electronics and/or battery operated electronic devices.
Consumption of current in the entire system is a critical feature
of the product design. Users do not want to be inconvenienced
by continually recharging or changing out batteries. When
designing in the accelerometer, battery power usage is often
a critical feature which concerns many customer-users.
Therefore, current consumption of the sensor as well as of the
entire system should be paramount design considerations. If
the system processor is used often only for processing data
from the accelerometer, then it is ideal to embed the
intelligence in the sensor to avoid burdening the system
processor from running continually. The flexibility of
embedded interrupt driven functions and selectable data rates
with trade-offs for resolution, response time, and current are
the types of intelligent features in the MMA8450Q.
This application note aims to explain the following:
• The Low Power Mode bit and the trade off with noise in the
accelerometer
• Noise vs. current consumption at all different Output Data
Rates
• The comparisons of the different current consumption
levels running the device at 6 different available sample
rates and the trade off with resolution vs. current
consumption
• Importance of embedded functions and how the overall
current consumption of the system can be lowered
compared to algorithm driven functions analyzing XYZ
data alone
• Reducing overall system power using the FIFO
• An explanation of the Auto-Wake/Sleep feature,
explaining the configuration procedure with example
register settings and code
© Freescale Semiconductor, Inc., 2010. All rights reserved.
TABLE OF CONTENTS
1.0 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1 Key Words . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.2 Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
2.0 MMA8450Q Consumer 3-axis Accelerometer 3 x 3 x 1 mm . . . . . . . . . . . 2
2.1 Key Features of the MMA8450Q . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
2.2 Two (2) Programmable Interrupt Pins for 8 Interrupt Sources . . . . . . . . . . . . 2
2.3 Application Notes for the MMA8450Q . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
3.0 Low Power Mode Compared to Normal Mode . . . . . . . . . . . . . . . . . . . . . 3
4.0 Power Savings of the MMA8450Q in the End System Application . . . . . 4
4.1 Power Savings Using the FIFO Data Logging . . . . . . . . . . . . . . . . . . . . . . . . . 4
4.1.1 Flushing the FIFO at 100 Hz ODR and Below . . . . . . . . . . . . . . . . . . . 5
4.1.2 Flushing the FIFO at 200 Hz ODR . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
4.1.3 Flushing the FIFO at 400 Hz ODR . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
4.2 Power Savings Using the FIFO to Collect the History Leading up to an Event
Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
5.0 Configuring the MMA8450Q into Auto-Wake/Sleep Mode . . . . . . . . . . . . 8
5.1 Set the Sleep Enable Bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5.2 Configure the Sleep Sample Rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5.3 Set the Time Out Counter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5.4 Enable the Interrupts to be used in the System and Route to INT1 or INT2
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
5.5 Enable the Interrupt Sources that Wake the Device . . . . . . . . . . . . . . . . . . . 10
6.0 Example Configuration for the Auto-Wake/Sleep Function . . . . . . . . . . 11
6.1 Example Procedure for Configuring the Auto-Wake/Sleep Function of the
MMA8450Q. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.1
Key Words
Accelerometer, Output Data Rate, Current, Standby Current,
Power Down Mode Current, Low Power Mode, Noise, AutoWake/Sleep, Sleep Timer, Power Cycling, FIFO, MCU,
Processor, Sensor
1.2
Summary
A. When there is a need for low power over high resolution the MMA8450Q is capable of reducing the current
consumption of the part at all ODRs resulting in significant overall system power savings.
B. The effective number of bits in Normal Mode and Low Power Mode are given with the current consumption for each
condition.
C. The embedded functions allow the system MCU or processor to go to sleep and wait for an interrupt from the
accelerometer. The processor does not need to continuously access and monitor data. This has significant benefits
over continuous polling of XYZ data and can save over 96% of the total current consumption allowing wireless
products to last much longer on a battery.
D. The FIFO has tremendous power savings potential for applications requiring data-logging or when waiting for an
event to view the exact data that triggered the event. Instead of accessing the data per every sample, the
processor/MCU can go to Sleep Mode and wake up only to flush the data when the FIFO is full or if an interrupt has
occurred. Current consumption savings can range from 78% up to 96% or higher depending on conditions of the
MCU and ODR chosen.
E. The MMA8450Q can be used to cycle between different ODRs, which results in overall lower current consumption
of the device. This can be achieved from 5 programmable functions.
2.0
MMA8450Q Consumer 3-axis Accelerometer 3 x 3 x 1 mm
NC
VDD
16
15
14
1
NC
3
SCL
4
GND
5
16 Pin QFN
3mm x 3 mm x 1mm
13
GND
12
GND
11
INT1
10 GND
9
6
7
8
EN
2
SA0
NC
MMA8450Q
SDA
VDD
NC
The MMA8450Q has a selectable dynamic range of ±2g, ±4g and ±8g with sensitivities of 1024 counts/g, 512 counts/g and
256 counts/g respectively. The device offers either 8-bit or 12-bit XYZ output data for algorithm development. The chip shot and
pinout are shown in Figure 1.
INT2
Figure 1. MMA8450Q Consumer 3-axis Accelerometer 3 x 3 x 1 mm
2.1
Key Features of the MMA8450Q
1.
2.
3.
4.
5.
6.
7.
2.2
Shutdown Mode: Typical < 1 μA, Standby Mode 3 μA
Low Power Mode current consumption ranges from 27 μA (1.56 - 50 Hz) to 120 μA (400 Hz)
Normal Mode current consumption ranges from 42 μA (1.56 - 50 Hz) to 225 μA (400 Hz)
I2C digital output interface (operates up to 400 kHz Fast Mode)
12-bit and 8-bit data output, 8-bit high pass filtered data output
Post Board Mount Offset < ±50 mg typical
Self Test X, Y and Z axes
Two (2) Programmable Interrupt Pins for 8 Interrupt Sources
1. Embedded 4 channels of Motion detection
a. Freefall or Motion detection: 2 channels
b. Tap detection: 1 channel
c. Transient detection: 1 channel
2. Embedded orientation (Portrait/Landscape) detection with hysteresis compensation
3. Embedded automatic ODR change for auto-wake-up and return-to-sleep
4. Embedded 32 sample FIFO
5. Data Ready Interrupt
AN3921
2
Sensors
Freescale Semiconductor
2.3
Application Notes for the MMA8450Q
The following is a list of Freescale Application Notes written for the MMA8450Q:
• AN3915, Embedded Orientation Detection Using the MMA8450Q
• AN3916, Offset Calibration of the MMA8450Q
• AN3917, Motion and Freefall Detection Using the MMA8450Q
• AN3918, High Pass Filtered Data and Transient Detection Using the MMA8450Q
• AN3919, MMA8450Q Single/Double and Directional Tap Detection
• AN3920, Using the 32 Sample First In First Out (FIFO) in the MMA8450Q
• AN3921, Low Power Modes and Auto-Wake/Sleep Using the MMA8450Q
• AN3922, Data Manipulation and Basic Settings of the MMA8450Q
• AN3923, MMA8450Q Design Checklist and Board Mounting Guidelines
3.0
Low Power Mode Compared to Normal Mode
Table 1 shows the different current consumption levels at different selectable Output Data Rates. The Low Power Mode is set
in Register 0x39 System Control Register 2, bit 0. If this bit is cleared, the device is in the Normal Mode. When this bit is set, the
device is in the Low Power Mode. Notice that in Low Power Mode the current consumption drops but this advantage comes at
the expense of higher noise. The typical noise calculated in mg RMS is given for all different available sample rates. The equivalent effective number of noise free bits of the 12-bit data is given for each based on tested data. The Low Power Mode reduces
the current consumption by internally sleeping longer and averaging the data less. The change in effective number of bits is approximately 0.6 to 0.7 bits. For an application requiring the highest resolution with the lowest current consumption, the trade-off
will need to be made.
Also note that when comparing the current consumption at different sample rates, the current consumption remains the same
from 1.56 Hz to 50 Hz. This is a trade off between current consumption and noise. At the lower sample rates, the device is averaging data to improve the noise performance. At 1.56 Hz the device averages 32 more samples than at 50 Hz; this improves the
noise performance. At 50 Hz in Normal Mode, the device typically has 7.8 effective (noise free) bits and at 1.56 Hz, the device
has 10.2 effective (noise free) bits.
Table 1. Current Consumption for Different Sample Rates Normal and Low Power Mode
Symbol
IddLP
Idd
Parameter
Low Power Mode
$39 CTRL_REG2: MOD[0] = 1
Normal Mode
$39 CTRL_REG2: MOD[0]=0
Test conditions
Typ Noise mg RMS
Effective Bits*
Typ Current (μA)
EN = 1, ODR = 1.563 Hz
1.5
9.6
27
EN = 1, ODR = 12.5 Hz
4.0
8.2
27
EN = 1, ODR = 50 Hz
8.0
7.2
27
EN = 1, ODR = 100 Hz
8.0
7.2
42
EN = 1, ODR = 200 Hz
8.0
7.2
72
EN = 1, ODR = 400 Hz
8.0
7.2
120
EN =1, ODR = 1.563 Hz
1.0
10.2
42
EN =1, ODR = 12.5 Hz
2.5
8.9
42
EN =1, ODR = 50 Hz
5.2
7.8
42
EN =1, ODR = 100 Hz
5.2
7.8
72
EN =1, ODR = 200 Hz
5.2
7.8
132
EN =1, ODR = 400 Hz
5.2
7.8
225
IddSdn
Current consumption in Shutdown Mode
EN = 0
—
—
1
IddStby
Supply Current Drain in Standby Mode
EN = 1 and FS[1:0] = 00
2
—
3
*Note the noise values in the chart are based on real data on the MMA8450Q Demo Board, taken at a typical workstation, not in an isolated noise
free environment.
AN3921
Sensors
Freescale Semiconductor
3
4.0
Power Savings of the MMA8450Q in the End System Application
The consideration of power savings is often specific to the application. Most applications for the accelerometer are in portable
devices using a battery power supply. Battery life is paramount and the ability to minimize power consumption depends upon the
performed operations required in the application. In most scenarios, the preference should be to shut down everything and only
wake up and do what is required as quickly and as efficiently as possible. Often, this will depend upon a user display and how
long the display needs to be “on” as well as how the unit is capable of being woken up.
Sometimes, if the processor needs to be up and running continuously, it may be possible to save power by “gear shifting” the
bus clock speed, that is, switching between fast and slow clocking modes rather than jumping between run and stop. The embedded FIFO is a proven benefit as it limits how often the processor needs to read the data. The FIFO is also an advantage in
non-battery powered applications as it can improve computational throughput, again, by not needing to interrupt the processor
every time there is a new sample.
Most, if not all, MCUs/processors can leave a sleep state via an external interrupt, which is how the MMA8450Q could be used
for “wake on shake”, or “wake on tilt”, etc. This is where the advanced features of the MMA8450Q prove to be beneficial. Several
MCUs/processors can also wake up via an internal interrupt, usually based upon a timer interval – i.e. wake up every 100 ms,
etc. This can be required in order to perform some regular housekeeping functions (such as time of day, etc.) which could include
scanning the accelerometer and processing its data via software. Switching off the power to the MCU rarely makes any sense
compared to waking up from sleep because this is always faster than a cold start. Wake up times can vary considerably depending on the MCU or processor. For example, some Freescale 8-bit MCUs have the ability to wake up from sleep/stop mode in 6 μs,
while other processors may take around 3 ms. Very fast wake-up times on the MCU/processor make it very efficient for switching
between sleep and wake states.
The MMA8450Q has many embedded functions in the device which relieve the host processor from having to continuously
sample the XYZ data and run various algorithms for motion detection, orientation detection, freefall, or quick jolts. The device has
the intelligence internally to recognize any of these embedded events and can change the sample rate upon detection. For example, in a remote controller application, much of the time the remote will sit on the table motionless while no one is using it. The
MMA8450Q can be configured to be at a low sample rate (50 Hz) when in sleep mode and then when the user picks up the remote
the accelerometer will switch over into a faster sample rate (400 Hz) in wake mode ready to recognize faster moving motion signatures. The embedded blocks to keep the device awake must be enabled and configured. For example, the orientation detection
can be configured to wake the device along with motion detection. All changes in orientation or motions will keep the device at
the higher sample rate. When the device stops moving it will go back to the sleep state to conserve power. The details of how to
configure the Auto-Wake/Sleep are described in Section 5.0.
4.1
Power Savings Using the FIFO Data Logging
The FIFO is very beneficial for saving overall system power by putting the processor into sleep mode until it needs to process
data from the accelerometer. The idea is to configure the MMA8450Q to monitor a desired interrupt, putting the processor in a
low power mode until it needs to respond to the accelerometer. This maximizes the time that the processor spends in a sleep or
low power mode and ultimately will minimize the system’s overall power consumption, increasing the life of the battery. The FIFO
allows the processor to sleep longer while samples are being collected inside the sensor. This also minimizes the traffic across
the I2C bus.
The timing of the data rate and the bus speed should be chosen with care. As an example the accelerometer is put in Low
Power Mode sampling at 50 Hz (20 ms) with the FIFO running in Fill Mode and the FIFO interrupt enabled. The interrupt would
be used to trigger the processor to wake up, service the interrupt, and flush the 32 samples. New data cannot be stored into the
FIFO while it is being flushed. Therefore the processor must wake up, service the interrupt and flush the data within 20 ms before
the next sample is available.
The FIFO overflow is asserted every 32 samples. The user has the option of flushing either the 12-bit data or the 8-bit data.
For the 12-bit data each sample consists of three 12-bit values, each stored as 2 bytes. Therefore, when full, the FIFO will contain
192 bytes. For the 8-bit data each sample consists of three 8-bit values, each stored as 1 byte. Therefore in this case when full
the FIFO will contain 96 bytes. An I2C burst access has about 3 extra bytes of “overhead”, for a total of 195 bytes in the 12-bit
data flush and 99 bytes in total for the 8-bit data flush. Also the Start, Stop and Repeat Start I2C transactions take a minimum of
0.6 μs. A 1 μs value will be added for each of these. Assuming that each I2C byte requires a 10-bit transfer window (8 for data,
1 for the acknowledge and 1 for bus idle), the time required to perform an I2C burst read of N samples can be calculated as follows:
10
10
10
10
Master
Slave
ST
Device Address [6:0]
W
Register Address [7:0]
AK
SR Device Address [6:0]
AK
R
NAK SP
AK
Data [7:0]
Figure 2. I2C Single Byte Read Transaction
AN3921
4
Sensors
Freescale Semiconductor
12- bit Data Flush Calculations
FIFORead(N) = ((((N · 3 · 2) + 3) · 10) / I2C bit rate)
FIFORead(32) = 1950 / I2C bit rate
For an I2C bit rate of 400 kHz, FIFORead(32) + 3 μs = 4.878 ms.
For an I2C bit rate of 400 kHz, FIFORead(16) + 3 μs = 2.478 ms.
8-bit Data Flush Calculations
FIFORead(N) = ((((N · 3) + 3) · 10) / I2C bit rate)
FIFORead(32) = 990 / I2C bit rate
For an I2C bit rate of 400 kHz, FIFORead(32) + 3 μs = 2.478 ms.
Note that bursting out 32 samples of 12-bit XYZ data consecutively takes 1950 bits to perform the transaction. By bursting XYZ
12-bit data each time new data is ready requires 2880 bits, as this requires 32 iterations. The start, stop and repeat start transactions calculated at 1 μs each start to add up over 32 iterations.
DataReadyRead(32) = (((3 · 2)+ 3) · 10) · 32 = 2880 bits/I2C bit rate
2
For an I C bit rate of 400 kHz, DataReadyRead(32) = 7.2 ms + 3 μs · 32 = 7.296 ms
It is seen that using the FIFO to pull out all 32 samples at one time saves on the overhead. This allows the application processor to do other things or to remain in a low power mode for longer.
Example conditions are given for a processor with the wake timing and current consumption values in Table 2. In Wake Mode
the example processor uses a total of 12 mA, while in sleep mode it only uses 0.5 mA. It take 3 ms to wake the processor from
sleep and read the FIFO status. As shown above, a 12-bit data flush from the accelerometer FIFO takes close to 5 ms while an
8-bit flush of the FIFO takes 2.5 ms. With these example conditions, the average current consumption and the percentage of
saved current consumption can be calculated.
Note: current consumption and wake times on different processors/MCUs will vary but this same methodology applies. The next
several sections will show the analysis of flushing the FIFO at different sample rates using the assumed conditions from Table 2.
Table 2. Example Conditions
4.1.1
Wake-Up Time
12-bit Flush
8-bit Flush
Sleep Mode
Wake Mode
3 ms
5 ms
2.5 ms
0.5 mA
12 mA
Flushing the FIFO at 100 Hz ODR and Below
At 100 Hz (or less) output data rate the processor can wake up and flush the FIFO without missing any samples. The following
is a timing diagram typical of how the FIFO and processor would be configured for sample rates 100 Hz or less. The FIFO collects
data until the overflow flag interrupt is asserted. Then the processor wakes up and flushes all the data out of the FIFO before the
next sample is ready. From sample 1 to sample 32 the processor is in sleep mode. Note: The processor will also be asleep during
the later part of the interval before the first sample is ready. The details of the sleep to wake timing are captured below in Figure 3
and Table 3. The total current is calculated assuming 0.5 mA in sleep mode and 12 mA in active mode.
Figure 3. Timing of the FIFO at 100 Hz ODR Showing Sleep and Wake Timing
Table 3. Wake to Sleep Timing at 100 Hz ODR
Data
ODR
Total Time
Sleep Time
Wake Time
Watermark
Wake/Total
Sleep/Total
Total Current
Current
Savings
12-bit
100
320 ms
312 ms
8 ms
32
8/320
312/320
0.7875 mA
93.4%
8-bit
100
320 ms
314.5 ms
5.5 ms
32
5.5/320
314.5/320
0.6978 mA
94.2%
AN3921
Sensors
Freescale Semiconductor
5
4.1.2
Flushing the FIFO at 200 Hz ODR
When the data rate is set to 200 Hz the processor can be triggered by the watermark set at 31 samples, giving 5 ms to turn
on, which is more than enough time. Then when the overflow flag asserts the FIFO is flushed, which takes almost 5 ms for flushing
the 12-bit data and 2.5 ms for flushing the 8-bit data. The FIFO can be flushed at 200 Hz ODR without missing any samples by
waking up from the Watermark interrupt set at sample 31 as shown in Figure 4. If the 12-bit data flush takes longer than the 5 ms
then the first sample of the next data set will be missed. The results of the sleep to wake timing and current drain are captured
in Table 4.
Figure 4. Timing of the FIFO at 200 Hz ODR Showing Sleep and Wake Timing
Table 4. Wake to Sleep Timing at 200 Hz ODR
Data
ODR
Total Time
12-bit
200
160 ms
8-bit
200
160 ms
4.1.3
Sleep Time
Wake Time
Watermark
150 ms
10 ms
31
152.5 ms
7.5 ms
31
Sleep/Total
Total Current
Current
Savings
10/160
150/160
1.218 mA
89.8%
7.5/160
152.5/160
1.039 mA
91.3%
Wake/Total
Flushing the FIFO at 400 Hz ODR
When sampling at 400 Hz, there is a new sample every 2.5 ms, which does not allow a lot of time to wake and flush without
missing samples. At 400 Hz the best way to configure the FIFO to avoid losing data is to set the Watermark for 30 samples. This
is the trigger to interrupt the processor to wake up. Then, when the overflow flag is asserted, a 16 sample (12-bit data) flush occurs, which takes 2.475 ms. Next, the processor will go immediately to sleep and continue cycling through this pattern, waking
up at the watermark then flushing the last 16 samples when the overflow flag asserts. When flushing 8-bit samples the FIFO
should have enough time to flush the entire buffer. Figure 5 shows the timing for flushing 12-bit data at 400 Hz ODR. Figure 6
shows the timing for the 8-bit data flush at 400 Hz.
Figure 5. Timing of the FIFO at 400 Hz ODR Flushing 12-bit data Showing Sleep and Wake Timing
Figure 6. Timing of the FIFO at 400 HZ ODR Flushing 8-bit data Showing Sleep and Wake Timing
Table 5 presents all the calculations at 400 Hz flushing 12-bit data and 8-bit data without missing samples.
Table 5. Wake to Sleep Timing at 400 Hz ODR
Data
ODR
Total Time
Sleep Time
Wake Time
Watermark
Wake/Total
Sleep/Total
Total Current
12-bit
400
40 ms
32.5 ms
7.5 ms
14
7.5/40
32.5/40
2.656 mA
Current Savings
77.9%
8-bit
400
80 ms
72.5 ms
7.5 ms
30
7.5/80
72.5/80
1.578 mA
86.9%
AN3921
6
Sensors
Freescale Semiconductor
Table 6 summarizes the wake and sleep timing for all sample rates of the MMA8450Q. The total current consumed per cycle
and the current savings as a percentage are calculated based on the amount of time the processor is in wake vs. sleep.
Table 6. Power Savings Using FIFO at Different Data Rates
ODR
Time
between
Samples
Sleep/Total
Ratio 12-bit
Current Consumption
12-bit Data Flush mA
Current Savings
12-bit Data (%)
Sleep/Total
Ratio 8-bit
Current Consumption
8-bit Data Flush mA
Current
Savings
8-bit Data (%)
1.56 Hz
641 ms
99.96%
0.505
95.8%
99.97%
0.503
95.8%
12.5 Hz
80 ms
99.69%
0.536
95.5%
99.79%
0.524
95.6%
50 Hz
20 ms
98.75%
0.644
94.6%
99.14%
0.599
95.0%
100 Hz
10 ms
97.50%
0.788
93.4%
98.28%
0.698
94.2%
200 Hz
5 ms
93.75%
1.219
89.8%
95.31%
1.039
91.3%
400 Hz
2.5 ms
81.25%
2.656
77.9%
90.63%
1.578
86.9%
From Table 6, these values can be related to the amount of time that a typical lithium ion battery for a cell phone would last.
This gives a representation of power savings related to battery life time. The percentage saved for current consumption is for the
application processor only. Table 7 incorporates the current consumption of the processor and the accelerometer in full power
mode to give the average total current consumption. An example lithium-ion cell phone battery stores 1200 mA hours. Based on
this information a comparison is made. This shows the total current consumption (processor + accelerometer) at all sample rates
when the processor is continuously polling data and therefore always in the wake state.
Table 7. Example Li-Ion Battery Life Calculations without the FIFO to Data Log Data
ODR
LP-Low Power
N-Normal
Processor
MMA8450Q
Current Consumption Current Consumption
Total Consumption
AA Li-Ion Battery Life
1200 mAh
(1200 mAh/Total mA) Time (h)
Time
(Days)
1.56 Hz (LP)
12
0.027
12.027
99.77
4.16
1.56 Hz (N)
12
0.042
12.042
99.65
4.16
12.5 Hz (LP)
12
0.027
12.027
99.77
4.16
12.5 Hz (N)
12
0.042
12.042
99.65
4.16
50 Hz (LP)
12
0.027
12.027
99.77
4.16
50 Hz (N)
12
0.042
12.042
99.65
4.16
100 Hz (LP)
12
0.042
12.042
99.65
4.15
100 Hz (N)
12
0.072
12.072
99.40
4.14
200 Hz (LP)
12
0.072
12.072
99.40
4.14
200 Hz (N)
12
0.132
12.132
98.91
4.12
400 Hz (LP)
12
0.120
12.120
99.01
4.13
400 Hz (N)
12
0.225
12.225
98.16
4.09
When the processor is continuously running, the accelerometer current consumption has a small effect on the battery life because the processor uses much more current than the accelerometer. The ability to use the accelerometer to put the processor
in a sleep mode can have a significant impact on the battery life (Table 8). The current consumption of the processor is based on
the 12-bit data that was explained from Table 6. Note in Table 8 the far column on the right displays the battery life improvement
by using the FIFO to data log the data. This shows that at the highest sampling rate in Normal Mode the battery life improves
4.2x what it would by polling the data with the processor continually running. At the lowest sample rate in Low Power Mode, the
savings is 22.6x longer battery life.
Table 8. Example Li-Ion Battery Life Calculations Using the FIFO to Data Log 12-bit Data
ODR
Processor Current MMA8450Q Current Total Consumption Li-Ion Battery 1200 mAh Time
LP-Low Power
Consumption
Consumption
12-bit Data Flush
(1200 mAh/Total mA)
(Days)
N-Normal
12-bit Data Flush mA 12-bit Data Flush mA
mA
Time (h)
Battery Life
Improvement
(x Longer)
1.56 Hz (LP)
0.505
0.027
0.532
2255.64
93.98
22.6
1.56 Hz (N)
0.505
0.042
0.547
2193.78
91.41
22.0
12.5 Hz (LP)
0.536
0.027
0.563
2131.44
88.81
21.4
12.5 Hz (N)
0.536
0.042
0.578
2076.12
86.51
20.8
50 Hz (LP)
0.644
0.027
0.671
1788.38
74.52
17.9
50 Hz (N)
0.644
0.042
0.686
1749.27
72.89
17.6
100 Hz (LP)
0.788
0.042
0.830
1445.78
60.24
14.5
AN3921
Sensors
Freescale Semiconductor
7
Table 8. Example Li-Ion Battery Life Calculations Using the FIFO to Data Log 12-bit Data
100 Hz (N)
0.788
0.072
0.860
1395.35
58.14
200 Hz (LP)
1.219
0.072
1.291
929.51
38.73
14.0
9.4
200 Hz (N)
1.219
0.132
1.351
888.23
37.01
9.0
400 Hz (LP)
2.656
0.120
2.776
432.28
18.01
4.4
400 Hz (N)
2.656
0.225
2.881
416.52
17.36
4.2
Note: A similar analysis can be done for the 8-bit data using the FIFO.
4.2
Power Savings Using the FIFO to Collect the History Leading up to an Event Trigger
Another use for the FIFO is the ability to analyze the data that occurred right up to the point of an interrupt triggering event.
After the interrupt flag of the event is set, the FIFO (configured in Circular Mode) can be flushed to extract the previous 32 samples of data leading up to the event. If it is desirable for the FIFO to hold the data in the FIFO after the interrupt, then this can only
be done when there is a transition from Wake to Sleep Mode only. Otherwise the FIFO must be flushed after the event to store
the data in the processor for further analysis. This technique is discussed in AN3919 for analyzing directional tap. The single tap
is configured and the FIFO is configured for Circular Buffer Mode to run at 400 Hz. When the tap interrupt flag is set, the FIFO is
read within 15 ms of the interrupt to collect the full signature of the tap to analyze the data leading up to the event, and the data
during the event. This technique can be particularly important when tracking events over a long period of time. The MCU or processor can remain asleep until the event has triggered and it can add up to substantial power savings.
5.0
Configuring the MMA8450Q into Auto-Wake/Sleep Mode
The MMA8450Q can be configured to transition between different sample rates (different current consumption) based on different selected events. Enabling this feature can be accomplished by enabling the Sleep Mode and setting a time-out period.
Then the functions of interest must be set to trigger the device to wake. The advantage of using the Auto-Wake/Sleep is that the
system can automatically transition to a higher sample rate (higher current consumption) when needed but spends the majority
of the time in the Sleep Mode (lower current) when the device does not require higher sampling rates. This can all be triggered
on selected events. The Low Power Mode bit (Reg 0x39 bit 0) can be used as well with this feature to minimize the total current
consumption. Figure 7 shows transition states.
Wake
Standby
Sysmod = 00
Interrupts
triggered
Sysmod = 01
<DR>
Sleep
If Time > ASLP_Count and
no Interrupts triggered
Sysmod = 10
<ASLP_Rate>
Figure 7. System Modes
The selected embedded functions must be enabled and the same corresponding functions must be set to “Wake From Sleep”
if they are to be used to wake the device.
All enabled functions will still function in Sleep Mode at the sleep ODR. Only the functions that have been selected for “Wake
From Sleep” will wake the device.
This section reviews the different registers involved in configuring the device for auto-wake/sleep.
1. Register 0x39 bit 1 – SLPE Enable Sleep bit
2. Register 0x38 Sleep Sample Rate and Wake Sample Rate
3. Register 0x37 Time Out Counter
4. Register 0x3B Enable the Interrupts for the Selected Functions
5. Register 0x3C Route the Interrupts to INT1 or INT2
6. Register 0x3A Enable the Wake from Sleep Interrupts
AN3921
8
Sensors
Freescale Semiconductor
5.1
Set the Sleep Enable Bit
If the Sleep Enable bit (Reg. 0x39 bit 1) is not enabled then the device can only toggle between Standby and Wake Mode by
writing to the FS0 and FS1 bits in Register 0x38. When the Sleep Enable bit is enabled the device can transition between Standby,
Wake, and Sleep. The SLPE bit is shown as bit 1 in Table 9.
Table 9. 0x39 CTRL_REG2 Register (Read/Write) and Description
5.2
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
ST
BOOT
0
0
0
0
SLPE
MODS
Configure the Sleep Sample Rate
It is important to note that when the device is in Sleep Mode, the system ODR and the data rate for all the system functions
are overwritten by the data rate set by the ASLP_RATE field in the CTRL_REG1 register (0x38). The Sleep Sample Rate and
the Normal Mode Sample Rate are found in Table 10. The different bit settings for the Sleep Sample Rate can be found in
Table 11.
Table 10. 0x38 CTRL_REG1 Register (Read/Write) and Description
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
ASLP_RATE1
ASLP_RATE0
0
DR2
DR1
DR0
FS1
FS0
Table 11. Sleep Mode Sample Rate Description
ASLP_RATE1
ASLP_RATE0
Frequency (Hz)
0
0
50
0
1
25
1
0
12.5
1
1
1.56
Example:
•
•
5.3
Sleep Period = 1/ASLP_RATE
If ASLP_RATE = 50 Hz, Sleep Period = 20 ms
Set the Time Out Counter
The ASLP_COUNT register sets the minimum time period of inactivity required to change current ODR value from the value
specified in the DR[2:0] to ASLP_RATE (Reg 0x38) value provided the SLPE bit is set to a logic ‘1’ in the CTRL_REG2 register.
Table 12. 0x37 ASLP_COUNT Register (Read/Write) and Description
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
D7
D6
D5
D4
D3
D2
D1
D0
D7-D0 defines the minimum duration time to change current ODR value from DR to ASLP_RATE. Time step and maximum
value depend on the ODR chosen. See Table 13.
Table 13. ASLP_COUNT Relationship with ODR
Output Data Rate (ODR)
Duration
Step
400
0 to 81s
320 ms
200
0 to 81s
320 ms
100
0 to 81s
320 ms
50
0 to 81s
320 ms
12.5
0 to 81s
320 ms
1.56
0 to 325.125s
640 ms
AN3921
Sensors
Freescale Semiconductor
9
5.4
Enable the Interrupts to be used in the System and Route to INT1 or INT2
The functions must be enabled in Register 0x3B per Table 14 for the event to trigger the Auto-Wake/Sleep.
Table 14. Register 0x3B CTRL_REG4 Register (Read/Write) and Description
Bit 7
Bit 6
INT_EN _ASLP
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
INT_EN _FIFO INT_EN _TRANS INT_EN _LNDPRT INT_EN _PULSE INT_EN_FF_MT_1 INT_EN_FF_MT_2 INT_EN_DRDY
The corresponding interrupt enable bit allows the function to route its event detection flag to the interrupt controller. The interrupt controller routes the enabled interrupt to the INT1 or INT2 pin. By default all interrupts are routed to INT2 and the corresponding configuration register bit value is 0. To route a functional block to INT1 instead of the default, set the corresponding
configuration register bit to 1. The configuration register bit settings are shown in Table 15.
Table 15. Register 0x3C CTRL_REG5 Register (Read/Write) and Description
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
INT_CFG_ASLP INT_CFG_FIFO INT_CFG_TRANS INT_CFG_LNDPRT INT_CFG_PULSE INT_CFG_FF_MT_1 INT_CFG_FF_MT_2 INT_CFG_DRDY
5.5
Enable the Interrupt Sources that Wake the Device
The register to control which interrupts will wake the device are configured in Register 0x3A shown below in Table 16. There
are six (6) functional blocks that can be used to keep the sensor from falling asleep if they are enabled. These are the
Transient, Orientation, Tap, Motion/FF1 and Motion/FF2 and the FIFO. There are only five (5) functions used to wake the device. The FIFO will not wake the device from sleep. Also note the auto-wake/sleep interrupt and the data ready interrupt do not
affect the wake/sleep.
Table 16. Register 0x3A CTRL_REG3 Interrupt Control Register and Description
Bit 7
Bit 6
Bit 5
Bit 4
FIFO_GATE
WAKE_TRANS
WAKE_LNDPRT
WAKE_PULSE
Bit 3
Bit 2
WAKE_FF_MT_1 WAKE_FF_MT_2
Bit 1
Bit 0
IPOL
PP_OD
Note: The FIFO is flushed whenever the system ODR changes in order to prevent mixing the FIFO data from different time
domains unless the FIFO_GATE (bit 7) is set. Also, the FIFO cannot wake the device from sleep but can prevent the device from
going to sleep. Details of the functionality of the FIFO is captured in Table 17.
Table 17. Behavior of FIFO under Wake/Sleep Conditions
FIFO INT
ENABLED
Wake from
Sleep Enabled
Result
(Assuming that the FIFO is set up to accept samples in either Fill or Circular Mode)
NO
• FIFO will fall asleep when the sleep timer times out and no other interrupt wakes the system.
• There is an AUTOMATIC flush and the FIFO starts refilling at the Sleep ODR from 0.
• If another functional block causes the device to wake, the FIFO will FLUSH itself again and start filling at
Wake ODR.
YES
NO
• With the interrupt enabled, the FIFO can be read and flushed (clearing the interrupt) to keep the device from
falling asleep. This is dependant on the sleep time out value and how fast the FIFO is clearing the interrupt.
• If the system does fall asleep, (and no interrupts occur during the time-out period), the FIFO
AUTOMATICALLY flushes and starts refilling at the Sleep ODR from 0.
• When the device wakes up again by an interrupt, the FIFO AUTMOATICALLY flushes and starts from 0 and
stores at the Wake ODR.
NO
YES
• FIFO will fall asleep if no wake events occur within the time out period.
• Last data remains in the FIFO until it is flushed.
• Once the FIFO is flushed, it will start collecting the new data at the current ODR.
YES
• With interrupt enabled, the FIFO can be read and flushed (clearing the interrupt) to keep the device from
falling asleep.
• If the system does fall asleep, (and no interrupts occur during the time out period), then the FIFO will stop
collecting any data.
• The last data will be held in the FIFO.
• Once the FIFO is flushed, it will start collecting the new data at the current ODR.
NO
YES
AN3921
10
Sensors
Freescale Semiconductor
6.0
Example Configuration for the Auto-Wake/Sleep Function
The following are the steps to configure the Auto-Wake/Sleep function with the registers of importance in Table 18. In this example the data rate will be set to 400 Hz in Active Mode and 12.5 Hz in Sleep Mode. The time-out period will be set to 20 seconds.
The wake triggers will be tap and motion. There may be other interrupts that are enabled in the system including orientation detection, but these will not wake the device in this example.
Table 18. Registers used for Auto-Wake/Sleep Functionality
Reg
Name
Definition
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
14
SYSMOD
System Mode R
PERR
FGERR
0
0
0
0
SYSMOD1
SYSMOD0
15
INT_SOURCE
Interrupt Status R
SRC_ASLP
SRC_FIFO
SRC_TRANS
SRC_LNDPRT
SRC_PULSE
SRC_FF_MT_1
SRC_FF_MT_2
SRC_DRDY
37
ASLP_COUNT
Auto-Sleep Counter R/W
D7
D6
D5
D4
D3
D2
D1
D0
38
CTRL_REG1
Control Reg 1 R/W
ASLP_RATE1
ASLP_RATE0
0
DR2
DR1
DR0
FS1
FS0
39
CTRL_REG2
Control Reg 2 R/W
ST
RST
0
0
0
0
SLPE
MODS
3A
CTRL_REG3
Control Reg3 R/W
(Wake Interrupts from Sleep)
FIFO_GATE
WAKE_TRANS
WAKE_LNDPRT
WAKE_PULSE
WAKE_FF_MT_1
WAKE_FF_MT_2
IPOL
PP_OD
3B
CTRL_REG4
Control Reg4 R/W
(Interrupt Enable Map)
INT_EN _ASLP
INT_EN _FIFO
INT_EN _TRANS INT_EN _LNDPRT INT_EN _PULSE INT_EN _FF_MT_1
INT_EN _FF_MT_2
INT_EN_DRDY
3C
CTRL_REG5
Control reg5 R/W
(Interrupt Configuration)
INT_CFG_ASLP
INT_CFG_FIFO
INT_CFG_TRANS INT_CFG_LNDPRT INT_CFG_PULSE INT_CFG_FF_MT_1 INT_CFG_FF_MT_2
6.1
INT_CFG_DRDY
Example Procedure for Configuring the Auto-Wake/Sleep Function of the
MMA8450Q
•
•
•
•
Sleep Time-out period = 20 seconds
Wake triggers = Tap and Motion
Wake Sample Rate = 400 Hz, Sleep Sample Rate = 12.5 Hz
8g Mode
Step 1: Put the device in Standby Mode
Register 0x38 CTRL_REG1
• CTRL_REG1Data = IIC_RegRead(0x38);
• CTRL_REG1Data& = 0xDC;
• IIC_RegWrite(0x38,CTRL_REG1Data);
Step 2: To enable the Auto-Wake/Sleep set bit 1 in Register 39, the SLPE bit.
Register 0x39 CTRL_REG2
• CTRLReg2Data = IIC_RegRead(0x39); // Store value in the Register
• CTRLReg2Data| = 0x02; // Set the Sleep Enable bit
• IIC_RegWrite(0x39, CTRLReg2Data); Write the updated value into CTRL Register 2.
Step 3: The sleep sample rate must be chosen by writing in the corresponding sample rate value to bits
6 and 7 ASLP_RATE0 and ASLP_RATE1 in Register 0x38.
Register 0x38 CTRL_REG1
• CTRL_REG1Data = IIC_RegRead(0x38);
• CTRL_REG1Data& = 0x1C; //50Hz
• CTRL_REG1Data& = 0x5C; //20Hz
• CTRL_REG1Data& = 0x9C; //12.5Hz
• CTRL_REG1Data& = 0xDC; //50Hz
• IIC_RegWrite(0x38,CTRL_REG1Data);
AN3921
Sensors
Freescale Semiconductor
11
Step 4: The Interrupt for the event to trigger the device to wake-up must be enabled by writing to
Register 0x3B, CTRL_Reg4. Bits 1 through 7 will affect the auto-wake sleep. The data ready
interrupt doesn’t trigger the auto-wake/sleep mechanism.
Example: Set Pulse and Orientation and Motion 1 and Auto-Wake/Sleep Interrupts
Enabled in the System
• IIC_RegWrite(0x3B, 0x9C);
Step 5: Route the interrupt chosen and enabled to either INT1 or INT2 in Register 0x3C CTRL_REG5.
Example: Route Pulse, Motion1 and Orientation to Int2 and Auto-Sleep to Int1.
• IIC_RegWrite(0x3C,0x80);
Step 6: Enable the interrupts that will wake the device from sleep. There can be more interrupts enabled
in Step 4 than in Step 6. Only interrupts that are Enabled in Step 4 and that have the “Wake From
Sleep” bit set in Register 0x3A will actually wake the device.
Example: Choose Pulse and Motion1 to wake the device from sleep
• IIC_RegWrite(0x3A,0x18);
Step 7: Set the Wake Mode Sample Rate and set the full-scale active mode in Register 0x38.
Register 0x38 CTRL_REG1
• CTRL_REG1Data = IIC_RegRead(0x38);
• CTRL_REG1Data& = 0xC0; //Make sure to clear the wake sample rate and set the ODR to
400 Hz
• CTRL_REG1Data| = 0x03;//Set 8g Active Mode
• IIC_RegWrite(0x38,CTRL_REG1Data);
Step 8: Write an Interrupt Service routine to monitor the Auto-Sleep Interrupt
Interrupt void isr_KBI (void)
{
//clear the interrupt flag
CLEAR_KBI_INTERRUPT;
//Determine the source of interrupt by reading the system interrupt register
Int_SourceSystem = IIC_RegRead(0x15);
// Set up Case statement here to service all of the possible interrupts
if ((Int_SourceSystem &=0x80)==0x80)
{
//Perform an Action since Auto-Sleep Flag has been set
//Read the System Mode to clear the system interrupt
Int_SysMod = IIC_RegRead(0x14);
if (Int_SysMod==0x02)
{// sleep mode
}
else if (Int_SysMod==0x01)
{//Wake Mode
}
else
{//Error
}
}
}
AN3921
12
Sensors
Freescale Semiconductor
How to Reach Us:
Home Page:
www.freescale.com
Web Support:
http://www.freescale.com/support
USA/Europe or Locations Not Listed:
Freescale Semiconductor, Inc.
Technical Information Center, EL516
2100 East Elliot Road
Tempe, Arizona 85284
1-800-521-6274 or +1-480-768-2130
www.freescale.com/support
Europe, Middle East, and Africa:
Freescale Halbleiter Deutschland GmbH
Technical Information Center
Schatzbogen 7
81829 Muenchen, Germany
+44 1296 380 456 (English)
+46 8 52200080 (English)
+49 89 92103 559 (German)
+33 1 69 35 48 48 (French)
www.freescale.com/support
Japan:
Freescale Semiconductor Japan Ltd.
Headquarters
ARCO Tower 15F
1-8-1, Shimo-Meguro, Meguro-ku,
Tokyo 153-0064
Japan
0120 191014 or +81 3 5437 9125
[email protected]
Asia/Pacific:
Freescale Semiconductor China Ltd.
Exchange Building 23F
No. 118 Jianguo Road
Chaoyang District
Beijing 100022
China
+86 10 5879 8000
[email protected]
For Literature Requests Only:
1-800-441-2447 or +1-303-675-2140
Fax: +1-303-675-2150
[email protected]
AN3921
Rev. 1
04/2010
Information in this document is provided solely to enable system and software
implementers to use Freescale Semiconductor products. There are no express or
implied copyright licenses granted hereunder to design or fabricate any integrated
circuits or integrated circuits based on the information in this document.
Freescale Semiconductor reserves the right to make changes without further notice to
any products herein. Freescale Semiconductor makes no warranty, representation or
guarantee regarding the suitability of its products for any particular purpose, nor does
Freescale Semiconductor assume any liability arising out of the application or use of any
product or circuit, and specifically disclaims any and all liability, including without
limitation consequential or incidental damages. “Typical” parameters that may be
provided in Freescale Semiconductor data sheets and/or specifications can and do vary
in different applications and actual performance may vary over time. All operating
parameters, including “Typicals”, must be validated for each customer application by
customer’s technical experts. Freescale Semiconductor does not convey any license
under its patent rights nor the rights of others. Freescale Semiconductor products are
not designed, intended, or authorized for use as components in systems intended for
surgical implant into the body, or other applications intended to support or sustain life,
or for any other application in which the failure of the Freescale Semiconductor product
could create a situation where personal injury or death may occur. Should Buyer
purchase or use Freescale Semiconductor products for any such unintended or
unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor and
its officers, employees, subsidiaries, affiliates, and distributors harmless against all
claims, costs, damages, and expenses, and reasonable attorney fees arising out of,
directly or indirectly, any claim of personal injury or death associated with such
unintended or unauthorized use, even if such claim alleges that Freescale
Semiconductor was negligent regarding the design or manufacture of the part.
Freescale and the Freescale logo are trademarks of Freescale Semiconductor, Inc.,
Reg. U.S. Pat. & Tm. Off. All other product or service names are the property of their
respective owners.
© Freescale Semiconductor, Inc. 2010. All rights reserved.